CN114902420B - 固态成像元件和成像系统 - Google Patents
固态成像元件和成像系统Info
- Publication number
- CN114902420B CN114902420B CN202180007895.XA CN202180007895A CN114902420B CN 114902420 B CN114902420 B CN 114902420B CN 202180007895 A CN202180007895 A CN 202180007895A CN 114902420 B CN114902420 B CN 114902420B
- Authority
- CN
- China
- Prior art keywords
- substrate
- light
- wiring
- solid
- state imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8057—Optical shielding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8063—Microlenses
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/809—Constructional details of image sensors of hybrid image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/811—Interconnections
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/47—Image sensors with pixel address output; Event-driven image sensors; Selection of pixels to be read out based on image data
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/79—Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/807—Pixel isolation structures
Landscapes
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020021833 | 2020-02-12 | ||
| JP2020-021833 | 2020-02-12 | ||
| PCT/JP2021/003777 WO2021161855A1 (ja) | 2020-02-12 | 2021-02-02 | 固体撮像素子および撮像システム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114902420A CN114902420A (zh) | 2022-08-12 |
| CN114902420B true CN114902420B (zh) | 2025-08-19 |
Family
ID=77291836
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202180007895.XA Active CN114902420B (zh) | 2020-02-12 | 2021-02-02 | 固态成像元件和成像系统 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20230058625A1 (https=) |
| EP (1) | EP4105968A4 (https=) |
| JP (1) | JPWO2021161855A1 (https=) |
| KR (1) | KR20220139302A (https=) |
| CN (1) | CN114902420B (https=) |
| WO (1) | WO2021161855A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022163433A (ja) * | 2021-04-14 | 2022-10-26 | 株式会社ニコン | 撮像素子及び撮像装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018163838A1 (en) * | 2017-03-08 | 2018-09-13 | Sony Semiconductor Solutions Corporation | Solid-state imaging apparatus and electronic apparatus |
| CN109729292A (zh) * | 2017-10-30 | 2019-05-07 | 索尼半导体解决方案公司 | 固体摄像元件 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001085661A (ja) * | 1999-09-13 | 2001-03-30 | Nikon Corp | 固体撮像装置 |
| JP4117540B2 (ja) * | 2002-10-17 | 2008-07-16 | ソニー株式会社 | 固体撮像素子の制御方法 |
| JP5645513B2 (ja) * | 2010-07-07 | 2014-12-24 | キヤノン株式会社 | 固体撮像装置及び撮像システム |
| JP2012064709A (ja) * | 2010-09-15 | 2012-03-29 | Sony Corp | 固体撮像装置及び電子機器 |
| US9634158B2 (en) * | 2012-02-03 | 2017-04-25 | Sony Corporation | Semiconductor device and electronic equipment |
| JP2013187360A (ja) * | 2012-03-08 | 2013-09-19 | Sony Corp | 固体撮像装置、及び、電子機器 |
| JP6521586B2 (ja) * | 2014-07-31 | 2019-05-29 | キヤノン株式会社 | 固体撮像素子および撮像システム |
| JP2018101699A (ja) * | 2016-12-20 | 2018-06-28 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置、固体撮像装置の製造方法および電子機器 |
| EP3576404B1 (en) | 2017-10-30 | 2021-11-03 | Sony Semiconductor Solutions Corporation | Solid-state image pickup element |
-
2021
- 2021-02-02 EP EP21753762.0A patent/EP4105968A4/en active Pending
- 2021-02-02 KR KR1020227025468A patent/KR20220139302A/ko not_active Abandoned
- 2021-02-02 WO PCT/JP2021/003777 patent/WO2021161855A1/ja not_active Ceased
- 2021-02-02 CN CN202180007895.XA patent/CN114902420B/zh active Active
- 2021-02-02 US US17/796,896 patent/US20230058625A1/en active Pending
- 2021-02-02 JP JP2022500340A patent/JPWO2021161855A1/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018163838A1 (en) * | 2017-03-08 | 2018-09-13 | Sony Semiconductor Solutions Corporation | Solid-state imaging apparatus and electronic apparatus |
| CN109729292A (zh) * | 2017-10-30 | 2019-05-07 | 索尼半导体解决方案公司 | 固体摄像元件 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2021161855A1 (https=) | 2021-08-19 |
| WO2021161855A1 (ja) | 2021-08-19 |
| CN114902420A (zh) | 2022-08-12 |
| EP4105968A4 (en) | 2023-08-02 |
| KR20220139302A (ko) | 2022-10-14 |
| US20230058625A1 (en) | 2023-02-23 |
| EP4105968A1 (en) | 2022-12-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9560294B2 (en) | Systems and methods for pixel-level dark current compensation in image sensors | |
| US8208054B2 (en) | Solid-state imaging device | |
| CN112740661B (zh) | 固体成像器件、固体成像器件的控制方法以及电子设备 | |
| TW201911547A (zh) | 光學感測器的像素以及光學感測器的操作方法 | |
| US9601538B2 (en) | Image sensors with photoelectric films | |
| US10785431B2 (en) | Image sensors having dark pixels and imaging pixels with different sensitivities | |
| US12446344B2 (en) | Solid-state image sensor | |
| CN115023947B (zh) | 固态成像装置和成像装置 | |
| US20240072093A1 (en) | Solid-state imaging element and imaging device | |
| CN114902420B (zh) | 固态成像元件和成像系统 | |
| JP2025061777A (ja) | 固体撮像素子および撮像装置 | |
| CN115004689B (zh) | 固态成像元件和成像装置 | |
| US12432465B2 (en) | Imaging device, sensor, and imaging control device | |
| US20180076251A1 (en) | Solid-state image capturing device and electronic apparatus | |
| US20210152770A1 (en) | Systems and methods for generating time trace information | |
| JP2006179813A (ja) | 固体撮像素子の検査方法および検査装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |