CN114994112A - Monochromatic focusing polarization X-ray optical system, use method and fluorescence spectrometer - Google Patents

Monochromatic focusing polarization X-ray optical system, use method and fluorescence spectrometer Download PDF

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Publication number
CN114994112A
CN114994112A CN202210712566.1A CN202210712566A CN114994112A CN 114994112 A CN114994112 A CN 114994112A CN 202210712566 A CN202210712566 A CN 202210712566A CN 114994112 A CN114994112 A CN 114994112A
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ray
rays
polarized
optical system
monochromatic
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沈亚婷
罗立强
韩凌云
柳检
孙梦荷
郭荣
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National Geological Experimental Testing Center china Geological Survey
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National Geological Experimental Testing Center china Geological Survey
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    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

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Abstract

The invention provides a monochromatic focusing polarization X-ray optical system, a using method and a fluorescence spectrometer, comprising an X-ray light pipe for emitting X-rays; the curved crystal is used for diffracting, focusing and polarizing the X-rays emitted by the X-ray light pipe, and re-emitting the X-rays onto a sample to excite X-ray fluorescence; the X-ray tube, the curved crystal and the sample form an optical plane and are arranged on the circumference of a Rowland circle. The X-ray tube, the curved crystal and the sample form an optical plane and are arranged on the circumference of a Rowland circle, so that the polarization-monochromatic-focusing function is realized by adopting the curved crystal in the XRF light path design; the detector detects polarized X-rays from a direction perpendicular to the optical plane, which blocks the propagation of the polarized X-rays along the detector direction, thereby reducing background interference; therefore, an independent monochromatic-focusing-polarization X-ray optical system and a fluorescence spectrometer thereof are designed and formed, wherein the independent monochromatic-focusing-polarization X-ray optical system has unique X-ray properties and can obviously improve the signal-to-noise ratio and the detection sensitivity.

Description

Monochromatic focusing polarization X-ray optical system, use method and fluorescence spectrometer
Technical Field
The invention relates to the technical field of optical equipment, in particular to a monochromatic focusing polarization X-ray optical system, a using method and a fluorescence spectrometer.
Background
X-ray fluorescence spectroscopy is widely applied in various fields, and is used for irradiating a sample by X-rays, detecting a fluorescence signal excited by the sample by a detector and completing X-ray fluorescence analysis and test of the sample. However, after the X-ray tube is powered on, the X-ray tube emits X-rays in a point source manner, and at this time, the X-rays emitted from the X-ray tube are an X-ray continuum, which generates large background interference and is not favorable for X-ray fluorescence analysis and test.
Disclosure of Invention
The invention aims to provide a monochromatic focusing polarization X-ray optical system, a using method and a fluorescence spectrometer, which can achieve the purposes of reducing the continuous spectrum background of an X-ray excitation source, improving the peak-to-back ratio of analysis elements, improving the analysis and detection sensitivity of X-ray fluorescence spectrum analysis and effectively reducing the element detection limit.
According to an object of the present invention, there is provided a monochromatic focused polarized X-ray optical system comprising:
an X-ray light pipe for emitting X-rays;
a curved crystal for diffracting, focusing and polarizing the X-ray emitted from the X-ray light pipe,
emitting the X-ray to the sample again to excite the X-ray fluorescence;
the X-ray light pipe, the curved crystal and the sample form an optical plane and are arranged on the circumference of a Rowland circle;
and the detector is arranged at an angle of 90 degrees with the sample and is used for receiving and collecting the X-ray fluorescence signals emitted by the sample.
Further, the diffraction of X-rays follows bragg's law.
Further, by the flexural crystal diffraction, the X-ray of the required wavelength is screened out from the X-rays of the continuous wavelengths.
Furthermore, the surface of the curved crystal is a concave mirror, and the spherical crystal focuses light in two dimensions according to the concave mirror imaging principle on the sagittal plane vertical to the Rowland circle plane.
Further, after scattering the X-rays at 90 ° from the bent crystal, highly polarized X-rays are generated.
Further, the curved crystal is spherical curved crystal, cylindrical curved crystal or toroidal curved crystal.
According to another aspect of the present invention, there is provided a method of using a monochromatic focused polarized X-ray optical system, comprising the steps of:
s1, after the X-ray light pipe is connected with the power supply, emitting X-rays in a point source mode;
s2, performing curved crystal diffraction on the X-ray, and reemitting;
s3, through S1 and S2, the X-rays impinging on the sample are monochromatic, focused and polarized, the X-ray fluorescence generated by the elements in the sample is anisotropic, and the incident plane-polarized light cannot propagate along its plane, so the background from the X-ray light pipe is reduced when the detector is at 90 ° to the sample and intersects the polarizer and X-ray tube planes.
Further, in S1, the X-ray emitted by the X-ray light pipe is continuous spectrum, divergent and unpolarized X-ray.
Further, in S2, the X-ray changes from white light to monochromatic light, the X-ray changes from divergent light to focused light, and the X-ray changes from unpolarized light to polarized light.
According to a third object of the present invention, there is provided a fluorescence spectrometer comprising the above-mentioned X-ray optical system.
According to the technical scheme, an X-ray light tube, curved crystals and a sample form an optical plane and are arranged on the circumference of a Rowland circle, so that the function of polarization-single color-focusing by adopting the curved crystals in XRF light path design is realized; the detector detects polarized X-rays from a direction perpendicular to the optical plane, which blocks the propagation along the detector direction, thereby reducing background interference; therefore, an independent monochromatic-focusing-polarization X-ray optical system and a fluorescence spectrometer thereof are designed and formed, wherein the independent monochromatic-focusing-polarization X-ray optical system has unique X-ray properties and can obviously improve the signal-to-noise ratio and the detection sensitivity.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a schematic structural diagram of an embodiment of the present invention;
in the figure, 1, an X-ray light pipe; 2. bending the crystal; 3. a sample; 4. and a detector.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the following embodiments, and it should be understood that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features defined as "first", "second", may explicitly or implicitly include one or more of the described features. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise. Furthermore, the terms "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in a specific case to those of ordinary skill in the art.
Example 1
As shown in the figure 1 of the drawings,
a monochromatic focused polarization X-ray optical system comprises an X-ray light pipe 1 for emitting X-rays; the curved crystal 2 is used for diffracting, focusing and polarizing the X rays emitted by the X-ray light pipe, and the X-ray light pipe 1, the curved crystal 2 and the sample 3 form an optical plane and are arranged on the circumference of a Roland circle; the bent crystal 2 can re-emit X-rays to the sample 3 to excite X-ray fluorescence;
the detector 4 is arranged at 90 ° to the sample 3 for receiving the X-ray fluorescence signal emitted by the collected sample 3.
The diffraction of the X-rays follows Bragg's law, and X-rays of a desired wavelength are screened out from X-rays of continuous wavelengths by diffraction of the curved crystal 2. The surface of the curved crystal 2 is a concave mirror, and the spherical crystal performs two-dimensional focusing on light rays according to the concave mirror imaging principle on an arc sagittal plane vertical to a Rowland circle plane. The X-rays are scattered at 90 ° to the curved crystal 2, producing highly polarized X-rays.
The curved crystal 2 in this embodiment may be one of a spherical curved crystal, a cylindrical curved crystal, or a toroidal curved crystal.
Example 2
The use method of the monochromatic focused polarized X-ray optical system comprises the following steps:
step 1, after the X-ray light pipe 1 is connected with a power supply, X-rays are emitted in a point source mode. The X-ray emitted from the X-ray tube at this time has the following properties: (ii) X-ray continuum. X-rays are typically generated by high energy particles bombarding an anode target. The interaction of the energetic particles with the anode target produces an X-ray signature and continuum. For example, visible light is composed of light with different wavelengths, and can be summarized as "red, orange, yellow, green, blue and indigo violet" simply and roughly in terms of the color that can be seen by human eyes through refraction of a prism. ② diverging the light. Since the X-ray tube is a point light source in general, the light emitted from such a light source is spread outward. ③ unpolarized X-rays.
And 2, diffracting the X-ray by the crystal and reemitting. In this step, the X-ray is changed as follows: the white light is changed into monochromatic light. In order to obtain monochromatic X-rays, an X-ray diffraction process is required. The X-ray diffraction process follows bragg's law, and when a beam of X-rays is irradiated onto a crystal plane of a crystal, the X-rays undergo constructive interference if the optical path difference 2d sin θ is an integral multiple of the wavelength, and destructive interference if not an integral multiple. Therefore, the X-ray with the required wavelength can be screened out from the X-rays with continuous wavelengths through crystal diffraction. The divergent light becomes the focused light. Because the concave mirror has the function of converging light, the spherical crystal can focus the light in two dimensions according to the imaging principle of the concave mirror on the sagittal plane vertical to the Rowland circle plane. The original diverging light can be converged through the curved surface of the curved crystal, thereby forming a focused light source and enhancing the energy of the light source. And the unpolarized light becomes polarized light. The scattering interaction with matter can produce polarized X-rays, and when the scattering angle is 90 °, nearly fully polarized X-rays can be produced. The unpolarized X-rays emitted by the X-ray tube are scattered at 90 ° to the curved crystal to produce highly polarized X-rays.
And 3, through the steps 1 and 2, the X-ray irradiated on the sample is monochromatic, focused and polarized. The single color ensures that the XRF energy of an excited sample has selectivity and specificity; focusing ensures the intensity value of the X-ray; ③ when highly polarized X-rays illuminate the sample, the X-ray fluorescence produced by the elements in the sample is anisotropic and the incident plane-polarized light cannot propagate along its plane, so when the detector is at 90 ° to the sample and intersects the polarizer and the X-ray tube plane, the background from the X-ray tube is reduced.
The present embodiment accomplishes the change of optical characteristics through the X-ray light pipe 1, the curved crystal 2, the sample 3 and the detector 4: emitting from the X-ray light pipe; irradiating the bent crystal 2, and emitting again after diffraction; irradiating the sample to excite X-ray fluorescence; the light irradiates on the detector, and the signal is collected by the detector. The X-ray is transmitted along the light path, the performance of the X-ray is changed, the color-focusing-polarization of the X-ray is completed, further, a target X-ray fluorescence signal of the sample is excited, and finally, the fluorescence signal is collected by a detector, the X-ray fluorescence analysis and test of the sample are completed, and the purpose of reducing the detection background is achieved.
Example 3
A fluorescence spectrometer comprising the X-ray optical system described in example 1.
In the embodiment, an X-ray tube, a curved crystal and a sample form an optical plane and are arranged on the circumference of a Roland circle, so that the function of polarization-monochrome-focusing by adopting the curved crystal in XRF optical path design is realized; the detector detects polarized X-rays from a direction perpendicular to the optical plane, which blocks the propagation of the polarized X-rays along the detector direction, thereby reducing background interference; therefore, the independent monochromatic-focusing-polarized X-ray fluorescence spectrometer with unique X-ray properties and capable of remarkably improving the signal-to-noise ratio and the detection sensitivity is designed and formed.
According to the invention, between an X-ray excitation source and an X-ray fluorescence detector, crystals with a polarization function are used as basic materials, spherical curved crystals, cylindrical curved crystals and toroidal curved crystals are designed and manufactured, so that the purposes of monochromatic, polarization and focusing of the X-ray excitation source are realized, the polarization orthogonal geometry design is applied, the X-ray excitation intensity is enhanced through focusing, the continuous spectrum background of the X-ray excitation source is reduced through the polarization geometry, the peak-to-back ratio is increased through monochromatic light excitation, the continuous spectrum background of the X-ray excitation source is reduced, the peak-to-back ratio of analytical elements is improved, the XRF detection sensitivity is improved, and the element detection limit is effectively reduced.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and these modifications or substitutions do not depart from the spirit of the corresponding technical solutions of the embodiments of the present invention.

Claims (10)

1. A monochromatic focused polarized X-ray optical system, comprising:
an X-ray light pipe for emitting X-rays;
a curved crystal for diffracting, focusing and polarizing the X-ray emitted from the X-ray light pipe,
emitting the X-ray to the sample again to excite the X-ray fluorescence;
the X-ray light pipe, the curved crystal and the sample form an optical plane and are arranged on the circumference of a Rowland circle;
and the detector is arranged at an angle of 90 degrees with the sample and is used for receiving and collecting the X-ray fluorescence signals emitted by the sample.
2. The monochromatic focused-polarized X-ray optical system according to claim 1, characterized in that the diffraction of the X-rays follows bragg's law.
3. The monochromatic focused polarized X-ray optical system according to claim 1, characterized in that the desired wavelength of X-rays is screened out from the successive wavelengths of X-rays by the flexural crystal diffraction.
4. The monochromatic focused polarized X-ray optical system of claim 1, characterized in that the curved crystal surface is a concave mirror, and the spherical crystal focuses light in two dimensions according to the concave mirror imaging principle in the sagittal plane perpendicular to the rowland circle plane.
5. The monochromatic focused polarized X-ray optical system of claim 1, wherein X-rays are scattered at 90 ° to the curved crystal to produce highly polarized X-rays.
6. The monochromatic focused polarized X-ray optical system of claim 1, wherein the curved crystal is a spherical curved crystal, a cylindrical curved crystal, or a toroidal curved crystal.
7. A method of using a monochromatic focused polarized X-ray optical system, comprising the steps of:
s1, after the X-ray light pipe is connected with the power supply, emitting X-rays in a point source mode;
s2, performing curved crystal diffraction on the X-ray, and reemitting;
s3, through S1 and S2, the X-rays impinging on the sample are monochromatic, focused and polarized, the X-ray fluorescence generated by the elements in the sample is anisotropic, and the incident plane-polarized light cannot propagate along its plane, so the background from the X-ray light pipe is reduced when the detector is at 90 ° to the sample and intersects the polarizer and X-ray tube planes.
8. The method of using a monochromatic focused polarized X-ray optical system as recited in claim 7, wherein in S1, the X-rays emitted by the X-ray light pipe are continuous spectrum, divergent and unpolarized X-rays.
9. The method of using a monochromatic focused polarized X-ray optical system as recited in claim 7, wherein in S2, the X-ray changes from white light to monochromatic light, the X-ray changes from divergent light to focused light, and the X-ray changes from unpolarized light to polarized light.
10. A fluorescence spectrometer comprising the X-ray optical system of claims 1-6.
CN202210712566.1A 2022-06-22 2022-06-22 Monochromatic focusing polarization X-ray optical system, use method and fluorescence spectrometer Pending CN114994112A (en)

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CN202210712566.1A CN114994112A (en) 2022-06-22 2022-06-22 Monochromatic focusing polarization X-ray optical system, use method and fluorescence spectrometer

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CN114994112A true CN114994112A (en) 2022-09-02

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