CN115128522A

CN115128522A - Packaging structure, detection equipment and packaging precision control method of Hall probe

Info

Publication number: CN115128522A
Application number: CN202210883563.4A
Authority: CN
Inventors: 孙晓龙; 陶志专; 段永超; 向丽丽; 耿军红
Original assignee: Suzhou JQS Info Tech Co Ltd
Current assignee: Suzhou JQS Info Tech Co Ltd
Priority date: 2022-07-26
Filing date: 2022-07-26
Publication date: 2022-09-30
Anticipated expiration: 2042-07-26
Also published as: CN115128522B

Abstract

The invention relates to a packaging structure, detection equipment and a packaging precision control method of a Hall probe, wherein the structure comprises a base, a bearing seat, a chip cover plate and a transmission line cover plate, the bearing seat is arranged in a groove of the base, a chip supporting groove and a transmission line supporting groove which are communicated are axially arranged on the bearing seat, the chip supporting groove and the transmission line supporting groove are respectively used for bearing a chip detection part and a transmission cable of the Hall probe, the chip cover plate is fixed on the bearing seat positioned on two sides of the chip supporting groove, the transmission line cover plate is fixed on the bearing seat positioned on two sides of the transmission line supporting groove, a precision control rod hole and a precision adjusting piece arranged in the precision control rod hole are arranged at the rear end of the base, and the precision adjusting piece is used for moving in the axial direction of the precision control rod hole to drive the bearing seat to move in the axial direction of the groove. Through setting up drawer type packaging structure for the packaging structure who will be equipped with hall probe is convenient for adjust when using on check out test set, effectively guarantees check out test set measuring result's uniformity.

Description

Packaging structure, detection equipment and packaging precision control method of Hall probe

Technical Field

The invention relates to the technical field of detection equipment, in particular to a packaging structure of a Hall probe, detection equipment and a packaging precision control method.

Background

The hall effect is a kind of magnetoelectric effect, and the hall sensor is a kind of magnetic field sensor fabricated according to the effect. Hall sensors are widely used in industrial automation, detection, and information processing because of their high sensitivity. As a very common sensor, the Hall sensor also has abundant advantages and disadvantages.

When the Hall probe is applied to detection equipment to detect the magnetic flux of a product, due to the purchased Hall probe, the problem of incoming material difference exists, so that when the Hall probe is directly installed on the detection equipment for application, the stability and reliability of the magnetic flux detection result of the product cannot be ensured due to the incoming material difference, the assembly difference of the detection equipment and the like; meanwhile, the directly mounted Hall probe has no anti-interference capability, and the measured value of the Hall probe is easily influenced by an external magnetic field, so that the magnetic flux test result of the product is not accurate enough.

Therefore, it is necessary to provide a package structure that effectively solves the problem of consistency during the application of the hall probe and can resist the external magnetic field during the detection process to solve the above technical problems.

Disclosure of Invention

In order to solve the technical problem, the invention provides a packaging structure of a Hall probe. The technical problem of when installing hall probe and using on check out test set among the prior art, because supplied materials difference, check out test set equipment assembly difference can't guarantee check out test set testing result uniformity is solved.

The technical effects of the invention are realized as follows:

a packaging structure of a Hall probe is used for managing and controlling the packaging precision of the Hall probe and comprises a base, a bearing seat, a chip cover plate and a transmission line cover plate, wherein a groove is arranged in the axial direction of the base, the bearing seat is arranged in the groove, a chip supporting groove and a transmission line supporting groove are arranged in the axial direction of the bearing seat, the chip supporting groove is communicated with the transmission line supporting groove, the chip supporting groove is used for bearing a chip detecting part of the Hall probe, the size of the chip supporting groove is matched with that of the chip detecting part, the transmission line supporting groove is used for bearing a transmission cable of the Hall probe, the chip cover plate is fixed on the bearing seat at the two sides of the chip supporting groove to fix the chip detecting part, the transmission line cover plate is fixed on the bearing seat at the two sides of the transmission line supporting groove to fix the transmission cable, the rear end of the base is provided with a precision control rod hole and a precision adjusting piece arranged in the precision control rod hole, and the precision adjusting piece is used for moving the precision control rod hole axially to drive the bearing seat to move axially in the groove to complete precision positioning of the Hall probe. The secondary packaging of the Hall probe is completed by arranging the drawer type packaging structure, so that when the packaging structure assembled with the Hall probe is applied to magnetic flux detection equipment, the assembly and debugging process is simple to operate, the consistency of the application of the Hall probe with incoming material difference on the detection equipment is ensured, and the consistency of the measurement result of the detection equipment is effectively ensured; on the other hand, the Hall probe is packaged in a secondary packaging mode, so that the design structure of the packaging structure or the mounting angle of the Hall probe on the detection equipment can be adjusted, the Hall probe assembled in the packaging structure can be used for carrying out magnetic flux tests in different measuring directions, and the applicability of the Hall probe is improved.

Furthermore, the precision adjusting part comprises a first adjusting part and a second adjusting part, the precision control rod hole comprises a retraction hole and a screwing-out hole, threads are arranged on the retraction hole, the first adjusting part is connected with the retraction hole in a threaded manner and then abuts against the rear end of the bearing seat, and the first adjusting part is used for spirally retracting on the retraction hole to push the bearing seat to move forwards; the rear end of bearing the seat is in be equipped with the screw thread fluting on the corresponding position of second regulating part, the second regulating part passes behind the screw-out trompil with screw thread fluting threaded connection just the head butt of second regulating part is in around the screw-out trompil bear on the seat, the second regulating part is arranged in screw entry is in order to drive in the screw thread fluting bear the backward movement of seat. Through setting up first regulating part and second regulating part for adjust the regulating part that corresponds and can drive the carrier that is equipped with hall probe and move for the base seesaw, realize that hall probe is controllable in the ascending measuring accuracy of Y.

Furthermore, the front end of the base is a precision control part, the width of the precision control part is smaller than the maximum width of the base, a precision control hole is formed in the side face of the precision control part, a third adjusting piece in threaded connection with the precision control hole is arranged on the precision control hole, and the third adjusting piece is used for spirally retracting on the precision control hole to push the bearing seat to move in the first direction so as to finish the precision adjustment of the chip detection part in the horizontal direction.

Furthermore, the part of the base, which is close to the precision control part, is a reference control part, the reference control part is provided with at least two reference control holes on the other side of the side surface of the base where the precision control holes are located, the reference control holes are provided with fourth adjusting pieces in threaded connection with the reference control holes, and the fourth adjusting pieces are used for spirally retracting on the precision control holes to push the bearing seat to move in the second direction so as to complete the reference positioning of the chip detection part in the horizontal direction. Through setting up third regulating part and fourth regulating part for bear the seat through the regulation of fourth regulating part and keep behind the benchmark position that corresponds, can also further adjust the third regulating part and realize bearing the ascending fine tuning of seat in X, thereby realize that hall probe is controllable at the ascending precision of X.

Furthermore, a graduated scale is arranged on the surface of the precision control part, and the front end face of the bearing seat moves a corresponding distance on the graduated scale to complete the adjustment of the bearing seat in the axial direction of the bearing seat.

Furthermore, a fixing groove is formed above the chip support groove, the width of the fixing groove is larger than that of the chip support groove, a boss is arranged on the chip cover plate, and the height and the width of the boss are respectively matched with the depth and the width of the fixing groove.

The transmission line cover plate is fixedly connected with the base, and the transmission line cover plate is pressed above the junction of the chip cover plate and the transmission line cover plate and completely covers the chip cover plate. Through setting up the encapsulation apron for the encapsulation apron can be when pressfitting chip cover board, and the juncture of pressfitting chip cover board and transmission line apron effectively solves and leads to chip detection portion to have the problem of Z to deformation when transmission line cover board and chip cover board are in the nonconformity of the juncture position pressfitting degree that corresponds, thereby guarantees chip detection portion at the ascending stability of Z.

Furthermore, the bearing seat, the chip cover plate and the packaging cover plate are made of anti-interference materials. Bear seat, chip apron and encapsulation apron and adopt anti-interference material to make for hall probe can resist external magnetic field environmental interference at the magnetic flux testing process, effectively improves check out test set's measurement accuracy.

In addition, still provide a magnetic flux check out test set, including testing platform, removal adjustment mechanism, hall probe and foretell packaging structure, testing platform is used for bearing and fixes the product that awaits measuring that has magnetic object, installs hall probe packaging structure is used for passing through after the installation accuracy who accomplishes hall probe removes adjustment mechanism and drives and be on a parallel with the motion on the plane of the product terminal surface that awaits measuring, it is right to accomplish the magnetic flux check out test process of the product that awaits measuring.

In addition, a packaging precision control method of the hall probe is further provided, the method is realized based on the packaging structure of the hall probe, a precision control hole is formed in the front end of the base, a third adjusting piece in threaded connection with the precision control hole is arranged on the precision control hole, and the method comprises the following steps:

fixing the base which is finished with finish machining at the front end of the mounting plate of the mobile adjusting mechanism in the horizontal direction to finish the finish positioning of the base in the X direction, the Y direction and the Z direction;

placing a chip detection part of the Hall probe in a chip bracket, placing transmission light in a transmission line bracket and enabling a transmission cable to extend out of the rear end of the transmission line bracket along the axial direction of the transmission cable;

placing a bearing seat for bearing the Hall probe in a groove of a base;

the precision adjusting piece is adjusted to finish the fine positioning of the bearing seat in the Y direction so as to finish the fine positioning of the Hall probe in the Y direction;

adjusting the third adjusting piece to finish the fine positioning of the bearing seat in the X direction so as to finish the fine positioning of the Hall probe in the X direction;

and fixing the transmission cable cover plate on the bearing seats on the two sides of the transmission line bracket to fix the transmission cable so as to finish the precise positioning of the Hall probe in the Z direction and the R direction.

As described above, the present invention has the following advantageous effects:

1) the secondary packaging of the Hall probe is completed by arranging the drawer type packaging structure, so that when the packaging structure provided with the Hall probe is applied to magnetic flux detection equipment, the assembling and debugging process is simple to operate, the consistency of the application of the Hall probe with incoming material difference on the detection equipment is ensured, and the consistency of the measurement result of the detection equipment is effectively ensured.

2) The secondary packaging mode is adopted to package the Hall probe, so that the design structure of the packaging structure can be adjusted or the mounting angle of the packaging structure on the detection equipment can be adjusted, the Hall probe assembled in the packaging structure can perform magnetic flux tests in different measuring directions, and the applicability of the Hall probe is improved.

3) Bear seat, chip apron and encapsulation apron and adopt anti-interference material to make for hall probe can resist external magnetic field environmental interference at the magnetic flux testing process, effectively improves check out test set's measurement accuracy.

4) Through setting up first regulating part and second regulating part for adjust the regulating part that corresponds and can drive the carrier that is equipped with hall probe and move for the base seesaw, realize that hall probe is controllable in the ascending measuring accuracy of Y.

5) Through setting up third regulating part and fourth regulating part for bear the seat through the regulation of fourth regulating part and keep at corresponding reference position after, can also further adjust the third regulating part and realize bearing the ascending fine adjustment of seat in X, thereby realize that hall probe is controllable at the ascending test accuracy of X.

6) Through setting up the encapsulation apron for the encapsulation apron can be when pressfitting chip cover board, and the juncture of pressfitting chip cover board and transmission line apron effectively solves and leads to chip detection portion to have the problem of Z to deformation when transmission line cover board and chip cover board are in the nonconformity of the juncture position pressfitting degree that corresponds, thereby guarantees chip detection portion at the ascending stability of Z.

Drawings

In order to more clearly illustrate the technical solution of the present invention, the drawings used in the embodiment or the description of the prior art will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art it is also possible to derive other drawings from these drawings without inventive effort.

Fig. 1 is a schematic structural diagram of a hall probe package structure with a package cover plate removed according to an embodiment of the present disclosure;

fig. 2 is a schematic structural diagram of the cooperation between the bearing seat and the hall probe provided in the embodiment of the present disclosure;

fig. 3 is a schematic structural diagram of a base and a carrier seat provided in the embodiment of the present disclosure;

FIG. 4 is a schematic diagram of a precision control rod hole provided in an embodiment of the present disclosure;

fig. 5 is a schematic structural diagram of a base provided in an embodiment of the present disclosure;

fig. 6 is a schematic structural diagram of a carrier according to an embodiment of the present disclosure;

fig. 7 is a schematic structural diagram of an overall structure of a package structure provided with a hall probe in an embodiment of the present disclosure;

fig. 8 is a schematic structural diagram of a magnetic flux detection apparatus provided in an embodiment of the present specification;

FIG. 9 is a schematic structural diagram of an alignment mechanism provided in an embodiment of the present disclosure;

FIG. 10 is a schematic structural diagram of a movement adjustment mechanism provided in an embodiment of the present disclosure;

fig. 11 is a flowchart of a method for managing and controlling the packaging accuracy of a hall probe according to an embodiment of the present disclosure;

FIG. 12 is a schematic structural diagram of an inspection platform provided in an embodiment of the present disclosure;

fig. 13 is a schematic view of a connection structure of a second push clip provided in an embodiment of the present disclosure;

fig. 14 is a flowchart of a magnetic flux detection method provided in an embodiment of the present disclosure.

Wherein the reference numerals in the figures correspond to:

the device comprises a base 1, a groove 101, a retraction hole 102, a screw-out hole 103, a precision control part 104, a precision control hole 1041, a reference control part 105, a reference control hole 1051, a bearing seat 2, a chip bracket 201, a transmission line bracket 202, a thread groove 203, a fixing groove 204, a chip cover plate 3, a boss 31, a transmission line cover plate 4, a Hall probe 5, a chip detection part 51, a transmission cable 52, a packaging cover plate 6, a detection platform 7, a movement adjusting mechanism 8, an X-direction guide rail 81, an X-axis moving mechanism 82, a Y-axis moving mechanism 83, a Z-axis moving mechanism 84, a packaging structure 9, a support plate 10, a right-angle positioning mechanism 11, an arc-shaped positioning block 111, a moving positioning block 112, a calibration mechanism 12, a fixing seat 121, a standard magnet 122, a first push clamp 13, a first driving mechanism 14, a second push clamp 15, a connecting rod 16, a compression spring 17, a second driving mechanism 18, a vacuum generator 19, A suction cup 20 and a positioning disc 21.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.

It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

Example 1:

as shown in fig. 1-9, an embodiment of the present disclosure provides a packaging structure 9 of a hall probe, where the packaging structure 9 is used to manage and control the packaging precision of the hall probe 5, and includes a base 1, a carrier base 2, a chip cover plate 3, and a transmission line cover plate 4, a groove 101 is provided in an axial direction of the base 1, the carrier base 2 is disposed in the groove 101, a chip bracket 201 and a transmission line bracket 202 are provided in an axial direction of the carrier base 2, the chip bracket 201 is communicated with the transmission line bracket 202, the chip bracket 201 is used to carry a chip detection portion 51 of the hall probe 5, a size of the chip bracket 201 is matched with a size of the chip detection portion 51, the transmission line bracket 202 is used to carry a transmission cable 52 of the hall probe 5, the chip cover plates 3 are fixed on the carrier bases 2 located at two sides of the chip bracket 201 to complete the fixing of the chip detection portion 51, the transmission line cover plates 4 are fixed on the carrier bases 2 located at two sides of the transmission line bracket 202 to complete the fixing of the transmission cable 52, the rear end of the base 1 is provided with a precision control rod hole and a precision adjusting piece arranged in the precision control rod hole, and the precision adjusting piece is used for moving in the axial direction of the precision control rod hole to drive the bearing seat 2 to move in the axial direction of the groove 101 so as to complete the precision positioning of the Hall probe 5.

Specifically, as shown in fig. 2, the hall probe 5 includes a chip probe portion 51 and a transmission cable 52, the chip probe portion 51 is exposed from the chip cover plate 3 and the front end of the chip bracket 201, and the chip probe portion 51 is configured to detect a change of a magnetic field during an upward movement along X on a plane parallel to the end surface of the product to be detected, so as to determine a magnetic flux of a physical center of the product corresponding to a region of the product to be detected, where the magnetic material is embedded, and complete a magnetic flux detection process for the product to be detected. The Y direction is an axial direction of the groove 101, i.e., an axial direction of the transmission cable 52, the X direction is a direction perpendicular to the Y direction in the horizontal direction, and the Z direction is a direction perpendicular to the horizontal direction.

The transmission cable 52 is exposed from the transmission line cover plate 4 and the rear end of the transmission line bracket 202, the transmission cable 52 comprises a first part and a second part, the first part is a transmission cable with a smaller diameter, the second part is a transmission cable with a larger diameter, the transmission line bracket 202 comprises two cylindrical grooves, the sizes of the two cylindrical grooves are matched with the sizes of the first part and the second part respectively, the length of the first part is larger than the length of the corresponding cylindrical groove in the axial direction, the magnetic field change data detected BY the chip detection part 51 is transmitted to the control device through the transmission cable 52, and the control device obtains the BX value, the BY value and the BZ value of the product to be detected through calculation of the magnetic field change data, so that whether the magnetic flux of the current product to be detected meets the product standard set BY a customer or not is judged. Wherein, the BX value, the BY value and the BZ value are magnetic flux values measured BY the hall probe 5 in the BX direction, the BY direction and the BZ direction, respectively, that is, gaussian measurement values. The BX direction is the Z direction in this application, the BY direction is the X direction in this application, and the BZ direction is the Y direction in this application.

In this embodiment, the transmission cable 52 is a copper cable with a shielding layer, and the shielding layer has an electromagnetic shielding function.

It should be noted that, the hall probe 5 is a hall sensor that is packaged by the chip detecting portion 51 and the transmission cable 52 once, and if the purchased hall sensor that is packaged once is directly installed in the detection device to detect the magnetic flux of the product to be detected, because the purchased hall probe 5 has the difference of supplied materials, and the hall probe 5 is directly assembled to the detection device to be used, there are problems of assembly difference and the like, the detection position where the chip detecting portion 51 is located cannot be accurately positioned when the hall probe 5 is assembled on the magnetic flux detection device to be used, and therefore, the consistency and reliability of the magnetic flux detection result of the product cannot be ensured, and the magnetic flux detection result of the product is not accurate enough.

Therefore, this application constitutes drawer type packaging structure 9 through setting up base 1 and bearing seat 2 collocation, accomplish the secondary encapsulation to hall probe 5, when making the packaging structure 9 that will be equipped with hall probe 5 use on magnetic flux check out test set, can bear seat 2 and base 1's relative position through the adjustment, realize the accurate positioning of chip detecting part 51 place detecting position among the hall probe 5, guarantee the uniformity of hall probe 5 that has the supplied materials difference and use on check out test set, thereby effectively guarantee the uniformity of check out test set measuring result, and simultaneously, the assembly and debugging process easy operation.

Specifically, in the present application, after the hall probe 5 completes the secondary encapsulation through the encapsulation structure 9, and assembles the encapsulation structure 9 on the movement adjusting mechanism 8 of the magnetic flux detecting device, the magnetic flux detection needs to be performed through the standard magnet 122 to complete the correction of the encapsulation structure 9, that is, the position of the hall probe 5 in the encapsulation structure 9 is adjusted according to the magnetic flux measurement result of the standard magnet 122, so as to correct the incoming material difference of the hall probe 5 and the assembly and assembly difference of the encapsulation structure 9 assembled on the detecting device, so as to complete the fine positioning of the position of the hall probe 5 in the encapsulation structure 9.

Preferably, as shown in fig. 4, the precision adjusting member includes a first adjusting member and a second adjusting member, the precision control rod hole includes a retraction hole 102 and a screwing-out hole 103, a thread is disposed on the retraction hole 102, the first adjusting member is connected with the retraction hole 102 by a thread and then abuts against the rear end of the carrier 2, and the first adjusting member is configured to be screwed into the retraction hole 102 to push the carrier 2 to move forward; bear the rear end of seat 2 and be equipped with screw thread fluting 203 on the corresponding position of second regulating part, the second regulating part passes behind the screw-out trompil 103 with screw thread fluting 203 threaded connection and the head butt of second regulating part on bearing seat 2 around the screw-out trompil 103, the second regulating part is arranged in screw-in screw thread fluting 203 in order to drive bears seat 2 rearward movement.

Preferably, as shown in fig. 3, the front end of the base 1 is a precision control portion 104, the width of the precision control portion 104 is smaller than the maximum width of the base 1, a precision control hole 1041 is formed in a side surface of the precision control portion 104, a third adjusting member in threaded connection with the precision control hole 1041 is arranged on the precision control hole 1041, and the third adjusting member is used for retracting and pushing the carrier base 2 to move in the first direction in a screwing manner on the precision control hole 1041 to complete precision adjustment of the chip detection portion 51 in the horizontal direction.

Preferably, the part of the base 1 close to the precision control part 104 is a reference control part 105, the reference control part 105 is provided with at least two reference control holes 1051 on the other side of the side surface of the base 1 where the precision control hole 1041 is located, the reference control holes 1051 are provided with fourth adjusting parts in threaded connection therewith, and the fourth adjusting parts are used for retracting and pushing the carrier base 2 to move in the second direction in a screwing manner on the precision control hole 1041 to complete the reference positioning of the chip detection part 51 in the horizontal direction.

Specifically, the first, second, third and fourth adjusting members are screws.

In this embodiment, the package structure 9 is driven by the movement adjusting mechanism 8 of the magnetic flux detecting apparatus to move on a plane parallel to the surface of the standard magnet 122, so as to obtain a magnetic flux measurement result of the standard magnet 122, and thus the position of the bearing seat 2 in the base 1 is adjusted according to the magnetic flux measurement result, so as to adjust the position of the chip detecting portion 51 of the hall probe 5 in the package structure 9, and complete the correction of the detection position of the chip detecting portion 51.

In the present embodiment, before the calibration of the package structure 9 is performed by measuring the magnetic flux of the standard magnet 122, it is necessary to set the distance between the center of the chip probe unit 51 and the surface of the standard magnet 122, and the distance is preferably 0.6mm, 0.8mm, or 1 mm.

When the center of the chip probe 51 and the center of the magnetic field are aligned, the BX value and the BY value measured with respect to the reference magnet 122 are both equal to zero, and the BZ value is a fixed parameter. The BX value, the BY value and the BZ value at the center of the magnetic field are the intrinsic BX value, the intrinsic BY value and the intrinsic BZ value, respectively, i.e., the technical parameters reflecting the magnetism of the standard magnet 122 can be obtained.

In the present application, the adjusting mechanism 8 is moved to drive the packaging structure 9 to move on the surface of the standard magnet 122, so as to search the magnetic field center of the standard magnet 122, when the corrected BX value, the corrected BY value and the corrected BZ value of the standard magnet 122 detected BY the hall probe 5 are respectively within the range of the intrinsic BX value ± 10GS, the intrinsic BY value ± 10GS and the intrinsic BZ ± 10GS, it is determined that the magnetic field center of the standard magnet 122 is found, and the calibration of the chip detection portion 51 in the X direction, the Y direction and the Z direction is completed.

The standard magnet 122 is a calibration magnet selected according to the magnetic flux technical parameters of the product to be tested with the magnetic material. In this embodiment, the intrinsic BZ value of the selected standard magnet 122 is ± 300GS of the calibrated BZ value of the product to be tested with the magnetic material. GS is gaussian and is a unit of measure.

The calibration process for calibrating the chip probing portion 51 by adjusting the package structure 9 is as follows:

when the control device calculates a corrected BX value, a corrected BY value and a corrected BZ value of the standard magnet 122 according to magnetic flux data corresponding to the standard magnet 122 detected BY the hall probe 5 in real time, when a coordinate position is found, that is, when the package structure 9 is located at the coordinate position, the corrected BZ value satisfies a corresponding gaussian measurement standard value, it is determined whether the corrected BX value and the corrected BY value satisfy the corresponding gaussian measurement standard value, when both the corrected BX value and the corrected BY value satisfy the corresponding gaussian measurement standard value, it is determined that fixing positions of the hall probe 5 in the BX direction and the BY direction in the package structure 9 are accurate, it is determined whether the corrected BX value and the corrected BY value satisfy the corresponding gaussian measurement standard value, when both the corrected BX value and the corrected BY value satisfy the corresponding gaussian measurement standard value, it is determined that fixing positions of the hall probe 5 in the package structure 9 are accurate, the corresponding adjusting piece is not required to be adjusted;

when the difference between the corrected BX value and the inherent BX value and the difference between the corrected BY value and the inherent BY value are both greater than 10, the fourth adjusting member is controlled to be screwed out of the precision control hole 1041 BY a corresponding distance in the first direction, and the third adjusting member is controlled to be screwed back on the precision control hole 1041 to push the bearing seat 2 to move in the first direction, so that the precision adjustment of the chip detection part 51 in the horizontal direction is completed;

when the difference between the corrected BX value and the inherent BX value and the difference between the corrected BY value and the inherent BY value are both smaller than-10, the third adjusting member is controlled to be screwed out of the precision control hole 1041 in the second direction, and the fourth adjusting member is controlled to be screwed back on the precision control hole 1041 to push the carrier base 2 to move in the second direction so as to complete the reference positioning of the chip detection part 51 in the horizontal direction. The first direction is from left to right in fig. 3, and the second direction is from right to left in fig. 3.

When a coordinate position is found, namely the packaging structure 9 is located at the coordinate position, the corrected BX value and the corrected BY value simultaneously meet the corresponding gaussian measurement standard value, whether the corrected BZ value meets the corresponding gaussian measurement standard value is judged, and when the corrected BZ value meets the corresponding gaussian measurement standard value, the fixed position of the hall probe 5 in the packaging structure 9 is judged to be accurate without adjusting a corresponding adjusting piece;

when the corrected BZ value does not meet the corresponding Gaussian measurement standard value, the fixed position of the Hall probe 5 in the packaging structure 9 is judged to be inaccurate, and when the difference value between the corrected BZ value and the inherent BZ value is larger than 10, the second adjusting piece is controlled to enter in the threaded slot 203 in a screwed mode so as to drive the bearing seat 2 to move backwards; when the difference between the corrected BZ value and the inherent BZ value is less than-10, the first adjusting member is controlled to spirally retract on the retraction opening 102 to push the carrier 2 to move forward.

Preferably, as shown in fig. 3, a fixing groove 204 is provided above the chip bracket 201, the fixing groove 204 has a width larger than that of the chip bracket 201, the chip cover plate 3 is provided with a projection 31, and the height and width of the projection 31 match with the depth and width of the fixing groove 204, respectively.

Specifically, the width of the transmission line bracket 202 is matched with the diameter of the transmission cable 52, the depth of the transmission line bracket 202 is set to be larger than the radius of the transmission cable 52 and smaller than the diameter of the transmission cable 52, the cross section of the transmission line bracket 202 is U-shaped, and the transmission line cover plate 4 is provided with a slot corresponding to the projection of the transmission line 52 with respect to the transmission line bracket 202.

Because the depth of the chip bracket 201 corresponding to the chip detection part 51 is less than the depth of the transmission line bracket 202 corresponding to the transmission cable 52, the chip cover plate 3 is at the same plane with the fixed position of the transmission line cover plate 4 on the bearing seat 2, therefore, the fixing groove 204 is arranged above the chip bracket 201, the width of the fixing groove 204 is greater than that of the chip bracket 201, meanwhile, the boss 31 is arranged on the chip cover plate 3, when the chip cover plate 3 is fixed on the bearing seat 2, the upper surface of the chip detection part 51 abuts against the boss 31, and the positioning of the chip detection part 51 on the Z direction is realized.

Preferably, as shown in fig. 7, the hall probe further includes a package cover plate 6, the package cover plate 6 is fixedly connected to the base 1 to be pressed over the junction between the chip cover plate 3 and the transmission line cover plate 4 and completely cover the chip cover plate 3, so as to further ensure that the chip cover plate 3 and the transmission line cover plate 4 are respectively kept horizontal between the corresponding fixing positions, and the hall probe 5 is more stably fixed in the X direction.

It should be noted that, if the integrated cover plate is used to fix the chip detection portion 51 and the transmission cable 52 at the same time, it is necessary to ensure that the chip detection portion and the transmission cable are limited in the corresponding bracket at the same time, and when any one of the two is tilted, the problem of inconvenient assembly or unstable assembly state of the assembled hall probe 5 is caused.

Therefore, the chip detection part 51 and the transmission cable 52 are fixed by arranging the corresponding chip cover plate 3 on the chip detection part 51 and arranging the corresponding transmission line cover plate 4 on the transmission cable 52, so that the problem that the chip detection part is deformed in the Z direction when the transmission line cover plate and the chip cover plate are inconsistent in the corresponding interface position pressing degree is effectively solved while the assembling operation is facilitated, and the stability of the chip detection part in the Z direction is ensured.

Preferably, the bearing seat 2, the chip cover plate 3 and the package cover plate 6 are made of anti-interference materials, so that the chip detection part 51 can resist the interference of an external magnetic field environment in the magnetic flux measurement process, and the accuracy of the magnetic flux detection result is effectively improved. The anti-interference material is preferably a glass fiber material.

In addition, the mode of carrying out secondary encapsulation to hall probe 5 in this application can be used in the magnetic flux test scene of different demands, namely through adjusting the concrete structure of packaging structure 9 or adjusting the installation angle of packaging structure 9 on check out test set for hall probe 5 of assembly in packaging structure 9 can carry out the magnetic flux test in the measuring direction of different demands, thereby improves hall probe 5's suitability.

As shown in fig. 10, an embodiment of the present specification provides a method for managing and controlling packaging accuracy of a hall probe 5, where the method is implemented based on a packaging structure 9 of a hall probe in embodiment 1, and the method includes:

s101: fixing the base 1 which is finished in finish machining at the front end of a mounting plate of a mobile adjusting mechanism 8 in the horizontal direction so as to finish the finish positioning of the base 1 in the X direction, the Y direction and the Z direction;

specifically, the perpendicularity of the mounting plate on the movement adjusting mechanism 8 is adjusted through the dial indicator, so that the base assembled on the mounting plate can ensure the perpendicularity after installation.

S102: placing the chip detection part 51 of the hall probe 5 in the chip bracket 201, placing the transmission light in the transmission line bracket 202 and extending the transmission cable 52 from the rear end of the transmission line bracket 202 along the axial direction thereof;

s103: placing a bearing seat 2 bearing the Hall probe 5 in a groove 101 of a base 1;

s104: fixing the chip cover plate 3 on the bearing seats 2 positioned at both sides of the chip bracket 201 to complete the fixing of the chip detection part 51, and fixing the transmission line cover plate 4 on the bearing seats 2 positioned at both sides of the transmission line bracket 202 to complete the fixing of the transmission cable 52 to complete the positioning of the hall probe 5 in the Z direction and the R direction;

wherein, the R direction is a radial direction perpendicular to the axial direction of the hall probe 5.

S105: when the corrected BZ value does not meet the corresponding Gaussian measurement standard value, the precision adjusting piece is adjusted to finish the fine positioning of the bearing seat 2 in the Y direction so as to finish the fine positioning of the chip detection part 51 of the Hall probe 5 in the Y direction;

s106: when the corrected BX value and the corrected BY value do not meet the corresponding Gaussian measurement standard value, the third adjusting piece and the fourth adjusting piece are adjusted to finish the fine positioning of the bearing seat 2 on the XZ plane so as to finish the fine positioning of the chip detection part 51 of the Hall probe 5 on the XZ plane.

In a specific embodiment, when the corrected BZ value does not satisfy the corresponding gaussian measurement standard value, the step S105 adjusts the precision adjusting element to complete the fine positioning of the carrier 2 in the Y direction, so as to complete the fine positioning of the chip detecting portion 51 of the hall probe 5 in the Y direction, and includes the following steps:

acquiring a calibration distance between the center of the chip detection part 51 and the surface of the standard magnet 122;

controlling the movement adjusting mechanism 8 to adjust the position of the packaging structure 9 in the Y direction according to the calibration distance, so that the distance between the center of the chip detecting part 51 and the plane where the surface of the standard magnet 122 is located is the calibration distance;

controlling the movement adjusting mechanism 8 to drive the packaging structure 9 to move in the X direction to an area corresponding to the surface of the standard magnet 122;

controlling the movable adjusting mechanism 8 to drive the packaging structure 9 to move upwards in the X direction and the Z direction so as to find a corrected BZ value meeting the BZ direction Gaussian measurement standard value or a corrected BX value and a corrected BY value respectively meeting the BX direction Gaussian measurement standard value and the BY direction Gaussian measurement standard value at the same time;

when the corrected BZ value meets the Gaussian measurement standard value in the BZ direction, judging whether the corrected BX value and the corrected BY value meet the corresponding Gaussian measurement standard value;

if yes, finishing the fine positioning of the chip detection part 51;

if not, adjusting the third adjusting part and the fourth adjusting part to enable the corrected BX value and the corrected BY value to meet corresponding Gaussian measurement standard values so as to finish the fine positioning of the bearing seat 2 on the XZ plane;

specifically, if not, step S106 is executed.

When the corrected BX value and the corrected BY value simultaneously respectively meet the BX direction Gaussian measurement standard value and the BY direction Gaussian measurement standard value, judging whether the corrected BZ value meets the corresponding Gaussian measurement standard value;

if yes, finishing the fine positioning of the chip detection part 51;

if not, the precision adjusting part is adjusted to enable the corrected BZ value to meet the corresponding Gaussian measurement standard value so as to finish the fine positioning of the bearing seat 2 in the Y direction.

Specifically, if not, step S105 is executed.

The third adjusting piece, the fourth adjusting piece and the precision adjusting piece can be adjusted manually or automatically.

The control device in the embodiment of the present specification includes a hall probe 5 calibration module, where the hall probe 5 calibration module is used to obtain a calibration distance between the center of the chip detection part 51 and the surface of the standard magnet 122; controlling the movement adjusting mechanism 8 to adjust the position of the packaging structure 9 in the Y direction according to the calibration distance, so that the distance between the center of the chip detecting part 51 and the plane where the surface of the standard magnet 122 is located is the calibration distance; controlling the movement adjusting mechanism 8 to drive the packaging structure 9 to move in the X direction to an area corresponding to the surface of the standard magnet 122; controlling the mobile adjusting mechanism 8 to drive the packaging structure 9 to move upwards in the X direction and the Z direction so as to find a corrected BZ value meeting the BZ direction Gaussian measurement standard value or a corrected BX value and a corrected BY value meeting the BX direction Gaussian measurement standard value and the BY direction Gaussian measurement standard value respectively at the same time; when the corrected BZ value meets the Gaussian measurement standard value in the BZ direction, judging whether the corrected BX value and the corrected BY value meet the corresponding Gaussian measurement standard value; if yes, finishing the fine positioning of the chip detection part 51; if not, adjusting the third adjusting part and the fourth adjusting part to enable the corrected BX value and the corrected BY value to meet corresponding Gaussian measurement standard values so as to finish the fine positioning of the bearing seat 2 on the XZ plane; when the corrected BX value and the corrected BY value simultaneously meet the BX direction Gaussian measurement standard value and the BY direction Gaussian measurement standard value respectively, judging whether the corrected BZ value meets the corresponding Gaussian measurement standard value or not; if yes, finishing the fine positioning of the chip detection part 51; if not, the precision adjusting part is adjusted to enable the corrected BZ value to meet the corresponding Gaussian measurement standard value so as to finish the fine positioning of the bearing seat 2 in the Y direction. The correction BX value, the correction BY value and the correction BZ value of the standard magnet 122 are measured through the correction module of the Hall probe 5, the movement adjusting mechanism 8 is controlled to adjust the spatial position of the packaging structure 9 according to the correction BX value, the correction BY value and the correction BZ value, so that the correction BX value, the correction BY value and the correction BZ value simultaneously meet the corresponding Gaussian measurement standard values to finish the fine positioning of the chip detection part 51, and the accuracy of the magnetic flux measurement result of the product to be measured is ensured.

Example 2:

as shown in fig. 1-9 and 11-13, an embodiment of the present specification provides a magnetic flux detection apparatus, including a detection platform 7, a movement adjustment mechanism 8, a hall probe 5, a control device, and an encapsulation structure 9 of the hall probe in embodiment 1, where the detection platform 7 is used to carry and fix a product to be detected having a magnetic object, and the encapsulation structure 9 on which the hall probe 5 is installed is used to move on a plane parallel to an end surface of the product to be detected by moving the adjustment mechanism 8 after completing adjustment of installation accuracy of the hall probe 5, so as to complete a magnetic flux detection process of the product to be detected.

In this embodiment, testing platform 7 includes backup pad 10 and right angle positioning mechanism 11, right angle positioning mechanism 11 is located on backup pad 10, right angle positioning mechanism 11 includes two arc locating pieces 111, two arc locating pieces 111 are located and are close to 9 one ends of packaging structure on backup pad 10 and follow X to setting up according to side by side, two arc locating pieces 111 all are equipped with the cambered surface in the one side of keeping away from packaging structure 9, arc locating piece 111 sets up to accomplish the location of awaiting measuring the product in Y to through the terminal surface butt of awaiting measuring the product simultaneously on two cambered surfaces when awaiting measuring the product and place in backup pad 10, so that when packaging structure 9 moves on the plane that is on a parallel with the terminal surface of awaiting measuring the product hall probe 5 carries out the magnetic flux detection to the product of awaiting measuring. The support plate 10 is disposed in a horizontal direction, and the cross section of the arc-shaped positioning block 111 in the horizontal direction is arc-shaped. Hall probe 5 in this application is used for carrying out the magnetic flux detection to the terminal surface of the product that awaits measuring, the terminal surface of the product that awaits measuring refers to the product that awaits measuring and is close to the terminal surface of packaging mechanism 9 side when placing in backup pad 10, and this terminal surface is parallel with the preceding terminal surface of Hall probe 5's chip probe 51.

Specifically, the product that awaits measuring in this application is for inhaling the panel computer that charges through magnetism, and the terminal surface butt at the panel computer is in order to fix on testing platform 7 back at two arc locating pieces 111, moves on the terminal surface of panel computer through hall probe 5, accomplishes the magnetic flux detection process to the terminal surface of panel computer.

Preferably, as shown in fig. 11, the detection platform 7 is connected with a first push clamp 13 in a sliding manner at a position opposite to the arc-shaped positioning blocks 111, and the first push clamp 13 pushes the product to be detected to abut against the corresponding arc surfaces of the two arc-shaped positioning blocks 111 under the driving of the first driving mechanism 14.

Specifically, the number of the first pushing clamps 13 is two, the first pushing clamps 13 can move in the Y direction under the driving of the first driving mechanism 14, and the width of the product to be tested is greater than or equal to the width of the supporting plate 10, so that after the product to be tested is placed on the supporting plate 10, the first pushing clamps 13 can push the product to be tested to abut against the arc surfaces corresponding to the two arc-shaped positioning blocks 111 under the driving of the first driving mechanism 14.

It should be noted that, if the planar positioning block is used to realize the upward positioning of the product to be tested in Y, when the first pushing clamp 13 pushes the butt of the product to be tested at the planar positioning block, the end face of the product to be tested is required to be evenly and flatly attached to the plane of the planar positioning block, so that the positioning of the product to be tested can be realized, and when the product to be tested is placed on the supporting plate 10, the end face of the product to be tested cannot be guaranteed to be completely parallel to the plane where the contact surface of the planar positioning block is located, so that in the process of pushing the product to be tested, the position of the product to be tested which is firstly butted is easily damaged by the rigid force.

Consequently, this application is through setting up arc locating piece 111 for when the product that awaits measuring in the cambered surface of successively butt in two arc locating pieces 111, because the cambered surface design, back butt is when the second cambered surface, the adjustment of angle can take place on the first cambered surface of the product that awaits measuring at first butt, so that the position of the product that awaits measuring first butt can not cause the damage, will await measuring the stable location of product on testing platform 7 when accomplishing butt simultaneously on two cambered surfaces, thereby realize the accurate positioning of the product that awaits measuring.

Preferably, the right-angle positioning mechanism 11 further includes two movable positioning blocks 112, the two movable positioning blocks 112 are disposed along the Y direction and slidably connected to the side end of the supporting plate 10, and the right-angle positioning mechanism 11 is configured to control the corresponding movable positioning block 112 to move in the X direction according to the bevel angle of the product to be measured, so as to adjust the distance between the two movable positioning blocks 112 to position the product to be measured in the X direction.

When the bevel angle of the product to be detected is not a right angle, that is, when the angle of the upper left corner of the product to be detected placed on the detection platform shown in fig. 11 is not 90 degrees, the positioning block 112 can be adjusted to move to the corresponding position and fixed according to the corresponding width of the different products to be detected in the Y direction at different positions, so that the detection device can be applied to the magnetic flux detection of electronic products without standard shapes.

Preferably, as shown in fig. 12, the detection platform 7 is slidably connected with a second push clamp 15 at a position opposite to the movable positioning block 112, the second push clamp 15 is configured to be connected with a second driving mechanism 18 through a connecting rod 16, the second push clamp 15 is slidably connected with one end of the connecting rod 16, the other end of the connecting rod 16 is fixedly connected with the second driving mechanism 18, a compression spring 17 is sleeved on the connecting rod 16, one end of the compression spring 17 close to the second push clamp 15 is fixedly connected with the second push clamp 15, one end of the compression spring 17 far from the second push clamp 15 abuts against the second driving mechanism 18, and the second driving mechanism 18 is configured to drive the second push clamp 15 to move forward to abut against the product to be detected after the product to be detected is positioned in the Y direction so as to generate a restoring force in an opposite direction to reduce the pushing force on the product to be detected, so as to ensure that the product to be detected cannot be damaged due to an excessively large pushing force of the second push clamp 15.

Preferably, as shown in fig. 11 and 12, the vacuum suction testing device further includes a second driving mechanism 19 and at least two suction cups 20, the second driving mechanism 19 is disposed below the supporting plate 10, the suction cups 20 are disposed on the supporting plate 10 in a penetrating manner, the suction cups 20 are communicated with the second driving mechanism 19, and the suction cups 20 are used for performing vacuum suction on the product to be tested under the action of the second driving mechanism 19 after the product to be tested placed on the suction cups 20 is positioned in the X direction and the Y direction.

Preferably, the vacuum test fixture further comprises positioning disks 21, the number of the positioning disks 21 is consistent with that of the suckers 20, the positioning disks 21 are sleeved outside the suckers 20, and the positioning disks 21 are arranged such that when the suckers 20 are sucked on a product to be tested in a vacuum manner, the lower surface of the product to be tested abuts against the positioning disks 21 to complete the positioning of the product to be tested in the Z direction.

Specifically, as shown in fig. 12, the suction cup 20 protrudes from the positioning disc 21 in the initial state, and when the product to be measured is vacuum-sucked on the suction cup 20 by the suction cup 20 and the lower surface of the product to be measured abuts against the upper end surfaces of all the positioning discs 21 at the same time, the positioning of the product to be measured is completed.

Preferably, as shown in fig. 9, the detection device further includes a calibration mechanism 12, the calibration mechanism 12 includes a fixing base 121 and a standard magnet 122, the fixing base 121 is disposed near the detection platform 7, the standard magnet 122 is disposed on a surface of one side of the fixing base 121 near the package structure 9, a plane where the standard magnet 122 is located is parallel to a plane where contact lines of a product to be detected abut against two arc surfaces are located, and the package structure 9 is configured to move on the plane parallel to an upper surface of the standard magnet 122 under the driving of the movement adjusting mechanism 8 to measure a magnetic flux of the standard magnet 122 so as to calibrate a detection position of the hall probe 5 in the package structure 9.

Preferably, as shown in fig. 13, the movement adjusting mechanism 8 includes an X-direction guide rail 81, an X-axis moving mechanism 82, a Y-axis moving mechanism 83, and a Z-axis moving mechanism 84, the Y-direction moving mechanism is connected to the X-axis moving mechanism 82 in a Y-direction sliding manner, the Z-axis moving mechanism 84 is connected to the Y-direction moving mechanism in a Z-direction sliding manner, the X-direction guide rail 81 is disposed at the rear end of the detection platform 7, and the packaging structure 9 performs adjustment in the X-direction, the Y-direction, and the Z-direction by moving the movement adjusting mechanism 8 and completes magnetic flux detection on the standard magnet 122 by moving the X-axis moving mechanism 82 on the X-direction guide rail 81. The movement adjusting mechanism 8 realizes the movement of the packaging structure 9 in the X direction, the Y direction and the Z direction through a control device.

As shown in fig. 14, an embodiment of the present specification further provides a magnetic flux detection method, which is implemented based on the magnetic flux detection apparatus in embodiment 2, and the method includes:

s201: mounting a packaging structure 9 with a Hall probe 5 on a movable adjusting mechanism 8;

s202: acquiring magnetic flux data of a product to be detected;

s203: selecting a standard magnet 122 matched with the magnetic flux data of the product to be detected according to the magnetic flux data of the product to be detected, and installing the standard magnet on a fixed seat 121;

specifically, the magnetic flux data is a calibration technical parameter of the product to be measured, the calibration technical parameter of the product to be measured is a magnetic flux calibration value of the product to be measured, that is, a calibration BX value, a calibration BY value, and a calibration BZ value, and the standard magnet 122 is a calibration magnet selected according to the calibration BZ value of the product to be measured with the magnetic material.

In this embodiment, the intrinsic BZ value of the selected standard magnet 122 is ± 300GS of the calibrated BZ value of the product to be tested with the magnetic material.

S204: controlling the movable adjusting mechanism 8 to slide along the X-direction guide rail 81 to drive the packaging structure 9 to synchronously move along the X-direction to measure a corrected BZ value of the standard magnet 122 and judge whether the corrected BZ value meets a corresponding gaussian measurement standard value, so as to perform a magnetic flux detection process of the product to be detected when the corrected BZ value meets the gaussian measurement BZ standard value;

in a specific embodiment, the step S204 of controlling the movable adjusting mechanism 8 to slide along the X-direction guide rail 81 to drive the packaging structure 9 to move synchronously along the X-direction to measure the corrected BZ value of the standard magnet 122 and determine whether the corrected BZ value satisfies the gaussian measurement BZ standard value includes the following steps:

when the corrected BZ value does not meet the standard value of the Gaussian measured BZ, acquiring a corrected BX value and a corrected BY value;

judging whether the corrected BX value and the corrected BY value meet the corresponding Gaussian measurement BX standard value and Gaussian measurement BY standard value;

if so, adjusting the precision adjusting part to realize that the corrected BZ value meets the standard value of the Gaussian measurement BZ;

if not, adjusting the third adjusting part and the fourth adjusting part to realize that the corrected BX value and the corrected BY value meet the corresponding Gaussian measurement BX standard value and the Gaussian measurement BY standard value, and measuring the BZ value again to judge whether the standard value meets the Gaussian measurement BZ standard value.

S205: when the product to be detected is placed on the detection platform 7, the right-angle positioning device is controlled to position the product to be detected in the X direction and the Y direction;

specifically, fixed laser sensor that is equipped with in backup pad 10 top, laser sensor is used for detecting whether place the product that awaits measuring on the backup pad 10, when detecting the product that awaits measuring, sends signal in place to controlling means to make controlling means control right angle positioner carry out the positioning process.

In a specific embodiment, after the step S205 detects that the product to be tested is placed on the testing platform 7, the right-angle positioning device is controlled to position the product to be tested in the X direction and the Y direction, which includes:

the method comprises the steps of obtaining a measuring distance of a product to be measured required BY a customer and calibration technical parameters of the product to be measured, wherein the calibration technical parameters comprise a calibration BX value and a calibration BY value;

the Y-axis moving mechanism 83 of the moving adjusting mechanism 8 is controlled to move relative to the X-axis moving mechanism 82 along the Y direction according to the measuring distance of the product to be measured so as to adjust the position of the chip detecting part 51 in the Y direction, so that the distance from the center of the chip detecting part 51 to the end face of the product to be measured meets the measuring distance of the product to be measured required by a customer;

determining the deviation of the center of the chip detection part 51 relative to the horizontal plane where the center of the end face of the product to be detected is located according to the calibration BX value and the calibration BY value so as to obtain the height of the center of the chip detection part 51 in the Z direction;

and controlling the Z-axis moving mechanism 84 of the moving adjusting mechanism 8 to move relative to the Y-axis moving mechanism 83 along the Z direction according to the height of the center of the chip detection part 51 in the Z direction so as to adjust the position of the packaging structure 98 in the Z direction and adjust the position of the chip detection part 51 in the Z direction, so that the product to be measured carries out magnetic flux measurement under the conditions of the calibration BX value and the calibration BY value.

Specifically, before measuring the magnetic flux of the product to be measured, the customer provides the measurement distance of the product to be measured and the calibration technical parameter of the product to be measured, and the calibration technical parameter of the product to be measured is the magnetic flux calibration value of the product to be measured, namely a calibration BX value, a calibration BY value and a calibration BZ value, wherein the calibration BX value is the same as the calibration BY value. The magnetic flux calibration value is the theoretical value of the magnetic flux of the product to be measured.

The detection of the product to be detected is to detect whether the magnetism of the magnetic material assembled in the product to be detected meets the corresponding standard.

The calibration BX value and the calibration BY value are related to the Z-direction position of the magnetic material in the product to be tested. Namely, the magnetic material is arranged in different positions in the Z direction in the product to be measured, and the calibration BX value and the calibration BY value proposed BY a customer are different.

S206: controlling the moving adjusting mechanism 8 to slide along the X-direction guide rail 81 to drive the packaging structure 9 to synchronously move along the X direction to measure the BX value, the BY value and the BZ value of the product to be measured;

s207: determining a product physical center in the product to be detected according to the BX value, the BY value and the BZ value of the current product to be detected;

theoretically, when the chip detecting portion 51 moves to a distance corresponding to the area of the product to be detected with the magnetic material during the moving process, that is, when the chip detecting portion is located at the physical center of the product, the BX value of the product to be detected BY the detecting device is equal to the calibrated BX value, and the BY value is equal to the calibrated BY value.

However, due to the problem of the mounting accuracy between the package structure 9 and the movement adjusting mechanism 8 and between the X-axis moving mechanism 82, the Y-axis moving mechanism 83 and the Z-axis moving mechanism 84 of the movement adjusting mechanism 8, there is no way to ensure that the detected BX value of the product to be detected is equal to the calibrated BX value and the BY value is equal to the calibrated BY value during the movement of the chip detecting portion 51.

Therefore, in the present application, according to the BX value and the BY value detected in real time, a moving distance within a range that the absolute value of the difference between the BX value and the calibrated BX value is less than or equal to 10GS and the absolute value of the difference between the BY value and the calibrated BY value is less than or equal to 10GS is selected, and the distance is taken as the physical center of the product in the product to be detected. The control device sets the moving range of the moving adjusting mechanism 8 in the X direction according to the coordinate corresponding to the distance, so that the subsequent batch test of the same product to be tested can complete the magnetic flux detection process in the X direction moving range, and the detection time is effectively saved.

S208: and calibrating the movement range of the movement adjusting mechanism 8 according to the physical center of the product to control the movement range of the packaging structure 9, so as to complete the subsequent batch test of the same product to be tested, and output the magnetic flux detection data and the detection result of the product to be tested.

In this embodiment, the calibrated BZ value of the product to be detected is 700-2000 GS, and when the BZ value measured by the product to be detected is within ± 300GS of the calibrated BZ value, the magnetic flux detection result of the product to be detected is a good product.

In some other embodiments, corresponding gaussian deviation percentages may also be set according to different products to be detected, that is, when the percentage obtained by dividing the absolute value of the difference between the measured BZ value and the calibrated BZ value of the magnetic flux detection device on the product to be detected by the calibrated BZ value is less than the gaussian deviation percentage, it is determined that the currently detected product to be detected is good.

The control device in the embodiment of the present description further includes a to-be-detected product magnetic flux detection module, where the to-be-detected product magnetic flux detection module is configured to obtain a measurement distance of a to-be-detected product required BY a customer and calibration technical parameters of the to-be-detected product, where the calibration technical parameters include a calibration BX value and a calibration BY value; the Y-axis moving mechanism 83 of the moving adjusting mechanism 8 is controlled to move relative to the X-axis moving mechanism 82 along the Y direction according to the measuring distance of the product to be measured so as to adjust the position of the chip detecting part 51 in the Y direction, so that the distance from the center of the chip detecting part 51 to the end face of the product to be measured meets the measuring distance of the product to be measured required by a customer; determining the deviation of the center of the chip detection part 51 relative to the horizontal plane where the center of the end face of the product to be detected is located according to the calibration BX value and the calibration BY value so as to obtain the height of the center of the chip detection part 51 in the Z direction; the Z-axis moving mechanism 84 of the moving adjusting mechanism 8 is controlled to move relative to the Y-axis moving mechanism 83 along the Z direction according to the height of the center of the chip detecting part 51 in the Z direction so as to adjust the position of the packaging structure 98 in the Z direction and adjust the position of the chip detecting part 51 in the Z direction, so that the product to be measured carries out magnetic flux measurement under the conditions of a calibrated BX value and a calibrated BY value; when the product to be detected is placed on the detection platform 7, the right-angle positioning device is controlled to position the product to be detected in the X direction and the Y direction; controlling the moving adjusting mechanism 8 to slide along the X-direction guide rail 81 to drive the packaging structure 9 to synchronously move along the X direction to measure the BX value, the BY value and the BZ value of the product to be measured; determining a product physical center in the product to be detected according to the BX value, the BY value and the BZ value of the current product to be detected; and calibrating the movement range of the movement adjusting mechanism 8 according to the physical center of the product to control the movement range of the packaging structure 9, so as to complete the subsequent batch test of the same product to be tested, and output the magnetic flux detection data and the detection result of the product to be tested.

Although the present invention has been described by way of preferred embodiments, the present invention is not limited to the embodiments described herein, and various changes and modifications may be made without departing from the scope of the present invention.

In this document, the terms front, back, upper and lower are used to define the components in the drawings and the positions of the components relative to each other, and are used for clarity and convenience of the technical solution. It is to be understood that the use of the directional terms should not be taken to limit the scope of the claims.

The embodiments and features of the embodiments described herein above can be combined with each other without conflict.

While the invention has been described in connection with what is presently considered to be the most practical and preferred embodiment, it is to be understood that the invention is not to be limited to the disclosed embodiment, but on the contrary, is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims.

Claims

1. The utility model provides a packaging structure of hall probe for encapsulate precision management and control to hall probe (5), its characterized in that, include base (1), bear seat (2), chip cover board (3) and transmission line cover board (4), be equipped with recess (101) on the axial of base (1), bear seat (2) and locate in recess (101), bear the axial of seat (2) and be equipped with chip support groove (201) and transmission line support groove (202), chip support groove (201) with transmission line support groove (202) intercommunication, chip support groove (201) are used for bearing chip detection portion (51) of hall probe (5), the size of chip support groove (201) with the size matching of chip detection portion (51), transmission line support groove (202) are used for bearing transmission cable (52) of hall probe (5), chip cover board (3) are fixed to be located chip support groove (201) both sides bear seat (2) with the completion on bear seat (201) The transmission cable fixing device comprises a transmission cable support groove (202), a chip detection part (51), a transmission line cover plate (4), a precision control rod hole and a precision adjusting piece, wherein the chip detection part (51) is fixed in pairs, the transmission line cover plate (4) is fixed on the bearing seat (2) positioned on two sides of the transmission line support groove (202) to fix the transmission cable (52), the precision adjusting piece is arranged at the rear end of the base (1) and used for moving in the axial direction of the precision control rod hole to drive the bearing seat (2) to move in the axial direction of the groove (101) to complete precision positioning of the Hall probe (5).

2. The packaging structure of the Hall probe according to claim 1, wherein the precision adjusting member comprises a first adjusting member and a second adjusting member, the precision control rod hole comprises a retraction hole (102) and a screwing-out hole (103), the retraction hole (102) is provided with a thread, the first adjusting member is connected with the retraction hole (102) in a threaded manner and abuts against the rear end of the bearing seat (2), and the first adjusting member is used for screwing in the retraction hole (102) to push the bearing seat (2) to move forwards; bear the rear end of seat (2) and be equipped with screw thread fluting (203) on the corresponding position of second regulating part, the second regulating part passes behind the screw-out trompil (103) with screw thread fluting (203) threaded connection just the head butt of second regulating part is in around the screw-out trompil (103) bear on the seat (2), the second regulating part is used for screw entry is in order to drive in the screw thread fluting (203) bear seat (2) rearward movement.

3. The packaging structure of the hall probe according to claim 2, wherein the front end of the base (1) is a precision control part (104), the width of the precision control part (104) is smaller than the maximum width of the base (1), a precision control hole (1041) is formed in the side surface of the precision control part (104), a third adjusting member in threaded connection with the precision control hole (1041) is arranged in the precision control hole (1041), and the third adjusting member is used for spirally retracting on the precision control hole (1041) to push the bearing base (2) to move in the first direction so as to complete the precision adjustment of the chip detection part (51) in the horizontal direction.

4. The packaging structure of the hall probe according to claim 3, wherein a portion of the base (1) close to the precision control portion (104) is a reference control portion (105), the reference control portion (105) is provided with at least two reference control holes (1051) on the other side of the side surface of the base (1) where the precision control hole (1041) is located, the reference control holes (1051) are provided with fourth adjusting members in threaded connection therewith, and the fourth adjusting members are used for spirally retracting on the precision control holes (1041) to push the bearing base (2) to move in the second direction so as to complete reference positioning of the chip detection portion (51) in the horizontal direction.

5. The packaging structure of the Hall probe according to claim 3, wherein a scale is provided on the surface of the precision control portion (104), and the adjustment of the bearing seat (2) in the axial direction thereof is completed by moving the front end surface of the bearing seat (2) on the scale by a corresponding distance.

6. The packaging structure of the Hall probe according to claim 1, characterized in that a fixing slot (204) is provided above the chip bracket (201), the width of the fixing slot (204) is larger than that of the chip bracket (201), the chip cover plate (3) is provided with a boss (31), and the height and width of the boss (31) are respectively matched with the depth and width of the fixing slot (204).

7. The packaging structure of the Hall probe according to claim 1, further comprising a package cover plate (6), wherein the package cover plate (6) is fixedly connected with the base (1) so as to be pressed over the interface between the chip cover plate (3) and the transmission line cover plate (4) and completely cover the chip cover plate (3).

8. The packaging structure of the Hall probe according to claim 7, wherein the carrier (2), the chip cover plate (3) and the package cover plate (6) are made of anti-interference materials.

9. The magnetic flux detection equipment is characterized by comprising a detection platform (7), a movable adjusting mechanism (8), a Hall probe (5) and the packaging structure of the Hall probe as claimed in any one of claims 1 to 8, wherein the detection platform (7) is used for bearing and fixing a product to be detected with a magnetic object, and the packaging structure provided with the Hall probe (5) is used for driving the product to be detected to move on a plane parallel to the end face of the product to be detected through the movable adjusting mechanism (8) after the installation accuracy of the Hall probe (5) is adjusted so as to complete the magnetic flux detection process of the product to be detected.

10. A method for managing and controlling packaging accuracy of a hall probe, the method being implemented based on a packaging structure of a hall probe according to any one of claims 1 to 8, wherein a precision control hole (1041) is formed in a front end of a base (1), and a third adjusting member in threaded connection with the precision control hole (1041) is arranged on the precision control hole, and the method comprises:

fixing the base (1) which is finished in the fine machining at the front end of a mounting plate of the mobile adjusting mechanism in the horizontal direction so as to finish the fine positioning of the base (1) in the X direction, the Y direction and the Z direction;

placing a chip detection part (51) of the Hall probe (5) in a chip bracket (201), placing transmission light in a transmission line bracket (202) and enabling a transmission cable (52) to extend out of the rear end of the transmission line bracket (202) along the axial direction of the transmission cable;

placing a bearing seat (2) bearing the Hall probe (5) in a groove (101) of a base (1);

the precision adjusting piece is adjusted to finish the fine positioning of the bearing seat (2) in the Y direction so as to finish the fine positioning of the Hall probe (5) in the Y direction;

adjusting a third adjusting piece to finish the fine positioning of the bearing seat (2) in the X direction so as to finish the fine positioning of the Hall probe (5) in the X direction;

fixing the chip cover plate (3) on the bearing seats (2) positioned at two sides of the chip bracket (201) to fix the chip detection part (51), and fixing the transmission line cover plate (4) on the bearing seats (2) positioned at two sides of the transmission line bracket (202) to fix the transmission cable (52) so as to finish the precise positioning of the Hall probe (5) in the Z direction and the R direction.