CN114902420B - 固态成像元件和成像系统 - Google Patents

固态成像元件和成像系统

Info

Publication number
CN114902420B
CN114902420B CN202180007895.XA CN202180007895A CN114902420B CN 114902420 B CN114902420 B CN 114902420B CN 202180007895 A CN202180007895 A CN 202180007895A CN 114902420 B CN114902420 B CN 114902420B
Authority
CN
China
Prior art keywords
substrate
light
wiring
solid
state imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202180007895.XA
Other languages
English (en)
Chinese (zh)
Other versions
CN114902420A (zh
Inventor
中村诚
北野伸
村川祐亮
土本航也
花田拓也
野田裕贵
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Semiconductor Solutions Corp
Original Assignee
Sony Semiconductor Solutions Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Semiconductor Solutions Corp filed Critical Sony Semiconductor Solutions Corp
Publication of CN114902420A publication Critical patent/CN114902420A/zh
Application granted granted Critical
Publication of CN114902420B publication Critical patent/CN114902420B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/18Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/805Coatings
    • H10F39/8057Optical shielding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/806Optical elements or arrangements associated with the image sensors
    • H10F39/8063Microlenses
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/809Constructional details of image sensors of hybrid image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/811Interconnections
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/47Image sensors with pixel address output; Event-driven image sensors; Selection of pixels to be read out based on image data
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/79Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/807Pixel isolation structures

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN202180007895.XA 2020-02-12 2021-02-02 固态成像元件和成像系统 Active CN114902420B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020021833 2020-02-12
JP2020-021833 2020-02-12
PCT/JP2021/003777 WO2021161855A1 (ja) 2020-02-12 2021-02-02 固体撮像素子および撮像システム

Publications (2)

Publication Number Publication Date
CN114902420A CN114902420A (zh) 2022-08-12
CN114902420B true CN114902420B (zh) 2025-08-19

Family

ID=77291836

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180007895.XA Active CN114902420B (zh) 2020-02-12 2021-02-02 固态成像元件和成像系统

Country Status (6)

Country Link
US (1) US20230058625A1 (https=)
EP (1) EP4105968A4 (https=)
JP (1) JPWO2021161855A1 (https=)
KR (1) KR20220139302A (https=)
CN (1) CN114902420B (https=)
WO (1) WO2021161855A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022163433A (ja) * 2021-04-14 2022-10-26 株式会社ニコン 撮像素子及び撮像装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018163838A1 (en) * 2017-03-08 2018-09-13 Sony Semiconductor Solutions Corporation Solid-state imaging apparatus and electronic apparatus
CN109729292A (zh) * 2017-10-30 2019-05-07 索尼半导体解决方案公司 固体摄像元件

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001085661A (ja) * 1999-09-13 2001-03-30 Nikon Corp 固体撮像装置
JP4117540B2 (ja) * 2002-10-17 2008-07-16 ソニー株式会社 固体撮像素子の制御方法
JP5645513B2 (ja) * 2010-07-07 2014-12-24 キヤノン株式会社 固体撮像装置及び撮像システム
JP2012064709A (ja) * 2010-09-15 2012-03-29 Sony Corp 固体撮像装置及び電子機器
US9634158B2 (en) * 2012-02-03 2017-04-25 Sony Corporation Semiconductor device and electronic equipment
JP2013187360A (ja) * 2012-03-08 2013-09-19 Sony Corp 固体撮像装置、及び、電子機器
JP6521586B2 (ja) * 2014-07-31 2019-05-29 キヤノン株式会社 固体撮像素子および撮像システム
JP2018101699A (ja) * 2016-12-20 2018-06-28 ソニーセミコンダクタソリューションズ株式会社 固体撮像装置、固体撮像装置の製造方法および電子機器
EP3576404B1 (en) 2017-10-30 2021-11-03 Sony Semiconductor Solutions Corporation Solid-state image pickup element

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018163838A1 (en) * 2017-03-08 2018-09-13 Sony Semiconductor Solutions Corporation Solid-state imaging apparatus and electronic apparatus
CN109729292A (zh) * 2017-10-30 2019-05-07 索尼半导体解决方案公司 固体摄像元件

Also Published As

Publication number Publication date
JPWO2021161855A1 (https=) 2021-08-19
WO2021161855A1 (ja) 2021-08-19
CN114902420A (zh) 2022-08-12
EP4105968A4 (en) 2023-08-02
KR20220139302A (ko) 2022-10-14
US20230058625A1 (en) 2023-02-23
EP4105968A1 (en) 2022-12-21

Similar Documents

Publication Publication Date Title
US9560294B2 (en) Systems and methods for pixel-level dark current compensation in image sensors
US8208054B2 (en) Solid-state imaging device
CN112740661B (zh) 固体成像器件、固体成像器件的控制方法以及电子设备
TW201911547A (zh) 光學感測器的像素以及光學感測器的操作方法
US9601538B2 (en) Image sensors with photoelectric films
US10785431B2 (en) Image sensors having dark pixels and imaging pixels with different sensitivities
US12446344B2 (en) Solid-state image sensor
CN115023947B (zh) 固态成像装置和成像装置
US20240072093A1 (en) Solid-state imaging element and imaging device
CN114902420B (zh) 固态成像元件和成像系统
JP2025061777A (ja) 固体撮像素子および撮像装置
CN115004689B (zh) 固态成像元件和成像装置
US12432465B2 (en) Imaging device, sensor, and imaging control device
US20180076251A1 (en) Solid-state image capturing device and electronic apparatus
US20210152770A1 (en) Systems and methods for generating time trace information
JP2006179813A (ja) 固体撮像素子の検査方法および検査装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant