CN115050530B - Round-robin resistance-adjusting circuit and resistance-adjusting method for thick film resistor array of thermal printing sheet - Google Patents

Round-robin resistance-adjusting circuit and resistance-adjusting method for thick film resistor array of thermal printing sheet Download PDF

Info

Publication number
CN115050530B
CN115050530B CN202210451028.1A CN202210451028A CN115050530B CN 115050530 B CN115050530 B CN 115050530B CN 202210451028 A CN202210451028 A CN 202210451028A CN 115050530 B CN115050530 B CN 115050530B
Authority
CN
China
Prior art keywords
resistance
resistor
regulated
adjusting
adjusted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202210451028.1A
Other languages
Chinese (zh)
Other versions
CN115050530A (en
Inventor
唐小琦
林志鹏
宋宝
高天赐
张泽之
吉文博
王共海
李国春
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hunan Kaitong Electronic Co ltd
Huazhong University of Science and Technology
Original Assignee
Hunan Kaitong Electronic Co ltd
Huazhong University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hunan Kaitong Electronic Co ltd, Huazhong University of Science and Technology filed Critical Hunan Kaitong Electronic Co ltd
Priority to CN202210451028.1A priority Critical patent/CN115050530B/en
Publication of CN115050530A publication Critical patent/CN115050530A/en
Application granted granted Critical
Publication of CN115050530B publication Critical patent/CN115050530B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C17/00Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C10/00Adjustable resistors

Abstract

The invention provides a round-robin resistance-regulating circuit and method of a thick film resistor array of a thermal printing sheet, comprising two switching devices corresponding to each path of regulated resistor, wherein one switching device is used for detecting the resistor, when the switching device is conducted, power is supplied to the regulated resistor through a connected reference power supply, and the voltage of a resistor end is subjected to AD conversion to obtain the resistance value after resistance regulation; the other switching device is called a resistance-adjusting switch and is connected with a resistance-adjusting power supply, and the resistance adjustment is realized by applying a conducting narrow pulse to the resistance-adjusting switch and providing an impact current to the resistance to be adjusted. The alternate detection and resistance adjustment of the adjusted resistor are realized by alternately switching on each path of detection switch and resistance adjustment switch. The invention realizes the detection and resistance adjustment of the adjusted resistance through alternate switching, and has high resistance adjustment efficiency and precision; by adopting the round robin resistance adjusting mode, only one resistor is adjusted at a time, so that a small-capacity resistance adjusting power supply can meet the requirements, and the cost and the volume of the resistance adjusting power supply can be greatly reduced.

Description

Round-robin resistance-adjusting circuit and resistance-adjusting method for thick film resistor array of thermal printing sheet
Technical Field
The invention relates to the field of printing, in particular to a round robin resistance regulating circuit and a resistance regulating method of a thick film resistor array of a thermal printing sheet.
Background
The thermal printing sheet is an important component of a thermal printing head and is composed of a row of thick film resistors with the same resistance value, the resistors are arranged tightly and are different from 200dpi (resistance width: 0.127 mm) to 600dpi (resistance width: 0.042 mm), the resistors can generate high temperature quickly when passing a certain current, when the medium coating meets the heated resistors, the temperature is increased in a very short time, and the medium coating is subjected to chemical reaction to change colors, so that the purpose of printing characters is realized.
The thick film resistor of the thermal printing sheet is prepared by screen printing resistor paste on a ceramic substrate, and then drying and sintering. The resistance value of the resistor after sintering is often greatly different from the nominal value, so that resistance adjustment equipment is needed to adjust each resistor within the allowable range of deviation from the nominal value.
The common thick film resistor resistance regulating method has two kinds, one is laser resistance regulating method, and the principle is that the conducting sectional area of the resistor is changed by short pulse laser scanning cutting, so that the resistor body with the resistance value lower than the target value is regulated to be within the allowable deviation range of the resistance value. The laser beam irradiates the resistor film according to a certain track, and the substrate resistor slurry layer is heated and vaporized by the laser irradiation to form a notch with a certain depth, so that the cross-sectional area of a conductor and the length of the conductor of the resistor are changed, the aim of fine tuning the resistor is achieved, and the resistance value can only be adjusted from small to large by the laser resistance adjustment method. The other is a pulse voltage resistance-regulating method, which is characterized in that high-frequency electric pulse is applied to electrodes at two ends of a resistor body, and a high-voltage breakdown resistor material RuO2 is utilized to ensure that conductive particles originally surrounded by the glass phase are connected, so that the conductive path is increased, and the resistance value is reduced. The resistor well solves the difficulty of adjusting the thick film resistor with smaller size, improves the performance of the resistor and reduces the resistance.
When the thermal printing sheet is produced in a large scale, how to realize the resistance adjustment of the thick film resistor economically, efficiently and accurately is a problem which the production enterprises have to face.
Disclosure of Invention
The invention provides a round robin resistance adjusting circuit and a resistance adjusting method of a thick film resistor array of a thermal printing sheet, which aim at the requirement of mass production of the existing thermal printing sheet.
According to a first aspect of the present invention, there is provided a round-robin resistance-adjusting circuit of a thick film resistor array of a thermal printing sheet, the thermal printing sheet comprising a plurality of paths of thick film resistors arranged side by side to form a resistor array, the round-robin resistance-adjusting circuit comprising a plurality of paths of switching devices corresponding to each path of resistance to be adjusted, each path of switching devices comprising two switching devices, one end of each path of resistance to be adjusted being connected to a resistance-adjusting power supply through a corresponding resistance-adjusting switching device for adjusting resistance of the resistance to be adjusted, and being connected to a reference power supply through a detection switching device, the reference power supply supplying power to each path of resistance to be adjusted when the detection switching device is turned on, for obtaining a resistance value after resistance adjustment; the alternate detection and resistance adjustment of the adjusted resistance are realized by alternately switching on each path of detection switching device and resistance adjustment switching device; in the process of adjusting the resistance, an impulse current is provided for the adjusted resistance by applying a conducting narrow pulse to the resistance-adjusting switching device, so that the resistance adjustment of the adjusted resistance is realized.
On the basis of the technical scheme, the invention can also make the following improvements.
Optionally, the resistance-adjusting switch device and the detection switch device are both MOS transistors, and the adjusted resistor R i One end of each of which is connected with a resistance-adjusting switch device Q i1 Is connected with the source electrode of the detection switch device Q i2 The resistance-adjusting switch device Q i1 The drain electrode of the detection switch device Q is connected with a resistance-adjusting power supply V i2 Is passed through the drain of resistor R 0 Connected with a reference power supply V 0
By switching the device Q to the detection i2 The gate of (1) is applied with an ith path control signal to control the detection switching device Q i2 To determine whether the corresponding tuned resistance is tuned at the time;
by switching the device Q to the resistance-adjusting switch i1 Applying a conducting narrow pulse to the grid electrode of the resistor to be regulated to provide an impulse current for the resistor to be regulated, and regulating the resistance value of the corresponding resistor to be regulated;
wherein i is the serial number of the regulated resistor, i is more than or equal to 1 and less than or equal to n, and i is a positive integer.
Optionally, the resistance-adjusting circuit further includes an AD sampling circuit corresponding to each path of the adjusted resistor, and the AD sampling circuit is connected to the detection switching device Q i2 Drain of (d) and resistance R 0 The voltage of the regulated resistor is used for calculating the resistance value of the regulated resistor;
based on the calculated resistance value of the regulated resistor, the regulated resistor is turned on and off to the switching device Q i1 A conducting narrow pulse is applied to provide a surge current for the regulated resistor, and the resistance value of the corresponding regulated resistor is regulated.
Optionally, the conducting narrow pulse is of sub microsecond level.
According to a second aspect of the present invention, there is provided a thermal print sheet thick film resistor round-robin resistance adjustment method, the thermal print sheet comprising a plurality of parallel thick film resistors forming a resistor array, the method comprising:
the alternate detection and resistance adjustment of the adjusted resistance are realized by alternately switching on each path of detection switching device and resistance adjustment switching device;
in the process of regulating the resistance, a conducting narrow pulse is applied to a resistance regulating switching device so as to provide an impact current for a regulated resistor, so that the resistance regulation of the regulated resistor is realized;
one end of each path of the regulated resistor is connected with a resistance regulating power supply through a corresponding resistance regulating switching device, and is connected with a reference power supply through a detection switching device, and the reference power supply supplies power for each path of the regulated resistor.
Optionally, the alternately detecting and adjusting the resistance of the adjusted resistor is realized by alternately switching on each path of detection switching device and resistance-adjusting switching device, including:
according to the adjustment sequence of the multi-path adjusted resistors, corresponding detection switching devices are turned on in a round-robin manner through respective control signals so as to determine the current adjusted resistors;
for the currently regulated resistor, an impulse current is provided for the regulated resistor by applying a conduction pulse to the corresponding resistance regulating switch device, so that the resistance value of the currently regulated resistor is regulated.
Optionally, for the currently adjusted tuned resistor, applying a conducting pulse to its corresponding tuning resistance switching device provides an impact current for the tuned resistor, and adjusting the resistance value of the currently adjusted tuned resistor includes:
and for the currently regulated resistor, the same conducting narrow pulse is applied to the corresponding resistor regulating switch device for a plurality of times, an impact current is provided for the resistor to be regulated, and the resistance value of the currently regulated resistor to be regulated is regulated until the regulated resistance value of the regulated resistor is within the allowable resistance value range of the nominal value deviation.
Optionally, for the currently adjusted resistor, the same conducting narrow pulse is applied to the corresponding resistor-adjusting switch device for multiple times, so as to provide an impact current for the resistor to be adjusted, and the current adjusted resistor value of the currently adjusted resistor to be adjusted until the adjusted resistor value is within the allowable range of the nominal value deviation, including:
a, acquiring an initial resistance value of a regulated resistor, and if the initial resistance value is within a resistance value range allowed by a nominal value deviation, switching to a next regulated resistor for regulation without regulation;
b, if the initial resistance is not in the range of the resistance allowed by the nominal value deviation, applying a conducting narrow pulse to the resistance-adjusting switching device, adjusting the adjusted resistor once, and repeatedly executing a and b until the acquired resistance of the adjusted resistor is in the range of the resistance allowed by the nominal value deviation.
The round-robin resistance-adjusting circuit and the resistance-adjusting method of the thick film resistor array of the thermal printing sheet provided by the invention realize the detection and resistance adjustment of the adjusted resistor through alternate switching, and have high resistance-adjusting efficiency and accuracy. By adopting the round robin resistance adjusting mode, only one resistor is adjusted at a time, so that a small-capacity resistance adjusting power supply can meet the requirements, and the cost and the volume of the resistance adjusting power supply can be greatly reduced.
Drawings
FIG. 1 is a schematic diagram of a thermal print sheet thick film resistor array of the present invention;
fig. 2 is a schematic flow chart of a method for adjusting resistance in a thermal printing sheet thick film resistor array according to the present invention.
Detailed Description
The following describes in further detail the embodiments of the present invention with reference to the drawings and examples. The following examples are illustrative of the invention and are not intended to limit the scope of the invention.
Example 1
A thermal printing sheet thick film resistor array round-robin resistance adjusting circuit, wherein, the thermal printing sheet includes multiple parallel thick film resistors, forming a resistor array, each thick film resistor is a resistor to be adjusted. The round-robin resistance-regulating circuit comprises a plurality of switching devices corresponding to each path of regulated resistance, wherein each path of switching device comprises two switching devices, namely a resistance-regulating switching device and a detection switching device. One end of each path of the regulated resistor is connected with a resistance regulating power supply through a corresponding resistance regulating switching device, and is connected with a reference power supply through a detection switching device, and when the detection switching device is turned on, the reference power supply supplies power to each path of the regulated resistor.
The alternate detection and resistance adjustment of the adjusted resistor are realized by alternately switching on each path of detection switching device and resistance adjustment switching device; in the process of adjusting the resistance, an impulse current is provided for the adjusted resistance by applying a conducting narrow pulse to the resistance-adjusting switching device, so that the resistance adjustment of the adjusted resistance is realized.
The round-robin resistance-adjusting circuit of the thick film resistor array of the thermal printing sheet provided by the invention realizes the detection and resistance adjustment of the adjusted resistor through alternate switching, and has very high resistance-adjusting efficiency and precision. By adopting the round robin resistance adjusting mode, only one resistor is adjusted at a time, so that a small-capacity resistance adjusting power supply can meet the requirements, and the cost and the volume of the resistance adjusting power supply can be greatly reduced.
Specifically, let the resistor-adjusting of the thermal printing sheet with n resistors be exemplified, the n resistors are connected with the MOS tube array of the resistor-adjusting machine by probes on the precise positioning equipment, and the pulse round-robin resistor-adjusting principle circuit of the thick film resistor array of the thermal printing sheet based on the MOS tube is shown in figure 1.
As shown in FIG. 1, the round-robin resistance-adjusting circuit comprises multiple adjustable resistors R 1 ~R n Each path of switching device corresponding to each path of regulated resistor comprises two MOS switching tubes which are marked as Q 11 、Q 12 ~Q n1 、Q n2 ,Q i1 For resistance-adjusting switching devices, Q i2 To detect switching devices. Each path of modulated resistor R i And the probe i is connected with the MOS switch tube array. The specific circuit connection relation is that the resistance-adjusting switch device and the detection switch device are both MOS tubes, and the resistance R is adjusted i One end of each of which is connected with a resistance-adjusting switch device Q i1 Source and sense switching device Q i2 Source electrode of (C) resistance-adjusting switching device Q i1 The drain electrode of (2) is connected with a resistance-adjusting power supply V, and a detection switching device Q i2 Is passed through the drain of resistor R 0 Connected with a reference power supply V 0
The working principle of adjusting the resistance value of the regulated resistor is as follows: by detecting the switching device Q i2 Is applied with a control signal i to control the detection switching device Q i2 To determine whether the corresponding tuned resistance is tuned at the time; then, by switching device Q to resistance-adjusting i1 Applying a conducting narrow pulse to provide an impulse current for the regulated resistor, and regulating the resistance value of the corresponding regulated resistor; wherein i is the serial number of the regulated resistor, i is more than or equal to 1 and less than or equal to n, and i is a positive integer.
As an embodiment, the round-robin resistance-adjusting circuit further includes an AD sampling circuit corresponding to each path of the adjusted resistance, and the AD sampling circuit is connected to the detection switch device Q i2 Drain of (d) and resistance R 0 When the detection switch device is turned on, calculating the resistance value of the regulated resistor by adopting the voltage of the regulated resistor; based on the calculated resistance value of the regulated resistor, the resistor-regulating switch device Q i1 And applying a conducting narrow pulse to adjust the resistance value of the corresponding regulated resistor.
It can be understood that in fig. 1, each path of modulated resistor has two MOS transistors as a contactless switch capable of being opened and closed rapidly, one path of MOS transistor is used for modulating resistor, switching on the modulating resistor power supply, and providing a narrow pulse (sub microsecond level) to the modulated resistor; the other MOS tube is connected with a reference power supply to supply power to the regulated resistor, the voltage of the regulated resistor is sent to AD sampling, and the resistance value of the regulated resistor is calculated in real time.
The process of adjusting the resistance of the thermal printing sheet thick film resistor based on the round robin resistance adjusting resistor of fig. 1 is as follows:
S1:Q 11 disconnection, Q 12 Conducting, AD1 sampling to obtain a regulated resistor R 1 If R is the value of 1 If the deviation from the nominal value is within the allowable range, the next resistor R to be regulated is ready to be regulated 2 Resistance value of (2); otherwise, entering S2;
S2:Q 11 applying a conducting narrow pulse (sub microsecond level) to the regulated resistor R 1 An impulse current, R 1 The resistance of (2) decreases; regulated resistor R 1 After the resistance value of (2) is adjusted, the resistor (R) is switched to the next adjusted resistor (R) 2 . And sequentially cycling until the resistance value of each regulated resistor is regulated to be within the range of the resistance value allowed by the nominal value deviation, and finishing the regulation process.
Example two
A method for adjusting the resistance of a thick film resistor array of a thermal printing sheet by a round-robin method comprises the following steps: the alternate detection and resistance adjustment of the adjusted resistance are realized by alternately switching on each path of detection switching device and resistance adjustment switching device; in the process of regulating the resistance, a conducting narrow pulse is applied to a resistance regulating switching device so as to provide an impact current for a regulated resistor, so that the resistance regulation of the regulated resistor is realized; one end of each path of the regulated resistor is connected with a resistance regulating power supply through a corresponding resistance regulating switching device, and is connected with a reference power supply through a detection switching device, and the reference power supply supplies power for each path of the regulated resistor.
As an embodiment, by turning on each path of detection switching device and resistance-adjusting switching device in turn, the method for realizing the detection and resistance adjustment of the adjusted resistance in turn includes: according to the adjustment sequence of the multi-path adjusted resistors, corresponding detection switching devices are turned on in a round-robin manner through respective control signals so as to determine the current adjusted resistors; for the currently regulated resistor, an impulse current is provided for the regulated resistor by applying a conduction pulse to the corresponding resistance regulating switch device, so that the resistance value of the currently regulated resistor is regulated.
Wherein, for the current regulated resistance, through applying a conducting pulse to its corresponding resistance regulating switching device, the current regulated resistance of the current regulated resistance is regulated, including: and for the currently regulated resistor, the resistance value of the currently regulated resistor is regulated by applying the same conducting narrow pulse to the corresponding resistor regulating switch device for a plurality of times until the resistance value of the regulated resistor after regulation is within the resistance value range allowed by the nominal value deviation.
Specifically, for the currently adjusted resistor, the same conducting narrow pulse is applied to the corresponding resistor-adjusting switching device for a plurality of times, and the resistance value of the currently adjusted resistor is adjusted until the resistance value of the adjusted resistor is within the allowable resistance value range of the nominal value deviation, and the method comprises the following steps: a, acquiring an initial resistance value of a regulated resistor, and if the initial resistance value is within a resistance value range allowed by a nominal value deviation, switching to a next regulated resistor for regulation without regulation; b, if the initial resistance is not in the range of the resistance allowed by the nominal value deviation, applying a conducting narrow pulse to the resistance-adjusting switching device, adjusting the adjusted resistor once, and repeatedly executing a and b until the acquired resistance of the adjusted resistor is in the range of the resistance allowed by the nominal value deviation.
The flow of pulse cycle resistance adjustment of the thick film resistor of the thermal printing sheet can be shown in fig. 2, wherein n number of the adjusted resistors of the thermal printing sheet are set, and the serial number of the adjusted resistors is i. When the n modulated resistors are subjected to round robin resistance adjustment, the voltage value of the ith modulated resistor is read through the ith AD sampling channel, and the resistance value R of the ith modulated resistor is calculated i Judging R i Whether within the allowable deviation range of the nominal value, if so, the regulated resistor R i The resistance of (2) is not adjusted; if R is i And if the difference is not in the allowable range of the nominal value, applying an opening pulse (0.1 microsecond) to the MOS tube of the ith path of the resistance-adjusting switch to realize the resistance adjustment of the ith path of the resistance-adjusting resistor. And then the resistance value of the next path of regulated resistor is regulated until the resistance values of all the regulated resistors of the thermal printing sheet are regulated. When all are poweredAfter the resistance value of the resistor is adjusted, all resistance values in the resistor adjusting process are transmitted to an upper computer through Ethernet difference, and the completion of resistor adjustment is notified.
In the process of adjusting the resistance, conducting narrow pulses are applied to the resistance adjusting switch device each time, after the resistance adjustment of each pulse is completed, the resistance value adjusted by the adjusted resistor is recalculated, whether the resistance value of the adjusted resistor is within the allowable error range of the deviation of the nominal value is judged again, if not, conducting narrow pulses with the same size are applied to the resistance adjusting switch device again, and the resistance value of the adjusted resistor is continuously adjusted until the resistance value of the adjusted resistor is within the allowable error range of the deviation of the nominal value.
According to the circulation resistance regulating circuit and the resistance regulating method of the thermal printing sheet thick film resistor array based on the MOS tube, as the delay time of the switching device high-speed MOS tube is only a few nanoseconds, a resistance regulating narrow pulse with the minimum of less than 100 nanoseconds can be generated, the on resistance is only a few milliohms, and the MOS tube is connected in a contactless manner, when the thermal printing sheet thick film resistor array based on the MOS tube is used, the circuit is reasonable in design, does not overflow and overpressure, the conduction times of the MOS tube are infinite, and the conduction voltage drop is negligible and stable and invariable. Therefore, the MOS tube alternate switching pulse resistance adjusting method has high resistance adjusting efficiency, resistance adjusting precision and reliability. The detection and resistance adjustment of the adjusted resistance are realized through alternate switching, and the adjustable resistance detection device has high resistance adjustment efficiency and precision. By adopting the round robin resistance adjusting mode, only one resistor is adjusted at a time, so that a small-capacity resistance adjusting power supply can meet the requirements, and the cost and the volume of the resistance adjusting power supply can be greatly reduced.
In the foregoing embodiments, the descriptions of the embodiments are focused on, and for those portions of one embodiment that are not described in detail, reference may be made to the related descriptions of other embodiments.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.

Claims (7)

1. The round-robin resistance-adjusting circuit of the thick film resistor array of the thermal printing sheet is characterized in that the thermal printing sheet comprises a plurality of paths of thick film resistors which are arranged side by side to form a resistor array, the round-robin resistance-adjusting circuit comprises a plurality of paths of switching devices corresponding to each path of regulated resistors, each path of switching devices comprises two switching devices, one end of each path of regulated resistor is connected with a resistance-adjusting power supply through the corresponding resistance-adjusting switching device and used for adjusting resistance of the regulated resistor, and the reference power supply is connected through a detection switching device, the resistance-adjusting switching device and the detection switching device are MOS tubes, when the detection switching device is turned on, the reference power supply supplies power to each path of regulated resistor, and the voltage of the regulated resistor end is subjected to AD conversion to obtain a resistance value after resistance adjustment;
the alternate detection and resistance adjustment of the adjusted resistance are realized by alternately switching on each path of detection switching device and resistance adjustment switching device;
in the process of regulating the resistance, a conducting narrow pulse is applied to a resistance regulating switch device so as to provide an impact current for a regulated resistor, so that the resistance regulation of the regulated resistor is realized;
the regulated resistor R i One end of each of which is connected with a resistance-adjusting switch device Q i1 Is connected with the source electrode of the detection switch device Q i2 The resistance-adjusting switch device Q i1 The drain electrode of the detection switch device Q is connected with a resistance-adjusting power supply V i2 Is passed through the drain of resistor R 0 Connected with a reference power supply V 0
By switching the device Q to the detection i2 The gate of (1) is applied with an ith path control signal to control the detection switching device Q i2 To determine whether the corresponding tuned resistance is tuned at the time;
by direction ofThe resistance-adjusting switch device Q i1 Applying a conducting narrow pulse to the grid electrode of the resistor to be regulated to provide an impulse current for the resistor to be regulated, and regulating the resistance value of the corresponding resistor to be regulated;
wherein i is the serial number of the regulated resistor, i is more than or equal to 1 and less than or equal to n, and i is a positive integer.
2. The resistance-switching circuit according to claim 1, further comprising an AD sampling circuit corresponding to each of the resistors to be switched, the AD sampling circuit being connected to the detection switching device Q i2 Drain of (d) and resistance R 0 The voltage of the regulated resistor is sampled, and the resistance value of the regulated resistor is calculated;
based on the calculated resistance value of the regulated resistor, the regulated resistor is turned on and off to the switching device Q i1 A conducting narrow pulse is applied to provide a surge current for the regulated resistor, and the resistance value of the corresponding regulated resistor is regulated.
3. The round robin resistance adjustment circuit according to claim 1 or 2, wherein the on narrow pulse is of the sub microsecond order.
4. A method of adjusting resistance in a thermal print sheet comprising a plurality of thick film resistors side by side to form a resistor array, the method comprising:
the alternate detection and resistance adjustment of the adjusted resistor are realized by alternately switching on each path of detection switching device and each path of resistance adjustment switching device, wherein the resistance adjustment switching devices and the detection switching devices are MOS tubes;
in the process of regulating the resistance, a conducting narrow pulse is applied to a resistance regulating switching device so as to provide an impact current for a regulated resistor, so that the resistance regulation of the regulated resistor is realized;
one end of each path of the regulated resistor is connected with a resistance regulating power supply through a corresponding resistance regulating switching device, and is connected with a reference power supply through a detection switching device, and the reference power supply supplies power for each path of the regulated resistor.
5. The method for adjusting resistance according to claim 4, wherein the alternately detecting and adjusting resistance of the adjusted resistor is realized by alternately turning on each of the detecting switch devices and the resistance-adjusting switch devices, comprising:
according to the adjustment sequence of the multi-path adjusted resistors, corresponding detection switching devices are turned on in a round-robin manner through respective control signals so as to determine the current adjusted resistors;
for the currently regulated resistor, an impulse current is provided for the regulated resistor by applying a conduction pulse to the corresponding resistance regulating switch device, so that the resistance value of the currently regulated resistor is regulated.
6. The method of claim 5, wherein for the currently adjusted resistor to be adjusted, by applying a conducting pulse to its corresponding resistor-adjusting switching device, the resistor-adjusting device is provided with an impulse current, and the adjusting of the resistance of the currently adjusted resistor to be adjusted comprises:
and for the currently regulated resistor, the same conducting narrow pulse is applied to the corresponding resistor regulating switch device for a plurality of times, an impact current is provided for the resistor to be regulated, and the resistance value of the currently regulated resistor to be regulated is regulated until the regulated resistance value of the regulated resistor is within the allowable resistance value range of the nominal value deviation.
7. The method for adjusting resistance by round robin according to claim 6, wherein for the currently adjusted resistance to be adjusted, by applying the same conducting narrow pulse to its corresponding resistance-adjusting switching device a plurality of times, providing an impact current to the resistance to be adjusted, adjusting the resistance of the currently adjusted resistance to be adjusted until the adjusted resistance of the resistance to be adjusted is within a range of resistance allowed by a nominal value deviation, comprising:
a, acquiring an initial resistance value of a regulated resistor, and if the initial resistance value is within a resistance value range allowed by a nominal value deviation, switching to a next regulated resistor for regulation without regulation;
b, if the initial resistance is not in the range of the resistance allowed by the nominal value deviation, applying a conducting narrow pulse to the resistance-adjusting switching device, adjusting the adjusted resistor once, and repeatedly executing a and b until the acquired resistance of the adjusted resistor is in the range of the resistance allowed by the nominal value deviation.
CN202210451028.1A 2022-04-26 2022-04-26 Round-robin resistance-adjusting circuit and resistance-adjusting method for thick film resistor array of thermal printing sheet Active CN115050530B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210451028.1A CN115050530B (en) 2022-04-26 2022-04-26 Round-robin resistance-adjusting circuit and resistance-adjusting method for thick film resistor array of thermal printing sheet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210451028.1A CN115050530B (en) 2022-04-26 2022-04-26 Round-robin resistance-adjusting circuit and resistance-adjusting method for thick film resistor array of thermal printing sheet

Publications (2)

Publication Number Publication Date
CN115050530A CN115050530A (en) 2022-09-13
CN115050530B true CN115050530B (en) 2023-12-22

Family

ID=83156939

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210451028.1A Active CN115050530B (en) 2022-04-26 2022-04-26 Round-robin resistance-adjusting circuit and resistance-adjusting method for thick film resistor array of thermal printing sheet

Country Status (1)

Country Link
CN (1) CN115050530B (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6359554A (en) * 1986-08-29 1988-03-15 Mitsubishi Electric Corp Resistance uniformizing device for thermal head
US4782202A (en) * 1986-12-29 1988-11-01 Mitsubishi Denki Kabushiki Kaisha Method and apparatus for resistance adjustment of thick film thermal print heads
EP0454133A2 (en) * 1990-04-26 1991-10-30 Matsushita Electric Industrial Co., Ltd. Thermal print head trimming apparatus and method for trimming resistance of a thermal print head
JP2002052752A (en) * 2000-08-09 2002-02-19 Rohm Co Ltd Method of adjusting resistance value of thermal head
CN103381711A (en) * 2012-05-04 2013-11-06 山东华菱电子有限公司 Method and device for thermal printing head resistor repair
CN207611091U (en) * 2017-12-29 2018-07-13 中国振华集团云科电子有限公司 Resistive performance detection device and system

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6359554A (en) * 1986-08-29 1988-03-15 Mitsubishi Electric Corp Resistance uniformizing device for thermal head
US4782202A (en) * 1986-12-29 1988-11-01 Mitsubishi Denki Kabushiki Kaisha Method and apparatus for resistance adjustment of thick film thermal print heads
US4782202B1 (en) * 1986-12-29 1994-03-08 Mitsubishi Denki Kabushiki Kaisha
EP0454133A2 (en) * 1990-04-26 1991-10-30 Matsushita Electric Industrial Co., Ltd. Thermal print head trimming apparatus and method for trimming resistance of a thermal print head
JP2002052752A (en) * 2000-08-09 2002-02-19 Rohm Co Ltd Method of adjusting resistance value of thermal head
CN103381711A (en) * 2012-05-04 2013-11-06 山东华菱电子有限公司 Method and device for thermal printing head resistor repair
CN207611091U (en) * 2017-12-29 2018-07-13 中国振华集团云科电子有限公司 Resistive performance detection device and system

Also Published As

Publication number Publication date
CN115050530A (en) 2022-09-13

Similar Documents

Publication Publication Date Title
US9308719B2 (en) Printhead board, printhead, and printing apparatus
US7950765B2 (en) Liquid discharge head and liquid discharge apparatus using liquid discharge head
CN108688326B (en) Wide array printhead module
Tirano et al. Accurate analysis of parasitic current overshoot during forming operation in RRAMs
DE10011179A1 (en) Determining temperature of semiconductor memory chip
JPH07503332A (en) resistive memory element
KR20060121567A (en) System and method of measuring pulse properties of semiconductor device
US11238928B2 (en) Read-write circuit and read-write method of memristor
CN103381711B (en) Thermal printing head repaiies resistance method and device
CN115050530B (en) Round-robin resistance-adjusting circuit and resistance-adjusting method for thick film resistor array of thermal printing sheet
JP2007064834A (en) Device characteristic measuring system
CN112525385B (en) Thermal resistance measuring instrument calibration system
Maestro-Izquierdo et al. Experimental time evolution study of the HfO 2-based IMPLY gate operation
CN112526425B (en) Thermal resistance measuring instrument calibration method and device based on thermal resistance standard component
US11031689B2 (en) Method for rapid testing of functionality of phase-change material (PCM) radio frequency (RF) switches
US10739290B2 (en) Read out integrated circuit (ROIC) for rapid testing and characterization of conductivity skew of phase-change material (PCM) in PCM radio frequency (RF) switches
US10862477B2 (en) Read out integrated circuit (ROIC) for rapid testing of functionality of phase-change material (PCM) radio frequency (RF) switches
CN1326697C (en) Fluid jet head with circuit to drive heater set
US10770122B2 (en) Memory input hold time adjustment
Li et al. An FPGA-Based Training System for a 1T1R Memristor Array with 500 nS Conductance Resolution Limit
CN1175975C (en) Ink-jet printing head able to accurately measure temp of heating element and its measuring method
Negrov et al. Integration of functional elements of resistive nonvolative memory with 1T-1R topology
JP2990323B2 (en) Thermal head trimming method and trimming device
CN110970073B (en) Phase change memory circuit, method for phase change memory device, pulse generation system
CN106079904B (en) A kind of new heating element structure thermal printing head

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant