CN114800594A - Quick docking mechanism suitable for different grade type test host computer - Google Patents

Quick docking mechanism suitable for different grade type test host computer Download PDF

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Publication number
CN114800594A
CN114800594A CN202210378613.3A CN202210378613A CN114800594A CN 114800594 A CN114800594 A CN 114800594A CN 202210378613 A CN202210378613 A CN 202210378613A CN 114800594 A CN114800594 A CN 114800594A
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CN
China
Prior art keywords
docking mechanism
die plate
different types
quick docking
positioning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202210378613.3A
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Chinese (zh)
Inventor
文汉林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ruisite Electronic Technology Suzhou Co ltd
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Ruisite Electronic Technology Suzhou Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Ruisite Electronic Technology Suzhou Co ltd filed Critical Ruisite Electronic Technology Suzhou Co ltd
Priority to CN202210378613.3A priority Critical patent/CN114800594A/en
Publication of CN114800594A publication Critical patent/CN114800594A/en
Pending legal-status Critical Current

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00—Gripping heads and other end effectors
    • B25J15/08—Gripping heads and other end effectors having finger members
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
    • B25J19/0095—Means or methods for testing manipulators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention relates to a quick docking mechanism suitable for different types of test hosts, which comprises an upper module and a lower module; the upper module comprises an upper template horizontally arranged on the manipulator, two supporting bars arranged at the bottom of the upper template in parallel and at least two clamping heads arranged on the side surfaces of the supporting bars; the lower die block comprises a lower die plate horizontally arranged on the testing machine, two groups of buckle components which are arranged at the top of the lower die plate in parallel and are respectively staggered with the two support bars, and a linkage component which is arranged at the top of the lower die plate and is used for driving the two groups of buckle components to move simultaneously; each group of buckle components comprises a guide rail, at least two sliding blocks arranged on the guide rail in a sliding way and a connecting plate used for connecting the adjacent sliding blocks; the side surface of the sliding block is provided with an L-shaped clamping groove for clamping or loosening the clamping head; according to the invention, the linkage assembly drives the two groups of buckle assemblies to move simultaneously, and the L-shaped clamping groove is used for clamping the clamping head, so that the manipulator and the testing machine can be aligned quickly, and the working efficiency is improved.

Description

Quick docking mechanism suitable for different types of test hosts
Technical Field
The invention relates to the field of semiconductor testing, in particular to a quick docking mechanism suitable for different types of test hosts.
Background
In the semiconductor industry at present, a plurality of semiconductor products need a tester to perform performance testing; in order to realize automatic testing, a testing machine is usually used in cooperation with a manipulator; however, because the testing machines are large-sized precision testing instruments, the testing machines are large in size, heavy in weight and small in space on the manipulator, the testing machines are difficult to align, and the working efficiency is low.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide a quick docking mechanism suitable for different types of test hosts.
In order to achieve the purpose, the invention adopts the technical scheme that: a quick docking mechanism suitable for different types of test hosts comprises an upper module and a lower module;
the upper die block comprises an upper die plate horizontally arranged on the manipulator, an upper avoidance hole arranged in the middle of the upper die plate, two support bars arranged at the bottom of the upper die plate in parallel and respectively positioned at two sides of the avoidance hole, and at least two clamping heads arranged on the side surfaces of the support bars;
the lower die block comprises a lower die plate, a lower avoidance hole, two groups of buckle assemblies and a linkage assembly, wherein the lower die plate is horizontally arranged on the testing machine and is positioned below the upper die plate, the lower avoidance hole is arranged in the middle of the lower die plate and is coaxially arranged with the upper avoidance hole, the two groups of buckle assemblies are arranged at the top of the lower die plate in parallel and are respectively staggered with the two support bars, and the linkage assembly is arranged at the top of the lower die plate and is used for simultaneously driving the two groups of buckle assemblies to move; each group of buckle components comprises a guide rail arranged at the top of the lower template, at least two sliding blocks arranged on the guide rail in a sliding way, and a connecting plate used for connecting the adjacent sliding blocks; and an L-shaped clamping groove for clamping or loosening the clamping head is arranged on the side surface of the sliding block.
Preferably, the chuck is provided with a roller; the diameter of the roller is not larger than the minimum diameter of the L-shaped clamping groove.
Preferably, the supporting bars are provided with a plurality of height adjusting knobs connected with the upper template; the height adjusting knobs are evenly distributed along the length direction of the supporting bar at intervals.
Preferably, a plurality of groups of locking holes with different positions and types are arranged on the upper template; the locking hole is a gourd hole.
Preferably, a plurality of first positioning columns which are vertically arranged are arranged at the bottom of the upper template; the lower template is provided with a plurality of first positioning holes corresponding to the first positioning columns.
Preferably, a plurality of second positioning columns which are vertically arranged are arranged at the top of the lower template; the bottom of the supporting bar is provided with a plurality of second positioning holes corresponding to the second positioning columns.
Preferably, the head parts of the first positioning column and the second positioning column are provided with chamfers.
Preferably, the first positioning hole and the second positioning hole are internally provided with self-lubricating shaft sleeves.
Preferably, the linkage assembly comprises turntables respectively arranged at four corners of the top of the lower template, four first connecting rods respectively hinged with the turntables and the sliding blocks, a second connecting rod respectively hinged with two adjacent turntables, and a handle arranged on one of the turntables.
Preferably, the L-shaped clamping groove comprises a vertical part and a horizontal part; a chamfer is arranged at an opening at the upper end of the vertical part; the horizontal part is wedge-shaped, and the diameter gradually reduces from outside to inside.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
1. according to the invention, the linkage assembly drives the two groups of buckle assemblies to move simultaneously, and the L-shaped clamping groove is used for clamping the clamping head, so that the manipulator and the testing machine can be quickly aligned, and the working efficiency is improved;
2. the invention is provided with a plurality of groups of locking holes with different positions and models, can be matched with various manipulator models, and has good trafficability characteristic;
3. the invention has the advantages of flexible rotation, simple structure, convenient installation and alignment, and the like.
Drawings
The technical scheme of the invention is further explained by combining the accompanying drawings as follows:
FIG. 1 is a schematic structural diagram of a quick docking mechanism suitable for different types of test hosts according to the present invention;
FIG. 2 is a schematic structural view of the present invention with the upper mold plate removed;
FIG. 3 is a schematic structural view of an upper module mounted on a manipulator in the present invention;
FIG. 4 is a schematic structural view of a support bar of the present invention;
FIG. 5 is a schematic view of the structure of the lower module of the present invention mounted on a testing machine;
FIG. 6 is a schematic structural view of a buckle assembly according to the present invention;
FIG. 7 is a schematic structural view of a slider according to the present invention;
fig. 8 is a schematic diagram of the fast docking mechanism of the present invention for different types of test hosts.
Wherein: 1. an upper module; 11. mounting a template; 12. an upper avoidance hole; 13. a supporting strip; 14. clamping a head; 15. a roller; 16. a height adjustment knob; 17. a locking hole; 18. a first positioning post; 19. a second positioning hole; 2. a lower module; 21. a lower template; 22. a lower avoidance hole; 23. a buckle assembly; 231. a guide rail; 232. a slider; 233. a connecting plate; 234. an L-shaped clamping groove; 235. a vertical portion; 236. a horizontal portion; 24. a linkage assembly; 241. a turntable; 242. a first link; 243. a second link; 244. a handle; 25. a first positioning hole; 26. a second positioning column; 3. a manipulator; 4. a testing machine.
Detailed Description
The invention is described in further detail below with reference to the figures and the embodiments.
Fig. 1-8 show a fast docking mechanism for different types of test hosts according to the present invention, which comprises an upper module 1 and a lower module 2;
the upper module 1 comprises an upper template 11 horizontally arranged on the manipulator 3, an upper avoidance hole 12 arranged in the middle of the upper template 11, two support bars 13 arranged at the bottom of the upper template 11 in parallel and respectively positioned at two sides of the avoidance hole, and two clamping heads 14 arranged at the side surfaces of the support bars 13;
the lower module 2 comprises a lower template 21 which is horizontally arranged on the testing machine 4 and is positioned below the upper template 11, lower avoidance holes 22 which are arranged in the middle of the lower template 21 and are coaxially arranged with the upper avoidance holes 12, two groups of buckle assemblies 23 which are arranged in parallel at the top of the lower template 21 and are respectively staggered with the two support bars 13, and a linkage assembly 24 which is arranged at the top of the lower template 21 and is used for simultaneously driving the two groups of buckle assemblies 23 to move; each set of the buckle assemblies 23 comprises a guide rail 231 arranged at the top of the lower template 21, two sliders 232 arranged on the guide rail 231 in a sliding manner, and a connecting plate 233 used for connecting the two sliders 232; the side surface of the sliding block 232 is provided with an L-shaped clamping groove 234 for clamping or loosening the clamping head 14; the L-shaped card slot 234 includes a vertical portion 235 and a horizontal portion 236.
When the manipulator 3 and the testing machine 4 need to be docked: horizontally installing an upper template 11 on a manipulator 3, horizontally installing a lower template 21 on a testing machine 4, carrying the testing machine 4 to the lower part of the manipulator 3 to enable the upper template 11 to be positioned right above a lower module 2, then driving the testing machine 4 to move upwards to enable a clamping head 14 to enter a vertical part 235 of an L-shaped clamping groove 234, and finally simultaneously driving two groups of clamping components 23 to move through a linkage component 24 to enable the clamping head 14 to enter a horizontal part 236 of the L-shaped clamping groove 234, so that rapid butt joint is realized, and the working efficiency is improved; where manipulator 3 and tester 4 are both prior art, such as a manipulator of hong jin 9045 or 9046, and a tester of tai rui da J750.
Further, a roller 15 is arranged on the chuck 14; the diameter of the roller 15 is not larger than the minimum diameter of the L-shaped clamping groove 234; according to the invention, the roller 15 is arranged on the chuck 14, so that the abrasion can be reduced, and the service life can be prolonged.
Further, three height adjusting knobs 16 connected with the upper template 11 are arranged on the supporting bars 13; the three height adjusting knobs 16 are uniformly distributed at intervals along the length direction of the supporting bar 13; the height of the supporting bar 13 can be conveniently adjusted by arranging the height adjusting knob 16.
Furthermore, a plurality of groups of locking holes 17 with different positions and types are arranged on the upper template 11; the locking hole 17 is a gourd hole; the invention is provided with a plurality of groups of locking holes 17 with different positions and types, can be matched with various types of manipulators 3, has good trafficability, and the locking holes 17 are gourd holes, thereby being convenient for quick connection.
Further, four corners of the bottom of the upper template 11 are respectively provided with a first positioning column 18 which is vertically arranged; the lower template 21 is provided with four first positioning holes 25 corresponding to the first positioning columns 18; when the manipulator 3 and the testing machine 4 need to be docked: the first positioning post 18 and the first positioning hole 25 can serve as a guide and a positioning function, so that the clamping head 14 can enter the L-shaped clamping groove 234 conveniently.
Further, a second positioning column 26 which is vertically arranged is arranged at the top of the lower template 21; the bottom of the supporting bar 13 is provided with a second positioning hole 19 corresponding to the second positioning column 26; when the manipulator 3 and the testing machine 4 need to be docked: the second positioning post 26 and the second positioning hole 19 can further serve a guiding and positioning function, so that the chuck 14 can enter the L-shaped clamping groove 234 conveniently.
Furthermore, the heads of the first positioning column 18 and the second positioning column 26 are both provided with chamfers to play a guiding role, so that the first positioning column 18 and the second positioning column 26 can conveniently extend into the first positioning hole 25 or the second positioning hole 19 respectively.
Further, the first positioning hole 25 and the second positioning hole 19 are internally provided with self-lubricating shaft sleeves, so that abrasion can be reduced, and the service life is prolonged.
Further, the linkage assembly 24 includes a rotating disc 241 respectively disposed at four corners of the top of the lower mold plate 21, four first connecting rods 242 respectively hinge-connecting the rotating disc 241 and the sliding block 232, a second connecting rod 243 respectively hinge-connecting two adjacent rotating discs 241, and a handle 244 disposed on one of the rotating discs 241; after the chuck 14 enters the vertical part 235 of the L-shaped clamping groove 234, the handle 244 drives the rotating disc 241 to rotate, and the four rotating discs 241 and the sliding block 232 are hinged through the first connecting rod 242, so that the two sets of linkage assemblies 24 are driven to move horizontally simultaneously, the chuck 14 enters the horizontal part 236 of the L-shaped clamping groove 234, and rapid butt joint is achieved.
Further, an opening at the upper end of the vertical part 235 is provided with a chamfer to play a role in guiding, so that the clamping head 14 can conveniently enter the vertical part 235 of the L-shaped clamping groove 234; the horizontal portion 236 is wedge-shaped and has a diameter that decreases from the outside to the inside, facilitating locking of the chuck 14.
The above is only a specific application example of the present invention, and the protection scope of the present invention is not limited in any way. All the technical solutions formed by equivalent transformation or equivalent replacement fall within the protection scope of the present invention.

Claims (10)

1. The utility model provides a quick docking mechanism suitable for different grade type test host computer which characterized in that: comprises an upper module and a lower module;
the upper die block comprises an upper die plate horizontally arranged on the manipulator, an upper avoidance hole arranged in the middle of the upper die plate, two support bars arranged at the bottom of the upper die plate in parallel and respectively positioned at two sides of the avoidance hole, and at least two clamping heads arranged on the side surfaces of the support bars;
the lower die block comprises a lower die plate, a lower avoidance hole, two groups of buckle assemblies and a linkage assembly, wherein the lower die plate is horizontally arranged on the testing machine and is positioned below the upper die plate, the lower avoidance hole is arranged in the middle of the lower die plate and is coaxially arranged with the upper avoidance hole, the two groups of buckle assemblies are arranged at the top of the lower die plate in parallel and are respectively staggered with the two support bars, and the linkage assembly is arranged at the top of the lower die plate and is used for simultaneously driving the two groups of buckle assemblies to move; each group of buckle components comprises a guide rail arranged at the top of the lower template, at least two sliding blocks arranged on the guide rail in a sliding way, and a connecting plate used for connecting the adjacent sliding blocks; and an L-shaped clamping groove for clamping or loosening the clamping head is arranged on the side surface of the sliding block.
2. The quick docking mechanism for different types of test hosts of claim 1, further comprising: the chuck is provided with a roller; the diameter of the roller is not larger than the minimum diameter of the L-shaped clamping groove.
3. The quick docking mechanism for different types of test hosts of claim 2, wherein: the support bar is provided with a plurality of height adjusting knobs connected with the upper template; the height adjusting knobs are evenly distributed along the length direction of the supporting bar at intervals.
4. The quick docking mechanism for different types of test hosts of claim 3, wherein: a plurality of groups of locking holes with different positions and types are arranged on the upper template; the locking hole is a gourd hole.
5. The quick docking mechanism for different types of test hosts of claim 4, wherein: a plurality of first positioning columns which are vertically arranged are arranged at the bottom of the upper template; the lower template is provided with a plurality of first positioning holes corresponding to the first positioning columns.
6. The quick docking mechanism for different types of test hosts of claim 5, wherein: a plurality of second positioning columns which are vertically arranged are arranged at the top of the lower template; the bottom of the supporting bar is provided with a plurality of second positioning holes corresponding to the second positioning columns.
7. The quick docking mechanism for different types of test hosts of claim 6, wherein: the head parts of the first positioning column and the second positioning column are provided with chamfers.
8. The quick docking mechanism for different types of test hosts of claim 7, wherein: and self-lubricating shaft sleeves are arranged in the first positioning hole and the second positioning hole.
9. The quick docking mechanism for different types of test hosts according to any one of claims 1 to 8, characterized in that: the linkage assembly comprises turntables respectively arranged at four corners of the top of the lower template, four first connecting rods respectively hinged with the turntables and the sliding blocks, a second connecting rod respectively hinged with two adjacent turntables, and a handle arranged on one of the turntables.
10. The quick docking mechanism for different types of test hosts of claim 9, wherein: the L-shaped clamping groove comprises a vertical part and a horizontal part; a chamfer is arranged at an opening at the upper end of the vertical part; the horizontal part is wedge-shaped, and the diameter gradually reduces from outside to inside.
CN202210378613.3A 2022-04-12 2022-04-12 Quick docking mechanism suitable for different grade type test host computer Pending CN114800594A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210378613.3A CN114800594A (en) 2022-04-12 2022-04-12 Quick docking mechanism suitable for different grade type test host computer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210378613.3A CN114800594A (en) 2022-04-12 2022-04-12 Quick docking mechanism suitable for different grade type test host computer

Publications (1)

Publication Number Publication Date
CN114800594A true CN114800594A (en) 2022-07-29

Family

ID=82534751

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210378613.3A Pending CN114800594A (en) 2022-04-12 2022-04-12 Quick docking mechanism suitable for different grade type test host computer

Country Status (1)

Country Link
CN (1) CN114800594A (en)

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