CN114629571B - Method for testing useless emission index of 5G millimeter wave terminal - Google Patents
Method for testing useless emission index of 5G millimeter wave terminal Download PDFInfo
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
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- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/101—Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof
- H04B17/102—Power radiated at antenna
Abstract
The invention provides a testing method of useless emission indexes of a 5G millimeter wave terminal, which comprises the following steps: selecting a determining mode of a target beam pattern of the 5G millimeter wave terminal to be tested and a corresponding appointed OTA darkroom; determining a target beam pattern of the 5G millimeter wave terminal according to the selected determination mode, wherein the target beam pattern is a beam pattern corresponding to the maximum in-band total radiation power or the target in-band total radiation power of the 5G millimeter wave terminal, and the target in-band total radiation power is not less than the in-band total radiation power of the 5G millimeter wave terminal measured in the beam pattern corresponding to the maximum equivalent omnidirectional radiation power locked by the maximum beam scanning in the directional OTA darkroom; and testing useless emission indexes of the 5G millimeter wave terminal in a designated OTA darkroom under the target beam pattern. The test is more strict, the measurement result is more accurate, the test site can be not only limited to the directional OTA darkroom, and the test flexibility is improved.
Description
Technical Field
The invention relates to the technical field of radio measurement, in particular to a method for testing useless emission indexes of a 5G millimeter wave terminal.
Background
For a 5G millimeter wave terminal, all test items need to be conducted in an OTA (Over-the-Air) environment since there is no antenna connection port for conduction measurements already present. Currently, in the measurement step of the 3GPP 38521-2G millimeter wave terminal OTA radio frequency consistency stray test item, the test is carried out in a Beam Lock Mode (Beam Lock Mode), and the test index is TRP (Total Radiated Power, total radiation power). The specific process of the test method specified by 3GPP is that firstly, a maximum Beam (Beam Peak) is scanned in a directional OTA darkroom, such as a compact range and a far field, then, according to the scanning result, the Beam lock is carried out in the direction aimed by the Beam of the maximum EIRP (Effective Isotropic Radiated Power) is selected, and then, the measurement of in-band TRP, out-of-band spurious and the like is carried out based on the locked Beam Pattern (Beam Pattern).
However, the test methods specified in the current 3GPP have the following problems: first, the test method is not strict, and cannot meet test conditions that the spurious test should have. Second, the test site is limited, only directional OTA darkrooms, such as compact ranges, far fields, etc., can be selected, and EIRP must be accurately measured, which results in increased system cost and limited test flexibility. Third, the test time is long.
Disclosure of Invention
The present invention has been made in view of the above-mentioned problems, and has as its object to provide a method for testing a useless emission index of a 5G millimeter wave terminal that overcomes or at least partially solves the above-mentioned problems.
The invention aims to provide a testing method for useless emission indexes of a 5G millimeter wave terminal, which is more strict, more accurate and high in testing flexibility.
A further object of the present invention is to perform a useless emission index test based on a beam pattern corresponding to a maximum in-band TRP, and expand a test field to a non-directional OTA darkroom such as a near field, a reverberation room, etc. except a compact range, a far field, thereby improving test flexibility and reducing test cost.
Another further object of the present invention is to utilize a directional OTA darkroom to perform a pre-beam scan to determine a target beam pattern, and utilize a non-directional OTA darkroom to directly measure a useless emission index under the target beam pattern locking, so that the test time and the test cost can be greatly saved.
In particular, according to an aspect of the embodiment of the present invention, there is provided a method for testing useless emission indexes of a 5G millimeter wave terminal, including:
selecting a determining mode of a target beam pattern of the 5G millimeter wave terminal to be tested and a corresponding appointed OTA darkroom;
determining a target beam pattern of the 5G millimeter wave terminal according to the selected determination mode, wherein the target beam pattern is a beam pattern corresponding to the maximum in-band total radiation power or the target in-band total radiation power of the 5G millimeter wave terminal, and the target in-band total radiation power is not less than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam pattern corresponding to the maximum equivalent omnidirectional radiation power locked through maximum beam scanning in the directional OTA darkroom; and
and testing useless emission indexes of the 5G millimeter wave terminal in the designated OTA darkroom under the target beam pattern.
Optionally, the unwanted emission index includes at least one of out-of-band spurious total radiation power, a spectrum emission template, and an adjacent channel leakage power ratio.
Optionally, the selected determining mode is to determine the target beam pattern according to a first beam pattern corresponding to the pre-stated maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal;
the selected appointed OTA darkroom is any one of a directional OTA darkroom or a non-directional OTA darkroom; and is also provided with
The target beam pattern is a beam pattern corresponding to a maximum in-band total radiation power of the 5G millimeter wave terminal.
Optionally, the step of determining the target beam pattern of the 5G millimeter wave terminal according to the selected determination mode includes:
acquiring a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal;
measuring the total in-band radiation power of the 5G millimeter wave terminal under the condition of locking each first beam pattern; and
and selecting the beam pattern corresponding to the maximum value in the measured total in-band radiation power of the 5G millimeter wave terminal as the target beam pattern.
Optionally, the first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal is obtained by traversing different beam patterns of each antenna module of the 5G millimeter wave terminal.
Optionally, the step of testing the useless emission index of the 5G millimeter wave terminal in the specified OTA darkroom under the target beam pattern includes:
controlling the 5G millimeter wave terminal to emit the target beam pattern in the appointed OTA darkroom in a non-signaling mode; and
and testing useless emission indexes of the 5G millimeter wave terminal under the target beam pattern.
Optionally, the selected determining manner is to determine the target beam pattern based on a beam pattern corresponding to a maximum equivalent omnidirectional radiation power locked by a maximum beam scan in a directional OTA darkroom;
the selected designated OTA darkroom is any one of non-directional OTA darkrooms; and is also provided with
The target beam pattern is a beam pattern corresponding to the total in-band radiation power of the target.
Optionally, the step of determining the target beam pattern of the 5G millimeter wave terminal according to the selected determination mode includes:
locking a beam pattern corresponding to the maximum equivalent omnidirectional radiation power in a directional OTA darkroom through maximum beam scanning;
measuring the in-band total radiated power of the 5G millimeter wave terminal in the beam pattern locked in the directional OTA darkroom;
controlling the 5G millimeter wave terminal to emit in-band total radiation power which is not less than the measured in-band total radiation power of the 5G millimeter wave terminal in the appointed OTA darkroom as the target in-band total radiation power; and
and taking the beam pattern corresponding to the total radiation power in the target band as the target beam pattern.
Optionally, the directional OTA darkroom comprises a compact field or far field; and is also provided with
The non-directional OTA darkroom includes a reverberation room or near field.
Optionally, the designated OTA darkroom is a reverberation room.
The method for testing the useless emission index of the 5G millimeter wave terminal overcomes the technical prejudice in the field, adopts the beam pattern corresponding to the target in-band total radiation power of the 5G millimeter wave terminal, which is measured under the beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal or the maximum equivalent omnidirectional radiation power which is not less than the in-band total radiation power locked by the maximum beam scanning in a directional OTA darkroom, as the target beam pattern, and tests the useless emission index of the 5G millimeter wave terminal under the target beam pattern. Therefore, the total in-band radiation power corresponding to the target beam pattern used for testing can be guaranteed to be the maximum value or be closer to the maximum value, so that the testing is more strict, and the measurement result is more accurate. Meanwhile, the maximum EIPR is not required to be scanned when the useless emission index is tested in the appointed OTA darkroom, so that the testing site can be not limited to the directional OTA darkroom, and the testing flexibility is improved.
Further, in the method for testing the useless emission index of the 5G millimeter wave terminal, the target beam pattern is determined according to the first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal, and the useless emission index is measured by adopting the target beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal. Because the useless emission index test is carried out based on the beam pattern corresponding to the maximum in-band TRP, the test field can be expanded to nondirectional OTA darkrooms (such as near field and reverberation room) except for the directivity OTA darkroom (such as compact range and far field), so that various OTA darkrooms can be flexibly adopted, the test flexibility is improved, and the system cost and the test cost are greatly reduced. In addition, the testing speed is greatly improved due to the fact that early-stage beam scanning is saved.
Further, in the method for testing the useless emission index of the 5G millimeter wave terminal, after the directional OTA darkroom is used for performing the early-stage beam scanning to lock the beam pattern corresponding to the maximum equivalent omnidirectional radiation power, the in-band total radiation power which is not smaller than the in-band total radiation power of the 5G millimeter wave terminal and is measured under the beam pattern corresponding to the locked maximum equivalent omnidirectional radiation power is obtained in the selected non-directional OTA darkroom as the target in-band total radiation power, and further, the useless emission index under the condition of locking the beam pattern corresponding to the target in-band total radiation power is directly measured in the non-directional OTA darkroom, so that the testing time and the testing cost can be greatly saved.
Furthermore, in the method for testing the useless emission index of the 5G millimeter wave terminal, the reverberation room can be selected as the appointed OTA darkroom for testing. Because of the unique test principle of the reverberation chamber, the point-by-point scanning measurement of the EIRP at each angle is not required, TRP can be directly measured, and the measurement time is greatly saved.
The foregoing description is only an overview of the present invention, and is intended to be implemented in accordance with the teachings of the present invention in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present invention more readily apparent.
The above, as well as additional objectives, advantages, and features of the present invention will become apparent to those skilled in the art from the following detailed description of a specific embodiment of the present invention when read in conjunction with the accompanying drawings.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to designate like parts throughout the figures. In the drawings:
FIG. 1 is a diagram of a point grid distribution and a coordinate system when a TRP is spherically scanned;
fig. 2 is a schematic scan of a beam pattern obtained by a 5G millimeter wave terminal when the beam pattern is locked;
fig. 3 is a schematic scan of another beam pattern obtained by the 5G millimeter wave terminal while locking the other beam pattern;
fig. 4 is a flowchart illustrating a method for testing useless emission indexes of a 5G millimeter wave terminal according to an embodiment of the present invention;
fig. 5 is a flowchart illustrating a method for testing a useless emission index of a 5G millimeter wave terminal according to another embodiment of the present invention;
fig. 6 is a flowchart illustrating a method for testing a useless emission index of a 5G millimeter wave terminal according to still another embodiment of the present invention;
fig. 7 is a schematic diagram illustrating the positions of antenna modules of a 5G millimeter wave terminal according to an embodiment of the invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
The existing test method of the 5G millimeter wave terminal OTA radio frequency consistency stray test item specified by 3GPP38521-2 is that firstly, spherical scanning of a maximum beam is carried out in a directional OTA darkroom, such as a compact range and a far field, then a maximum EIRP is determined, a beam pattern where the maximum EIRP is located is locked, and then in-band TRP, out-of-band stray and other tests are carried out. This would create a technical prejudice for those skilled in the art, considering that OTA spurious testing of 5G millimeter wave terminals should be performed based on maximum EIRP.
However, the inventors of the present application found through research that the spurious test in the conventional sense should be based on the maximum in-band TRP instead of the maximum EIRP. In addition, since there may be more than one antenna module (i.e., antenna array) in the terminal, the corresponding beam pattern is determined only by one maximum beam scanning, which cannot guarantee the maximum of the EIRP currently measured or the maximum of the TRP. The following analysis was performed in conjunction with the measured data of fig. 1 to 3 and tables 1 and 2.
The main source of spurious emissions related to the output power of the terminal is the nonlinearity of the power amplifier, which is manifested by the total power of the port. In the conventional conductive power measurement, a radio frequency conductive port is connected through a cable, and when the total power of the in-band conductive port reaches the maximum, measurement of useless emission including out-of-band spurious emission is performed. In the measurement corresponding to the OTA, the TRP is theoretically the power of the conductive power port, if the influence of the antenna efficiency, the housing, and the like is not considered. The antenna is only one radiation mode, it does not amplify or reduce the total power, and only can concentrate the power energy in certain directions. Therefore, the spurious should be related to the TRP, and the maximum EIRP (Peak EIRP) is only the power value of a certain directional point containing the antenna gain.
Fig. 1 is a diagram of a point grid distribution and a coordinate system when a TRP is spherically scanned. As shown in fig. 1, EIRP corresponds to a point on the power radiating sphere, while TRP corresponds to the overall power of the power radiating sphere. According to the standard definition, the calculated relation of TRP and EIRP is as follows:
that is, TRP is the power weighted sum of EIRP measured at each point on the sphere. Corresponding to the angles theta and phi of the coordinate system, each EIRP (theta n ，φ m ) That is, a sample of the EIRP value, N and M are the number of samples of angles θ and Φ, respectively. The weighting coefficient is sin theta. Based on the above-described calculation relation, in the case where a certain EIRP is maximum, it is not necessarily indicative of the TRP being maximum, because the value of TRP is related to n×m samples, not to a single EIRP. In the case where a certain EIRP is maximum, TRP is not necessarily maximum.
In addition, there may be a large variety of beam patterns (represented by three-dimensional spheres) for a certain terminal, which corresponds to a value of only one TRP and is obtained by summing up a large number of EIRP values. Fig. 2 and 3 show schematic scanned views of a beam pattern obtained by a certain 5G millimeter wave terminal under locking of the beam pattern, respectively. The EIPR scan power values for the spherical points in the beam pattern shown in fig. 2 are shown in table 1 below, and the EIPR scan power values for the spherical points in the beam pattern shown in fig. 3 are shown in table 2, where the units of angles θ and Φ are both degrees (°).
TABLE 1
TABLE 2
As shown in fig. 2 and 3, irregular spherical surfaces are formed due to the EIRP difference at the different directional points. In the beam pattern shown in fig. 2, the maximum EIRP scanned is 27.4dBm at the point θ=180°, Φ=135°, and the TRP of the entire sphere is 17.6dBm. Whereas in another beam pattern of the same 5G millimeter wave terminal shown in fig. 3, the maximum EIRP occurs at the point of θ=15°, Φ=15°, at 33.64dBm, while the TRP of the entire sphere is 22.04dBm.
From the above theory and analysis of measured data, TRP is not necessarily the largest in the case of the largest EIRP. The current 3GPP test method is to determine a maximum EIRP based on one spherical scan, lock the beam pattern where it is located, and then perform in-band TRP and out-of-band spurious tests. This approach is highly random, the maximum EIRP for each scan lock is not necessarily the same, nor is it necessarily the maximum in-band TRP under its corresponding beam pattern. This results in a less stringent test method, affecting the accuracy of the test. In addition, because the EIRP needs to be accurately measured, the testing site is limited, the system cost is high, and the testing time is long.
In view of this, the inventors of the present application have proposed a method for testing useless emission indexes of a 5G millimeter wave terminal, overcoming the aforementioned technical bias.
Fig. 4 is a flowchart illustrating a method for testing a useless emission index of a 5G millimeter wave terminal according to an embodiment of the present invention. Referring to fig. 4, the measuring method may include at least the following steps S402 to S406.
Step S402, selecting a determining mode of a target beam pattern of the 5G millimeter wave terminal to be tested and a corresponding appointed OTA darkroom.
Step S404, determining a target beam pattern of the 5G millimeter wave terminal according to the selected determination mode, wherein the target beam pattern is a beam pattern corresponding to the maximum in-band total radiation power or the target in-band total radiation power of the 5G millimeter wave terminal, and the target in-band total radiation power is not less than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam pattern corresponding to the maximum equivalent omnidirectional radiation power locked by the maximum beam scanning in the directional OTA darkroom.
In step S406, the useless emission index of the 5G millimeter wave terminal is tested in the target beam pattern in the designated OTA darkroom.
In the method for testing the useless emission index of the 5G millimeter wave terminal, which is provided by the embodiment of the invention, the technical prejudice in the field is overcome, the beam pattern corresponding to the target in-band total radiation power of the 5G millimeter wave terminal, which is measured under the beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal or the maximum equivalent omnidirectional radiation power which is not less than the in-band total radiation power locked by the maximum beam scanning in the directional OTA darkroom, is adopted as the target beam pattern, and the useless emission index of the 5G millimeter wave terminal is tested under the target beam pattern. Therefore, the total in-band radiation power corresponding to the target beam pattern used for testing can be guaranteed to be the maximum value or be closer to the maximum value, so that the testing is more strict, and the measurement result is more accurate. Meanwhile, the maximum EIPR is not required to be scanned when the useless emission index is tested in the appointed OTA darkroom, so that the testing site can be not limited to the directional OTA darkroom, and the testing flexibility is improved.
In some particular embodiments, the measured unwanted emission index may include at least one of out-of-band spurious total radiated power, spectral emission template (Spectrum Emission Mask, SEM), adjacent channel leakage power ratio (Adjacent Channel Leakage Power Ratio, ACLR), and the like. In other words, the test method provided by the invention is not only applicable to the stray test of the 5G millimeter wave terminal, but also applicable to the test of useless emission such as a spectrum emission template, an adjacent channel leakage power ratio and the like of the 5G millimeter wave terminal.
In some embodiments, the determining manner of the target beam pattern to be selected in step S402 may include two manners: a target beam pattern is determined for a first beam pattern corresponding to a maximum in-band total radiation power of each antenna module of a pre-declared 5G millimeter wave terminal, and a target beam pattern is determined based on a beam pattern corresponding to a maximum equivalent omni-directional radiation power locked by maximum beam scanning in a directional OTA darkroom. When the determination is different, the obtained target beam pattern and the designated OTA darkroom for performing the useless emission index measurement under the condition of locking the target beam pattern can also be different.
In some specific embodiments, the selected determining manner is to determine the target beam pattern according to a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the pre-declared 5G millimeter wave terminal; the selected appointed OTA darkroom is any one of a directional OTA darkroom or a non-directional OTA darkroom; and the target beam pattern is a beam pattern corresponding to a maximum in-band total radiated power of the 5G millimeter wave terminal.
The directional OTA darkroom referred to herein refers to an OTA darkroom, such as a compact range, far field, etc., in which an OTA test can be performed to scan for an accuracy-compliant radiation power value for each point on the power radiating sphere of the object under test. The non-directional OTA darkroom refers to an OTA darkroom, such as a reverberation room, a near field, etc., in which the radiation power value of each point on the power radiation sphere of the tested object cannot be obtained by scanning when the OTA test is performed, or the radiation power value of each point on the power radiation sphere of the tested object cannot meet the accuracy requirement, but only the integral power value of the power radiation sphere meets the accuracy requirement. It should be noted that, when the near field is used as the test field, although the radiation power value of each point on the power radiation sphere of the tested object can be scanned, the radiation power value of each point does not meet the accuracy requirement, but the total radiation power value of the power radiation sphere obtained by integrating the radiation power value of each point only meets the accuracy requirement, so the near field belongs to a non-directional OTA darkroom. The accuracy requirements herein may employ the general requirements of OTA testing of wireless devices in the art.
Fig. 5 is a flowchart illustrating a method for testing a useless emission index of a 5G millimeter wave terminal according to another embodiment of the present invention.
Referring to fig. 5, in some embodiments, the above step S402 may be implemented as step S502: and selecting a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal according to the pre-statement to determine a target beam pattern, and selecting any one of a directional OTA darkroom or a non-directional OTA darkroom as a designated OTA darkroom. That is, in this embodiment, the selected determination mode is to determine the target beam pattern according to the first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the pre-declared 5G millimeter wave terminal, and the selected designated OTA darkroom is either a directional OTA darkroom or a non-directional OTA darkroom.
Further, in some embodiments, the above step S404 may be embodied as the following steps S504 to S508.
Step S504, a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the pre-declared 5G millimeter wave terminal is obtained.
Step S506 measures the in-band total radiation power of the 5G millimeter wave terminal under the condition that each first beam pattern is locked.
Step S508, selecting the beam pattern corresponding to the maximum value in the measured total in-band radiation power of the 5G millimeter wave terminal as a target beam pattern. That is, the determined target beam pattern is a beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal.
In this embodiment, the beam pattern corresponding to the largest TRP of all antenna modules supported by the terminal is pre-declared, and then the beam pattern corresponding to the largest in-band TRP is selected as the target beam pattern for measurement of the useless emission index. A schematic diagram of the location of each antenna module of one possible 5G millimeter wave terminal is shown in fig. 7. As shown in fig. 7, three groups of antenna arrays are respectively arranged at three positions of a circuit board of a 5G millimeter wave terminal, which are respectively called an antenna module 1, an antenna module 2 and an antenna module 3, when the terminal transmits power in the working process, one of the antenna modules is selected to transmit according to a system instruction, and the beam pattern, the EIRP and the TRP power are different according to specific situations, so that the beam pattern will be various. In this embodiment, the first beam pattern corresponding to the maximum TRP power when each pre-declared antenna module works is used for locking to measure and verify the in-band TRP, and then the beam pattern corresponding to the maximum in-band TRP is selected as the target beam pattern for performing the useless emission index test, which can greatly save the test time.
In some embodiments, the first beam pattern corresponding to the maximum in-band total radiated power of each antenna module of the 5G millimeter wave terminal may be obtained by traversing different beam patterns of each antenna module of the 5G millimeter wave terminal. For example, the manufacturer may declare the first beam pattern corresponding to the maximum in-band TRP after traversing different beam patterns of each antenna module of the 5G millimeter wave terminal in advance.
Further, in some embodiments, the above step S406 may be implemented as step S510: and controlling the 5G millimeter wave terminal to emit the target beam pattern in the appointed OTA darkroom in a non-signaling mode, and testing useless emission indexes of the 5G millimeter wave terminal under the target beam pattern. The non-signaling mode mentioned here refers to that the control instruction of the terminal directly transmits the corresponding beam pattern without signaling connection of the comprehensive tester, and measures useless transmission indexes such as strays and the like. Therefore, the method avoids the test time lost due to the link building failure of the comprehensive tester, and can also use more kinds of OTA field environments for measurement.
In the method for testing the useless emission index of the 5G millimeter wave terminal according to the embodiment, the target beam pattern is determined according to the first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal, and the useless emission index is measured by adopting the target beam pattern corresponding to the maximum in-band total radiation power of the 5G millimeter wave terminal. Because the useless emission index test is carried out based on the beam pattern corresponding to the maximum in-band TRP, the test field can be expanded to nondirectional OTA darkrooms (such as near field and reverberation room) except for the directivity OTA darkroom (such as compact range and far field), so that various OTA darkrooms can be flexibly adopted, the test flexibility is improved, and the system cost and the test cost are greatly reduced. In practical application, the manufacturer can select and designate the OTA darkroom as a test field according to the needs. In addition, the testing speed is greatly improved due to the fact that early-stage beam scanning is saved.
In the conventional method for testing based on the maximum EIRP, taking the test of the terminal on the turntable of the directional OTA darkroom as an example, if the terminal performs spherical rotation on the turntable according to the angular direction in table 1, and scans the EIRP power of each point, the power of each point needs to be measured, and the current scanning time in the industry is about half an hour to one hour, and if the test under different frequency bands, different polarizations and different configurations is considered, the measurement time will be multiplied. Thus, stray testing of a 5G millimeter wave terminal may take more than 1000 minutes.
In other specific embodiments, the selected determination is to determine the target beam pattern based on the beam pattern corresponding to the maximum equivalent omnidirectional radiation power locked by the maximum beam sweep in the directional OTA darkroom; the selected appointed OTA darkroom is any one of the nondirectional OTA darkrooms; and the target beam pattern is a beam pattern corresponding to the total radiated power in the target band. The directional OTA darkroom can include compact fields, far fields, etc. The non-directional OTA darkroom may include a reverberant room, near field, etc.
Fig. 6 is a flowchart illustrating a method for testing a useless emission index of a 5G millimeter wave terminal according to still another embodiment of the present invention.
Referring to fig. 6, in some embodiments, step S402 above may be implemented as step S602: and selecting a target beam pattern determined based on a beam pattern corresponding to the maximum equivalent omni-directional radiation power locked by the maximum beam scanning in the directional OTA darkroom, and selecting any one of the non-directional OTA darkrooms as a designated OTA darkroom. That is, in this embodiment, the selected determination mode is to determine the target beam pattern based on the beam pattern corresponding to the maximum equivalent omni-directional radiation power locked by the maximum beam scanning in the directional OTA darkroom, and the selected designated OTA darkroom is any one of the non-directional OTA darkrooms.
Further, in some embodiments, the above step S404 may be embodied as the following steps S604 to S610.
In step S604, the beam pattern corresponding to the maximum equivalent omni-directional radiation power is locked in the directional OTA darkroom by the maximum beam scanning.
Step S606 measures the in-band total radiated power of the 5G millimeter wave terminal in the beam pattern locked in the directional OTA darkroom.
In step S608, the 5G millimeter wave terminal is controlled to emit in-band total radiation power not less than the measured in-band total radiation power of the 5G millimeter wave terminal as the target in-band total radiation power in the designated OTA darkroom.
In step S610, the beam pattern corresponding to the total radiation power in the target band is taken as the target beam pattern.
Step S612 is the same as step S406, and a test method under the general locked beam pattern condition can be adopted, which is not described herein.
In the method for testing the useless emission index of the 5G millimeter wave terminal, after the directional OTA darkroom is used for performing the early-stage beam scanning to lock the beam pattern corresponding to the maximum equivalent omnidirectional radiation power, the in-band total radiation power which is not smaller than the in-band total radiation power of the 5G millimeter wave terminal measured under the beam pattern corresponding to the locked maximum equivalent omnidirectional radiation power is obtained in the selected non-directional OTA darkroom as the target in-band total radiation power, and further, the useless emission index under the condition of locking the beam pattern corresponding to the target in-band total radiation power is directly measured in the non-directional OTA darkroom, so that the testing time and the testing cost can be greatly saved.
In a preferred embodiment, the designated OTA darkroom can be a reverberation room. Whether the useless emission index test is performed based on the beam pattern corresponding to the maximum in-band TRP or based on the beam pattern corresponding to the maximum equivalent omni-directional radiation power of the directional OTA darkroom for the earlier beam scanning and locking and the in-band TRP result measured according to the beam pattern, the useless emission index test is performed by taking the result which is not smaller than the in-band TRP measured in the appointed OTA darkroom as a reference, and under the condition of selecting the reverberation room as the appointed OTA darkroom for the test, the point-by-point scanning measurement of the EIRP under each angle is not needed due to the unique test principle of the reverberation room, the TRP can be directly measured, and the measurement time is greatly saved. For example, when out-of-band spurious TRP tests are performed based on the beam pattern corresponding to the largest in-band TRP, a single measurement can be completed in 2-3 minutes.
In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
By now it should be appreciated by those skilled in the art that while a number of exemplary embodiments of the invention have been shown and described herein in detail, many other variations or modifications of the invention consistent with the principles of the invention may be directly ascertained or inferred from the present disclosure without departing from the spirit and scope of the invention. Accordingly, the scope of the present invention should be understood and deemed to cover all such other variations or modifications.
Claims (6)
1. The method for testing the useless emission index of the 5G millimeter wave terminal is characterized by comprising the following steps of:
selecting a determining mode of a target beam pattern of the 5G millimeter wave terminal to be tested and a corresponding appointed OTA darkroom;
determining a target beam pattern of the 5G millimeter wave terminal according to the selected determination mode; and
testing useless emission indexes of the 5G millimeter wave terminal in the appointed OTA darkroom under the target beam pattern;
the method for determining the target beam pattern comprises the steps of determining the target beam pattern according to a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal, wherein the selected determining mode is that the designated OTA darkroom is any one of a directional OTA darkroom or a non-directional OTA darkroom, and the step of determining the target beam pattern of the 5G millimeter wave terminal according to the selected determining mode comprises the following steps:
acquiring a first beam pattern corresponding to the maximum in-band total radiation power of each antenna module of the 5G millimeter wave terminal;
measuring the total in-band radiation power of the 5G millimeter wave terminal under the condition of locking each first beam pattern; and
selecting a beam pattern corresponding to the maximum value in the measured in-band total radiation power of the 5G millimeter wave terminal as the target beam pattern;
or,
the selected determining mode is to determine the target beam pattern based on a beam pattern corresponding to the maximum equivalent omni-directional radiation power locked by the maximum beam scanning in the directional OTA darkroom, the selected designated OTA darkroom is any one of the non-directional OTA darkrooms, and the step of determining the target beam pattern of the 5G millimeter wave terminal according to the selected determining mode includes:
locking a beam pattern corresponding to the maximum equivalent omnidirectional radiation power in a directional OTA darkroom through maximum beam scanning;
measuring the in-band total radiated power of the 5G millimeter wave terminal in the beam pattern locked in the directional OTA darkroom;
controlling the 5G millimeter wave terminal to emit in-band total radiation power which is not less than the measured in-band total radiation power of the 5G millimeter wave terminal in the appointed OTA darkroom as target in-band total radiation power; and
and taking the beam pattern corresponding to the total radiation power in the target band as the target beam pattern.
2. The test method of claim 1, wherein the unwanted emission index comprises at least one of out-of-band spurious total radiated power, a spectral emission template, and an adjacent channel leakage power ratio.
3. The method of claim 1, wherein the first beam pattern corresponding to the maximum in-band total radiated power of each antenna module of the 5G millimeter wave terminal is obtained by traversing different beam patterns of each antenna module of the 5G millimeter wave terminal.
4. The method of testing according to claim 1, wherein the step of testing the 5G millimeter wave terminal for unwanted emissions index in the designated OTA darkroom at the target beam pattern comprises:
controlling the 5G millimeter wave terminal to emit the target beam pattern in the appointed OTA darkroom in a non-signaling mode; and
and testing useless emission indexes of the 5G millimeter wave terminal under the target beam pattern.
5. The test method according to any one of claim 1 to 4, wherein,
the directional OTA darkroom comprises a compact range or far field; and is also provided with
The non-directional OTA darkroom includes a reverberation room or near field.
6. The test method according to claim 5, wherein,
the designated OTA darkroom is a reverberation room.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107643452A (en) * | 2016-07-22 | 2018-01-30 | 美国电磁兼容测试系统公司 | System and method for being tested in the air millimeter wave |
| CN109617623A (en) * | 2017-09-30 | 2019-04-12 | 是德科技股份有限公司 | Aerial (OTA) test macro of Multi probe anechoic chamber, (MPAC) and method |
| CN111555826A (en) * | 2020-04-28 | 2020-08-18 | 中国信息通信研究院 | Millimeter wave end-to-end performance test system and method facing base station |
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| KR102243154B1 (en) * | 2016-09-30 | 2021-04-21 | 텔레폰악티에볼라겟엘엠에릭슨(펍) | Reduced grid for measurement of total radiated power |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107643452A (en) * | 2016-07-22 | 2018-01-30 | 美国电磁兼容测试系统公司 | System and method for being tested in the air millimeter wave |
| CN109617623A (en) * | 2017-09-30 | 2019-04-12 | 是德科技股份有限公司 | Aerial (OTA) test macro of Multi probe anechoic chamber, (MPAC) and method |
| CN111555826A (en) * | 2020-04-28 | 2020-08-18 | 中国信息通信研究院 | Millimeter wave end-to-end performance test system and method facing base station |
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