CN114894146A - High-precision communication connector signal terminal pin surface flatness detection system - Google Patents
High-precision communication connector signal terminal pin surface flatness detection system Download PDFInfo
- Publication number
- CN114894146A CN114894146A CN202111621105.5A CN202111621105A CN114894146A CN 114894146 A CN114894146 A CN 114894146A CN 202111621105 A CN202111621105 A CN 202111621105A CN 114894146 A CN114894146 A CN 114894146A
- Authority
- CN
- China
- Prior art keywords
- detector
- pin
- signal terminal
- driving mechanism
- clamp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 18
- 238000005070 sampling Methods 0.000 claims abstract description 20
- CLOMYZFHNHFSIQ-UHFFFAOYSA-N clonixin Chemical compound CC1=C(Cl)C=CC=C1NC1=NC=CC=C1C(O)=O CLOMYZFHNHFSIQ-UHFFFAOYSA-N 0.000 claims description 2
- 239000012535 impurity Substances 0.000 abstract description 4
- 230000002159 abnormal effect Effects 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000011895 specific detection Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
Abstract
The invention discloses a high-precision communication connector signal terminal pin surface flatness detection system, which comprises a clamp and a detector, wherein the clamp is driven by a driving mechanism to move horizontally, and the detector is driven by the driving mechanism to move along the directions of an x axis and a y axis; after the clamp moves to the corresponding position, the driving mechanism drives the detector to move to a measuring position, the detector detects the upper pins of the signal terminal step by step, n sampling points are arranged on the surface of each pin to be detected, and the detector collects a distance parameter D between each sampling point and the detector; and selecting an effective value of the parameter D, and calculating an average value and a standard deviation. The invention can not only judge whether the surface of the pin has the deviation, but also can indicate whether the pin has the conditions of distortion, deformation and the like. In addition, before the judgment, abnormal data caused by the situations that impurities appear on the surface of the pin and the sampling point is not on the surface of the pin are eliminated, and the misjudgment caused by the situations is avoided.
Description
Technical Field
The invention relates to the technical field of electronic device detection, in particular to a high-precision detection system for the surface flatness of a signal terminal pin of a communication connector.
Background
The material that signal terminal formed has a plurality of pins, in the assembly process, often can cause the damage of terminal, warp and twist to cause at the product not up to standard. In the prior art, whether the pins are deformed or damaged is mostly checked in a manual detection mode, so that the efficiency is low and mistakes are easily made.
Disclosure of Invention
The technical problem to be solved by the invention is to solve the defects of the prior art and provide a high-precision detection system for the surface flatness of a signal terminal pin of a communication connector.
In order to solve the technical problems, the invention adopts the technical scheme that: a high-precision communication connector signal terminal pin surface flatness detection system comprises a clamp and a detector, wherein the clamp is driven by a driving mechanism to move horizontally, and the detector is driven by the driving mechanism to move along the directions of an x axis and a y axis; the detection method comprises the following steps:
after the clamp moves to the corresponding position, the driving mechanism drives the detector to move to the measuring position, the detector detects the upper pins of the signal terminal step by step, n sampling points are arranged on the surface of each pin to be detected, and the detector collects a distance parameter D between each sampling point and the detector;
selecting an effective value of the parameter D to form a sequence X, and calculating an average value E (X) and a standard deviation sigma of the X;
comparing the average value e (x) with the reference values R, R + Δ R, and the relationship between σ and the reference value R;
when R < E (X) < R + Deltar, and sigma < R, the signal terminal pin surface is judged to be qualified.
And further, calculating the absolute difference between each sampling point and the rest sampling points, calculating the sum s of the absolute differences, and determining the numerical value of each sampling point as an effective value when s is smaller than a reference value m.
Further, the detector adopts 50 groups of data on the detection surface of each pin.
It can be seen from the above technical scheme that this practicality has following advantage: the invention can not only judge whether the surface of the pin has the deviation, but also can indicate whether the pin has the conditions of distortion, deformation and the like. In addition, before the judgment, abnormal data caused by the situations that impurities appear on the surface of the pin and the sampling point is not on the surface of the pin are eliminated, and the misjudgment caused by the situations is avoided.
Drawings
FIG. 1 is a schematic view of the present invention.
Detailed Description
The following description will specifically describe an embodiment of the present invention with reference to fig. 1.
The surface flatness detection system for the signal terminal pin of the high-precision communication connector comprises a clamp 5 and a detector 4, wherein the clamp is driven by a cylinder assembly to move horizontally, and the clamp is used for clamping a signal terminal assembly to be detected. The detector is a nanoscale detector and is driven by a lead screw or a servo motor to move along the directions of an x axis and a y axis. A light barrier 1 is also arranged above the detector. The specific detection method is as follows:
after the clamp moves to the corresponding position, the driving mechanism drives the detector to move to the measuring position, the detector gradually detects the upper pin of the signal terminal, the distance between the detection and the corresponding sampling point is recorded, and 50 points are collected on the detection surface of each pin.
After data acquisition, some invalid values, such as points outside the surface of the pin, need to be removed. Or data fluctuations due to impurities on the surface.
The specific method comprises the following steps: and calculating the absolute difference between each sampling point and the rest sampling points, calculating the sum s of the absolute differences, and determining the numerical value of each sampling point as an effective value when s is smaller than a reference value m. m is determined by the precision requirement and the number of sampling points, and when the precision is in a nanometer level, m in the embodiment can be selected to be 1000 nanometers. When impurities exist on the surface of the pin or the sampling point is positioned on the surface of the pin, the measured value of the point is larger or smaller, so that the s value jumps, and therefore the s value needs to be removed.
After the limitation is eliminated, selecting effective values of the parameters to form a number sequence X, and calculating the average value E (X) and the standard deviation sigma of the X; comparing the average value e (x) with the reference value R, and the relationship between σ and the reference value R; when R < e (x) < R + Δ R, and σ < R. The r value and r + delta r are set parameter values and can be determined according to the detection data of good products. The R value is determined according to the precision requirement, and the higher the precision is, the smaller the R value is.
When the average value E (X) is in a reasonable interval, the detection points on the surface of the pin do not have large deviation, and the whole body is relatively flat. When the standard deviation sigma is smaller than the reference value, the difference between the point positions is smaller, and the distortion degree is small.
The invention adopts a high-precision detector, the detection precision is 0.0009um, and n high-precision terminal pins can be detected in the rapid movement.
Claims (3)
1. A high-precision communication connector signal terminal pin surface flatness detection system comprises a clamp and a detector, wherein the clamp is driven by a driving mechanism to move horizontally, and the detector is driven by the driving mechanism to move along the directions of an x axis and a y axis; the detection method comprises the following steps:
after the clamp moves to the corresponding position, the driving mechanism drives the detector to move to the measuring position, the detector detects the upper pins of the signal terminal step by step, n sampling points are arranged on the surface of each pin to be detected, and the detector collects a distance parameter D between each sampling point and the detector;
selecting an effective value of the parameter D to form a sequence X, and calculating an average value E (X) and a standard deviation sigma of the X;
comparing the average value e (x) with the reference values R, R + Δ R, and the relationship between σ and the reference value R;
when R < E (X) < R + Deltar, and sigma < R, the signal terminal pin surface is judged to be qualified.
2. The system of claim 1, wherein the surface flatness detecting system comprises: and calculating the absolute difference between each sampling point and the rest sampling points, calculating the sum s of the absolute differences, and determining the numerical value of each sampling point as an effective value when s is smaller than a reference value m.
3. The system of claim 1, wherein the surface flatness detecting system comprises: the tester uses 50 sets of data on the test face of each pin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111621105.5A CN114894146A (en) | 2021-12-28 | 2021-12-28 | High-precision communication connector signal terminal pin surface flatness detection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111621105.5A CN114894146A (en) | 2021-12-28 | 2021-12-28 | High-precision communication connector signal terminal pin surface flatness detection system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114894146A true CN114894146A (en) | 2022-08-12 |
Family
ID=82714408
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111621105.5A Pending CN114894146A (en) | 2021-12-28 | 2021-12-28 | High-precision communication connector signal terminal pin surface flatness detection system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114894146A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102798365A (en) * | 2012-08-17 | 2012-11-28 | 杭州鸿远测控技术有限公司 | Brake disc form and location tolerance measuring method and measuring instrument for realizing same |
| CN106940178A (en) * | 2017-03-22 | 2017-07-11 | 上海日进机床有限公司 | Silicon crystal workpiece flatness detecting device and silicon crystal workpiece measurement method of planeness |
| CN107289898A (en) * | 2016-04-12 | 2017-10-24 | 中国运载火箭技术研究院 | A kind of flat package electronic component lead coplanarity detecting system |
| CN109163885A (en) * | 2018-11-14 | 2019-01-08 | 吴美珍 | Optical fibre device and its detection method and detection device |
| CN109186951A (en) * | 2018-11-14 | 2019-01-11 | 吴美珍 | Mould group and optical fibre device test equipment are combed before a kind of detection |
| CN110715638A (en) * | 2019-11-27 | 2020-01-21 | 湖南大合新材料有限公司 | Method for detecting flatness of crystal |
| CN212320640U (en) * | 2020-04-02 | 2021-01-08 | 深圳市华显光学仪器有限公司 | Pin coplanarity detector |
-
2021
- 2021-12-28 CN CN202111621105.5A patent/CN114894146A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102798365A (en) * | 2012-08-17 | 2012-11-28 | 杭州鸿远测控技术有限公司 | Brake disc form and location tolerance measuring method and measuring instrument for realizing same |
| CN107289898A (en) * | 2016-04-12 | 2017-10-24 | 中国运载火箭技术研究院 | A kind of flat package electronic component lead coplanarity detecting system |
| CN106940178A (en) * | 2017-03-22 | 2017-07-11 | 上海日进机床有限公司 | Silicon crystal workpiece flatness detecting device and silicon crystal workpiece measurement method of planeness |
| CN109163885A (en) * | 2018-11-14 | 2019-01-08 | 吴美珍 | Optical fibre device and its detection method and detection device |
| CN109186951A (en) * | 2018-11-14 | 2019-01-11 | 吴美珍 | Mould group and optical fibre device test equipment are combed before a kind of detection |
| CN110715638A (en) * | 2019-11-27 | 2020-01-21 | 湖南大合新材料有限公司 | Method for detecting flatness of crystal |
| CN212320640U (en) * | 2020-04-02 | 2021-01-08 | 深圳市华显光学仪器有限公司 | Pin coplanarity detector |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9212891B2 (en) | Method of calibrating gear measuring device | |
| CN102478385B (en) | Probe card detection method and system | |
| KR102652160B1 (en) | Metrics for Asymmetric Wafer Geometry Characterization | |
| CN111185745B (en) | Floating lock detection method for screw | |
| CN104597381A (en) | Device for detecting mechanical property and electric safety performance of electrical connector | |
| CN103376079B (en) | A kind of device of on-line checking glass size | |
| CN104103543B (en) | Wafer defect dimension correction method | |
| CN105300280B (en) | Connector size vision measuring method | |
| CN114894146A (en) | High-precision communication connector signal terminal pin surface flatness detection system | |
| CN209764048U (en) | Film thickness measuring device | |
| CN112158693A (en) | Detection method for elevator guide rail parameters | |
| CN108332693B (en) | Coordinate difference detection method and system | |
| CN114993192B (en) | Automatic thickness measuring equipment in lithium battery industry | |
| CN111474599A (en) | Foreign matter detection device for glass substrate and detection method thereof | |
| CN108709528B (en) | A kind of vehicle turbine shell cubing | |
| CN215768312U (en) | Glass reinspection device | |
| CN102789998B (en) | Inspecting method and inspecting equipment | |
| CN110838535B (en) | Preparation method of solar cell module and friction force testing system | |
| CN211783328U (en) | Equipment for detecting thickness of wafer | |
| CN108120409B (en) | Film thickness measuring apparatus and film thickness measuring method | |
| CN110715638A (en) | Method for detecting flatness of crystal | |
| KR100262655B1 (en) | Alignment method and device of the wafer prober | |
| CN110021027A (en) | A kind of trimming point calculating method based on binocular vision | |
| CN111288892A (en) | Vision measurement method | |
| CN220102659U (en) | Workpiece detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |