CN114894140B - Method, device, equipment and medium for measuring interval thickness of three-dimensional model - Google Patents
Method, device, equipment and medium for measuring interval thickness of three-dimensional model Download PDFInfo
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- CN114894140B CN114894140B CN202210435555.3A CN202210435555A CN114894140B CN 114894140 B CN114894140 B CN 114894140B CN 202210435555 A CN202210435555 A CN 202210435555A CN 114894140 B CN114894140 B CN 114894140B
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- 238000000034 method Methods 0.000 title claims abstract description 65
- 238000012545 processing Methods 0.000 claims abstract description 76
- 238000003379 elimination reaction Methods 0.000 claims abstract description 45
- 238000005259 measurement Methods 0.000 claims abstract description 31
- 230000008569 process Effects 0.000 claims description 20
- 238000003860 storage Methods 0.000 claims description 17
- 238000004590 computer program Methods 0.000 claims description 14
- 238000012216 screening Methods 0.000 claims description 3
- 238000000926 separation method Methods 0.000 claims 1
- 230000008030 elimination Effects 0.000 abstract description 16
- 238000001514 detection method Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 9
- 230000006870 function Effects 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000003754 machining Methods 0.000 description 7
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- 238000005553 drilling Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/16—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring distance of clearance between spaced objects
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
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Abstract
The embodiment of the invention provides a method for measuring the interval thickness of a three-dimensional model, which is characterized by comprising the following steps: obtaining an identifier in the model body; acquiring a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first set of non-adjacent pairs of faces a has a pair-wise relationship G; and acquiring all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B. The paired surface groups with too far interval, paired surface groups with too small area and adjacent or same paired surface groups with too far interval can be effectively removed by carrying out combined elimination treatment on the paired surface groups in the model body before the common measurement algorithm, so that excessive detection of the surfaces during processing of the common measurement algorithm can be reduced, the processing time of the common measurement algorithm is greatly shortened, and the efficiency of modifying the distance between paired surface groups with too small interval thickness is improved.
Description
Technical Field
The present invention relates to the field of measurement technologies, and in particular, to a method, an apparatus, a device, and a medium for measuring a three-dimensional model interval thickness.
Background
In the field of manufacturing industry, it is generally required to design a three-dimensional model using three-dimensional design software UG (Unigraphics NX, digital product development system), and process and manufacture a blank based on the three-dimensional model, to process the blank into a finished product.
In some cases, in order to reduce the machining cost, machining is performed by a machining method with a low precision, and when the thickness of the space between two surfaces to be machined in the three-dimensional model is too low, machining and manufacturing anomalies are likely to occur. As shown in fig. 4, in the case where two identical holes are drilled in the same direction with a relatively small interval, when the interval thickness between the two holes is less than a certain degree, the drilling accuracy for machining is low, and it may be shifted from the center during the drilling; since the larger the depth is, the larger the offset center is, when the depth of the two holes is larger, the two holes may intersect at the bottom, that is, a hole breakage problem may occur, resulting in abnormal manufacturing.
Since the three-dimensional model is the basis of the final processing and manufacturing finished product, if a place where the interval thickness is lower than a preset minimum value can be found in advance in the three-dimensional model and modified, the processing and manufacturing abnormality can be reduced, thereby reducing the processing and manufacturing cost. However, the prior art can only measure the thickness of each interval in the model by a common measurement algorithm carried by the UG software. However, because the thickness of the space to be measured in a model is typically too large, it can be as high as thousands of times; however, manually measuring each spacer thickness is not only time-consuming and easy to miss, so how to measure spacer thickness in a model body efficiently and accurately is a technical problem to be solved by those skilled in the art.
Disclosure of Invention
In view of the foregoing, embodiments of the present invention have been developed to provide a method, apparatus, device, and medium for measuring a three-dimensional model gap thickness that overcome or at least partially solve the foregoing problems.
In order to solve the above problems, an embodiment of the present invention discloses a method for measuring a thickness of a three-dimensional model interval, including:
obtaining an identifier in the model body; wherein the identifier comprises a wired identifier and a face identifier;
acquiring a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first non-adjacent pair of faces set a has a pair-face relationship G, the pair-face relationship G comprising:
the safety distance value q between the faces is not greater than the minimum distance value k1 of the interval thickness;
the common edge does not exist between the faces;
the area of any one surface is not smaller than a preset minimum value k2 of the area;
and acquiring all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B.
Preferably, the step of acquiring a first non-adjacent pair of face sets a in the model body according to the line identifier and the face identifier includes:
S1: any one surface of the model body is obtained to serve as a reference surface, and the reference surface is marked as an ith reference surface; acquiring any surface of the model body, which is subjected to comparison processing with the ith reference surface, as a comparison surface, and marking the comparison surface as the jth comparison surface;
s2: according to the ith reference plane and the jth comparison plane, executing the steps of removing the excessive distance processing, removing the adjacent plane processing and removing the excessive facet processing; if the ith reference surface and the jth comparison surface meet the requirement of the paired surface relation G, obtaining a corresponding non-adjacent paired surface a;
s3: judging whether the model body has an unparallel surface or not; if yes, returning to the execution step S1; if not, entering step S4;
s4: and summarizing all the obtained non-adjacent facing surfaces a to form a first non-adjacent facing surface set A, and terminating traversal.
Preferably, in the step of performing the distance-elimination processing, the adjacent surface-elimination processing, and the undersurface-elimination processing based on the i-th reference surface and all the j-th reference surfaces, the distance-elimination processing specifically includes:
c1: acquiring a minimum three-dimensional wire frame xi of the ith reference plane through the plane identifier of the ith reference plane, and acquiring a diagonal length r1 of the minimum three-dimensional wire frame xi;
C2: acquiring a minimum three-dimensional wire frame xj of the jth comparison surface through a surface identifier of the jth comparison surface, and acquiring a diagonal length j1 of the minimum three-dimensional wire frame xj;
and C3: obtaining the length d3 of a connecting line of a diagonal central point between the minimum three-dimensional wire frame xi and the minimum three-dimensional wire frame xj;
and C4: judging whether the safety distance value q is larger than the minimum distance value k1, wherein q=d3-r 1/2-j1/2; if yes, entering a step S3; if not, entering a step C5;
c5: and outputting the ith reference plane and the jth comparison plane as a first temporary group z1.
Preferably, in the step of performing the elimination distance overstep process, the elimination neighboring face process, and the elimination understep process according to the i-th reference face and all the j-th reference faces, the elimination neighboring face process specifically includes:
d1: acquiring a line identifier of the ith reference plane in the first temporary group z 1;
d2: screening out a common edge surface with any line identifier of the ith reference surface in the model body, and acquiring the identifier of the common edge surface;
d3: determining whether the identifier of the j-th reference plane in the first temporary group z1 is identical to the identifier of any one of the co-boundary planes; if yes, entering a step S3; if not, entering a step D4;
D4: and outputting the ith reference plane and the jth comparison plane in the first temporary group z1 as a second temporary group z2.
Preferably, in the step of performing the distance elimination process, the adjacent surface elimination process, and the over-facet elimination process according to the i-th reference surface and all the j-th reference surfaces, the over-facet elimination process specifically includes:
e1: in the second temporary group z2, acquiring an area value mj of the jth comparison surface through the surface identifier of the jth comparison surface;
e2: judging whether the area value mj is smaller than a preset minimum value k2 of the area or not; if yes, returning to the step S3; if not, entering a step E3;
e3: outputting the ith reference plane and the jth comparison plane in the second temporary group z2 as a group of the non-adjacent opposite planes a.
Preferably, the step of obtaining all non-adjacent pairs B with the interval thickness satisfying the preset condition in the first non-adjacent pair set a as the second non-adjacent pair set B includes:
f1: in a first non-adjacent opposite face set A, any group of non-adjacent opposite faces a are acquired;
f2: a step of executing ordinary measurement processing according to the ith reference plane and the jth comparison plane corresponding to each other in the non-adjacent pair of planes a; if the ith reference surface and the jth comparison surface meet the requirement of the interval thickness, obtaining a corresponding non-adjacent forming surface b;
F3: judging whether the non-adjacent facing surface a which is not subjected to common measurement processing exists in a first non-adjacent facing surface set A or not; if yes, returning to the execution step F1; if not, go to step F4
F4: outputting the ith reference plane and the jth comparison plane as non-adjacent facing planes B, forming the second non-adjacent facing plane set B, and terminating the traversal.
Preferably, after the step of obtaining all non-adjacent pairs B with the interval thickness satisfying the preset condition in the first non-adjacent pair set a as the second non-adjacent pair set B, the method further includes:
and performing highlighting processing on the second non-adjacent facing set B.
The embodiment of the invention discloses a device for measuring the interval thickness of a three-dimensional model, which comprises the following components:
the data acquisition module acquires identifiers in the model body; wherein the identifier comprises a wired identifier and a face identifier;
the first data generation module acquires a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first non-adjacent pair of faces set a has a pair-face relationship G, the pair-face relationship G comprising:
the safety distance value q between the faces is not greater than the minimum distance value k1 of the interval thickness;
The common edge does not exist between the faces;
the area of any one surface is not smaller than a preset minimum value k2 of the area;
and the second data generation module acquires all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B.
The embodiment of the invention discloses an electronic device, which comprises a processor, a memory and a computer program stored on the memory and capable of running on the processor, wherein the computer program realizes the method for measuring the interval thickness of a three-dimensional model when being executed by the processor.
Embodiments of the present invention provide a computer readable storage medium, comprising a computer program stored on the computer readable storage medium, which when executed by a processor, implements a method of measuring a three-dimensional model gap thickness as described above.
The embodiment of the invention has the following advantages: the paired surface groups with too far interval, paired surface groups with too small area and adjacent or same paired surface groups with too far interval can be effectively removed by carrying out combined elimination treatment on the paired surface groups in the model body before the common measurement algorithm, so that excessive detection of the surfaces during processing of the common measurement algorithm can be reduced, the processing time of the common measurement algorithm is greatly shortened, and the efficiency of modifying the distance between paired surface groups with too small interval thickness is improved.
Drawings
FIG. 1 is a flow chart of steps of an embodiment of a method of measuring the thickness of a three-dimensional model gap of the present invention;
FIG. 2 is a schematic view of an embodiment of an apparatus for measuring the thickness of a three-dimensional model interval according to the present invention;
FIG. 3 is an electronic device of an embodiment of a method of measuring the thickness of a three-dimensional model gap of the present invention;
FIG. 4 is a schematic diagram of a prior art model processing hole breaking situation according to the present invention;
FIG. 5 is a general flow chart of the comparative processing steps of one embodiment of a method of measuring the thickness of a three-dimensional model interval of the present invention;
FIG. 6 is a flow chart of the step of excluding distance oversteps in an embodiment of a method of measuring the thickness of a three-dimensional model according to the present invention;
FIG. 7 is a flow chart of the process steps of excluding adjacent surfaces in an embodiment of a method of measuring the thickness of a three-dimensional model;
FIG. 8 is a flow chart of the process steps of excluding facets of an embodiment of a method of measuring the thickness of a three-dimensional model interval in accordance with the present invention;
FIG. 9 is a schematic diagram of a minimal three-dimensional wireframe relationship of two faces of an embodiment of a method of measuring the thickness of a three-dimensional model gap in accordance with the present invention;
FIG. 10 is a flow chart of the general measurement processing steps of one embodiment of a method of measuring the thickness of a three-dimensional model interval of the present invention.
Detailed Description
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description. The percentages not specifically stated in the present invention are weight percentages/mass percentages.
Referring to fig. 1-10, there is shown a flowchart of steps of an embodiment of a method of measuring the thickness of a three-dimensional model interval according to the present invention, which may include the steps of:
obtaining an identifier in the model body; wherein the identifier comprises a wired identifier and a face identifier;
acquiring a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first non-adjacent pair of faces set a has a pair-face relationship G, the pair-face relationship G comprising:
the safety distance value q between the faces is not greater than the minimum distance value k1 of the interval thickness;
the common edge does not exist between the faces;
the area of any one surface is not smaller than a preset minimum value k2 of the area;
and acquiring all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B. More specifically, to reduce the number of measurement processes of conventional common measurement algorithms, it is desirable to use a combined contrast process to eliminate a large number of opposing faces that do not require measurement. In the present embodiment, the combined contrast processing includes an over-distance elimination processing, an adjacent surface elimination processing, and an over-facet elimination processing, which can eliminate three types of paired surfaces, respectively: a finished surface having a too large surface-to-surface distance; a forming surface with a common edge exists between the surfaces; there is a pair of facets with an area that is too small, and because facets are negligible, measurement of the gap thickness is not required. In order to improve the execution efficiency, the order of the combination contrast processing is not generally changed, that is, the process of eliminating the distance is performed first, then the process of eliminating the adjacent surface is performed, and finally the algorithm of eliminating the small surface is performed. After the comparison processing is carried out in the model body, a first non-adjacent facing surface set A is obtained; the common measurement process is then performed on each non-adjacent pair a contained in the first set of non-adjacent pairs a, and a non-adjacent pair b is derived. The preset condition is that the distance between the non-adjacent facing surfaces a is smaller than a minimum distance k1, that is, when the distance between the surfaces in the non-adjacent facing surfaces a is smaller than the minimum distance k1, machining errors are likely to occur, and in this case, a technician can adjust and modify the non-adjacent facing surfaces b according to the obtained non-adjacent facing surfaces b. The preset conditions herein are understood to be preset conditions in the normal measurement process. The UG software is provided with a common measurement processing function, and the distance between two surfaces in the model body can be measured through the interface and the common measurement processing function. In the present embodiment, two faces of the three-dimensional model to be subjected to measurement processing are referred to as facing faces. By measuring the thickness of the space between the two faces in this solution, as can be seen from fig. 4, it is also understood that the spacing between two nearest neighbors is measured in the same face.
It should be noted that, the line identifier corresponds to a line attribute feature of a corresponding line segment, and the line attribute feature includes: the length of each line segment; the face identifier corresponds to a face attribute feature of the corresponding face, the face attribute feature comprising: the number of the faces, the minimum three-dimensional wire frame corresponding to each face, the line segments forming the faces corresponding to each face, the area value of each face and the like. After the line identifier and the face identifier are acquired, the corresponding line attribute and face attribute can be acquired through an interface in the UG software.
It should also be noted that in UG software, each model body, each face, and each line has only one unique identifier, which can be used to uniquely name and distinguish each model body, each face, and each line; it is further noted that, because the identifiers of each body, each face, each line and each point in the UG software are independent of each other, although the model body and its corresponding upper line point are associated, if the identifier of the upper line point in the model body is to be obtained, the corresponding upper line point identifier in the model body can be obtained through the interface of the UG software.
According to the embodiment of the application, the paired surfaces in the model body are subjected to combined comparison treatment before the common measurement treatment, so that paired surfaces which are too far apart and are paired surfaces of adjacent surfaces or the same surface and too small in area can be effectively removed, excessive surfaces can be detected when the common measurement algorithm treatment is performed, the treatment time of the common measurement treatment is greatly reduced, and the efficiency of modifying the distance between paired surfaces with too small interval thickness is improved.
Next, a method of measuring the space thickness of the three-dimensional model in the present exemplary embodiment will be further described.
As an example, the step of obtaining a first non-adjacent set of pairs a in the model body from the line identifier and the face identifier comprises:
s1: any one surface of the model body is obtained to serve as a reference surface, and the reference surface is marked as an ith reference surface; acquiring any surface of the model body, which is subjected to comparison processing with the ith reference surface, as a comparison surface, and marking the comparison surface as the jth comparison surface;
s2: according to the ith reference plane and the jth comparison plane, executing the steps of removing the excessive distance processing, removing the adjacent plane processing and removing the excessive facet processing; if the ith reference surface and the jth comparison surface meet the requirement of the paired surface relation G, obtaining a corresponding non-adjacent paired surface a;
s3: judging whether the model body has an unparallel surface or not; if yes, returning to the execution step S1; if not, entering step S4;
s4: and summarizing all the obtained non-adjacent facing surfaces a to form a first non-adjacent facing surface set A, and terminating traversal. More specifically, the unpaired face refers to a reference face in the model body that has not been selected for comparison processing, and a comparison face in the model body that has not been selected for comparison processing with the i-th reference face. In this embodiment, one surface is selected as the i-th reference surface in the model body, and then one surface subjected to comparison processing with the i-th reference surface is selected as the j-th comparison surface in the model body. Therefore, the j-th reference plane here is likely to be identical to the i-th reference plane, since they are all selected in the model body. Taking the ith reference surface as a reference, and carrying out contrast treatment on all contrast surfaces in the model body with the ith reference surface one by one, wherein the contrast treatment is distance elimination treatment, adjacent surface elimination treatment and facet elimination treatment; when the ith reference plane and a comparison plane meet the pairing relation G, the ith reference plane and the comparison plane are a group of non-adjacent pairing planes a; when the ith reference surface and one comparison surface do not meet the pairing relation G, a step S3 is entered, at this moment, whether all the comparison surfaces and the ith reference surface are subjected to comparison processing is judged first, if not, the step S1 is returned to, and the comparison processing is carried out between the other comparison surface and the current ith reference surface, so that the comparison surface at this moment can be marked as a j+1th comparison surface for the convenience of understanding; if all the reference surfaces are compared with the ith reference surface, then judging whether all the reference surfaces are selected. If it is determined that there is a surface which is not selected as the reference surface, the surface is acquired as the reference surface for the next comparison processing, and for convenience of understanding, it can be understood that the reference surface at this time is the i+1th reference surface. If there are no faces that are not selected as reference faces, all the non-adjacent pairs a obtained can be summarized to form the first non-adjacent pair set a. Taking this embodiment as an example, there are 6 surfaces in a certain model body, and any one of the surfaces is obtained as a reference surface, and is recorded as a 1 st reference surface, and there are 6 reference surfaces (a 1 st reference surface, a 2 nd reference surface, a 3 rd reference surface, a 4 th reference surface, a 5 th reference surface, and a 6 th reference surface) at this time; and then, any surface of the model body is taken as a comparison surface, and the comparison surface is marked as a 1 st comparison surface, and 6 comparison surfaces (a 1 st comparison surface, a 2 nd comparison surface, a 3 rd comparison surface, a 4 th comparison surface, a 5 th comparison surface and a 6 th comparison surface) are also obtained. And then the 6 comparison surfaces are respectively compared with the 1 st reference surface, if the 1 st reference surface and the 1 st comparison surface accord with the pairing relation G, the comparison surfaces are marked as a group of non-adjacent pairing surfaces a, then the comparison surfaces enter into S3 to judge whether the comparison surfaces are used up, and when the 1 st comparison surface is found to be compared, the 2 nd comparison surface is obtained to be compared with the 1 st reference surface. Even if the 1 st reference plane and the 1 st comparison plane do not match the pairing relation G, the process goes to S3 to determine whether the comparison plane is used up. When judging that the 1 st reference surface is used up with the 6 th reference surface after the comparison processing is carried out, namely, when the comparison surface which is used up with the 1 st reference surface is used up, judging whether the reference surface is used up or not, and when the 1 st reference surface is compared at the moment, changing the reference surface into the 2 nd reference surface and then carrying out the comparison processing, namely, carrying out one-to-one comparison processing with the 6 comparison surfaces by using the 2 nd reference surface.
As an example, in the step of performing the distance-elimination excessive processing, the adjacent-surface-elimination processing, and the facet-elimination excessive processing according to the i-th reference surface and all the j-th reference surfaces, the distance-elimination excessive processing specifically includes:
c1: acquiring a minimum three-dimensional wire frame xi of the ith reference plane through the plane identifier of the ith reference plane, and acquiring a diagonal length r1 of the minimum three-dimensional wire frame xi;
c2: acquiring a minimum three-dimensional wire frame xj of the jth comparison surface through a surface identifier of the jth comparison surface, and acquiring a diagonal length j1 of the minimum three-dimensional wire frame xj;
and C3: obtaining the length d3 of a connecting line of a diagonal central point between the minimum three-dimensional wire frame xi and the minimum three-dimensional wire frame xj;
and C4: judging whether the safety distance value q is larger than the minimum distance value k1, wherein q=d3-r 1/2-j1/2; if yes, entering a step S3; if not, entering a step C5;
c5: and outputting the ith reference plane and the jth comparison plane as a first temporary group z1. More specifically, the minimum three-dimensional wire frame is automatically generated by UG software, and each surface can be enclosed by a minimum three-dimensional wire frame, and it should be noted that when two surfaces are identical in space, the minimum three-dimensional wire frame is identical; but the minor three-dimensional wireframes are identical, the non-substituted surfaces are spatially identical. As shown in fig. 9, the diagonal length r1 of the minimum three-dimensional wire frame xi is the length of the wire segment A1A2, the wire segment A1A3 can be understood as a radius (with a value of r 1/2), the diagonal length j1 of the minimum three-dimensional wire frame xj is the length of the wire segment B1B2, the wire segment B1B3 can be understood as a radius (with a value of j 1/2), and the connecting wire segment between the wire segment A1A2 and the midpoint of the wire segment B1B2 is A3B3 (with a value of d 3); when the connecting line segment d3 subtracts r1/2 and j1/2 respectively, a safety distance q is left; if the safety distance q is greater than k1 (k 1 is the minimum distance value of the spacing thickness set by the user), it is indicated that the distance between the surface a and the surface B cannot be lower than k1, that is, the spacing thickness of the non-adjacent pairs of surfaces is not too small; if the safety distance q is not greater than k1, then the subsequent comparison is performed based on this condition. In fig. 6, the start step is started on the premise that the i-th reference plane and the j-th reference plane are acquired, that is, on the premise that step S1 is performed, and when it is determined that the safe distance value q is greater than the minimum distance value k1, the end means the end of this step for the distance elimination process, and the next step proceeds to step S3.
As an example, in the step of performing the distance elimination process, the adjacent surface elimination process, and the facet elimination process based on the i-th reference surface and all the j-th reference surfaces, the adjacent surface elimination process specifically includes:
d1: acquiring a line identifier of the ith reference plane in the first temporary group z 1;
d2: screening out a common edge surface with any line identifier of the ith reference surface in the model body, and acquiring the identifier of the common edge surface;
d3: determining whether the identifier of the j-th reference plane in the first temporary group z1 is identical to the identifier of any one of the co-boundary planes; if yes, entering a step S3; if not, entering a step D4;
d4: and outputting the ith reference plane and the jth comparison plane in the first temporary group z1 as a second temporary group z2. More specifically, since the jth surface may be identical to or adjacent to the ith surface, where identical refers to the same surface case, and adjacent may refer to the case where two surfaces have a common edge, the minimum distance between the two surfaces is 0 in both cases, and the surfaces in both cases need to be excluded. Since the i-th surface and the j-th surface are both surfaces in the model body, the i-th surface and the j-th surface may be the same surface, and thus, not only surfaces having a common edge may be removed by excluding the adjacent surface treatment; and when the ith surface and the jth surface are the same surface, the ith surface and the jth surface can be selected and removed. It should be noted that, in the present embodiment, the starting step in fig. 7 is started on the premise that the first temporary group z1 is acquired, that is, on the premise that step C5 is performed; when it is determined that the identifier of the j-th reference plane is the same as the identifier of any common plane, the end refers to the end of this step for excluding the adjacent plane, and the next step proceeds to step S3.
As an example, in the step of performing the distance elimination excessive processing, the adjacent surface elimination processing, and the over-facet elimination processing according to the i-th reference surface and all the j-th reference surfaces, the over-facet elimination processing specifically includes:
e1: in the second temporary group z2, acquiring an area value mj of the jth comparison surface through the surface identifier of the jth comparison surface;
e2: judging whether the area value mj is smaller than a preset minimum value k2 of the area or not; if yes, returning to the step S3; if not, entering a step E3;
e3: outputting the ith reference plane and the jth comparison plane in the second temporary group z2 as a group of the non-adjacent opposite planes a. More specifically, k2 is a minimum area value set by the user, and when the area of the jth comparison surface is smaller than k2, this indicates that this comparison surface is too small, and the measurement interval thickness is meaningless, so this surface can be ignored. It should be noted that, in the present embodiment, the starting step in fig. 8 is started on the premise that the second temporary group z2 is acquired, that is, on the premise that step D4 is performed; when it is determined that the area value mj is smaller than the preset minimum value k2 of the area, the end refers to the end of this step for the process of excluding the undersides, and the next step goes to step S3. The interface of UG software is used for obtaining the line identifier and the surface identifier of the co-edge surface and the j-th contrast surface, and the line attribute characteristics and the surface attribute characteristics corresponding to the line identifier and the surface identifier are respectively read through the line identifier and the surface identifier. The attributes of the lines comprise the number, the length and the like of all the lines, and the attributes of the planes comprise the number of all the planes, the corresponding minimum three-dimensional wire frame, the area value and the like. In the combination contrast processing of the embodiment, the fact is that the identifier acquires the corresponding line attribute and the corresponding surface attribute to perform contrast processing, so as to eliminate the non-conforming surface.
As an example, the step of obtaining, as the second non-adjacent pair face set B, all non-adjacent pair faces B whose interval thickness satisfies the preset condition in the first non-adjacent pair face set a includes:
f1: in a first non-adjacent opposite face set A, any group of non-adjacent opposite faces a are acquired;
f2: a step of executing ordinary measurement processing according to the ith reference plane and the jth comparison plane corresponding to each other in the non-adjacent pair of planes a; if the ith reference surface and the jth comparison surface meet the requirement of the interval thickness, obtaining a corresponding non-adjacent forming surface b;
f3: judging whether the non-adjacent facing surface a which is not subjected to common measurement processing exists in a first non-adjacent facing surface set A or not; if yes, returning to the execution step F1; if not, go to step F4
F4: outputting the ith reference plane and the jth comparison plane as non-adjacent facing planes B, forming the second non-adjacent facing plane set B, and terminating the traversal. More specifically, since the non-adjacent facing surfaces a to be subjected to the ordinary measurement processing have been previously selected, this step is only required to perform measurement judgment in one pass among the non-adjacent facing surfaces a. When the thickness distance between the faces in the non-adjacent pair of faces a is smaller than the minimum distance value k1, that is, the distance between the faces in the non-adjacent pair of faces a is too small, a machining error is liable to occur, and in this case, the non-adjacent pair of faces a is marked as a non-adjacent pair of faces B, and for convenience of subsequent color marking, the non-adjacent pair of faces B is summarized to form a second non-adjacent pair of faces B. It should be noted that, in this embodiment, the initial step in fig. 10 is started on the premise that the first non-adjacent pair-face set a is acquired, that is, on the premise that the combined comparison processing step is completed; and when judging that the first non-adjacent paired surface set A has no non-adjacent paired surface a which is not subjected to common measurement processing, summarizing the obtained non-adjacent paired surfaces B to obtain a second non-adjacent paired surface set B, and ending the flow.
As an example, after the step of obtaining, as the second non-adjacent pair face set B, all non-adjacent pair faces B whose interval thickness satisfies the preset condition in the first non-adjacent pair face set a, further includes:
and performing highlighting processing on the second non-adjacent facing set B. More specifically, the second non-adjacent, face-forming set that has been screened out is highlighted for ease of viewing by the user.
It should be noted that, for simplicity of description, the method embodiments are shown as a series of acts, but it should be understood by those skilled in the art that the embodiments are not limited by the order of acts, as some steps may occur in other orders or concurrently in accordance with the embodiments. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred embodiments, and that the acts are not necessarily required by the embodiments of the invention.
Referring to fig. 2, there is shown a schematic structural diagram of an embodiment of an apparatus for measuring a thickness of a three-dimensional model interval according to the present invention, which may specifically include the following modules:
the data acquisition module acquires identifiers in the model body; wherein the identifier comprises a wired identifier and a face identifier;
The first data generation module acquires a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first non-adjacent pair of faces set a has a pair-face relationship G, the pair-face relationship G comprising:
the safety distance value q between the faces is not greater than the minimum distance value k1 of the interval thickness;
the common edge does not exist between the faces;
the area of any one surface is not smaller than a preset minimum value k2 of the area;
and the second data generation module acquires all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B.
It should be noted that, for simplicity of description, the method embodiments are shown as a series of acts, but it should be understood by those skilled in the art that the embodiments are not limited by the order of acts, as some steps may occur in other orders or concurrently in accordance with the embodiments. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred embodiments, and that the acts are not necessarily required by the embodiments of the application.
For the device embodiments, since they are substantially similar to the method embodiments, the description is relatively simple, and reference is made to the description of the method embodiments for relevant points.
Referring to FIG. 3, in an embodiment of the present invention, the present invention also provides a computer device, the computer device 12 described above being embodied in the form of a general purpose computing device, and the components of the computer device 12 may include, but are not limited to: one or more processors or processing units 16, a system memory 28, a bus 18 that connects the various system components, including the system memory 28 and the processing units 16.
Bus 18 represents one or more of several types of bus 18 structures, including a memory bus 18 or memory controller, a peripheral bus 18, an accelerated graphics port, a processor, or a local bus 18 using any of a variety of bus 18 architectures. By way of example, and not limitation, such architectures include Industry Standard Architecture (ISA) bus 18, micro channel architecture (MAC) bus 18, enhanced ISA bus 18, video Electronics Standards Association (VESA) local bus 18, and Peripheral Component Interconnect (PCI) bus 18.
Computer device 12 typically includes a variety of computer system readable media. Such media can be any available media that is accessible by computer device 12 and includes both volatile and nonvolatile media, removable and non-removable media.
The system memory 28 may include computer system readable media in the form of volatile memory, such as Random Access Memory (RAM) 31 and/or cache memory 32. The computer device 12 may further include other removable/non-removable, volatile/nonvolatile computer storage media. By way of example only, storage system 34 may be used to read from or write to non-removable, nonvolatile magnetic media (commonly referred to as a "hard disk drive"). Although not shown in FIG. 3, a magnetic disk drive for reading from and writing to a removable non-volatile magnetic disk (e.g., a "floppy disk"), and an optical disk drive for reading from or writing to a removable non-volatile optical disk such as a CD-ROM, DVD-ROM, or other optical media may be provided. In such cases, each drive may be coupled to bus 18 through one or more data medium interfaces. The memory may include at least one program product having a set (e.g., at least one) of program modules 42, the program modules 42 being configured to carry out the functions of embodiments of the invention.
A program/utility 41 having a set (at least one) of program modules 42 may be stored, for example, in a memory, such program modules 42 including, but not limited to, an operating system, one or more application programs, other program modules 42, and program data, each or some combination of which may include an implementation of a network environment. Program modules 42 generally perform the functions and/or methods of the embodiments described herein.
The computer device 12 may also communicate with one or more external devices 14 (e.g., keyboard, pointing device, display 24, camera, etc.), one or more devices that enable a user to interact with the computer device 12, and/or any devices (e.g., network card, modem, etc.) that enable the computer device 12 to communicate with one or more other computing devices. Such communication may occur through an input/output (I/O) interface 22. Moreover, computer device 12 may also communicate with one or more networks such as a Local Area Network (LAN), a Wide Area Network (WAN), and/or a public network such as the Internet, through network adapter 21. As shown, network adapter 21 communicates with other modules of computer device 12 over bus 18. It should be appreciated that although not shown, other hardware and/or software modules may be used in connection with computer device 12, including, but not limited to: microcode, device drivers, redundant processing units 16, external disk drive arrays, RAID systems, tape drives, data backup storage systems 34, and the like.
The processing unit 16 executes various functional applications and data processing by running programs stored in the system memory 28, for example, implementing the method of measuring the thickness of the three-dimensional model interval provided by the embodiment of the present invention.
Namely, the processing unit 16 realizes when executing the program: the data acquisition module acquires identifiers in the model body; wherein the identifier comprises a wired identifier and a face identifier;
the first data generation module acquires a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first non-adjacent pair of faces set a has a pair-face relationship G, the pair-face relationship G comprising:
the safety distance value q between the faces is not greater than the minimum distance value k1 of the interval thickness;
the common edge does not exist between the faces;
the area of any one surface is not smaller than a preset minimum value k2 of the area;
and the second data generation module acquires all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B.
In an embodiment of the present application, the present application further provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements a method of measuring a three-dimensional model gap thickness as provided by all embodiments of the present application.
That is, the program is implemented when executed by a processor: the data acquisition module acquires identifiers in the model body; wherein the identifier comprises a wired identifier and a face identifier;
The first data generation module acquires a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first non-adjacent pair of faces set a has a pair-face relationship G, the pair-face relationship G comprising:
the safety distance value q between the faces is not greater than the minimum distance value k1 of the interval thickness;
the common edge does not exist between the faces;
the area of any one surface is not smaller than a preset minimum value k2 of the area;
and the second data generation module acquires all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B.
Any combination of one or more computer readable media may be employed. The computer readable medium may be a computer-readable signal medium or a computer-readable storage medium. The computer readable storage medium can be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the computer-readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPOM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, either in baseband or as part of a carrier wave. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A computer readable signal medium may be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Computer program code for carrying out operations of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, smalltalk, C ++ and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (for example, through the Internet using an Internet service provider).
In this specification, each embodiment is described in a progressive manner, and each embodiment is mainly described by differences from other embodiments, and identical and similar parts between the embodiments are all enough to be referred to each other.
It will be apparent to those skilled in the art that embodiments of the present application may be provided as a method, apparatus, or computer program product. Accordingly, embodiments of the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, embodiments of the application may take the form of a computer program product on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) having computer-usable program code embodied therein.
Embodiments of the present application are described with reference to flowchart illustrations and/or block diagrams of methods, terminal devices (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing terminal device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal device, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiment and all such alterations and modifications as fall within the scope of the embodiments of the application.
Finally, it is further noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or terminal. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article or terminal device comprising the element.
The above detailed description of the method, the device, the equipment and the medium for measuring the interval thickness of the three-dimensional model, provided by the application, applies specific examples to illustrate the principle and the implementation of the application, and the description of the examples is only used for helping to understand the method and the core idea of the application; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in accordance with the ideas of the present application, the present description should not be construed as limiting the present application in view of the above.
Claims (10)
1. A method of measuring the thickness of a three-dimensional model space, comprising:
obtaining an identifier in the model body; wherein the identifier comprises a wired identifier and a face identifier;
acquiring a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first non-adjacent pair of faces set a has a pair-face relationship G, the pair-face relationship G comprising: the safety distance value q between the faces is not greater than the minimum distance value k1 of the interval thickness; the common edge does not exist between the faces; the area of any one surface is not smaller than a preset minimum value k2 of the area;
and acquiring all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B.
2. The method of claim 1, wherein the step of obtaining a first non-adjacent pair of faces set a in the model body based on the line identifier and the face identifier comprises:
s1: any one surface of the model body is obtained to serve as a reference surface, and the reference surface is marked as an ith reference surface; acquiring any surface of the model body, which is subjected to comparison processing with the ith reference surface, as a comparison surface, and marking the comparison surface as the jth comparison surface;
S2: according to the ith reference plane and the jth comparison plane, executing the steps of removing the excessive distance processing, removing the adjacent plane processing and removing the excessive facet processing; if the ith reference surface and the jth comparison surface meet the requirement of the paired surface relation G, obtaining a corresponding non-adjacent paired surface a;
s3: judging whether the model body has an unparallel surface or not; if yes, returning to the execution step S1; if not, entering step S4;
s4: and summarizing all the obtained non-adjacent facing surfaces a to form a first non-adjacent facing surface set A, and terminating traversal.
3. The method according to claim 2, wherein in the step of performing the distance-elimination overfar process, the adjacent-surface-elimination process, and the facet-elimination process based on the i-th reference plane and all the j-th reference planes, the distance-elimination overfar process specifically includes:
c1: acquiring a minimum three-dimensional wire frame xi of the ith reference plane through the plane identifier of the ith reference plane, and acquiring a diagonal length r1 of the minimum three-dimensional wire frame xi;
c2: acquiring a minimum three-dimensional wire frame xj of the jth comparison surface through a surface identifier of the jth comparison surface, and acquiring a diagonal length j1 of the minimum three-dimensional wire frame xj;
And C3: obtaining the length d3 of a connecting line of a diagonal central point between the minimum three-dimensional wire frame xi and the minimum three-dimensional wire frame xj;
and C4: judging whether the safety distance value q is larger than the minimum distance value k1, wherein q=d3-r 1/2-j1/2; if yes, entering a step S3; if not, entering a step C5;
c5: and outputting the ith reference plane and the jth comparison plane as a first temporary group z1.
4. A method according to claim 3, wherein in the step of performing the distance elimination process, the adjacent surface elimination process, and the facet elimination process based on the i-th reference surface and all the j-th reference surfaces, the adjacent surface elimination process specifically includes:
d1: acquiring a line identifier of the ith reference plane in the first temporary group z 1;
d2: screening out a common edge surface with any line identifier of the ith reference surface in the model body, and acquiring the identifier of the common edge surface;
d3: determining whether the identifier of the j-th reference plane in the first temporary group z1 is identical to the identifier of any one of the co-boundary planes; if yes, entering a step S3; if not, entering a step D4;
D4: and outputting the ith reference plane and the jth comparison plane in the first temporary group z1 as a second temporary group z2.
5. The method according to claim 4, wherein in the step of performing an over-distance elimination process, an adjacent surface elimination process, and an over-facet elimination process based on the i-th reference surface and all the j-th reference surfaces, the over-facet elimination process specifically includes:
e1: in the second temporary group z2, acquiring an area value mj of the jth comparison surface through the surface identifier of the jth comparison surface;
e2: judging whether the area value mj is smaller than a preset minimum value k2 of the area or not; if yes, returning to the step S3; if not, entering a step E3;
e3: outputting the ith reference plane and the jth comparison plane in the second temporary group z2 as a group of the non-adjacent opposite planes a.
6. The method according to claim 5, wherein the step of acquiring, as the second non-adjacent pair face set B, all non-adjacent pair faces B whose interval thickness satisfies a preset condition in the first non-adjacent pair face set a includes:
f1: in a first non-adjacent opposite face set A, any group of non-adjacent opposite faces a are acquired;
F2: a step of executing ordinary measurement processing according to the ith reference plane and the jth comparison plane corresponding to each other in the non-adjacent pair of planes a; if the ith reference surface and the jth comparison surface meet the requirement of the interval thickness, obtaining a corresponding non-adjacent forming surface b;
f3: judging whether the non-adjacent facing surface a which is not subjected to common measurement processing exists in a first non-adjacent facing surface set A or not; if yes, returning to the execution step F1; if not, go to step F4
F4: outputting the ith reference plane and the jth comparison plane as non-adjacent facing planes B, forming the second non-adjacent facing plane set B, and terminating the traversal.
7. The method according to claim 1, wherein after the step of acquiring, as the second non-adjacent pair face set B, all non-adjacent pair faces B whose interval thickness satisfies a preset condition in the first non-adjacent pair face set a, further comprises:
and performing highlighting processing on the second non-adjacent facing set B.
8. An apparatus for measuring the thickness of a three-dimensional model space, comprising:
the data acquisition module acquires identifiers in the model body; wherein the identifier comprises a wired identifier and a face identifier;
The first data generation module acquires a first non-adjacent facing set A in the model body according to the identifier; wherein any one of the non-adjacent pairs of faces a in the first non-adjacent pair of faces set a has a pair-face relationship G, the pair-face relationship G comprising:
the safety distance value q between the faces is not greater than the minimum distance value k1 of the interval thickness;
the common edge does not exist between the faces;
the area of any one surface is not smaller than a preset minimum value k2 of the area;
and the second data generation module acquires all non-adjacent facing surfaces B with interval thickness meeting preset conditions from the first non-adjacent facing surface set A as a second non-adjacent facing surface set B.
9. An electronic device comprising a processor, a memory and a computer program stored on the memory and capable of running on the processor, which when executed by the processor implements the method of measuring a three-dimensional model separation thickness as claimed in any one of claims 1 to 7.
10. A computer readable storage medium, comprising a computer program stored thereon, which when executed by a processor, implements a method of measuring a three-dimensional model gap thickness according to any of claims 1-7.
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