CN115097258A - Power-off protection device - Google Patents
Power-off protection device Download PDFInfo
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- CN115097258A CN115097258A CN202210723614.7A CN202210723614A CN115097258A CN 115097258 A CN115097258 A CN 115097258A CN 202210723614 A CN202210723614 A CN 202210723614A CN 115097258 A CN115097258 A CN 115097258A
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- power supply
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
- G01R31/086—Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution networks, i.e. with interconnected conductors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J9/00—Circuit arrangements for emergency or stand-by power supply, e.g. for emergency lighting
- H02J9/04—Circuit arrangements for emergency or stand-by power supply, e.g. for emergency lighting in which the distribution system is disconnected from the normal source and connected to a standby source
- H02J9/06—Circuit arrangements for emergency or stand-by power supply, e.g. for emergency lighting in which the distribution system is disconnected from the normal source and connected to a standby source with automatic change-over, e.g. UPS systems
- H02J9/061—Circuit arrangements for emergency or stand-by power supply, e.g. for emergency lighting in which the distribution system is disconnected from the normal source and connected to a standby source with automatic change-over, e.g. UPS systems for DC powered loads
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J9/00—Circuit arrangements for emergency or stand-by power supply, e.g. for emergency lighting
- H02J9/04—Circuit arrangements for emergency or stand-by power supply, e.g. for emergency lighting in which the distribution system is disconnected from the normal source and connected to a standby source
- H02J9/06—Circuit arrangements for emergency or stand-by power supply, e.g. for emergency lighting in which the distribution system is disconnected from the normal source and connected to a standby source with automatic change-over, e.g. UPS systems
- H02J9/068—Electronic means for switching from one power supply to another power supply, e.g. to avoid parallel connection
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
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- Business, Economics & Management (AREA)
- Emergency Management (AREA)
- Protection Of Static Devices (AREA)
Abstract
The application discloses power-off protection device, the device includes: a tank circuit and a first failure diagnosis circuit; the energy storage circuit is used for being connected with a power supply of the chip in parallel; the input end of the first fault diagnosis circuit is used for being connected with a power supply, and the output end of the first fault diagnosis circuit is used for being connected with the chip; the first fault diagnosis circuit is used for sending a first electric signal representing power supply disconnection to the chip under the condition that the voltage corresponding to the input end of the first fault diagnosis circuit is smaller than or equal to a first preset voltage threshold value.
Description
Technical Field
The application relates to the technical field of automobile electronic control, in particular to a power-off protection device.
Background
The vehicle is provided with a plurality of electronic control units, the vehicle is safely driven through the combined control of the electronic control units, and the electronic control units often cannot leave the power supply process of the electronic control units in the working process, so that the stable and reliable operation of the whole electronic control units is ensured.
However, in the process of supplying power to the electronic control unit, the battery is often exposed to the moment of sudden power failure or vehicle starting, at this time, the voltage value of the battery is instantly reduced, and for a power chip or a single chip microcomputer in the electronic control unit, when the voltage value of a power pin of the power chip or the single chip microcomputer is reduced to a lower voltage limit value which cannot maintain normal operation of the power chip or the single chip microcomputer, the power chip or the single chip microcomputer enters a logic disordered state, so that the power chip or the single chip microcomputer is seriously damaged, and therefore, a reliable and stable fault diagnosis mode is needed to monitor the power chip or the single chip microcomputer.
In the prior art, the storage battery is often subjected to fault diagnosis in a resistor voltage division mode, but the mode is a process of monitoring a generated analog signal, and at the moment that a power supply abnormally fails or a vehicle is started, a plurality of sampling results are needed by a diagnosis mechanism to determine the abnormal power failure of the storage battery, so that a power supply chip or a single chip microcomputer cannot enter a safe state in time, or an interrupt instruction cannot be sent to a load module in time, and the load module cannot be ensured to enter the safe state in time.
Therefore, an improved power failure protection device is needed to solve the above technical problems.
Disclosure of Invention
In order to solve the problems in the prior art, an embodiment of the present application provides a technical solution of a power-off protection device, where the technical solution is as follows:
the application provides a power-off protection device, includes: a tank circuit and a first fault diagnosis circuit;
the energy storage circuit is used for being connected with a power supply of the chip in parallel;
the input end of the first fault diagnosis circuit is used for being connected with the power supply, and the output end of the first fault diagnosis circuit is used for being connected with the chip;
the first fault diagnosis circuit is used for sending a first electric signal representing power supply disconnection to the chip under the condition that the voltage corresponding to the input end of the first fault diagnosis circuit is smaller than or equal to a first preset voltage threshold value.
The application provides a power-off protection device has following technological effect:
by arranging the energy storage circuit and the first fault diagnosis circuit, the embodiment of the application realizes the under-voltage fault diagnosis of the circuit, and solves the problems that a diagnosis mechanism in the prior art needs a plurality of sampling results to determine the abnormal power failure of the storage battery, so that a power supply chip or a single chip microcomputer cannot enter a safe state in time and the like. Specifically, the energy storage circuit is used for being connected with a power supply of the chip in parallel; the input end of the first fault diagnosis circuit is used for being connected with a power supply, and the output end of the first fault diagnosis circuit is used for being connected with the chip; the first fault diagnosis circuit is used for sending a first electric signal representing power supply disconnection to the chip under the condition that the voltage corresponding to the input end of the first fault diagnosis circuit is smaller than or equal to a first preset voltage threshold value.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the description below are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a power-off protection device according to an embodiment of the present disclosure;
wherein the reference numerals correspond to: 10-a power supply; 20-a tank circuit; 21-a second diode; 22-an energy storage capacitor; 30-a first fault diagnosis circuit; 31-voltage comparison loop; 32-a first resistance; 33-a second resistance; 34-a zener diode; 35-a first diode; 36-ninth resistance; 37-tenth resistance; 311-a voltage comparator; 312-a field effect transistor; 313-a third resistance; 40-a second fault diagnosis circuit; 41-supply circuit; 411-a filter capacitance; 412-a power supply chip; 421-fourth resistance; 422-a fifth resistance; 50-a chip; 60-a voltage output circuit; 61-sixth resistance; 62-a seventh resistance; 63-a first triode; 64-a second triode; 65-eighth resistance; 70-eleventh resistance; 71-twelfth resistance; 72-a third diode; 80-load.
Detailed Description
The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only some embodiments of the present application, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein.
Referring to fig. 1, a schematic structural diagram of a power-off protection device according to an embodiment of the present application is shown, and a detailed description is provided below with reference to fig. 1.
The embodiment of the present application provides a power failure protection device, which specifically includes a tank circuit 20 and a first fault diagnosis circuit 30.
The energy storage circuit 20 is used for being connected with the power supply 10 of the chip 50 in parallel; the input end of the first failure diagnosis circuit 30 is used for connecting with the power supply 10, and the output end of the first failure diagnosis circuit 30 is used for connecting with the chip 50; first fault diagnosis circuit 30 is configured to send a first electrical signal indicating that the power supply is disconnected to chip 50 when a voltage corresponding to an input terminal of first fault diagnosis circuit 30 is equal to or less than a first preset voltage threshold.
In an alternative embodiment, first fault diagnosis circuit 30 is further configured to send a second electrical signal to chip 50, indicating that the power is turned on, if the voltage corresponding to the input terminal of first fault diagnosis circuit 30 is greater than a first preset voltage threshold.
In the embodiment of the present application, the first fault diagnosis circuit 30 is configured to implement under-voltage fault diagnosis on the circuit, so that when the voltage corresponding to the input terminal of the first fault diagnosis circuit 30 is less than or equal to a first preset voltage threshold, the first fault diagnosis circuit 30 outputs a first electrical signal, where the first electrical signal is a low-potential diagnosis signal, and when the first fault diagnosis circuit 30 outputs the low-potential diagnosis signal, it indicates that the circuit supplying power to the chip 50 is in an abnormal state, that is, the output voltage of the power supply 10 is less than or equal to the first preset voltage threshold, at this time, the chip 50 enters a corresponding safe state, and for example, the operation corresponding to the safe state may be an operation of recording the abnormal state, resetting the power supply chip, prohibiting reading and writing of the RAM, or reducing the load 80, and when the voltage corresponding to the input terminal of the first fault diagnosis circuit 30 is greater than the first preset voltage threshold, the first fault diagnosis circuit 30 outputs a second electrical signal, wherein the second electrical signal is a high-potential diagnosis signal, and when the first fault diagnosis circuit 30 outputs the high-potential diagnosis signal, it indicates that the circuit supplying power to the chip 50 is in a normal state, that is, the output voltage of the power supply 10 is greater than a first preset voltage threshold, at this time, the chip 50 does not need to enter a corresponding safe state, and thus, the reliability and the safety of the circuit are improved.
It should be noted that the first preset voltage threshold may be zero, that is, the power supply 10 is damaged, and the power supply to the chip 50 is stopped, and the first preset voltage threshold may also be a certain voltage threshold, that is, the output voltage of the power supply 10 is smaller than the rated output voltage of the power supply 10, which is not limited specifically herein.
In an embodiment, the first electrical signal and the second electrical signal are diagnostic signals in two states, and it can be understood herein that, in the case that the chip 50 receives the first electrical signal, the chip 50 enters a corresponding safe state, so that a fault can be diagnosed quickly, so that the chip 50 enters the safe state quickly; in case the chip 50 receives the second electrical signal, the chip 50 does not need to enter a corresponding safe state.
In practical applications, the input end of the energy storage circuit 20 is connected to the output end of the power supply 10, and the output end of the energy storage circuit 20 is connected to the chip 50, so that when the voltage corresponding to the input end of the first fault diagnosis circuit 30 is less than or equal to the first preset voltage threshold, the chip 50 is powered, and the chip 50 is ensured to maintain normal operation under the condition that the chip 50 receives the first electrical signal.
It should be noted that the chip 50 may be a single chip, and the power supply 10 is used for supplying power to the chip 50.
In an alternative embodiment, with continued reference to fig. 1, the first fault diagnosis circuit 30 includes a voltage comparison loop 31, a first resistor 32, a second resistor 33, a zener diode 34, and a first diode 35.
Wherein, the first resistor 32 is connected in series with the second resistor 33; the first resistor 32 is also connected in series with the inverting input terminal of the voltage comparison loop 31; the anode of the first diode 35 is connected with the output end of the power supply 10, and the cathode of the first diode 35 is connected with the cathode of the zener diode 34; the cathode of the first diode 35 is further connected to the positive input terminal of the voltage comparison circuit 31, and the positive input terminal of the voltage comparison circuit 31 is further connected to the cathode of the zener diode 34; the power supply input end of the voltage comparison loop 31 is connected with the output end of the energy storage circuit 20; the output of the voltage comparison circuit 31 is connected to the input of the chip 50.
In a specific embodiment, the voltage comparison circuit 31 includes a voltage comparator 311, a field effect transistor 312 and a third resistor 313, wherein the output terminal of the voltage comparator 311, the gate of the field effect transistor 312, the source of the field effect transistor 312, the third resistor 313 and the power input terminal of the voltage comparator 311 are connected in sequence; the inverting input terminal of the voltage comparator 311 is connected to the first resistor 32, and the non-inverting input terminal of the voltage comparator 311 is connected to the zener diode 34.
In an optional embodiment, in a case that a voltage corresponding to the input terminal of the first fault diagnosis circuit 30 is greater than a first preset voltage threshold, the voltage comparator 311 outputs a first voltage value, and the field effect transistor 312 is in an off state, so that the first fault diagnosis circuit 30 outputs a second electrical signal; when the voltage corresponding to the input terminal of the first failure diagnosis circuit 30 is less than or equal to the first preset voltage threshold, the voltage comparator 311 outputs the second voltage value, and the field effect transistor 312 is in a conducting state, so that the first failure diagnosis circuit 30 outputs the first electrical signal.
In the embodiment of the present application, the voltage comparator 311 is a circuit for identifying and comparing an input signal, and it can be understood that the voltage comparator 311 is a circuit for comparing voltages at two input terminals, specifically, the voltage comparator 311 includes a positive input terminal and a negative input terminal, and when a voltage at the positive input terminal is higher than a voltage at the negative input terminal, outputs a high voltage; the voltage at the inverting input terminal is higher than the voltage at the non-inverting input terminal of the voltage comparator 311 in fig. 1, such as the "+" input terminal of the voltage comparator 311, and the inverting input terminal of the voltage comparator 311 in fig. 1, such as the "-" input terminal of the voltage comparator 311, and outputs a low voltage.
In practical applications, when the voltage corresponding to the input terminal of the first fault diagnosis circuit 30 is greater than the first preset voltage threshold, the voltage comparator 311 outputs a first voltage value, the field effect transistor 312 is in an off state, so that the first fault diagnosis circuit 30 outputs the second electrical signal, specifically, the voltage value at the inverting input terminal of the voltage comparator 311 is a voltage value after the tube voltage drop of the first resistor 32, the voltage value after the tube voltage drop of the first resistor 32 is determined by the voltage division of the power supply through the first resistor 32 and the second resistor 33, and the voltage value at the non-inverting input terminal of the voltage comparator 311 is a voltage value after the tube voltage drop of the first diode 35. Under the condition that the voltage corresponding to the input terminal of the first fault diagnosis circuit 30 is greater than the first preset voltage threshold, since the voltage value after the tube drop of the first diode 35 is much greater than the second preset voltage threshold, the zener diode 34 is in the reverse breakdown state, and the voltage value after the tube drop of the first diode 35 is the second preset voltage threshold, by reasonably configuring the first resistor 32 and the second resistor 33, the voltage value after the voltage division by the power supply through the first resistor 32 and the second resistor 33 is greater than the second preset voltage threshold, at this time, the voltage value after the tube drop of the first resistor 32 is greater than the voltage value after the tube drop of the first diode 35, that is, the voltage value of the inverting input terminal in the voltage comparator 311 is greater than the voltage value of the non-inverting input terminal in the voltage comparator 311, the voltage comparator 311 outputs the first voltage value, where the first voltage value is a low voltage, since the gate of the field effect transistor 312 is connected to the voltage comparator 311 and the source of the field effect transistor 312 is grounded, at this time, the field effect transistor 312 is in the off state, the voltage value at the output terminal V2 of the first failure diagnosis circuit 30 is affected by the voltage at the output terminal of the chip 50, so that the first failure diagnosis circuit 30 outputs a high voltage diagnosis signal, and when the chip 50 receives the high voltage diagnosis signal, the chip 50 operates normally.
It should be noted that the second preset voltage threshold may be an input under-voltage threshold voltage value for a power supply device for the chip 50, where the power supply device may be the power supply chip 412.
In another practical application, when the output terminal of the power supply 10 is abnormally powered down or the vehicle is started up, the output voltage of the power supply 10 drops instantaneously, the voltage comparator 311 outputs a second voltage value, the field effect transistor 312 is in a conducting state, so that the first fault diagnosis circuit 30 outputs the first electric signal, specifically, the output voltage of the power supply 10 drops instantaneously, so that the voltage value of the inverting input terminal of the voltage comparator 311 is zero, and the voltage value of the non-inverting input terminal of the voltage comparator 311 is greater than zero due to the zener diode 34, at this time, the voltage value of the non-inverting input terminal of the voltage comparator 311 is greater than the voltage value of the inverting input terminal of the voltage comparator 311, and the voltage comparator 311 outputs a second voltage value, wherein the second voltage value is a high voltage, and since the gate of the field effect transistor 312 is connected to the voltage comparator 311, the source of the field effect transistor 312 is grounded, therefore, the field effect transistor 312 is in a conducting state, so that the first failure diagnosis circuit 30 outputs a low voltage diagnosis signal, and the chip 50 enters a corresponding safe state when the chip 50 receives the low voltage diagnosis signal.
In an alternative embodiment, with continued reference to fig. 1, the power outage protection device further includes a second fault diagnosis circuit 40 and a power supply circuit 41.
A first input end of the second fault diagnosis circuit 40 is connected with an output end of the energy storage circuit 20, a second input end of the second fault diagnosis circuit 40 is connected with an output end of the chip 50, and an output end of the chip 50 is further connected with an output end of the second fault diagnosis circuit 40; the output terminal of the second failure diagnosis circuit 40 is connected to the input terminal of the chip 50; the input end of the power supply circuit 41 is connected to the output end of the tank circuit 20, and the output end of the power supply circuit 41 is connected to the chip 50.
In an alternative embodiment, the power supply circuit 41 is connected in parallel with the second failure diagnosis circuit 40; in response to the first electrical signal, the tank circuit 20 discharges the power supply circuit 41, and in the process that the discharge voltage value output by the tank circuit 20 reaches the second preset voltage threshold, the second fault diagnosis circuit 40 outputs a third electrical signal corresponding to the discharge voltage value.
In an alternative embodiment, the power supply circuit 41 includes a filter capacitor 411 and a power supply chip 412, the filter capacitor 411 is connected in series with the power supply chip 412, the second fault diagnosis circuit 40 includes a fourth resistor 421 and a fifth resistor 422, and the fourth resistor 421 is connected in series with the fifth resistor 422.
In an alternative embodiment, the tank circuit 20 comprises a second diode 21 and a tank capacitor 22; the anode of the second diode 21 is connected to the power supply 10, the cathode of the second diode 21 is connected to the charging end of the energy storage capacitor 22, the discharging end of the energy storage capacitor 22 is connected to the input end of the second fault diagnosis circuit 40, and the discharging end of the energy storage capacitor 22 is further connected to the input end of the power supply circuit 41.
In the embodiment of the present application, the power supply circuit 41 is configured to buffer power supplied to the chip 50, where the power supply circuit 41 is configured to buffer power supplied to the chip 50 through the power supply chip 412, and the filter capacitor 411 in the power supply circuit 41 is configured to filter the power supply circuit 41, so as to ensure stability of the circuit. When the input voltage of the power supply chip 412 in the power supply circuit 41 is lower than the threshold voltage of the power supply chip 412, the power supply chip 412 is in an abnormal state, where the threshold voltage is a lower limit voltage capable of maintaining the normal operation of the power supply chip 412, and when the power supply chip 412 is abnormal, the chip 50 may enter a logic chaotic state, and may cause an irreversible loss in a severe case, so that the chip 50 is ensured to enter a corresponding safe state before the input voltage of the power supply chip 412 drops to the threshold voltage.
Specifically, when the voltage corresponding to the input end of the first fault diagnosis circuit 30 is greater than the first preset voltage threshold, the power supply 10 charges the energy storage capacitor 22 in the energy storage circuit 20, so that the energy storage capacitor 22 stores the electric quantity, meanwhile, the power supply 10 charges the power supply circuit 41 to ensure the normal operation of the power supply chip 412, when the voltage corresponding to the input end of the first fault diagnosis circuit 30 is less than or equal to the first preset voltage threshold, the energy storage capacitor 22 discharges to ensure the normal operation of the power supply chip 412 in the power supply circuit 41, and as time goes on, the electric quantity in the energy storage capacitor 22 gradually decreases, and when the voltage value for supplying power to the power supply chip 412 is reduced to the voltage threshold, it is ensured that the chip 50 enters the corresponding safety state.
In practical applications, the second fault diagnosis circuit 40 monitors the output voltage value of the energy storage capacitor 22, and in the process that the discharge voltage value output by the energy storage circuit 20 reaches the second preset voltage threshold, the second fault diagnosis circuit 40 outputs a third electrical signal corresponding to the discharge voltage value, specifically, as shown in fig. 1, the input voltage value of the second fault diagnosis circuit 40 is equal to the input voltage value of the power supply chip 412 and equal to the discharge voltage value output by the energy storage capacitor 22, the output voltage value of the second fault diagnosis circuit 40 is determined by dividing the input voltage value of the second fault diagnosis circuit 40 through the fourth resistor 421 and the fifth resistor 422, so that the input voltage value of the second fault diagnosis circuit 40 can be determined by calculating the output voltage value of the second fault diagnosis circuit 40, and further the input voltage value of the power supply chip 412 and the discharge voltage value output by the energy storage capacitor 22 can be obtained, so that second failure diagnosis circuit 40 outputs a third electric signal corresponding to the discharge voltage value, wherein the third electric signal is an analog signal, and the third electric signal is determined mainly according to the input voltage value of second failure diagnosis circuit 40, so that chip 50 determines the safety state corresponding to the third electric signal according to the third electric signal.
Specifically, the output voltage value of second failure diagnosis circuit 40 is equal to the input voltage value of second failure diagnosis circuit 40 multiplied by the resistance value of fifth resistor 422 divided by the sum of the resistance value of fourth resistor 421 and the resistance value of fifth resistor 422. Note that the output voltage value of the second failure diagnosis circuit 40 is equal to the voltage value at the input terminal V1 of the chip 50.
In an alternative embodiment, with continued reference to fig. 1, the power down protection device further includes a voltage output circuit 60, wherein an input of the voltage output circuit 60 is connected to an output of the chip 50, and an output of the voltage output circuit 60 is connected to an input of the second fault diagnosis circuit 40.
In an alternative embodiment, the voltage output circuit 60 includes a sixth resistor 61, a seventh resistor 62, a first transistor 63, and a second transistor 64; the sixth resistor 61, the base of the first triode 63, the collector of the first triode 63, the seventh resistor 62, the base of the second triode 64, the collector of the second triode 64, and the fourth resistor 421 are sequentially connected in series.
Specifically, when the voltage corresponding to the input terminal of the first fault diagnosis circuit 30 is less than or equal to the first preset voltage threshold, the chip 50 is in a normal operation state, and the output terminal of the chip 50 outputs a high voltage, so that the first triode 63 and the second triode 64 are both in a conduction state, and the second fault diagnosis circuit 40 is further ensured to output a normal voltage value; under the condition that the voltage corresponding to the input end of the first fault diagnosis circuit 30 is greater than the first preset voltage threshold, the chip 50 is in an abnormal operation state, at this time, the output end of the chip 50 outputs a voltage value corresponding to the input voltage value of the chip 50, and on the premise that the first triode 63 and the second triode 64 are ensured to be conducted, the second fault diagnosis circuit 40 outputs a third electric signal corresponding to the discharge voltage value, so that the chip 50 determines a corresponding safety state according to the third electric signal.
In practical applications, when the voltage corresponding to the input terminal of the first fault diagnosis circuit 30 is less than or equal to the first preset voltage threshold, the energy storage circuit 20 outputs the stored electric quantity, the input voltage value of the power supply chip 412 is ensured to be greater than or equal to the threshold voltage value within the preset time, meanwhile, the chip 50 records the time when the tank circuit 20 falls to the threshold voltage value as t0, records the duration time when the first fault diagnosis circuit 30 outputs the first electric signal as t2, records the time when the chip 50 enters the corresponding safe state as ts, and in the normal state, ts is much less than t0, and the time required for the voltage value at the input terminal V1 of the computing chip 50 to fall from the normal input voltage to the output voltage value when the threshold voltage value is taken as the input voltage, and it is denoted as t1, so that the chip 50 can flexibly configure different security states according to the above time information.
Specifically, the chip 50 determines the corresponding safety state by comparing the magnitudes of t0, t1, t2 and ts, for example, 1) when t1 is much smaller than t0, it indicates that the energy storage circuit 20 or the first fault diagnosis circuit 30 is abnormal, and the chip 50 should immediately enter the safety state, where the operation corresponding to the safety state may be an operation of recording the abnormal state, resetting the power supply chip, prohibiting reading and writing of the RAM, or lowering the load 80; 2) when t1 is more than or equal to t0 and t2 is less than t0-ts, whether the voltage value output by the Fault PIN of the power supply chip 412 affects the whole circuit system is judged, if the voltage value output by the Fault PIN of the power supply chip 412 is high voltage, the whole circuit system is not affected, and the chip 50 records the abnormal electric signal and stores the abnormal electric signal into a diagnosis log; if the voltage value output by the Fault PIN of the power supply chip 412 is low voltage, the whole circuit system is affected, and the chip 50 should enter a safe state; 3) if t1 is not less than t0 and t2 is not less than t0-ts, the chip 50 should enter a safe state.
It should be noted that the power outage protection device may further include an eleventh resistor 70 and a twelfth resistor 71, the first fault diagnosis circuit 30 may further include a ninth resistor 36, and the voltage output circuit 60 may further include an eighth resistor 65, where the eleventh resistor 70, the twelfth resistor 71, the ninth resistor 36, and the eighth resistor 65 are all used for protecting a circuit, and details are not described herein.
A power-off protection device provided by an embodiment of the present application is described below with reference to fig. 1.
The power-off protection device comprises a power supply 10, a tank circuit 20, a first fault diagnosis circuit 30, a second fault diagnosis circuit 40, a power supply circuit 41, a chip 50 and a voltage output circuit 60, wherein the tank circuit 20 comprises a second diode 21 and a tank capacitor 22; the first failure diagnosis circuit 30 includes a voltage comparator 311, a field effect transistor 312 and a third resistor 313, a first resistor 32, a second resistor 33, a zener diode 34 and a first diode 35; the power supply circuit 41 includes a filter capacitor 411 and a power supply chip 412; the second fault diagnosis circuit 40 includes a fourth resistor 421 and a fifth resistor 422; the voltage output circuit 60 includes a sixth resistor 61, a seventh resistor 62, a first transistor 63, and a second transistor 64.
The circuit structure of the device is as follows: the first resistor 32 is connected in series with the second resistor 33; the first resistor 32 is also connected in series with the inverting input terminal of the voltage comparator 311; the anode of the first diode 35 is connected with the output end of the power supply 10, and the cathode of the first diode 35 is connected with the cathode of the voltage stabilizing diode 34; the cathode of the first diode 35 is further connected to the positive input terminal of the voltage comparator 311, and the positive input terminal of the voltage comparator 311 is further connected to the cathode of the zener diode 34; the power supply input end of the voltage comparator 311 is connected with the output end of the energy storage circuit 20; the output terminal of the voltage comparator 311 is connected to the input terminal of the chip 50; the output end of the voltage comparator 311, the gate of the field effect transistor 312, the source of the field effect transistor 312, the third resistor 313 and the power input end of the voltage comparator 311 are connected in sequence; the inverting input terminal of the voltage comparator 311 is connected to the first resistor 32, and the non-inverting input terminal of the voltage comparator 311 is connected to the zener diode 34; the anode of the second diode 21 is connected with the power supply 10, the cathode of the second diode 21 is connected with the charging end of the energy storage capacitor 22, the discharging end of the energy storage capacitor 22 is connected with the emitter of the second triode 64, and the discharging end of the energy storage capacitor 22 is also connected with the power supply chip 412; the filter capacitor 411 is connected in series with the power supply chip 412; the fourth resistor 421 is connected in series with the fifth resistor 422; the sixth resistor 61, the base of the first triode 63, the collector of the first triode 63, the seventh resistor 62, the base of the second triode 64, the collector of the second triode 64, and the fourth resistor 421 are sequentially connected in series.
Based on the above circuit structure, when the voltage corresponding to the input terminal of the first failure diagnosis circuit 30 is greater than the first preset voltage threshold, the voltage comparator 311 outputs a first voltage value, the field effect transistor 312 is in the off state, so that the first failure diagnosis circuit 30 outputs the second electrical signal, specifically, the voltage value of the inverting input terminal of the voltage comparator 311 is the voltage value after the tube voltage drop of the first resistor 32, the voltage value after the tube voltage drop of the first resistor 32 is determined by the voltage division of the power supply through the first resistor 32 and the second resistor 33, and the voltage value of the non-inverting input terminal of the voltage comparator 311 is the voltage value after the tube voltage drop of the first diode 35. Since the voltage value of the first diode 35 after the tube voltage drop is much larger than the second preset voltage threshold, the zener diode 34 is in the reverse breakdown state, and the voltage value of the first diode 35 after the tube voltage drop is the second preset voltage threshold, the voltage value of the power supply after the tube voltage drop is larger than the second preset voltage threshold by reasonably configuring the first resistor 32 and the second resistor 33, so that the voltage value of the power supply after the tube voltage drop through the first resistor 32 and the second resistor 33 is larger than the second preset voltage threshold, at this time, the voltage value of the first resistor 32 after the tube voltage drop is larger than the voltage value of the first diode 35 after the tube voltage drop, that is, the voltage value of the inverting input terminal in the voltage comparator 311 is larger than the voltage value of the non-inverting input terminal in the voltage comparator 311, the voltage comparator 311 outputs the first voltage value, wherein, the first field effect voltage value is a low voltage, because the gate of the transistor 312 is connected with the voltage comparator 311, the source of the transistor 312 is grounded, at this time, field effect transistor 312 is in the off state, and the voltage value at output terminal V2 of first fault diagnosis circuit 30 is affected by the voltage at the output terminal of chip 50, so that first fault diagnosis circuit 30 outputs a high voltage diagnosis signal, and when chip 50 receives the high voltage diagnosis signal, chip 50 is in the normal operation state. Meanwhile, the power supply 10 charges the energy storage capacitor 22 in the energy storage circuit 20 so that the energy storage capacitor 22 stores the energy, and the power supply 10 charges the power supply circuit 41 to ensure the normal operation of the power supply chip 412.
Based on the above circuit structure, when the voltage corresponding to the input terminal of the first failure diagnosis circuit 30 is less than or equal to the first preset voltage threshold, that is, when the output terminal of the power supply 10 is abnormally powered down or the vehicle starts up instantaneously, the output voltage of the power supply 10 instantaneously drops, the voltage comparator 311 outputs the second voltage value, the field effect transistor 312 is in the conducting state, so that the first failure diagnosis circuit 30 outputs the first electrical signal, specifically, the voltage value of the inverting input terminal of the voltage comparator 311 is zero due to the instantaneous drop of the output voltage of the power supply 10, and the voltage value of the non-inverting input terminal of the voltage comparator 311 is greater than zero due to the presence of the zener diode 34, at this time, the voltage value of the non-inverting input terminal of the voltage comparator 311 is greater than the voltage value of the inverting input terminal of the voltage comparator 311, the voltage comparator 311 outputs the second voltage value, the second voltage value is a high voltage, because the gate of the field effect transistor 312 is connected to the voltage comparator 311, and the source of the field effect transistor 312 is grounded, the field effect transistor 312 is in a conducting state, so that the first fault diagnosis circuit 30 outputs a low voltage diagnosis signal, and the chip 50 enters a corresponding safe state when the chip 50 receives the low voltage diagnosis signal. At the same time, the energy storage capacitor 22 discharges the power supply circuit 41 to ensure the normal operation of the power supply chip 412 in the power supply circuit 41 within the preset time, so that the chip 50 enters the corresponding safe state within the preset time.
According to the technical scheme, the energy storage circuit and the first fault diagnosis circuit are arranged, under-voltage fault diagnosis of the circuit is achieved, and the problems that a power supply chip or a single chip microcomputer cannot enter a safe state in time and the like due to the fact that a diagnosis mechanism in the prior art can determine abnormal power failure of a storage battery only through a plurality of sampling results are solved. Specifically, the energy storage circuit is used for being connected with a power supply of the chip in parallel; the input end of the first fault diagnosis circuit is used for being connected with a power supply, and the output end of the first fault diagnosis circuit is used for being connected with a chip; the first fault diagnosis circuit is used for sending a first electric signal representing power supply disconnection to the chip under the condition that the voltage corresponding to the input end of the first fault diagnosis circuit is smaller than or equal to a first preset voltage threshold value.
The embodiment of the application also provides a vehicle, and the vehicle comprises the power-off protection device, so the vehicle in the embodiment of the application has the technical effect of the power-off protection device, and the details are not repeated.
Although the present invention has been described by way of preferred embodiments, the present invention is not limited to the embodiments described herein, and various changes and modifications may be made without departing from the scope of the present invention.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present application, and shall be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A power-off protection device, comprising: a tank circuit (20) and a first failure diagnosis circuit (30);
the energy storage circuit (20) is used for being connected with a power supply (10) of the chip (50) in parallel;
the input end of the first fault diagnosis circuit (30) is used for being connected with the power supply (10), and the output end of the first fault diagnosis circuit (30) is used for being connected with the chip (50);
the first fault diagnosis circuit (30) is used for sending a first electric signal representing power supply disconnection to the chip (50) when the voltage corresponding to the input end of the first fault diagnosis circuit (30) is smaller than or equal to a first preset voltage threshold value.
2. The power down protection device according to claim 1, wherein the first fault diagnosis circuit (30) is further configured to send a second electrical signal to the chip (50) indicating that the power is turned on if the voltage corresponding to the input terminal of the first fault diagnosis circuit (30) is greater than a first preset voltage threshold.
3. The power outage protection device according to claim 2, wherein the first fault diagnosis circuit (30) comprises a voltage comparison loop (31), a first resistor (32), a second resistor (33), a zener diode (34) and a first diode (35);
the first resistor (32) is connected in series with the second resistor (33);
the first resistor (32) is also connected in series with the inverting input of the voltage comparison circuit (31);
the anode of the first diode (35) is connected with the output end of the power supply (10), and the cathode of the first diode (35) is connected with the cathode of the voltage-stabilizing diode (34);
the cathode of the first diode (35) is further connected with a positive-phase input end of the voltage comparison loop (31), and the positive-phase input end of the voltage comparison loop (31) is further connected with the cathode of the voltage-stabilizing diode (34);
the power supply input end of the voltage comparison loop (31) is connected with the output end of the energy storage circuit (20);
the output end of the voltage comparison loop (31) is connected with the input end of the chip (50).
4. The power down protection device according to claim 3, wherein the voltage comparison circuit (31) comprises a voltage comparator (311), a field effect transistor (312) and a third resistor (313);
the output end of the voltage comparator (311), the grid electrode of the field effect transistor (312), the source electrode of the field effect transistor (312), the third resistor (313) and the power supply input end of the voltage comparator (311) are sequentially connected;
the inverting input end of the voltage comparator (311) is connected with the first resistor (32), and the non-inverting input end of the voltage comparator (311) is connected with the voltage stabilizing diode (34).
5. The power down protection device according to claim 4, wherein when the voltage corresponding to the input terminal of the first fault diagnosis circuit (30) is greater than a first preset voltage threshold, the voltage comparator (311) outputs a first voltage value, and the field effect transistor (312) is in an off state, so that the first fault diagnosis circuit (30) outputs the second electrical signal;
when the voltage corresponding to the input end of the first fault diagnosis circuit (30) is less than or equal to a first preset voltage threshold value, the voltage comparator (311) outputs a second voltage value, and the field effect transistor (312) is in a conducting state, so that the first fault diagnosis circuit (30) outputs the first electric signal.
6. The power outage protection device according to claim 1, characterized by further comprising a second fault diagnosis circuit (40) and a power supply circuit (41);
a first input end of the second fault diagnosis circuit (40) is connected with an output end of the energy storage circuit (20), a second input end of the second fault diagnosis circuit (40) is connected with an output end of the chip (50), and an output end of the chip (50) is also connected with an output end of the second fault diagnosis circuit (40);
the output end of the second fault diagnosis circuit (40) is connected with the input end of the chip (50);
the input end of the power supply circuit (41) is connected with the output end of the energy storage circuit (20), and the output end of the power supply circuit (41) is connected with the chip (50).
7. The power outage protection device according to claim 6, characterized in that the power supply circuit (41) is connected in parallel with the second fault diagnosis circuit (40);
in response to the first electric signal, the energy storage circuit (20) discharges the power supply circuit (41), and the second fault diagnosis circuit (40) outputs a third electric signal corresponding to the discharge voltage value in the process that the discharge voltage value output by the energy storage circuit (20) reaches a second preset voltage threshold value.
8. Power-off protection device according to claim 7, characterized in that said power supply circuit (41) comprises a filter capacitor (411) and a power supply chip (412), said filter capacitor (411) being connected in series with said power supply chip (412);
the second failure diagnosis circuit (40) includes a fourth resistor (421) and a fifth resistor (422), and the fourth resistor (421) is connected in series with the fifth resistor (422).
9. The power down protection device according to claim 7, further comprising a voltage output circuit (60), wherein an input terminal of the voltage output circuit (60) is connected to an output terminal of the chip (50), and an output terminal of the voltage output circuit (60) is connected to an input terminal of the second fault diagnosis circuit (40).
10. Power-off protection device according to claim 7, characterized in that the tank circuit (20) comprises a second diode (21) and a tank capacitor (22);
the positive electrode of the second diode (21) is connected with the power supply (10), the negative electrode of the second diode (21) is connected with the charging end of the energy storage capacitor (22), the discharging end of the energy storage capacitor (22) is connected with the input end of the second fault diagnosis circuit (40), and the discharging end of the energy storage capacitor (22) is further connected with the input end of the power supply circuit (41).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210723614.7A CN115097258A (en) | 2022-06-23 | 2022-06-23 | Power-off protection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210723614.7A CN115097258A (en) | 2022-06-23 | 2022-06-23 | Power-off protection device |
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| Publication Number | Publication Date |
|---|---|
| CN115097258A true CN115097258A (en) | 2022-09-23 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210723614.7A Pending CN115097258A (en) | 2022-06-23 | 2022-06-23 | Power-off protection device |
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| Country | Link |
|---|---|
| CN (1) | CN115097258A (en) |
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2022
- 2022-06-23 CN CN202210723614.7A patent/CN115097258A/en active Pending
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