CN114629571A - Method for testing useless emission index of 5G millimeter wave terminal - Google Patents
Method for testing useless emission index of 5G millimeter wave terminal Download PDFInfo
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Abstract
The invention provides a method for testing useless emission indexes of a 5G millimeter wave terminal, which comprises the following steps: selecting a determination mode of a target beam direction diagram of the 5G millimeter wave terminal to be tested and a corresponding designated OTA darkroom; determining a target beam directional diagram of the 5G millimeter wave terminal according to the selected determination mode, wherein the target beam directional diagram is a beam directional diagram corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal or the target in-band total radiation power, and the target in-band total radiation power is not less than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam directional diagram corresponding to the maximum equivalent omnidirectional radiation power locked by maximum beam scanning in a directional OTA darkroom; and testing the 5G millimeter wave terminal for useless emission indicators in a designated OTA darkroom under the target beam pattern. The test is more rigorous, and the measuring result is more accurate, and the test place can not only be limited to the directional OTA darkroom, has improved the test flexibility ratio.
Description
Technical Field
The invention relates to the technical field of radio testing, in particular to a method for testing useless emission indexes of a 5G millimeter wave terminal.
Background
For 5G mm-wave terminals, all test items need to be performed in an OTA (Over-the-Air) environment because there is no antenna connector for conduction measurement. At present, in the measurement step of the OTA radio frequency consistency stray test item of the 3GPP 38521-25G millimeter wave terminal, a test is specified under a Beam Lock Mode (Beam Lock Mode), and a test index is TRP (Total Radiated Power). The specific process of the above-mentioned testing method specified by 3GPP is to perform a maximum Beam (Beam Peak) scan in a directional OTA darkroom, such as a compact field and a far field, then select a direction in which a Beam of a maximum EIRP (Effective Isotropic Radiated Power) is aligned according to the scan result to perform Beam locking, and then perform in-band TRP and out-of-band spurious measurement based on the locked Beam Pattern (Beam Pattern).
However, the test method specified in the current 3GPP has the following problems: first, the test method is not rigorous and cannot meet the test conditions that the spurious test should have. Second, the test site is limited, only directional OTA dark rooms such as compact range, far field, etc. can be selected, and the EIRP must be accurately measured, which results in increased system cost and limited test flexibility. Third, the test time is long.
Disclosure of Invention
In view of the above problems, the present invention has been made in order to provide a method for testing a useless transmission index of a 5G millimeter wave terminal that overcomes or at least partially solves the above problems.
The invention aims to provide a method for testing the useless emission indexes of a 5G millimeter wave terminal, which is more rigorous and accurate and has high testing flexibility.
A further object of the present invention is to perform a useless transmission index test based on a beam pattern corresponding to a maximum in-band TRP, and to extend a test field to a non-directional OTA darkroom such as a near field except a compact field and a far field, a reverberation room, and the like, thereby improving test flexibility and reducing test cost.
Another further object of the present invention is to utilize directional OTA darkroom for beam scanning in the early stage to determine the target beam pattern and to utilize non-directional OTA darkroom for direct measurement of unwanted emission indicators locked to the target beam pattern, which can greatly save test time and test cost.
Particularly, according to an aspect of the embodiments of the present invention, there is provided a method for testing a useless emission index of a 5G millimeter wave terminal, including:
selecting a determination mode of a target beam direction diagram of the 5G millimeter wave terminal to be tested and a corresponding designated OTA darkroom;
determining a target beam pattern of the 5G millimeter wave terminal according to the selected determination mode, wherein the target beam pattern is a beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal or a target in-band total radiation power, and the target in-band total radiation power is not less than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam pattern corresponding to the maximum equivalent omnidirectional radiation power locked by maximum beam scanning in the directional OTA darkroom; and
testing the 5G millimeter wave terminal for useless emission indicators in the designated OTA darkroom under the target beam pattern.
Optionally, the unwanted emission indicator includes at least one of an out-of-band spurious total radiated power, a spectral emission template, and an adjacent channel leakage power ratio.
Optionally, the selected determination manner is to determine the target beam pattern according to a first beam pattern corresponding to a maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal, which is declared in advance;
the selected designated OTA darkroom is any one of a directional OTA darkroom or a non-directional OTA darkroom; and is
The target beam pattern is a beam pattern corresponding to the maximum in-band total radiated power of the 5G millimeter wave terminal.
Optionally, the step of determining the target beam pattern of the 5G millimeter wave terminal according to the selected determination manner includes:
acquiring a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal which is declared in advance;
measuring the in-band total radiated power of the 5G millimeter wave terminal under the condition of locking each first beam pattern; and
and selecting a beam pattern corresponding to the maximum value in the measured in-band total radiation power of the 5G millimeter wave terminal as the target beam pattern.
Optionally, the pre-declared first beam pattern corresponding to the maximum in-band total radiated power of each antenna module of the 5G millimeter wave terminal is obtained by traversing different beam patterns of each antenna module of the 5G millimeter wave terminal.
Optionally, the step of testing the useless emission index of the 5G millimeter wave terminal in the specified OTA darkroom under the target beam pattern includes:
controlling the 5G millimeter wave terminal to transmit the target beam pattern in the specified OTA darkroom in a non-signaling mode; and
and testing useless emission indexes of the 5G millimeter wave terminal under the target beam pattern.
Optionally, the selected determination is to determine the target beam pattern based on a beam pattern corresponding to a maximum equivalent omnidirectional radiation power locked by a maximum beam sweep in a directional OTA darkroom;
the selected designated OTA darkroom is any one of the non-directional OTA darkrooms; and is
The target beam pattern is a beam pattern corresponding to the target in-band total radiated power.
Optionally, the step of determining the target beam pattern of the 5G millimeter wave terminal according to the selected determination manner includes:
locking a beam directional pattern corresponding to the maximum equivalent omnidirectional radiation power through maximum beam scanning in a directional OTA darkroom;
measuring the in-band total radiated power of the 5G millimeter wave terminal under the beam pattern locked in the directional OTA darkroom;
controlling the 5G millimeter wave terminal to emit in-band total radiation power which is not less than the measured in-band total radiation power of the 5G millimeter wave terminal in the specified OTA darkroom as the target in-band total radiation power; and
and taking the beam pattern corresponding to the total radiation power in the target band as the target beam pattern.
Optionally, the directional OTA darkroom comprises a compact field or a far field; and is
The non-directional OTA darkroom includes a reverberation room or a near field.
Optionally, the designated OTA darkroom is a reverberation room.
According to the method for testing the useless emission index of the 5G millimeter wave terminal, the technical bias in the field is overcome, a beam directional pattern corresponding to the target in-band total radiation power of the 5G millimeter wave terminal, which is measured under the beam directional pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal or the maximum equivalent omnidirectional radiation power not less than the maximum equivalent omnidirectional radiation power locked by the maximum beam scanning in the directional OTA darkroom, is used as the target beam directional pattern, and the useless emission index of the 5G millimeter wave terminal is tested under the target beam directional pattern. Therefore, the in-band total radiation power corresponding to the target beam pattern used for testing can be guaranteed to be the maximum value or be closer to the maximum value, so that the test is more rigorous, and the measurement result is more accurate. Meanwhile, the maximum EIPR does not need to be scanned when the useless emission index is tested in the appointed OTA darkroom, so the test site can not be limited to the directional OTA darkroom, and the test flexibility is improved.
Further, in the method for testing the useless emission index of the 5G millimeter wave terminal, a target beam pattern is determined according to a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal, which is declared in advance, and the useless emission index measurement is performed by adopting the target beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal. Because the useless emission index test is carried out based on the beam pattern corresponding to the maximum in-band TRP, the test field can be expanded to the non-directional OTA darkroom (such as a near field, a reverberation room and the like) except the directional OTA darkroom (such as a compact field, a far field and the like), so that various OTA darkrooms can be flexibly adopted, the test flexibility is improved, and the system cost and the test cost are greatly reduced. And, because the beam scanning in earlier stage has been saved, test speed will also promote greatly.
Furthermore, in the method for testing the useless emission index of the 5G millimeter wave terminal, after the beam pattern corresponding to the maximum equivalent omnidirectional radiation power is locked by performing early-stage beam scanning by using the directional OTA darkroom, the in-band total radiation power which is not less than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam pattern corresponding to the locked maximum equivalent omnidirectional radiation power is obtained in the selected non-directional OTA darkroom and is taken as the target in-band total radiation power, and then the useless emission index is measured under the condition that the beam pattern corresponding to the target in-band total radiation power is directly locked in the non-directional OTA darkroom, so that the test time and the test cost can be greatly saved.
Furthermore, in the method for testing the useless emission indexes of the 5G millimeter wave terminal, a reverberation room can be selected as a designated OTA darkroom for testing. Due to the unique test principle of the reverberation chamber, the TRP can be directly measured without performing point-by-point scanning measurement of EIRP under each angle, and the measurement time is greatly saved.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
The above and other objects, advantages and features of the present invention will become more apparent to those skilled in the art from the following detailed description of specific embodiments thereof, taken in conjunction with the accompanying drawings.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a schematic diagram of dot-grid distribution and coordinate system in spherical scanning of TRP;
FIG. 2 is a schematic scanning diagram of a beam pattern obtained by a 5G millimeter wave terminal under the condition of locking the beam pattern;
FIG. 3 is a schematic scanning diagram of another beam pattern obtained by the 5G millimeter wave terminal under the condition of locking the other beam pattern;
fig. 4 is a schematic flowchart of a method for testing a useless transmission indicator of a 5G millimeter wave terminal according to an embodiment of the present invention;
fig. 5 is a schematic flowchart of a method for testing a useless transmission indicator of a 5G millimeter wave terminal according to another embodiment of the present invention;
fig. 6 is a schematic flowchart of a method for testing a useless emission index of a 5G millimeter wave terminal according to another embodiment of the present invention;
fig. 7 is a schematic position diagram of each antenna module of the 5G millimeter wave terminal according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
The existing test method for the 5G millimeter wave terminal OTA radio frequency consistency spurious test item specified by 3GPP38521-2 is to perform a spherical scan of a maximum beam in a directional OTA dark room, such as a compact field and a far field, determine a maximum EIRP, lock a beam pattern where the maximum EIRP is located, and perform in-band TRP and out-of-band spurious tests. This would create a technical prejudice for the skilled person considering that OTA spurt testing for 5G millimeter wave terminals should be performed based on maximum EIRP.
However, the inventors of the present application found through research that the spurious tests in the conventional sense should be based on the maximum in-band TRP instead of the maximum EIRP. In addition, since there may be more than one antenna module (i.e., antenna array) in the terminal, the corresponding beam pattern is determined only by one maximum beam scan, which cannot guarantee that the EIRP currently measured is maximum, nor that the TRP is maximum. The following analysis is performed in conjunction with the measured data of fig. 1 to 3 and tables 1 and 2.
The main source of the spurs related to the output power of the terminal is the nonlinearity of the power amplifier, which is reflected by the total port power. In the conventional conducted power measurement, a radio frequency conduction port is connected by a cable, and when the total power of an in-band conduction port reaches a maximum, measurement of unwanted emissions including out-of-band spurious emissions is performed. In the measurement corresponding to the OTA, the TRP is theoretically the power of the conducted power port, if the influence of the antenna efficiency, the outer case, and the like is not considered. An antenna is just a radiation mode that does not amplify or reduce the total power, but only concentrates the power energy in certain directions. Therefore, the spurs should be correlated with TRP, and the maximum eirp (peak eirp) is the power value of a certain directional point including the antenna gain.
Fig. 1 is a schematic diagram of dot lattice distribution and coordinate system in spherical scanning of TRP. As shown in fig. 1, EIRP corresponds to a certain point on the power radiation sphere, and TRP corresponds to the total power of the power radiation sphere. The calculated relationship of TRP to EIRP, according to the standard definition, is as follows:
that is, TRP is the power weighted sum of the EIRP measured at each point on the sphere. Corresponding according to the angles theta and phi of a coordinate system, and each EIRP (theta)n，φm) Is the adoption of an EIRP valueN and M are the number of samples of angles theta and phi, respectively. The weighting factor is sin θ. Based on the above calculation relationship, in the case where a certain EIRP is maximum, it does not necessarily mean that TRP is maximum, because the value of TRP is correlated with N × M samples, not with a single EIRP. In the case where a certain EIRP is maximum, the TRP is not necessarily maximum.
Furthermore, for a certain terminal, there may be a large variety of beam patterns (represented by three-dimensional spheres), and a certain beam pattern corresponds to a unique TRP value and is summed up from a large number of EIRP values. Fig. 2 and 3 respectively show schematic scanning diagrams of a beam pattern obtained by a certain 5G millimeter wave terminal under the condition of locking the beam pattern. The EIPR scan power values for the points of the sphere under the beam pattern shown in fig. 2 are shown in table 1 below, and the EIPR scan power values for the points of the sphere under the beam pattern shown in fig. 3 are shown in table 2 below, where angles θ and φ are both in degrees (°).
TABLE 1
TABLE 2
As shown in fig. 2 and 3, due to the difference in EIRP at different directional points, an irregular spherical surface is formed. In the beam pattern shown in fig. 2, the maximum EIRP scanned at the point where θ is 180 ° and Φ is 135 ° is 27.4dBm, and the TRP of the entire sphere is 17.6 dBm. In another beam pattern of the same 5G mm-wave terminal shown in fig. 3, the maximum EIRP appears at the point where θ is 15 ° and Φ is 15 °, 33.64dBm, and the TRP of the entire sphere is 22.04 dBm.
From the above theoretical and actual data analysis, it is found that when EIRP is maximized, TRP is not necessarily maximized. The current 3GPP test method determines a maximum EIRP based on one spherical scan, locks the beam pattern where the EIRP is located, and then performs in-band TRP and out-of-band spurious tests. The method is highly random, the maximum EIRP locked in each scanning is not necessarily the same, and the in-band TRP in the corresponding beam pattern is not necessarily the maximum. This results in imprecise testing methods, which affect the accuracy of the test. In addition, because the EIRP needs to be accurately measured, the test site is limited, the system cost is high, and the test time is long.
In view of the above, the inventor of the present application has overcome the foregoing technical prejudice and has proposed a method for testing the useless emission index of a 5G millimeter wave terminal.
Fig. 4 is a flowchart illustrating a method for testing a useless emission index of a 5G millimeter wave terminal according to an embodiment of the present invention. Referring to fig. 4, the measurement method may include at least the following steps S402 to S406.
And step S402, selecting a determination mode of a target beam pattern of the 5G millimeter wave terminal to be tested and a corresponding designated OTA darkroom.
Step S404, determining a target beam directional diagram of the 5G millimeter wave terminal according to the selected determination mode, wherein the target beam directional diagram is a beam directional diagram corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal or the target in-band total radiation power, and the target in-band total radiation power is not less than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam directional diagram corresponding to the maximum equivalent omnidirectional radiation power locked by the maximum beam scanning in the directional OTA darkroom.
Step S406, the useless emission index of the 5G millimeter wave terminal is tested in the target beam pattern in the appointed OTA darkroom.
In the method for testing the useless emission index of the 5G millimeter wave terminal, provided by the embodiment of the invention, the technical bias in the field is overcome, a beam directional pattern corresponding to the target in-band total radiation power of the 5G millimeter wave terminal, which is measured under the beam directional pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal or the maximum equivalent omnidirectional radiation power not less than the maximum equivalent omnidirectional radiation power locked by the maximum beam scanning in a directional OTA dark room, is used as the target beam directional pattern, and the useless emission index of the 5G millimeter wave terminal is tested under the target beam directional pattern. Therefore, the in-band total radiation power corresponding to the target beam pattern used for testing can be guaranteed to be the maximum value or be closer to the maximum value, so that the test is more rigorous, and the measurement result is more accurate. Meanwhile, the maximum EIPR does not need to be scanned when the useless emission index is tested in the appointed OTA darkroom, so the test site can not be limited to the directional OTA darkroom, and the test flexibility is improved.
In some embodiments, the measured unwanted Emission indicators may include at least one of out-of-band spurious total radiated Power (outband spurious Emission Mask, SEM), Adjacent Channel Leakage Power Ratio (ACLR), and the like. In other words, the test method provided by the invention not only can be suitable for the stray test of the 5G millimeter wave terminal, but also is suitable for the test of useless emission such as a frequency spectrum emission template, an adjacent channel leakage power ratio and the like of the 5G millimeter wave terminal.
In some embodiments, the determination manner of the target beam pattern to be selected in step S402 may include two manners: one is to determine a target beam pattern from a first beam pattern corresponding to a maximum in-band total radiation power of each antenna module of a pre-declared 5G millimeter wave terminal, and the other is to determine a target beam pattern based on a beam pattern corresponding to a maximum equivalent omnidirectional radiation power locked by maximum beam scanning in a directional OTA darkroom. If the determination is different, the resulting target beam pattern and the designated OTA darkroom for making useless transmission indicator measurements with the target beam pattern locked may also be different.
In some specific embodiments, the selected determination manner is to determine a target beam pattern according to a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the pre-declared 5G millimeter wave terminal; the selected designated OTA darkroom is any one of a directional OTA darkroom or a non-directional OTA darkroom; and the target beam pattern is a beam pattern corresponding to the maximum in-band total radiated power of the 5G millimeter wave terminal.
A directional OTA darkroom as referred to herein refers to an OTA darkroom, such as compact field, far field, etc., capable of scanning to obtain an accuracy required radiation power value for each point on the power radiation sphere of the object under test when performing OTA testing therein. The non-directional OTA darkroom refers to an OTA darkroom in which the radiation power value of each point on the power radiation spherical surface of the tested object cannot be scanned when the OTA test is performed, or the radiation power value of each point on the power radiation spherical surface of the tested object cannot meet the accuracy requirement although the radiation power value of each point on the power radiation spherical surface of the tested object can be scanned, but only the integral power value of the power radiation spherical surface meets the accuracy requirement, such as a reverberation room, a near field and the like. It should be noted that, when the near field is used as a test site, although the radiation power value of each point on the power radiation spherical surface of the tested object can be scanned, the radiation power value of each point does not meet the accuracy requirement, but the total radiation power value of the power radiation spherical surface obtained by integrating the radiation power value of each point must meet the accuracy requirement, and therefore, the near field belongs to a non-directional OTA darkroom. The accuracy requirements herein may be adapted to the general requirements of OTA testing of wireless devices in the art.
Fig. 5 is a flowchart illustrating a method for testing a useless emission index of a 5G millimeter wave terminal according to another embodiment of the present invention.
Referring to fig. 5, in some embodiments, the above step S402 may be embodied as step S502: and selecting a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal to determine a target beam pattern, and selecting any one of a directional OTA darkroom and a non-directional OTA darkroom as a designated OTA darkroom. That is, in the embodiment, the selected determination method is to determine the target beam pattern according to the first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the pre-declared 5G millimeter wave terminal, and the selected designated OTA darkroom is any one of a directional OTA darkroom and a non-directional OTA darkroom.
Further, in some embodiments, the above step S404 may be embodied as the following steps S504 to S508.
Step S504, a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the pre-declared 5G millimeter wave terminal is obtained.
Step S506, measuring the in-band total radiated power of the 5G millimeter wave terminal under the condition of locking each first beam pattern.
Step S508, selecting a beam pattern corresponding to the maximum value in the measured in-band total radiation power of the 5G millimeter wave terminal as a target beam pattern. That is, the determined target beam pattern is a beam pattern corresponding to the maximum in-band total radiated power of the 5G millimeter wave terminal.
In this embodiment, the beam patterns corresponding to the maximum TRP of all antenna modules supported by the terminal are all pre-declared, and then the beam pattern corresponding to the maximum in-band TRP is selected as a target beam pattern for measurement of useless emission indexes. A schematic position diagram of each antenna module of one possible 5G millimeter wave terminal is shown in fig. 7. As shown in fig. 7, three antenna arrays, namely an antenna module 1, an antenna module 2, and an antenna module 3, are respectively disposed at three positions of a circuit board of a 5G millimeter wave terminal, and when the terminal transmits power in a working process, one of the antenna modules is selected according to a system instruction to transmit, and a beam pattern, EIRP, and TRP power are different according to specific situations, so that the beam pattern may have various kinds. In the embodiment, the in-band TRP is measured and verified by locking the first beam pattern corresponding to the maximum TRP power of each antenna module during working, and then the beam pattern corresponding to the maximum in-band TRP is selected as the target beam pattern to perform useless emission index test, so that the test time can be greatly saved.
In some embodiments, the first beam pattern corresponding to the maximum in-band total radiated power of each antenna module of the pre-declared 5G millimeter-wave terminal may be obtained by traversing different beam patterns of each antenna module of the 5G millimeter-wave terminal. For example, a manufacturer may declare a first beam pattern corresponding to the maximum in-band TRP after traversing different beam patterns of each antenna module of the 5G millimeter wave terminal in advance.
Further, in some embodiments, the above step S406 may be embodied as step S510: and controlling the 5G millimeter wave terminal to transmit a target beam direction diagram in a specified OTA darkroom in a non-signaling mode, and testing useless transmission indexes of the 5G millimeter wave terminal under the target beam direction diagram. The non-signaling mode mentioned here means that the integrated tester is not required to perform signaling connection, the integrated tester directly transmits a corresponding beam pattern through a control instruction of the terminal, and measures useless transmission indexes such as stray. Therefore, the test time lost due to the failure of the comprehensive tester to build a chain is saved, and more various OTA site environments can be used for measurement.
In the method for testing the useless emission index of the 5G millimeter wave terminal provided in this embodiment, a target beam pattern is determined according to a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal, and the useless emission index measurement is performed by using the target beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal. Because the useless emission index test is carried out based on the beam pattern corresponding to the maximum in-band TRP, the test field can be expanded to the non-directional OTA darkroom (such as a near field, a reverberation room and the like) except the directional OTA darkroom (such as a compact field, a far field and the like), so that various OTA darkrooms can be flexibly adopted, the test flexibility is improved, and the system cost and the test cost are greatly reduced. In practical application, a manufacturer can select a designated OTA darkroom as a test site according to needs. And, because the beam scanning in earlier stage has been saved, test speed will also promote greatly.
In the existing maximum EIRP based testing method, taking the terminal to perform testing on a rotating table of a directional OTA darkroom as an example, if the terminal performs spherical rotation and scans EIRP power of each point on the rotating table according to the angular direction in table 1, for example, then grid points at two hundred angles need to be scanned, and the power of each grid point needs to be measured, if the time for scanning once in the industry is about half an hour to one hour, the measurement time will be multiplied if the testing under different frequency bands, different polarizations and different configurations is considered. Thus, a spurious test of a 5G millimeter wave terminal may take over 1000 minutes.
In other specific embodiments, the selected determination is to determine the target beam pattern based on a beam pattern corresponding to a maximum equivalent omnidirectional radiation power locked by a maximum beam sweep in the directional OTA darkroom; the selected designated OTA darkroom is any one of the non-directional OTA darkrooms; and the target beam pattern is a beam pattern corresponding to the target in-band total radiated power. The directional OTA darkroom may include compact field, far field, etc. The non-directional OTA darkroom may include reverberation rooms, near fields, and the like.
Fig. 6 is a flowchart illustrating a method for testing a useless emission index of a 5G millimeter wave terminal according to another embodiment of the present invention.
Referring to fig. 6, in some embodiments, the above step S402 may be embodied as step S602: selecting a beam pattern corresponding to a maximum equivalent omnidirectional radiation power that is locked by a maximum beam sweep in the directional OTA darkroom to determine a target beam pattern, and selecting any one of the non-directional OTA darkrooms as the designated OTA darkroom. That is, the determination in this embodiment is selected to determine the target beam pattern based on the beam pattern corresponding to the maximum equivalent omni-directional radiation power locked by the maximum beam sweep in the directional OTA darkroom, the selected designated OTA darkroom being any one of the non-directional OTA darkrooms.
Further, in some embodiments, the above step S404 may be embodied as the following steps S604 to S610.
Step S604, lock the beam pattern corresponding to the maximum equivalent omnidirectional radiation power through the maximum beam scanning in the directional OTA darkroom.
Step S606, measuring the in-band total radiation power of the 5G millimeter wave terminal under the beam pattern locked in the directional OTA darkroom.
And step S608, controlling the 5G millimeter wave terminal to transmit in-band total radiation power which is not less than the measured in-band total radiation power of the 5G millimeter wave terminal in a specified OTA darkroom as target in-band total radiation power.
Step S610, a beam pattern corresponding to the target in-band total radiation power is used as a target beam pattern.
Step S612 is the same as step S406 above, and a test method under a general beam pattern locking condition may be adopted, which is not described herein again.
In the method for testing the useless emission index of the 5G millimeter wave terminal provided by this embodiment, after the beam pattern corresponding to the maximum equivalent omnidirectional radiation power is locked by performing the preliminary beam scanning by using the directional OTA darkroom, the in-band total radiation power, which is not less than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam pattern corresponding to the locked maximum equivalent omnidirectional radiation power, is obtained in the selected non-directional OTA darkroom as the target in-band total radiation power, and then the useless emission index is measured under the condition that the beam pattern corresponding to the target in-band total radiation power is directly locked in the non-directional OTA darkroom, so that the test time and the test cost can be greatly saved.
In a preferred embodiment, the designated OTA darkroom may be a reverberant room. Whether the useless emission index test is carried out based on a beam pattern corresponding to the maximum in-band TRP, or a beam pattern corresponding to the maximum equivalent omnidirectional radiation power locked by the previous-stage beam scanning of the directional OTA darkroom and the in-band TRP result measured based on the beam pattern, the result not smaller than the in-band TRP is measured in the appointed OTA darkroom and is used as a reference to carry out the useless emission index test, and under the condition that the reverberation room is selected as the appointed OTA darkroom to carry out the test, due to the unique test principle of the reverberation room, the point-by-point scanning measurement of the EIRP under each angle is not required, the TRP can be directly measured, and the measurement time is greatly saved. For example, when performing an out-of-band spurious TRP test based on the beam pattern corresponding to the maximum in-band TRP, a single measurement can be completed in 2-3 minutes.
In the description provided herein, numerous specific details are set forth. It is understood, however, that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Thus, it should be appreciated by those skilled in the art that while a number of exemplary embodiments of the invention have been illustrated and described in detail herein, many other variations or modifications consistent with the principles of the invention may be directly determined or derived from the disclosure of the present invention without departing from the spirit and scope of the invention. Accordingly, the scope of the invention should be understood and interpreted to cover all such other variations or modifications.
Claims (10)
1. A test method for useless emission indexes of a 5G millimeter wave terminal is characterized by comprising the following steps:
selecting a determination mode of a target beam direction diagram of the 5G millimeter wave terminal to be tested and a corresponding designated OTA darkroom;
determining a target beam pattern of the 5G millimeter wave terminal according to the selected determination mode, wherein the target beam pattern is a beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal or a target in-band total radiation power, and the target in-band total radiation power is not less than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam pattern corresponding to the maximum equivalent omnidirectional radiation power locked by maximum beam scanning in the directional OTA darkroom; and
testing the 5G millimeter wave terminal for useless emission indicators in the designated OTA darkroom under the target beam pattern.
2. The test method of claim 1, wherein the unwanted emission indicators comprise at least one of out-of-band spurious total radiated power, spectral emission templates, and adjacent channel leakage power ratios.
3. The test method according to claim 1, wherein the selected determination manner is to determine the target beam pattern according to a first beam pattern corresponding to a maximum in-band total radiation power of each antenna module of the pre-declared 5G millimeter wave terminal;
the selected designated OTA darkroom is any one of a directional OTA darkroom or a non-directional OTA darkroom; and is
The target beam pattern is a beam pattern corresponding to the maximum in-band total radiated power of the 5G millimeter wave terminal.
4. The testing method of claim 3, wherein the step of determining the target beam pattern of the 5G millimeter wave terminal according to the selected determination comprises:
acquiring a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal, which is declared in advance;
measuring the in-band total radiated power of the 5G millimeter wave terminal under the condition of locking each first beam pattern; and
and selecting a beam pattern corresponding to the maximum value in the measured in-band total radiation power of the 5G millimeter wave terminal as the target beam pattern.
5. The test method according to claim 4, wherein the pre-declared first beam pattern corresponding to the maximum in-band total radiated power of each antenna module of the 5G millimeter-wave terminal is obtained by traversing different beam patterns of each antenna module of the 5G millimeter-wave terminal.
6. The method of claim 4, wherein the step of testing the 5G millimeter wave terminal for a useless transmission target in the target beam pattern in the designated OTA darkroom comprises:
controlling the 5G millimeter wave terminal to transmit the target beam pattern in the designated OTA darkroom in a non-signaling mode; and
and testing useless emission indexes of the 5G millimeter wave terminal under the target beam pattern.
7. The test method according to claim 1, wherein the selected determination is based on the target beam pattern determined based on the beam pattern corresponding to the maximum equivalent omnidirectional radiation power locked by the maximum beam sweep in the directional OTA darkroom;
the selected designated OTA darkroom is any one of the non-directional OTA darkrooms; and is
The target beam pattern is a beam pattern corresponding to the target in-band total radiated power.
8. The testing method of claim 7, wherein the step of determining the target beam pattern of the 5G millimeter wave terminal according to the selected determination comprises:
locking a beam directional pattern corresponding to the maximum equivalent omnidirectional radiation power through maximum beam scanning in a directional OTA darkroom;
measuring the in-band total radiated power of the 5G millimeter wave terminal under the beam pattern locked in the directional OTA darkroom;
controlling the 5G millimeter wave terminal to emit in-band total radiation power which is not less than the measured in-band total radiation power of the 5G millimeter wave terminal in the specified OTA darkroom as the target in-band total radiation power; and
and taking a beam pattern corresponding to the target in-band total radiation power as the target beam pattern.
9. The test method according to any one of claims 3 to 8,
the directional OTA darkroom comprises a compact field or far field; and is
The non-directional OTA darkroom includes a reverberation room or a near field.
10. The test method according to claim 9,
the designated OTA darkroom is a reverberation room.
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| CN107643452A (en) * | 2016-07-22 | 2018-01-30 | 美国电磁兼容测试系统公司 | System and method for being tested in the air millimeter wave |
| CN109617623A (en) * | 2017-09-30 | 2019-04-12 | 是德科技股份有限公司 | Aerial (OTA) test macro of Multi probe anechoic chamber, (MPAC) and method |
| US20190229817A1 (en) * | 2016-09-30 | 2019-07-25 | Telefonaktiebolaget Lm Ericsson (Publ) | Reduced Grid For Measurement Of Total Radiated Power |
| CN111555826A (en) * | 2020-04-28 | 2020-08-18 | 中国信息通信研究院 | Millimeter wave end-to-end performance test system and method facing base station |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107643452A (en) * | 2016-07-22 | 2018-01-30 | 美国电磁兼容测试系统公司 | System and method for being tested in the air millimeter wave |
| US20190229817A1 (en) * | 2016-09-30 | 2019-07-25 | Telefonaktiebolaget Lm Ericsson (Publ) | Reduced Grid For Measurement Of Total Radiated Power |
| CN109617623A (en) * | 2017-09-30 | 2019-04-12 | 是德科技股份有限公司 | Aerial (OTA) test macro of Multi probe anechoic chamber, (MPAC) and method |
| CN111555826A (en) * | 2020-04-28 | 2020-08-18 | 中国信息通信研究院 | Millimeter wave end-to-end performance test system and method facing base station |
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