CN114677049A

CN114677049A - Detection equipment process detection method and device and computer equipment

Info

Publication number: CN114677049A
Application number: CN202210427985.0A
Authority: CN
Inventors: 马继扬; 韩传云; 李维维
Original assignee: Suzhou HYC Technology Co Ltd
Current assignee: Suzhou HYC Technology Co Ltd
Priority date: 2022-04-22
Filing date: 2022-04-22
Publication date: 2022-06-28

Abstract

The invention relates to the technical field of automation control, and particularly discloses a method, a device and computer equipment for detecting equipment process, wherein the method comprises the following steps: acquiring first detection data of an electronic product fed back by an effective detection station on detection equipment; according to the preset number of the products to be sampled and inspected, obtaining recheck data of a plurality of inspected electronic products at the effective inspection station to form second inspection data; and determining an adjusting mode of the effective detection station state according to the process detection result output by the first detection data and the second detection data. The method can adjust the state of the effective detection station in time, ensure the stable operation of the detection equipment and improve the detection accuracy of the electronic product; the sampling inspection frequency of the electronic product to be sampled and inspected on each effective detection station is ensured to be preset, the effective detection stations of the sampled and inspected electronic product are convenient to track, and the corresponding relation between the first detection data and the second detection data can be rapidly and accurately positioned.

Description

Detection equipment process detection method and device and computer equipment

Technical Field

The disclosure relates to the technical field of automation control, in particular to a method and a device for detecting equipment process and computer equipment.

Background

With the development of the automatic control technology, the automatic detection technology appears in the field of electronic product testing, so that the electronic product testing is more convenient, intelligent and efficient. Especially to electronic products such as display module assembly, display module assembly plays more and more important role in the life. The production of the display module requires a plurality of complicated processes, and various defects may be generated in the production process, so that the quality detection is also important. Before leaving the factory, the display module needs to be subjected to various detections by detection equipment, such as electric detection, Mura detection, AOI detection, appearance detection, aging test and the like, so as to achieve the purpose of determining the product as a qualified product. In order to ensure the stability of the automatic detection equipment, the process inspection of the detection equipment is very important.

In the prior art, a process inspection mode of manually performing sampling inspection on each batch of electronic products is often adopted, and during station verification, the sampling inspection is mainly performed on the products detected by each machine manually. However, since the electronic products are mixed together after automatic detection, which station is the product detected cannot be distinguished, and therefore, each electronic product needs to be subjected to manual code scanning and judgment for spot inspection, and is excessively dependent on manual detection of the electronic product, so that the detection flow efficiency is low, and the detection accuracy is to be further improved.

Disclosure of Invention

In view of the above, it is necessary to provide a process inspection method, apparatus, computer device, storage medium and computer program product for detecting device.

In a first aspect, the present disclosure provides a process check method for a process of a piece of instrumentation. The method comprises the following steps:

acquiring first detection data of an electronic product fed back by an effective detection station on detection equipment;

according to the preset number of the products to be sampled and inspected, obtaining recheck data of a plurality of inspected electronic products at the effective inspection station to form second inspection data;

and determining an adjusting mode of the effective detection station state according to the process detection result output by the first detection data and the second detection data.

In one embodiment, the acquiring first detection data of the electronic product fed back by the effective detection station on the detection device includes:

moving the electronic product from a detection flow line into the effective detection station;

acquiring first product information of the electronic product;

the detection equipment is instructed to detect the electronic product on the effective detection station, the first detection data are obtained, the first product information is updated according to the first detection data and the effective detection station information, and second product information is generated;

and moving the electronic product which is detected on the effective detection station into the detection flow line.

In one embodiment, the obtaining reinspection data of a plurality of inspected electronic products at the effective inspection station according to the preset number of the products to be sampled to form second inspection data includes:

moving the electronic product which completes the detection of the effective detection station into a sampling area from a detection flow line;

acquiring the second product information of the electronic product; the second product information comprises an effective detection station number corresponding to the electronic product, and the accumulated sampling inspection times of the electronic product on the effective detection station corresponding to the effective detection station number are acquired according to the second product information;

indicating to perform recheck on the electronic product of which the accumulated sampling frequency is smaller than a preset sampling frequency in the sampling inspection area so as to acquire second detection data of the electronic product; and moving the electronic product of which the accumulated sampling times are equal to the preset sampling times in the sampling inspection area to the detection flow line.

In one embodiment, the obtaining first detection data of the electronic product fed back by the effective detection station on the detection device comprises:

receiving a starting instruction of process inspection, and assigning a process inspection enabling mark as yes;

performing feeding operation on an electronic product to obtain first product information of the fed electronic product; the first product information includes a process inspection completion flag;

in the case that the process check completion flag is yes, transmitting an inquiry request whether to confirm starting of the process check;

and receiving a confirmation instruction aiming at the inquiry request, and modifying the process inspection completion mark to be no.

In one embodiment, the method further comprises:

and displaying the serial number of the detection station, the sampling inspection completion mark of the detection station, the process inspection starting mark, the process inspection completion mark, the preset sampling inspection times and the accumulated sampling inspection times through a first display interface.

In one embodiment, the method further comprises:

and displaying the selective examination state, the detection station number, the preset selective examination times and the accumulated selective examination times through a second display interface.

In one embodiment, the instructing rechecking the electronic product in which the accumulated number of the spot checks in the spot check area is less than a preset number of the spot checks includes:

judging the magnitude of the accumulated sampling inspection times and the preset sampling inspection times according to the serial number of the effective detection station and the accumulated sampling inspection times of the effective detection station;

and when the accumulated random inspection times are smaller than the preset random inspection times, receiving a random inspection confirmation instruction, and accumulating the one-time random inspection times for the effective detection stations with the accumulated random inspection times smaller than the preset random inspection times.

In one embodiment, the method further comprises:

and under the condition that the accumulated sampling times of all the effective detection stations are equal to the preset sampling times, modifying the process inspection completion mark of the electronic products of the batch corresponding to the electronic products to be yes.

In a second aspect, the present disclosure also provides a process inspection device for inspection equipment. The device comprises:

the detection station module is used for acquiring first detection data of the electronic product fed back by an effective detection station on the detection equipment;

the sampling inspection module is used for acquiring rechecking data of a plurality of inspected electronic products at the effective inspection station according to the preset sampling inspection product number to form second inspection data;

and the output module is used for determining an adjustment mode of the effective detection station state according to the process detection result output by the first detection data and the second detection data.

In one embodiment, the inspection station module comprises:

the first transfer unit is used for transferring the electronic product from the detection flow line to the effective detection station;

the first information acquisition unit is used for acquiring first product information of the electronic product;

the first detection data unit is used for indicating the detection equipment to detect the electronic product on the effective detection station, acquiring the first detection data, updating the first product information according to the first detection data and the effective detection station information, and generating second product information;

the first transfer unit is also used for transferring the electronic product which is detected on the effective detection station into the detection flow line.

In one embodiment, the spot check module comprises:

the second transfer unit is used for transferring the electronic product which is detected by the effective detection station into a sampling detection area from a detection flow line;

the second information acquisition unit is used for acquiring the second product information of the electronic product; the second product information comprises effective detection station numbers corresponding to the electronic products, and the accumulated random inspection times of the electronic products on the effective detection stations corresponding to the effective detection station numbers are obtained according to the second product information;

the second detection data unit is used for indicating the rechecking of the electronic product of which the accumulated sampling frequency is less than the preset sampling frequency in the sampling area so as to acquire second detection data of the electronic product;

the second transferring unit is further configured to move the electronic product in the spot check area, where the accumulated spot check times are equal to a preset spot check time, to the detection flow line.

In one embodiment, the apparatus further comprises:

the starting module is used for receiving a starting instruction of process inspection, and the assignment process inspection starting mark is positive;

the product information module is used for carrying out feeding operation on the electronic product to obtain first product information of the fed electronic product; the first product information includes a process inspection completion flag;

the inquiry module is used for sending an inquiry request for confirming whether the process inspection is started or not under the condition that the process inspection completion mark is positive;

and the completion marking module is used for receiving a confirmation instruction aiming at the inquiry request and modifying the process inspection completion mark to be negative.

In one embodiment, the apparatus further comprises:

and the first display module is used for displaying the detection station number, the detection station spot check completion mark, the process check starting mark, the process check completion mark, the preset spot check times and the accumulated spot check times through a first display interface.

In one embodiment, the apparatus further comprises:

and the second display module is used for displaying the sampling inspection state, the detection station number, the preset sampling inspection times and the accumulated sampling inspection times through a second display interface.

In one embodiment, the second detection data unit includes:

the judging unit is used for judging the size of the accumulated sampling inspection times and the preset sampling inspection times according to the serial number of the effective detection station and the accumulated sampling inspection times of the effective detection station;

and the accumulation unit is used for receiving a sampling inspection confirmation instruction when the accumulated sampling inspection times are smaller than the preset sampling inspection times, and accumulating the sampling inspection times for one time for effective detection stations with the accumulated sampling inspection times smaller than the preset sampling inspection times.

In one embodiment, the apparatus further comprises:

and the mark updating module is used for modifying the process inspection completion mark of the electronic product of the batch corresponding to the electronic product into yes under the condition that the accumulated sampling times of all the effective detection stations are equal to the preset sampling times.

In a third aspect, the present disclosure also provides a computer device. The computer device comprises a memory and a processor, wherein the memory stores a computer program, and the processor realizes the steps of the detection device process inspection method when executing the computer program.

In a fourth aspect, the present disclosure also provides a computer-readable storage medium. The computer-readable storage medium has stored thereon a computer program which, when being executed by a processor, carries out the steps of the above-mentioned method for process inspection of a test device.

In a fifth aspect, the present disclosure also provides a computer program product. The computer program product comprises a computer program which, when executed by a processor, implements the steps of the above-described process inspection method for a test device.

The detection equipment process inspection method, the detection equipment process inspection device, the computer equipment, the storage medium and the computer program product at least have the following beneficial effects:

according to the method, the electronic product with preset times is subjected to spot inspection on each effective detection station, the running state of the effective detection station is judged according to the first detection data and the second detection data of the spot-inspected electronic product, the adjusting mode of the state of the effective detection station is determined, the state of the effective detection station can be adjusted in time, the stable running of detection equipment is ensured, and the detection accuracy of the electronic product is improved; the method has the advantages that the electronic products to be subjected to spot inspection on each effective detection station are ensured to be preset for the number of times of spot inspection, the effective detection stations of the electronic products to be subjected to spot inspection are convenient to track, and the corresponding relation between the first detection data and the second detection data and the effective detection stations corresponding to the first detection data and the second detection data can be rapidly and accurately positioned; the detection process is intelligent, and the normal operation of the detection flow line is not influenced.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments or the conventional technologies of the present disclosure, the drawings used in the descriptions of the embodiments or the conventional technologies will be briefly introduced below, it is obvious that the drawings in the following descriptions are only some embodiments of the present disclosure, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a diagram of an exemplary process verification method for a process monitoring device;

FIG. 2 is a schematic flow chart diagram illustrating a process check method for a test fixture in one embodiment;

FIG. 3 is a flow diagram illustrating a process check method for a test fixture, according to one embodiment;

FIG. 4 is a flow diagram illustrating a process check method for a test fixture, according to one embodiment;

FIG. 5 is a schematic diagram of an exemplary embodiment of an electronic product flow detection process;

FIG. 6 is a flow diagram illustrating a process check method for a test fixture, according to one embodiment;

FIG. 7 is a diagram of a first display interface in one embodiment;

FIG. 8 is a schematic diagram of a first display interface in one embodiment;

FIG. 9 is a diagram of a second display interface in one embodiment;

FIG. 10 is a flow diagram illustrating a process check-out method for a test fixture, according to one embodiment;

FIG. 11 is a diagram of a second display interface in one embodiment;

FIG. 12 is a block diagram of the process inspection device of the inspection apparatus in one embodiment;

FIG. 13 is a block diagram of the process inspection device of the inspection apparatus in one embodiment;

FIG. 14 is a block diagram of the process inspection device of the inspection apparatus in one embodiment;

FIG. 15 is a block diagram of an embodiment of a process challenge device for a test fixture;

FIG. 16 is a block diagram showing the construction of a process inspection device for a test apparatus according to one embodiment;

FIG. 17 is a block diagram showing an internal configuration of a computer device according to an embodiment.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. The terminology used herein in the description of the disclosure is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure.

It should be noted that the terms "first," "second," and the like in the description and claims of the present disclosure and in the above-described drawings are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the disclosure described herein are capable of operation in sequences other than those illustrated or otherwise described herein. The implementations described in the exemplary embodiments below do not represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present disclosure, as detailed in the appended claims. The terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, the presence of additional identical or equivalent elements in a process, method, article, or apparatus that comprises the recited elements is not excluded. For example, if the terms first, second, etc. are used to denote names, they do not denote any particular order.

As used herein, the singular forms "a", "an" and "the" may include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises/comprising," "includes" or "including," etc., specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof. Also, in this specification, the term "and/or" includes any and all combinations of the associated listed items.

The detection device process inspection method provided by the embodiment of the application can be applied to the application environment shown in fig. 1. Wherein the terminal 102 communicates with the execution device 104 through a wired or wireless connection. The data storage system may store data that the terminal 102 needs to process. The data storage system may be integrated on the terminal 102, or may be placed on the cloud or other network server. The terminal 102 may be, but is not limited to, various industrial computers, industrial control cabinets, personal computers, notebook computers, smart phones, tablet computers, internet of things devices, and portable wearable devices. The execution apparatus 104 may include a transfer assembly 1042 for receiving an instruction from the terminal 102 to transfer a product. The execution device 104 may further include an image capturing apparatus 1044 for receiving an instruction of the terminal 102 to capture image information. The method can be applied to the occasion of detecting the equipment process inspection, and the detection equipment process inspection (IPQC for short) is a round inspection among all working procedures in the production process or the detection process. When electronic products need to carry out various detections before leaving the factory, such as electric detection, Mura detection, AOI detection, appearance detection, aging test and the like, the different detections can be carried out by setting corresponding detection equipment on the same detection line and sequentially carrying out the detections according to a certain sequence.

In some embodiments of the present disclosure, as shown in fig. 2, a method for checking a process of a detection device is provided, which is described by taking the method as an example for being applied to the terminal in fig. 1, and includes the following steps:

step S10: and acquiring first detection data of the electronic product fed back by the effective detection station on the detection equipment.

In particular, a valid inspection station generally refers to an inspection station that is not shielded on the inspection equipment and is normally put into use. The electronic product is moved into an effective detection station from a detection flow line in normal operation, and the effective detection station detects the electronic product to obtain first detection data fed back by the effective detection station.

Further, when the qualified rate of the electronic product in the first detection data is lower than a preset threshold value, the step of detecting the equipment process is stopped. When the qualified rate of the electronic product in the first detection data is greater than or equal to the preset threshold, the step S20 is continuously executed. By judging the qualified rate of the first detection data, the inspection is stopped in time when the qualified rate of the electronic products in the same batch is lower, the production line of the electronic products is adjusted, and data invalidity caused by continuous process inspection is avoided.

Step S20: and acquiring rechecking data of a plurality of checked electronic products at the effective detection stations according to the preset number of the spot check products to form second detection data.

Specifically, the preset number of the products to be spot-checked can be set according to the characteristic parameters of the electronic product and the requirement for the accuracy of the spot-check. The preset sampling inspection product number can refer to the number of electronic products detected by each effective detection station in sampling inspection aiming at the products in the same batch. For example, the number of preset spot check products can be set to be 2, that is, 2 electronic products detected by each effective detection station are extracted, and the electronic products subjected to spot check are indicated to be rechecked. The retest can be manual retest, also can transfer to the check device of higher accuracy and carry out the retest. And arranging the acquired reinspection data, and corresponding to the first detection data to form second detection data.

Step S30: and determining an adjusting mode of the effective detection station state according to the process detection result output by the first detection data and the second detection data.

Specifically, according to the obtained second detection data, the first detection data of the electronic product corresponding to the second detection data are compared, the running state of the effective detection station is judged, and adaptation adjustment is carried out. For example, when the error of the effective detection station is judged to be large or the fault is judged, the effective detection station can be shielded in time and maintained.

In the process inspection method for the detection equipment, the electronic product with preset times is subjected to sampling inspection on each effective detection station, the running state of the effective detection station is judged according to the first detection data and the second detection data of the sampled electronic product, and the adjustment mode of the state of the effective detection station is determined, so that the state of the effective detection station can be adjusted in time, the stable running of the detection equipment is ensured, and the detection accuracy of the electronic product is improved; the electronic product to be subjected to random inspection on each effective detection station is ensured to be the preset random inspection times, the effective detection stations of the electronic product to be subjected to random inspection are convenient to track, and the corresponding relation between the first detection data and the second detection data and the effective detection stations corresponding to the first detection data and the second detection data can be positioned more quickly and accurately; the detection process is intelligent, and the normal operation of the detection flow line is not influenced.

In some embodiments of the present disclosure, as shown in fig. 3, the step S10 includes:

step S12: and moving the electronic product from the detection flow line into the effective detection station.

Specifically, the inspection flow line may refer to a mechanical apparatus that continuously conveys electronic products on a set inspection line. A plurality of detection devices are distributed on the detection production line. This embodiment can adopt and move the subassembly transport electronic product to effective detection station on.

Step S14: first product information of the electronic product is obtained.

Specifically, when the electronic product enters the effective detection station, first product information of the electronic product is acquired. The first product information may include a batch of the electronic product, a serial number of the electronic product, and a serial number of a valid inspection station where the electronic product is inspected. In this embodiment, a two-dimensional code or a barcode may be configured on the electronic product, the two-dimensional code is read through the barcode scanning system, and the first product information of the electronic product is obtained through the access of the two-dimensional code.

Step S16: and indicating the detection equipment to detect the electronic product on the effective detection station, acquiring the first detection data, updating the first product information according to the first detection data and the effective detection station information, and generating second product information.

Specifically, a detection instruction is issued to the effective detection station, so that the effective detection station executes the detection step. And after the effective detection station detects the electronic product, acquiring first detection data of the effective detection station. And associating the first detection data, the effective detection station information (such as an effective detection station number) and the electronic product, adding the first detection data and the effective detection station information into the first product information, updating the first product information, and generating second product information. The second product information may include all the first product information, and the newly added first detection data.

Step S18: and moving the electronic product which is detected on the effective detection station into the detection flow line.

Specifically, the electronic product which is detected at the effective detection station is carried to the detection flow line through the transfer assembly and enters the next flow (namely, the spot inspection flow).

This embodiment is through effectively detecting station information, first detection data, electronic product information and correlating to in time update electronic product information, the data tracking and the location of being convenient for.

In some embodiments of the present disclosure, as shown in fig. 4, the step S20 includes:

step S22: and moving the electronic product which completes the detection of the effective detection station into a sampling inspection area from a detection flow line.

Specifically, referring to the schematic flow diagram of the electronic product in the detection flow line shown in fig. 5, the electronic product detected at the effective detection station can be moved to the spot-checking area by the transfer assembly.

Step S24: acquiring the second product information of the electronic product; and the second product information comprises the effective detection station number corresponding to the electronic product, and the accumulated random inspection times of the electronic product on the effective detection station corresponding to the effective detection station number are obtained according to the second product information.

Specifically, the information of the electronic product entering the spot check area is read, a two-dimensional code or a bar code on the electronic product can be read through a code reading system, and the accessed electronic product information is updated second electronic product information. The second electronic product information comprises effective detection station numbers corresponding to the electronic products, and the accumulated random inspection times of the electronic products on the effective detection stations corresponding to the effective detection station numbers are obtained according to the second electronic product information.

Furthermore, in order to improve the sampling efficiency, when the electronic product enters the sampling area, the electronic product can enter the sampling area in a group. The electronic product may be carried into the spot check area, for example, by a spot check tray. The spot check tray is provided with a plurality of grooves, each groove is provided with a groove number, and each groove is used for accommodating one electronic product.

Step S26: indicating to perform recheck on the electronic product of which the accumulated sampling frequency is smaller than a preset sampling frequency in the sampling inspection area so as to acquire second detection data of the electronic product; and moving the electronic product of which the accumulated sampling times are equal to the preset sampling times in the sampling inspection area to the detection flow line.

Specifically, the magnitude of the accumulated random inspection times and the preset random inspection times is judged according to the acquired accumulated random inspection times of the random inspection electronic products on each effective detection station, and when the accumulated random inspection times of a certain effective detection station is smaller than the preset random inspection times, the re-inspection of the electronic products detected by the effective detection station is instructed, for example, the re-inspection can be instructed through information interaction modes such as information displayed on a display screen. And receiving second detection data of the returned electronic product after the electronic product needing to be subjected to spot check in the spot check area is indicated to be subjected to recheck. Under the condition that the accumulated sampling times of sampling the electronic products on a certain effective detection station are equal to the preset sampling times, the electronic products detected by the effective detection station on the sampling area are moved back to the detection flow line, and the normal operation of the detection flow line is not influenced.

Furthermore, in order to improve the sampling inspection efficiency, when the electronic product enters the sampling inspection area through the sampling inspection tray, the second product information of the electronic product on the sampling inspection tray is read, the electronic product needing sampling inspection in the sampling inspection tray is indicated to be rechecked, and the returned second detection data of the electronic product are received. Under the condition that the accumulated sampling times of the electronic products which are detected on one effective detection station are equal to the preset sampling times, the electronic products on the effective detection station are not sampled in the next sampling tray, only the related products which are not detected on the effective detection station with the preset sampling times are sampled in the sampling tray, and after the sampling is finished, the sampling tray is moved back to the detection flow line, so that the normal operation of the detection flow line is not influenced.

The embodiment is through in time updating electronic product information, the accumulative sampling inspection times of the effective detection stations are obtained according to the effective detection station information of the electronic products in the sampling inspection area, and then the accumulative sampling inspection times of the sampling inspection are smaller than the electronic products corresponding to the preset sampling inspection times, the electronic products corresponding to the effective detection stations of the sampling inspection times are not sampled and inspected when the accumulative sampling inspection times of the sampling inspection are equal to the preset sampling inspection times, the normal operation of a detection flow line is not influenced, the detection information of the electronic products is accurately tracked and positioned, and the electronic products corresponding to the effective detection stations are accurately tracked and positioned.

In some embodiments of the present disclosure, as shown in fig. 6, the step S10 includes, before:

step A10: and receiving an initiating instruction of process check, and assigning a process check enabling mark as yes.

Specifically, after the terminal receives an activation instruction for process verification, the process verification enable flag is assigned as yes. In the case where the program verify enabled flag is yes, it indicates that a process verify needs to be performed on the detection device, indicating that a process verify is initiated.

Step A20: performing feeding operation on an electronic product to obtain first product information of the fed electronic product; the first product information includes a process check completion flag.

Specifically, after the process inspection is started, feeding operation is performed on the electronic products on the detection flow line. The detection flow line has a plurality of detection devices, and a certain detection device is taken as an example for explanation. The detection equipment feeds the electronic product and simultaneously obtains first product information of the fed electronic product. Furthermore, the electronic product is provided with a two-dimension code, the two-dimension code information of the electronic product is read through an image acquisition device (such as a camera) during feeding, first product information associated with the two-dimension code information is obtained according to the two-dimension code information, and the first product information at least comprises a process inspection completion mark. Wherein the two-dimensional code may be replaced by a bar code and a process check complete flag is used to indicate that the process check is complete.

Step A30: in the case where the process check completion flag is yes, an inquiry request is sent whether to confirm the start of the process check.

Specifically, when the process inspection completion flag read from the electronic product during feeding is yes, it indicates that the process inspection of the batch of electronic products has been completed, and triggers sending of an inquiry request for confirming whether to start the process inspection. The query request may be presented via a display screen.

Step A40: and receiving a confirmation instruction aiming at the inquiry request, and modifying the process inspection completion mark to be no.

Specifically, after the query request is transmitted, an instruction returned for the query request is received. And when a confirmation instruction aiming at the inquiry request is received, updating and modifying the process inspection completion mark of the batch of electronic products to be no, and starting process inspection. When a denial command for the inquiry request is received, it indicates that the batch of electronic products has completed the process check, and no longer triggers the open process check.

In the embodiment, the product information of the fed electronic product is read, the process inspection completion mark is used for determining whether the batch of electronic products are subjected to process inspection or not, and the process inspection starting mark indicates to start the process inspection, so that the process inspection state of the electronic products can be quickly determined, and the resource waste caused by unnecessary repeated process inspection is avoided.

In some embodiments of the present disclosure, the method further comprises:

Specifically, the terminal carries out man-machine interaction through a connected display screen and indicates the display screen to display a first display interface. As shown in fig. 7, the first display interface is configured to display a detection station number, a detection station spot check completion flag, a process check start flag, a process check completion flag, a preset spot check frequency, and an accumulated spot check frequency. The number of the detection station can uniquely determine the detection station, for example, a certain detection device comprises 10 detection stations, and the 10 detection stations can be numbered according to 1-10. The detection station selective examination completion mark is used for indicating whether the number of the electronic products subjected to selective examination on the detection station meets the preset selective examination times or not, and the detection station selective examination completion mark is yes and indicates that the number of the electronic products subjected to selective examination on the detection station is the preset selective examination times; and if the spot inspection completion mark of the detection station is not, the number of the electronic products for spot inspection on the detection station is smaller than the preset spot inspection times. The preset sampling times can be set through human-computer interaction, and can be a positive integer not less than 1, such as 2, for representing the electronic product needing the sampling detection on each detection station. The accumulated sampling times are used for representing the number of the electronic products which are sampled and inspected on the inspection station.

Further, when the detection station with the number of 1 is shielded due to a fault (that is, the detection stations with the numbers of 2 to 10 are valid detection stations) in 10 detection stations included in a certain detection device, the detection station spot check completion flag corresponding to the detection station with the number of 1 is modified to be yes, and the accumulated spot check times are modified to be the same as the preset spot check times. When the cumulative sampling inspection times of all the effective detection stations in the 10 detection stations included in a certain detection device are all preset sampling inspection times, the first display interface is as shown in fig. 8.

The embodiment shows the process detection state and the sampling state of each detection station in real time through the human-computer interaction interface, so that the staff can obtain and modify information in time through the first display interface.

In some embodiments of the present disclosure, the method further comprises:

Specifically, the terminal carries out man-machine interaction through the connected display screen, and the display screen is indicated to display the second display interface. As shown in fig. 9, the second display interface is used to display the sampling inspection state, the number of the inspection stations, the preset sampling inspection times, and the accumulated sampling inspection times. The selective examination state can display the effective detection station number of the electronic product in the selective examination area.

Further, the electronic products are carried by the sampling tray to enter the sampling area. The spot check tray is provided with 6 grooves, the 6 grooves are numbered according to 1-6, and each groove is used for accommodating an electronic product. The spot check status may include information for the electronic product in each bay on the spot check tray.

Furthermore, the first display interface and the second display interface can be switched through a page turning button. The first display interface and the second display interface can also distinguish effective detection stations with accumulated sampling times meeting the preset sampling times and effective detection stations with accumulated sampling times not meeting the preset sampling times through different colors.

The sampling inspection state and the sampling inspection state of each detection station are displayed in real time through the human-computer interaction interface, and therefore the staff can conveniently obtain information in time through the second display interface to appropriately deal with the information.

In some embodiments of the present disclosure, as shown in fig. 10, the step S26 includes:

step S262: and judging the size of the accumulated sampling inspection times and the preset sampling inspection times according to the serial number of the effective detection station and the accumulated sampling inspection times of the effective detection station.

Specifically, the accumulated sampling inspection times corresponding to each effective detection station are determined according to the effective detection station number and the accumulated sampling inspection times, and the accumulated sampling inspection times and the preset sampling inspection times of each effective detection station are judged.

Step S264: and when the accumulated random inspection times are smaller than the preset random inspection times, receiving a random inspection confirmation instruction, and accumulating the one-time random inspection times for the effective detection stations with the accumulated random inspection times smaller than the preset random inspection times.

Specifically, when the accumulated random inspection times of a certain effective detection station are smaller than the preset random inspection times, the accumulated random inspection times of the effective detection station are accumulated once after a random inspection confirmation instruction is received.

Further, the confirmation snapshot instruction may be received through the second display interface. For example, a confirmation sampling instruction may be triggered on the second display interface by clicking, touching, and the like, where the confirmation sampling instruction is used to indicate that the electronic product in the current sampling area (i.e., on the sampling tray) is to be checked. And after receiving the confirmation random inspection instruction, reading the effective detection station corresponding to the electronic product on the random inspection tray, and updating the accumulated random inspection times according to the effective detection station corresponding to the confirmation random inspection instruction. For example, referring to fig. 9, at this time, the detection stations 1 to 10 are all valid detection stations, wherein the cumulative number of sampling checks of the detection stations 3 to 10 is equal to the preset number of sampling checks, which is 2; the accumulated sampling inspection times of the inspection stations 1-2 are 1, and the electronic products on the No. 5-6 cell grids of the sampling inspection tray come from the effective inspection station 1 and the effective inspection station 2 respectively. After receiving the sampling inspection confirmation command through the second display interface, the second display interface is changed from fig. 9 to fig. 11.

The electronic product in the selective examination region is rechecked through the received selective examination instruction, the accumulative selective examination times are increased by triggering, the accuracy of the accumulative selective examination times is improved, and the selective examination state on each effective detection station can be conveniently and accurately tracked.

In some embodiments of the present disclosure, the method further comprises:

Specifically, when it is determined that the cumulative number of sampling tests of all effective detection stations of the current detection device is equal to the preset number of sampling tests, that is, when one round of sampling tests of the current detection device is completed, an adjustment manner of the states of the effective detection stations may be determined according to process test results output by the first detection data and the second detection data, and the process test completion flag of the electronic product of the batch corresponding to the electronic product detected in step S10 is modified to yes.

Further, in order to improve the sampling accuracy, the adjustment mode for determining the state of the effective detection station according to the process inspection result output by the first detection data and the second detection data may be: after one round of spot check of the current detection equipment is finished, if the output result of the first detection data of at least one product in two spot check products of a certain effective detection station is qualified or unqualified, and the output result of the second detection data corresponding to the product is unqualified or qualified, that is, the output results of the first detection data and the second detection data are inconsistent, the accumulated spot check times of the effective detection station needs to be cleared (generally set to 2 times), the electronic product which is detected by the effective detection station is spot checked again, whether the output results of the first detection data and the second detection data of the two spot check products of the effective detection station are consistent or not is repeatedly judged, if the output results are inconsistent, the effective detection station is considered to be in fault, and the effective detection station needs to be shielded or other operations are carried out according to needs. The final situation that the first detection data is inconsistent with the second detection data can be determined in a repeated zero clearing and repeated sampling mode.

In addition, if the first detection data and the second detection data of the product are both unqualified, two conditions exist at the moment, the product is unqualified or the station fails, at the moment, the accumulated sampling times also need to be cleared, the product of the effective detection station is subjected to sampling test again, and whether the effective station fails or not is finally judged.

Or, determining an adjustment mode for the state of the effective detection station according to the process inspection result output by the first detection data and the second detection data may further be: after one round of spot check of the current detection equipment is finished, if the error of the first detection data and the second detection data of a certain effective detection station is larger than a preset threshold, resetting the accumulated spot check times of the effective detection station, so that the electronic product of the effective detection station is subjected to spot check again, repeatedly judging whether the error of the first detection data and the second detection data of the effective detection station is larger than the preset threshold, and finally determining the error of the first detection data and the second detection data in a repeated resetting and repeated spot check mode. And if the error of the final first detection data and the second detection data is larger than a preset threshold value, the effective detection station can be shielded.

In the embodiment, when the accumulated sampling times of all the effective detection stations are equal to the preset sampling times, namely the sampling of each effective detection station of the current detection equipment is finished, the product information of the batch of electronic products is updated in time, and the process inspection completion mark of the electronic products is specifically modified to be yes, so that subsequent unnecessary repeated sampling is avoided.

It should be understood that, although the steps in the flowcharts related to the embodiments as described above are sequentially displayed as indicated by arrows, the steps are not necessarily performed sequentially as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a part of the steps in the flowcharts related to the embodiments described above may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the execution order of the steps or stages is not necessarily sequential, but may be rotated or alternated with other steps or at least a part of the steps or stages in other steps.

Based on the same inventive concept, the embodiment of the present disclosure further provides a detection device process inspection apparatus for implementing the detection device process inspection method. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme described in the above method, so that specific limitations in one or more embodiments of the inspection apparatus for process of inspection equipment provided below can be referred to the limitations for the inspection method for process of inspection equipment in the above description, and are not described herein again.

The apparatus may include systems (including distributed systems), software (applications), modules, components, servers, clients, etc. that use the methods described in embodiments of the present specification in conjunction with any necessary apparatus to implement the hardware. Based on the same innovative concept, the embodiments of the present disclosure provide an apparatus in one or more embodiments as described in the following embodiments. Since the implementation scheme of the apparatus for solving the problem is similar to that of the method, the specific implementation of the apparatus in the embodiment of the present specification may refer to the implementation of the foregoing method, and repeated details are not repeated. As used hereinafter, the term "unit" or "module" may be a combination of software and/or hardware that implements a predetermined function. Although the means described in the embodiments below are preferably implemented in software, an implementation in hardware or a combination of software and hardware is also possible and contemplated.

In some embodiments of the present disclosure, as shown in fig. 12, a device for testing a device process is provided, and the device may be the aforementioned terminal, or may also be a server, or a module, a component, a device, a unit, or the like integrated in the terminal. The device Z00 may include:

the detection station module Z10 is used for acquiring first detection data of the electronic product fed back by the effective detection station on the detection equipment;

the sampling inspection module Z20 is used for acquiring recheck data of a plurality of inspected electronic products at the effective inspection station according to the preset sampling inspection product number to form second inspection data;

and the output module Z30 is used for determining an adjustment mode of the effective detection station state according to the process detection result output by the first detection data and the second detection data.

In some embodiments of the present disclosure, as shown in fig. 13, the inspection station module Z10 includes:

the first transfer unit Z12 is used for transferring the electronic product from the detection flow line to the effective detection station;

the first information acquisition unit Z14 is used for acquiring first product information of the electronic product;

a first detection data unit Z16, configured to instruct the detection device to detect an electronic product on an effective detection station, acquire the first detection data, update the first product information according to the first detection data and the effective detection station information, and generate second product information;

the first transfer unit Z12 is further configured to move the electronic product that has been detected at the effective detection station into the detection flow line.

In some embodiments of the present disclosure, as shown in fig. 14, the spot check module Z20 includes:

the second transfer unit Z22 is used for transferring the electronic product which is detected by the effective detection station into a sampling detection area from a detection flow line;

the second information acquisition unit Z24 is used for acquiring the second product information of the electronic product; the second product information comprises an effective detection station number corresponding to the electronic product, and the accumulated sampling inspection times of the electronic product on the effective detection station corresponding to the effective detection station number are acquired according to the second product information;

a second detection data unit Z26, configured to instruct to perform retest on the electronic product whose accumulated number of times of spot checks is smaller than a preset number of times of spot checks in the spot check area, so as to obtain second detection data of the electronic product;

the second transferring unit Z22 is further configured to move the electronic product in the spot check area with the accumulated number of spot checks equal to a preset number of spot checks to the detection flow line.

In some embodiments of the present disclosure, as shown in fig. 15, the apparatus Z00 further comprises:

a starting module Z40, configured to receive a starting instruction of process check, and assign a process check enable flag as yes;

the product information module Z50 is used for performing feeding operation on the electronic product to acquire first product information of the fed electronic product; the first product information includes a process inspection completion flag;

a query module Z60, configured to send a query request whether to confirm starting of the process check, in case the process check completion flag is yes;

and a completion flag module Z70, configured to receive a confirmation instruction for the query request, and modify the process check completion flag to no.

In some embodiments of the present disclosure, the apparatus further comprises:

In some embodiments of the present disclosure, as shown in fig. 16, the second detection data unit Z26 includes:

the judging unit Z262 is used for judging the size of the accumulated sampling times and the preset sampling times according to the serial number of the effective detection station and the accumulated sampling times of the effective detection station;

and the accumulation unit Z264 is used for receiving a sampling inspection confirming instruction when the accumulated sampling inspection times are less than the preset sampling inspection times, and accumulating the sampling inspection times for one time for the effective detection station with the accumulated sampling inspection times less than the preset sampling inspection times.

In some embodiments of the present disclosure, the apparatus further comprises:

The various modules in the process-checking apparatus of the detection device described above may be implemented in whole or in part by software, hardware, and combinations thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules. It should be noted that, the division of the modules in the embodiments of the present disclosure is illustrative, and is only one division of logic functions, and there may be another division in actual implementation.

Based on the foregoing description of the embodiment of the process inspection method for a detection device, in another embodiment provided by the present disclosure, a computer device is provided, where the computer device may be a terminal, and the internal structure diagram of the computer device may be as shown in fig. 17. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless communication can be realized through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement a process check method for a test device. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on a shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.

It will be appreciated by those skilled in the art that the configurations shown in the figures are block diagrams of only some of the configurations relevant to the present application, and do not constitute a limitation on the computing devices to which the present application may be applied, and that a particular computing device may include more or less components than those shown in the figures, or may combine certain components, or have a different arrangement of components.

Based on the foregoing description of the embodiments of the process inspection method for a detection device, in another embodiment provided by the present disclosure, a computer-readable storage medium is provided, on which a computer program is stored, which, when being executed by a processor, implements the steps in the above-mentioned embodiments of the method.

Based on the foregoing description of embodiments of the method for process inspection of a detection device, in another embodiment provided by the present disclosure, a computer program product is provided, which comprises a computer program, which when executed by a processor, performs the steps in the above-described method embodiments.

It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, presented data, etc.) referred to in the present disclosure are information and data that are authorized by the user or sufficiently authorized by each party.

It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high-density embedded nonvolatile Memory, resistive Random Access Memory (ReRAM), Magnetic Random Access Memory (MRAM), Ferroelectric Random Access Memory (FRAM), Phase Change Memory (PCM), graphene Memory, and the like. Volatile Memory can include Random Access Memory (RAM), external cache Memory, and the like. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others. The databases referred to in various embodiments provided herein may include at least one of relational and non-relational databases. The non-relational database may include, but is not limited to, a block chain based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic devices, quantum computing based data processing logic devices, etc., without limitation.

In the description herein, references to the description of "some embodiments," "other embodiments," "desired embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, a schematic description of the above terminology may not necessarily refer to the same embodiment or example.

It is understood that the embodiments of the method described above are described in a progressive manner, and the same/similar parts of the embodiments are referred to each other, and each embodiment focuses on differences from the other embodiments. Reference may be made to the description of other method embodiments for relevant points.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features of the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present disclosure, and the description thereof is more specific and detailed, but not construed as limiting the claims. It should be noted that, for those skilled in the art, various changes and modifications can be made without departing from the concept of the present disclosure, and these changes and modifications are all within the scope of the present disclosure. Therefore, the protection scope of the present disclosure should be subject to the appended claims.

Claims

1. A process check method for a process instrumentation, the method comprising:

2. The method of claim 1, wherein the obtaining first detection data of the electronic product fed back by the effective detection station on the detection device comprises:

acquiring first product information of the electronic product;

3. The method as claimed in claim 2, wherein the obtaining the recheck data of the checked electronic products at the effective checking station according to the preset number of the sampled products to form the second checking data comprises:

4. The method of claim 3, wherein the obtaining first detection data of the electronic product fed back by the effective detection station on the detection device comprises:

5. The method of claim 4, further comprising:

6. The method of claim 3, further comprising:

7. The method of claim 3, wherein the instructing recheck the electronic product with the accumulated number of spot checks being less than a preset number of spot checks on the spot check area comprises:

8. The method of claim 4, further comprising:

9. A process challenge device for a test equipment, said device comprising:

10. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 8.