CN115047219A

CN115047219A - Automatic chip testing device

Info

Publication number: CN115047219A
Application number: CN202210592550.1A
Authority: CN
Inventors: 沈爱兵
Original assignee: Shenzhen Baodingfeng Technology Co ltd
Current assignee: Shenzhen Baodingfeng Technology Co ltd
Priority date: 2022-05-28
Filing date: 2022-05-28
Publication date: 2022-09-13

Abstract

The invention discloses an automatic chip testing device, which comprises: the device comprises a universal meter, an accommodating mechanism and a fixing mechanism; a supporting seat is fixedly arranged at the bottom of the universal meter; the accommodating mechanism comprises a movable plate and an inserted rod which are respectively and movably connected to the supporting seat; according to the automatic chip testing device, the accommodating mechanism and the fixing mechanism are arranged on the universal meter, so that after the chip is placed in the empty groove, the chip can be fixed by the clamping plate under the action of the first spring; when the fixing mechanism is not used, the inserting rod can be inserted into the inserting groove to position the limiting block in a mode of pulling the movable plate, so that the fixing mechanism is convenient to store and place; through the setting, solved the staff and detected when the test pencil detects the resistance of chip through two on the universal meter, the condition of rocking can appear in the examination chip that awaits measuring of placing at will on the desktop to promote the work efficiency who carries out resistance detection time measuring to the chip.

Description

Automatic chip testing device

Technical Field

The invention relates to the technical field of chip detection, in particular to an automatic chip testing device.

Background

As is well known, an integrated circuit in which a circuit is fabricated on a surface of a semiconductor chip is also called a thin film integrated circuit. Another type of thick film integrated circuit is a miniaturized circuit formed by a discrete semiconductor device and passive components integrated into a substrate or wiring board. Integrated circuits have two main advantages for discrete transistors: cost and performance; the low cost is due to the fact that the chip prints all the components as a unit by photolithography, rather than making only one transistor at a time; the high performance is due to the components switching quickly, consuming less energy, because the components are small and close to each other; in the manufacturing of the chip, a monocrystalline silicon wafer is used as a base layer, then the MOSFET or BJT and other components are manufactured by using the technologies of photoetching, doping, CMP and the like, and then the conducting wire is manufactured by using the thin film and the CMP technology, so that the chip manufacturing is completed; the whole chip manufacturing process includes several links, such as chip design, wafer manufacturing, package manufacturing, testing, etc., wherein the wafer manufacturing process is particularly complex. Due to product performance requirements and cost considerations, the wire can be classified into an aluminum process and a copper process. The main process technologies can be divided into the following categories: photolithography, etching, diffusion, film formation, planarization, and metallization. Meanwhile, random access memory is the most common type of integrated circuit, so the most dense device is memory, but even on microprocessors there is memory; despite the complexity of the structure and the reduction in chip width over decades, the layers of the integrated circuit are still much thinner than the width.

When the resistance of a chip is detected, an automatic testing device commonly used in the prior art is a universal meter; but because partial chip volume is less to being fixed not being convenient for by the in-process of being detected, thereby making the staff examine time measuring through the resistance of two detection electrographs on the universal meter to the chip, the condition of rocking can appear in the examination chip that awaits measuring of placing at will on the desktop, and then two detection electrographs of being not convenient for are responded to the both ends of chip resistance simultaneously, thereby has reduced the work efficiency that resistance detected time measuring.

Disclosure of Invention

The present invention is directed to an automated chip testing apparatus to solve the above problems in the background art.

In order to achieve the purpose, the invention provides the following technical scheme: an automated chip testing apparatus, comprising: the device comprises a universal meter, an accommodating mechanism and a fixing mechanism;

a supporting seat is fixedly arranged at the bottom of the universal meter;

the accommodating mechanism comprises a movable plate and an inserting rod which are movably connected to the supporting seat respectively, a limiting block is fixedly connected to one side of the movable plate, an inserting groove is formed in one side of the limiting block, a baffle is fixedly connected to one end of the inserting rod, a first spring is fixedly connected to one side of the baffle, and one end of the first spring is fixedly connected with the supporting seat; the storage mechanism is used for storing the fixing mechanism, so that the fixing mechanism can be conveniently stored on the universal meter when not used;

the fixing mechanism comprises a hollow groove formed in the top of the movable plate, a clamping plate is connected to the inner side wall of the hollow groove in a sliding mode, a second spring is fixedly connected to one side of the clamping plate, a connecting plate is fixedly connected to one end of the second spring, and one side of the connecting plate is fixedly connected with the movable plate; the fixing mechanism is used for fixing the chip, and the chip is prevented from shaking in the process of being detected.

By adopting the technical scheme, the multimeter can be placed and used more stably; when the fixing mechanism is required to be used for fixing the chip, the fixing mechanism can be pulled out from the bottom of the universal meter for use through the accommodating mechanism, and the movable plate can drive the fixing mechanism to be pulled out from the bottom of the universal meter for use in a mode of pulling the movable plate; when the fixing mechanism is used, the movable plate can be pushed to the bottom of the universal meter again, after the movable plate drives the limiting block to extrude the insertion rod, the insertion rod can generate displacement inside the supporting seat, and the insertion rod can be inserted into the insertion groove of the limiting block under the action of the stretching force of the first spring, so that the limiting block can be subjected to the fixing force of the insertion rod, and the movable plate can be stably accommodated at the bottom of the universal meter; when needs carry out resistance to the chip and detect, can put into the dead slot to the fly leaf with the chip to after loosening the effort to splint, splint can press from both sides tightly the chip of placing in the dead slot under the effect of the stretching strength of second spring, thereby make the chip can not appear the condition of rocking when being responded to by two detection electrographs simultaneously.

Preferably, the inside sliding connection of connecting plate has the movable rod, the second spring suit is in on the lateral wall of movable rod.

Through adopting above-mentioned technical scheme, can make the second spring more steady at flexible in-process.

Preferably, one end of the movable rod, which is far away from the clamping plate, is fixedly connected with a second pull lug.

Through adopting above-mentioned technical scheme, can be convenient for stimulate splint through the movable rod, and then be convenient for carry out the operation that the centre gripping was fixed to the chip.

Preferably, the inside sliding connection of connecting plate has the slide bar, the one end and the splint fixed connection of slide bar, the other end fixedly connected with block of slide bar.

Through adopting above-mentioned technical scheme, can further promote the stability of splint when removing.

Preferably, one side of the movable plate is fixedly connected with a first pull lug.

Through adopting above-mentioned technical scheme, can be convenient for take the fly leaf out from the universal meter bottom and use.

Preferably, the quantity of supporting seat is two, two the spout has all been seted up to the adjacent one side of supporting seat, the inside wall sliding connection of spout has the slider, one side and the fly leaf fixed connection of slider.

Through adopting above-mentioned technical scheme, can make the fly leaf remove on the supporting seat more steadily.

Preferably, one side of the supporting seat and one side of the sliding groove are fixedly connected with a stop block.

Through adopting above-mentioned technical scheme, can remove to the slider and carry on spacingly, avoid the slider to break away from in the spout.

Preferably, the bottom of the supporting seat is fixedly connected with a supporting leg, and a groove is formed in the supporting leg.

Through adopting above-mentioned technical scheme, can promote the stability of supporting seat when supporting the universal meter.

Preferably, the outside of universal meter is rotated and is connected with the pivot that quantity is two, two the one end fixedly connected with handle that the pivot was carried on the back mutually, the inboard fixedly connected with rubber pad of handle.

Through adopting above-mentioned technical scheme, can be convenient for remove the carrying to the universal meter to comfort when also having promoted the grip.

Preferably, one side fixedly connected with connecting wire of universal meter, the one end fixedly connected with of connecting wire detects the electrography.

By adopting the technical scheme, the two detection test pens can be used for conveniently detecting the resistance on the chip.

Compared with the prior art, the invention has the beneficial effects that:

according to the automatic chip testing device, the accommodating mechanism and the fixing mechanism are arranged on the universal meter, so that after the chip is placed in the empty groove, the chip can be fixed by the clamping plate under the action of the first spring; when the fixing mechanism is not used, the inserting rod can be inserted into the inserting groove to position the limiting block in a mode of pulling the movable plate, so that the fixing mechanism is convenient to store and place; through the setting, solved the staff and detected when the test pencil detects the resistance of chip through two on the universal meter, the condition of rocking can appear in the examination chip that awaits measuring of placing at will on the desktop to promote the work efficiency who carries out resistance detection time measuring to the chip.

Drawings

FIG. 1 is a schematic structural diagram of an automated chip testing apparatus according to the present invention;

FIG. 2 is an enlarged view of area A of the structural schematic diagram of the automatic chip testing device of the present invention;

FIG. 3 is a schematic structural diagram of a receiving mechanism of the automatic chip testing device according to the present invention;

FIG. 4 is an enlarged schematic view of area B of the schematic view of the receiving mechanism of the automatic chip testing device according to the present invention;

FIG. 5 is a schematic structural diagram of a slide groove and a stopper in the automatic chip testing device of the present invention.

In the figure: 1. a universal meter; 10. a rotating shaft; 11. a handle; 12. a rubber pad; 13. a connecting wire; 14. a supporting seat; 15. a support leg; 16. a groove; 2. a storage mechanism; 20. a chute; 21. a slider; 22. a movable plate; 23. a limiting block; 24. inserting grooves; 25. inserting a rod; 26. a first spring; 27. a baffle plate; 28. a first pull tab; 29. a stopper; 3. a fixing mechanism; 30. an empty groove; 31. a splint; 32. a connecting plate; 33. a second spring; 34. a movable rod; 35. a slide bar; 36. a block body; 37. and a second pull lug.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1-5, the present invention provides a technical solution: an automated chip testing apparatus, comprising: the universal meter comprises a universal meter 1, a containing mechanism 2 and a fixing mechanism 3; the storage mechanism 2 is used for storing the fixing mechanism 3, so that the fixing mechanism 3 can be conveniently stored and placed on the multimeter 1 when not in use; the fixing mechanism 3 is used for fixing the chip and avoiding the chip from shaking in the process of detection;

in order to enable the multimeter 1 to be more stable when placed and used, a support seat 14 is fixedly arranged at the bottom of the multimeter 1; in order to improve the stability of the support seat 14 when the multimeter 1 is supported, a support leg 15 is fixedly connected to the bottom of the support seat 14, and a groove 16 is formed in the support leg 15; in order to facilitate the moving and carrying of the multimeter 1 and improve the comfort when the handle 11 is held, two rotating shafts 10 are rotatably connected to the outer side of the multimeter 1, the handle 11 is fixedly connected to the end, opposite to the rotating shafts 10, of each rotating shaft, and a rubber pad 12 is fixedly connected to the inner side of the handle 11; in order to facilitate the detection of the resistor on the chip through the two detection test pens, one side of the universal meter 1 is fixedly connected with a connecting wire 13, and one end of the connecting wire 13 is fixedly connected with the detection test pens;

when the fixing mechanism 3 is required to fix a chip, the fixing mechanism 3 can be drawn out from the bottom of the multimeter 1 for use through the accommodating mechanism 2, and the movable plate 22 can drive the fixing mechanism 3 to be drawn out from the bottom of the multimeter 1 for use by pulling the movable plate 22; after the fixing mechanism 3 is used, the movable plate 22 can be pushed into the bottom of the multimeter 1 again, after the movable plate 22 drives the limiting block 23 to extrude the insertion rod 25, the insertion rod 25 can generate displacement inside the supporting seat 14, and the insertion rod 25 can be inserted into the insertion groove 24 of the limiting block 23 under the action of the stretching force of the first spring 26, so that the limiting block 23 can be subjected to the fixing force of the insertion rod 25, and the movable plate 22 can be stably accommodated at the bottom of the multimeter 1; the accommodating mechanism 2 comprises a movable plate 22 and an inserting rod 25 which are movably connected to the supporting seat 14 respectively, one side of the movable plate 22 is fixedly connected with a limiting block 23, one side of the limiting block 23 is provided with an inserting groove 24, one end of the inserting rod 25 is fixedly connected with a baffle 27, one side of the baffle 27 is fixedly connected with a first spring 26, and one end of the first spring 26 is fixedly connected with the supporting seat 14; it should be noted that: the contact position of the limiting block 23 and the insertion rod 25 is a hemispherical structure, so that the insertion rod 25 can be displaced after being extruded by the limiting block 23; in order to facilitate the movable plate 22 to be drawn out from the bottom of the multimeter 1 for use, a first pull tab 28 is fixedly connected to one side of the movable plate 22; and it is to be noted that: when the movable plate 22 and the fixing mechanism 3 are stored at the bottom of the multimeter 1, one side of the first pull tab 28 can always extend out of the bottom of the multimeter 1; in order to enable the movable plate 22 to move on the supporting seat 14 more stably, the number of the supporting seats 14 is two, sliding grooves 20 are formed in adjacent sides of the two supporting seats 14, sliding blocks 21 are connected to inner side walls of the sliding grooves 20 in a sliding mode, and one sides of the sliding blocks 21 are fixedly connected with the movable plate 22; in order to limit the movement of the sliding block 21 and avoid the sliding block 21 from being separated from the sliding chute 20, a stop block 29 is fixedly connected with one side of the supporting seat 14 and one side of the sliding chute 20;

in order to place the chip into the empty slot 30 of the movable plate 22 and clamp the chip placed in the empty slot 30 under the action of the stretching force of the second spring 33 after the acting force on the clamp plate 31 is released when the chip is required to perform resistance detection, so that the chip cannot shake when being simultaneously sensed by two detection pens, the fixing mechanism 3 comprises the empty slot 30 arranged at the top of the movable plate 22, the inner side wall of the empty slot 30 is connected with the clamp plate 31 in a sliding manner, one side of the clamp plate 31 is fixedly connected with the second spring 33, one end of the second spring 33 is fixedly connected with the connecting plate 32, and one side of the connecting plate 32 is fixedly connected with the movable plate 22; it should be noted that: silica gel cushions are arranged on the inner side wall of the empty groove 30 and one side of the clamping plate 31, so that the chip can be prevented from being damaged by the clamping plate 31 and the inner side wall of the empty groove 30; in order to enable the second spring 33 to be more stable in the expansion process, a movable rod 34 is connected inside the connecting plate 32 in a sliding manner, and the second spring 33 is sleeved on the outer side wall of the movable rod 34; in order to facilitate the pulling of the clamping plate 31 by the movable rod 34 and further facilitate the operation of clamping and fixing the chip, a second pulling lug 37 is fixedly connected to one end of the movable rod 34 far away from the clamping plate 31; in order to further improve the stability of the clamping plate 31 during movement, a sliding rod 35 is slidably connected inside the connecting plate 32, one end of the sliding rod 35 is fixedly connected with the clamping plate 31, and the other end of the sliding rod 35 is fixedly connected with a block 36.

It should be noted that: the model of the multimeter 1 is MF 47.

According to the technical scheme, the working steps of the scheme are summarized and carded: when the resistance of the chip needs to be detected, the inserting rod 25 is pulled through the baffle 27, so that the inserting rod 25 can be pulled out of the inserting groove 24; after the limiting block 23 loses the positioning force, the movable plate 22 can drive the sliding block 21 to slide in the sliding groove 20 through the first pull lug 28, so that the movable plate 22 can extend out of the bottom of the multimeter 1 for use; the second pull lug 37 pulls the movable rod 34, so that the gap between the clamping plate 31 and the empty groove 30 can be increased under the action of the movable rod 34; placing a chip to be detected into the empty slot 30, loosening the second pull lug 37, and enabling the movable rod 34 to drive the clamping plate 31 to clamp the chip in the empty slot 30 under the action of the stretching force of the second spring 33; the worker can simultaneously detect the fixed chip resistor through the two detection test pens; after the detection is finished, the movable plate 22 can be moved into the bottom of the universal meter 1 again in a mode of driving the sliding block 21 to slide in the sliding groove 20; and after the movable plate 22 drives the limiting block 23 to extrude the insertion rod 25, the insertion rod 25 after displacement can be inserted into the insertion groove 24 under the action of the stretching force of the first spring 26 to position the limiting block 23, so that the movable plate 22 can be stably accommodated at the bottom of the multimeter 1.

To sum up: according to the automatic chip testing device, the accommodating mechanism 2 and the fixing mechanism 3 are arranged on the universal meter 1, so that after a chip is placed in the empty groove 30, the chip can be fixed by the clamping plate 31 under the action of the first spring 26; when the fixing mechanism 3 is not used, the insertion rod 25 can be inserted into the insertion groove 24 to position the limiting block 23 by pulling the movable plate 22, so that the fixing mechanism 3 can be conveniently stored; through the setting, solved the staff and detected when the resistance of test pencil to the chip through two on universal meter 1 detects, the condition of rocking can appear in the examination chip that awaits measuring of placing at will on the desktop to promote the work efficiency when carrying out resistance detection to the chip.

The parts not involved in the present invention are the same as or can be implemented by the prior art. Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. An automated chip testing apparatus, comprising: the universal meter comprises a universal meter (1), a storage mechanism (2) and a fixing mechanism (3);

a supporting seat (14) is fixedly arranged at the bottom of the universal meter (1);

the accommodating mechanism (2) comprises a movable plate (22) and an inserting rod (25) which are movably connected to the supporting seat (14) respectively, one side of the movable plate (22) is fixedly connected with a limiting block (23), one side of the limiting block (23) is provided with an inserting groove (24), one end of the inserting rod (25) is fixedly connected with a baffle (27), one side of the baffle (27) is fixedly connected with a first spring (26), and one end of the first spring (26) is fixedly connected with the supporting seat (14);

fixed establishment (3) are including offering dead slot (30) at fly leaf (22) top, the inside wall sliding connection of dead slot (30) has splint (31), one side fixedly connected with second spring (33) of splint (31), the one end fixedly connected with connecting plate (32) of second spring (33), one side and fly leaf (22) fixed connection of connecting plate (32).

2. The automated chip testing apparatus of claim 1, wherein: the inside sliding connection of connecting plate (32) has movable rod (34), second spring (33) suit is in on the lateral wall of movable rod (34).

3. The automated chip testing apparatus of claim 2, wherein: one end of the movable rod (34) far away from the clamping plate (31) is fixedly connected with a second pull lug (37).

4. The automated chip testing apparatus of claim 2, wherein: the inside sliding connection of connecting plate (32) has slide bar (35), the one end and splint (31) fixed connection of slide bar (35), the other end fixedly connected with block (36) of slide bar (35).

5. The automated chip testing apparatus of claim 1, wherein: one side of the movable plate (22) is fixedly connected with a first pull lug (28).

6. The automated chip testing apparatus of claim 1, wherein: the quantity of supporting seat (14) is two, two spout (20) have all been seted up to adjacent one side of supporting seat (14), the inside wall sliding connection of spout (20) has slider (21), one side and fly leaf (22) fixed connection of slider (21).

7. The automated chip testing apparatus of claim 6, wherein: and a stop block (29) is fixedly connected to one side of the supporting seat (14) and one side of the sliding groove (20).

8. The automated chip testing apparatus of claim 7, wherein: the bottom of the supporting seat (14) is fixedly connected with a supporting leg (15), and a groove (16) is formed in the supporting leg (15).

9. The automated chip testing apparatus of claim 1, wherein: the outside of universal meter (1) is rotated and is connected with pivot (10) that quantity is two, two one end fixedly connected with handle (11) that pivot (10) carried on the back mutually, inboard fixedly connected with rubber pad (12) of handle (11).

10. The automated chip testing apparatus of claim 9, wherein: one side fixedly connected with connecting wire (13) of universal meter (1), the one end fixedly connected with of connecting wire (13) detects the electrography.