CN114858285A - Linear frequency modulation infrared nondestructive testing system - Google Patents
Linear frequency modulation infrared nondestructive testing system Download PDFInfo
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- CN114858285A CN114858285A CN202210354133.3A CN202210354133A CN114858285A CN 114858285 A CN114858285 A CN 114858285A CN 202210354133 A CN202210354133 A CN 202210354133A CN 114858285 A CN114858285 A CN 114858285A
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- 238000009659 non-destructive testing Methods 0.000 title abstract description 15
- 230000005284 excitation Effects 0.000 claims abstract description 79
- 230000002457 bidirectional effect Effects 0.000 claims abstract description 18
- 230000001360 synchronised effect Effects 0.000 claims abstract description 15
- 238000001514 detection method Methods 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 10
- 230000008859 change Effects 0.000 claims description 6
- 238000004364 calculation method Methods 0.000 claims description 5
- 230000000630 rising effect Effects 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 4
- 238000007781 pre-processing Methods 0.000 claims description 3
- 230000008569 process Effects 0.000 claims description 2
- 238000001931 thermography Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
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- 238000002310 reflectometry Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0815—Light concentrators, collectors or condensers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
- G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
- G06V10/141—Control of illumination
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Abstract
The invention relates to a linear frequency modulation infrared nondestructive testing system. The device includes: the system comprises a light source excitation module based on bidirectional Chirp signal modulation of square wave carrier, a focal plane thermal infrared imager image sequence acquisition module and a heat map data processing module. The pulse number is pre-calculated after the waveform parameters are set, bidirectional Chirp modulation of the light source based on the square wave carrier is realized by counting corresponding pulses, frames of all pixel points are synchronous, and the detected characteristic image is obtained by calculating the cross-correlation phase. The system has the advantages of simple device, wide application range, high portability and the like, and can be used for linear frequency modulation infrared nondestructive testing.
Description
Technical Field
The invention relates to the field of infrared nondestructive detection, in particular to a system for performing infrared nondestructive detection on linear frequency modulation excitation waveforms and keeping frame synchronization.
Background
The infrared thermal wave nondestructive testing is a novel nondestructive testing mode and has the characteristics of high testing speed, large testing area, no contact, wide application range and the like. In all infrared nondestructive testing technologies, a wide-range continuous wave excitation source is used for phase-locked infrared thermal imaging and thermal wave radar infrared thermal imaging. Among them, thermal wave radar infrared thermal imaging is a recently proposed method, and the modulation waveform thereof adopts linear frequency modulation or phase modulation, while the frequency in the excitation waveform of phase-locked infrared thermal imaging is a fixed value. In general, in the infrared nondestructive inspection method using a continuous wave excitation source, the excitation waveform tends to become more complicated.
The square wave is a waveform which is easier to realize than a sine wave, and the square wave is used as a carrier wave, so that a detection system can be simplified. The thermal infrared imager serving as a temperature detector works in a scanning mode, that is, the radiant quantities of all pixel points in a view field are sequentially collected once within a time range corresponding to a collecting frame frequency and are converted into temperature values of different points, so that the temperature collecting time of different pixel points in one frame has a tiny time interval. If the excitation energy of the excitation source changes within the small time interval, the temperature sequences of different pixel points are asynchronous, and the detection result is inaccurate. Therefore, a linear frequency modulation thermal excitation infrared nondestructive testing system which can still keep frame synchronization under the square wave carrier is needed.
Disclosure of Invention
In order to solve the problems, the invention provides a linear frequency modulation infrared nondestructive testing system, which utilizes square waves as carrier waves and preprocesses the time of each energy change in the square waves by combining the frame frequency of a thermal imager in a computer, so that the energy change of an excitation source can be generated only after the scanning of all pixel points of a frame of image is finished, the frame synchronization is realized, and the cross-correlation phase image is obtained after the temperature data is subjected to correlation processing.
The technical scheme of the invention.
A linear frequency modulation infrared nondestructive testing system comprises a light source excitation module based on bidirectional Chirp signal modulation of square wave carriers, an acquisition module of a focal plane thermal infrared imager image sequence and a thermal image data processing module. The system comprises a light source excitation module, a thermal imager, a computer control system and a control module, wherein the light source excitation module consists of an excitation light source, a light source drive, a light-gathering cover, an excitation control unit and a lower computer control part of the computer control system, can complete instructions from a computer, controls the excitation light source to change according to a bidirectional Chirp signal based on a square wave carrier wave in combination with a synchronous signal of the thermal imager, and generates uniform thermal excitation on the surface of a sample; the acquisition module of the focal plane thermal infrared imager image sequence is composed of a focal plane thermal infrared imager and a thermal imager control part in a computer control system, is used for acquiring a thermal image and keeps synchronous with the light source excitation module; the heat map data processing module is integrated in a data processing part of the computer control system, and performs correlation calculation by using the bidirectional Chirp reference signals with the same waveform parameters to obtain the cross-correlation phase. After setting waveform parameters and detection time in a computer control system, sending the parameters to an excitation control unit by a computer, completing the calculation of square wave duration time in the excitation control unit, clicking 'start detection' in the computer control system, starting to collect thermal imager images with specified frame numbers by the computer, sending corresponding instructions to a lower computer, collecting thermal images with specified frame numbers in the computer control system, and obtaining cross-correlation phases after data processing.
The excitation light source is used for generating thermal excitation of a specified waveform, and continuous light sources such as LEDs, halogen lamps and the like can be used.
The light source drive can receive signals from the excitation control unit and control the switch of the excitation light source.
The light-gathering shade is a cube light-tight plastic hard plate with an opening on one surface. An excitation light source is arranged in the opposite side of the opening surface of the thermal infrared imager, and a square hole is reserved in the middle of the excitation light source and used for placing the thermal infrared imager; the irregular surface metal film is completely arranged inside the plastic hard board (except for the opening surface and the opening of the thermal imager), and the metal film needs to have higher reflectivity for light emitted by the excitation light source, so that most of the light emitted to the cover wall is reflected, the light energy is bound in the light-gathering cover, and finally the light energy received by the surface of the sample is maximized and uniform.
The focal plane thermal infrared imager works in a scanning mode, namely, all pixel points are scanned according to a certain sequence to form a frame of image, and a pulse is sent by a synchronous signal line after each scanning is finished and is used as a field synchronous signal.
The excitation control unit needs to be connected with a computer, a chip in light source drive and a synchronous signal line of the focal plane thermal infrared imager, needs to have a hardware interrupt function, and can be realized by integrated circuit chips such as a single chip microcomputer. The excitation control unit receives waveform parameters and detection time information from a computer, performs waveform calculation, calculates time required each time when the switching condition of an excitation light source changes, and calculates the number of pulses corresponding to the time by combining with a preset thermal imager frame frequency; setting the pins connected with the synchronous signal lines to be interrupted; after the upper computer sends a 'start detection' instruction, the pulse number of the synchronous signal line is recorded in an interrupt processing function; after the number of pulses reaches a preset amount, the excitation control unit sends a signal for changing the switching state to the chip in the light source drive.
The computer control system needs to have three major parts. The lower computer control part can realize the waveform setting function and needs parameters such as waveform starting frequency, finishing frequency, detection duration, thermal imager frame frequency and the like; the second is a thermal imager control part, which needs to physically connect a computer with a focal plane thermal infrared imager through a network cable and then acquire a thermal image of the thermal imager through software; and thirdly, a data processing part, namely, after preprocessing the heat map data, performing correlation algorithm processing on the heat map sequence by using a specified reference signal to obtain a cross-correlation phase.
The bidirectional Chirp signal based on the square wave carrier is defined as follows:
wherein phi EXC (t) representing a bidirectional Chirp signal based on a square wave carrier; f. of s The method comprises the steps of representing the initial frequency of a Chirp signal in Hz; f. of n The Chirp signal termination frequency is represented and the unit is Hz; b represents the Chirp signal frequency scanning rate, and the unit is Hz/s; t is s And the unit is s and represents the scanning period of the Chirp signal.
The definition formula (1) of the bidirectional Chirp reference signal is shown in the specification.
The excitation heat source signal refers to a change rule of the excitation heat source power along with time, and the definition of the change rule is shown as a formula (2).
The invention has the beneficial effects that:
compared with the prior art, the invention controls the light source by combining the excitation control unit and the synchronous signal of the focal plane thermal infrared imager, can realize the frame synchronization of all pixel points, has the advantages of simple device, wide application range, high portability and the like, and can carry out linear frequency modulation infrared nondestructive testing.
Drawings
FIG. 1 is a schematic structural diagram of a chirp infrared nondestructive testing system according to the present invention.
Fig. 1 is a linear frequency modulation infrared nondestructive testing system, which comprises a sample to be tested 1, a light-gathering cover 2, a focal plane thermal infrared imager 3, an excitation light source 4, an ethernet line 5, a thermal infrared imager synchronous signal line 6, an excitation light source power line 7, an excitation light source drive 8, a bidirectional Chirp square wave carrier signal 9, a light source control signal line 10, an excitation control unit 11, a lower computer control signal line 12, a computer control system 13, a bidirectional Chirp reference signal 14 and an excitation heat source signal 15.
The graph in fig. 2 is a bi-directional Chirp reference signal 14.
The graph in fig. 3 is the excitation heat source signal 15.
Detailed Description
The technical solution of the present invention is further described below with reference to the accompanying drawings, and the following contents are used for illustrating the present invention but not for limiting the scope of the present invention.
The linear frequency modulation infrared nondestructive testing system utilizes a computer control system to control a focal plane thermal infrared imager to collect a thermal image, and cooperates with an excitation control unit to control a heat source, and a nondestructive testing result is obtained after data processing. The specific implementation of the invention comprises three parts: the method comprises the steps of light source excitation based on bidirectional Chirp signal modulation of square wave carrier waves, acquisition of an image sequence of a focal plane thermal infrared imager and thermal image data processing.
Firstly, a light source excitation step based on bidirectional Chirp signal modulation of square wave carrier waves:
step 1: adjusting the position of the sample 1 to be detected to enable incident light to vertically irradiate the area to be detected of the sample 1 to be detected as far as possible;
step 2: 4 parameters of a Chirp signal starting frequency, a Chirp signal terminating frequency, a Chirp signal scanning period and a thermal imager frame frequency are set in the computer control system 13, and the computer control system 13 transmits an instruction (and values of the 4 parameters) through the lower computer control signal line 12 to enable the excitation control unit 11 to calculate the pulse number;
and step 3: the excitation heat source signal 15 is calculated at each rising edge (from 0 to q0) and falling edge (from q) in the detection process 0 Becomes 0), dividing each time data by the frame frequency of the focal plane thermal infrared imager 3 and rounding, storing all rounded values into a pulse array, and meanwhile, setting the total detection time length T as T s Dividing the frame frequency of the thermal infrared imager 3 by 32, rounding and storing the frame frequency as an end value;
and 4, step 4: connecting a thermal infrared imager synchronous signal wire 6 to a certain IO of the excitation control unit 11, setting a rising edge for triggering interruption to the IO, and starting the interruption in a 'start detection' instruction; the pulses in the infrared thermal imager synchronous signal line 6 are counted in the interrupt processing function and compared with the values in the pulse array, and when the counted value is equal to the value in the pulse array, the excitation control unit 11 sends a signal to the excitation light source driver 8 through the light source control signal line 10, so that the excitation light source 4 is controlled to be switched on and off; in general, the control result of the excitation control unit 11 on the excitation light source drive 8 is the same as that of the bidirectional Chirp square wave carrier signal 9, so that the light intensity of the excitation light source 4 changes according to the rule of the excitation heat source signal 15;
and 5: when the pulse count value is equal to the end value, the excitation control unit 11 sends an end signal to the excitation light source driver 8 through the light source control signal line 10, and the excitation light source driver 8 controls the excitation light source to turn off.
Secondly, acquiring a focal plane thermal infrared imager image sequence:
step 1: the focal plane thermal infrared imager 3 is connected with the computer control system 13 through an Ethernet cable 5, the initialization, the integration time and the frame frequency of the focal plane thermal infrared imager 3 are set through the computer control system 13, the focal plane thermal infrared imager 3 is focused, and the to-be-detected region of the to-be-detected sample 1 is ensured to be clearly visible on the real-time image of the computer control system 13;
step 2: according to the total detection time T ═ T s 32 and the frame frequency of the focal plane thermal infrared imager 3 sets the number of acquisitions of the image sequence such thatThe collection quantity is 3 frame frequency +1 of the total detection time;
and step 3: triggering a 'start detection' instruction, wherein the computer control system 13 in the instruction starts to collect an image sequence first, and then sends an instruction to the excitation control unit to start the rising edge interruption of the connection IO of the thermal infrared imager synchronous signal line 6;
and 4, step 4: after saving the specified number of images, the computer control system 13 stops the acquisition of the heat map, while the excitation control unit 11 automatically controls the excitation light source 4 to be turned off.
Thirdly, heat map data processing:
step 1: arranging all the images according to the acquisition time, and removing the first frame of image;
step 2: performing second-order polynomial fitting on the temperature sequence of each pixel point, and subtracting a fitting result to remove a temperature trend term;
and step 3: performing cross-correlation calculation on the temperature sequence of each pixel point and a bidirectional Chirp reference signal 14 with the same modulation parameter, specifically discretizing the bidirectional Chirp reference signal 14 to obtain q (n), performing rigid bert transformation on the orthogonal signal r (n) by using q (n), wherein the discrete temperature sequence of each pixel point is T (n), and calculating according to the formulas (4) to (6)
Namely, the cross-correlation phase of the corresponding pixel point, and after the cross-correlation phase of all the pixel points is calculated, the cross-correlation phase characteristic image is displayed on the computer control system 13.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (5)
1. The utility model provides a linear frequency modulation infrared nondestructive test system which the characterized in that includes: the system comprises a focal plane thermal infrared imager 3, an excitation light source 4, an excitation control unit 11, a computer control system 13, a bidirectional Chirp reference signal 14 and an excitation heat source signal 15; the computer control system 13 sends waveform modulation parameters to the excitation control unit 11, and after pulse number preprocessing of the excitation control unit 11, the excitation light source 4 is modulated by combining a field synchronization signal (pulse) of the focal plane thermal infrared imager 3, and simultaneously, image acquisition of the focal plane thermal infrared imager 3 is carried out, and cross-correlation calculation is carried out on the acquired thermal image.
2. The Chirp infrared nondestructive inspection system of claim 1 wherein the bi-directional Chirp reference signal 14 is defined as follows:
wherein phi REF (t) represents a bidirectional Chirp reference signal; f. of s The method comprises the steps of representing the initial frequency of a Chirp signal in Hz; f. of n The Chirp signal termination frequency is represented and the unit is Hz; b represents the frequency scanning rate of the Chirp signal, and the unit is Hz/s; t is s And the unit is s, which represents the Chirp signal scanning period.
3. The system of claim 1, wherein the excitation heat source signal 15 is defined as follows:
wherein phi FMTWI (t) represents the power density of an excitation heat source, which is a bidirectional Chirp signal based on a square wave carrier wave and has the unit of W/m 2 ；q 0 Represents the peak value of the power density of the excitation heat source, namely the power density when the excitation light source is turned on, and has the unit of W/m 2 ；f s The method comprises the steps of representing the initial frequency of a Chirp signal in Hz; f. of n The Chirp signal termination frequency is represented and the unit is Hz; b represents the frequency scanning rate of the Chirp signal, and the unit is Hz/s; t is s The method comprises the steps of representing a Chirp signal scanning period with the unit of s; detecting the total time length T ═ T s 32. Wherein f is s And f n In contrast, the frequency of the signal is first from f s Linear change to f n Is again linearly changed to f s 。
4. The method for preprocessing the pulse number in the chirp infrared nondestructive inspection system according to claim 1, characterized by the steps of:
a) the excitation heat source signal 15 is calculated at each rising edge (from 0 to q) during the detection process 0 ) And a falling edge (q) 0 Becomes 0) the corresponding time;
b) dividing each time data by the frame frequency of the focal plane thermal infrared imager 3, rounding, and storing all rounded values into a pulse array;
c) setting the total detection time length T as T s And dividing the frame frequency of the focal plane thermal infrared imager 3 by 32, rounding the frame frequency, and storing the rounding result into an end value.
5. The modulation part of the excitation light source 4 in the chirp infrared nondestructive inspection system according to claim 1 is characterized by the steps of:
a) connecting a thermal infrared imager synchronous signal wire 6 to a certain IO of the excitation control unit 11, setting a rising edge for triggering interruption to the IO, and setting interruption closing;
b) when the detection is started, the interruption is started, pulses in the infrared thermal imager synchronous signal line 6 are counted in an interruption processing function and compared with values in a pulse array, and when the counted value is equal to the values in the pulse array, the excitation control unit 11 sends a signal to the excitation light source driver 8 through the light source control signal line 10 to control the on and off of the excitation light source 4;
c) in the interrupt processing function, when the pulse count is equal to the end value, the excitation control unit 11 sends a signal to the excitation light source driver 8 through the light source control signal line 10 so that the excitation light source 4 is turned off.
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Citations (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0163060A2 (en) * | 1984-05-29 | 1985-12-04 | Allied Corporation | Surface acoustic wave infrared line imaging array |
| WO2001020303A1 (en) * | 1999-09-16 | 2001-03-22 | Wayne State University | Miniaturized contactless sonic ir device for remote non-destructive inspection |
| US20020109505A1 (en) * | 2000-10-24 | 2002-08-15 | Thomas Brinz | Device for testing a material that changes shape when an electric and/or magnetic field is applied |
| US20100276594A1 (en) * | 2007-12-20 | 2010-11-04 | Edik Rafailov | Photoconductive device |
| US20120228502A1 (en) * | 2011-03-11 | 2012-09-13 | Leco Corporation | Circuit and method for controlling an ir source for an analytical instrument |
| DE102012222933A1 (en) * | 2011-12-12 | 2013-06-13 | F-Tech Inc. | Non-destructive testing system |
| CN103926253A (en) * | 2014-04-22 | 2014-07-16 | 哈尔滨工业大学 | Linear frequency modulation ultrasonic excitation-based infrared thermal wave nondestructive testing method and system |
| EP2840387A1 (en) * | 2013-08-23 | 2015-02-25 | DCG Systems, Inc. | Lock-in thermography method and system for hot spot localization |
| CN205537964U (en) * | 2015-12-31 | 2016-08-31 | 南京诺威尔光电系统有限公司 | Laser scanning heat wave phase locking imaging system |
| US20160282272A1 (en) * | 2015-03-24 | 2016-09-29 | Arizona Board Of Regents On Behalf Of Arizona State University | Real-time baseline correction technique for infrared time-resolved photoluminescence |
| CN106610316A (en) * | 2016-12-29 | 2017-05-03 | 重庆工商大学 | Thin-wall local heat transfer coefficient measuring method based on thermal fluctuation coupling infrared imaging |
| CN107765162A (en) * | 2016-08-18 | 2018-03-06 | 华为机器有限公司 | A kind of micro-current electric leakage image detecting method and its system |
| CN109696457A (en) * | 2019-01-10 | 2019-04-30 | 华南理工大学 | Active infrared thermal wave detection method and system towards the damage of glass curtain wall cementing structure |
| CN109856189A (en) * | 2019-04-03 | 2019-06-07 | 黑龙江科技大学 | The transmission hot spot infrared thermal imaging detection device and method of pulse beam splitting laser excitation semi-conductor silicon chip micro-crack defect |
| CN109900741A (en) * | 2019-04-03 | 2019-06-18 | 哈尔滨商业大学 | Consider the infrared thermal wave NDT device and method of pulse heat pumping signal rising edge and failing edge |
| WO2019129959A1 (en) * | 2017-12-29 | 2019-07-04 | Saint-Gobain Isover | Method and device for the nondestructive testing of a wall |
| CN110411582A (en) * | 2019-08-12 | 2019-11-05 | 电子科技大学 | A kind of un-cooled infrared focal plane array reading circuit based on exponential model |
| CN110763727A (en) * | 2019-10-23 | 2020-02-07 | 广东工业大学 | Nondestructive testing system for welding defects |
| CN111256835A (en) * | 2020-03-13 | 2020-06-09 | 西北工业大学 | Temperature measurement thermal infrared imager calibration method and device of hyper-parameter polynomial physical model |
| CN113237559A (en) * | 2021-04-25 | 2021-08-10 | 哈尔滨工业大学 | Multispectral radiation temperature measuring device and using method |
| CN113483896A (en) * | 2021-07-06 | 2021-10-08 | 国网浙江宁海县供电有限公司 | Power equipment temperature measuring method and device, computer equipment and storage medium |
| CN113820016A (en) * | 2021-08-19 | 2021-12-21 | 东南大学 | Phase modulation thermal wave signal total variation denoising method |
-
2022
- 2022-04-02 CN CN202210354133.3A patent/CN114858285A/en active Pending
Patent Citations (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0163060A2 (en) * | 1984-05-29 | 1985-12-04 | Allied Corporation | Surface acoustic wave infrared line imaging array |
| WO2001020303A1 (en) * | 1999-09-16 | 2001-03-22 | Wayne State University | Miniaturized contactless sonic ir device for remote non-destructive inspection |
| US20020109505A1 (en) * | 2000-10-24 | 2002-08-15 | Thomas Brinz | Device for testing a material that changes shape when an electric and/or magnetic field is applied |
| US20100276594A1 (en) * | 2007-12-20 | 2010-11-04 | Edik Rafailov | Photoconductive device |
| US20120228502A1 (en) * | 2011-03-11 | 2012-09-13 | Leco Corporation | Circuit and method for controlling an ir source for an analytical instrument |
| DE102012222933A1 (en) * | 2011-12-12 | 2013-06-13 | F-Tech Inc. | Non-destructive testing system |
| EP2840387A1 (en) * | 2013-08-23 | 2015-02-25 | DCG Systems, Inc. | Lock-in thermography method and system for hot spot localization |
| CN103926253A (en) * | 2014-04-22 | 2014-07-16 | 哈尔滨工业大学 | Linear frequency modulation ultrasonic excitation-based infrared thermal wave nondestructive testing method and system |
| US20160282272A1 (en) * | 2015-03-24 | 2016-09-29 | Arizona Board Of Regents On Behalf Of Arizona State University | Real-time baseline correction technique for infrared time-resolved photoluminescence |
| CN205537964U (en) * | 2015-12-31 | 2016-08-31 | 南京诺威尔光电系统有限公司 | Laser scanning heat wave phase locking imaging system |
| CN107765162A (en) * | 2016-08-18 | 2018-03-06 | 华为机器有限公司 | A kind of micro-current electric leakage image detecting method and its system |
| CN106610316A (en) * | 2016-12-29 | 2017-05-03 | 重庆工商大学 | Thin-wall local heat transfer coefficient measuring method based on thermal fluctuation coupling infrared imaging |
| WO2019129959A1 (en) * | 2017-12-29 | 2019-07-04 | Saint-Gobain Isover | Method and device for the nondestructive testing of a wall |
| CN109696457A (en) * | 2019-01-10 | 2019-04-30 | 华南理工大学 | Active infrared thermal wave detection method and system towards the damage of glass curtain wall cementing structure |
| CN109856189A (en) * | 2019-04-03 | 2019-06-07 | 黑龙江科技大学 | The transmission hot spot infrared thermal imaging detection device and method of pulse beam splitting laser excitation semi-conductor silicon chip micro-crack defect |
| CN109900741A (en) * | 2019-04-03 | 2019-06-18 | 哈尔滨商业大学 | Consider the infrared thermal wave NDT device and method of pulse heat pumping signal rising edge and failing edge |
| CN110411582A (en) * | 2019-08-12 | 2019-11-05 | 电子科技大学 | A kind of un-cooled infrared focal plane array reading circuit based on exponential model |
| CN110763727A (en) * | 2019-10-23 | 2020-02-07 | 广东工业大学 | Nondestructive testing system for welding defects |
| CN111256835A (en) * | 2020-03-13 | 2020-06-09 | 西北工业大学 | Temperature measurement thermal infrared imager calibration method and device of hyper-parameter polynomial physical model |
| CN113237559A (en) * | 2021-04-25 | 2021-08-10 | 哈尔滨工业大学 | Multispectral radiation temperature measuring device and using method |
| CN113483896A (en) * | 2021-07-06 | 2021-10-08 | 国网浙江宁海县供电有限公司 | Power equipment temperature measuring method and device, computer equipment and storage medium |
| CN113820016A (en) * | 2021-08-19 | 2021-12-21 | 东南大学 | Phase modulation thermal wave signal total variation denoising method |
Non-Patent Citations (2)
| Title |
|---|
| CHEN S Q: "Thermographic evaluation of coating thickness with different modulation waveforms" * |
| 陶胜杰: "基于数字功率控制的红外锁相激励技术" * |
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