CN114997241B - Pin inspection method, pin inspection device, computer equipment and storage medium - Google Patents
Pin inspection method, pin inspection device, computer equipment and storage medium Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 39
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- 238000010835 comparative analysis Methods 0.000 claims abstract description 21
- 238000004590 computer program Methods 0.000 claims description 25
- 238000013507 mapping Methods 0.000 claims description 21
- 238000013461 design Methods 0.000 claims description 16
- 238000012795 verification Methods 0.000 claims description 9
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G01R31/317—Testing of digital circuits
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- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Abstract
The application relates to a pin inspection method, a pin inspection device, computer equipment and a storage medium. The method comprises the following steps: acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information; acquiring demand information according to a demand document, storing pin information into a first data set, storing demand information into a second data set, and screening difference characteristics according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set; and performing comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information. By adopting the method, the efficiency of pin inspection can be improved, and resources required in the pin inspection process can be saved.
Description
Technical Field
The present disclosure relates to the field of hardware testing technologies, and in particular, to a pin inspection method, apparatus, computer device, and storage medium.
Background
FPGA (Field Programmable Gate Array ) is presented as a semi-custom circuit in ASIC (Application Specific Integrated Circuit ) field, which not only solves the disadvantages of custom circuits, but also overcomes the disadvantages of limited gate numbers of the original programmable devices.
The flow of FPGA logic circuit design can be roughly divided into five steps, namely logic code design, pin mapping, place and route, timing analysis and executable file generation. The pin mapping is an important step for establishing connection between a logic code interface and the FPGA physical pins, and affects the follow-up steps such as layout and wiring. Therefore, an efficient and accurate method of verifying whether a pin map meets design requirements is important.
However, at present, the method for checking the pin mapping is mainly to compare whether the states of all pins are consistent with the design requirement one by one in a manual mode.
Disclosure of Invention
Based on the above, a pin inspection method, a device, a computer device and a storage medium are provided, which can solve the problem of low pin inspection efficiency in the prior art.
In one aspect, a pin inspection method is provided, the method comprising:
acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information;
acquiring demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and performing difference feature screening according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
and performing comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information.
In one embodiment, the performing a comparison analysis based on the first difference data and the second difference data comprises:
extracting first semantic information of the first difference data and second semantic information of the second difference data;
judging whether the first difference data is matched with the corresponding second difference data according to the first semantic information and the second semantic information, and obtaining a matching result;
And screening and checking the difference data according to the matching result to obtain the checking information.
In one embodiment, the performing the comparison analysis based on the first difference data and the second difference data further includes:
and performing character matching according to the first difference data and the second difference data to obtain difference points of the first difference data and the second difference data, selecting a corresponding difference characteristic screening mode according to difference factors of the difference points, screening and comparing the difference data according to the difference characteristic screening mode, and obtaining the pin inspection information.
In one embodiment, the selecting a corresponding difference feature screening manner according to the difference category of the difference point includes:
ignoring the point of difference when a difference factor of the point of difference is detected to be caused by a separator in the first difference data and/or the second difference data;
and comparing and analyzing the first difference data and the second difference data.
In one embodiment, the selecting a corresponding difference feature screening manner according to the difference category of the difference point includes:
When detecting that the difference factor of the difference point is caused by brackets in the first difference data and/or the second difference data, comparing and analyzing the character data of the first difference data and the second difference data outside the brackets with the character data in the brackets respectively.
In one embodiment, the obtaining pin verification information from the analysis information includes:
judging whether the difference data exists in the analysis information;
if yes, extracting difference data in the analysis information, generating pin inspection information according to the difference data, and judging pin mapping abnormality according to the pin inspection information;
if not, generating the pin inspection information according to the analysis information, and judging that the pin mapping is normal according to the pin inspection information.
In one embodiment, the performing the comparison analysis based on the first difference data and the second difference data further includes:
clustering the first difference data and the second difference data respectively to obtain first clustering information corresponding to the first difference data and second clustering information corresponding to the second difference data, and performing comparative analysis on the first clustering information and the second clustering information to obtain analysis information.
In another aspect, there is provided a pipe teaching inspection device, the device comprising:
the acquisition module is used for acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information;
the screening module is used for acquiring the demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and screening difference characteristics according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
and the analysis module is used for carrying out comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information.
In yet another aspect, a computer device is provided comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the steps of:
Acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information;
acquiring demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and performing difference feature screening according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
and performing comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information.
In yet another aspect, a computer readable storage medium is provided, having stored thereon a computer program which when executed by a processor performs the steps of:
acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information;
acquiring demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and performing difference feature screening according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
And performing comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information.
According to the pin checking method, the pin checking device, the computer equipment and the storage medium, the configuration information in the configuration file is read by acquiring the configuration file, and the configuration information is extracted according to the requirement file to obtain the pin information to be checked; obtaining demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and performing difference feature screening according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set so as to realize primary screening of the first difference data and the second difference data which are not matched with the pin information and the demand information; and comparing and analyzing the first difference data and the second difference data to obtain analysis information so as to realize secondary screening of the first difference data and the second difference data, and obtaining pin inspection information according to the analysis information so as to embody the result of pin inspection, and further judging whether the pin mapping is abnormal or not according to the pin inspection information so as to finish inspection of the pins. By the pin inspection method, the efficiency of pin inspection is improved, and resources required in the pin inspection process are saved.
Drawings
FIG. 1 is a flow chart of a pin inspection method in one embodiment;
FIG. 2 is a flow chart of a comparative analysis step in one embodiment;
FIG. 3 is a flow chart of a comparative analysis step in another embodiment;
FIG. 4 is a block diagram of a pin verification device in one embodiment;
fig. 5 is an internal structural diagram of a computer device in one embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
It should be noted that, the illustrations provided in the present embodiment merely illustrate the basic concept of the present invention by way of illustration, and only the components related to the present invention are shown in the drawings and are not drawn according to the number, shape and size of the components in actual implementation, and the form, number and proportion of the components in actual implementation may be arbitrarily changed, and the layout of the components may be more complex. The structures, proportions, sizes, etc. shown in the drawings attached hereto are for illustration purposes only and are not intended to limit the scope of the invention, which is defined by the claims, but rather by the claims. Also, the terms "upper", "lower", "left", "right", "middle" and "first", "second", etc. are used herein for descriptive purposes only and are not intended to limit the scope of the invention for practical purposes, but are also to be construed as within the scope of the invention without substantial modification to the technical context.
In one embodiment, as shown in FIG. 1, a pin verification method is provided, comprising the steps of:
step 101, acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information.
The configuration file refers to an engineering file generated by the FPGA after pin mapping, the engineering file contains configuration information of all pins of the whole FPGA logic circuit design, and the requirement document refers to a document used for reflecting design requirements in the FPGA logic circuit design.
Specifically, according to the design engineering of the logic circuit, a corresponding configuration file is obtained, configuration information is read from the configuration file, the configuration information is divided, the divided configuration information is extracted according to a requirement document, and pin information in the configuration information is obtained.
When the configuration information is divided, the configuration information may be divided according to a preset information template, or a sentence (character string) in the configuration file may be obtained, and the character string may be divided.
Illustratively, for example, if the statement "set_location_assignment PIN_A0-to LED_A0" exists in the configuration file, this indicates that PIN A0 is matched to LED_A0. Therefore, the PIN PIN and the named NAME can be extracted by taking the ' set_location_assignment ' PIN ' -to ' NAME ' as an information template, namely, two pieces of information of PIN_A0 and LED_A0 are extracted according to the information template;
Or dividing the sentence according to the form of character strings to obtain configuration information in the form of character strings such as 'set', 'location', 'assignment', 'PIN_A0', 'to', 'LED_A0', and the like, extracting 'PIN_A0' related to the PIN type and 'LED_A0' related to the NAME type from the configuration information, and taking 'PIN_A0' and 'LED_A0' as PIN information.
Step 102, obtaining requirement information according to the requirement document, storing the pin information into a first data set, storing the requirement information into a second data set, and screening difference characteristics according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set.
The requirement information refers to the design requirement recorded in the related requirement document in the design engineering of the FPGA logic circuit.
It should be noted that, the pin map is mainly used to test whether the actual pin information of the FPGA is matched with the design requirement in the requirement document, so that the pin information and the requirement information can be divided into two data sets, and difference feature screening is performed according to the information differences in the two data sets, so as to obtain difference data which are not matched with each other in the two data sets, where the difference data includes one or more first difference data obtained according to the first data set and one or more second difference data obtained according to the second data set, and the first difference data and the second difference data correspond to each other.
It should be noted that, in the present specification, terms such as "first", "second", etc., are used for convenience of description, and are not used for any limitation or additional feature of the modified term.
For ease of understanding, it may be considered that a union (difference dataset) of proprietary data in respective sets of the first dataset and the second dataset, i.e. a set comprising the first difference data and the second difference data, is obtained.
And step 103, performing comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information.
Wherein the analysis information is used to analyze the cause (difference factor) of the difference between the first difference data and the second difference data.
Specifically, by comparing and analyzing the first difference data and the second difference data to obtain analysis information including difference factors, judging the difference degree of the first difference data and the second difference data according to the difference factors, obtaining the difference factors mainly for obtaining whether the first difference data and the second difference have substantial differences (namely whether the actual meanings represented by the first difference data and the second difference data are different or not), obtaining pin inspection information for reflecting pin inspection results according to the analysis information, judging whether the pin mapping is abnormal or not according to the pin inspection information, and finishing the inspection of pins.
In the pin inspection method, the configuration information in the configuration file is read by acquiring the configuration file, and the configuration information is extracted according to the requirement file to obtain the pin information to be inspected; obtaining demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and performing difference feature screening according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set so as to realize primary screening of the first difference data and the second difference data which are not matched with the pin information and the demand information; and comparing and analyzing the first difference data and the second difference data to obtain analysis information so as to realize secondary screening of the first difference data and the second difference data, and obtaining pin inspection information according to the analysis information so as to embody the result of pin inspection, and further judging whether the pin mapping is abnormal or not according to the pin inspection information so as to finish inspection of the pins. By the pin inspection method, the efficiency of pin inspection is improved, and resources required in the pin inspection process are saved.
In one embodiment, as shown in fig. 2, the step of performing a comparative analysis on the first difference data and the second difference data includes:
step 201, extracting first semantic information of the first difference data and second semantic information of the second difference data;
step 202, judging whether the first difference data is matched with the corresponding second difference data according to the first semantic information and the second semantic information, and obtaining a matching result;
and step 203, screening and checking the difference data according to the matching result to obtain the checking information.
In some embodiments, the semantic feature extraction may be performed on the difference data through an Encoder-Decoder structure (Encoder-Decoder), thereby obtaining semantic information corresponding to the difference data.
Specifically, the semantic feature extraction can be performed by using a Seq2Seq semantic information extraction model, and the semantic feature extraction step comprises the following steps: and performing text segmentation on the difference data to obtain one or more difference texts, inputting the difference texts into a semantic information extraction model to obtain feature vectors corresponding to the difference data, wherein the feature vectors are used for reflecting semantic information of the difference data.
Illustratively, by the above-mentioned semantic feature extraction method, a first feature vector (first semantic information) of the first difference data and a second feature vector (second semantic information) of the second difference data are extracted, and by calculating the matching degree of the first feature vector and the second feature vector, whether the first difference data are matched with the second difference data is judged, so as to further check whether the pin mapping is correct or whether the logic circuit design requirement in the requirement document is met, and output corresponding check information.
In one embodiment, as shown in fig. 3, the step of performing a comparative analysis on the first difference data and the second difference data further includes:
step 301, performing character matching according to the first difference data and the second difference data to obtain difference points of the first difference data and the second difference data;
step 302, selecting a corresponding difference feature screening mode according to the difference factors of the difference points, screening and comparing and analyzing the difference data according to the difference feature screening mode to obtain the pin inspection information.
Specifically, character segmentation is performed on the first difference data to obtain one or more first difference characters, character segmentation is performed on the second difference data to obtain one or more second difference characters, character comparison is performed on the first difference characters and the second difference characters to obtain one or more character addresses (difference points) of the first difference characters and the second difference characters, which are not matched, the factor causing the difference is judged according to the difference point, the corresponding difference feature screening mode is selected according to the difference factor, the difference data is screened, the first difference data and the second difference data which still have difference features are selected, and comparison analysis is performed on the screened first difference data and second difference data to obtain the pin inspection information.
In one embodiment, the selecting a corresponding difference feature screening manner according to the difference category of the difference point includes:
ignoring the point of difference when a difference factor of the point of difference is detected to be caused by a separator in the first difference data and/or the second difference data;
and comparing and analyzing the first difference data and the second difference data.
Illustratively, the explanation is given taking an example in which the difference factor of the difference point in the first difference data and the second difference data is caused by the separator;
if the first difference data is "pin_a0", the second difference data is "PINA0", wherein the difference point is a separator "_j", so that the difference point can be ignored, and the first difference data is regarded as "PINA0" and is compared with the second difference data for analysis;
or, if the first difference data is "PIN-A0", the second difference data is "PINA0", and the difference point is the separator "-", the difference point generated by the separator may be ignored.
Further, a preset partition Fu Moban may be obtained, and when it is detected that the difference factor of the difference point matches the separator in the separator template, it is considered that the difference factor is caused by the separator, and the difference point is ignored.
In one embodiment, the selecting a corresponding difference feature screening manner according to the difference category of the difference point includes:
when detecting that the difference factor of the difference point is caused by brackets in the first difference data and/or the second difference data, comparing and analyzing the character data of the first difference data and the second difference data outside the brackets with the character data in the brackets respectively.
Illustratively, the difference factor of the difference points in the first difference data and the second difference data is illustrated by taking the example that the difference factor is caused by brackets, wherein the brackets include, but are not limited to, related symbols such as small brackets, medium brackets, large brackets, circular brackets, fang Kuo culvert and angle brackets;
if the first difference data is 'LED <0 >', the second difference data is 'LED (0)', wherein the difference points are '<' > and '()' caused by bracket reasons, extracting character data 'LED' outside the bracket of the first difference data and character data 'LED' outside the bracket of the second difference data, and extracting character data '0' in brackets of the first difference data and character data '0' in brackets of the second difference data; respectively comparing and analyzing the character data outside the bracket of the first difference data with the character data outside the bracket of the second difference data, the character data in the bracket of the first difference data and the character data in the bracket of the second difference data; if the character data outside the bracket of the first difference data and the character data outside the bracket of the second difference data are matched, and the character data in the bracket of the first difference data and the character data in the bracket of the second difference data are matched, the first difference data and the second difference data are considered to have no difference characteristic in the meaning, the pin corresponding to the first difference data is matched with the corresponding requirement information, and the design requirement of the logic circuit is met.
For ease of understanding, the above method can be considered to a certain extent as: if the difference characteristics of the first difference data and the second difference data are only caused by brackets, the first difference data and the second difference data are considered to have no substantial difference, and the accuracy of pin inspection is improved and error interference in the inspection process is avoided by the method for eliminating the difference factors.
In one embodiment, the obtaining pin verification information from the analysis information includes:
judging whether the difference data exists in the analysis information;
if yes, extracting difference data in the analysis information, generating pin inspection information according to the difference data, and judging pin mapping abnormality according to the pin inspection information;
if not, generating the pin inspection information according to the analysis information, and judging that the pin mapping is normal according to the pin inspection information.
It should be noted that, in the pin inspection process, it is necessary to determine whether there is still difference data in the analysis information, so as to know whether the pin mapping is normal or whether the pin setting meets the design requirement of the FPGA logic circuit.
In one embodiment, the performing the comparison analysis based on the first difference data and the second difference data further includes:
Clustering the first difference data and the second difference data respectively to obtain first clustering information corresponding to the first difference data and second clustering information corresponding to the second difference data, and performing comparative analysis on the first clustering information and the second clustering information to obtain analysis information.
It should be noted that, clustering the first difference data may obtain one or more first clustering information, clustering the second difference data may obtain one or more second clustering information, and comparing and analyzing the first difference data in the first clustering information and the second difference data in the corresponding second clustering information to obtain analysis information.
Further, if the first difference data in the first cluster information is matched with the second difference data in the corresponding second cluster information, the first cluster information and the second cluster information can be considered to be matched, and the efficiency of analyzing and checking the difference data is improved through the mode of performing cluster analysis on the difference data.
It should be understood that, although the steps in the flowcharts of fig. 1-3 are shown in order as indicated by the arrows, these steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in fig. 1-3 may include multiple sub-steps or phases that are not necessarily performed at the same time, but may be performed at different times, nor does the order in which the sub-steps or phases are performed necessarily occur sequentially, but may be performed alternately or alternately with at least a portion of the sub-steps or phases of other steps or other steps.
In one embodiment, as shown in FIG. 4, there is provided a pin inspection apparatus comprising: the system comprises an acquisition module, a screening module and an analysis module, wherein:
the acquisition module is used for acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information;
the screening module is used for acquiring the demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and screening difference characteristics according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
and the analysis module is used for carrying out comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information.
In one embodiment, the performing a comparison analysis based on the first difference data and the second difference data comprises:
extracting first semantic information of the first difference data and second semantic information of the second difference data;
Judging whether the first difference data is matched with the corresponding second difference data according to the first semantic information and the second semantic information, and obtaining a matching result;
and screening and checking the difference data according to the matching result to obtain the checking information.
In one embodiment, the performing the comparison analysis based on the first difference data and the second difference data further includes:
and performing character matching according to the first difference data and the second difference data to obtain difference points of the first difference data and the second difference data, selecting a corresponding difference characteristic screening mode according to difference factors of the difference points, screening and comparing the difference data according to the difference characteristic screening mode, and obtaining the pin inspection information.
In one embodiment, the selecting a corresponding difference feature screening manner according to the difference category of the difference point includes:
ignoring the point of difference when a difference factor of the point of difference is detected to be caused by a separator in the first difference data and/or the second difference data;
and comparing and analyzing the first difference data and the second difference data.
In one embodiment, the selecting a corresponding difference feature screening manner according to the difference category of the difference point includes:
when detecting that the difference factor of the difference point is caused by brackets in the first difference data and/or the second difference data, comparing and analyzing the character data of the first difference data and the second difference data outside the brackets with the character data in the brackets respectively.
In one embodiment, the obtaining pin verification information from the analysis information includes:
judging whether the difference data exists in the analysis information;
if yes, extracting difference data in the analysis information, generating pin inspection information according to the difference data, and judging pin mapping abnormality according to the pin inspection information;
if not, generating the pin inspection information according to the analysis information, and judging that the pin mapping is normal according to the pin inspection information.
In one embodiment, the performing the comparison analysis based on the first difference data and the second difference data further includes:
clustering the first difference data and the second difference data respectively to obtain first clustering information corresponding to the first difference data and second clustering information corresponding to the second difference data, and performing comparative analysis on the first clustering information and the second clustering information to obtain analysis information.
For specific limitations of the pin inspection apparatus, reference may be made to the above limitations of the pin inspection method, and no further description is given here. The various modules in the pin verification device described above may be implemented in whole or in part by software, hardware, and combinations thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
In one embodiment, a computer device is provided, which may be a terminal, and the internal structure of which may be as shown in fig. 5. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a pin verification method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, can also be keys, a track ball or a touch pad arranged on the shell of the computer equipment, and can also be an external keyboard, a touch pad or a mouse and the like.
It will be appreciated by those skilled in the art that the structure shown in fig. 5 is merely a block diagram of some of the structures associated with the present application and is not limiting of the computer device to which the present application may be applied, and that a particular computer device may include more or fewer components than shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the steps of when executing the computer program:
acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information;
acquiring demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and performing difference feature screening according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
And performing comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information.
In one embodiment, the processor when executing the computer program further performs the steps of:
extracting first semantic information of the first difference data and second semantic information of the second difference data;
judging whether the first difference data is matched with the corresponding second difference data according to the first semantic information and the second semantic information, and obtaining a matching result;
and screening and checking the difference data according to the matching result to obtain the checking information.
In one embodiment, the processor when executing the computer program further performs the steps of:
and performing character matching according to the first difference data and the second difference data to obtain difference points of the first difference data and the second difference data, selecting a corresponding difference characteristic screening mode according to difference factors of the difference points, screening and comparing the difference data according to the difference characteristic screening mode, and obtaining the pin inspection information.
In one embodiment, the processor when executing the computer program further performs the steps of:
Ignoring the point of difference when a difference factor of the point of difference is detected to be caused by a separator in the first difference data and/or the second difference data;
and comparing and analyzing the first difference data and the second difference data.
In one embodiment, the processor when executing the computer program further performs the steps of:
when detecting that the difference factor of the difference point is caused by brackets in the first difference data and/or the second difference data, comparing and analyzing the character data of the first difference data and the second difference data outside the brackets with the character data in the brackets respectively.
In one embodiment, the processor when executing the computer program further performs the steps of:
judging whether the difference data exists in the analysis information;
if yes, extracting difference data in the analysis information, generating pin inspection information according to the difference data, and judging pin mapping abnormality according to the pin inspection information;
if not, generating the pin inspection information according to the analysis information, and judging that the pin mapping is normal according to the pin inspection information.
In one embodiment, the processor when executing the computer program further performs the steps of:
Clustering the first difference data and the second difference data respectively to obtain first clustering information corresponding to the first difference data and second clustering information corresponding to the second difference data, and performing comparative analysis on the first clustering information and the second clustering information to obtain analysis information.
In one embodiment, a computer readable storage medium is provided having a computer program stored thereon, which when executed by a processor, performs the steps of:
acquiring a configuration file, reading configuration information in the configuration file, and extracting information from the configuration information according to a requirement document to obtain pin information;
acquiring demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and performing difference feature screening according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
and performing comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information.
In one embodiment, the computer program when executed by the processor further performs the steps of:
extracting first semantic information of the first difference data and second semantic information of the second difference data;
judging whether the first difference data is matched with the corresponding second difference data according to the first semantic information and the second semantic information, and obtaining a matching result;
and screening and checking the difference data according to the matching result to obtain the checking information.
In one embodiment, the computer program when executed by the processor further performs the steps of:
and performing character matching according to the first difference data and the second difference data to obtain difference points of the first difference data and the second difference data, selecting a corresponding difference characteristic screening mode according to difference factors of the difference points, screening and comparing the difference data according to the difference characteristic screening mode, and obtaining the pin inspection information.
In one embodiment, the computer program when executed by the processor further performs the steps of:
ignoring the point of difference when a difference factor of the point of difference is detected to be caused by a separator in the first difference data and/or the second difference data;
And comparing and analyzing the first difference data and the second difference data.
In one embodiment, the computer program when executed by the processor further performs the steps of:
when detecting that the difference factor of the difference point is caused by brackets in the first difference data and/or the second difference data, comparing and analyzing the character data of the first difference data and the second difference data outside the brackets with the character data in the brackets respectively.
In one embodiment, the computer program when executed by the processor further performs the steps of:
judging whether the difference data exists in the analysis information;
if yes, extracting difference data in the analysis information, generating pin inspection information according to the difference data, and judging pin mapping abnormality according to the pin inspection information;
if not, generating the pin inspection information according to the analysis information, and judging that the pin mapping is normal according to the pin inspection information.
In one embodiment, the computer program when executed by the processor further performs the steps of:
clustering the first difference data and the second difference data respectively to obtain first clustering information corresponding to the first difference data and second clustering information corresponding to the second difference data, and performing comparative analysis on the first clustering information and the second clustering information to obtain analysis information.
Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the various embodiments provided herein may include non-volatile and/or volatile memory. The nonvolatile memory can include Read Only Memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous Link DRAM (SLDRAM), memory bus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), among others.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples merely represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the invention. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.
Claims (10)
1. A pin inspection method, comprising:
acquiring a corresponding configuration file according to logic circuit design engineering, reading configuration information from the configuration file, dividing the configuration information, and extracting the divided configuration information according to a requirement document to obtain pin information in the configuration information;
acquiring demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and performing difference feature screening according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
Performing comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information;
the comparing and analyzing are performed according to the first difference data and the second difference data to obtain analysis information, and the pin inspection information is obtained according to the analysis information, including:
and comparing and analyzing the first difference data and the second difference data to obtain analysis information containing difference factors, judging the difference degree of the first difference data and the second difference data according to the difference factors, and obtaining pin inspection information for reflecting pin inspection results according to the difference degree.
2. The method of claim 1, wherein said performing a comparison analysis based on said first difference data and said second difference data comprises:
extracting first semantic information of the first difference data and second semantic information of the second difference data;
judging whether the first difference data is matched with the corresponding second difference data according to the first semantic information and the second semantic information, and obtaining a matching result;
and screening and checking the difference data according to the matching result to obtain the pin checking information.
3. The method of claim 1 or 2, wherein the performing a comparison analysis based on the first and second difference data further comprises:
and performing character matching according to the first difference data and the second difference data to obtain difference points of the first difference data and the second difference data, selecting a corresponding difference characteristic screening mode according to difference factors of the difference points, screening and comparing the difference data according to the difference characteristic screening mode, and obtaining the pin inspection information.
4. A method according to claim 3, wherein selecting a corresponding difference feature screening method according to the difference class of the difference point comprises:
ignoring the point of difference when a difference factor of the point of difference is detected to be caused by a separator in the first difference data and/or the second difference data;
and comparing and analyzing the first difference data and the second difference data.
5. A method according to claim 3, wherein selecting a corresponding difference feature screening method according to the difference class of the difference point comprises:
When detecting that the difference factor of the difference point is caused by brackets in the first difference data and/or the second difference data, comparing and analyzing the character data of the first difference data and the second difference data outside the brackets with the character data in the brackets respectively.
6. The method of claim 1, wherein obtaining pin inspection information from the analysis information further comprises:
judging whether the difference data exists in the analysis information;
if yes, extracting difference data in the analysis information, generating pin inspection information according to the difference data, and judging pin mapping abnormality according to the pin inspection information;
if not, generating the pin inspection information according to the analysis information, and judging that the pin mapping is normal according to the pin inspection information.
7. The method of claim 1, wherein the performing a comparison analysis based on the first difference data and the second difference data further comprises:
clustering the first difference data and the second difference data respectively to obtain first clustering information corresponding to the first difference data and second clustering information corresponding to the second difference data, and performing comparative analysis on the first clustering information and the second clustering information to obtain analysis information.
8. A pin verification device, the device comprising:
the acquisition module is used for acquiring a corresponding configuration file according to the logic circuit design engineering, reading configuration information from the configuration file, dividing the configuration information, and extracting the divided configuration information according to a requirement document to obtain pin information in the configuration information;
the screening module is used for acquiring the demand information according to the demand document, storing the pin information into a first data set, storing the demand information into a second data set, and screening difference characteristics according to the first data set and the second data set to obtain difference data, wherein the difference data comprises first difference data corresponding to the first data set and second difference data corresponding to the second data set;
the analysis module is used for carrying out comparative analysis according to the first difference data and the second difference data to obtain analysis information, and obtaining pin inspection information according to the analysis information;
the comparing and analyzing are performed according to the first difference data and the second difference data to obtain analysis information, and the pin inspection information is obtained according to the analysis information, including:
And comparing and analyzing the first difference data and the second difference data to obtain analysis information containing difference factors, judging the difference degree of the first difference data and the second difference data according to the difference factors, and obtaining pin inspection information for reflecting pin inspection results according to the difference degree.
9. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the steps of the checking method according to any one of claims 1 to 7 when the computer program is executed by the processor.
10. A computer-readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the verification method according to any one of claims 1 to 7.
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