CN114705404A - Automatic testing system of polarization device - Google Patents
Automatic testing system of polarization device Download PDFInfo
- Publication number
- CN114705404A CN114705404A CN202210371362.6A CN202210371362A CN114705404A CN 114705404 A CN114705404 A CN 114705404A CN 202210371362 A CN202210371362 A CN 202210371362A CN 114705404 A CN114705404 A CN 114705404A
- Authority
- CN
- China
- Prior art keywords
- polarization
- testing system
- polarizer
- automated testing
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
Abstract
The invention discloses an automatic testing system of a polarizing device, which comprises a testing light path assembly and an automatic control module, wherein the testing light path assembly comprises a light path module and a light path module; the test optical path assembly is used for testing the polarization response and/or the phase response of the polarization device and is provided with at least one optical lens group, at least one tunable laser module, at least one photoelectric detector and at least one camera; and the automatic control module is provided with at least one adjusting mechanism and is used for driving the at least one optical lens group to rotate to change the orientation of an optical axis and linking the at least one tunable laser module and/or the at least one photoelectric detector and/or the at least one camera. The automatic testing system of the polarization device has the advantages of adjustable wavelength, adjustable power, adjustable polarization state, automatic control and the like, and can realize automatic measurement of polarization response and phase response according to a polarization analysis method and an interference method.
Description
Technical Field
The invention relates to the technical field of photoelectric equipment, in particular to an automatic testing system of a polarizing device.
Background
The wave nature of light can be proved by the phenomena of diffraction, interference, polarization and the like of light, so that the light can be used as a carrier to carry out multi-dimensional regulation and control on amplitude, polarization, phase, frequency and the like in the processes of transmitting, receiving, storing and the like of information. The spatial light modulator is used as a core element for realizing dynamic regulation and control of a light field, and has wide application prospects in the fields of digital holography, mode multiplexing in an optical communication system, laser radar ranging and the like.
Spatial light modulators play an important role, from digital holography to optical communication modules, to in recent years in-vehicle laser radars for autonomous driving, which are hot. The core element of the spatial light modulator is liquid crystal on silicon, which can be classified into an amplitude type and a phase type according to the type. The spatial orientation of liquid crystal molecules is controlled by loading voltage to the pixel unit, and the birefringence characteristic of the liquid crystal can be utilized to regulate and control the phase and polarization of an optical field. The traditional silicon-based liquid crystal spatial light modulator has polarization-dependent optical response, and dynamic regulation and control of a light field are generally realized aiming at single dimensionality. To meet the requirements of practical application, a high-performance liquid crystal on silicon spatial light modulator is important, however, the performance of the device during operation is limited by the non-uniformity of the spatial distribution of liquid crystal molecules: 1) non-uniformity of liquid crystal thickness; 2) the liquid crystal molecules may be distorted under the variation of the applied voltage; 3) the liquid crystal molecules close to the alignment layer are insensitive to variations in the applied voltage.
The silicon-based liquid crystal spatial light modulator as a typical polarizing device has wide adaptability, in order to meet the requirements of practical application, large bandwidth, low power consumption, high efficiency and high integration degree are core problems concerned in the technical field of optoelectronic devices, and the performance of the polarizing device is generally related to physical quantities with multiple dimensions. For the design and performance optimization of the polarizing device, it is very important to face a multi-dimensional, accurate and efficient test scheme.
Disclosure of Invention
The present disclosure provides an automated testing system for polarizing devices for accurate and efficient measurement of polarization and phase responses from multiple dimensions for design and performance optimization of the polarizing devices.
In order to solve the problems, the invention adopts the following technical scheme:
an automatic testing system of a polarization device comprises a testing light path assembly and an automatic control module.
The test optical path assembly is used for testing the polarization response and/or the phase response of the polarization device and is provided with at least one optical lens group, at least one tunable laser module, at least one photoelectric detector and at least one camera.
The automatic control module is provided with at least one adjusting mechanism and is used for driving the at least one optical lens group to rotate to change the orientation of an optical axis and linking the at least one tunable laser module and/or the at least one photoelectric detector and/or the at least one camera.
In an automated testing system for a polarizer according to at least one embodiment of the present disclosure, the at least one optical lens group includes: at least one polarizer, at least one analyzer, and at least one wave plate.
At least one polarizer is used for obtaining linearly polarized light with adjustable polarization state and high linear polarization degree.
And the at least one analyzer is used for keeping parallel or orthogonal with the optical axis of the at least one polarizer to form a parallel or orthogonal polarization analyzing system.
In an automated testing system of a polarization device provided in at least one embodiment of the present disclosure, the wave plate is a quarter wave plate.
At least one embodiment of the present disclosure provides a system for automated testing of a polarizer device, wherein the polarizer comprises a half-wave plate and a first linear polarizer.
In an automated testing system for a polarizer provided by at least one embodiment of the present disclosure, the analyzer is a second linear polarizer
At least one embodiment of the present disclosure provides an automated testing system for a polarization device, wherein the testing optical path assembly further includes at least one polarization controller, at least one collimator mirror, at least one third linear polarizer, at least one lens group, at least one beam splitter, and at least one mirror.
At least one embodiment of this disclosure provides an automated testing system for a polarization device, further including: an optical 4F system; the lens group is used for changing the size of a light spot passing through the collimating mirror through the optical 4F system.
At least one embodiment of the present disclosure provides the automated testing system of the polarization device, wherein the second linear polarizer is further configured to move to the back of the beam splitter through the adjusting mechanism, and to be polarized in parallel with the optical axis orientation of the first linear polarizer, so that the object light with small angle incidence can be reflected by the sample and then collected by the photodetector to measure the polarization response.
At least one embodiment of this disclosure provides an automated testing system for a polarization device, further including: a terminal; and the test light path assembly and the automatic control module are electrically connected with the terminal.
The invention has the beneficial effects that: the polarization response measuring device has the advantages of adjustable wavelength, adjustable power, adjustable polarization state, automatic control and the like, and can realize automatic measurement of polarization response and phase response according to a polarization analysis method and an interference method. The automatic testing system and the method thereof can accurately and efficiently realize comprehensive testing of the performance of the polarizer from multiple dimensions (such as wavelength, polarization and voltage), such as parameter indexes of polarization conversion efficiency, insertion loss, phase modulation amount, polarization-related loss and the like, and indicate the relation between the polarization conversion efficiency and the phase modulation amount, and have important significance for design and performance optimization of the polarizer.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of an automated testing system for a polarizer.
FIG. 2 is a schematic diagram of a test optical path of a polarizer at normal incidence.
FIG. 3 is a schematic diagram of a test light path of a polarizer under a small angle of incidence.
FIG. 4 shows the results of the orientation test at different wavelengths.
FIG. 5 shows the polarization conversion efficiency test results at different wavelengths.
FIG. 6 shows the polarization conversion efficiency test results at different wavelengths and gray levels.
FIG. 7 shows the phase modulation test results of 1550nm wavelength and different gray scale down-calibration.
Fig. 8 shows the insertion loss test results at different wavelengths and gray levels for a 0 degree deflection angle.
FIG. 9 shows the insertion loss test results at different wavelengths and gray levels for a 90 degree skew angle.
FIG. 10 shows the phase modulation test results of the interferometry at 1550nm wavelength and different gray levels.
Fig. 11 shows the insertion loss test results at different wavelengths and angles of incidence at small angles.
FIG. 12 shows the polarization dependent loss test results at different wavelengths at low angle incidence.
FIG. 13 is a schematic diagram of an automated testing system for a polarizer device.
In the figure:
10. testing the optical path assembly; 101. a tunable laser module; 102. a polarization controller; 103. a collimating mirror; 104. a lens group; 105. a first polarizing plate; 106. a second polarizing plate; 107. a third polarizing plate; 108. a half-wave plate; 109. a quarter wave plate; 110. a beam splitter; 111. a mirror; 112. a detection mechanism;
20. an automation control module; 201. an electric rotating table; 202. a voltage source;
30. a PC terminal;
40. and (3) sampling.
Detailed Description
The technical solutions in the embodiments will be clearly and completely described below with reference to the drawings in the embodiments, and it is obvious that the described embodiments are only a part of the embodiments, and not all of the embodiments.
In the embodiments, it should be understood that the terms "middle", "upper", "lower", "top", "right", "left", "above", "back", "middle", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description, and do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Unless otherwise defined, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this disclosure belongs. The use of "first," "second," and similar terms in this disclosure is not intended to indicate any order, quantity, or importance, but rather is used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items.
In addition, in the description of the present invention, it should be noted that unless otherwise explicitly stated or limited, terms such as installation, connection, and connection, etc., are to be interpreted broadly, e.g., as being fixed or detachable or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
At least one embodiment of the present disclosure provides an automated testing system for a polarization device, including a testing optical path assembly, an automated control module, and a PC terminal. The test light path assembly comprises a tunable laser module, a polarization controller, a collimating mirror, a lens group, a first polaroid, a second polaroid, a third polaroid, a half-wave plate, a quarter-wave plate, a beam splitter, a reflecting mirror, a photoelectric detector and a CCD camera; the automatic control module comprises an electric rotating platform, a rotation controller and a voltage source, the electric rotating platform is controlled to change the optical axis orientations of the first polarizing film, the second polarizing film and the quarter-wave plate, and the tunable laser module, the electric rotating platform, the rotation controller, the voltage source, the photoelectric detector and the CCD camera are linked to complete automatic collection of optical power and images. The voltage source is used to apply an alternating voltage and serves as a signal generator or a driving device for the spatial light modulator.
The polarization and analysis system can be built by utilizing the combination of the wave plate and the polaroid, the wavelength and voltage can be adjusted, the orthogonal polarization and parallel polarization analysis system can be rotated and the optical power can be collected by linking the tunable laser module, the electric rotating platform, the rotating controller, the voltage source and the photoelectric detector, and the automatic measurement of polarization response can be realized from multiple dimensions (such as wavelength, polarization and voltage); the method comprises the steps of firstly dividing light into two paths by utilizing a beam splitter, enabling object light to pass through a sample, enabling reference light to pass through a quarter-wave plate and a reflector, enabling the two paths of light to pass through the beam splitter again after being reflected to form interference fringes, adjusting wavelength and voltage, rotating an orthogonal polarization analysis system or a parallel polarization analysis system and collecting interference patterns by linkage of a tunable laser module, an electric rotating platform, a rotary controller, a voltage source and a CCD camera, and achieving automatic measurement of phase response from multiple dimensions (such as wavelength, polarization and voltage).
The automatic test system can accurately and efficiently realize comprehensive test of the performance of the polarizer from multiple dimensions (such as wavelength, polarization and voltage), such as parameter indexes of polarization conversion efficiency (PCR), Insertion Loss (IL), phase modulation amount (delta), Polarization Dependent Loss (PDL) and the like.
To understand the relationship between the polarization conversion efficiency and the phase modulation amount, the birefringence characteristics of the polarizing device were considered and the following rotated jones matrix was constructed:
in this case, the angle between the optical axis of the birefringent molecule and the x-axis is θ, and φ is AL-ASexp(iδ)，ALAnd ASRespectively, represents the amplitude response along the major and minor axes of the birefringent molecule, δ (δ ═ Φ)S-φL) Representing the phase difference in response along the long and short axes of the birefringent molecules. Consider that the amplitude response is equal (A)L＝ASA), the response of the parallel and orthogonal analyzer systems can be expressed as:
according to equation (4), in the orthogonal polarization analysis system, regardless of the complex amplitude response along the major and minor axes of the birefringent molecules, when θ is n pi/2 (n is an integer, and the optical axis of the analyzer is parallel to or orthogonal to the optical axis of the birefringent molecules), the optical power appears at a minimum, and the orientation of the birefringent molecules can be considered as the value of θ at which the optical power appears at a minimum under orthogonal polarization detection. At this time, the polarization conversion efficiency (PCR, unit: dB) can be expressed as:
PCR(θ)＝10log[Pouty(θ)]-10log[Poutx(θ)]；
(5)
when θ is (2n +1) pi/4 (n is an integer, and the optical axis of the analyzer makes an angle of 45 degrees or 135 degrees with the optical axis of the birefringent molecule), the polarization conversion efficiency exhibits a maximum value and can be expressed as:
the relation between the polarization conversion efficiency (PCR) and the phase difference (δ) can be obtained from the equation (7), and both the polarization conversion efficiency and the phase difference vary with the wavelength and the voltage, and thus the relation between the polarization conversion efficiency (PCR) and the phase modulation amount (Δ δ) can be obtained.
The combination of the tunable laser module, the polarization controller, the collimating mirror and the linear polarizer is used for obtaining linearly polarized light with adjustable wavelength, adjustable power and high linear polarization degree.
The lens group is used for changing the size of a light spot passing through the collimating mirror through a 4F system.
The combination of the half-wave plate and the first polaroid is used as a polarizer for obtaining linearly polarized light with adjustable polarization state and high polarization degree.
The second linear polarizer is used as an analyzer, and the object light reflected by the sample passes through the beam splitter and the analyzer and then is collected by the photoelectric detector to obtain the optical power.
The light is divided into two paths by the beam splitter, the polarization state of the reference light is changed by the combination of the quarter-wave plate and the reflector, the object light reflected by the sample is interfered with the reference light after passing through the beam splitter and the analyzer, and an interference image is collected by the CCD camera.
The second linear polaroid can move to the back of the beam splitter, is parallel to the optical axis orientation of the first linear polaroid in front of the beam splitter and serves as a polarizer, and when the object light is incident at a small angle, the object light is reflected by the sample and then the light power is collected by the photoelectric detector.
The scheme of the disclosure is further described below by taking a liquid crystal on silicon spatial light modulator as an example and combining the drawings in the specification.
As shown in fig. 1 and fig. 2, an automated testing system and method for a polarization device includes a testing optical path assembly 10, an automated control module 20 and a PC terminal; the test optical path assembly 10 comprises a tunable laser module 101, a polarization controller 102, a collimating mirror 103, a first polarizer 105, a second polarizer 106, a third polarizer 107, a lens group 104, a half-wave plate 108, a beam splitter 110, a detection mechanism 112, a quarter-wave plate 109 and a reflecting mirror 111; the detection mechanism 112 includes a photodetector and a CCD camera. The automatic control module includes an electric turntable 201, a rotation controller (not shown), and a voltage source 202. The automatic control module 20 establishes connection of the tunable laser module 101, the electric rotating table 201, the rotation controller, the voltage source 202, the photodetector and the CCD camera at the PC terminal by using Python, controls the first polarizer 105, the second polarizer 106, the half-wave plate 108 and the quarter-wave plate 109 through the electric rotating table 201, and completes automatic collection of optical power and images by linking the tunable laser module 101, the electric rotating table 201, the rotation controller, the voltage source 202, the photodetector and the CCD camera.
More specifically, linearly polarized light with adjustable wavelength, adjustable power and high linear polarization is obtained through the tunable laser module 101, the polarization controller 102, the collimating mirror 103 and the third polarizer 107, and the size of the light spot is changed through the lens group 104.
More specifically, the half-wave plate 108 and the first linear polarizer are controlled by the electric rotating platform 201 and are used as polarizers, and linear polarized light with adjustable polarization state and high linear polarization degree is obtained.
More specifically, the second linear polarizer is controlled by the electric rotating table 201 and acts as an analyzer, so that the second linear polarizer is parallel or orthogonal to the optical axis of the polarizer, thereby forming a parallel or orthogonal analyzing system.
More specifically, the tunable laser module 101, the electric rotary table 201, the rotary controller and the photodetector are linked, the parallel polarization analyzing system and the orthogonal polarization analyzing system are rotated, and the test results of the liquid crystal orientation and polarization conversion efficiency at different wavelengths can be obtained by collecting the optical power through the photodetector, as shown in fig. 4 and 5. When the optical axis of the analyzer is parallel or orthogonal to the optical axis of the liquid crystal, the optical power (unit: dBm) appears minimum; when the angle between the optical axis of the analyzer and the optical axis of the liquid crystal is 45 or 135 degrees, the polarization conversion efficiency (PCR, unit: dB) becomes maximum.
More specifically, the tunable laser module 101, the electric rotating table 201, the rotation controller, the voltage source 202, and the photodetector are linked, the polarization angles are set to 45 degrees and 135 degrees according to the orientation test result, different gray scales are loaded to the liquid crystal on silicon spatial light modulator under the parallel and orthogonal polarization analyzing systems, and the polarization conversion efficiency test result under different wavelengths and gray scales can be obtained by collecting the optical power through the photodetector, as shown in fig. 6. The polarization conversion efficiency (PCR, unit: dB) is defined as the difference between the optical power in orthogonal and parallel polarization analysis. After liquid crystal is modulated twice, when the phase difference meets odd times of pi, the polarization conversion efficiency has the maximum value; when the phase difference satisfies an even multiple of pi, the polarization conversion efficiency takes a minimum value. As the gray scale increases, the polarization conversion efficiency successively has a maximum value and a minimum value and finally returns to the vicinity of the initial value, which indicates that the phase difference has changed by 2 pi. Taking 1550nm wavelength as an example, the phase difference under different gray scales is calculated according to the formula (7), and the minimum value and the maximum value of the phase difference are taken as reference points of 0 and pi, so that the phase modulation amount test result of the polarization analysis method under 1550nm wavelength and different gray scales can be obtained, as shown in fig. 7.
More specifically, the tunable laser module 101, the electric rotary table 201, the rotary controller, the voltage source 202 and the photodetector are linked, the polarization angle is set to be 0 degree and 90 degrees according to the orientation test result, different gray scales are loaded to the silicon-based liquid crystal spatial light modulator under the parallel and orthogonal polarization analysis systems, and the optical power is collected through the photodetector. Referring to the mirror 111, the insertion loss test results at different wavelengths and gray levels can be obtained by collecting the optical power according to the above steps, as shown in fig. 8 and 9. The insertion loss (IL, unit: dB) is defined as the difference between the total optical power after passing through the mirror 111 and the sample 40, which is the sum of the optical power in the parallel and orthogonal analyzer systems. Due to interface reflection caused by mismatching of refractive indexes among air, the glass cover plate and the liquid crystal layer, after linearly polarized light oriented along the long axis of the liquid crystal (0 degree) is modulated by liquid crystals under different wavelengths and gray scales, the insertion loss change is obvious; linearly polarized light aligned along the long axis of the liquid crystal (90 degrees) undergoes liquid crystal modulation at different wavelengths, and the insertion loss changes significantly.
More specifically, the tunable laser module 101, the electric rotating table 201, the rotation controller, the voltage source 202, and the CCD camera are linked, the wavelength is set to 1550nm, the polarization angle is set to 0 degree and 90 degrees according to the orientation test result, and the orientation angle of the quarter-wave plate 109 is set to 0 degree. The beam splitter 110 is used to split the light into two paths, wherein the object light passes through the liquid crystal on silicon spatial light modulator, the reference light passes through the quarter-wave plate 109 and the mirror 111, and the two paths of light are reflected and then pass through the beam splitter 110 again to form interference fringes. The interference fringes move when different gray scales are loaded to the LCOS spatial light modulator under parallel and orthogonal polarization analyzing systems, and the phase modulation amount test result of the interference method under different gray scales with 1550nm wavelength can be obtained by collecting the interference patterns through a CCD camera, as shown in FIG. 10. The amount of phase modulation changes by 2 pi for each shift of the dark interference fringe by one cycle.
More specifically, an automated testing system for a polarizer under small-angle incidence is implemented by the following steps:
the half-wave plate 108 and the first linear polarizer are controlled by the electric rotating platform 201 to obtain linearly polarized light with adjustable polarization state and high linear polarization degree, then the second linear polarizer is moved to the beam splitter 110, and the first polarizer 105 and the second polarizer 106 are controlled by the electric rotating platform 201 to be used as polarizers, so that the optical axes of the polarizers are kept parallel.
In the specific implementation process, the tunable laser module 101, the electric rotating platform 201, the rotating controller and the photoelectric detector are linked, the polarizer is rotated, the object light is reflected by the silicon-based liquid crystal spatial light modulator when the object light is incident at a small angle, and then the photoelectric detector is used for collecting the light power. Referring to the reflector 111, the insertion loss and polarization dependent loss test results at different wavelengths and polarization angles can be obtained by collecting the optical power according to the above steps, as shown in fig. 11 and 12. The insertion loss (IL, unit: dB) is defined as the difference between the total optical power after passing through the mirror 111 and the sample 40, and the polarization dependent loss (PDL, unit: dB) is defined as the maximum difference in insertion loss for different polarization states. The scheme adopts the combination of 3 polarization states to analyze the polarization-dependent loss: linearly polarized light of all angles; linearly polarized light of 0 to 180 degrees; the results of linearly polarized light of specific angles such as 0 degrees, 45 degrees, 90 degrees, and 135 degrees were found to be approximately equal, indicating that the polarization dependent loss is mainly due to the difference in amplitude response between the liquid crystal major and minor axes (0 degrees and 90 degrees).
In the description herein, references to the description of the term "present embodiment," "some embodiments," "other embodiments," or "specific examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Although embodiments of the present application have been shown and described above, the scope of the present invention is not limited thereto, and any changes or substitutions that are not thought of through the inventive work should be included within the scope of the present invention; no element, act, or instruction used herein should be construed as critical or essential unless explicitly described as such.
Claims (10)
1. An automated testing system for a polarizing device, comprising:
the test light path assembly is used for testing the polarization response and/or the phase response of the polarization device and is provided with at least one optical lens group, at least one tunable laser module, at least one photoelectric detector and at least one camera; and
and the automatic control module is provided with at least one adjusting mechanism and is used for driving the at least one optical lens group to rotate to change the orientation of an optical axis and linking the at least one tunable laser module and/or the at least one photoelectric detector and/or the at least one camera.
2. The system of claim 1, wherein the at least one optical lens group comprises:
at least one polarizer for obtaining linearly polarized light with adjustable polarization state and high linear polarization degree;
the at least one analyzer is used for keeping parallel or orthogonal with the optical axis of the at least one polarizer to form a parallel or orthogonal polarization analyzing system; and
at least one wave plate.
3. The automated testing system of a polarizing device of claim 2 wherein the wave plate is a quarter wave plate.
4. The automated testing system of claim 3, wherein the polarizer comprises a half-wave plate and a first linear polarizer.
5. The automated testing system of claim 4, wherein the analyzer is a second linear polarizer.
6. The automated testing system of a polarizing device of claim 5, wherein the test light path assembly further comprises at least one polarization controller, at least one collimating mirror, at least one third line polarizer, at least one lens set, at least one beam splitter, and at least one mirror.
7. The automated testing system of a polarizing device of claim 6, further comprising:
an optical 4F system;
the lens group is used for changing the size of a light spot passing through the collimating mirror through the optical 4F system.
8. The automated testing system of claim 6, wherein the second linear polarizer is further configured to be moved by the adjustment mechanism behind the beam splitter and to be polarized in parallel with the optical axis orientation of the first linear polarizer, such that the object light incident at a small angle can be reflected by the sample and collected by the photodetector to measure the polarization response.
9. The automated testing system of a polarizing device of claim 1, further comprising:
a terminal;
and the test light path assembly and the automatic control module are electrically connected with the terminal.
10. The automated testing system of a polarizing device of claim 1, wherein the automated control module further comprises: a voltage source.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210371362.6A CN114705404A (en) | 2022-04-11 | 2022-04-11 | Automatic testing system of polarization device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210371362.6A CN114705404A (en) | 2022-04-11 | 2022-04-11 | Automatic testing system of polarization device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114705404A true CN114705404A (en) | 2022-07-05 |
Family
ID=82172527
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210371362.6A Pending CN114705404A (en) | 2022-04-11 | 2022-04-11 | Automatic testing system of polarization device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114705404A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117193261A (en) * | 2023-10-13 | 2023-12-08 | 华南师范大学 | Polarization controller performance test method, system and device |
-
2022
- 2022-04-11 CN CN202210371362.6A patent/CN114705404A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117193261A (en) * | 2023-10-13 | 2023-12-08 | 华南师范大学 | Polarization controller performance test method, system and device |
| CN117193261B (en) * | 2023-10-13 | 2024-04-02 | 华南师范大学 | Polarization controller performance test method, system and device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN203365108U (en) | Common-path interference measurement device for generated optical aberration of liquid-crystal spatial light modulator | |
| CN101556386B (en) | Interference type double-imaging measurement device for multi-parameters of liquid crystal spatial light modulator | |
| WO2015101352A1 (en) | Optical polarisation modulation and detection apparatus and detection method | |
| CN108692663A (en) | Phase modulation-type cross-polarization Laser feedback grating interferometer and its measurement method | |
| EP1200796A1 (en) | Birefringement interferometer | |
| CN101183043A (en) | Optical phase put-off precision measurement method and system thereof | |
| CN112731694B (en) | Liquid crystal optical phase shift detection system and detection method based on interference method | |
| CN111208067A (en) | Spectrum-polarization imaging measurement system | |
| CN114705404A (en) | Automatic testing system of polarization device | |
| CN111272284A (en) | Large-caliber laser polarization characteristic measuring instrument | |
| US11656484B2 (en) | Voltage-tunable polarizer | |
| CN112461381B (en) | Device for measuring orbital angular momentum spectrum of vortex light beam | |
| CN201149541Y (en) | Optical phase defer precision measurement system | |
| CN113533254A (en) | Testing device and testing method for birefringence of optical material | |
| Niu et al. | Phase modulation characteristics analysis of liquid crystal spatial light modulator under oblique incidence | |
| CN204855372U (en) | Heavy -calibre uniaxial crystal refracting index homogeneity measuring device | |
| Okabe et al. | Error-reduced channeled spectroscopic ellipsometer with palm-size sensing head | |
| CN110631805A (en) | Device and method for measuring performance of broadband wave plate by using AOTF monochromatic light | |
| CN116297228A (en) | Phase compensation ultrasensitive polarization interferometer | |
| CN106896546B (en) | method for improving diffraction efficiency of nematic liquid crystal light modulation device | |
| CN102519712B (en) | One-eighth wave plate phase retardation measurer and measuring method | |
| Fukuchi et al. | Oblique-incidence characteristics of a parallel-aligned nematic-liquid-crystal spatial light modulator | |
| KR102430925B1 (en) | Thickness and property measurement system of thin film using spatial light modulator | |
| CN201464161U (en) | Multi-light source phase delay device measuring system | |
| CN203274918U (en) | Adjustable wave plate type polarization interference image spectrometer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |