CN114764108A - Dielectric constant measuring device based on waveguide structure - Google Patents
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- CN114764108A CN114764108A CN202110047374.9A CN202110047374A CN114764108A CN 114764108 A CN114764108 A CN 114764108A CN 202110047374 A CN202110047374 A CN 202110047374A CN 114764108 A CN114764108 A CN 114764108A
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- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
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Abstract
The invention relates to the technical field of microwave measurement and discloses a dielectric constant measuring device based on a waveguide structure. The directional coupler is formed by coupling two microwave transmission lines, microwaves input from a main line are coupled to a secondary line in a certain proportion, a hole is formed in the rectangular waveguide, a cuboid metal strip is arranged between the upper edge of the small hole and an upper cover plate, the rectangular waveguide is used for six-port reflection timing in the project design, therefore, the hole is formed in the wide surface of the rectangular waveguide, the microwaves are coupled to a strip line through the small hole, then the microwaves are transmitted to the two ends of the strip line to be connected with a coaxial line, and the microwaves are transmitted to a power meter through the coaxial line, so that the waveguide-strip line-coaxial line type directional coupler is formed, and the purposes of greatly reducing the complexity and the cost of a system are achieved.
Description
Technical Field
The invention relates to the technical field of microwave measurement, in particular to a dielectric constant measuring device based on a waveguide structure.
Background
The microwave application is mainly in the application of information transmission and microwave energy, the microwave measurement technology is one of the main applications of microwave, which is the basis and important component of microwave application, electromagnetic materials are very widely applied in the civil, industrial and national defense fields, the electromagnetic parameters of the electromagnetic materials have important influence on the performance and indexes of devices, wherein the dielectric constant is the most important parameter in the electromagnetic parameters, so the dielectric constant of the materials is more important to measure, the methods for measuring the dielectric constant are numerous and are spread in various fields of industry, civil and national defense, currently, in the electromagnetic theory and the microwave network theory, the scattering parameters are generally adopted to derive the dielectric constant, the measurement of the scattering parameters needs to be realized by microwave measurement, more advanced network measurement technology and measuring instrument are needed, 1934 Bell laboratory first starts the measurement research of network parameters and develops a measurement method of transmission parameters, the method can display a polar coordinate graph of transmission parameters on an oscilloscope, and the microwave measurement technology is continuously innovated and divided into the traditional microwave measurement technology and the modern microwave measurement technology.
Although the dielectric constant measuring methods are various, the dielectric property of the material is influenced by the temperature change, so that the information transmission performance of the antenna on the shielding case is influenced, and great interference is brought to signal transmission, the method is not applicable to measuring different materials by once and for all, and different systems, the measuring methods selected under different frequencies are different, the scheme for measuring the dielectric constant under high-power microwaves is less, the general manufacturing cost is high, the structure is complex, and the real-time measuring function of measuring the complex dielectric constant while heating cannot be realized.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a dielectric constant measuring device based on a waveguide structure, which has the advantages of realizing the measurement of the complex dielectric constant of a material under high-power microwave by microwave measurement, so as to realize the real-time measurement of the complex dielectric constant of the material under different temperatures while heating, along with low manufacturing cost, simple structure, high accuracy, suitability for the polymorphic measurement of solid, liquid and gas, more uniform heating by adopting a double-layer vacuum-pumping silicon tube and a ridge waveguide, introduction of a computer neural network, improvement of calculation accuracy and reduction of calculation difficulty, and solving the problem that the change of the microwave measurement temperature can influence the dielectric property of the material, thereby influencing the information transmission performance of an antenna on a shielding case and bringing great interference to signal transmission.
The invention provides the following technical scheme: a dielectric constant measuring device based on a waveguide structure comprises a reflectometer, wherein a rectangular waveguide is fixedly arranged on the upper surface of the reflectometer, a first port is fixedly arranged on the side surface of the rectangular waveguide, a second port is fixedly arranged at one end, far away from the first port, of the rectangular waveguide, a directional coupler of a waveguide-strip line-coaxial line structure is arranged on the wide surface of the rectangular waveguide, a fourth port is arranged on the upper surface of the directional coupler, a coaxial line is fixedly arranged on one side of the fourth port, a power meter is fixedly arranged at one end, far away from the fourth port, of the coaxial line, a probe is fixedly arranged on the side surface of the rectangular waveguide, a third port is arranged on the upper surface of the probe, a fifth port is arranged on one side, far away from the third port, of the probe, a sixth port is arranged on one side, far away from the fifth port, of the reflectometer, a ridge waveguide is fixedly connected to one side of the reflectometer, a first connecting block is arranged on one side of the ridge waveguide, a second connecting block is arranged at one end, away from the first connecting block, of the ridge waveguide, a first cut-off waveguide is fixedly arranged on one side of the ridge waveguide, and a second cut-off waveguide is fixedly arranged at one end, away from the first cut-off waveguide, of the ridge waveguide.
Preferably, two sides of the ridge waveguide are a wide surface and a narrow surface, the wide surface of the ridge waveguide is provided with two openings, and a first cut-off waveguide is installed, and the narrow surface of the ridge waveguide is also provided with two openings and a second cut-off waveguide is installed.
Preferably, the reflectometer and the ridge waveguide are both arranged in a rectangular shape and are fixedly installed through the first connecting block and the second connecting block.
Preferably, the wide-surface-mounted cut-off waveguide of the ridge waveguide can measure the temperature at one time, and the narrow-surface-mounted cut-off waveguide of the ridge waveguide can observe the form of the material at two times.
Preferably, the sides of the reflectometer are tangent to the sides of the ridge waveguide.
Preferably, the port three, the port five and the port six three are combined into a probe structure.
Compared with the prior art, the invention has the following beneficial effects:
1. the dielectric constant measuring device based on the waveguide structure adopts a six-port measuring technology as a relatively mature microwave measuring technology with early origin, has high measuring precision, low manufacturing cost and simple structure, is rapidly developed, utilizes the six-port measuring technology to accurately measure the reflection coefficient and the phase, and borrows the help ofThe method comprises the following steps that a neural network model between a microwave parameter S11 and a complex dielectric constant is obtained by a Back Propagation (BP) neural network of an auxiliary computer, and then the complex dielectric constant of a material is obtained, the introduction of a neural network technology enables the calculation process to be greatly reduced, the structure is simpler, the flexibility and the accuracy are higher, a mathematical model between the measurement power of a power meter and the reflection coefficient of a load to be measured can be established on a given six-port measurement system through a microwave network analysis theory, the mathematical model is the theoretical basis of the six-port reflectometer, the relative power theory of the six ports is the most commonly used method for deriving the mathematical model of the six-port measurement system, and the general equation of any six-port reflectometer is as follows:
according to the analysis of the six-port mathematical model and the geometric model, the six-port reflectometer needs to meet the following design criteria:
1.1, the reference port 4 (directional coupler) is ideally coupled with only the incident wave b2 of the measured piece, but not coupled with the reflected wave a2 of the measured piece, generally the coupling degree of the port is required to be controlled to be about-40 dB, the isolation degree is about-60 dB, and the port is used for sampling the input power of the microwave source, so the stability of the system is directly influenced by the quality of the isolation degree.
1.2, three central points qk of the six-port reflectometer are uniformly distributed, the phase difference is 120 degrees, and the qk distribution directly influences the measurement precision.
The distance from the center of the circle to the origin of 1.3 three circles is 0.5-1.5 and cannot be equal to 1, and qk amplitude influences the dynamic range of the power meter.
2. The dielectric constant measuring device based on the waveguide structure is formed by coupling two paths of microwave transmission lines through a directional coupler, is a four-port microwave component, microwaves input from a main line are coupled to a secondary line in a certain proportion and are only transmitted in one direction, the microwaves which are transmitted in the reverse direction basically do not exist, the directional coupler has multiple forming modes and multiple types, has mature technology and higher measuring precision, the directional coupler is designed by adopting a single-hole coupling method, a hole is formed in a rectangular waveguide, a cuboid metal strip is arranged between the upper edge of the small hole and an upper cover plate and is not contacted with the upper surface and the lower surface, P1 and P2 are respectively input and output of the rectangular waveguide, P3 is a coupling port, the other port is a coupling load, the project designs that a rectangular waveguide is used for six-port reflection timing, and therefore a hole is formed in the wide surface of the rectangular waveguide, microwave is coupled to the strip line through the small hole, then transmitted to the two ends of the strip line to be connected with the coaxial line, and transmitted to the power meter through the coaxial line, so that the waveguide-strip line-coaxial line type directional coupler is formed, and the purposes of greatly reducing the complexity and the cost of the system are achieved.
3. In the dielectric constant measuring device based on the waveguide structure, a BP neural network is a multilayer forward neural network trained based on an error back propagation algorithm (BP algorithm), and structurally, the BP neural network is provided with an input layer, a hidden layer and an output layer; in essence, the BP algorithm is that the square of a network error is used as a target function, a gradient descent method is adopted to calculate the minimum value of the target function, the error propagated each time is reversely propagated from an output layer, weight values of all layers are continuously adjusted through the gradient descent method, a neuron adopts a sigmoid activation function, the nonlinear mapping relation of input and output during network training can be realized, the neural network is applied to deducing a mathematical model between an S parameter and a complex dielectric constant, the application of the technology is not limited by the shape and the physical state of a material to be measured, in addition, the use of the neural network not only greatly simplifies the calculation process, but also has higher accuracy than the traditional formula deduction and approximate value, and the aim of higher accuracy is fulfilled.
4. The dielectric constant measuring device based on the waveguide structure has the advantages that the system measurement in the design needs to realize the function of heating while measuring, if the heating is uneven, the measurement precision can be affected, because the ridge of the ridge waveguide has the capability of focusing an electric field, the ridge waveguide is generally used as a core device for heating and measuring, two ridge surfaces with optimized shapes are added at the upper end and the lower end of the ridge waveguide mainly on the basis of a standard BJ22 waveguide, two cut-off waveguides are respectively positioned at the upper surface and the lower surface and penetrate through the whole waveguide to place a silicon tube, the other two cut-off waveguides at the left side and the right side are used for observing and measuring the temperature of a test sample in a high-temperature environment, and due to the ridge of the ridge waveguide, compared with a common waveguide, the ridge of the ridge waveguide has wider transmission bandwidth, longer cut-off wavelength and smaller characteristic impedance, which is a common advantage in a broadband test system, the microwave heating uniformity can be improved, and the aim of reducing the multi-value problem in the BP neural network by changing the length, the width and the height of the ridge is fulfilled.
Drawings
FIG. 1 is a schematic view of a reflectometer of the present invention;
FIG. 2 is a schematic view of a ridge waveguide structure of the present invention;
FIG. 3 is a schematic view of the overall structure of the present invention;
FIG. 4 is a flow chart of the mathematical calculation structure of the system of the present invention;
FIG. 5 is a schematic flow diagram of a six-port reflectometer configuration of the present invention;
fig. 6 is a schematic structural diagram of the directional coupler of the present invention.
In the figure: 1. a reflectometer; 2. a rectangular waveguide; 3. a third port; 4. a fifth port; 5. port six; 6. a port four; 11. a probe; 12. a directional coupler; 13. a power meter; 14. a coaxial line; 15. a ridge waveguide; 21. cutting off the first waveguide; 22. a second cut-off waveguide; 101. a first port; 102. a second port; 201. a first connecting block; 202. and a second connecting block.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.
Referring to fig. 1-6, a dielectric constant measuring device based on a waveguide structure,
the method comprises the following steps: modeling and simulation analysis are carried out in CST, model structure is adjusted, data reasonability is tested, devices are manufactured according to a simulation model, an experiment platform is built,
step two: firstly, calibrating the reflectometer 1, calculating the calibration constant of the reflectometer 1, wherein four calibration pieces are connected to the load end of the reflectometer 1 at one time, and are respectively a fully matched load and three short-circuit devices with 90-degree phase angle difference, the power of the four power meters 13 is measured, so that the system constant of the calibration pieces is calculated through software, the measurement technology of the reflectometer 1 is used as a microwave measurement technology with earlier origin and relatively mature, the microwave measurement technology has high measurement precision, low manufacturing cost and simple structure, and is rapidly developed, the measurement technology of the reflectometer 1 is used for accurately measuring the reflection coefficient and the phase, a neural network model between a microwave parameter S11 and a complex dielectric constant is obtained by means of a BP neural network of a computer, the complex dielectric constant of a material is further obtained, the introduction of the neural network technology is used, the calculation process is greatly reduced, the structure is simpler, and the flexibility and the accuracy are higher, in a given reflectometer 1 measurement system, a mathematical model between the measurement power of the detection power meter 13 and the reflection coefficient of a load to be measured can be established through a microwave network analysis theory, the mathematical model is the theoretical basis of the reflectometer 1, the relative power theory of the reflectometer 1 is the most commonly used method for deducing the mathematical model of the reflectometer 1 measurement system, and the general equation of any reflectometer 1 is as follows: from the analysis of the mathematical model and the geometric model of the reflectometer 1, the reflectometer 1 needs to satisfy the following design criteria:
1.1, the reference port 4 (directional coupler 12) is ideally coupled with only the incident wave b2 of the tested piece and not coupled with the reflected wave a2 of the tested piece, generally, the coupling degree of the port is required to be controlled to be about-40 dB, the isolation degree is required to be about-60 dB, and the port is used for sampling the input power of a microwave source, so the stability of the system is directly influenced by the quality of the isolation degree,
1.2, three central points qk of the reflectometer 1 are uniformly distributed, the phase difference is 120 degrees, the qk distribution directly influences the measurement precision,
1.3, the distance from the center of the three circles to the origin should be between 0.5 and 1.5 and not equal to 1, qk amplitude affects the dynamic range of the power meter 13,
step three: the microwave source is transmitted through a coaxial line 14, the microwave source is fed into a first port 101 of the reflectometer 1 through a wave co-conversion interface, a second port 102 of the reflectometer 1 is connected with a first connecting block 201 of the ridge waveguide 15 through a flange, a matching load is connected on a second connecting block 202 of the ridge waveguide 15, a double-layer evacuated silicon tube filled with a material to be tested is inserted into a cut-off waveguide along the wide surface of the ridge waveguide 15, three SMA interfaces and a directional coupler 12 are connected with a power meter 13 through the coaxial line 14,
step four: preparing mixed solution with different concentrations, deducing complex dielectric constant of the mixed solution by using a Bruggeman formula, extending an infrared thermometer into an observation hole, putting the solution with different concentrations into a silicon tube for measurement,
step five: reading power through four ports of the reflectometer 1, calculating S parameters of the system by using a general mathematical model and a calibration technology of the reflectometer 1, recording the S parameters corresponding to dielectric constants of different solutions by using a data acquisition card, inputting the obtained data into a neural network as a sample space for network training,
step six: the known complex dielectric constant material is put in again for measurement, the complex dielectric constant of the material is obtained by back-pushing the S parameter, the complex dielectric constant is compared with the actual complex dielectric constant, the calculation flow process of the whole system is shown in figure 4, the directional coupler 12 is formed by coupling two microwave transmission lines and is a four-port microwave component, microwaves input from a main line have a certain proportion and are coupled to a secondary line and only propagate in one direction, and back propagation of the microwaves are basically avoided, the directional coupler 12 has a plurality of forming modes, a plurality of types and mature technology and high measurement precision, the directional coupler 12 is designed by adopting a single-hole coupling method, a hole is formed in the rectangular waveguide 2, a cuboid metal strip is arranged between the upper edge of the small hole and the upper cover plate and is not contacted with the upper and lower surfaces, and P1 and P2 are respectively input and output of the rectangular waveguide 2, p3 is a coupling port, the other port is a coupling load, the project designs the reflectometer 1 by using the rectangular waveguide 2, therefore, the rectangular waveguide 2 is provided with a hole on the wide surface, the microwave is coupled to the strip line through the small hole, then transmitted to the two ends of the strip line to be connected with the coaxial line 14, and transmitted to the power meter 13 through the coaxial line 14, thus forming the waveguide-strip line-coaxial line 14 type directional coupler 12, thereby achieving the purpose of greatly reducing the complexity and the cost of the system,
the BP neural network is a multilayer forward neural network trained based on an error back propagation algorithm (BP algorithm), and structurally, the BP neural network is provided with an input layer, a hidden layer and an output layer; in essence, the BP algorithm calculates the minimum value of an objective function by taking the square of a network error as the objective function and adopting a gradient descent method, the error propagated each time is reversely propagated from an output layer, each layer continuously adjusts the weight by the gradient descent method, a neuron adopts a sigmoid activation function, the nonlinear mapping relation of input and output during network training can be realized, the neural network is applied to derive a mathematical model between an S parameter and a complex dielectric constant, the application of the technology is not limited by the shape and the physical state of a material to be measured, in addition, the use of the neural network not only greatly simplifies the calculation process, but also has higher accuracy than the conventional formula derivation, thereby achieving the purpose of higher accuracy,
the system measurement in design needs to realize the function of heating while measuring, if the heating is uneven, the measurement precision will be affected, because the ridge of the ridge waveguide has the capability of focusing the electric field, therefore, the ridge waveguide is usually used as the core device for heating and measuring, the ridge waveguide is mainly based on the standard BJ22 waveguide, two ridge surfaces with optimized shapes are added at the upper and lower ends, two cut-off waveguides are respectively located at the upper and lower surfaces and penetrate through the whole waveguide to place the silicon tube, the other two cut-off waveguides at the left and right sides are used for observing and measuring the temperature of the test sample under the high temperature environment, because of the ridge waveguide 15, compared with the common waveguide, the ridge waveguide has wider transmission bandwidth, longer cut-off wavelength and smaller characteristic impedance, which is the common advantage in the broadband test system, not only can improve the uniformity of microwave heating, thereby achieving the purpose of reducing the multivalue problem in the BP neural network by changing the length, the width and the height of the ridge,
the device comprises a reflectometer 1, a rectangular waveguide 2 is fixedly installed on the upper surface of the reflectometer 1, a first port 101 is fixedly installed on the side surface of the rectangular waveguide 2, a second port 102 is fixedly installed at one end, far away from the first port 101, of the rectangular waveguide 2, a directional coupler 12 of a waveguide-strip line-coaxial line 14 structure is installed on the wide surface of the rectangular waveguide 2, a fourth port 6 is installed on the upper surface of the directional coupler 12, a coaxial line 14 is fixedly installed on one side of the fourth port 6, a power meter 13 is fixedly installed at one end, far away from the fourth port 6, of the coaxial line 14, a probe 11 is fixedly installed on the side surface of the rectangular waveguide 2, a third port 3 is installed on one side of the probe 11, a fifth port 4 is installed on one side, far away from the fifth port 3, a sixth port 5 is installed on one side, far away from the fifth port 4, and the combination of the third port 3, the fifth port 4 and the sixth port 5 is of the probe 11 structure, one side of the reflectometer 1 is fixedly connected with a ridge waveguide 15, the side of the reflectometer 1 is tangent to the side of the ridge waveguide 15, one side of the ridge waveguide 15 is provided with a first connecting block 201, one end of the ridge waveguide 15 far away from the first connecting block 201 is provided with a second connecting block 202, the reflectometer 1 and the ridge waveguide 15 are both arranged in a rectangle, the reflectometer 1 and the ridge waveguide 15 are fixedly installed through a first connecting block 201 and a second connecting block 202, a first cut-off waveguide 21 is fixedly installed on one side of the ridge waveguide 15, a second cut-off waveguide 22 is fixedly installed on one end, far away from the first cut-off waveguide 21, of the ridge waveguide 15, two sides of the ridge waveguide 15 are a wide surface and a narrow surface, the wide surface of the ridge waveguide 15 is provided with two openings, a first cut-off waveguide 21 is arranged, the narrow surface of the ridge waveguide 15 is also provided with two openings and is provided with a second cut-off waveguide 22, the first cut-off waveguide 21 arranged on the wide surface of the ridge waveguide 15 can measure the temperature, and the second cut-off waveguide 22 installed on the narrow surface of the ridge waveguide 15 observes the morphology of the material.
The working principle is that the reflectometer 1 measuring technology is used as a microwave measuring technology with earlier origin and relatively mature, the measuring precision is high, the manufacturing cost is low, the structure is simple, and the rapid development is achieved, the reflectometer 1 measuring technology is used for accurately measuring the reflection coefficient and the phase, a neural network model between the microwave parameter S11 and the complex dielectric constant is obtained by means of a BP neural network, further the complex dielectric constant of the material is obtained, the introduction of the neural network technology enables the calculation process to be greatly reduced, the structure is simpler, the flexibility and the accuracy are higher, in a given reflectometer 1 measuring system, a mathematical model between the measuring power of a detecting power meter 13 and the reflection coefficient of a load to be measured is established through a microwave network analysis theory, the microwave measuring system is formed by coupling of two microwave transmission lines through a directional coupler 12, and is a four-port microwave component, the microwave input from the main line is coupled to the secondary line in a certain proportion and only propagates in one direction, the microwave basically does not propagate in the reverse direction, the directional coupler 12 has a plurality of forming modes, has mature technology and higher measuring precision, the design adopts a single-hole coupling method to design the directional coupler 12, a hole is formed on the rectangular waveguide 2, a cuboid metal strip is arranged between the upper side of the hole and the upper cover plate, the metal strip is not contacted with the upper surface and the lower surface, P1 and P2 are respectively input and output of the rectangular waveguide 2, P3 is a coupling port, the other port is a coupling load, the rectangular waveguide 2 is used when the reflectometer 1 is designed, therefore, the hole is formed on the wide surface of the rectangular waveguide 2, the microwave is coupled to the strip line through the hole, then transmitted to the two ends of the strip line to be connected with the coaxial line 14 and then transmitted to the power meter 13 through the coaxial line 14, this constitutes a waveguide-stripline-coaxial 14 type directional coupler 12, and due to the ridge of the ridge waveguide 15, the ridge waveguide has a wider transmission bandwidth, a longer cut-off wavelength and a smaller characteristic impedance than a normal waveguide, which is a common advantage in a broadband test system, and improves the uniformity of microwave heating.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. A dielectric constant measuring device based on a waveguide structure, comprising a reflectometer (1), characterized in that: the device comprises a reflectometer (1), a rectangular waveguide (2) is fixedly arranged on the upper surface of the reflectometer (1), a port I (101) is fixedly arranged on the side surface of the rectangular waveguide (2), a port II (102) is fixedly arranged at one end, far away from the port I (101), of the rectangular waveguide (2), a directional coupler (12) of a wide-surface installation waveguide-strip line-coaxial line (14) structure of the rectangular waveguide (2), a port IV (6) is arranged on the upper surface of the directional coupler (12), a coaxial line (14) is fixedly arranged at one side of the port IV (6), a power meter (13) is fixedly arranged at one end, far away from the port IV (6), of the coaxial line (14), a probe (11) is fixedly arranged on the side surface of the rectangular waveguide (2), a port III (3) is arranged on the upper surface of the probe (11), a port V (4) is arranged at one side, far away from the port III (3), of the probe (11), one side that port five (4) were kept away from in probe (11) has seted up port six (5), one side fixedly connected with spine waveguide (15) of reflectometer (1), connecting block one (201) have been seted up to one side of spine waveguide (15), connecting block two (202) have been seted up to one end that spine waveguide (15) kept away from connecting block one (201), one side fixed mounting of spine waveguide (15) has end waveguide one (21), and the one end fixed mounting that spine waveguide (15) kept away from end waveguide one (21) has end waveguide two (22).
2. A waveguide structure-based permittivity measurement device according to claim 1, wherein: the two sides of the ridge waveguide (15) are wide surfaces and narrow surfaces, the wide surfaces of the ridge waveguide (15) are provided with two openings, a first cut-off waveguide (21) is installed, and the narrow surfaces of the ridge waveguide (15) are also provided with two openings and a second cut-off waveguide (22).
3. A waveguide structure-based permittivity measurement device according to claim 1, wherein: the reflectometer (1) and the ridge waveguide (15) are both arranged in a rectangular mode, and the reflectometer (1) and the ridge waveguide (15) are fixedly installed through a first connecting block (201) and a second connecting block (202).
4. A waveguide structure-based permittivity measurement device according to claim 1, wherein: the wide-surface-mounted first cut-off waveguide (21) of the ridge waveguide (15) can be used for measuring the temperature, and the narrow-surface-mounted second cut-off waveguide (22) of the ridge waveguide (15) is used for observing the form of the material.
5. A waveguide structure-based permittivity measurement device according to claim 1, wherein: the sides of the reflectometer (1) are tangent to the sides of the ridge waveguide (15).
6. A waveguide structure-based permittivity measurement device according to claim 1, wherein: and the three ports of the port three (3), the port five (4) and the port six (5) are combined into a probe (11) structure.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115842234A (en) * | 2023-02-14 | 2023-03-24 | 电子科技大学 | Novel coupling mode strip line resonator |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115842234A (en) * | 2023-02-14 | 2023-03-24 | 电子科技大学 | Novel coupling mode strip line resonator |
| CN115842234B (en) * | 2023-02-14 | 2024-03-26 | 电子科技大学 | Strip line resonator |
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