CN115078922A - MLCC pressure resistance testing method and MLCC testing machine - Google Patents
MLCC pressure resistance testing method and MLCC testing machine Download PDFInfo
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- CN115078922A CN115078922A CN202210545433.XA CN202210545433A CN115078922A CN 115078922 A CN115078922 A CN 115078922A CN 202210545433 A CN202210545433 A CN 202210545433A CN 115078922 A CN115078922 A CN 115078922A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/129—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of components or parts made of semiconducting materials; of LV components or parts
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Abstract
The application discloses a method for testing the pressure resistance of an MLCC (Multi-level cell CC), which is applied to a testing machine with a surge testing function, and comprises the following steps: and under the condition that the MLCC to be tested is positioned at the test position corresponding to the surge test and the surge instrument is connected with the MLCC to be tested, the control device controls the surge instrument to detect the change condition that the voltage of the MLCC to be tested rises from the initial value to the target voltage value in the charging process and the pressure maintaining condition of the MLCC to be tested after the charging is finished. And the surge instrument provides information whether the voltage resistance of the MLCC to be tested is qualified or not to the control device according to the voltage change condition of the MLCC to be tested. And the control device determines whether the pressure resistance of the MLCC to be detected is qualified or not according to the information. According to the method and the device, the surge instrument in the MLCC testing machine is used for completing the pressure resistance test of the MLCC in the testing machine, so that the flaw point of the MLCC to be tested can be effectively detected, the testing accuracy is greatly improved, and the potential safety hazard of the MLCC is eliminated.
Description
Technical Field
The application relates to the technical field of capacitor testing, in particular to a voltage resistance testing method of an MLCC and an MLCC testing machine.
Background
Under the background of great progress in the terminal equipment and intelligent electric vehicle industry of the fifth Generation Mobile communication technology (5th Generation Mobile Networks, 5G), the industry of the domestic chip multilayer Ceramic capacitor (MLCC) is rapidly developing, and meanwhile, the development of the domestic equipment manufactured based on the MLCC is also driven. However, since the MLCC device is started later, many test functions for MLCCs are under further study compared to imported devices.
In the prior art, a domestic MLCC testing machine can only test parameters such as capacity, loss, insulativity and the like, wherein the voltage-resistant parameters of the MLCC are subjected to independent secondary testing by additionally using a voltage-resistant instrument in the conventional method. The principle of the method is that parameters such as a theoretical withstand voltage value, breakdown current and power-on time of an MLCC product are set in a withstand voltage instrument, a timer in the instrument starts to time and outputs set voltage, and when the output current exceeds the set breakdown current within set time, the voltage is judged to be poor.
The voltage-withstanding instrument is used for testing, and the defects of long testing time, low sensitivity of detecting breakdown current, incapability of detecting slight defect of poor voltage resistance of products and the like are overcome. Meanwhile, the high-efficiency MLCC tester is not suitable to be additionally arranged due to the reasons of long testing time, low sensitivity and the like.
Disclosure of Invention
The application provides a method for testing the voltage resistance of an MLCC and an MLCC testing machine, which are used for enabling the MLCC to be subjected to voltage resistance detection which needs to be tested by a voltage resistance instrument independently originally, and can be used for directly testing on the testing machine, so that the testing time is greatly shortened, and the testing efficiency and the accuracy are improved.
The technical scheme is as follows:
in a first aspect, a voltage resistance testing method of an MLCC is provided, which is applied to a testing machine having a surge meter and a control device, and the method includes:
under the condition that the MLCC to be tested is positioned at a test position corresponding to the surge instrument and the surge instrument is connected with the MLCC to be tested, the control device controls the surge instrument to detect a first voltage change condition and a second voltage change condition of the MLCC to be tested,
the first voltage change condition is used for reflecting that the voltage of the MLCC to be tested rises from an initial value to change into a target voltage value in the charging process of the MLCC to be tested, and the second voltage change condition is used for reflecting that the voltage of the MLCC to be tested changes in a first time period from the charging end time to the time when the voltage drops from the target voltage value to a preset value;
the surge instrument provides information for reflecting whether the voltage resistance of the MLCC to be tested is qualified or not to the control device according to the first voltage change condition and the second voltage change condition;
and the control device determines whether the pressure resistance of the MLCC to be tested is qualified or not according to the information.
According to the method and the device, the customized instrument, namely the surge instrument, is added in the MLCC testing machine, so that the MLCC can complete the pressure resistance test in the testing machine, the control device in the testing machine controls the surge instrument to charge the MLCC to be tested, the information capable of judging the pressure resistance is determined according to the change condition of the voltage of a sample to be tested along with the time in the preset time period, and the controller determines whether the pressure resistance of the MLCC to be tested is qualified or not according to the information. According to the scheme, the surge instrument in the MLCC testing machine is used for completing the pressure resistance test of the MLCC in the testing machine, so that the flaw point of the MLCC to be tested can be effectively detected, the testing accuracy is greatly improved, and the potential safety hazard of the MLCC is eliminated.
Optionally, the controlling device controls the surge meter to detect a first voltage variation condition and a second voltage variation condition of the MLCC to be tested, including:
the control device sends a test starting instruction to the surge instrument;
the surge instrument responds to the test starting instruction, charges the MLCC to be tested by using specified charging voltage in a charging time period, and collects voltage values of the MLCC to be tested at different time points of the charging time period to obtain the first voltage change condition;
the surge instrument acquires the voltage value of the MLCC to be tested at different time points in a first time period to obtain a second voltage change condition,
the first time period comprises a pressure maintaining time period of the MLCC to be tested and a time period of reducing the voltage of the MLCC to be tested from the target voltage value to a preset value, and the starting time of the first time period is the charging ending time.
Optionally, before the control device sends a test starting instruction to the surge meter, the method further includes:
the control device provides charging parameters for charging the MLCC to be tested for the surge instrument according to input operation of a user, wherein the charging parameters comprise the specified charging voltage and information for determining the charging time period when the MLCC to be tested is charged by the surge instrument.
Optionally, the determining, by the surge meter, information for reflecting the voltage resistance of the to-be-tested MLCC according to the first voltage change condition and the second voltage change condition of the to-be-tested MLCC includes:
the surge instrument obtains a test waveform of the MLCC to be tested according to a first voltage change condition and a second voltage change condition of the MLCC to be tested, and the test waveform is used for reflecting the voltage change rule along with time of the MLCC to be tested in a charging time period, a pressure maintaining time period and a voltage falling time period;
and the surge meter compares the test waveform with a standard waveform to obtain information for reflecting the voltage resistance of the MLCC to be tested, and the standard waveform is used for reflecting the rule that the voltage of the standard MLCC changes along with time in a charging time period, a pressure maintaining time period and a voltage falling time period.
Optionally, before detecting the pressure resistance of the MLCC to be tested, the method includes:
the surge instrument outputs a first voltage to charge the standard MLCC in a charging time period, and the voltage values of the standard MLCC at different time points in the charging time period are recorded;
from the charging end time of the standard MLCC, the surge instrument determines a pressure maintaining time period of the standard MLCC and voltage values of the standard MLCC at different time points in a voltage falling time period after the pressure maintaining time period;
obtaining the standard waveform according to the voltage values of different time points in the charging time period, the pressure maintaining time period and the voltage falling time period;
wherein the first voltage is a sustainable maximum voltage of the standard MLCC,
the standard MLCC is an MLCC with pressure resistance meeting the requirement, and the specification of the MLCC is the same as the rule of the MLCC to be tested.
Optionally, the comparing, by the surge meter, the test waveform with a standard waveform to obtain information for reflecting the pressure resistance of the sample to be tested, where the information includes:
under the condition that the surge instrument determines that the error between the test waveform and the standard waveform is within a preset range, determining that the pressure resistance of the MLCC to be tested is qualified;
and under the condition that the surge meter determines that the error between the test waveform and the standard waveform is out of a preset range, determining that the pressure resistance is unqualified.
Through surge test, the waveforms of the MLCC to be tested and the qualified MLCC are compared, and the accuracy of the withstand voltage test is improved.
Optionally, the MLCC testing machine has a display device, and the display device displays information for indicating that the pressure resistance of the MLCC to be tested is qualified when it is determined that the pressure resistance of the MLCC to be tested is qualified; and under the condition that the pressure resistance of the MLCC to be tested is determined to be unqualified, the display device displays information for indicating that the pressure resistance of the MLCC to be tested is unqualified.
The change of the MLCC waveform, including the voltage value at each time point, can be visually observed through a display device on the testing machine.
Optionally, the MLCC testing machine further has one or more test meters, and the one or more test meters are connected to the control device, and the method further includes:
the control device determines indication information of whether a first performance parameter of the MLCC to be tested is qualified or not through one or more test instruments, different test instruments measure different performance parameters, and the first performance parameter is a performance parameter of the MLCC to be tested except the pressure resistance;
and the control device transmits the MLCC to be tested to a corresponding classified material receiving box according to the information of the first instrument surge instrument, which reflects whether the pressure resistance of the MLCC to be tested is qualified, and the indication information of whether the first performance parameters of the MLCC to be tested of one or more test instruments are qualified.
Optionally, the MLCC testing machine is further connected to a moving device for driving the capacitor to move, and the method further includes:
the control device determines the test position of each test meter and the surge meter;
determining a detection sequence according to the test positions of each test instrument and each surge instrument;
and the control device controls the mobile device to sequentially pass through the test positions of each test instrument and each surge instrument according to the detection sequence.
In a second aspect, an MLCC testing machine is provided, which comprises a surge instrument and a control device connected with the surge instrument,
the control device is used for sending a test instruction to the surge instrument under the condition that the MLCC to be tested is detected to be located at the test position of the surge instrument, wherein the test instruction is used for detecting a first voltage change condition and a second voltage change condition of the MLCC to be tested in a preset time period;
the surge instrument is used for measuring the voltage change condition of the MLCC to be tested in a preset time period according to the test instruction, and providing information for reflecting the voltage resistance of the MLCC to be tested for the control device according to the voltage change condition of the MLCC to be tested in the preset time period;
and the control device is also used for determining whether the pressure resistance of the MLCC to be tested is qualified or not according to the information.
It is to be understood that, the beneficial effects of the second aspect can be referred to the related descriptions in the first aspect, and are not described herein again.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a flowchart of a voltage resistance testing method of an MLCC according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of an MLCC testing machine according to an embodiment of the present disclosure;
fig. 3 is a test waveform diagram and a standard waveform diagram in a voltage resistance test method of an MLCC according to an embodiment of the present application;
FIG. 4 is a waveform diagram of an MLCC with qualified pressure resistance and a waveform diagram of an MLCC with unqualified pressure resistance provided by an embodiment of the application;
FIG. 5 is a display interface of an MLCC tester provided in an embodiment of the present application;
FIG. 6 is a schematic structural diagram of an MLCC testing machine having a withstand voltage tester and other test instruments provided in an embodiment of the present application;
FIG. 7 is a schematic structural diagram of an MLCC testing machine having multiple test meters according to an embodiment of the present disclosure.
Detailed Description
To make the objects, technical solutions and advantages of the present application more clear, embodiments of the present application will be described in further detail below with reference to the accompanying drawings.
It should be understood that reference to "a plurality" in this application means two or more. In the description of the present application, "/" means "or" unless otherwise stated, for example, a/B may mean a or B; "and/or" herein is only an association relationship describing an associated object, and means that there may be three relationships, for example, a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, for the convenience of clearly describing the technical solutions of the present application, the terms "first", "second", and the like are used to distinguish the same items or similar items having substantially the same functions and actions. Those skilled in the art will appreciate that the terms "first," "second," etc. do not denote any order or quantity, nor do the terms "first," "second," etc. denote any order or importance.
Before explaining the embodiments of the present application in detail, an application scenario of the embodiments of the present application will be described.
At present, a domestic MLCC testing machine can only test the capacity, loss, insulation and other parameters of the MLCC, and for the voltage resistance parameters, the current common practice is to additionally use a voltage resistance instrument to independently perform secondary testing on the MLCC. The principle of the method is that parameters such as a theoretical withstand voltage value, breakdown current and power-on time of the MLCC to be tested are set in a withstand voltage instrument, the theoretical withstand voltage value, the breakdown current and the power-on time of the MLCC to be tested are connected with two ends of an electrode of the MLCC to be tested through an output end of the instrument, the instrument is started, an internal timer starts timing and outputs set voltage, and poor withstand voltage is judged when the output current exceeding the set breakdown current is detected within the set time. The method has the disadvantages of long test time, generally several seconds to dozens of seconds according to products with different specifications, low sensitivity of detecting breakdown current, incapability of detecting slight defect of poor withstand voltage of the products and the like. Therefore, the pressure-resistant instrument is not suitable for being mounted on a high-efficiency MLCC tester.
The following explains the pressure resistance test method of the MLCC provided in the embodiments of the present application in detail.
Fig. 1 provides a voltage resistance testing method of an MLCC, which is applied to an MLCC testing machine having a surge meter and a control device. The surge instrument is in communication connection with the control device.
The surge instrument is a customized instrument for testing the voltage resistance of the MLCC, and the instrument needs to meet relevant specifications of an MLCC testing machine and can be used together with other instruments such as a capacity bridge instrument and a high-resistance insulation instrument in the MLCC testing machine.
The control device is a processor and a related execution mechanism of the MLCC test machine, and is used for receiving, processing and sending a test instruction input by a user, and operating the MLCC to be tested through the execution mechanism. The processor may be an upper computer or a Programmable Logic Controller (PLC), which is not limited herein. As an example, the surge meter is connected to an upper computer.
The method for testing the pressure resistance of the MLCC provided by the embodiment of the application comprises the following steps:
step 101: and under the condition that the MLCC to be tested is positioned at the test position corresponding to the surge instrument and the surge instrument is connected with the MLCC to be tested, the control device controls the surge instrument to detect the first voltage change condition and the second voltage change condition of the MLCC to be tested. And the first voltage change condition is used for reflecting the change process of the voltage of the MLCC to be tested rising from the initial value to the target voltage value in the charging process of the MLCC to be tested. And the second voltage change condition is used for determining the pressure maintaining condition of the MLCC to be tested after the charging is finished and the change process when the voltage is reduced from the target voltage value to the preset value.
As an example, the surge meter has a voltage output end, the MLCC to be tested has an electrode end, and the connection of the surge meter and the MLCC to be tested means that the voltage output end is connected with the electrode end, so that the MLCC to be tested is charged by the surge meter, when the MLCC to be tested is located at a test position of the surge meter, a processor (such as an upper computer) in the control device controls the surge meter to rapidly charge the MLCC to be tested, and the voltage of the MLCC to be tested is increased from 0 to change of the voltage value of the voltage provided by the surge meter. And when the voltage value provided by the surge instrument is reached, maintaining the pressure, after the voltage is stabilized for a period of time, the voltage begins to fall back, the voltage drop of the MLCC to be detected is finally 0, and the process is the second voltage change condition.
For example, when a tester is used to test various performance parameters of the MLCC to be tested, such as voltage resistance, insulation, and the like, the MLCC to be tested may be installed on a mobile device (for example, the mobile device may include a carrying tray, and the carrying tray is used to carry the MLCC to be tested), and then the mobile device may move from a first position to a testing position where a surge meter is located under the control of a control device, which may refer to the description in the prior art, and this embodiment of the present application is not limited.
Step 102: the surge instrument provides information for reflecting whether the voltage resistance of the MLCC to be tested is qualified or not to the control device according to the voltage change condition of the MLCC to be tested.
Step 103: and the control device determines whether the pressure resistance of the MLCC to be tested is qualified or not according to the information.
And after the surge instrument acquires the information, the information is transmitted to the control device, and a processor in the control device judges whether the pressure resistance of the MLCC to be tested is qualified or not according to the information.
In an embodiment of the present application, as shown in fig. 2, the MLCC to be tested is located at a test position of the surge meter, the processor 201 sends a test instruction to the surge meter 202, and the surge meter 202 charges, maintains pressure, and falls back the MLCC to be tested according to a preset voltage and a preset time, so as to obtain a time-varying curve of the voltage of the MLCC to be tested in a preset time period, that is, a first voltage variation condition and a second voltage variation condition. The surge instrument compares the preset standard MLCC with the MLCC to be tested under the first voltage change condition and the second voltage change condition. And when the comparison result shows that the two curves are matched within the error range, the surge instrument 202 sends the information to the processor 201, and the processor 201 determines that the pressure resistance of the MLCC to be tested is qualified according to the information. And when the comparison result shows that the two curves are not matched within the error range, the surge instrument 202 sends the information to the processor 201, and the processor 201 determines that the pressure resistance of the MLCC to be tested is not qualified according to the information.
The method and the device have the advantages that the instrument for testing the pressure resistance is customized in the MLCC testing machine, so that the MLCC can complete the pressure resistance test in the testing machine, the control device in the testing machine controls the surge instrument to charge the MLCC to be tested, the information capable of judging the pressure resistance is determined according to the change condition of the voltage of the sample to be tested along with the time in the preset time period, and the controller determines whether the pressure resistance of the MLCC to be tested is qualified or not according to the information. The scheme enables the pressure resistance test to be carried out through the test machine, and the pressure resistance of the MLCC is not required to be tested through an independent pressure resistance test meter, so that the test efficiency is greatly improved.
In an embodiment of the present application, the control device controls the surge meter to detect a first voltage variation condition and a second voltage variation condition of the MLCC to be tested, including: and the control device sends a test starting instruction to the surge instrument. The surge instrument responds to the test starting instruction, charges the MLCC to be tested by using the specified charging voltage in the charging time period, and collects the voltage values of the MLCC to be tested at different time points in the charging time period to obtain a first voltage change condition. After charging is finished, the surge instrument collects the voltage values of the MLCC to be tested at different time points in the first time period, and the second voltage change condition is obtained.
The first time period comprises a pressure maintaining time period of the MLCC to be tested and a time period of reducing the voltage of the MLCC to be tested from a target voltage value to a preset value. And maintaining the voltage of the MLCC to be tested as the target voltage value for a period of time after the voltage of the MLCC to be tested reaches the target voltage value.
For example, the start test instruction is sent to the surge meter by the upper computer. Specifically, the upper computer detects a start test instruction triggered by a user or the MLCC to be tested is located at a test position corresponding to the surge instrument, and the surge instrument can send the start test instruction under the condition that the surge instrument is connected with the MLCC to be tested. After the charging is stopped, the MLCC to be tested is subjected to a pressure maintaining stage and a voltage falling stage, and the surge instrument acquires a change curve of the voltage along with the time in the period.
In an embodiment of the present application, before the control device sends the test start instruction to the surge meter, the method further includes: and the control device provides charging parameters for charging the MLCC to be tested for the surge instrument according to the input operation of a user, wherein the charging parameters comprise charging voltage and charging time when the MLCC to be tested is charged by the surge instrument. Optionally, the charging parameters may be set in the surge meter by default.
As an example, a user inputs charging parameters including a voltage and a charging time for charging the MLCC to be tested, and a pressure holding time and a voltage falling time on an operation interface of the MLCC testing machine. After the charging parameters are input, an upper computer of the MLCC testing machine sends the charging parameters to a surge instrument, and the surge instrument provides the charging voltage and the charging time for the MLCC to be tested according to the parameters.
In an embodiment of the present application, the determining, by a surge meter, information for reflecting the voltage resistance of an MLCC to be tested according to a voltage variation condition of the MLCC to be tested includes: and the surge instrument obtains the test waveform of the MLCC to be tested according to the first voltage change condition and the second voltage change condition of the MLCC to be tested. The test waveform is used for reflecting the rule that the voltage of the MLCC to be tested changes along with time in the charging time period, the pressure maintaining time period and the voltage falling time period. And comparing the test waveform with the standard waveform by the surge meter to obtain information for reflecting the pressure resistance of the MLCC to be tested. The standard waveform is used for reflecting the rule of the voltage change of the standard MLCC along with the time in the charging time period, the pressure maintaining time period and the voltage falling time period.
The standard waveform may be a waveform input to the surge instrument through the MLCC tester, or a waveform obtained by testing a known standard MLCC through the surge instrument, and the obtained waveform is stored in the surge instrument for comparison with a waveform to be tested.
The test waveform and the standard waveform are provided in FIG. 3. As shown in FIG. 3, waveform 301 is the standard waveform and waveform 302 is the test waveform. Taking the standard waveform 301 as an example, taking t 0-t 1 as a charging time period, rapidly charging the MLCC sample to be tested by a surge instrument, wherein the voltage is a first voltage, and at a time point of t1, the voltage of the MLCC sample to be tested theoretically reaches the first voltage; t 1-t 2 are pressure maintaining time periods, and the voltage of the MLCC sample to be detected is kept unchanged; and t 2-t 3 are fall time periods, the voltage of the MLCC sample to be tested begins to fall, and at the time point of t3, the voltage falls to 0.
In an embodiment of the present application, before detecting the pressure resistance of the MLCC to be tested, the method includes: the surge instrument outputs a first voltage to charge the standard MLCC in the charging time period, and the voltage values of the standard MLCC at different time points in the first time period are recorded. After stopping charging the standard MLCC, the surge meter determines a pressure holding time period of the standard MLCC and voltage values of the standard MLCC at different time points in a voltage falling time period after the pressure holding time period. And obtaining a standard waveform according to the voltage values of different time points in the charging time period, the pressure maintaining time period and the voltage falling time period. The first voltage is the maximum voltage which can be borne by a standard MLCC, the standard MLCC is an MLCC with voltage resistance meeting the requirement, and the specification of the standard MLCC is the same as the rule of the MLCC to be tested.
Where the waveform of the standard MLCC is referred to as the waveform 302 in fig. 3, the first voltage is typically 3 times the operating voltage of the MLCC, i.e. the maximum voltage that the MLCC can withstand. The specification of the MLCC generally refers to the same capacitance capacity, i.e. the MLCC to be tested and the standard MLCC have the same capacity.
In an embodiment of the present application, the surge meter compares the test waveform with the standard waveform to obtain information for reflecting the pressure resistance of the sample to be tested, and the information includes: and under the condition that the surge instrument determines that the error between the test waveform and the standard waveform is within a preset range, determining that the pressure resistance of the MLCC to be tested is qualified. And under the condition that the surge instrument determines that the error between the test waveform and the standard waveform is out of the preset range, determining that the pressure resistance is unqualified.
As an example, after the surge meter charges the MLCC sample to be tested at a first voltage, the voltage of the MLCC to be tested reaches a second voltage. Because different MLCCs have some differences, even if the voltage resistance of the MLCCs is qualified, the second voltage and the first voltage can have differences, and therefore the preset condition is set. The difference between the voltage in the dwell period of the broken-line horizontal line and the standard waveform in fig. 4 is a predetermined condition. When the difference between the first voltage and the second voltage is lower than or equal to the preset condition, the voltage resistance of the MLCC sample to be tested can be considered as qualified, as shown in (a) of fig. 4. And when the difference value between the first voltage and the second voltage is higher than the preset condition, the voltage resistance of the MLCC sample to be tested is not qualified, as shown in (b) in fig. 4.
In an embodiment of the application, the MLCC testing machine has a display device, and the display device displays information for indicating that the pressure resistance of the MLCC to be tested is qualified when the pressure resistance of the MLCC to be tested is determined to be qualified. And under the condition that the pressure resistance of the MLCC to be tested is determined to be unqualified, displaying information for indicating that the pressure resistance of the MLCC to be tested is unqualified by the display device.
In an embodiment of the present application, the display device is an MLCC tester, and displays a test waveform 501 of the MLCC to be tested by the surge meter and a standard waveform 502 of the standard MLCC, as shown in fig. 5, wherein a prompt message 503 is displayed on the upper right corner of the display device. In fig. 5 (a), when the waveform 501 is the same as the waveform 502, the prompt message 503 shows that the first message is OK, which indicates that the pressure resistance of the MLCC sample to be tested is qualified. In fig. 5 (b), the waveform 501 is different from the waveform 502, and the prompt message 503 shows that the second message is NG, which indicates that the pressure resistance of the MLCC sample to be measured is not qualified.
In an embodiment of the present application, the MLCC testing machine further includes one or more test instruments, where the one or more test instruments are connected to the control device, and the one or more test instruments determine, through the one or more test instruments, indication information of whether a first performance parameter of the MLCC to be tested is qualified, and different test instruments measure different performance parameters, where the first performance parameter is a performance parameter of the MLCC to be tested except for pressure resistance. And according to the information of whether the pressure resistance of the MLCC to be tested of the surge instrument is qualified or not and the indication information of whether the first performance parameter of the MLCC to be tested of one or more test instruments is qualified or not, the control device transmits the MLCC to be tested to the corresponding classified material receiving box.
As an example, as shown in fig. 6, the MLCC testing machine has a test meter, a test meter 602 and a surge meter 603 are connected to a processor 601 in the control device, and a determination actuator 604 is connected to the processor 601. The surge instrument 603 is a custom instrument and is used for testing the voltage resistance of the MLCC, and the test instrument 602 is a capacity instrument and is used for testing the capacitance capacity of the MLCC. After the custom meter finishes testing the MLCC to be tested, the tested pressure resistance result is sent to the processor 601, and after the capacity meter finishes testing the MLCC to be tested, the tested capacity result is sent to the processor 601. The processor 601 controls the determination executing mechanism 604 to transfer the MLCC to be tested to the corresponding sorting receiving box 605 according to the capacity and the qualification of the pressure resistance.
In an embodiment of the present application, the MLCC testing machine is further connected to a moving device for moving the capacitor, and the method provided in the embodiment of the present application further includes: and the control device controls the mobile device to pass through the test positions of each test instrument and each surge instrument in sequence.
The structure of the mobile device can refer to the description in the prior art, and is not described herein, but any device that can drive the capacitor to move can be regarded as the mobile device of the present application.
In a possible implementation manner, the moving device driving the capacitor to move comprises a loading tray for placing the MLCC to be tested and a conveyor belt matched with the MLCC testing machine.
As an example, as shown in FIG. 7, the one or more test meters include various ones of: the device comprises a capacity meter 702, a first insulation meter 703 and a second insulation meter 704, wherein the capacity meter 702 is used for testing the capacitance capacity of the MLCC to be tested. The first MLCC sample to be tested moves step by step in sequence, testing is carried out on the MLCC sample to be tested at stations corresponding to the capacity meter 702, the first insulating meter 703, the second insulating meter 704 and the surge meter 705 in sequence, the testing result of each meter is sent to the processor 701 to be processed after the testing is finished, and the processor 701 controls the determination executing mechanism 706 to transmit the MLCC sample to be tested to the corresponding classified material receiving box 707 according to the testing results of all the meters.
The embodiment of the application provides an MLCC test machine, which comprises a surge instrument and a control device connected with the surge instrument. And the control device is used for sending a test instruction to the surge instrument under the condition that the MLCC to be tested is detected to be positioned at the test position of the surge instrument, wherein the test instruction is used for detecting the voltage change condition of the MLCC to be tested in a preset time period. The surge instrument is used for measuring the voltage change condition of the MLCC to be tested in the preset time period according to the test instruction, and providing information for reflecting the voltage resistance of the MLCC to be tested for the control device according to the voltage change condition of the MLCC to be tested in the preset time period. The control device is also used for determining whether the pressure resistance of the MLCC to be tested is qualified or not according to the information.
Optionally, the MLCC testing machine further includes: one or more test meters, one or more of which are connected to the control device. The control device is further configured to determine, by one or more test instruments, indication information of whether a first performance parameter of the MLCC to be tested is qualified, where different test instruments measure different performance parameters, and the first performance parameter is a performance parameter of the MLCC to be tested except for the pressure resistance;
the control device is further used for transmitting the MLCCs to be tested to the corresponding classified material receiving boxes according to the information of the surge meters, which reflects whether the pressure resistance of the MLCCs to be tested is qualified, and the indication information of whether the first performance parameters of the MLCCs to be tested of one or more test meters are qualified.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
1. A voltage resistance testing method of an MLCC (multi-level cell CC) is applied to a testing machine with a surge meter and a control device, and comprises the following steps:
under the condition that the MLCC to be tested is positioned at the testing position of the surge instrument and the surge instrument is connected with the MLCC to be tested, the control device controls the surge instrument to detect a first voltage change condition and a second voltage change condition of the MLCC to be tested,
the first voltage change condition is used for reflecting that the voltage of the MLCC to be tested rises from an initial value to change into a target voltage value in the charging process of the MLCC to be tested, and the second voltage change condition is used for reflecting that the voltage of the MLCC to be tested changes in a first time period from the charging end time to the time when the voltage is reduced from the target voltage value to a preset value;
the surge instrument provides information for reflecting whether the voltage resistance of the MLCC to be tested is qualified or not to the control device according to the first voltage change condition and the second voltage change condition;
and the control device determines whether the pressure resistance of the MLCC to be tested is qualified or not according to the information.
2. The method of claim 1, wherein the controlling device controls the surge meter to detect a first voltage variation condition and a second voltage variation condition of the MLCC under test, comprising:
the control device sends a test starting instruction to the surge instrument;
the surge instrument responds to the test starting instruction, charges the MLCC to be tested by using specified charging voltage in a charging time period, and collects voltage values of the MLCC to be tested at different time points of the charging time period to obtain the first voltage change condition;
the surge instrument acquires the voltage value of the MLCC to be tested at different time points in a first time period to obtain a second voltage change condition,
the first time period comprises a pressure maintaining time period of the MLCC to be tested and a time period of reducing the voltage of the MLCC to be tested from the target voltage value to a preset value, and the starting time of the first time period is the charging ending time.
3. The method of claim 2, wherein before the control device sends a start test instruction to the surge meter, the method further comprises:
the control device provides charging parameters for charging the MLCC to be tested for the surge instrument according to input operation of a user, wherein the charging parameters comprise the specified charging voltage and information for determining the charging time period when the MLCC to be tested is charged by the surge instrument.
4. The method of claim 1, wherein the determining, by the surge meter, information for reflecting the voltage resistance of the MLCC to be tested according to the first voltage variation condition and the second voltage variation condition of the MLCC to be tested comprises:
the surge meter obtains a test waveform of the MLCC to be tested according to a first voltage change condition and a second voltage change condition of the MLCC to be tested, wherein the test waveform is used for reflecting the rule that the voltage of the MLCC to be tested changes along with time in a charging time period, a pressure maintaining time period and a voltage falling time period;
and the surge meter compares the test waveform with a standard waveform to obtain information for reflecting the voltage resistance of the MLCC to be tested, and the standard waveform is used for reflecting the rule that the voltage of the standard MLCC changes along with time in a charging time period, a pressure maintaining time period and a voltage falling time period.
5. The method according to claim 4, wherein before detecting the pressure resistance of the MLCC under test, the method comprises:
the surge instrument outputs a first voltage to charge the standard MLCC in a charging time period, and the voltage values of the standard MLCC at different time points in the charging time period are recorded;
from the charging end time of the standard MLCC, the surge instrument determines a pressure maintaining time period of the standard MLCC and voltage values of the standard MLCC at different time points in a voltage falling time period after the pressure maintaining time period;
obtaining the standard waveform according to the voltage values of different time points in the charging time period, the pressure maintaining time period and the voltage falling time period;
wherein the first voltage is a sustainable maximum voltage of the standard MLCC,
the standard MLCC is an MLCC with pressure resistance meeting the requirement, and the specification of the MLCC is the same as the rule of the MLCC to be tested.
6. The method according to claim 4, wherein the comparing the test waveform with a standard waveform by the surge meter to obtain information reflecting the pressure resistance of the sample to be tested comprises:
under the condition that the surge instrument determines that the error between the test waveform and the standard waveform is within a preset range, determining that the pressure resistance of the MLCC to be tested is qualified;
and under the condition that the surge meter determines that the error between the test waveform and the standard waveform is out of a preset range, determining that the pressure resistance is unqualified.
7. The method of any one of claims 1 to 6, wherein the MLCC tester has a display device,
under the condition that the pressure resistance of the MLCC to be tested is determined to be qualified, the display device displays information used for representing that the pressure resistance of the MLCC to be tested is qualified;
and under the condition that the pressure resistance of the MLCC to be tested is determined to be unqualified, the display device displays information for indicating that the pressure resistance of the MLCC to be tested is unqualified.
8. The method of any one of claims 1 to 6, wherein the MLCC tester further comprises one or more test meters, the one or more test meters being connected to the control device, the method further comprising:
the control device determines indication information of whether a first performance parameter of the MLCC to be tested is qualified or not through one or more test instruments, different test instruments measure different performance parameters, and the first performance parameter is a performance parameter of the MLCC to be tested except the pressure resistance;
and the control device transmits the MLCC to be tested to a corresponding classified material receiving box according to the information of the surge instrument, which reflects whether the pressure resistance of the MLCC to be tested is qualified, and the indication information of whether the first performance parameter of the MLCC to be tested of one or more test instruments is qualified.
9. The method of claim 8, wherein the MLCC testing machine is further connected to a mobile device for moving the MLCC under test, and wherein the method further comprises:
the control device determines the test position of each test meter and the surge meter;
determining a detection sequence according to the test positions of each test instrument and each surge instrument;
and the control device controls the mobile device to sequentially pass through the test positions of each test instrument and each surge instrument according to the detection sequence.
10. An MLCC tester is characterized by comprising a surge meter and a control device connected with the surge meter,
the control device is used for sending a test instruction to the surge instrument under the condition that the MLCC to be tested is detected to be located at the test position of the surge instrument, wherein the test instruction is used for detecting a first voltage change condition and a second voltage change condition of the MLCC to be tested in a preset time period;
the surge instrument is used for measuring the voltage change condition of the MLCC to be tested in a preset time period according to the test instruction, and providing information for reflecting the voltage resistance of the MLCC to be tested for the control device according to the voltage change condition of the MLCC to be tested in the preset time period;
and the control device is also used for determining whether the pressure resistance of the MLCC to be tested is qualified or not according to the information.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117572039A (en) * | 2023-11-17 | 2024-02-20 | 广东微容电子科技有限公司 | Test device and test method for chip three-terminal capacitive filter |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117572039A (en) * | 2023-11-17 | 2024-02-20 | 广东微容电子科技有限公司 | Test device and test method for chip three-terminal capacitive filter |
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