CN114894140A - Method, device, equipment and medium for measuring interval thickness of three-dimensional model - Google Patents
Method, device, equipment and medium for measuring interval thickness of three-dimensional model Download PDFInfo
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- CN114894140A CN114894140A CN202210435555.3A CN202210435555A CN114894140A CN 114894140 A CN114894140 A CN 114894140A CN 202210435555 A CN202210435555 A CN 202210435555A CN 114894140 A CN114894140 A CN 114894140A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/16—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring distance of clearance between spaced objects
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Abstract
The embodiment of the invention provides a method for measuring the interval thickness of a three-dimensional model, which is characterized by comprising the following steps: obtaining an identifier in a model body; according to the identifier, acquiring a first non-adjacent pair face set A in the model body; wherein any group of non-adjacent facing surfaces a in the first set of non-adjacent facing surfaces a has a facing relationship G; and acquiring all non-adjacent opposite surfaces B with interval thicknesses meeting preset conditions from the first set of non-adjacent opposite surfaces A as a second set of non-adjacent opposite surfaces B. By combining and excluding the paired surface groups in the molded body before the common measurement algorithm, the paired surface groups with too long spacing distance, the paired surface groups with adjacent surfaces or the same surfaces and the paired surface groups with too small area can be effectively removed, so that the excessive surfaces detected during the common measurement algorithm processing can be reduced, the processing time of the common measurement algorithm is greatly reduced, and the efficiency of modifying the distance between the paired surface groups with too small spacing thickness is improved.
Description
Technical Field
The invention relates to the technical field of measurement, in particular to a method, a device, equipment and a medium for measuring the interval thickness of a three-dimensional model.
Background
In the manufacturing industry, it is generally required to design a three-dimensional model using three-dimensional design software UG (Unigraphics NX, digital product development system), and process a blank based on the three-dimensional model to obtain a finished product.
In some cases, when machining is performed by a machining method with low precision in order to reduce the machining and manufacturing cost, machining and manufacturing abnormalities are likely to occur when the thickness of the gap between the two surfaces of the three-dimensional model to be machined is too low. As shown in fig. 4, in the case where two identical holes are drilled at a relatively small interval and in the same direction, when the thickness of the interval between the two holes is less than a certain degree, it may be off-centered during drilling due to low accuracy of drilling for machining; since the offset center is larger as the depth is larger, when the depth of the two holes is larger, the two holes may intersect at the bottom, that is, a hole breaking problem may occur, thereby causing an abnormality in manufacturing.
Since the three-dimensional model is the basis of the final finished product, if a place where the interval thickness is lower than a preset minimum value can be found in advance in the three-dimensional model and modified, the processing and manufacturing abnormity can be reduced, thereby reducing the processing and manufacturing cost. However, the prior art can only measure the thickness of each interval in the model through a common measurement algorithm carried by UG software. However, since the number of spacer thicknesses to be measured in a model is typically too large, up to thousands of times; however, manually measuring each interval thickness is not only time-consuming but also easy to omit, so how to measure the interval thickness in the model body efficiently and accurately is a technical problem to be solved by those skilled in the art.
Disclosure of Invention
In view of the above, embodiments of the present invention have been developed to provide a method, apparatus, device, and medium for measuring a gap thickness of a three-dimensional model that overcome or at least partially solve the above-mentioned problems.
In order to solve the above problem, an embodiment of the present invention discloses a method for measuring a three-dimensional model interval thickness, including:
obtaining an identifier in a model body; wherein the identifier comprises a wired identifier and a face identifier;
obtaining a first non-adjacent pair face set A in the model body according to the identifier; wherein any group of non-adjacent facing a in the first set of non-adjacent facing a has a facing relationship G comprising:
the safety distance value q between the surfaces is not more than the minimum distance value k1 of the interval thickness;
there is no common edge between the faces;
the area of any one surface is not less than a preset minimum value k2 of the area;
and acquiring all non-adjacent opposite surfaces B with interval thicknesses meeting preset conditions from the first set A of non-adjacent opposite surfaces as a second set B of non-adjacent opposite surfaces.
Preferably, the step of obtaining a first non-adjacent pair set a in the model volume according to the line identifier and the face identifier comprises:
s1: acquiring any surface in the model body as a reference surface, and marking the reference surface as an ith reference surface; acquiring any one surface of the model body which is compared with the ith reference surface as a comparison surface, and marking the comparison surface as a jth comparison surface;
s2: executing the processes of eliminating the too far distance processing, eliminating the adjacent surface processing and eliminating the facet processing according to the ith reference surface and the jth comparison surface; if the ith reference surface and the jth contrast surface meet the requirement of the opposite-to-surface relation G, obtaining the corresponding nonadjacent opposite surface a;
s3: judging whether the model body has no more opposite surface; if yes, returning to execute the step S1; if not, go to step S4;
s4: and summarizing all the obtained nonadjacent opposite faces a to form the first nonadjacent opposite face set A, and terminating traversal.
Preferably, in the step of performing the excluded distance excessive processing, the excluded neighboring surface processing, and the excluded facet processing according to the ith reference plane and all jth comparison planes, the excluded distance excessive processing specifically includes:
c1: acquiring a minimum three-dimensional wire frame xi of the ith reference surface through the surface identifier of the ith reference surface, and acquiring a diagonal length r1 of the minimum three-dimensional wire frame xi;
c2: acquiring a minimum three-dimensional wire frame xj of the jth contrast surface through the surface identifier of the jth contrast surface, and acquiring a diagonal length j1 of the minimum three-dimensional wire frame xj;
c3: acquiring the length d3 of a diagonal center point connecting line between the minimum three-dimensional wire frame xi and the minimum three-dimensional wire frame xj;
c4: determining whether the safe distance value q is greater than the minimum distance value k1, wherein q is d3-r1/2-j 1/2; if yes, go to step S3; if not, go to step C5;
c5: the ith reference plane and the jth contrast plane are output as a first temporary group z 1.
Preferably, in the step of performing the excluded distance excessive distance processing, the excluded adjacent surface processing, and the excluded small surface processing according to the ith reference surface and all the jth comparison surfaces, the excluded adjacent surface processing specifically includes:
d1: in the first temporary group z1, acquiring a line identifier of the i-th reference plane;
d2: screening out a common edge surface with the line identifier of any ith reference surface in the model body, and acquiring the identifier of the common edge surface;
d3: determining whether the identifier of the jth contrasting face in the first temporary group z1 is the same as the identifier of any of the co-edge faces; if yes, go to step S3; if not, go to step D4;
d4: the ith reference plane and the jth contrast plane in the first temporary group z1 are output as a second temporary group z 2.
Preferably, in the step of performing the process of excluding the excessive distance, the process of excluding the adjacent plane, and the process of excluding the facet according to the ith reference plane and all the jth comparison planes, the process of excluding the facet specifically includes:
e1: in the second temporary group z2, obtaining the area value mj of the jth contrast surface by the surface identifier of the jth contrast surface;
e2: judging whether the area value mj is smaller than a preset minimum value k2 of the area; if yes, return to step S3; if not, go to step E3;
e3: outputting the ith reference plane and the jth contrast plane in the second temporary group z2 as a group of the nonadjacent pair a.
Preferably, the step of acquiring all non-adjacent facing surfaces B with interval thicknesses meeting preset conditions from the first set of non-adjacent facing surfaces a as the second set of non-adjacent facing surfaces B includes:
f1: in a first non-adjacent pair surface set A, acquiring any group of non-adjacent pair surfaces a;
f2: executing common measurement processing according to the ith reference surface and the jth comparison surface corresponding to the nonadjacent pair of opposite surfaces a; if the ith reference surface and the jth contrast surface meet the requirement of interval thickness, obtaining the corresponding nonadjacent opposite surface b;
f3: judging whether non-adjacent opposite surfaces a which are not subjected to common measurement processing exist in a first non-adjacent opposite surface set A or not; if yes, the process returns to the step F1; if not, go to step F4
F4: and outputting the ith reference surface and the jth contrast surface as a nonadjacent paired surface B, forming a second nonadjacent paired surface set B, and terminating the traversal.
Preferably, after the step of obtaining all non-adjacent facing surfaces B with a gap thickness satisfying a preset condition in the first set of non-adjacent facing surfaces a as the second set of non-adjacent facing surfaces B, the method further includes:
and carrying out the brightening treatment on the second non-adjacent face set B.
The embodiment of the invention discloses a device for measuring the interval thickness of a three-dimensional model, which comprises:
the data acquisition module acquires the identifier in the model body; wherein the identifier comprises a wired identifier and a face identifier;
the first data generation module is used for acquiring a first non-adjacent pair of face sets A in the model body according to the identifier; wherein any group of non-adjacent facing a in the first set of non-adjacent facing a has a facing relationship G comprising:
the safety distance value q between the surfaces is not more than the minimum distance value k1 of the interval thickness;
there is no common edge between the faces;
the area of any one surface is not less than a preset minimum value k2 of the area;
and the second data generation module is used for acquiring all the non-adjacent opposite surfaces B with the interval thickness meeting the preset condition from the first non-adjacent opposite surface set A as a second non-adjacent opposite surface set B.
The embodiment of the invention discloses electronic equipment, which comprises a processor, a memory and a computer program which is stored on the memory and can run on the processor, wherein when the computer program is executed by the processor, the method for measuring the interval thickness of the three-dimensional model is realized.
Embodiments of the present invention provide a computer-readable storage medium, including a computer program stored thereon, which when executed by a processor, implement the above method for measuring a space thickness of a three-dimensional model.
The embodiment of the invention has the following advantages: by combining and excluding the paired surface groups in the molded body before the common measurement algorithm, the paired surface groups with too long spacing distance, the paired surface groups with adjacent surfaces or the same surfaces and the paired surface groups with too small area can be effectively removed, so that the excessive surfaces detected during the common measurement algorithm processing can be reduced, the processing time of the common measurement algorithm is greatly reduced, and the efficiency of modifying the distance between the paired surface groups with too small spacing thickness is improved.
Drawings
FIG. 1 is a flow chart illustrating the steps of one embodiment of a method of measuring the thickness of a three-dimensional model space according to the present invention;
FIG. 2 is a schematic structural diagram of an embodiment of an apparatus for measuring the thickness of a three-dimensional model space according to the present invention;
FIG. 3 is an electronic device of an embodiment of a method of measuring the thickness of a three-dimensional model space of the present invention;
FIG. 4 is a schematic diagram of a prior art model for hole-breaking;
FIG. 5 is a schematic general flow chart of comparative processing steps of an embodiment of a method of measuring the spacer thickness of a three-dimensional model of the present invention;
FIG. 6 is a flowchart illustrating the step of excluding the step of processing too far distance according to an embodiment of the method for measuring the space thickness of a three-dimensional model of the present invention;
FIG. 7 is a schematic flow chart diagram illustrating the process steps of excluding adjacent surfaces in an embodiment of a method for measuring spacer thickness of a three-dimensional model according to the present invention;
FIG. 8 is a schematic flow chart diagram of an embodiment of a method of measuring the spacer thickness of a three-dimensional model of the present invention excluding the over-faceting step;
FIG. 9 is a schematic diagram of a minimum three-dimensional wire frame relationship of two faces of an embodiment of a method of measuring the standoff thickness of a three-dimensional model of the present invention;
FIG. 10 is a flowchart illustrating the general measurement process steps of one embodiment of the method of measuring the spacer thickness of a three-dimensional model according to the present invention.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below. The percentages not specifically stated in the present invention are all weight percentages/mass percentages.
Referring to fig. 1-10, a flow chart of steps of an embodiment of the method for measuring a space thickness of a three-dimensional model of the present invention is shown, which may specifically include the following steps:
obtaining an identifier in a model body; wherein the identifier comprises a wired identifier and a face identifier;
obtaining a first non-adjacent pair face set A in the model body according to the identifier; wherein any group of non-adjacent facing a in the first set of non-adjacent facing a has a facing relationship G comprising:
the safety distance value q between the surfaces is not more than the minimum distance value k1 of the interval thickness;
there is no common edge between the faces;
the area of any one surface is not less than a preset minimum value k2 of the area;
and acquiring all non-adjacent opposite surfaces B with interval thicknesses meeting preset conditions from the first set A of non-adjacent opposite surfaces as a second set B of non-adjacent opposite surfaces. More specifically, in order to reduce the number of measurement processes of the conventional general measurement algorithm, a combined contrast process is required to exclude a large number of pairs of planes that do not require measurement. In the present embodiment, the combination contrast processing includes the elimination of the distance excessive processing, the elimination of the adjacent face processing, and the elimination of the small face processing, which can eliminate three types of pairs of faces, respectively: the surfaces are too far away from each other; the surfaces are in a pair with a common edge; there are pairs of facets that are over-faceted, and since the facets are negligible when too small, no gap thickness needs to be measured. In order to improve the execution efficiency, the order of the combination contrast processing is not generally changed, that is, the processing for excluding too far distance is executed first, then the processing for excluding adjacent surfaces is executed, and finally the algorithm for excluding small surfaces is executed. After contrast processing is carried out on the molded body, a first nonadjacent forming surface set A is obtained; then, each pair of non-adjacent pair a included in the first set a of non-adjacent pairs is subjected to a normal measurement process, and a pair of non-adjacent pairs b is obtained. The preset condition means that when the spacing distance between the non-adjacent opposite surfaces a is smaller than the minimum distance value k1, that is, the spacing between the surfaces in the non-adjacent opposite surfaces a is smaller than the minimum distance value k1, a processing error is likely to occur, and at this time, a technician can adjust and modify the obtained non-adjacent opposite surfaces b. It should be noted that the preset condition here can be understood as a preset condition in a general measurement process. The UG software has a common measurement processing function, and the distance between two surfaces in the model body can be measured through the interface and the common measurement processing function. In this embodiment, two surfaces of the three-dimensional model that need to be subjected to measurement processing are referred to as opposing surfaces. As can be seen from fig. 4, the measurement of the thickness of the space between two surfaces in this solution can also be understood as the measurement of the distance between two nearest neighboring points in the same surface.
It should be noted that the line identifier corresponds to a line attribute feature of a corresponding line segment, and the line attribute feature includes: the length of each line segment; the surface identifier corresponds to a surface attribute feature of the corresponding surface, and the surface attribute feature comprises: the number of faces, the minimum three-dimensional line frame corresponding to each face, the line segments of the component faces corresponding to each face, the area numerical value of each face, and the like. After the line identifier and the plane identifier are obtained, the corresponding line attribute and the corresponding plane attribute can be obtained through an interface in UG software.
It should also be noted that in UG software, there is one and only one unique identifier for each model body, each face and each line, and the identifier can be used to uniquely name and distinguish each model body, each face and each line; it should be noted that, because the identifiers of each body, each surface, each line and each point in the UG software are independent from each other, although the model body and the corresponding facial line point are associated, if the identifier of the facial line point in the model body is to be acquired, the corresponding facial line point identifier in the model body can be acquired through the interface of the UG software itself.
The embodiment of the application carries out the combination contrast processing on the paired surfaces in the model body before disclosing the common measurement processing, can effectively remove the paired surfaces with too far spacing distance, the paired surfaces with adjacent surfaces or the same surfaces and the paired surfaces with too small area, can reduce the detection of too many surfaces when carrying out the common measurement algorithm processing, greatly reduces the processing time of the common measurement processing, and improves the efficiency of modifying the distance between the paired surfaces with too small spacing thickness.
Next, a method of measuring the spacer thickness of the three-dimensional model in the present exemplary embodiment will be further described.
As an example, the step of retrieving a first non-adjacent pair set a in the model volume from the line identifier and the face identifier comprises:
s1: acquiring any surface in the model body as a reference surface, and marking the reference surface as an ith reference surface; acquiring any surface in the model body, which is subjected to comparison processing with the ith reference surface, as a comparison surface, and marking as a jth comparison surface;
s2: executing the processes of eliminating the too far distance processing, eliminating the adjacent surface processing and eliminating the facet processing according to the ith reference surface and the jth comparison surface; if the ith reference surface and the jth contrast surface meet the requirement of the opposite-to-surface relation G, obtaining the corresponding nonadjacent opposite surface a;
s3: judging whether the model body has no more opposite surface; if yes, go back to step S1; if not, go to step S4;
s4: and summarizing all the obtained nonadjacent opposite faces a to form the first nonadjacent opposite face set A, and terminating traversal. More specifically, the non-comparison surface refers to a reference surface that has not been selected for comparison processing in the model body, and a comparison surface that has not been selected for comparison processing with the ith reference surface in the model body. In this embodiment, one surface is optionally selected as the ith reference surface in the model, and then one surface to be compared with the ith reference surface is optionally selected as the jth comparison surface in the model. Therefore, the jth contrast surface may be the same as the ith reference surface because they are all selected in the model body. Taking the ith reference surface as a reference, comparing all comparison surfaces in the model body with the ith reference surface one by one, wherein the comparison processing is the processing of eliminating too far distance, the processing of eliminating adjacent surfaces and the processing of eliminating too small surfaces; when the ith reference surface and a contrast surface meet the paired surface relationship G, the ith reference surface and the contrast surface are taken as a group of nonadjacent paired surfaces a; when the ith reference plane and one comparison plane do not satisfy the face-to-face relationship G, the method proceeds to step S3, at this time, it is determined whether all comparison planes and the ith reference plane have been compared, if not, the method returns to step S1, and another comparison plane and the current ith reference plane are obtained for comparison, and for convenience of understanding, the comparison plane at this time can be regarded as the (j + 1) th comparison plane; and if all the comparison surfaces are compared with the ith reference surface, judging whether all the reference surfaces are selected. If the surface which is not selected as the reference surface is judged to exist, the surface is obtained as the next reference surface for comparison processing, and for convenience of understanding, the reference surface at the moment can be understood as the (i + 1) th reference surface. If there are no faces that have not been selected as reference faces, then all non-adjacent pair faces a that are obtained can be summed to form the first set of non-adjacent pair faces a. Taking this embodiment as an example, there are 6 surfaces in a certain model, and any one of the surfaces is taken as a reference surface and is recorded as the 1 st reference surface, and there are 6 reference surfaces in this case (the 1 st reference surface, the 2 nd reference surface, the 3 rd reference surface, the 4 th reference surface, the 5 th reference surface, and the 6 th reference surface); then, any one of the obtained surfaces of the model body is taken as a contrast surface and is marked as a1 st contrast surface, and at the moment, 6 contrast surfaces are also provided (the 1 st contrast surface, the 2 nd contrast surface, the 3 rd contrast surface, the 4 th contrast surface, the 5 th contrast surface and the 6 th contrast surface). Then, the 6 comparison surfaces are respectively compared with the 1 st reference surface, if the 1 st reference surface and the 1 st comparison opposite surface accord with the paired surface relationship G, the comparison surfaces are marked as a group of nonadjacent pair surfaces a, then the step S3 is carried out to judge whether the comparison surfaces are used up, and when the comparison is found to be carried out on the 1 st comparison surface, the 2 nd comparison surface is obtained to be compared with the 1 st reference surface. Note that, even if the 1 st reference plane and the 1 st contrasting plane do not match the contrasting plane relationship G, the process proceeds to S3, and it is determined whether the contrasting plane is used up. And when the 1 st reference surface is judged to be compared with the 6 th contrast surface, namely the contrast surface which is compared with the 1 st reference surface is used up, judging whether the reference surface is used up again, and when the 1 st reference surface is compared, changing the reference surface to the 2 nd reference surface and then performing the comparison treatment, namely performing the one-to-one comparison treatment on the 2 nd reference surface and the 6 th contrast surface.
As an example, in the step of performing the excluded distance too far processing, the excluded adjacent surface processing, and the excluded facet processing according to the ith reference surface and all the jth comparison surfaces, the excluded distance too far processing specifically includes:
c1: acquiring a minimum three-dimensional wire frame xi of the ith reference surface through the surface identifier of the ith reference surface, and acquiring a diagonal length r1 of the minimum three-dimensional wire frame xi;
c2: acquiring a minimum three-dimensional wire frame xj of the jth contrast surface through the surface identifier of the jth contrast surface, and acquiring a diagonal length j1 of the minimum three-dimensional wire frame xj;
c3: acquiring the length d3 of a diagonal center point connecting line between the minimum three-dimensional wire frame xi and the minimum three-dimensional wire frame xj;
c4: determining whether the safe distance value q is greater than the minimum distance value k1, wherein q is d3-r1/2-j 1/2; if yes, go to step S3; if not, go to step C5;
c5: the ith reference plane and the jth contrast plane are output as a first temporary group z 1. More specifically, the minimum three-dimensional wire frame is automatically generated by the UG software, each face can be wrapped by one minimum three-dimensional wire frame, and it should be noted that when two faces are identical in space, the minimum three-dimensional wire frames are also identical; but the smallest three-dimensional wire frames are not spatially identical. As shown in fig. 9, the diagonal length r1 of the minimum three-dimensional wire frame xi is the length of the line segment A1a2, the line segment A1A3 can be understood as a radius (value r1/2), the diagonal length j1 of the minimum three-dimensional wire frame xj is the length of the line segment B1B2, the line segment B1B3 can be understood as a radius (value j1/2), and the connecting line segment between the midpoint of the line segment A1a2 and the line segment B1B2 is A3B3 (value d 3); when the connecting line segment d3 subtracts r1/2 and j1/2 respectively, a safe distance q is left; if the safety distance q is greater than k1(k1 is the minimum distance value of the separation thickness set by the user), it indicates that the distance between the surface A and the surface B cannot be lower than k1, i.e. the separation thickness of the non-adjacent pair of surface groups cannot be too small; if the safety distance q is not greater than k1, then the subsequent comparison process is performed based on the situation. It should be noted that, in fig. 6, the starting step is started on the premise that the ith reference plane and the jth comparison plane are acquired, that is, on the premise that step S1 is executed, and when it is determined that the safe distance value q is greater than the minimum distance value k1, the ending step refers to the ending of this step of processing to exclude too far, and the next step proceeds to step S3.
As an example, in the step of performing the excluded-distance-too-far processing, the excluded-neighboring-surface processing, and the excluded-facet processing according to the ith reference plane and all the jth comparison planes, the excluded-neighboring-surface processing specifically includes:
d1: in the first temporary group z1, acquiring a line identifier of the i-th reference plane;
d2: screening out a common edge surface with the line identifier of any ith reference surface in the model body, and acquiring the identifier of the common edge surface;
d3: determining whether the identifier of the jth contrast surface in the first temporary group z1 is the same as the identifier of any one of the co-edge surfaces; if yes, go to step S3; if not, go to step D4;
d4: the ith reference plane and the jth contrast plane in the first temporary group z1 are output as a second temporary group z 2. More specifically, since the j-th surface may be the same as or adjacent to the i-th surface, the same refers to the same surface condition, and the adjacent may refer to the condition that two surfaces have a common edge, in which case the minimum distance between the two surfaces is 0, and the surfaces in the two conditions need to be excluded. It should be noted that, since the ith surface and the jth surface are both surfaces in the model body, the ith surface and the jth surface may be the same surface, and therefore, not only the surfaces having a common edge may be removed by the process of excluding the adjacent surfaces; and when the ith surface and the jth surface are the same surface, the surfaces can be screened out and removed. It should be noted that, in the present embodiment, the starting step in fig. 7 is started on the premise that the first temporary group z1 is acquired, that is, on the premise that step C5 is executed; when the identifier of the jth comparison surface is judged to be the same as the identifier of any one of the co-located surfaces, the end refers to the end of this step of processing for excluding the adjacent surface, and the next step will be proceeded to step S3.
As an example, in the step of performing the excluded distance excessive processing, the excluded neighboring surface processing, and the excluded faceting processing according to the ith reference plane and all the jth comparison planes, the excluded faceting processing specifically includes:
e1: in the second temporary group z2, obtaining the area value mj of the jth contrast surface by the surface identifier of the jth contrast surface;
e2: judging whether the area value mj is smaller than a preset minimum value k2 of the area; if yes, return to step S3; if not, go to step E3;
e3: outputting the ith reference plane and the jth contrast plane in the second temporary group z2 as a group of the nonadjacent pair a. More specifically, k2 is the minimum area value set by the user, and when the area of the jth comparison surface is smaller than k2, it is indicated that the comparison surface is too small, and the measurement interval thickness has no meaning, so that the surface can be ignored. It should be noted that, in the present embodiment, the starting step in fig. 8 is started on the premise that the second temporary group z2 is acquired, that is, on the premise that step D4 is executed; when the area value mj is smaller than the preset minimum value k2, the end refers to the end of this step for the elimination of the facet processing, and the next step proceeds to step S3. What is needed to be added is that line identifiers and surface identifiers of the common side surface and the jth contrast surface are acquired through an interface of UG software, and then line attribute characteristics and surface attribute characteristics corresponding to the line identifiers and the surface identifiers are respectively read through the line identifiers and the surface identifiers. The attributes of the lines include the number, the length and the like of all the lines, and the attributes of the faces include the number, the corresponding minimum three-dimensional wire frame, the area numerical value and the like of all the faces. In the combined comparison processing of the present embodiment, it is actually to obtain the corresponding line attribute and the corresponding plane attribute through the identifier and perform the comparison processing, so as to eliminate the pair of planes that do not meet the requirement.
As an example, the step of acquiring all non-adjacent facing surfaces B with interval thicknesses satisfying a preset condition in the first set of non-adjacent facing surfaces a as the second set of non-adjacent facing surfaces B includes:
f1: in a first non-adjacent pair surface set A, acquiring any group of non-adjacent pair surfaces a;
f2: executing common measurement processing according to the ith reference surface and the jth comparison surface corresponding to the nonadjacent pair of opposite surfaces a; if the ith reference surface and the jth contrast surface meet the requirement of interval thickness, obtaining the corresponding nonadjacent opposite surface b;
f3: judging whether non-adjacent opposite surfaces a which are not subjected to common measurement processing exist in a first non-adjacent opposite surface set A or not; if yes, the process returns to the step F1; if not, go to step F4
F4: and outputting the ith reference surface and the jth contrast surface as a non-adjacent opposite surface B, forming a second non-adjacent opposite surface set B, and terminating the traversal. More specifically, since the non-adjacent pair a that needs to be subjected to the ordinary measurement processing has been screened before, this step requires only one measurement determination in one pass among the non-adjacent pairs a. When the distance between the surfaces of the non-adjacent opposite surfaces a is smaller than the minimum distance value k1, that is, the distance between the surfaces of the non-adjacent opposite surfaces a is too small, machining errors are likely to occur, and at this time, the non-adjacent opposite surfaces a in this case are marked as non-adjacent opposite surfaces B, so that a second non-adjacent opposite surface set B is formed by summarizing the non-adjacent opposite surfaces B for the convenience of subsequent color marking. It should be noted that, in the present embodiment, the starting step in fig. 10 is started on the premise that the first non-adjacent pair surface set a is acquired, that is, the combination contrast processing step is completed; and when the non-adjacent opposite surfaces a which are not subjected to the ordinary measurement processing in the first non-adjacent opposite surface set A are judged, summarizing the obtained non-adjacent opposite surfaces B to obtain a second non-adjacent opposite surface set B, and then finishing the process.
As an example, after the step of acquiring all non-adjacent facing surfaces B with interval thicknesses satisfying a preset condition in the first set of non-adjacent facing surfaces a as the second set of non-adjacent facing surfaces B, the method further includes:
and carrying out brightening treatment on the second non-adjacent forming surface set B. More specifically, the second non-adjacent face set that has been filtered out is highlighted for easy viewing by the user.
It should be noted that, for simplicity of description, the method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present invention is not limited by the illustrated order of acts, as some steps may occur in other orders or concurrently in accordance with the embodiments of the present invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred and that no particular act is required to implement the invention.
Referring to fig. 2, a schematic structural diagram of an embodiment of the apparatus for measuring a space thickness of a three-dimensional model according to the present invention is shown, and specifically, the apparatus may include the following modules:
the data acquisition module acquires the identifier in the model body; wherein the identifier comprises a wired identifier and a face identifier;
the first data generation module is used for acquiring a first non-adjacent pair of face sets A in the model body according to the identifier; wherein any group of non-adjacent facing a in the first set of non-adjacent facing a has a facing relationship G comprising:
the safety distance value q between the surfaces is not more than the minimum distance value k1 of the interval thickness;
there is no common edge between the faces;
the area of any one surface is not less than a preset minimum value k2 of the area;
and the second data generation module is used for acquiring all the non-adjacent opposite surfaces B with the interval thickness meeting the preset condition from the first non-adjacent opposite surface set A as a second non-adjacent opposite surface set B.
It should be noted that, for simplicity of description, the method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the embodiments are not limited by the order of acts described, as some steps may occur in other orders or concurrently depending on the embodiments. Further, those skilled in the art will also appreciate that the embodiments described in the specification are presently preferred and that no particular act is required of the embodiments of the application.
For the device embodiment, since it is basically similar to the method embodiment, the description is simple, and for the relevant points, refer to the partial description of the method embodiment.
Referring to fig. 3, in an embodiment of the present invention, the present invention further provides a computer device, where the computer device 12 is represented in a form of a general-purpose computing device, and components of the computer device 12 may include, but are not limited to: one or more processors or processing units 16, a system memory 28, and a bus 18 that couples various system components including the system memory 28 and the processing unit 16.
The system memory 28 may include computer system readable media in the form of volatile memory, such as Random Access Memory (RAM)31 and/or cache memory 32. Computer device 12 may further include other removable/non-removable, volatile/nonvolatile computer system storage media. By way of example only, storage system 34 may be used to read from and write to non-removable, nonvolatile magnetic media (commonly referred to as "hard drives"). Although not shown in FIG. 3, a magnetic disk drive for reading from and writing to a removable, nonvolatile magnetic disk (e.g., a "floppy disk") and an optical disk drive for reading from or writing to a removable, nonvolatile optical disk (e.g., a CD-ROM, DVD-ROM, or other optical media) may be provided. In these cases, each drive may be connected to bus 18 by one or more data media interfaces. The memory may include at least one program product having a set (e.g., at least one) of program modules 42, with the program modules 42 configured to carry out the functions of embodiments of the invention.
A program/utility 41 having a set (at least one) of program modules 42 may be stored, for example, in memory, such program modules 42 including, but not limited to, an operating system, one or more application programs, other program modules 42, and program data, each of which examples or some combination thereof may include an implementation of a network environment. Program modules 42 generally carry out the functions and/or methodologies of the described embodiments of the invention.
The processing unit 16 executes programs stored in the system memory 28 to perform various functional applications and data processing, such as implementing the method for measuring the thickness of the three-dimensional model space provided by the embodiments of the present invention.
That is, the processing unit 16 implements, when executing the program: the data acquisition module acquires the identifier in the model body; wherein the identifier comprises a wired identifier and a face identifier;
the first data generation module is used for acquiring a first non-adjacent pair of face sets A in the model body according to the identifier; wherein any group of non-adjacent facing a in the first set of non-adjacent facing a has a facing relationship G comprising:
the safety distance value q between the surfaces is not more than the minimum distance value k1 of the interval thickness;
there is no common edge between the faces;
the area of any one surface is not less than a preset minimum value k2 of the area;
and the second data generation module is used for acquiring all the non-adjacent opposite surfaces B with the interval thickness meeting the preset condition from the first non-adjacent opposite surface set A as a second non-adjacent opposite surface set B.
In an embodiment of the present invention, the present invention further provides a computer-readable storage medium, on which a computer program is stored, which when executed by a processor, implements the method for measuring the space thickness of a three-dimensional model as provided in all embodiments of the present application.
That is, the program when executed by the processor implements: the data acquisition module acquires the identifier in the model body; wherein the identifier comprises a wired identifier and a face identifier;
the first data generation module is used for acquiring a first non-adjacent pair of face sets A in the model body according to the identifier; wherein any group of non-adjacent pairs of faces a in the first set of non-adjacent pairs of faces a has a face-to-face relationship G comprising:
the safety distance value q between the surfaces is not more than the minimum distance value k1 of the interval thickness;
there is no common edge between the faces;
the area of any one surface is not less than a preset minimum value k2 of the area;
and the second data generation module is used for acquiring all the non-adjacent opposite surfaces B with the interval thickness meeting the preset condition from the first non-adjacent opposite surface set A as a second non-adjacent opposite surface set B.
Any combination of one or more computer-readable media may be employed. The computer readable medium may be a computer-readable storage medium or a computer-signal medium. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPOM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the context of this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
A computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Computer program code for carrying out operations for aspects of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, Smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider).
The embodiments in the present specification are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
As will be appreciated by one of skill in the art, embodiments of the present application may be provided as a method, apparatus, or computer program product. Accordingly, embodiments of the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, embodiments of the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
Embodiments of the present application are described with reference to flowchart illustrations and/or block diagrams of methods, terminal devices (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing terminal to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing terminal to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing terminal to cause a series of operational steps to be performed on the computer or other programmable terminal to produce a computer implemented process such that the instructions which execute on the computer or other programmable terminal provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present application have been described, additional variations and modifications of these embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including the preferred embodiment and all such alterations and modifications as fall within the true scope of the embodiments of the application.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or terminal. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or terminal that comprises the element.
The method, the device, the equipment and the medium for measuring the interval thickness of the three-dimensional model provided by the application are introduced in detail, specific examples are applied in the detailed description to explain the principle and the implementation mode of the application, and the description of the examples is only used for helping to understand the method and the core idea of the application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.
Claims (10)
1. A method of measuring the thickness of a three-dimensional model space, comprising:
obtaining an identifier in a model body; wherein the identifier comprises a wired identifier and a face identifier;
obtaining a first non-adjacent pair face set A in the model body according to the identifier; wherein any group of non-adjacent facing a in the first set of non-adjacent facing a has a facing relationship G comprising: the safety distance value q between the surfaces is not more than the minimum distance value k1 of the interval thickness; there is no common edge between the faces; the area of any one surface is not less than a preset minimum value k2 of the area;
and acquiring all non-adjacent opposite surfaces B with interval thicknesses meeting preset conditions from the first set A of non-adjacent opposite surfaces as a second set B of non-adjacent opposite surfaces.
2. The method of claim 1, wherein the step of obtaining a first non-adjacent pair set a in the model volume from the line identifier and the face identifier comprises:
s1: acquiring any surface in the model body as a reference surface, and marking the reference surface as an ith reference surface; acquiring any one surface of the model body which is compared with the ith reference surface as a comparison surface, and marking the comparison surface as a jth comparison surface;
s2: executing the processes of eliminating the too far distance processing, eliminating the adjacent surface processing and eliminating the facet processing according to the ith reference surface and the jth comparison surface; if the ith reference surface and the jth contrast surface meet the requirement of the opposite-to-surface relation G, obtaining the corresponding nonadjacent opposite surface a;
s3: judging whether the model body has no more opposite surface; if yes, go back to step S1; if not, go to step S4;
s4: and summarizing all the obtained nonadjacent opposite faces a to form the first nonadjacent opposite face set A, and terminating traversal.
3. The method according to claim 2, wherein in the step of performing the excluded distance far processing, the excluded neighboring surface processing, and the excluded facet processing based on the ith reference surface and all the jth contrast surfaces, the excluded distance far processing specifically includes:
c1: acquiring a minimum three-dimensional wire frame xi of the ith reference surface through the surface identifier of the ith reference surface, and acquiring a diagonal length r1 of the minimum three-dimensional wire frame xi;
c2: acquiring a minimum three-dimensional wire frame xj of the jth contrast surface through the surface identifier of the jth contrast surface, and acquiring a diagonal length j1 of the minimum three-dimensional wire frame xj;
c3: acquiring the length d3 of a diagonal center point connecting line between the minimum three-dimensional wire frame xi and the minimum three-dimensional wire frame xj;
c4: determining whether the safe distance value q is greater than the minimum distance value k1, wherein q is d3-r1/2-j 1/2; if yes, go to step S3; if not, go to step C5;
c5: the ith reference plane and the jth contrast plane are output as a first temporary group z 1.
4. The method according to claim 3, wherein in the step of performing the excluded-too-far-distance processing, the excluded-neighboring-surface processing, and the excluded-facet processing based on the ith reference plane and all the jth contrast planes, the excluded-neighboring-surface processing specifically includes:
d1: in the first temporary group z1, acquiring a line identifier of the i-th reference plane;
d2: screening out a common edge surface with the line identifier of any ith reference surface in the model body, and acquiring the identifier of the common edge surface;
d3: determining whether the identifier of the jth contrast surface in the first temporary group z1 is the same as the identifier of any one of the co-edge surfaces; if yes, go to step S3; if not, go to step D4;
d4: the ith reference plane and the jth contrast plane in the first temporary group z1 are output as a second temporary group z 2.
5. The method according to claim 4, wherein in the step of performing the process of excluding too far distance, the process of excluding adjacent facets and the process of excluding facets based on the ith reference plane and all the jth contrast planes, the process of excluding facets specifically comprises:
e1: in the second temporary group z2, obtaining the area value mj of the jth contrast surface by the surface identifier of the jth contrast surface;
e2: judging whether the area value mj is smaller than a preset minimum value k2 of the area; if yes, return to step S3; if not, go to step E3;
e3: outputting the ith reference plane and the jth contrast plane in the second temporary group z2 as a group of the nonadjacent pair a.
6. The method of claim 5, wherein the step of obtaining all non-adjacent facing surfaces B with a gap thickness satisfying a preset condition in the first set of non-adjacent facing surfaces A as the second set of non-adjacent facing surfaces B comprises:
f1: in a first non-adjacent pair surface set A, acquiring any group of non-adjacent pair surfaces a;
f2: executing common measurement processing according to the ith reference surface and the jth comparison surface corresponding to the nonadjacent pair of opposite surfaces a; if the ith reference surface and the jth contrast surface meet the requirement of interval thickness, obtaining the corresponding nonadjacent opposite surface b;
f3: judging whether non-adjacent opposite surfaces a which are not subjected to common measurement processing exist in a first non-adjacent opposite surface set A or not; if yes, the process returns to the step F1; if not, go to step F4
F4: and outputting the ith reference surface and the jth contrast surface as a non-adjacent opposite surface B, forming a second non-adjacent opposite surface set B, and terminating the traversal.
7. The method according to claim 1, wherein after the step of obtaining all non-adjacent facing surfaces B with a gap thickness satisfying a preset condition in the first set of non-adjacent facing surfaces a as the second set of non-adjacent facing surfaces B, further comprising:
and carrying out the brightening treatment on the second non-adjacent face set B.
8. An apparatus for measuring the thickness of a three-dimensional model space, comprising:
the data acquisition module acquires the identifier in the model body; wherein the identifier comprises a wired identifier and a face identifier;
the first data generation module is used for acquiring a first non-adjacent pair of face sets A in the model body according to the identifier; wherein any group of non-adjacent facing a in the first set of non-adjacent facing a has a facing relationship G comprising:
the safety distance value q between the surfaces is not more than the minimum distance value k1 of the interval thickness;
there is no common edge between the faces;
the area of any one surface is not less than a preset minimum value k2 of the area;
and the second data generation module is used for acquiring all the non-adjacent opposite surfaces B with the interval thickness meeting the preset condition from the first non-adjacent opposite surface set A as a second non-adjacent opposite surface set B.
9. An electronic device comprising a processor, a memory, and a computer program stored on the memory and capable of running on the processor, the computer program, when executed by the processor, implementing the method of measuring a three-dimensional model space thickness of any of claims 1-7.
10. A computer-readable storage medium comprising a computer program stored thereon, which, when executed by a processor, implements a method of measuring a three-dimensional model gap thickness as recited in any one of claims 1-7.
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