CN115097251A - Test system and method, control module and readable storage medium - Google Patents
Test system and method, control module and readable storage medium Download PDFInfo
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Abstract
The application discloses a test system and a method, a control module and a readable storage medium, wherein the test system is used for testing equipment to be tested, the test system comprises a control module, N power supplies, a first switch module, a second switch module and M electric equipment, the N power supplies sequentially pass through the first switch module, the equipment to be tested and the second switch module are connected to the M electric equipment, the first switch module comprises N first switch branches, the N first switch branches correspond to the N power supplies one to one, the second switch module comprises M second switch branches, and the M second switch branches correspond to the M electric equipment one to one. The control module is respectively connected with the first switch branch and the second switch branch and is used for acquiring the type of the equipment to be tested and controlling the on-off of the first switch branch and the second switch branch according to the type of the equipment to be tested. By the aid of the mode, ATE testing can be performed on different devices to be tested, and the practicability is high.
Description
Technical Field
The present application relates to the field of testing technologies, and in particular, to a testing system and method, a control module, and a readable storage medium.
Background
ATE (automated test equipment) testing is mainly used for signal testing (e.g., voltage, current, resistance, etc.) of hardware devices.
These devices under test are of a wide variety and conform to a variety of standard specifications. Even the same kind of tested equipment has differences between different manufacturers and different models. Therefore, although there are many identical or similar test requirements for these devices under test, each has many different special requirements, so that the current ATE test can only realize the test of a single device in a specific field, and is not practical.
Disclosure of Invention
The application aims to provide a test system and method, a control module and a readable storage medium, which can realize ATE test on different devices to be tested and have stronger practicability.
To achieve the above object, in a first aspect, the present application provides a test system for testing a device under test, the test system including:
the system comprises N power supplies, a first switch module, a second switch module and M pieces of electric equipment, wherein the N power supplies are connected to the M pieces of electric equipment through the first switch module, the equipment to be tested and the second switch module in sequence;
the first switch module comprises N first switch branches, the N first switch branches are connected with the N power supplies in a one-to-one correspondence mode, the second switch module comprises M second switch branches, the M second switch branches are connected with the M electric equipment in a one-to-one correspondence mode, and N and M are integers which are larger than 1;
the control module is respectively connected with the N first switch branches and the M second switch branches, is used for acquiring the type of the equipment to be tested, is in communication connection with the equipment to be tested, and controls the on-off of the N first switch branches and the M second switch branches according to the type of the equipment to be tested.
In an optional manner, the control module is further configured to:
if the type of the equipment to be tested corresponds to a jth first switch branch and a kth second switch branch respectively, controlling the jth first switch branch and the kth second switch branch to be connected, and controlling other first switch branches and other second switch branches to be disconnected, wherein the jth first switch branch is any one of the N first switch branches, and the kth second switch branch is any one of the M second switch branches, j and k are integers which are not less than 1, and j is not less than N, and k is not less than M.
In an alternative manner, the first switching branch and the second switching branch each include two switches;
a first switch in the first switch branch is connected between the positive output end of the corresponding power supply and the positive input end of the equipment to be tested, and a second switch in the first switch branch is connected between the negative output end of the corresponding power supply and the negative input end of the equipment to be tested;
a first switch in the second switch branch is connected between the positive output end of the device to be tested and the positive input end of the corresponding electric device, and a second switch in the second switch branch is connected between the negative output end of the device to be tested and the negative input end of the corresponding electric device
In an optional manner, the control module is further configured to:
acquiring the type and model of the equipment to be tested according to the mark on the equipment to be tested;
acquiring a first test instruction;
and if the type corresponding to the first test instruction is the same as the acquired type of the equipment to be tested, and the type corresponding to the first test instruction is the same as the acquired type of the equipment to be tested, controlling the on-off of the N first switch branches and the M second switch branches according to the type of the equipment to be tested.
In an optional manner, before the controlling, according to the type of the device to be tested, the N first switch branches and the M second switch branches to be turned on and off, the control module is further configured to:
acquiring a second test instruction;
determining a test type for testing the equipment to be tested according to the second test instruction, and acquiring reference parameters of J test items in the test type, wherein J is an integer larger than or equal to 1;
and acquiring K test items according to the model of the device to be tested, wherein K is an integer larger than or equal to 1, and the K test items are at least part of the J test items.
In an optional manner, after the N first switching branches and the M second switching branches are controlled to be turned on and off according to the type of the device to be tested, the control module is further configured to:
sequentially testing the equipment to be tested according to the K test items until the K test items are tested;
if the test result of the nth test item in the K test items is the same as the corresponding reference parameter, or the difference value between the test result of the nth test item in the K test items and the corresponding reference parameter is within the corresponding preset range, determining that the test result of the nth test item is normal, otherwise, determining that the test result of the nth test item is abnormal, wherein n is an integer greater than or equal to 1, and n is less than or equal to K.
In an optional manner, the control module is further configured to:
and in the process of testing the K test items, storing the K test items and corresponding test results in real time, and displaying the total test time of the K test items, the test result corresponding to each test item in the K test items and the test time of each test item in the K test items.
In an optional manner, the control module is further configured to:
after the K test items are tested, testing the test items with abnormal test results again;
and displaying the test result of each test item in the K test items, generating a test report according to the test result of each test item in the K test items, and storing the test report.
In an optional manner, the control module is further configured to: and acquiring a remote control instruction, and executing an operation corresponding to the remote control instruction.
In a second aspect, the present application provides a testing method for testing a device under test, the testing method including:
acquiring the type of the equipment to be tested;
and determining a power supply and electric equipment corresponding to the type of the equipment to be tested, and connecting the type of the equipment to be tested between the corresponding power supply and electric equipment to test the equipment to be tested.
In an optional manner, the method further comprises:
acquiring a model of the equipment to be tested;
acquiring a test type for testing the to-be-tested equipment, and acquiring reference parameters of J test items in the test type;
determining K test items corresponding to the model of the device to be tested, wherein J is an integer larger than or equal to 1;
and testing the equipment to be tested according to the reference parameters of the J test items and the K test items, wherein K is an integer more than or equal to 1, and K is less than or equal to J.
In a third aspect, the present application provides a control module comprising:
at least one processor and a memory communicatively coupled to the at least one processor, the memory storing instructions executable by the at least one processor to enable the at least one processor to perform a method as described above.
In a fourth aspect, the present application provides a non-transitory computer-readable storage medium having stored thereon computer-executable instructions that, when executed by a processor, cause the processor to perform a method as described above.
The beneficial effect of this application is: the test system that this application provided is used for testing the equipment that awaits measuring, and test system includes control module, N power, first switch module, second switch module and M consumer, and N power loops through first switch module, the equipment that awaits measuring and second switch module are connected to M consumer, and control module is connected with N first switch branch roads, M second switch branch roads and the equipment that awaits measuring respectively. The first switch module comprises N first switch branch circuits, the N first switch branch circuits are in one-to-one correspondence with the N power supplies, the second switch module comprises M second switch branch circuits, the M second switch branch circuits are in one-to-one correspondence with the M electric equipment, and the N and the M are integers which are larger than 1. The control module is further in communication connection with the devices to be tested and is used for obtaining the types of the devices to be tested and controlling the on-off of the N first switch branches and the M second switch branches according to the types of the devices to be tested. Therefore, when testing different to await measuring equipment, can switch on corresponding first switch branch road and second switch branch road to the realization is the equipment power supply that awaits measuring through the power that corresponds, and supplies power for corresponding consumer through the equipment that awaits measuring, can realize then carrying out the ATE test to different equipment that awaits measuring, the practicality is stronger.
Drawings
One or more embodiments are illustrated by way of example in the accompanying drawings which correspond to and are not to be construed as limiting the embodiments, in which elements having the same reference numeral designations represent like elements throughout, and in which the drawings are not to be construed as limiting in scale unless otherwise specified.
Fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present disclosure;
FIG. 2 is a flow chart of a method performed by a control module according to an embodiment of the present disclosure;
FIG. 3 is a flow chart of a method performed by a control module according to another embodiment of the present application;
FIG. 4 is a schematic structural diagram of a test system according to another embodiment of the present application;
FIG. 5 is a schematic structural diagram of a test system according to yet another embodiment of the present application;
fig. 6 is a schematic structural diagram of communication connection of components in the test system according to the embodiment of the present application;
FIG. 7 is a flowchart of a testing method provided in an embodiment of the present application;
fig. 8 is a schematic structural diagram of the control module 10 according to an embodiment of the present disclosure.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present disclosure. As shown in fig. 1, the test system 100 is used to test a device under test 200. The test system 100 includes a control module 10, N power supplies, a first switch module 20, a second switch module 30, and M electric devices, where the N power supplies are connected to the M electric devices sequentially through the first switch module 20, the device to be tested 200, and the second switch module 30, and N and M are integers greater than 1.
Specifically, the N power supplies include a first power supply V1, a second power supply V2 …, and an nth power supply VN. The first switch module 20 includes N first switch legs, including a first switch leg S11, a second first switch leg S12 …, and an nth first switch leg S1N. The second switching module 30 includes M second switching legs including a first second switching leg S21, a second switching leg S22 …, and an mth second switching leg S2M. The M electric devices comprise a first electric device PD1 and a second electric device PD2 …, an Mth electric device PDM.
The first power supply V1 is connected to the first switching leg S11, and the second power supply V2 is connected to the second first switching leg S12 …, and the nth power supply VN is connected to the nth first switching leg S1N. The first power supply V1 and the second power supply V2 … and the nth power supply VN may be the same type of power supply or different types of power supplies. For example, in one embodiment, N =2, the first power source V1 is a dc power source, and the second power source V2 is an ac power source. For another example, in another embodiment, N =2, the first power source V1 and the second power source V2 are both dc power sources, but the first power source V1 and the second power source V2 have different output voltages. The first power supply V1 and the second power supply V2 … are used as power supplies for the Nth power supply VN.
The first switching leg S11, the second first switching leg S12 …, the nth first switching leg S1N are also connected to the device under test 200. When the first switching branch S11 is turned on, the first power source V1 supplies power to the device under test 200; when the second first switching branch S12 is turned on, the second power supply V2 supplies power to the dut 200 …, and when the nth first switching branch S1N is turned on, the nth power supply VN supplies power to the dut 200. The first switching branch S11, the second first switching branch S12 …, and the nth first switching branch S1N each include at least one switch.
The first second switching leg S21, the second switching leg S22 …, and the mth second switching leg S2M are each connected to the device under test 200. The first second switching branch S21 is also connected to the first consumer PD1, the second switching branch S22 is also connected to the second consumer PD2, and the mth second switching branch S2M is also connected to the mth consumer PDM. When the first second switching branch S21 is turned on, the device under test 200 supplies power to the first powered device PD 1; when the second switching branch S22 is turned on, the device under test 200 supplies power … to the second powered device PD2, and when the mth second switching branch S2M is turned on, the device under test 200 supplies power to the mth powered device PDM. The first second switching branch S21, the second switching branch S22 …, and the mth second switching branch S2M each include at least one switch. The first electric device PD1 and the second electric device PD2 …, the mth electric device PDM, may be the same type of electric device or different types of electric devices. For example, in one embodiment, N =3, the first powered device PD1 is a dc input powered device, the second powered device PD2 is an ac input powered device, and the third powered device is an ac input ac analog power source. For another example, in another embodiment, N =2, the first powered device PD1 and the second powered device PD2 are both dc-input powered devices, but the magnitudes of the input voltages of the first powered device PD1 and the second powered device PD2 are different.
The control module 10 is connected to the N first switch branches and the M second switch branches, that is, the control module 10 is connected to the first switch branch S11, the second first switch branch S12 …, the nth first switch branch S1N, the first second switch branch S21, the second switch branch S22 …, and the mth second switch branch S2M. The control module 10 is also communicatively coupled to the device under test 200. The control module 10 is configured to obtain a type of the device under test 200, and control on/off (i.e., turn on or off) of the first switching branch S11, the second first switching branch S12 …, the nth first switching branch S1N, the first second switching branch S21, and the second switching branch S22 …, the mth second switching branch S2M according to the type of the device under test.
Specifically, after the type of the device under test 200 is acquired, the power supply and the electric device corresponding to the type of the device under test 200 may be determined. Then, a first switching branch connected between the device to be tested 200 and the corresponding power supply may be controlled to be turned on, and a second switching branch connected between the device to be tested 200 and the corresponding power consuming device may be controlled to be turned on. And then the corresponding power supply can be used for supplying power to the device to be tested 200, and the corresponding power utilization equipment can be supplied with power through the device to be tested 200, and the detection of the device to be tested 200 can be further realized. Therefore, when different pieces of equipment to be tested 200 are tested, only the corresponding first switch branch and the corresponding second switch branch are needed to be switched on, the ATE test on the equipment to be tested 200 can be realized, and the practicability is high.
In one embodiment, the control module is further configured to: if the type of the device to be tested 200 corresponds to the jth first switch branch and the kth second switch branch, respectively, the jth first switch branch and the kth second switch branch are controlled to be connected, and the other first switch branches and the other second switch branches are controlled to be disconnected. The types of the devices to be tested 200 correspond to the jth first switch branch and the kth second switch branch, respectively, which means that when the jth first switch branch is turned on, a power supply connected to the jth first switch branch can supply power to the devices to be tested 200, and when the kth second switch branch is turned on, the devices to be tested 200 can supply power to the electric devices connected to the kth second switch branch.
Wherein j and k are integers more than or equal to 1, N is less than or equal to j, and M is less than or equal to k. The jth first switch branch is any one of the N first switch branches, and the kth second switch branch is any one of the M second switch branches.
For example, in one embodiment, if the device under test 200 is a photovoltaic inverter (the input of the photovoltaic inverter is dc, and the output is ac), the power source corresponding to the type of the device under test 200 is a dc power source, and the electric device corresponding to the type of the device under test 200 is an analog power source with ac input. Then, if the first power source V1 is a dc power source and the first power consumer PD1 is an analog power source with ac input, j = k =1, that is, the photovoltaic inverters correspond to the first switching branch S11 and the first second switching branch S21, respectively. Then, the control module 10 conducts the first switching branch S11 and the first second switching branch S21, so as to further implement ATE testing of the photovoltaic inverter. For another example, in another embodiment, the device under test 200 is a dc-dc converter (both the input and the output of the dc-dc converter are dc), the power source corresponding to the type of the device under test 200 is a dc power source, and the electric device corresponding to the type of the device under test 200 is a dc-input electric device. Then, if the first power source V1 is maintained as a dc power source and the second power consumer PD2 is set as a dc input power consumer, j =1 and k =2, that is, the dc-dc devices correspond to the first switching branch S11 and the second switching branch S22, respectively. In turn, the control module 10 turns on the first switching branch S11 and the second switching branch S22, thereby further implementing ATE testing on the dc/dc device.
In an embodiment, as shown in fig. 2, the control module 10 is further configured to perform the following method steps:
step 201: and acquiring the type and model of the device to be tested according to the mark on the device to be tested.
The mark on the device to be tested 200 may be a two-dimensional code or a barcode, and only the identification of the device to be tested 200 needs to be implemented. Taking a bar code as an example, the control module 10 can obtain the type and model of the device to be tested by scanning the bar code disposed on the device to be tested 200.
Step 202: a first test instruction is obtained.
Step 203: and if the type corresponding to the first test instruction is the same as the identified type of the equipment to be tested, and the model corresponding to the first test instruction is the same as the identified model of the equipment to be tested, controlling the on-off of the N first switch branches and the M second switch branches according to the type of the equipment to be tested.
The first test instruction may be an instruction input by a user.
Specifically, after the control module 10 automatically obtains the type and model of the device to be tested 200, the type and model of the device to be tested 200 may be displayed for the user to determine whether the type and model are consistent with the actual type and model. Then, if the user determines that the type of the device to be tested 200 acquired by the control module 10 is the same as the actual type of the device to be tested 200, and the model of the device to be tested 200 acquired by the control module 10 is the same as the actual model of the device to be tested 200, the first test instruction input by the user is a determined instruction. In other words, at this time, the type corresponding to the first test instruction is the same as the type of the device under test 200 acquired by the control module 10, and the model corresponding to the first test instruction is the same as the model of the device under test 200 acquired by the control module 10.
On the contrary, if the user determines that the type of the to-be-tested device 200 acquired by the control module 10 is different from the actual type of the to-be-tested device 200, and/or the model of the to-be-tested device 200 acquired by the control module 10 is different from the actual model of the to-be-tested device 200, the first test instruction input by the user is a cancel instruction. In other words, at this time, the type corresponding to the first test instruction is different from the type of the device under test 200 acquired by the control module 10, and/or the model corresponding to the first test instruction is different from the model of the device under test 200 acquired by the control module 10.
In this embodiment, the type and model of the device to be tested 200 are automatically identified, and then the user further confirms the type and model, so that the risk of identifying the type and model by mistake due to abnormality such as a mark error can be reduced, the risk that the device to be tested 200 is damaged due to power source mismatch is reduced, and the test system 100 and the device to be tested 200 are protected.
In another embodiment, as shown in fig. 3, before the control module 10 performs the process of controlling the on/off of the N first switch branches and the M second switch branches according to the type of the device to be tested in step 203, that is, after the control module 10 determines that the type corresponding to the first test instruction is the same as the identified type of the device to be tested, and the model corresponding to the first test instruction is the same as the identified model of the device to be tested, the control module 10 further performs the following method steps:
step 301: and acquiring a second test instruction.
Step 302: and determining the test type for testing the equipment to be tested according to the second test instruction, and acquiring the reference parameters of J test items in the test type.
Step 303: and acquiring K test items according to the model of the device to be tested.
Wherein J is an integer larger than or equal to 1, K is an integer larger than or equal to 1, and the K test items are at least part of the J test items, namely K is smaller than or equal to J. The second test instruction may also be an instruction entered by the user.
Specifically, after the control module 10 determines that the type corresponding to the first test instruction is the same as the identified type of the device to be tested 200, and the model corresponding to the first test instruction is the same as the identified model of the device to be tested 200, the user may input a corresponding second test instruction according to the required test type. The control module 10 may then determine the type of test from the received second test instruction. The test items in each test type and the reference parameters of each test item are preset in the control module 10, so that after the control module 10 determines the test type, the reference parameters of J test items in the test type can be directly obtained. In an embodiment, the reference parameters of the J test items may be stored as a parameter library so as to be directly called when needed, and when the reference parameters need to be modified due to replacement or update of the device under test 200, the reference parameters in the parameter library only need to be modified correspondingly, and a program for testing the device under test 200 does not need to be modified, so that modification is more convenient, and the risk of errors is lower.
The reference parameter is used as a criterion for judging whether the test result of each test item is normal. Meanwhile, the reference parameter of any test item may be a specific value, for example, if the test item is to test the rated output power of the device to be tested 200, the reference parameter may be X watts, where X is a specific value, and then, when the device to be tested 200 is tested according to the test item, whether the test result is normal or not may be determined according to the detected relationship between the rated output power of the device to be tested 200 and the reference parameter; the reference parameter of any test item may also be whether the corresponding function is normal (at this time, the reference parameter is yes or no), for example, when the electrical device connected to the device to be tested 200 is changed, the function that the device to be tested 200 keeps outputting is normal, the test parameter may be yes, and then when the device to be tested 200 is tested according to the test item, the electrical device is changed to detect whether the device to be tested 200 continues to keep outputting, so that whether the test result is normal can be determined.
In one embodiment, the test types include a complete machine system test, a safety standard grid-connected test and a production test. The whole system test comprises a test on the overall performance of the device to be tested 200 and an application scene test applicable to the device to be tested 200, such as a test on the maximum input voltage of the device to be tested 200, a test on the adaptability of the device to be tested 200 to a power grid or a grid-connected parameter test, and the like; the safety regulation grid-connected test is used for testing whether the equipment to be tested 200 meets the safety regulation grid-connected standard of each country; the production test may also include a performance test and a grid-connected test, and the test items of the production test are part of test items in the test of the whole system, and are used for performing a sampling test when the production of the plurality of devices to be tested 200 is completed.
For example, in some embodiments, the test type is a complete machine system test, and the reference parameters of J test items in the test type can be as shown in table 1:
TABLE 1
Table 1 shows reference parameters for three models (model D1, model D2, and model D3) with maximum input powers of 90000W, 105000W, and 120000W, respectively, for one model. For example, the type of the device under test 200 is a dc-to-ac photovoltaic inverter, and reference parameters of the dc-to-ac photovoltaic inverter with maximum input powers of 90000W, 105000W and 120000W are shown in table 1.
In this embodiment, it is exemplarily shown that the reference parameters include a parameter related to an input of the device under test 200, a parameter related to an output of the device under test 200, a parameter related to an efficiency of the device under test 200, and a parameter related to a protection function of the device under test 200. In other embodiments, the user may also set corresponding parameters according to the requirement, which is not specifically limited in this application embodiment.
The test items of the model D1 can be shown in Table 2:
TABLE 2
The test items for model D2 can be as shown in Table 3:
TABLE 3
The test items for model D3 can be as shown in Table 4:
TABLE 4
In this embodiment, table 1 includes all test items and reference parameters of each model. Tables 2 to 4 show test items of a model, each model of which shows part or all of the test items in table 1, for example, the test items of the model D1 corresponding to table 2 include all the test items in table 1, and the model D2 and the model D3 corresponding to table 3 and table 4 include part of the test items in table 1. Moreover, the test items set for different models may also be set by the user according to the requirements, which is not specifically limited in the embodiment of the present application. Meanwhile, the items set by different models may be the same or different, for example, the model D1 is different from the test item for performing D2, and the model D2 is the same as the test item for the model D3.
In summary, when the type of the device to be tested 200 is kept unchanged, the test items of each model are at least part of the J test items in the test type, and the test items of each model can all find the corresponding reference parameters, so as to complete the test process for each model. Simultaneously, different models can set up different test items to the user can set up different test items according to the demand of difference, can satisfy user's different demands promptly, has stronger practicality. Secondly, if the setting of the reference parameters and the test items is performed after the on-off of the N first switch branches and the M second switch branches are controlled, because at least one first switch branch is conducted with the second switch branch, extra power loss may be caused, in other words, the reference parameters and the test items are preset before the on-off of the N first switch branches and the M second switch branches are controlled, which is beneficial to reducing the power loss.
Further, after the reference parameters and the test items are set, on-off of the N first switch branches and the M second switch branches can be controlled, so that the device to be tested 200 is tested.
Specifically, in an embodiment, if the type of the device to be tested 200 corresponds to the jth first switch branch and the kth second switch branch respectively, the jth first switch branch is controlled to be turned on first, and the control module 10 controls the power output voltage connected to the jth first switch branch. Then, the control module 10 can be in communication connection with the device under test 200, so that the control module 10 obtains the voltage and the current of the device under test 200, and performs voltage calibration and current calibration on the device under test 200. Specifically, a detection device for testing the voltage and current of the device under test 200, such as a power analyzer, may be added first. Taking a power analyzer as an example, the power analyzer detects the voltage and the current input by the device to be tested 200 in real time, and the result detected by the power analyzer is used as a reference value, the control module 10 outputs a signal to control the device to be tested, so as to calibrate the voltage and the current of the device to be tested 200 in real time until the voltage and the current of the device to be tested 200, which are obtained by the control module 10, are equal to the corresponding reference values, thereby completing the calibration process of the input voltage and the input current of the device to be tested 200.
In one embodiment, the device under test 200 may also be calibrated using multiple voltages and multiple currents. Taking the voltage calibration process as an example, if the input voltage range of the device to be tested 200 is 50V-60V, 50V, 55V and 60V may be selected for voltage calibration, and when the power supply outputs 50V, the power analyzer detects 50V, and the voltage of the device to be tested 200 acquired by the control module 10 should be calibrated to 50V; when the power supply outputs 55V, the power analyzer detects 55V, and the voltage of the device under test 200 acquired by the control module 10 should be calibrated to 55V; when the power supply outputs 60V, the power analyzer detects 60V, and the voltage of the device under test 200 acquired by the control module 10 should be calibrated to 60V. Therefore, the linear calibration process of the input voltage of the device to be tested 200 is also realized, and the device to be tested 200 has higher accuracy when being tested under different input voltages. Moreover, the current calibration process can be simultaneously implemented in the voltage calibration process, for example, when the power supply outputs 55V, the control module 10 adjusts the device to be tested 200 to have different input currents, and uses the current detected by the power analyzer as the reference value of the current, the specific implementation process is similar to the voltage calibration process, which is not described herein again, and the current linear calibration process is also implemented.
And then, controlling the kth second switch branch to be conducted. At this time, the output voltage and the output current of the device under test 200 may be calibrated. Specifically, the power of the electrical device connected to the kth second switch branch may be adjusted to calibrate the output voltage of the device under test 200 under different powers, so that the output voltage of the device under test 200 may match the supply voltage required by the electrical device under different powers. The specific implementation process is similar to the linear calibration process of the input voltage and the input current of the device 200 to be tested, and the linear calibration process is also implemented, so that the device 200 to be tested has higher accuracy when being tested under different electric devices. After the output voltage of the device to be tested 200 is calibrated, the power of the electric device is adjusted so that the electric device can meet the current test requirement.
Then, testing of the device under test 200 may begin. In an embodiment, after controlling the on/off of the N first switching branches and the M second switching branches, the control module 10 is further configured to: and sequentially testing the devices to be tested 200 according to the K test items until the K test items are tested. If the test result of the nth test item in the K test items is the same as the corresponding reference parameter or the difference value between the test result of the nth test item in the K test items and the corresponding reference parameter is within the corresponding preset range, determining that the test result of the nth test item is normal, otherwise, determining that the test result of the nth test item is abnormal. Wherein n is an integer not less than 1, and n is not more than K.
Specifically, in the process of sequentially testing the device to be tested 200 by using K test items, even if the test result of the test item is abnormal, the test process is not stopped, that is, the test is continuously performed, so as to improve the test efficiency.
If the reference parameter of any test item is a specific numerical value, the standard for judging whether the test result is normal is as follows: and the difference value between the test result of the nth test item in the K test items and the corresponding reference parameter is in the corresponding preset range. For example, in an embodiment, as shown in table 1, the nth test item is the maximum input power for testing the dut D1, and the corresponding reference parameter is 90000W, the corresponding predetermined range may be set as [ -100W, 100W ], that is, if the maximum input power of the dut D1 is detected to be within the range of [89900W, 90100W ], it may be determined that the test result of the test item is normal, otherwise, it may be determined that the test result of the test item is abnormal.
If the reference parameter of any test item is the judgment standard for judging whether the corresponding function is normal, the standard for judging whether the test result is normal is as follows: the test result of the nth test item in the K test items is the same as the corresponding reference parameter. For example, in an embodiment, the nth test item is to test whether the device under test D1 has an island protection function, if it is detected that the device under test D1 has the island protection function, it is determined that the test result of the test item is normal, otherwise, it is determined that the test result of the test item is abnormal.
Meanwhile, in other embodiments, the control module 10 is further configured to: and in the process of testing the K test items, storing the K test items and corresponding test results in real time, and displaying the total test time length of the K test items, the test result corresponding to each test item in the K test items and the test time length of each test item in the K test items.
In this embodiment, on the one hand, storing the K test items and the corresponding test results in real time can prevent data loss due to power outage and other abnormalities, which is beneficial to improving the test efficiency. On the other hand, the total testing time of the K testing items, the testing result corresponding to each testing item in the K testing items and the testing time of each testing item in the K testing items are displayed in real time, so that a user can visually check the testing progress at any time, and the user can perform targeted optimization on the testing items subsequently according to the actual testing time of each item, and the testing efficiency is further improved. Of course, in other embodiments, other manners may also be used to maintain or display the data, which is not specifically limited in the embodiments of the present application, for example, in an embodiment, after the test is started, a test folder is automatically generated, and a form is automatically generated according to the test items and the test results, so as to be referred by the user.
In one embodiment, the control module 10 is further configured to: and after the K test items are tested, testing the test items with abnormal test results again. And displaying the test result of each test item in the K test items, generating a test report according to the test result of each test item in the K test items, and storing the test report.
Specifically, after the K test items are all tested for the first time, the test items with abnormal test results are tested again to reduce the probability of mistesting. And if the test result is abnormal due to no output signal in the test item with the abnormal test result, the test item is not tested for the second time, so that the test efficiency is improved. For example, the test item is the rated output power of the device under test 200, if the output power of the device under test 200 is zero or close to zero in the actual test process, the test result of the test item is abnormal, and after the K test items are tested for the first time, the test item is not tested again.
And then, after the test of the test item with the abnormal current test result is completed again, displaying the test result of each test item in the K test items, generating a test report according to the test result of each test item in the K test items, and storing the test report, wherein the test can include contents such as pictures, data and the like. In one embodiment, the test report can be saved in a cloud server, so that the user can conveniently check the test report at any time.
In one embodiment, the control module 10 is further configured to: and acquiring a remote control instruction, and executing an operation corresponding to the remote control instruction.
Specifically, the user may perform the corresponding operation not only in directly controlling the control module 10, but also by remotely implementing the control module 10.
For example, when a user needs to remotely control the conduction of the jth first switch branch and the kth second switch branch, a remote control instruction corresponding to the control of the conduction of the jth first switch branch and the kth second switch branch may be output, and then, after receiving the remote control instruction, the control module 10 may automatically control the conduction of the jth first switch branch and the kth second switch branch.
For another example, when the user needs to remotely check the test process of each test item, the remote control instruction corresponding to the test process of each test item may be output, and then the control module 10 sends the test process of each test item to the corresponding display interface for the user to check.
For another example, the first test command and the second test command in the above embodiments may also be sent to the control module 10 as remote control commands.
In this embodiment, a manner of remotely controlling the control module 10 is provided, which is convenient for a user to implement a test process on the device to be tested 200 in various application scenarios, and has strong practicability.
Referring to fig. 4, fig. 4 illustrates an example of a structure of each of the first switching branch and the second switching branch. As shown in fig. 4, the first switching branch and the second switching branch each include two switches.
Take the first switching leg S11 and the first second switching leg S12 as examples. For specific implementation manners of the other first switching branch and the second switching branch, reference may be made to implementation manners of the first switching branch S11 and the first second switching branch S12, which are not described herein again.
Wherein the first switch S111 of the first switching branch S11 is connected between the positive output terminal of the corresponding power supply (i.e. the 1 st terminal of the first power supply V1) and the positive input terminal of the device under test 200 (i.e. the 1 st terminal of the device under test 200), and the second switch S112 of the first switching branch S11 is connected between the negative output terminal of the corresponding power supply (i.e. the 2 nd terminal of the first power supply V1) and the negative input terminal of the device under test (i.e. the 2 nd terminal of the device under test 200). A first switch S211 of the first and second switching branch S21 is connected between the positive output terminal of the dut 200 (i.e., the 3 rd terminal of the dut 200) and the positive input terminal of the corresponding consumer (i.e., the 1 st terminal of the first consumer PD 1), and a second switch S212 of the first and second switching branch S21 is connected between the negative output terminal of the dut 200 (i.e., the 3 rd terminal of the dut 200) and the negative input terminal of the corresponding consumer (i.e., the 1 st terminal of the first consumer PD 1).
In this embodiment, a switch is disposed at a port of each device (including the power supply, the device to be tested, and the electrical device) for transmitting electrical energy, which is beneficial to preventing electrical energy between different devices from interfering with each other, and can improve the reliability of the test system 100.
In one embodiment, as shown in fig. 5, the test system 100 further includes a power analysis module 40 and a waveform display module 50.
The power dividing module 40 is connected to the positive input terminal of the device under test 200, the positive output terminal of the device under test 200, and the control module 10, and the power analyzing module 40 is configured to detect the input power and the output power of the device under test 200 and input the detected result to the control module 10. In one embodiment, the power analysis module 40 may be a power analyzer.
The waveform display module 50 is respectively connected to the positive input terminal of the device under test 200, the positive output terminal of the device under test 200 and the control module 10, and the waveform display module 50 is configured to detect an output waveform of the device under test 200 and input the output waveform into the control module 10. In one embodiment, the waveform display module 50 may be an oscilloscope.
It should be noted that the hardware configuration of the test system 100 as shown in fig. 4 or fig. 5 is only one example, and that the test system 100 may have more or less components than shown in the figures, may combine two or more components, or may have a different configuration of components, and that the various components shown in the figures may be implemented in hardware, software, or a combination of hardware and software including one or more signal processing and/or application specific integrated circuits.
For example, as shown in fig. 6, in one embodiment, the components (including the components of the control module 10, the power analysis module 40, and the waveform display module 50) described in fig. 5 may be further communicatively connected. The communication module 60 may be provided to transmit signals between the N power sources and the M power consumers by the control module 10. That is, the test system 100 further includes a communication module 60, the communication module 60 is in communication connection with the control module 10, the N power supplies and the M power consumers are connected to the communication module 60 through communication lines such as network cables, and the communication connection with the control module 10 is established through the communication module 60. In one embodiment, the communication module 60 may be a switch. Meanwhile, if the connection between the power analysis module 40 and the control module 10 is also a communication connection, the power analysis module 40 may also establish a communication connection with the control module 10 through the communication module 60 to transmit the detected voltage and current to the control module 10. The device to be tested 200 can be directly connected to the control module 10 through a communication line such as a serial line, so as to realize communication connection with the control module 10. The waveform display module 50 may also be connected to the control module 10 via a communication line such as a USB line, so as to realize communication connection with the control module 10.
Referring to fig. 7, fig. 7 is a flowchart of a testing method according to an embodiment of the present disclosure. The test method is used for testing the device to be tested. In some embodiments, the specific implementation process of the test method may be implemented by a circuit structure shown in fig. 1, fig. 4, or fig. 5, and the specific implementation process is described in detail in the foregoing embodiments and is not described here again.
The test method comprises the following steps:
step 701: and acquiring the type of the device to be tested.
Step 702: and determining a power supply and electric equipment corresponding to the type of the equipment to be tested, and connecting the type of the equipment to be tested between the corresponding power supply and the electric equipment so as to test the equipment to be tested.
The corresponding power supply refers to a power supply capable of providing a power supply matched with the device to be tested, for example, for a device to be tested with a direct current input, the corresponding power supply is a power supply with a direct current output; the corresponding electric device refers to a device to which the power supply provided by the device to be tested can be matched, for example, for the device to be tested with ac output, the corresponding electric device may be a device with ac input. Therefore, when different devices to be tested are tested, the power supply and the electric equipment which need to be connected can be determined only after the type of the devices to be tested is determined. Then, the devices to be tested can be connected with the corresponding power supplies and the electric equipment respectively, and the devices to be tested can be tested subsequently. Therefore, ATE testing is performed on different devices to be tested, and the method has high practicability.
In one embodiment, the testing method further comprises the steps of: and acquiring the model of the device to be tested. The method comprises the steps of obtaining a test type for testing a device to be tested, and obtaining reference parameters of J test items in the test type. And determining K test items corresponding to the model of the device to be tested. And testing the device to be tested according to the reference parameters of the J test items and the K test items. Wherein K is an integer more than or equal to 1, and K is less than or equal to J.
It should be understood that, for specific control and beneficial effects generated by the method embodiment on the device to be tested, reference may be made to the corresponding description in the embodiment of the test system described above, and details are not described here for brevity.
Referring to fig. 8, fig. 8 is a schematic structural diagram of a control module 10 according to another embodiment of the present application. The control module 10 may be implemented by a Micro Control Unit (MCU), a Digital Signal Processing (DSP) controller, a microcomputer, a desktop computer, an all-in-one machine, and a notebook computer.
As shown in fig. 8, the control module 10 includes at least one processor 11 and a memory 12, where the memory 12 may be built in the control module 10 or may be external to the control module 10, and the memory 12 may be a remotely located memory and is connected to the control module 10 through a network.
The processor 11 executes various functions of the terminal and processes data by running or executing software programs and/or modules stored in the memory 12 and calling data stored in the memory 12, thereby performing overall monitoring of the terminal, for example, implementing a test method according to any embodiment of the present application.
The number of the processors 11 may be one or more, and one processor 11 is illustrated in fig. 8. The processor 11 and the memory 12 may be connected by a bus or other means. The processor 11 may include a Central Processing Unit (CPU), Digital Signal Processor (DSP), Application Specific Integrated Circuit (ASIC), controller, Field Programmable Gate Array (FPGA) device, or the like. Processor 11 may also be implemented as a combination of computing devices, e.g., a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in conjunction with a DSP core, or any other such configuration
Embodiments of the present application further provide a non-transitory computer-readable storage medium, which stores computer-executable instructions, and when the computer-executable instructions are executed by a processor, the processor is caused to execute the test method in any one of the above embodiments.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; within the context of the present application, where technical features in the above embodiments or in different embodiments can also be combined, the steps can be implemented in any order and there are many other variations of the different aspects of the present application as described above, which are not provided in detail for the sake of brevity; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.
Claims (13)
1. A test system for testing a device under test, the test system comprising:
the system comprises N power supplies, a first switch module, a second switch module and M electric devices, wherein the N power supplies are connected to the M electric devices through the first switch module, the device to be tested and the second switch module in sequence;
the first switch module comprises N first switch branches, the N first switch branches are connected with the N power supplies in a one-to-one correspondence mode, the second switch module comprises M second switch branches, the M second switch branches are connected with the M electric devices in a one-to-one correspondence mode, and N and M are integers which are larger than 1;
the control module is respectively connected with the N first switch branches and the M second switch branches, and is also in communication connection with the equipment to be tested, and the control module is used for acquiring the type of the equipment to be tested and controlling the on-off of the N first switch branches and the M second switch branches according to the type of the equipment to be tested.
2. The test system of claim 1, wherein the control module is further configured to:
if the type of the device to be tested corresponds to a jth first switch branch and a kth second switch branch respectively, controlling the jth first switch branch to be connected with the kth second switch branch, and controlling other first switch branches to be disconnected with the second switch branches, wherein the jth first switch branch is any one of the N first switch branches, and the kth second switch branch is any one of the M second switch branches, j and k are integers not less than 1, j is not less than N, and k is not less than M.
3. The test system according to claim 1 or 2, wherein the first switching leg and the second switching leg each comprise two switches;
a first switch in the first switch branch is connected between the positive output end of the corresponding power supply and the positive input end of the equipment to be tested, and a second switch in the first switch branch is connected between the negative output end of the corresponding power supply and the negative input end of the equipment to be tested;
the first switch in the second switch branch is connected between the positive output end of the device to be tested and the positive input end of the corresponding electric device, and the second switch in the second switch branch is connected between the negative output end of the device to be tested and the negative input end of the corresponding electric device.
4. The test system of claim 1, wherein the control module is further configured to:
acquiring the type and model of the equipment to be tested according to the mark on the equipment to be tested;
acquiring a first test instruction;
and if the type corresponding to the first test instruction is the same as the acquired type of the equipment to be tested, and the type corresponding to the first test instruction is the same as the acquired type of the equipment to be tested, controlling the on-off of the N first switch branches and the M second switch branches according to the type of the equipment to be tested.
5. The test system of claim 4, wherein prior to the controlling of the switching of the N first switching legs and the M second switching legs according to the type of the device under test, the control module is further configured to:
acquiring a second test instruction;
determining a test type for testing the equipment to be tested according to the second test instruction, and acquiring reference parameters of J test items in the test type, wherein J is an integer larger than or equal to 1;
and acquiring K test items according to the model of the device to be tested, wherein K is an integer larger than or equal to 1, and the K test items are at least part of the J test items.
6. The test system of claim 5, wherein after controlling the switching of the N first switching legs and the M second switching legs according to the type of the device under test, the control module is further configured to:
sequentially testing the equipment to be tested according to the K test items until the K test items are tested;
if the test result of the nth test item in the K test items is the same as the corresponding reference parameter, or the difference value between the test result of the nth test item in the K test items and the corresponding reference parameter is within the corresponding preset range, determining that the test result of the nth test item is normal, otherwise, determining that the test result of the nth test item is abnormal, wherein n is an integer not less than 1, and n is not more than K.
7. The test system of claim 6, wherein the control module is further configured to:
and in the process of testing the K test items, storing the K test items and corresponding test results in real time, and displaying the total test time of the K test items, the test result corresponding to each test item in the K test items and the test time of each test item in the K test items.
8. The test system of claim 6 or 7, wherein the control module is further configured to:
after the K test items are tested, testing the test items with abnormal test results again;
and displaying the test result of each test item in the K test items, generating a test report according to the test result of each test item in the K test items, and storing the test report.
9. The test system of claim 1, wherein the control module is further configured to:
and acquiring a remote control instruction, and executing an operation corresponding to the remote control instruction.
10. A testing method for testing a device under test, the testing method comprising:
acquiring the type of the equipment to be tested;
and determining a power supply and electric equipment corresponding to the type of the equipment to be tested, and connecting the type of the equipment to be tested between the corresponding power supply and electric equipment to test the equipment to be tested.
11. The method of claim 10, further comprising:
acquiring the model of the device to be tested;
acquiring a test type for testing the to-be-tested equipment, and acquiring reference parameters of J test items in the test type;
determining K test items corresponding to the model of the device to be tested, wherein J is an integer larger than or equal to 1;
and testing the equipment to be tested according to the reference parameters of the J test items and the K test items, wherein K is an integer larger than or equal to 1, and K is smaller than or equal to J.
12. A control module, comprising:
at least one processor and a memory communicatively coupled to the at least one processor, the memory storing instructions executable by the at least one processor to enable the at least one processor to perform the method of any of claims 10-11.
13. A non-transitory computer-readable storage medium having stored thereon computer-executable instructions that, when executed by a processor, cause the processor to perform the method of any of claims 10-11.
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