CN114487909A - Short circuit detection method and system for test interface unit - Google Patents

Abstract

The present disclosure provides a short detection method for a test interface unit having a plurality of test pins, the method comprising: contacting a plurality of test pins of the test interface unit with a plurality of contacts of a package unit to be tested; determining whether a short circuit exists in a plurality of test pins of the test interface unit; and if the short circuit exists in the plurality of test pins of the test interface unit, determining the position of the short-circuited pin in the plurality of test pins of the test interface unit. The present disclosure also provides a short circuit detection system for testing an interface unit.

Description

Short circuit detection method and system for test interface unit

Technical Field

The present disclosure relates generally to the field of post-package testing and, more particularly, to a short detection method and system for testing interface units.

Background

After the semiconductor device is packaged, various electrical function tests are performed on the package unit (e.g., CPU, south bridge chip, north bridge chip, etc.) using a Test Interface Unit (TIU) to measure whether the electrical functions of the package unit satisfy design requirements. And selecting corresponding test interface units aiming at different packaging units, wherein the test interface units are provided with a plurality of test pins with the interval of micron order. As shown in fig. 1(a), when the package unit 110 is electrically tested using the test interface unit 100, the test pins 120 of the test interface unit 100 are brought into close contact with the contacts 130 of the package unit 110 to be tested. Various electrical functional tests of the package unit under test 110 are then completed by applying corresponding electrical signals to the test interface unit 100.

When the package unit is tested using the test interface unit, a force needs to be applied to bring the test pins of the test interface unit into close contact with the contacts of the package unit to be tested. However, with the frequent use of the test interface unit, the test pins of the test interface unit may be deformed. In this case, when a force is applied such that the test pins of the test interface unit are brought into close contact with the contacts of the package unit to be tested, two (or more) test pins of the test interface unit may contact each other. As shown in fig. 1(b), the two test pins 120 on the left side of the test interface unit 100 are contacted, thereby causing a short circuit of the test interface unit 100, and further failing to complete the electrical function test of the package unit under test 110 by using the test interface unit 100.

In order to eliminate the deformation of the test pins of the test interface unit, a technician is required to manually correct the test pins of the test interface unit. Since the number of test pins of the test interface unit is thousands, it is time consuming to manually perform the calibration by a technician, and such long repetitive labor may be annoying. In addition, such manual calibration is performed without the test pins of the test interface unit coming into contact with the contacts of the package unit to be tested. Therefore, even after all the test pins of the test interface unit are manually corrected, it cannot be guaranteed that the corrected test pins do not cause short-circuiting of the test pins when the test pins are again in contact with the contacts of the package unit.

Therefore, there is a need for a short circuit detection method and system for a test interface unit, which can accurately detect whether a test pin of the test interface unit is short-circuited or not in a state where the test pin of the test interface unit is in contact with a contact of a package unit to be tested before a test interface unit is used to perform various electrical function tests on the package unit to be tested.

Disclosure of Invention

According to an embodiment of the present disclosure, there is provided a short detection method for a test interface unit having a plurality of test pins, the method including: contacting a plurality of test pins of the test interface unit with a plurality of contacts of a package unit to be tested; determining whether a short circuit exists in a plurality of test pins of the test interface unit; and if the short circuit exists in the plurality of test pins of the test interface unit, determining the position of the short-circuited pin in the plurality of test pins of the test interface unit.

In some embodiments, the method further comprises removing a shorted pin of the plurality of test pins of the test interface unit.

In some embodiments, determining the location of the shorted pin of the plurality of test pins of the test interface unit comprises: connecting the test interface unit to a power supply; and determining a test pin, which is visibly changed, among the plurality of test pins of the test interface unit as a short-circuited pin.

In some embodiments, the voltage of the power supply is 10V and the test interface unit is connected to the power supply for 2-5 seconds.

In some embodiments, determining whether a short exists in a plurality of test pins of a test interface unit by connecting the test interface unit to a resistance measurement unit.

In some embodiments, the resistance measurement unit is a multimeter or an ohmmeter.

According to an embodiment of the present disclosure, there is provided a short detection system for a test interface unit having a plurality of test pins, the system including: the test platform is used for bearing a to-be-tested packaging unit, and the to-be-tested packaging unit is provided with a plurality of contacts; the test interface unit is provided with a plurality of test pins which are contacted with a plurality of contacts of the packaging unit to be tested; the resistance measuring unit is connected to the test interface unit to determine whether a short circuit exists in a plurality of test pins of the test interface unit; and the power supply is used for being connected to the test interface unit when the short circuit exists in the plurality of test pins of the test interface unit so as to determine the position of the short-circuited pin in the plurality of test pins of the test interface unit.

In some embodiments, the resistance measurement unit is a multimeter or an ohmmeter.

In some embodiments, determining the location of the shorted pin of the plurality of test pins of the test interface unit comprises: connecting the test interface unit to the power supply; and determining a test pin, which is visibly changed, among the plurality of test pins of the test interface unit as a short-circuited pin.

In some embodiments, the voltage of the power supply is 10V and the test interface unit is connected to the power supply for 2-5 seconds.

Drawings

The accompanying drawings, which are incorporated herein and form a part of the specification, illustrate embodiments of the present disclosure and, together with the description, further serve to explain the principles of the disclosure and to enable a person skilled in the pertinent art to make and use the disclosure.

FIG. 1(a) is a schematic view showing that test pins of a test interface unit are brought into close contact with contacts of a package unit to be tested and the test pins of the test interface unit are not shorted;

FIG. 1(b) is a schematic view showing that a test pin of a test interface unit is brought into close contact with a contact of a package unit to be tested and a short circuit occurs in the test pin of the test interface unit;

2(a) -2(b) show schematic diagrams of a short detection method for testing an interface unit according to an embodiment of the present disclosure;

FIG. 3 illustrates a flow chart of a short detection method for testing an interface unit according to an embodiment of the present disclosure;

FIG. 4 is a schematic diagram illustrating a test pin of a short in a test interface unit that will become visible after short detection of the test interface unit using a short detection method for testing the interface unit according to an embodiment of the disclosure; and

FIG. 5 shows a block diagram of a short detection system for testing interface units according to an embodiment of the present disclosure.

Embodiments will be described with reference to the accompanying drawings.

Detailed Description

The subject matter described herein will now be discussed with reference to example embodiments. It should be understood that these embodiments are discussed only to enable those skilled in the art to better understand and thereby implement the subject matter described herein, and are not intended to limit the scope, applicability, or examples set forth in the claims. Changes may be made in the function and arrangement of elements discussed without departing from the scope of the disclosure. Various examples may omit, substitute, or add various procedures or components as needed. For example, the described methods may be performed in an order different from that described, and various steps may be added, omitted, or combined. In addition, features described with respect to some examples may also be combined in other examples.

It is noted that references in the specification to "one embodiment," "an embodiment," "some embodiments," etc., indicate that the embodiment described may include a particular feature, structure, or characteristic, but every embodiment may not necessarily include the particular feature, structure, or characteristic. Moreover, such phrases are not necessarily referring to the same embodiment. Further, when a particular feature, structure, or characteristic is described in connection with an embodiment, it is submitted that it is within the knowledge of one skilled in the relevant art to effect such feature, structure, or characteristic in connection with other embodiments whether or not explicitly described.

Embodiments herein may be described with reference to the accompanying drawings. Unless explicitly stated, the dimensions of the figures are intended to simplify the examples, rather than to describe relative dimensions. For example, the various lengths/widths/heights of elements in the drawings may not be drawn to scale unless otherwise indicated.

Embodiments of a short detection method and system for testing an interface unit according to the present disclosure will now be described with reference to the accompanying drawings.

Fig. 2(a) -2(b) show schematic diagrams of a short detection method for testing an interface unit according to an embodiment of the disclosure, and fig. 3 shows a flowchart of a short detection method 300 for testing an interface unit according to an embodiment of the disclosure. A method for short detection for a test interface unit according to an embodiment of the present disclosure will now be described with reference to fig. 2(a) -2(b) and fig. 3.

As shown in fig. 3, a short detection method 300 for testing interface units according to an embodiment of the present disclosure begins with step S310: and contacting a plurality of test pins of the test interface unit with a plurality of contacts of the package unit to be tested. For example, the package unit to be tested may be any one of a CPU, a south bridge chip, a north bridge chip, a Ball Grid Array (BGA), and the like.

As shown in fig. 2(a), the test interface unit 200 has a plurality of test pins 220, the package unit to be tested 210 has a plurality of contacts 230, and the plurality of test pins 220 of the test interface unit 200 are in contact with the plurality of contacts 230 of the package unit to be tested 210. Only three test pins 220 and three contacts 230 are shown in fig. 2(a) as an example, and the two test pins 220 on the left side of the test interface unit 200 are also in contact with each other in the case of being in contact with the contacts 230 of the package unit to be tested 210, respectively, thereby causing a short circuit of the test interface unit 200. In the case where the test interface unit 200 is short-circuited, the test interface unit 200 cannot be used to perform various electrical function tests on the package unit under test 210.

Next, the method 300 proceeds to step S320: determining whether a short circuit exists in a plurality of test pins of the test interface unit. As shown in fig. 2(a), a resistance measurement unit 240 is utilized to determine whether there is a short circuit in a plurality of test pins 220 of the test interface unit 200. If there is a short in the plurality of test pins 220 of the test interface unit 200, the resistance measurement unit 240 measures the resistance to be zero. In one embodiment, the resistance measurement unit 240 may be any one of a multimeter or an ohmmeter.

Next, as shown in fig. 3, if it is determined in step S320 that there is a short circuit in the plurality of test pins 220 of the test interface unit 200, the method 300 proceeds to step S330: determining a location of a shorted pin of a plurality of test pins of the test interface unit. As shown in fig. 2(b), in the case where the plurality of test pins 220 of the test interface unit 200 are in contact with the plurality of contacts 230 of the package unit to be tested 210, the test interface unit 200 is connected to the power supply 250. If there is a short circuit in a plurality of test pins 220 (e.g., the two test pins 220 on the left) of the test interface unit 200, the current flowing through the shorted test pins 220 causes the shorted test pins 220 to heat up, even melt. In this case, the heat generation of the test pin 220 causes the test pin to visually change, for example, to turn whitish. FIG. 4 is a schematic diagram illustrating a test pin of a short circuit in a test interface unit that becomes visible after the test interface unit is short-circuit detected by a short circuit detection method for the test interface unit according to an embodiment of the disclosure. As shown in fig. 4, R denotes the package unit to be tested 210. After the test interface unit 200 is connected to the power supply 250, current flows through the shorted test pin 220, causing the shorted test pin 220 to heat up or even melt, thereby creating a visible change at the shorted test pin 220. For example, as shown in the enlarged view of the lower test interface unit 200 in fig. 4, the test pins 220 of the test interface unit 200 are made of rhodium alloy, the test pins 220 that are not short-circuited are gray and do not change, and the test pins 220 that are short-circuited become whitish (three short-circuited pins 220 are shown in fig. 4 and are respectively included in the circles 410, 420, and 430), so that the positions of the short-circuited test pins 220 can be visually observed.

In one embodiment, the voltage of the power supply 250 is 10V and the time that the test interface unit 200 is connected to the power supply 250 lasts 2-5 seconds. It will be apparent to those skilled in the art that the voltage of the power supply 250 and the duration of time that the test interface unit 200 is connected to the power supply 250 may be selected according to the material of the test pins 220.

As shown in fig. 3, if it is determined in step S320 that there is no short circuit in the plurality of test pins of the test interface unit, the method 300 proceeds to step S340: and utilizing the test interface unit to carry out electrical function test on the packaging unit to be tested. That is, only when there is no short circuit in the plurality of test pins of the test interface unit, the test interface unit can be used to perform various electrical function tests on the package unit to be tested.

As shown in fig. 3, after determining the location of the shorted pin among the plurality of test pins of the test interface unit, the method 300 proceeds to step S350: and removing the short-circuited pin in the plurality of test pins of the test interface unit. The test interface unit typically has a plurality of test pins belonging to a plurality of different channels, and removing a few short-circuited test pins in one channel does not affect the use of the test interface unit.

FIG. 5 shows a block diagram of a short detection system 500 for testing interface units according to an embodiment of the present disclosure. As shown in fig. 5, the short detection system 500 for a test interface unit includes a test platform 510, a package unit to be tested 520, a test interface unit 530, a resistance measurement unit 540, and a power supply 550.

The test platform 510 is used for carrying the packaged unit to be tested 520. As described above, the package unit to be tested 520 may be any one of a CPU, a south bridge chip, a north bridge chip, a Ball Grid Array (BGA), and the like, which the present disclosure is not limited thereto. The test interface unit 530 has a plurality of test pins, and the plurality of test pins of the test interface unit 530 are brought into close contact with the plurality of contacts of the package unit 520 to be tested when the test pins of the test interface unit 530 are used to perform various electrical function tests on the package unit 520 to be tested.

Before the test interface unit 530 is used to perform various electrical function tests on the package unit 520 to be tested, the resistance measurement unit 540 is connected to the test interface unit 530 to determine whether there is a short circuit in a plurality of test pins of the test interface unit 530. If there is a short in the plurality of test pins of the test interface unit 530, the resistance measured by the resistance measurement unit 540 is close to zero. As described above, the resistance measurement measuring unit 540 may be any one of a multimeter or an ohmmeter, but the present disclosure is not limited thereto.

After detecting, by the resistance measuring unit 540, that there is a short-circuited test pin among the plurality of test pins of the test interface unit 530, the power supply 550 is connected to the test interface unit 530 to determine a location of the short-circuited pin among the plurality of test pins of the test interface unit 530. As described above, when the test interface unit 530 is connected to the power supply 550, current flows through the shorted test pin 220, causing the shorted test pin to heat up and even melt, thereby producing a visible change, such as whitening, at the shorted test pin. It will be apparent to those skilled in the art that the appropriate power supply may be selected depending on the material of the test pin.

According to the short-circuit detection method and system for the test interface unit, before the test interface unit is used for testing various electrical functions of the packaging unit to be tested, whether the test pin of the test interface unit is short-circuited or not can be accurately detected under the condition that the test pin of the test interface unit is in contact with the contact of the packaging unit to be tested. Compared with the test pins of the existing manual correction test interface unit, the test pin testing device greatly saves time and can accurately detect all short-circuited test pins under the condition that the test pins of the test interface unit are in contact with the contacts of the to-be-tested packaging unit at one time.

It should be noted that not all steps and units in the above flows and system structure diagrams are necessary, and some steps or units may be omitted according to actual needs. The execution order of the steps is not fixed, and can be determined as required. The apparatus structures described in the above embodiments may be physical structures or logical structures, that is, some units may be implemented by the same physical entity, or some units may be implemented by a plurality of physical entities, or some units may be implemented by some components in a plurality of independent devices.

The previous description of the disclosure is provided to enable any person skilled in the art to make or use the disclosure. Various modifications to the disclosure will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other variations without departing from the scope of the disclosure. Thus, the disclosure is not intended to be limited to the examples and designs described herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (10)

1. A short detection method for a test interface unit having a plurality of test pins, the method comprising:

contacting a plurality of test pins of the test interface unit with a plurality of contacts of a package unit to be tested;

determining whether a short circuit exists in a plurality of test pins of the test interface unit; and

and if the short circuit exists in the plurality of test pins of the test interface unit, determining the position of the short-circuited pin in the plurality of test pins of the test interface unit.

2. The short detection method of claim 1, further comprising removing a shorted pin of the plurality of test pins of the test interface unit.

3. The short-circuit detection method of claim 1, wherein determining the location of the shorted pin of the plurality of test pins of the test interface unit comprises:

connecting the test interface unit to a power supply; and

and determining a test pin with visible change in the plurality of test pins of the test interface unit as a short-circuited pin.

4. The short circuit detection method of claim 3, wherein the voltage of the power supply is 10V and the test interface unit is connected to the power supply for 2-5 seconds.

5. The short detection method of claim 1, wherein determining whether there is a short in a plurality of test pins of a test interface unit is performed by connecting the test interface unit to a resistance measurement unit.

6. The short circuit detection method according to claim 5, wherein the resistance measurement unit is a multimeter or an ohmmeter.

7. A short detection system for a test interface unit having a plurality of test pins, the system comprising:

the test platform is used for bearing a to-be-tested packaging unit, and the to-be-tested packaging unit is provided with a plurality of contacts;

the test interface unit is characterized in that a plurality of test pins of the test interface unit are contacted with a plurality of contacts of the packaging unit to be tested;

the resistance measuring unit is connected to the test interface unit to determine whether a short circuit exists in a plurality of test pins of the test interface unit; and

the power supply is used for being connected to the test interface unit when the short circuit exists in the plurality of test pins of the test interface unit so as to determine the position of the short-circuited pin in the plurality of test pins of the test interface unit.

8. The short circuit detection system of claim 7, wherein the resistance measurement unit is a multimeter or ohmmeter.

9. The short detection system of claim 7, wherein determining the location of the shorted pin of the plurality of test pins of the test interface unit comprises:

connecting the test interface unit to the power supply; and

and determining a test pin with visible change in the plurality of test pins of the test interface unit as a short-circuited pin.

10. The short detection system of claim 9, wherein the voltage of the power supply is 10V and the test interface unit is connected to the power supply for 2-5 seconds.

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