CN114545210B - Circuit testing device - Google Patents

Circuit testing device Download PDF

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Publication number
CN114545210B
CN114545210B CN202210417865.2A CN202210417865A CN114545210B CN 114545210 B CN114545210 B CN 114545210B CN 202210417865 A CN202210417865 A CN 202210417865A CN 114545210 B CN114545210 B CN 114545210B
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China
Prior art keywords
conductive
circuit
testing device
conductive member
short
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CN202210417865.2A
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CN114545210A (en
Inventor
刘勇
孙灯群
张超
段良军
张宾
朱齐飞
朱春丽
李婉君
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Lizhen Precision Intelligent Manufacturing Kunshan Co ltd
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Lizhen Precision Intelligent Manufacturing Kunshan Co ltd
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Priority to CN202210417865.2A priority Critical patent/CN114545210B/en
Publication of CN114545210A publication Critical patent/CN114545210A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The circuit testing device of the embodiment of the invention can realize the quick charge and discharge switching of the tested circuit by utilizing the connection of the contact points of the contact point ends of the conductive pieces and the contact points of the tested circuit, and the short-circuit structure and the charging component which are electrically connected among the plurality of conductive pieces. On the other hand, still be provided with connecting portion at the link of electrically conductive piece, this connecting portion fix a plurality of electrically conductive pieces to make circuit tester can hold this circuit testing arrangement by one hand, very big reduction the operation degree of difficulty. The miniaturization and integration of the circuit testing device are realized.

Description

Circuit testing device
Technical Field
The invention relates to the technical field of circuit testing, in particular to a circuit testing device.
Background
When a hardware function of a 3C electronic product such as a mobile phone or a tablet computer is detected, charging and discharging operations are carried out on a product mainboard, so that performance parameters of the mainboard in different states are tested. At present, the method commonly used is natural charging and discharging, that is, the charger is connected with the mainboard. However, the operation of switching charge and discharge is more complicated in this way, and the charge and discharge speed of the electronic product is greatly influenced.
Disclosure of Invention
In view of this, an embodiment of the present invention provides a circuit testing apparatus, which switches and conducts a short-circuit structure and a charging component, so as to implement charging and discharging operations on a circuit to be tested.
The circuit testing device of the embodiment of the invention comprises:
a connecting portion;
a short-circuit structure;
a charging member including a switch and a power source electrically connected to the switch;
a plurality of conductive members disposed at intervals, the plurality of conductive members being electrically connected by the charging member, the plurality of conductive members being electrically connected by the short circuit structure, the conductive members having contact ends and connection ends disposed opposite to each other, the connection ends being connected to each other by the connection portion;
the short circuit structure is electrically connected with one area of the conductive pieces, the charging component is electrically connected with the other area of the conductive pieces, the short circuit structure is conducted in a discharging state to enable the conductive pieces to have the same electric potential, and the switch is conducted in a charging state to enable the charging component to form an electric potential difference among the conductive pieces.
Further, the charging member is electrically connected to a region near the contact terminal, and the short-circuit structure is electrically connected to a region near the connection terminal; or
The short-circuit structure is electrically connected to a vicinity of the contact terminal, and the charging member is electrically connected to a vicinity of the connection terminal.
Further, the plurality of conductive members includes a first conductive member and a second conductive member;
The connecting portion is sandwiched between the first conductive member and the second conductive member so that 2 of the contact ends on the first conductive member and the second conductive member have an opening and a tightening amount.
Further, the first conductive member and the second conductive member are sheet-shaped structures, and the first conductive member and the second conductive member are arranged along a thickness direction of the sheet-shaped structures.
Further, the connection portion includes:
and the battery groove is arranged at the opposite side position of the connecting part facing the first conductive piece and the second conductive piece.
Furthermore, the switch comprises a button, and the button is convexly arranged on one side of the first conductive piece, which is far away from the second conductive piece.
Further, the short circuit structure comprises a first part and a second part which are arranged in pairs, the first part and the second part are respectively arranged on the first conductive piece and the second conductive piece and face to opposite sides of the first conductive piece and the second conductive piece, and the first part and the second part are mutually overlapped and separated to realize the connection and disconnection of the first conductive piece and the second conductive piece.
Further, the first part is a clamping hook, and the second part is a buckle.
Further, the sheet structure has a band-shaped region extending from the connection end toward the contact end, the first conductive member having a threaded through hole;
the first part comprises an adjusting bolt corresponding to the threaded through hole, the adjusting bolt penetrates through the threaded through hole along the direction towards the second conductive piece, the second part comprises a disconnecting sleeve block, and the disconnecting sleeve block is sleeved in the strip-shaped area of the second conductive piece;
the position of the disconnecting sleeve block is configured to be slid to a position corresponding to the adjusting bolt when the short-circuit structure is in a disconnecting state, and the disconnecting sleeve block is slid to a position staggered from the adjusting bolt when the short-circuit structure is in a conducting state.
Further, the second part further comprises:
and the conduction sleeve block is sleeved in the strip-shaped area of the second conductive piece, and when the short-circuit structure is in a conduction state, the conduction sleeve block slides to a position corresponding to the adjusting bolt.
The circuit testing device of the embodiment of the invention can realize the quick charge and discharge switching of the tested circuit by utilizing the connection of the contact points of the contact point ends of the conductive pieces and the contact points of the tested circuit, and the short-circuit structure and the charging component which are electrically connected among the plurality of conductive pieces. On the other hand, still be provided with connecting portion at the link of electrically conductive piece, this connecting portion fix a plurality of electrically conductive pieces to make circuit tester can hold this circuit testing arrangement by one hand, very big reduction the operation degree of difficulty. The miniaturization and integration of the circuit testing device are realized.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:
FIG. 1 is a schematic diagram of an assembly structure of a circuit testing device according to an embodiment of the present invention;
FIG. 2 is an exploded view of a circuit testing apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic view of the position of the hook and the buckle according to the embodiment of the present invention;
fig. 4 is a schematic view of a first conductive member and a second conductive member in a tightened and expanded state according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of an equivalent circuit of the circuit testing apparatus and the circuit under test according to the embodiment of the present invention;
FIG. 6 is a schematic diagram of an equivalent circuit of the circuit testing apparatus and the oscilloscope according to the embodiment of the present invention.
Description of reference numerals:
1-a conductive member;
11-a contact end; 12-a connection end; 13-a first conductive member; 14-a second electrically conductive member; 15-band-shaped area; 16-a threaded through hole; 17-a boss;
2-a connecting part; 21-a battery jar;
3-a charging member; 31-a switch; 32-a power supply;
4-short-circuit structure;
41-trip; 42-buckling; 43-adjusting bolts; 431-mark points; 44-disconnecting the sleeve block; 45-conducting sleeve block.
Detailed Description
The present invention will be described below based on examples, but the present invention is not limited to only these examples. In the following detailed description of the present invention, certain specific details are set forth. It will be apparent to one skilled in the art that the present invention may be practiced without these specific details. Well-known methods, procedures, components and circuits have not been described in detail so as not to obscure the present invention.
Further, those of ordinary skill in the art will appreciate that the drawings provided herein are for illustrative purposes and are not necessarily drawn to scale.
Unless the context clearly requires otherwise, throughout this specification, the words "comprise", "comprising", and the like are to be construed in an inclusive sense as opposed to an exclusive or exhaustive sense; that is, what is meant is "including, but not limited to".
In the description of the present invention, it is to be understood that the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. In addition, in the description of the present invention, "a plurality" means two or more unless otherwise specified.
Unless expressly stated or limited otherwise, the terms "mounted," "connected," "secured," and the like are intended to be inclusive and mean that, for example, they may be fixedly connected or detachably connected or integrally formed; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
The circuit testing device of the embodiment of the invention can carry out charging and discharging operations on the circuit board of a 3C electronic product, the circuit testing device shown in figures 1-3 is provided with 2 conductive pieces, and the cross section size of the bottom area of the conductive piece 1 is gradually reduced in the figures to form a contact. The circuit testing device in the form can be contacted with 2 contacts for charging and discharging operations on a tested circuit board during charging and discharging tests so as to realize circuit conduction between the circuit testing device and the tested circuit board. In order to further realize that the circuit testing device can be adapted to different size intervals of 2 contacts, fig. 4 shows that one end of the circuit testing device can be in an opening or tightening state, the position of the chain line in the figure is the position of the conductive piece 1 when the circuit testing device is in a free state, the conductive pieces 1 are respectively separated towards two sides after the circuit testing device is opened, and the conductive pieces 1 are respectively folded towards the inner side after the circuit testing device is tightened. So that two contacts with a greater or lesser distance can be measured. Fig. 5-6 are schematic diagrams of equivalent circuits of the circuit testing apparatus, the circuit under test and the oscilloscope, wherein the arrow direction is the current flow direction, and fig. 5 is taken as an example. The arrows in the drawing include solid line arrows and dashed line arrows. The solid line arrow current flows to a first loop formed by the circuit testing device and the tested circuit, and the dashed line arrow current flows to a second loop formed by the circuit testing device and the tested circuit. The first loop formed by the solid line arrows in the figure is the current flow direction of the circuit testing device for charging operation of the tested circuit, and the second loop formed by the dashed line arrows in the figure is the current flow direction of the circuit testing device for discharging operation of the tested circuit.
As shown in fig. 1 to 6, the circuit testing device connecting part 2, the shorting structure 4, the charging member 3, and the plurality of conductive members 1 in the present embodiment. The charging member 3 includes a switch 31 and a power source 32 electrically connected to the switch 31, a plurality of conductive members 1 are arranged at intervals, and the plurality of conductive members 1 are electrically connected by the charging member 3, the plurality of conductive members 1 are electrically connected by a short circuit structure 4, the conductive members 1 have contact terminals 11 and connection terminals 12 arranged oppositely, and the connection terminals 12 are connected to each other by a connection part 2. The short circuit structure 4 is electrically connected to one region of the conductive member 1, and the charging member 3 is electrically connected to another region of the conductive member 1. That is, there is a gap between the electrical connection position of any one of the conductive members 1 to the shorting structure 4 and the electrical connection position to the charging member 3. The short circuit structure 4 is conducted in a discharge state so that the plurality of conductive members 1 are equal in potential, and the switch 31 is conducted in a charge state so that the charging member 3 forms a potential difference between the plurality of conductive members 1.
The circuit testing device of the embodiment can realize the rapid charge and discharge switching of the tested circuit by utilizing the contact points of the contact point ends 11 of the conductive pieces 1 to be connected with the contact points of the tested circuit, and the short-circuit structure 4 and the charging component 3 which are electrically connected among the plurality of conductive pieces 1. On the other hand, connecting portion 2 is also provided at connecting end 12 of conductive piece 1, and this connecting portion 2 fixes a plurality of conductive pieces 1 to make circuit tester can hold this circuit testing device by one hand, very big reduction the operation degree of difficulty. The miniaturization and integration of the circuit testing device are realized.
Specifically, the number of the conductive members 1 in this embodiment may be matched with the number of contacts of an actual circuit to be tested, so as to simultaneously charge and discharge a plurality of contacts. The number of the conductive members 1 includes, but is not limited to, 2, 3 or 4. The shorting structure 4 and the switch 31 and the power supply 32 are respectively located between the plurality of conductive members 1, thereby forming a second loop and a first loop. In the embodiment, the short-circuit structure 4, the switch 31 and the power supply 32 are connected in parallel, as shown in fig. 5, one end of the short-circuit structure 4 (the hook 41 and the buckle 42) is connected to one end of the switch 31 through the internal resistance of the circuit testing device, and the other end of the short-circuit structure 4 is connected to the power supply 32.
Optionally, the size and shape of the contact end 11 of this embodiment can be selected according to the size of the corresponding position on the circuit to be tested. The contact section of the contact terminal 11 may be in the form of a circle, a square, a straight line, a cross or a racetrack, so as to increase the contact area between the contact of the conductive device 1 and the contact of the circuit to be tested in the charge and discharge test.
Optionally, the material of the conductive member 1 in the present embodiment includes, but is not limited to, a metal conductive material or an insulating material coating a conductive layer. The metal conductive material comprises conductive metal such as copper, iron, aluminum or iron alloy. The outer layer of the insulating material covering the conductive layer may be selected from the above materials having conductive properties, and the inner layer may be selected from a non-conductive material such as silicon dioxide or ceramic.
It is easy to understand that, in this embodiment, when the first loop and the second loop formed by the circuit testing apparatus and the circuit to be tested are conducted, the short-circuit structure 4 and the switch 31 are in the open state and the connected state, respectively, that is, when the first loop is conducted, the switch 31 is closed, and simultaneously, the short-circuit structure 4 is opened, and the power supply 32 performs the charging operation on the circuit to be tested. When the second loop is switched on, the switch 31 is switched off, the short-circuit structure 4 is switched on, and the circuit testing device discharges to the tested circuit. In other words, the switch 31 and the shorting structure 4 of the circuit testing apparatus in this embodiment need to make one of them conductive and the other off during the circuit testing. And then the condition that two components are conducted simultaneously is avoided, and at the moment, a loop formed by the switch 31, the power supply 32 and the short-circuit structure 4 is formed in the circuit testing device, so that the device generates heat and the electric quantity of the power supply 32 is rapidly consumed. As shown in fig. 5, the circuit under test in the figure includes an input voltage module, a diode, a filter capacitor resistor, a switch and an inductor. During the charge and discharge test, 2 contacts of the circuit testing device of the embodiment are respectively connected with two ends of the filter capacitor.
In some embodiments, as shown in fig. 1-2, the locations of the charging component 3 and the shorting structure 4 on the conductive member 1 may be configured in different regions. In fig. 2, the charging member 3 is electrically connected to the area near the contact terminal 11, and the short-circuit structure 4 is electrically connected to the area near the connection terminal 12. In fig. 1, the shorting structure 4 is electrically connected to the vicinity of the contact terminal 11, and the charging member 3 is electrically connected to the vicinity of the connection terminal 12.
The above two different forms can achieve different effects as described below. For example, when the circuit test uses a large number of charging operations, the form in fig. 2 may be used preferentially, that is, the switch 31 is closer to the contact end 11, and when the operator holds the switch with a hand, the switch 31 is more easily touched by a thumb or an index finger. Meanwhile, the loop formed by the switch 31 and the 2 conductive pieces 1 is shorter, and the loss of electric energy is less when the circuit testing device performs charging operation on the tested circuit. When the circuit test uses the discharge operation more, can select to set up short circuit structure 4 in the position that is closer to contact end 11, here can realize being convenient for operating personnel one-hand operation short circuit structure 4 break-make's purpose. Meanwhile, the loop internal resistance formed by the short circuit structure 4 and the 2 conductive pieces 1 is lower, and larger current can be generated when the short circuit is on a circuit board, so that the discharging effect of the circuit is accelerated. The selection can be made by those skilled in the art according to the actual working requirements.
Further, the switch 31 comprises a button, which is provided protruding on a side of the first conductive member 13 facing away from the second conductive member 14 (as shown in fig. 1). The button at this position is convenient for the operator to press by hand, and the on-off of the switch 31 is switched rapidly.
In other embodiments, the circuit testing device further comprises a power consumption unit (not shown in the figures) which is connected in series with the shorting structure 4 and forms a second loop together with the plurality of conductive members 1. The energy consumption unit in this embodiment may assist the circuit to be tested in discharging, and the energy consumption unit may be a coil. Taking the coil as an example, after the short-circuit structure 4 is closed, the current in the circuit to be tested flows through the coil, and the coil converts part of the electric energy into heat energy to be dissipated. Therefore, the consumption of the electric energy on the tested circuit is accelerated, and meanwhile, the heat originally generated by the internal resistance of the tested circuit is transferred to the circuit testing device by using the energy consumption unit, so that the electronic components on the tested circuit are further protected.
In some embodiments, as shown in fig. 1-4, the plurality of conductive members 1 includes a first conductive member 13 and a second conductive member 14. The connecting portion 2 is sandwiched between the first conductive member 13 and the second conductive member 14 so that the 2 contact terminals 11 on the first conductive member 13 and the second conductive member 14 have an opened state (shown in state ii in fig. 4) and a tightened state (shown in state i in fig. 4). The conductive member 1 in the above embodiment is made of a conductive metal material, and the present embodiment further utilizes the property of metal deformation to dispose the connection portion 2 in the region of the opposite side of the connection end 12, so that the contact ends 11 of the first conductive member 13 and the second conductive member 14 can be bent toward or away from the opposite side.
When a plurality of different tested circuits are provided or a plurality of pairs of contacts with different distances are provided on the same tested circuit, the circuit testing device can be adapted to more tested circuits by the 2 contact ends 11 with the bending amount in the embodiment, and the testing efficiency is further improved.
It is easily understood that the amount of bending of the contact ends 11 in the present embodiment can be changed within a certain range by tightening or separating the first conductive member 13 and the second conductive member 14 to each other by a finger at the time of testing by an operator.
Further, the first conductive member 13 and the second conductive member 14 have a sheet-like structure, and the first conductive member 13 and the second conductive member 14 are arranged in a thickness direction of the sheet-like structure. The first conductive member 13 and the second conductive member 14 in the present embodiment are configured as a sheet-like structure, and the connection portion 2 in the above-described embodiment is sandwiched between 2 sheet-like structures, so that the first conductive member 13 and the second conductive member 14 in the sheet-like structure in the present embodiment are more easily bent in the arrangement direction of the conductive members 1, thereby further improving the distance variation range of the 2 contact terminals 11.
Alternatively, as shown in fig. 2, to further cooperate with the sheet structure, the connecting portion 2 is provided in an outer shape of a cubic structure extending toward the contact end 11. This kind of form makes the lateral wall laminating with the cube structure that lamellar structure can be fine, improves the fixed strength each other of electrically conductive 1.
In some embodiments, as shown in fig. 1-2, the connection part 2 includes a battery groove 21, and the battery groove 21 is opened at an opposite side position of the connection part 2 toward the first conductive member 13 and the second conductive member 14. In this embodiment, in order to further realize the miniaturization and integration of the circuit testing apparatus, the power supply 32 in the above embodiment is disposed inside the connecting portion 2, so that the connecting portion 2 can fix the conductive member 1, and can further accommodate the power supply 32 through the battery jar 21.
Preferably, the switch 31 of the circuit testing device can be connected with the conductive member 1 and the power supply 32 through wires, wherein the wires arranged along the shape of the circuit testing device may be too long to have a redundant part, and the wires can be plugged into the battery groove 21, and the energy dissipation unit in the above embodiment can also be arranged in the battery groove 21, so that the appearance of the circuit testing device is neat and compact.
In some embodiments, as shown in fig. 1 to 4, the shorting structure 4 includes a first part and a second part, which are disposed in pairs, on the first conductive member 13 and the second conductive member 14, respectively, and face opposite sides of the first conductive member 13 and the second conductive member 14, and the first part and the second part are connected and disconnected by being overlapped with each other to connect and disconnect the first conductive member 13 and the second conductive member 14. The shorting structure 4 of the present embodiment is located inside the first and second conductive members 13 and 14, respectively, so as to facilitate connection with each other at the first and second portions.
Further, the first part is a hook 41, and the second part is a buckle 42. The hook 41 and the buckle 42 of the present embodiment can realize the fast overlapping and separating of the first part and the second part, and simultaneously keep the buckle 42 and the hook 41 relatively stable after overlapping, even if the circuit testing device moves, is in a flat or vertical state during testing, the two will not be separated easily.
In some embodiments, as shown in fig. 1 to 4, the sheet structure has a strip region 15, the strip region 15 extends from the connection end 12 to the contact end 11, and the first conductive member 13 has a through-threaded hole 16 in a thickness direction. The first portion includes an adjusting bolt 43 corresponding to the threaded through hole 16, a threaded end of the adjusting bolt 43 is inserted into the threaded through hole 16 in a direction toward the second conductive member 13, and the second portion includes a breaking block 44, and the breaking block 44 is fitted in the band-shaped region 15 of the second conductive member 14. The position of the break-off block 44 is configured such that when the shorting structure 4 is in the broken state, the break-off block 44 slides to a position corresponding to the adjustment bolt 43, and when the shorting structure 4 is in the conductive state, the break-off block 44 slides to a position offset from the adjustment bolt 43. In the embodiment, the adjusting bolt 43 and the breaking sleeve 44 sliding in the strip-shaped region 15 are utilized to realize that when the short-circuit structure 4 is in a conducting state in the first circuit, the adjusting bolt 43 abuts against the breaking sleeve 44, so that the adjusting bolt 43 and the conductive member 1 are prevented from being in short circuit with each other. When the circuit under test is discharged, the disconnection block 44 is moved to another position (e.g., a dot-dashed line position shown at 44' in fig. 1), so that the adjustment bolt 43 can be electrically connected to the second conductive member 13.
Specifically, in the present embodiment, the contact distance between the first conductive member 13 and the second conductive member 14 is adjusted by using the adjusting bolt 43, and after the adjusting bolt 43 is screwed into the threaded through hole 16, as the adjusting bolt 43 is continuously screwed in, the threaded end of the adjusting bolt 43 abuts against the second conductive member 14. As the adjustment bolt 43 is further screwed in, the distance between the first conductive member 13 and the second conductive member 14 is gradually increased by the adjustment bolt 43. The tightening end of the adjusting screw 43, which is opposite to the threaded end (the hexagonal part of the adjusting screw 43 shown in fig. 1), is located on the side away from the second conductive member 14, so that the operator can adjust the distance between the contacts on the circuit to be tested. During the discharging operation, the adjusting bolt 43 may be directly abutted against the second conductive member 14, and the adjusting bolt 43 may conduct the first conductive member 13 and the second conductive member 14 to each other. For this reason, the material of the adjusting bolt 43 in this embodiment should be a conductive material, for example, a more general GB/T5783 hexagon head full thread bolt may be selected, and the length may be selected according to the adjusting distance between the 2 contact ends 11. In order to ensure an opening angle between the first conductive member 13 and the second conductive member 14 and to prevent a short circuit between the first conductive member 13 and the second conductive member 14 during a charging operation, a disconnection block 44 is provided between the adjustment bolt 43 and the second conductive member 14. The material of the break-away block 44 may be plastic or rubber with poor conductivity.
Further, the first conductive member 13 is further provided with a boss 17 protruding from the surface of the first conductive member 13 at the position of the threaded through hole 16, when the first conductive member 13 is thinner, there is no space for providing a thread with a sufficient length, and at this time, the length of the thread can be increased by using the boss 17, so that the contact area between the adjusting bolt 43 and the threaded through hole 16 is larger, and the adjusting bolt 43 and the first conductive member 13 are prevented from being disengaged from each other when the opening angle is adjusted.
It is easily understood that the shorting structure 4 in this embodiment is composed of an adjusting bolt 43 and a break-away block 44, and the adjusting bolt 43 and the break-away block 44 can achieve 2 functions. Firstly, the opening distance of the first conductive member 13 and the second conductive member 14 is adjusted by the adjusting bolt 43, and the distance of the 2 contact terminals 11 can be accurately adjusted along with the continuous screwing of the adjusting bolt 43. Meanwhile, the opening angle can be kept stable after the 2 contact ends 11 are opened. The need for the operator to hold the 2 contact ends open with hand strength in the above-described embodiment is avoided. On the other hand, a circuit board of a 3C electronic product may integrate a lot of electrical components, and an operator may test a plurality of groups of test contacts in a test stage, and may be confused when switching contacts at different positions, so that the position of the contact to be tested cannot be found quickly. The adjusting bolt 43 in this embodiment is used to fix the opening distance, so that the contact position of the current circuit to be tested can be quickly found by using the circuit testing device. Second, the adjusting bolt 43 is used in conjunction with the break-away block 44 during the charging phase in this embodiment, so that the first conductive member 13 and the second conductive member 14 are not shorted when they are opened.
Preferably, when the circuit testing device of the present embodiment switches between the charging state and the discharging state, since the adjusting bolt 43 abuts against different positions (the breaking sleeve 44 and the second conductive member 14), the distance between the 2 contact ends 11 changes, which affects the measurement of the circuit to be tested. For this purpose, a scale can be provided in the axial direction of the adjusting screw 43 for recording its screwing depth in order to compensate for the varying distance of the 2 contact ends 11 when changing from the charging state to the discharging state. Before the test, the thickness of the side wall of the break-away sleeve block 44, that is, the distance of the decrease of 2 contact ends after the break-away sleeve block 44 moves from the corresponding position of the adjusting bolt 43 to the staggered position of the adjusting bolt 43, can be recorded in advance. The scale may be a plurality of equidistant marker points 431 (shown as an enlarged area in fig. 2) marked axially along the adjustment bolt 43. For example, the pitch of each marker point 431 may be 1mm and the thickness of the sidewall of break-away pocket 44 may be 2 mm. When the circuit testing device is switched from the charging state to the discharging state, the operator can continue to screw the adjusting screw into the 2 marking points 431 as compensation for the reduced distance.
Further, the second portion further includes a conducting sleeve block 45, the conducting sleeve block 45 and the disconnecting sleeve block 44 are together sleeved on the belt-shaped area 15 of the second conductive member 14, and when the shorting structure 4 is in a conducting state, the conducting sleeve block 45 slides to a position corresponding to the adjusting bolt 43. In the above embodiment, the distance of the 2 contact ends is reduced after the break away pocket 44 is removed. For this reason, the conducting block 45 in this embodiment may move to the position where the breaking block 44 is originally disposed after the breaking block 44 is removed, so that the first conductive member 13 and the second conductive member 14 may be electrically connected to each other when the circuit testing apparatus discharges the circuit to be tested. The conductive block 45 may be made of a conductive material similar to or the same as the first conductive member 13 and the second conductive member 14, such as a conductive metal, e.g., copper, iron, aluminum, or iron alloy. Meanwhile, the size of the on pocket block 45 is configured to be the same as that of the off pocket block 44.
In some embodiments, as shown in fig. 1 to 6, the circuit testing apparatus described above may be further electrically connected to an oscilloscope, and two ends of the oscilloscope may be respectively connected to 2 contacts of the circuit testing apparatus, so as to monitor the charging and discharging states of the circuit to be tested. For example, when the circuit testing device charges the circuit to be tested, the oscilloscope may detect the current value of the circuit to be tested, and after the current value reaches a predetermined range, the switch 31 of the circuit testing device is turned off and removed from the circuit to be tested to complete the charging operation. In the discharging stage, the current may also be detected by using an oscilloscope, which is similar to the charging state and is not described again. By matching the oscilloscope with the circuit testing device of the embodiment, the use time of the circuit testing device can be accurately controlled, and the electronic elements of the tested circuit can be further protected.
The circuit testing apparatus in the above embodiment can perform measurement on the circuit under test as follows. In some embodiments, the circuit under test shown in fig. 6 is taken as an example. Firstly, according to the distance between 2 contacts of the tested circuit, the opening amount of 2 contact ends 11 of the tested current is adjusted by screwing the adjusting bolt 43 into the distance, wherein the threaded end of the adjusting bolt 43 is abutted against the disconnecting sleeve block 44. The 2 contacts of the circuit testing device are respectively abutted against the 2 corresponding contacts of the tested circuit, namely two ends of the filter capacitor. Meanwhile, two contact terminals of the oscilloscope are also respectively connected to 2 contact positions of the tested circuit. Secondly, the switch 31 is opened to make the first loop conductive, and simultaneously, the circuit testing device is ensured to charge the tested circuit. At this time, the current of the circuit to be detected is continuously monitored by using the oscilloscope, and when the current of the circuit to be detected reaches the preset charging current, the switch 31 is switched off to disconnect the first loop, so that the charging operation is completed. And thirdly, sliding the disconnecting sleeve block 44 to a position staggered with the adjusting bolt 43, sliding the conducting sleeve block 45 to the position of the original disconnecting sleeve block 44, enabling the circuit testing device to be in a short-circuit state by the adjusting bolt 43 abutting against the conducting sleeve block 45, and keeping the sizes of the disconnecting sleeve block 44 and the conducting sleeve block 45 consistent, so that the opening amount of the contact end 11 of the circuit testing device can be kept the same after the positions of the disconnecting sleeve block and the conducting sleeve block are changed. And finally, in the discharging stage of the tested circuit, continuously detecting the residual electric quantity of the tested circuit by using an oscilloscope until the current of the tested circuit is reduced to zero, and finishing the discharging operation.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (8)

1. A circuit testing device, characterized in that the circuit testing device comprises:
a connecting part (2);
a shorting structure (4);
a charging member (3) including a switch (31) and a power source (32) electrically connected to the switch (31);
a plurality of conductive members (1), the plurality of conductive members (1) being arranged at intervals, the plurality of conductive members (1) being electrically connected by the charging member (3), the plurality of conductive members (1) being electrically connected by the short circuit structure (4), the conductive members (1) having contact terminals (11) and connection terminals (12) arranged opposite to each other, the connection terminals (12) being connected to each other by the connection part (2);
the short-circuit structure (4) is electrically connected with one area of the conductive pieces (1), the charging component (3) is electrically connected with the other area of the conductive pieces (1), the short-circuit structure (4) is conducted in a discharging state to enable the plurality of conductive pieces (1) to be equal in potential, the switch (31) is conducted in a charging state to enable the charging component (3) to form a potential difference between the plurality of conductive pieces (1);
The plurality of conductive pieces (1) comprise a first conductive piece (13) and a second conductive piece (14), and the first conductive piece (13) and the second conductive piece (14) are of sheet structures;
the short-circuit structure (4) comprises a first part and a second part which are arranged in pairs, wherein the first part and the second part are respectively arranged on the first conductive piece (13) and the second conductive piece (14) and face to opposite sides of the first conductive piece (13) and the second conductive piece (14), and the first part and the second part are mutually overlapped and separated to realize the connection and disconnection of the first conductive piece (13) and the second conductive piece (14);
the sheet-like structure having a strip-like region (15), the strip-like region (15) extending from the connection end (12) to the contact end (11), the first conductive member (13) having a threaded through-hole (16);
the first part comprises an adjusting bolt (43) corresponding to the threaded through hole (16), the adjusting bolt (43) is arranged in the threaded through hole (16) along the direction towards the second conductive piece (14), the second part comprises a breaking sleeve block (44), and the breaking sleeve block (44) is sleeved on the strip-shaped area (15) of the second conductive piece (14);
the position of the disconnecting sleeve block (44) is configured in such a way that when the short-circuit structure (4) is in a disconnected state, the disconnecting sleeve block (44) slides to a position corresponding to the adjusting bolt (43), and when the short-circuit structure (4) is in a connected state, the disconnecting sleeve block (44) slides to a position staggered from the adjusting bolt (43).
2. The circuit testing device according to claim 1, characterized in that the charging member (3) is electrically connected to the vicinity of the contact terminal (11), and the shorting structure (4) is electrically connected to the vicinity of the connection terminal (12); or
The short-circuit structure (4) is electrically connected to the vicinity of the contact terminal (11), and the charging member (3) is electrically connected to the vicinity of the connection terminal (12).
3. The circuit testing device of claim 1,
the connecting portion (2) is sandwiched between the first conductive member (13) and the second conductive member (14) so that 2 of the contact ends (11) on the first conductive member (13) and the second conductive member (14) have an expanding and contracting amount.
4. A circuit testing device according to claim 3, characterized in that said first electrically conductive member (13) and said second electrically conductive member (14) are arranged in the thickness direction of said sheet-like structure.
5. The circuit testing device of claim 3, wherein the connection portion comprises:
a battery groove (21), wherein the battery groove (21) is arranged at the position of the connecting part (2) facing to the opposite side of the first conductive member (13) and the second conductive member (14).
6. A circuit testing device according to claim 3, characterized in that the switch (31) comprises a push button, which is provided protruding on a side of the first electrically conductive member (13) facing away from the second electrically conductive member (14).
7. The circuit testing device of claim 1, wherein the first portion is a snap (41) and the second portion is a snap (42).
8. The circuit testing device of claim 1, wherein the second portion further comprises:
and the conduction sleeve block (45) is sleeved on the second conductive piece (14) and is arranged in the belt-shaped area (15), and when the short-circuit structure (4) is in a conduction state, the conduction sleeve block (45) slides to a position corresponding to the adjusting bolt (43).
CN202210417865.2A 2022-04-21 2022-04-21 Circuit testing device Active CN114545210B (en)

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CN208270604U (en) * 2017-12-30 2018-12-21 广东思诺伟智能技术有限公司 A kind of contact adjustment structure of the component debugger for pcb board
CN209104396U (en) * 2018-12-06 2019-07-12 首瑞(天津)电气设备有限公司 A kind of conductive fixture
CN213240217U (en) * 2020-07-16 2021-05-18 中广核核电运营有限公司 Short circuit clamp and short circuit device
CN216209521U (en) * 2021-09-26 2022-04-05 西门子电站自动化有限公司 Test circuit connecting device for switching value input signal channel test

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6252410B1 (en) * 1999-01-29 2001-06-26 Taiwan Semiconductor Manufacturing Company, Ltd Pico fuse open or short detector tool
US6623314B1 (en) * 2002-07-29 2003-09-23 Midtronics, Inc. Kelvin clamp for electrically coupling to a battery contact
GB2449950A (en) * 2007-06-08 2008-12-10 Powertech Ind Co Ltd Extendible Electrically Conductive Device and socket Device
CN108267654A (en) * 2017-12-30 2018-07-10 广东思诺伟智能技术有限公司 A kind of component debugger for pcb board
CN208270604U (en) * 2017-12-30 2018-12-21 广东思诺伟智能技术有限公司 A kind of contact adjustment structure of the component debugger for pcb board
CN209104396U (en) * 2018-12-06 2019-07-12 首瑞(天津)电气设备有限公司 A kind of conductive fixture
CN213240217U (en) * 2020-07-16 2021-05-18 中广核核电运营有限公司 Short circuit clamp and short circuit device
CN216209521U (en) * 2021-09-26 2022-04-05 西门子电站自动化有限公司 Test circuit connecting device for switching value input signal channel test

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