CN115112675A - Micro LED display panel defect detection device and method - Google Patents
Micro LED display panel defect detection device and method Download PDFInfo
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- CN115112675A CN115112675A CN202210710592.0A CN202210710592A CN115112675A CN 115112675 A CN115112675 A CN 115112675A CN 202210710592 A CN202210710592 A CN 202210710592A CN 115112675 A CN115112675 A CN 115112675A
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
Abstract
The invention discloses a Micro LED display panel defect detection device and method. The device comprises a color analyzer, a planar array colorimeter, a planar array camera, a control module and a data processing module; the color analyzer is used for acquiring first brightness and chrominance data of a designated area when the display panel lights the first picture set; the control module is used for controlling the display panel to carry out Gamma correction according to the first brightness and chromaticity data, controlling the surface array type colorimeter to acquire second brightness and chromaticity data when the display panel after Gamma correction lights a second picture set, and controlling the surface array type camera to acquire an LED appearance image in the display panel; and the data processing module determines abnormal LED points with abnormal chromaticity or brightness and coordinates thereof according to the second brightness and chromaticity data, and determines defect types of the abnormal LED points according to the LED appearance image. The invention can detect various defects of the Micro LED display panel.
Description
Technical Field
The application relates to the technical field of display panels, in particular to a Micro LED display panel defect detection device and method.
Background
Micro LED display panels have become the best display technology in the industry today due to their excellent display performance. However, even if the transfer yield is 99.99% due to the influence of the transfer yield of a huge transfer bonding process, thousands of chips are abnormal for a 4K screen body, and the display performance of the Micro LED panel is greatly reduced. Therefore, after mass transfer, the Micro LED panel needs to be subjected to an AOI technology-based image quality detection technology, abnormal LEDs are detected and positioned, and data is provided to Micro LED repair equipment for repair, so as to improve the yield and quality of the Micro LED panel.
The existing technical scheme is based on a conventional industrial camera, and abnormal LED lamp beads can not be found out by shooting a panel image through the camera, so that absolute measurement of LED brightness and chromaticity can not be carried out, and dead point LEDs and missing LEDs can not be distinguished.
Disclosure of Invention
Aiming at least one defect or improvement requirement in the prior art, the invention provides a device and a method for detecting the defects of a Micro LED display panel, which can detect various defects of the Micro LED display panel.
In order to achieve the above object, according to a first aspect of the present invention, there is provided a Micro LED display panel defect detecting apparatus, including:
the system comprises a color analyzer, a planar array colorimeter, a planar array camera, a control module and a data processing module;
the color analyzer is used for acquiring first brightness and chrominance data of a designated area when the display panel lights the first picture set;
the control module is used for controlling the display panel to carry out Gamma correction according to the first brightness and chromaticity data, controlling the area array colorimeter to acquire second brightness and chromaticity data when the display panel after the Gamma correction lightens a second picture set, and controlling the area array camera to acquire an LED appearance image in the display panel;
and the data processing module determines abnormal LED points with abnormal chromaticity or brightness and coordinates thereof according to the second brightness and chromaticity data, and determines defect types of the abnormal LED points according to the LED appearance image.
Further, the Micro LED display panel defect detection device further comprises a re-judging Micro-camera, and the control device is further used for controlling the re-judging Micro-camera to perform point-by-point image capture on the abnormal LED points according to the coordinates of the abnormal LED points.
Further, the determining the defect type of the abnormal LED point according to the LED appearance image includes:
if the LED appearance image shows that the abnormal LED point has no LED particles, the abnormal LED point is a missing defect;
and if the LED appearance image shows that the abnormal LED point has LED particles, the abnormal LED point is a dead point defect.
Further, the data processing module is also used for determining the LED particles with rotation abnormality and offset abnormality according to the LED appearance image.
Further, the determining, according to the LED appearance image, the LED particles with rotational anomalies and offset anomalies includes:
acquiring standard positions of all LED particles preset by the display panel;
the LED appearance image acquires the actual position of the LED particles, the standard position and the actual position are both coordinates in an xyz three-dimensional coordinate system, the x axis and the y axis are the horizontal and vertical coordinate axes of the plane where the display panel is located, and the z axis is the coordinate axis perpendicular to the plane where the display panel is located;
and comparing the standard position with the actual position, determining the LED with the difference of the x value or the y value of the standard position and the actual position larger than a first preset threshold as the LED particle with abnormal deviation, and determining the point with the difference of the z value of the standard position and the actual position larger than a second preset threshold as the LED particle with abnormal rotation.
And further, when the area array type camera is controlled to collect the LED appearance image in the display panel, the display panel is controlled to move, the area array type camera is fixed, and the area array type camera is controlled to perform flying shooting and image taking on the moving display panel.
Further, the control module is further configured to control the color analyzer to obtain third luminance and chrominance data of a designated area when the Gamma-corrected display panel lights up a plurality of pictures in the second picture set, and correct the second luminance and chrominance data by using the third luminance and chrominance data.
Further, the planar array colorimeter has a first resolution and a first resolution, the planar array camera has a second resolution and a second resolution, the first resolution is higher than the second resolution, and the first resolution is lower than the second resolution.
According to the second aspect of the invention, the invention also provides a Micro LED display panel defect detection method, which comprises the following steps:
acquiring first brightness and chrominance data of a designated area when a display panel lights a first picture set by using a color analyzer;
controlling the display panel to carry out Gamma correction according to the first brightness and chromaticity data, and acquiring second brightness and chromaticity data when the display panel after the Gamma correction lights a second picture set by using a planar array colorimeter;
collecting an LED appearance image in a display panel by using a planar array camera;
and determining abnormal LED points with abnormal chromaticity or brightness and coordinates thereof according to the second brightness chromaticity data, and determining defect types of the abnormal LED points according to the LED appearance image.
In general, compared with the prior art, the above technical solution contemplated by the present invention can achieve the following beneficial effects:
(1) through utilizing the color analyzer, the area array colorimeter and the area array camera to be mutually matched for use, and utilizing first brightness and chromaticity data collected by the color analyzer, second brightness and chromaticity collected by the area array colorimeter and an LED appearance image collected by the area array camera, abnormal LED points can be detected and the defect types of the abnormal LED points can be determined, so that different defects of the abnormal LED points of the Micro LED display panel can be effectively distinguished.
(2) And the re-judging camera is used for capturing images of abnormal LED points, so that personnel can re-judge and position the process reason causing the abnormal LED display, and the repair of downstream repair equipment is remarkably improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic flowchart of a method for detecting defects of a Micro LED display panel according to an embodiment of the present disclosure;
fig. 2 is a schematic flow chart of a method for detecting defects of a Micro LED display panel according to another embodiment of the present disclosure.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and do not limit the invention. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
The terms "first," "second," "third," and the like in the description and claims of this application and in the above-described drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or modules is not limited to the listed steps or modules but may alternatively include other steps or modules not listed or inherent to such process, method, article, or apparatus.
The Micro LED display panel defect detection device of the embodiment of the invention comprises: the system comprises a color analyzer, a planar array colorimeter, a planar array camera, a control module and a data processing module; the color analyzer is used for acquiring first brightness and chrominance data of a designated area when the display panel lights the first picture set; the control module is used for controlling the display panel to carry out Gamma correction according to the first brightness and chromaticity data, controlling the surface array colorimeter to acquire second brightness and chromaticity data when the display panel after the Gamma correction lightens a second picture set, and controlling the surface array camera to acquire an LED appearance image in the display panel;
and the data processing module determines abnormal LED points with abnormal chromaticity or brightness and coordinates thereof according to the second brightness and chromaticity data, and determines defect types of the abnormal LED points according to the LED appearance image.
The color analyzer can be a probe type color analyzer, and when the display panel lights the first picture set, the control module controls the color analyzer to acquire brightness and chromaticity data at the moment. The first set of pictures may be multiple pictures.
The first luminance chrominance data of the designated area when the display panel lights the first picture set may be the first luminance chrominance data of the central point when the display panel lights the first picture set.
The control module controls the display panel to carry out Gamma correction according to the first brightness and chromaticity data, and then controls the display panel after the Gamma correction to lighten the second picture set. When the display panel lights the second picture set, the image quality is detected by adopting a planar array colorimeter, second luminance and chrominance data are obtained, and all abnormal LED points with abnormal luminance or chrominance are screened out according to the second luminance and chrominance data. The second set of pictures may be a plurality of pictures.
And adopting a planar array camera to perform appearance detection on the panel. The area-array camera generally has high resolution, and can classify dead-spot defects and missing defects.
Further, determining the defect type of the abnormal LED point according to the LED appearance image includes: for abnormal LED points detected by a color analyzer and the surface array chromaticity, if the LED appearance image shows that the abnormal LED points have no LED particles, the abnormal LED points are missing defects, namely the point positions are missing LED particles; if the LED appearance image shows that the abnormal LED point has LED particles, the abnormal LED point is a dead point defect, namely the LED particles at the point are necrotic.
Further, the data processing module is also used for determining the LED particles with rotation abnormality and offset abnormality according to the LED appearance image. Due to the massive transfer process, after the LED is transferred, the actual position of the LED has an offset compared with the standard position due to the error of the transfer. By adopting the area array type camera, the actual position of the LED can be obtained, and whether the offset exists or not is judged according to the actual position of the LED and the standard position.
Further, determining the LED particles with rotation anomalies and offset anomalies according to the LED appearance image includes:
acquiring standard positions of all LED particles preset by a display panel;
the LED appearance image acquires the actual position of the LED particles, the standard position and the actual position are both coordinates in an xyz three-dimensional coordinate system, the x axis and the y axis are the horizontal and vertical coordinate axes of the plane where the display panel is located, and the z axis is the coordinate axis perpendicular to the plane where the display panel is located;
and comparing the standard position with the actual position, determining the LED with the difference of the x value or the y value of the standard position and the actual position larger than a first preset threshold as the LED particle with abnormal deviation, and determining the point with the difference of the z value of the standard position and the actual position larger than a second preset threshold as the LED particle with abnormal rotation.
Further, when acquiring the LED appearance image in the control surface array type camera acquisition display panel, the control display panel moves, the fixed surface array type camera, the control surface array type camera fly-shoot the display panel that moves and get for the picture. Namely, a flying shooting mode is adopted, a Z-shaped shooting path can be adopted, the array camera is controlled to be fixed, and the panel moves. Because if the area array camera moves, it will need to drive other cameras such as color analyzer, area array colorimeter, etc. to move together.
Further, the area array colorimeter has a first resolution and a first resolution, the area array camera has a second resolution and a second resolution, the first resolution is higher than the second resolution, and the first resolution is lower than the second resolution.
The required resolution for detecting the image quality is determined by the size of the image pixel point, so that the required resolution is high. The resolution required for appearance inspection is determined by the size of the LED, which is low. The camera frame rate at high resolution is low, typically only two or three frames. The low-resolution camera frame rate is very high, which can reach dozens of frames, and then the appearance detection needs to take multiple pictures, so that a high-frame-rate camera is needed to increase the detection speed. The image quality detection only needs to take one image, so that the detection time can be saved under the condition that the frame rate is not required to be very high and the resolution is very high.
Through utilizing the cooperation of mutually between color analysis appearance, area array formula colorimeter, area array formula camera to use, utilize the first luminance chrominance data that color analysis appearance gathered, the second luminance chrominance that area array formula colorimeter gathered and the LED outward appearance image that area array formula camera gathered, can detect out unusual LED point and confirm the defect classification of unusual LED point, realize effectively distinguishing the different defects of unusual LED point of Micro LED display panel.
Further, the control module is further configured to control the color analyzer to obtain third luminance and chrominance data of the designated area when the Gamma-corrected display panel lights up the plurality of pictures in the second picture set, and correct the second luminance and chrominance data by using the third luminance and chrominance data.
The control module can be used for controlling the color analyzer to obtain third luminance and chrominance data of a designated area when the Gamma-corrected display panel lights a plurality of pictures in the second picture set before the control surface matrix colorimeter collects the second luminance and chrominance data when the Gamma-corrected display panel lights the second picture set, and correcting the second luminance and chrominance data by using the third luminance and chrominance data after collecting the second luminance and chrominance data when the Gamma-corrected display panel lights the second picture set.
Namely, the control module controls the display panel after Gamma correction to light one or more pictures in the second picture set, and controls the color analyzer to obtain the third luminance and chrominance data again. And then controlling a surface array colorimeter to acquire second brightness and chrominance data when the display panel subjected to Gamma correction lightens a second picture set. At the moment, the color analyzer and the area array colorimeter both acquire data of the same picture, and analyze the difference value between third brightness data and second brightness chrominance data corresponding to the same picture, so that the correction values of other different pictures in the second brightness chrominance data can be determined. Like this, can promote the accuracy of planar array formula colorimeter to improve follow-up defect detection's accuracy.
The control module can be used for controlling the color analyzer to obtain third luminance and chrominance data of a designated area when the Gamma-corrected display panel lights a plurality of pictures in the second picture set when the Gamma-corrected display panel lights the second picture set when the control-surface-array colorimeter collects the second luminance and chrominance data when the Gamma-corrected display panel lights the second picture set, and correcting the second luminance and chrominance data by using the third luminance and chrominance data.
Furthermore, the Micro LED display panel defect detection device further comprises a re-judging Micro-camera, and the control device is further used for controlling the re-judging Micro-camera to carry out point-by-point image capture on the abnormal LED points according to the coordinates of the abnormal LED points. The method controls the re-judging microscope camera to move to a corresponding position for picking up images point by point for relevant personnel to judge and position the process reason causing the abnormal LED display, so that the repair of downstream repair equipment is remarkably improved.
Further, the Micro LED display panel defect detection device further comprises a crimping conduction assembly, and the control module is electrically connected with the crimping conduction assembly. Further, the Micro LED display panel defect detection device further comprises a signal generator, and the signal generator is electrically connected with the control module.
The pressure welding conducting assembly and the signal generator are used for enabling the display panel to light a specified picture during detection.
Further, Micro LED display panel defect detecting device still includes: the display device comprises a carrying platform for carrying the display panel and a first moving unit for adjusting the spatial position of the carrying platform, wherein the first moving unit is electrically connected with the control module.
Further, Micro LED display panel defect detecting device still includes: the color analyzer comprises a first bracket for bearing the color analyzer and a second movement unit for adjusting the spatial position of the first bracket, wherein the second movement unit is electrically connected with the control module.
Further, Micro LED display panel defect detecting device still includes: the second support is used for bearing the planar array colorimeter and the third moving unit is used for adjusting the spatial position of the second support and is electrically connected with the control module.
The first motion unit, the second motion unit and the third motion unit are used for realizing the movement of the color analyzer, the planar array colorimeter and the display panel.
Further, Micro LED display panel defect detecting device still includes frame and bumper shock absorber, and the microscope carrier passes through the bumper shock absorber and is connected with the frame, and the area array camera sets up in the frame.
As shown in fig. 1, a method for detecting a defect of a Micro LED display panel according to an embodiment of the present invention includes:
s101, collecting first brightness and chrominance data of a designated area when a first picture set is lightened by a display panel by using a color analyzer;
s102, controlling the display panel to carry out Gamma correction according to the first brightness and chromaticity data, and collecting second brightness and chromaticity data when the display panel after the Gamma correction lightens a second picture set by using a planar array colorimeter;
s103, collecting an LED appearance image in the display panel by using a planar array camera;
and S104, determining abnormal LED points with abnormal chromaticity or brightness and coordinates thereof according to the second brightness chromaticity data, and determining defect types of the abnormal LED points according to the LED appearance image.
Further, the method for detecting the defects of the Micro LED display panel further comprises the following steps: and performing point-by-point image capture on the abnormal LED points by using a re-judging micro-camera according to the coordinates of the abnormal LED points. .
Further, determining the defect type of the abnormal LED point according to the LED appearance image includes:
if the abnormal LED points are displayed in the LED appearance image and no LED particles exist, the abnormal LED points are the missing defects;
and if the LED appearance image shows that the abnormal LED point has LED particles, the abnormal LED point is a dead point defect.
Further, the method for detecting the defects of the Micro LED display panel further comprises the following steps: and controlling a color analyzer to obtain third luminance and chrominance data of a designated area when the display panel after Gamma correction lightens a plurality of pictures in the second picture set, and correcting the second luminance and chrominance data by using the third luminance and chrominance data.
The specific implementation of the method is the same as the above device, and is not described herein again.
In another embodiment, as shown in fig. 2, the method for detecting defects of a Micro LED display panel includes the steps of:
(1) the sign indicating number and location are swept to the display panel material loading, and control module moves the panel according to the location data and switches on the subassembly down to the crimping, and the crimping switches on the subassembly and pushes down, realizes lighting of panel.
(2) The signal generator drives the panel to light a specified picture, the probe type color analyzer optical head moves to the upper end of the panel to measure the brightness and the chromaticity of a specified area of the panel, the brightness and the chromaticity are called as first brightness and chromaticity data, and the data processing module carries out Gamma correction on the panel according to the measured data.
(3) The color analyzer optical head moves out, the area array type colorimeter optical head moves to the upper end of the panel after Gamma correction, the signal generator drives the panel to light the appointed picture, the area array type colorimeter sequentially captures the appointed picture, the appointed picture is called as second brightness and chromaticity data, the data processing module detects the panel according to the second brightness and chromaticity data, and all the LED lamp bead coordinates and characteristics with abnormal brightness and chromaticity are output.
(4) The face array type colorimeter shifts out, and the crimping switches on the crimping probe of subassembly and pops out, and under the face array type camera was removed to the panel, the face array type camera carried out the multifrequency spectrum according to the flow of flying to shoot to the panel and flies to shoot for, and data processing module detects the panel according to image data, and the measuring value of the rotatory and skew of all LEDs of output, the coordinate and the characteristic of the lamp pearl of all LED deletions are exported.
(5) The panel moves to the position below the crimping conduction assembly, and the crimping conduction assembly is pressed into the panel to light the panel. And (4) the detection system outputs specified defect coordinates by combining the measurement data comprehensive analysis in the steps (3) and (4), and the optical head of the re-judging microscope camera moves to the defect point by point to take a picture of the defect point by point.
Furthermore, before the step (1) of adjusting the value in the step (4), appearance detection is performed, and then Gamma correction, chromaticity measurement and re-judgment are performed, so that the crimping times can be reduced.
Further, before the step (3), the color analyzer is controlled to obtain brightness and chromaticity data of a designated area when the display panel after Gamma correction lights a plurality of pictures in the designated pictures in the step (3), the brightness and chromaticity data is called as third brightness and chromaticity data, after the second brightness and chromaticity data is obtained in the step (3), the third brightness and chromaticity data is firstly used for correcting the second brightness and chromaticity data, and all LED lamp bead coordinates and characteristics with abnormal brightness and chromaticity are output according to the corrected second brightness and chromaticity data.
Through the optical detection device integration with 4 different grade types together, including the color analysis appearance, the area array colorimeter, the area array camera, the Micro-camera of reexamination, use of mutually supporting, specifically for utilizing the color analysis appearance to carry out the Gamma correction, utilize the color analysis appearance to rectify the testing result of area array colorimeter simultaneously, the image quality that adopts the area array colorimeter of high resolution low resolution to detect and the outward appearance of the area array camera of low resolution high resolution and combine together, realize showing the effective differentiation of dead point class defect and disappearance class defect in the unusual LED of Micro LED panel, utilize the Micro-camera of reexamination to get for instance and reexamination unusual lamp pearl at last, can provide unusual LED lamp pearl high definition image, the staff reexamination and location cause the unusual technology reason of LED display, make the restoration of low reaches repair equipment show and promote.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the modules is only one type of logical functional division, and other divisions may be realized in practice, for example, multiple modules or components may be combined or integrated into another apparatus, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of some service interfaces, devices or modules, and may be an electrical or other form.
The modules described as separate parts may or may not be physically separate, and parts displayed as modules may or may not be physical modules, may be located in one place, or may be distributed on a plurality of network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment.
In addition, each module in the embodiments of the present application may be integrated into one module, or each module may exist alone physically, or two or more modules may be integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode.
The above description is only an exemplary embodiment of the present disclosure, and the scope of the present disclosure should not be limited thereby. That is, all equivalent changes and modifications made in accordance with the teachings of the present disclosure are intended to be included within the scope of the present disclosure. Embodiments of the present disclosure will be readily apparent to those skilled in the art from consideration of the specification and practice of the disclosure herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. The utility model provides a Micro LED display panel defect detecting device which characterized in that includes:
the system comprises a color analyzer, a planar array colorimeter, a planar array camera, a control module and a data processing module;
the color analyzer is used for acquiring first brightness and chrominance data of a designated area when the display panel lights the first picture set;
the control module is used for controlling the display panel to carry out Gamma correction according to the first brightness and chromaticity data, controlling the area array colorimeter to acquire second brightness and chromaticity data when the display panel is lightened by a second picture set after the Gamma correction, and controlling the area array camera to acquire an LED appearance image in the display panel;
and the data processing module is used for determining abnormal LED points with abnormal chromaticity or brightness and coordinates thereof according to the second brightness and chromaticity data, and determining defect types of the abnormal LED points according to the LED appearance image.
2. The Micro LED display panel defect detecting device of claim 1, further comprising a re-judging Micro camera, wherein the control device is further configured to control the re-judging Micro camera to image the abnormal LED points point by point according to the coordinates of the abnormal LED points.
3. The Micro LED display panel defect detection device of claim 1, wherein the determining the defect type of the abnormal LED point from the LED appearance image comprises:
if the abnormal LED point is displayed in the LED appearance image without LED particles, the abnormal LED point is a missing defect;
and if the LED appearance image shows that the abnormal LED point has LED particles, the abnormal LED point is a dead point defect.
4. The Micro LED display panel defect detection device of claim 1, wherein the data processing module is further configured to determine the presence of LED particles with rotational anomalies and offset anomalies from the LED appearance image.
5. The Micro LED display panel defect detection device of claim 4, wherein the determining of the existence of the LED particles with rotation abnormality and the deviation abnormality according to the LED appearance image comprises:
acquiring standard positions of all LED particles preset by the display panel;
the LED appearance image acquires the actual position of the LED particles, the standard position and the actual position are both coordinates in an xyz three-dimensional coordinate system, the x axis and the y axis are the horizontal and vertical coordinate axes of the plane where the display panel is located, and the z axis is the coordinate axis perpendicular to the plane where the display panel is located;
and comparing the standard position with the actual position, determining the LED with the difference of the x value or the y value of the standard position and the actual position larger than a first preset threshold as the LED particle with abnormal deviation, and determining the point with the difference of the z value of the standard position and the actual position larger than a second preset threshold as the LED particle with abnormal rotation.
6. The Micro LED display panel defect detecting device of claim 1, wherein the area array camera is controlled to move when collecting the LED appearance image in the display panel, the area array camera is fixed, and the area array camera is controlled to take a flying shot of the moving display panel.
7. The Micro LED display panel defect detection device of claim 1, wherein the control module is further configured to control the color analyzer to obtain third luminance chromaticity data of a designated area when the Gamma-corrected display panel lights up a plurality of pictures in the second picture set, and to correct the second luminance chromaticity data by using the third luminance chromaticity data.
8. A Micro LED display panel defect detecting device as claimed in claim 1, wherein the area array colorimeter has a first resolution and a first resolution, the area array camera has a second resolution and a second resolution, the first resolution is higher than the second resolution, and the first resolution is lower than the second resolution.
9. A Micro LED display panel defect detection method is characterized by comprising the following steps:
acquiring first brightness and chrominance data of a designated area when a display panel lights a first picture set by using a color analyzer;
controlling the display panel to carry out Gamma correction according to the first brightness and chromaticity data, and acquiring second brightness and chromaticity data when the display panel after the Gamma correction lights a second picture set by using a planar array colorimeter;
collecting an LED appearance image in a display panel by using a planar array camera;
and determining abnormal LED points with abnormal chromaticity or brightness and coordinates thereof according to the second brightness chromaticity data, and determining defect types of the abnormal LED points according to the LED appearance image.
10. The Micro LED display panel defect detection method of claim 9, further comprising: and carrying out point-by-point image capture on the abnormal LED points by using a re-judging micro-camera according to the coordinates of the abnormal LED points.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115825101A (en) * | 2022-12-08 | 2023-03-21 | 广东芯乐光光电科技有限公司 | Mini LED panel optical detection equipment and detection method thereof |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115825101A (en) * | 2022-12-08 | 2023-03-21 | 广东芯乐光光电科技有限公司 | Mini LED panel optical detection equipment and detection method thereof |
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