CN114461476A - Memory bank fault detection method, device and system - Google Patents

Memory bank fault detection method, device and system Download PDF

Info

Publication number
CN114461476A
CN114461476A CN202210134713.1A CN202210134713A CN114461476A CN 114461476 A CN114461476 A CN 114461476A CN 202210134713 A CN202210134713 A CN 202210134713A CN 114461476 A CN114461476 A CN 114461476A
Authority
CN
China
Prior art keywords
memory bank
information
memory
address
numbering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202210134713.1A
Other languages
Chinese (zh)
Other versions
CN114461476B (en
Inventor
刘辉
刘俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Yuanchuang Storage Technology Co ltd
Original Assignee
Shenzhen Yuanchuang Storage Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Yuanchuang Storage Technology Co ltd filed Critical Shenzhen Yuanchuang Storage Technology Co ltd
Priority to CN202210134713.1A priority Critical patent/CN114461476B/en
Publication of CN114461476A publication Critical patent/CN114461476A/en
Application granted granted Critical
Publication of CN114461476B publication Critical patent/CN114461476B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/32Monitoring with visual or acoustical indication of the functioning of the machine
    • G06F11/324Display of status information
    • G06F11/327Alarm or error message display

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)

Abstract

The invention provides a method, a device and a system for detecting faults of a memory bank, wherein the method comprises the following steps: arranging a memory bank fault detection device, and connecting the detection device with memory bank installation equipment to construct a memory bank monitoring channel; grading the integrated fragments of the memory chip through the memory monitoring channel to obtain grade fragments; address calibration is carried out on bit storage grids in the level fragments, numbering and sequencing are carried out on the level fragments and the bit storage grids, and a numbering result is obtained; according to the numbering result, whether the information processing work of the memory bank numbering address is normal or not is judged, the judgment result is obtained, and the abnormal result is subjected to alarm display.

Description

Memory bank fault detection method, device and system
Technical Field
The invention relates to the technical field of memory bank detection, in particular to a memory bank fault detection method, device and system.
Background
At present, with the continuous development of the integrated circuit manufacturing process and the gradual reduction of the semiconductor size, the density of the memory is getting higher, especially with the rapid increase of the complexity of the memory bank, the probability of the failure of the memory bank is getting higher, the types of the failure are getting more, the detection of the failure of the memory bank is getting more and more complex, the detection time is getting longer, and the detection cost is getting higher, in addition, most of the memory bank detection technologies are the detection of the failure of the external structures such as the memory bank installation connection, and the detection technology is too monotonous, for example, CN 2015104719-a detection device and method for rapidly positioning the failed memory bank, the memory failure code table is established according to the condition of the server motherboard, and a BIOS platelet is externally connected to the server motherboard, the memory failure detection is performed in the PEI memory self-test stage of the server motherboard code, the fault memory code is displayed through the nixie tube small plate, and then the code displayed by the nixie tube small plate is compared with the memory fault code table to detect the memory bank fault.
Disclosure of Invention
The invention provides a method, a device and a system for detecting faults of a memory bank, which are used for solving the problems, and the invention realizes the detection of the internal faults by carrying out grade division and address calibration on integrated fragments and bit storage grids inside the memory bank by constructing a memory bank monitoring channel, can carry out quick alarm display on a detection result, saves the detection time and avoids the loss of memory bank information caused by inaccurate fault detection and other reasons.
1. A memory bank fault detection method comprises the following steps:
arranging a memory bank fault detection device, and connecting the detection device with memory bank installation equipment to construct a memory bank monitoring channel;
grading the integrated fragments of the memory chip through the memory monitoring channel to obtain grade fragments;
address calibration is carried out on bit storage grids in the level fragments, numbering and sequencing are carried out on the level fragments and the bit storage grids, and a numbering result is obtained;
and judging whether the information processing work of the memory bank numbering address is normal or not according to the numbering result, acquiring a judgment result, and carrying out alarm display on an abnormal result.
As an embodiment of the present invention: set up DRAM fault detection device to be connected detection device and DRAM erection equipment, construct DRAM monitoring channel, include:
connecting the set memory bank fault monitoring device with the memory bank mounting equipment, and performing primary fault prejudgment according to fault display of the memory bank mounting equipment to obtain a prejudgment result;
wherein, the prejudgment result comprises: a memory bank mechanical failure and a memory bank storage failure;
when the pre-judgment result shows that the memory bank is in a mechanical fault, fault feedback is carried out, and a detector carries out fault processing according to the fault feedback;
when the pre-judgment result shows that the memory bank storage fault exists, a memory bank channel monitoring mechanism is formulated, and a chip separation route in the memory bank is determined according to the memory bank channel monitoring mechanism through a memory bank detection device;
and determining an N-bit routing inspection route based on the chip separation route, and constructing a memory bank monitoring channel according to the N-bit routing inspection route.
As an embodiment of the present invention: when the prejudgment result shows that the memory bank storage fault occurs, a memory bank channel monitoring mechanism is formulated, and a memory bank monitoring channel is constructed through a memory bank detection device according to the memory bank channel monitoring mechanism, wherein the prejudgment result comprises the following steps:
performing data analysis on the memory bank technical index data displayed by the memory bank detection device according to a preset storage threshold value of the memory bank chip, and formulating a memory bank channel monitoring mechanism;
wherein, the memory bank channel monitoring mechanism comprises:
determining the number information lines of storage routes of the memory chips and the integrated chip fragments to generate chip separation routes;
the number information of the chip separation routes is represented by N bits, and N bit routing inspection routes are obtained;
recording memory information transmission time and information processing time of each routing inspection route based on the N-bit routing inspection routes, and performing equal-time section division on the memory information transmission time and the information processing time to obtain section time;
according to the section time, performing system sampling to obtain a section time sample, and performing data comparison on the section time sample with preset information transmission time and preset information processing time to obtain time difference value data;
monitoring whether the difference data is within a preset time error threshold value or not to obtain a monitoring result;
and on the basis of the monitoring result, when the difference data is not in a preset time error threshold value, carrying out fault detection on the route memory bank according to the N-bit routing inspection route.
As an embodiment of the present invention: through the memory bank monitoring channel, carry out grade division to the integrated burst of memory bank chip, obtain the grade burst, include:
acquiring fragmentation grade data according to a chip through the memory bank monitoring channel;
extracting information processing parameters of the chip fragments based on the fragment grade data, and performing fragment grade division according to the information processing parameters to obtain grade fragments;
dividing the chip integration fragments into three levels, wherein the three levels comprise: first-level slicing, second-level slicing and third-level slicing.
As an embodiment of the present invention: address calibration is carried out on bit storage lattices in the level fragments, numbering and sequencing are carried out on the level fragments and the bit storage lattices, and a numbering result is obtained, wherein the address calibration comprises the following steps:
performing address calibration on a bit storage grid in the level fragment, and executing memory addressing, wherein the address calibration comprises: calibrating a row address and a column address;
performing primary check detection on the storage grid data through a preset check code of the storage grid to obtain a primary detection result;
analyzing results based on the primary detection result, extracting checking error information, performing information exception classification storage management on the checking error information, and acquiring exception classification information;
sending the abnormal classification information to a memory bank fault detection device through a memory bank monitoring channel;
carrying out information marking indexing on the abnormal classification information, and numbering according to a, b and c to generate an index catalog;
numbering the bit storage grids according to 1, 2, 3,. to obtain numbered bit storage grids;
correspondingly matching the index directory with the number bit storage grid, and numbering according to 1-a/b/c, 2-a/b/c, 3-a/b/c.;
and storing the numbering sequence information of the numbering chip to obtain a numbering result.
As an embodiment of the present invention: performing address calibration on a bit storage grid in the level fragment, and executing memory addressing, wherein the address calibration comprises: the row address calibration and the column address calibration comprise the following steps:
the steps for performing memory addressing are as follows:
the method comprises the following steps: performing address calibration on a bit storage grid in the level fragment, wherein the address calibration comprises: calibrating a row address and a column address;
step two: recording the row address in a vertical coordinate signal, recording the column address in an abscissa signal, and acquiring horizontal and vertical coordinate signal information;
step three: based on the horizontal and vertical coordinate signal information, the memory bank fault detection device searches signal information through a memory bank monitoring channel, and locks address information through the signal information search;
step four: and performing address interpretation according to the address information, and determining whether the address information is a calibration address based on the address interpretation.
As an embodiment of the present invention: the judging whether the information processing work of the memory bank numbering address is normal or not according to the numbering result, obtaining the judging result and carrying out alarm display on the abnormal result comprises the following steps:
judging whether the information corresponding to the serial number works normally or not according to the serial number result to obtain a judgment result;
based on the judgment result, when the judgment result shows that the information storage time of the memory bank is abnormal, the voice alarm prompt for the abnormal information storage time is carried out through a memory bank fault detection device;
based on the judgment result, when the judgment result shows that the processing of the address information of the memory cell is abnormal, the memory cell fault detection device is used for carrying out voice alarm prompt on the abnormal address information of the memory cell;
based on the judgment result, when the judgment result shows that the information corresponding to the grading fragment number is abnormal, a voice alarm prompt for abnormal information corresponding to the number is carried out through a memory fault detection device;
and formulating a corresponding alarm processing scheme through different voice alarm prompts.
As an embodiment of the present invention: through different voice alarm prompts, formulate and correspond to report an emergency and ask for help or increased vigilance processing scheme, include:
according to the abnormal voice alarm prompt of the information storage time, a system operation repairing and reading speed changing scheme is formulated;
according to the abnormal voice alarm prompt of the address information of the memory grid, an insertion sequence scheme for adjusting the memory banks in the installation equipment is formulated;
and formulating a scheme for detecting the integrity of the serial number and re-matching the serial number information according to the abnormal voice alarm prompt of the information corresponding to the serial number.
As an embodiment of the present invention: the method comprises the following steps: the device comprises a data line, a display screen, a detection host and an alarm;
the display screen is embedded in the detection host, and the detection host is connected with the alarm and the memory bank installation equipment through data lines;
the alarm receives the abnormal detection data sent by the detection host through a data line and executes abnormal data alarm operation;
the detection host further comprises: and the channel monitor monitors the channel condition of the memory bank through connection.
As an embodiment of the present invention: the method comprises the following steps:
a channel building module: the device is used for setting a memory bank fault detection device, connecting the detection device with memory bank installation equipment and constructing a memory bank monitoring channel;
a fragment acquisition module: grading the integrated fragments of the memory chip through the memory monitoring channel to obtain grade fragments;
a numbering and sequencing module: address calibration is carried out on bit position storage grids in the grade fragments, numbering and sequencing are carried out on the grade fragments and the bit position storage grids, and numbering results are obtained
A judgment warning module: and judging whether the information processing work of the memory bank numbering address is normal or not according to the numbering result, acquiring a judgment result, and performing alarm display on an abnormal result.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by the practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and drawings.
The technical solution of the present invention is further described in detail by the accompanying drawings and embodiments.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a flow chart of a method for detecting a memory bank fault according to an embodiment of the present invention;
FIG. 2 is a diagram of a memory bank failure detection apparatus according to an embodiment of the present invention;
fig. 3 is a block diagram of a system for detecting a memory bank fault according to an embodiment of the present invention.
Detailed Description
The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are described herein for the purpose of illustration and explanation and not limitation.
Example 1:
the embodiment of the invention provides a memory bank fault detection method, which comprises the following steps:
arranging a memory bank fault detection device, and connecting the detection device with memory bank installation equipment to construct a memory bank monitoring channel;
grading the integrated fragments of the memory chip through the memory monitoring channel to obtain grade fragments;
address calibration is carried out on bit storage grids in the level fragments, numbering and sequencing are carried out on the level fragments and the bit storage grids, and a numbering result is obtained;
judging whether the information processing work of the memory bank numbering address is normal or not according to the numbering result, acquiring a judgment result, and carrying out alarm display on an abnormal result;
in one practical scenario: the detection of the fault of the memory bank is mainly to detect the installation and the insertion of the memory bank, and the detection system has the advantages that the detection of the fault of the memory bank is too simple, the specific position of the internal information processing and storage of the memory bank cannot be detected, and the fault of the memory bank caused by the overlong time of the information processing in the memory bank cannot be detected;
when the invention is implemented: firstly, connecting a memory bank fault device with memory bank installation equipment, monitoring chip fragments and bit storage grids in a memory bank through a built memory bank monitoring channel, judging whether the chip fragments and the bit storage grids are normal according to the monitored information condition, and displaying the fault position and the fault reason of the memory bank through alarming so as to finish the detection of the memory bank fault;
the beneficial effects of the above technical scheme are: the memory bank fault detection device has the advantages that the memory bank monitoring channel is constructed and the memory bank chip is subjected to hierarchical processing, the integrated fragments of the memory bank chip can be rapidly subjected to working conditions of the monitoring fragments through hierarchical division, the bit storage grid is the position for storing processing information and is subjected to address calibration, the calibrated address can be accurately positioned through the memory bank monitoring channel, and the specific position of information storage faults in the memory bank is alarmed and displayed through the memory bank fault detection device.
Example 2:
in one embodiment, the setting a memory bank fault detection device, and connecting the detection device with a memory bank installation device to construct a memory bank monitoring channel includes:
connecting the set memory bank fault monitoring device with the memory bank mounting equipment, and performing primary fault prejudgment according to fault display of the memory bank mounting equipment to obtain a prejudgment result;
wherein, the prejudgment result comprises: a memory bank mechanical failure and a memory bank storage failure;
when the pre-judgment result shows that the memory bank is in a mechanical fault, fault feedback is carried out, and a detector carries out fault processing according to the fault feedback;
when the pre-judgment result shows that the memory bank storage fault exists, a memory bank channel monitoring mechanism is formulated, and a chip separation route in the memory bank is determined according to the memory bank channel monitoring mechanism through a memory bank detection device;
determining an N-bit routing inspection route based on the chip separation route, and constructing a memory bank monitoring channel according to the N-bit routing inspection route;
in one practical scenario: when fault detection is needed for internal storage problems of a memory bank, the storage condition and the information storage path inside the memory bank need to be clear, but a memory bank monitoring path in the prior art is lacked, and when the fault problem of the memory bank is detected in the prior art, a method for constructing a memory bank monitoring channel is not mentioned, so that the fault detection of the memory bank is not comprehensive enough, and the detection position and the fault reason of the fault cannot be accurately known;
when the invention is implemented: firstly, primary judgment is carried out on the fault display through a memory bank fault detection device, the judgment result is divided into a memory bank mechanical fault and a memory bank storage fault, the memory bank mechanical fault can be detected by checking the installation and poor contact of the memory bank, the memory bank chip and integrated fragments thereof are divided and divided by constructing a memory bank monitoring channel for the memory bank storage fault, an information transmission processing route is determined, and the specific detection on the memory bank storage fault problem can be completed according to the generated N-bit routing inspection route;
the beneficial effects of the above technical scheme are: through constructing the memory bank monitoring channel, the information processing conditions in different routing inspection routes in the memory bank can be monitored through the channel, the chips on the memory bank are separated, the storage conditions on each route which can be organized can be monitored through the separation, the monitoring method is more convenient, the condition that the information stored on the memory bank chip is overlapped in monitoring is avoided, too much monitoring work is reduced, and the fault detection of the memory bank is more efficient.
Example 3:
in one embodiment, N bits represent the number information of chip separation routes to obtain N bits of routing inspection routes, and anomaly detection is performed according to the obtained routing inspection routes, so that the coordinates of information in the routes need to be determined for information detection in the routes, and the information coordinates are calculated according to the following formula:
Figure 78049DEST_PATH_IMAGE001
wherein,
Figure 714960DEST_PATH_IMAGE002
and
Figure 955625DEST_PATH_IMAGE003
the horizontal and vertical coordinates of the starting point of the information in the transmission process are represented;
Figure 109394DEST_PATH_IMAGE004
and
Figure 54610DEST_PATH_IMAGE005
the horizontal and vertical coordinates of the information at the transmission end point are represented;
Figure 178817DEST_PATH_IMAGE006
is shown in the routing inspection route
Figure 982694DEST_PATH_IMAGE007
The azimuth angle at the point;
Figure 508747DEST_PATH_IMAGE008
is shown in the total path length
Figure 121736DEST_PATH_IMAGE009
Integrating cosine values of the azimuth angles;
Figure 730309DEST_PATH_IMAGE010
is shown in the total path length
Figure 58916DEST_PATH_IMAGE009
Above, the cosine value of the azimuth is integrated.
The sine integral and the cosine integral of the azimuth angle are calculated by considering the corner curve in the routing inspection route, so that coordinate deviation exists, and the deviation of the azimuth angle can be eliminated through integral calculation;
for the azimuth angle
Figure 455787DEST_PATH_IMAGE006
The calculation method of (a) is as follows:
Figure 739875DEST_PATH_IMAGE011
wherein
Figure 104254DEST_PATH_IMAGE012
Representing an initial azimuth;
Figure 975565DEST_PATH_IMAGE013
and
Figure 473280DEST_PATH_IMAGE014
and the curvature of the starting point and the ending point of the curve element in the routing inspection route is shown.
Through the calculation, the coordinates of information transmission can be obtained, so that the fault information can be quickly positioned through the coordinates;
the working principle of the technical scheme is as follows: for the routing inspection route separated from the memory chip, the coordinate position of the information in the route can be determined, and when the coordinate calculation is carried out, the coordinate position is firstly set
Figure 947511DEST_PATH_IMAGE004
And
Figure 268028DEST_PATH_IMAGE005
the horizontal and vertical coordinates of the information at the transmission end point are shown, and then
Figure 201086DEST_PATH_IMAGE004
And
Figure 838129DEST_PATH_IMAGE005
and (3) calculating:
Figure 744247DEST_PATH_IMAGE015
(ii) a When calculating the horizontal and vertical coordinates, the determination is needed first
Figure 752392DEST_PATH_IMAGE002
And
Figure 242804DEST_PATH_IMAGE003
horizontal and vertical coordinates and azimuth angles of starting point of information in transmission process
Figure 186883DEST_PATH_IMAGE006
Integral calculation is carried out for azimuth
Figure 983675DEST_PATH_IMAGE006
Can be calculated by
Figure 29516DEST_PATH_IMAGE016
Calculating to obtain coordinate values, and determining the position according to the coordinate information;
the beneficial effects of the above technical scheme are: the information position can be rapidly determined by calculating the coordinates, so that the fault position point can be accurately found, the fault detection time of the memory bank is saved, and the loss is reduced.
Example 4:
in one embodiment, when the predetermined result shows that the memory bank storage fails, a memory bank channel monitoring mechanism is formulated, and a memory bank monitoring channel is constructed by a memory bank detection device according to the memory bank channel monitoring mechanism, including:
performing data analysis on the memory bank technical index data displayed by the memory bank detection device according to a preset storage threshold value of the memory bank chip, and formulating a memory bank channel monitoring mechanism;
wherein, the memory bank channel monitoring mechanism comprises:
determining the number information lines of storage routes of the memory chips and the integrated chip fragments to generate chip separation routes;
the number information of the chip separation routes is represented by N bits, and N bit routing inspection routes are obtained;
recording memory information transmission time and information processing time of each routing inspection route based on the N-bit routing inspection routes, and performing equal-time section division on the memory information transmission time and the information processing time to obtain section time;
according to the section time, performing system sampling to obtain a section time sample, and performing data comparison on the section time sample with preset information transmission time and preset information processing time to obtain time difference value data;
monitoring whether the difference data is within a preset time error threshold value or not to obtain a monitoring result;
on the basis of the monitoring result, when the difference data is not within a preset time error threshold value, performing route memory bank fault detection according to the N-bit routing inspection route;
in one practical scenario: the method for recording the time of operations such as storage processing of information in the memory bank is not available, so that whether the processing time of the information in the memory bank is reasonable and normal cannot be determined, and the prior art also does not mention the technology for establishing a memory bank channel monitoring mechanism;
when the invention is implemented: a memory bank channel monitoring mechanism is formulated, and the internal faults of the memory bank can be systematically monitored through the formulated monitoring mechanism, wherein the recorded time is divided into equal time intervals so as to perform systematic sampling on time information in a large number of time periods, so that the primary detection and judgment on the problem of whether the memory bank has information processing faults or not can be rapidly performed;
the beneficial effects of the above technical scheme are: through formulating the memory bank channel monitoring mechanism, can be according to the monitoring mechanism of formulating can be reasonable monitor the storage trouble of memory bank to carry out the record to the time of information transmission and information processing's time in each route, then carry out the scope to the time of record and predetermine the time error threshold value and compare, can go on preliminary judgement to the memory bank whether break down, consequently can save the time to memory bank fault detection.
Example 5:
in one embodiment, based on N-bit routing inspection routes, memory information transmission time and information processing time of each routing inspection route are recorded, equal-time segment division is carried out on the memory information transmission time and the information processing time, N segment times are obtained, and the total memory information transmission time arranged on one routing inspection route is equal to the total memory information transmission time
Figure 826747DEST_PATH_IMAGE017
Will transmit the total time to
Figure 153561DEST_PATH_IMAGE018
Time is divided into equal time intervals, and the divided time is used for the time of the section
Figure 874916DEST_PATH_IMAGE019
N denotes 1, 2, 3.. cndot,
systematic sampling is performed for the segment time by the following equation:
Figure 657321DEST_PATH_IMAGE020
wherein,
Figure 486606DEST_PATH_IMAGE021
is shown as
Figure 670856DEST_PATH_IMAGE022
Decimated block time samples;
Figure 824099DEST_PATH_IMAGE023
representing a first segment time;
then the divided section time is processed from the first section time by the formula
Figure 841603DEST_PATH_IMAGE023
Sampling is carried out until the extraction of n sections is finished;
then will be
Figure 992355DEST_PATH_IMAGE021
And preset information transmission time
Figure 31111DEST_PATH_IMAGE024
Comparing to obtain difference data
Figure 825761DEST_PATH_IMAGE025
(ii) a Judging and monitoring whether the obtained difference data is within a preset time error threshold value or not
Figure 51599DEST_PATH_IMAGE026
Represents the monitoring results:
Figure 728744DEST_PATH_IMAGE027
wherein,
Figure 635389DEST_PATH_IMAGE028
representing a preset time error threshold.
The working principle of the technical scheme is as follows: the technology divides the memory information transmission time into equal-time sections to obtainTaking n sections of time, setting the total time of memory information transmission on a routing inspection route as
Figure 853137DEST_PATH_IMAGE017
Will transmit the total time to
Figure 566272DEST_PATH_IMAGE018
Time is divided into equal time intervals, and the divided time is used for the time of the section
Figure 541050DEST_PATH_IMAGE019
N denotes according to 1, 2, 3.
Figure 288819DEST_PATH_IMAGE029
System sampling is carried out, then the system is passed again and then the system sampling is carried out
Figure 954767DEST_PATH_IMAGE021
And preset information transmission time
Figure 434158DEST_PATH_IMAGE024
Comparing to obtain difference data
Figure 933666DEST_PATH_IMAGE025
(ii) a Whether the obtained difference data are judged and monitored within a preset time error threshold value or not is judged, and the monitoring result judgment mode is as follows:
Figure 67101DEST_PATH_IMAGE030
when the result shows that the fault is abnormal, carrying out abnormal fault warning prompt through the memory bank monitoring channel, and when the result shows that the fault is normal, continuing to detect;
the beneficial effects of the above technical scheme are: the section time is sampled to obtain a section time sample, so that the detection time can be saved, then the sample is subjected to data comparison, preliminary difference data can be obtained more adequately, the judgment can be performed rapidly according to the difference data, and the monitoring efficiency is higher through threshold judgment.
Example 6:
in an embodiment, the performing, through the memory bank monitoring channel, rank division on the integrated fragments of the memory bank chip to obtain the rank fragments includes:
acquiring fragmentation grade data according to a chip through the memory bank monitoring channel;
extracting information processing parameters of the chip fragments based on the fragment grade data, and performing fragment grade division according to the information processing parameters to obtain grade fragments;
dividing the chip integration fragments into three levels, wherein the three levels comprise: first-level slicing, second-level slicing and third-level slicing;
in one practical scenario: the integrated fragments of the memory chip are not classified, so that information management cannot be performed on the classified fragments, and when a fault occurs during information storage of the fragments, the fault finding is complicated due to lack of classification and classification of the fragments, and a fault detection error condition is generated;
the invention is implemented as follows: the integrated fragments of the chip are classified into grades, the integrated fragments are classified according to the processing effect of the fragments on information, the information management of the fragments can be determined through the classification, and the abnormal information can be searched according to the corresponding classification of the classification for the abnormal problem of any information, so that the detection on the faults of the memory bank can be more accurate, and the detection time can be saved;
the beneficial effects of the above technical scheme are: according to the constructed memory bank monitoring channel, the integrated fragments of the chip are graded, the fragments are mainly graded into three grades according to the function of the fragments, and the three grades are respectively classified into the three grades according to the characteristics of the fragments, so that the memory bank information processed by the fragments can be classified, and the information processing and analyzing efficiency is improved.
Example 7:
in one embodiment, address calibration is performed on bit storage cells in the level fragments, and numbering and sorting are performed on the level fragments and the bit storage cells to obtain a numbering result, including:
performing address calibration on a bit storage grid in the level fragment to determine memory addressing, wherein the address calibration comprises: calibrating a row address and a column address;
performing primary check detection on the storage grid data through a preset check code of the storage grid to obtain a primary detection result;
analyzing results based on the primary detection result, extracting checking error information, performing information exception classification storage management on the checking error information, and acquiring exception classification information;
sending the abnormal classification information to a memory bank fault detection device through a memory bank monitoring channel;
carrying out information marking indexing on the abnormal classification information, and numbering according to a, b and c to generate an index catalog;
numbering the bit storage grids according to 1, 2, 3,. to obtain numbered bit storage grids;
correspondingly matching the index directory with the number bit storage grid, and numbering according to 1-a/b/c, 2-a/b/c, 3-a/b/c.;
storing the information of the numbering sequence of the numbering chip to obtain a numbering result;
in one practical scenario: the integrated fragments in the memory chip are not finely divided, and the bit storage grids are not numbered and sequenced, so that the internal storage faults of the memory chip cannot be accurately detected due to the lack of the technology;
when the invention is implemented: firstly, address calibration is carried out on the bit storage grids of the fragments, abnormal information of the storage grids in the memory bank can be searched according to the calibrated addresses, the information is firstly detected and verified through a preset verification code, the abnormal information can be extracted, a primary detection result is obtained, and the abnormal classification information is indexed by information marking, and is numbered according to a, b and c to generate an index catalog, numbering the bit storage cells according to 1, 2, 3.. to obtain numbered bit storage cells, the index directory and the number bit storage grid are correspondingly matched, and numbering is carried out according to 1-a/b/c, 2-a/b/c, 3-a/b/c, so that the position and the abnormal information of the abnormal information can be accurately searched;
the beneficial effects of the above technical scheme are: the method comprises the steps of calibrating the address of a bit storage grid, rapidly searching the position of the fault storage grid through a memory bank fault monitoring channel, marking and indexing detected abnormal information, and carrying out directory numbering through the index, so that the abnormal information can be accurately detected through the directory numbering, the specific information problem of the abnormal information can be obtained, and the memory bank can be optimized and improved according to the obtained abnormal information.
Example 8:
in one embodiment, address scaling is performed on bit cells in the level slices, and memory addressing is performed, where the address scaling includes: the row address calibration and the column address calibration comprise the following steps:
the steps for performing memory addressing are as follows:
the method comprises the following steps: performing address calibration on a bit storage grid in the level fragment, wherein the address calibration comprises: calibrating a row address and a column address;
step two: recording the row address in a vertical coordinate signal, recording the column address in a horizontal coordinate signal, and acquiring horizontal and vertical coordinate signal information;
step three: based on the horizontal and vertical coordinate signal information, the memory bank fault detection device searches signal information through a memory bank monitoring channel, and locks address information through the signal information search;
step four: performing address interpretation according to the address information, and determining whether the address information is a calibration address based on the address interpretation;
in one practical scenario: the address in the memory bank information is searched by detecting the memory bank, and the step is memory addressing, so that the address information is accurately positioned, but the prior art does not relate to address calibration of a storage grid, so that the fault position in the memory bank cannot be accurately positioned;
the invention is implemented as follows: the method comprises the steps that address calibration is carried out on bit storage grids of a chip in a memory bank, so that addresses can be searched through a memory bank monitoring channel, the positions of the storage grids can be rapidly determined through searching the addresses, faults occurring in the storage grids in the memory bank can be effectively positioned, and when information stored in the storage grids is abnormal, the storage grids can be rapidly searched through calibrated address information;
the beneficial effects of the above technical scheme are: and executing memory addressing, namely quickly locking the horizontal coordinate signals and the vertical coordinate signals by a method of searching memory information addresses, and quickly finding the abnormal storage grids or abnormal calibration information at the address calibration positions from the row addresses and the column addresses of the horizontal coordinate and the vertical coordinate.
Example 9:
in one embodiment, the determining whether the information processing work of the memory bank numbering address is normal according to the numbering result, obtaining the determination result, and performing alarm display on the abnormal result includes:
judging whether the information corresponding to the serial number works normally or not according to the serial number result to obtain a judgment result;
based on the judgment result, when the judgment result shows that the memory bank information storage time is abnormal, performing voice alarm prompt for information storage time abnormity through a memory bank fault detection device;
based on the judgment result, when the judgment result shows that the processing of the address information of the memory cell is abnormal, the memory cell fault detection device is used for carrying out voice alarm prompt on the abnormal address information of the memory cell;
based on the judgment result, when the judgment result shows that the information corresponding to the grading fragment number is abnormal, a voice alarm prompt for abnormal information corresponding to the number is carried out through a memory fault detection device;
formulating corresponding alarm processing schemes through different voice alarm prompts;
in one practical scenario: after the alarm is connected with the detection equipment or the detection device, the alarm gives an alarm after receiving an abnormal signal, but the alarm is only single alarm, specific alarm prompt voice is not available, and voice classification alarm is not available, so that the detection personnel cannot be clearly prompted, and the detection personnel cannot quickly find out the fault reason of the memory bank;
when the invention is implemented: according to the judgment result, when the memory bank information storage time is displayed to be abnormal, the memory bank storage grid address information processing is displayed to be abnormal and the hierarchical fragment number corresponding information is displayed to be abnormal, corresponding abnormal alarm is carried out on the three abnormal reasons, then the memory bank fault detection device is used for displaying the written memory bank fault prompt, and the alarm device is used for carrying out corresponding alarm voice prompt, so that the loss problem caused by the untimely fault processing can be solved;
the beneficial effects of the above technical scheme are: and as for the judged abnormal result, abnormal result voice alarm is carried out, abnormal information is transmitted to the memory bank fault detection device, then the alarm carries out prompt on the memory bank fault condition through voice alarm operation, so that detection personnel can find the fault condition of the memory bank in time, and the memory bank fault is maintained according to the voice alarm prompt, thereby avoiding more loss.
Example 10:
in an embodiment, the formulating a corresponding alarm processing scheme through different voice alarm prompts includes:
according to the abnormal voice alarm prompt of the information storage time, a system operation repairing and reading speed changing scheme is formulated;
according to the abnormal voice alarm prompt of the address information of the memory grid, an insertion sequence scheme for adjusting the memory banks in the installation equipment is formulated;
according to the abnormal voice alarm prompt of the information corresponding to the number, a scheme for detecting the integrity of the number and re-matching the number information is formulated;
in one practical scenario: according to the prior art, after an alarm task is executed through an alarm device, a corresponding problem solution is not formulated, the formulated corresponding solution can help a detector to timely process the fault problem of the memory bank according to the formulated scheme, and the fault processing cannot be timely performed after an alarm prompt is received without formulating the scheme, so that the fault of the memory bank is further aggravated, and more information loss is caused;
when the invention is implemented: through different abnormal voice prompts of the alarm, and according to the voice prompts, corresponding solutions are formulated, so that the memory bank can be ensured to be processed according to the formulated solutions after the alarm prompts are received at the first time;
the beneficial effects of the above technical scheme are: according to the voice alarm prompt, a solution of the corresponding abnormal problem is formulated, so that the detection personnel can be convenient to maintain according to the formulated scheme, more information loss of the memory bank due to untimely maintenance can be guaranteed, the formulated scheme is a scheme for preliminary maintenance of the memory bank faults, and the time wasted due to uncertain fault reasons is mainly saved.
Example 11:
in one embodiment, the method comprises the following steps: the device comprises a data line, a display screen, a detection host and an alarm;
the display screen is embedded in the detection host, and the detection host is connected with the alarm and the memory bank installation equipment through data lines;
the alarm receives the abnormal detection data sent by the detection host through a data line and executes abnormal data alarm operation;
the detection host further comprises: the channel monitor monitors the channel condition of the memory bank through connection;
in one practical scenario: in the existing memory bank detection technology, the fault condition of a memory bank is reacted through a data set and a data label, but the data set is not explicitly managed, so that the fault information in the data set with the memory bank fault is possibly disordered;
when the invention is implemented: the display screen is connected to the detection host in an embedded mode, data information of detection data can be displayed through the display screen, the detection host is connected with the alarm and the memory bank installation equipment through the data lines, and the alarm can be given out for prompting the abnormal condition of the memory bank through the alarm, wherein a channel monitor built in the detection host can be used for monitoring channels of the memory bank in the memory bank installation equipment, and the storage condition of channels divided in the memory bank is monitored in real time;
the beneficial effects of the above technical scheme are: the alarm can directly prompt an operator that the memory bank has a fault, so that the operator can timely maintain the memory bank to avoid leakage and loss of memory information, and the detection host can detect and search the fault of specific storage problems in the memory bank through the connected channel monitor.
Example 12:
in one embodiment, the method comprises the following steps:
a channel building module: the device is used for setting a memory bank fault detection device, connecting the detection device with memory bank installation equipment and constructing a memory bank monitoring channel;
a fragment acquisition module: grading the integrated fragments of the memory chip through the memory monitoring channel to obtain grade fragments;
a numbering and sequencing module: address calibration is carried out on bit position storage grids in the grade fragments, numbering and sequencing are carried out on the grade fragments and the bit position storage grids, and numbering results are obtained
A judgment warning module: judging whether the information processing work of the memory bank numbering address is normal or not according to the numbering result, acquiring a judgment result, and carrying out alarm display on an abnormal result;
in one practical scenario: the detection of the faults of the memory bank mainly comprises the detection of the installation and the insertion of the memory bank, and the detection system of the faults of the memory bank is too simple to detect the faults of the memory bank, cannot detect the specific position of the internal information processing and storage of the memory bank, and cannot detect whether the time for processing the information in the memory bank is too long or not so as to cause the faults of the memory bank;
when the invention is implemented: through the functional interaction among all modules, a memory bank monitoring channel capable of monitoring a chip information storage processing route in a memory bank is constructed in a channel construction module, then address calibration and sequencing are carried out on the memory bank chip and the chip fragments and storage grids by a fragment acquisition module and a numbering and sequencing module, the specific fault address of the memory bank can be searched, and finally, the information of abnormal detection and judgment is transmitted and alarmed through a judgment alarm module;
the beneficial effects of the above technical scheme are: through the channel construction module, the fragment acquisition module, the serial number sequencing module and the judgment warning module, a memory bank fault detection system is formed jointly, through interaction among the modules, according to a routing inspection channel formed among memory bank chips, the chip integration fragments and the storage grids, specific fault points of information storage faults in the memory banks are accurately detected, detected fault information is transmitted to a memory bank fault detection device through the constructed memory bank monitoring channel to be subjected to alarm prompt, and the fault positions of the memory banks can be found rapidly.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.

Claims (10)

1. A method for detecting a memory bank fault is characterized by comprising the following steps:
arranging a memory bank fault detection device, and connecting the detection device with memory bank installation equipment to construct a memory bank monitoring channel;
grading the integrated fragments of the memory chip through the memory monitoring channel to obtain grade fragments;
address calibration is carried out on bit position storage lattices in the level fragments, and the level fragments and the bit position storage lattices are numbered and sequenced to obtain numbering results;
and judging whether the information processing work of the memory bank numbering address is normal or not according to the numbering result, acquiring a judgment result, and carrying out alarm display on an abnormal result.
2. The method for detecting the failure of the memory bank according to claim 1, wherein the step of setting the failure detection device of the memory bank and connecting the detection device with the memory bank installation equipment to construct a memory bank monitoring channel comprises the following steps:
connecting the set memory bank fault monitoring device with the memory bank mounting equipment, and performing primary fault prejudgment according to fault display of the memory bank mounting equipment to obtain a prejudgment result;
wherein, the prejudgment result comprises: a memory bank mechanical failure and a memory bank storage failure;
when the pre-judgment result shows that the memory bank is in a mechanical fault, fault feedback is carried out, and a detector carries out fault processing according to the fault feedback;
when the pre-judgment result shows that the memory bank storage fault exists, a memory bank channel monitoring mechanism is formulated, and a chip separation route in the memory bank is determined according to the memory bank channel monitoring mechanism through a memory bank detection device;
and determining an N-bit routing inspection route based on the chip separation route, and constructing a memory bank monitoring channel according to the N-bit routing inspection route.
3. The method according to claim 1, wherein when the predetermined result indicates a memory bank storage failure, a memory bank channel monitoring mechanism is formulated, and a memory bank monitoring channel is constructed by a memory bank detection device according to the memory bank channel monitoring mechanism, the method comprising:
performing data analysis on the memory bank technical index data displayed by the memory bank detection device according to a preset storage threshold value of the memory bank chip, and formulating a memory bank channel monitoring mechanism;
wherein, the memory bank channel monitoring mechanism comprises:
determining the number information lines of storage routes of the memory chips and the integrated chip fragments to generate chip separation routes;
the number information of the chip separation routes is represented by N bits, and N bit routing inspection routes are obtained;
recording memory information transmission time and information processing time of each routing inspection route based on the N-bit routing inspection routes, and performing equal-time section division on the memory information transmission time and the information processing time to obtain section time;
according to the section time, performing system sampling to obtain a section time sample, and performing data comparison on the section time sample data, preset information transmission time and preset information processing time to obtain time difference value data;
monitoring whether the difference data is within a preset time error threshold value or not to obtain a monitoring result;
and on the basis of the monitoring result, when the difference data is not in a preset time error threshold value, carrying out fault detection on the route memory bank according to the N-bit routing inspection route.
4. The method for detecting the failure of the memory bank according to claim 1, wherein the step of performing the hierarchical classification on the integrated slices of the memory bank chip through the memory bank monitoring channel to obtain the hierarchical slices comprises:
acquiring fragmentation grade data according to a chip through the memory bank monitoring channel;
extracting information processing parameters of the chip fragments based on the fragment grade data, and performing fragment grade division according to the information processing parameters to obtain grade fragments;
dividing the chip integration fragments into three levels, wherein the three levels comprise: first-level slicing, second-level slicing and third-level slicing.
5. The method for detecting the failure of the memory bank according to claim 1, wherein the address calibration is performed on the bit storage cells in the level fragments, and the numbering and sorting are performed on the level fragments and the bit storage cells to obtain the numbering result, and the method comprises the following steps:
performing address calibration on a bit storage grid in the level fragment, and executing memory addressing, wherein the address calibration comprises: calibrating a row address and a column address;
performing primary check detection on the storage grid data through a preset check code of the storage grid to obtain a primary detection result;
analyzing results based on the primary detection result, extracting checking error information, performing information exception classification storage management on the checking error information, and acquiring exception classification information;
sending the abnormal classification information to a memory bank fault detection device through a memory bank monitoring channel;
carrying out information marking indexing on the abnormal classification information, and numbering according to a, b and c to generate an index catalog;
numbering the bit storage grids according to 1, 2, 3,. to obtain numbered bit storage grids;
correspondingly matching the index directory with the number bit storage grid, and numbering according to 1-a/b/c, 2-a/b/c, 3-a/b/c.;
and storing the numbering sequence information of the numbering chip to obtain a numbering result.
6. The method according to claim 5, wherein address scaling is performed on bit cells in the level slices to perform memory addressing, wherein the address scaling comprises: the row address calibration and the column address calibration comprise the following steps:
the steps for performing memory addressing are as follows:
the method comprises the following steps: performing address calibration on a bit storage grid in the level fragment, wherein the address calibration comprises: calibrating a row address and a column address;
step two: recording the row address in a vertical coordinate signal, recording the column address in a horizontal coordinate signal, and acquiring horizontal and vertical coordinate signal information;
step three: based on the horizontal and vertical coordinate signal information, the memory bank fault detection device searches signal information through a memory bank monitoring channel, and locks address information through the signal information search;
step four: and performing address interpretation according to the address information, and determining whether the address information is a calibration address based on the address interpretation.
7. The method for detecting the failure of the memory bank according to claim 1, wherein the step of judging whether the information processing work of the memory bank numbering address is normal or not according to the numbering result, obtaining the judgment result and displaying the abnormal result by alarming comprises the steps of:
judging whether the information corresponding to the serial number works normally or not according to the serial number result to obtain a judgment result;
based on the judgment result, when the judgment result shows that the information storage time of the memory bank is abnormal, the voice alarm prompt for the abnormal information storage time is carried out through a memory bank fault detection device;
based on the judgment result, when the judgment result shows that the processing of the address information of the memory cell is abnormal, the memory cell fault detection device is used for carrying out voice alarm prompt on the abnormal address information of the memory cell;
based on the judgment result, when the judgment result shows that the information corresponding to the grading fragment number is abnormal, a voice alarm prompt for abnormal information corresponding to the number is carried out through a memory fault detection device;
and formulating a corresponding alarm processing scheme through different voice alarm prompts.
8. The method according to claim 7, wherein the step of formulating a corresponding alarm processing scheme through different voice alarm prompts comprises:
according to the abnormal voice alarm prompt of the information storage time, a system operation repairing and reading speed changing scheme is formulated;
according to the abnormal voice alarm prompt of the address information of the memory grid, an insertion sequence scheme for adjusting the memory banks in the installation equipment is formulated;
and formulating a scheme for detecting the integrity of the number and re-matching the number information according to the abnormal voice alarm prompt of the information corresponding to the number.
9. A memory bank fault detection device, comprising: the device comprises a data line, a display screen, a detection host and an alarm;
the display screen is embedded in the detection host, and the detection host is connected with the alarm and the memory bank installation equipment through data lines;
the alarm receives the abnormal detection data sent by the detection host through a data line and executes abnormal data alarm operation;
the detection host further comprises: and the channel monitor monitors the channel condition of the memory bank through connection.
10. A memory bank fault detection system, comprising:
a channel building module: the device is used for setting a memory bank fault detection device, connecting the detection device with memory bank installation equipment and constructing a memory bank monitoring channel;
a fragment acquisition module: grading the integrated fragments of the memory chip through the memory monitoring channel to obtain grade fragments;
a numbering and sequencing module: address calibration is carried out on bit position storage grids in the grade fragments, numbering and sequencing are carried out on the grade fragments and the bit position storage grids, and numbering results are obtained
A judgment warning module: and judging whether the information processing work of the memory bank numbering address is normal or not according to the numbering result, acquiring a judgment result, and carrying out alarm display on an abnormal result.
CN202210134713.1A 2022-02-14 2022-02-14 Memory bank fault detection method, device and system Active CN114461476B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210134713.1A CN114461476B (en) 2022-02-14 2022-02-14 Memory bank fault detection method, device and system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210134713.1A CN114461476B (en) 2022-02-14 2022-02-14 Memory bank fault detection method, device and system

Publications (2)

Publication Number Publication Date
CN114461476A true CN114461476A (en) 2022-05-10
CN114461476B CN114461476B (en) 2023-09-26

Family

ID=81413381

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210134713.1A Active CN114461476B (en) 2022-02-14 2022-02-14 Memory bank fault detection method, device and system

Country Status (1)

Country Link
CN (1) CN114461476B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115292113A (en) * 2022-09-30 2022-11-04 新华三信息技术有限公司 Method and device for fault detection of internal memory of server and electronic equipment
CN117762716A (en) * 2024-01-05 2024-03-26 深圳市沃存电子有限公司 Method and system for rapidly positioning memory bank abnormality on main board

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5448448A (en) * 1977-09-26 1979-04-17 Fujitsu Ltd Inspection system of memory error
US20030088816A1 (en) * 2001-11-08 2003-05-08 Kun-Ho Wu Method and system for detecting and isolating faulted part of a memory device
CN102841832A (en) * 2011-06-24 2012-12-26 鸿富锦精密工业(深圳)有限公司 Error memory chip locating system and method
CN104035845A (en) * 2013-11-28 2014-09-10 曙光信息产业(北京)有限公司 Detection system and method for memory bank installation failure
CN106055438A (en) * 2016-05-27 2016-10-26 深圳市国鑫恒宇科技有限公司 Method and system for rapidly locating anomaly of memory banks on mainboard
CN107368385A (en) * 2017-07-26 2017-11-21 郑州云海信息技术有限公司 A kind of method and system of expansible more memory failure fast positionings based on BMC controls
CN107992399A (en) * 2017-12-12 2018-05-04 郑州云海信息技术有限公司 A kind of memory bar condition detection method, apparatus and system
US20190228831A1 (en) * 2018-01-23 2019-07-25 Microchip Technology Incorporated Memory device, memory address decoder, system, and related method for memory attack detection
CN110688266A (en) * 2019-08-21 2020-01-14 深圳市金泰克半导体有限公司 Fault memory bank positioning method and device and storage medium
CN210666750U (en) * 2019-11-22 2020-06-02 苏州浪潮智能科技有限公司 Memory fault alarm device
CN112650612A (en) * 2020-12-24 2021-04-13 新华三云计算技术有限公司 Memory fault positioning method and device

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5448448A (en) * 1977-09-26 1979-04-17 Fujitsu Ltd Inspection system of memory error
US20030088816A1 (en) * 2001-11-08 2003-05-08 Kun-Ho Wu Method and system for detecting and isolating faulted part of a memory device
CN102841832A (en) * 2011-06-24 2012-12-26 鸿富锦精密工业(深圳)有限公司 Error memory chip locating system and method
CN104035845A (en) * 2013-11-28 2014-09-10 曙光信息产业(北京)有限公司 Detection system and method for memory bank installation failure
CN106055438A (en) * 2016-05-27 2016-10-26 深圳市国鑫恒宇科技有限公司 Method and system for rapidly locating anomaly of memory banks on mainboard
CN107368385A (en) * 2017-07-26 2017-11-21 郑州云海信息技术有限公司 A kind of method and system of expansible more memory failure fast positionings based on BMC controls
CN107992399A (en) * 2017-12-12 2018-05-04 郑州云海信息技术有限公司 A kind of memory bar condition detection method, apparatus and system
US20190228831A1 (en) * 2018-01-23 2019-07-25 Microchip Technology Incorporated Memory device, memory address decoder, system, and related method for memory attack detection
CN110688266A (en) * 2019-08-21 2020-01-14 深圳市金泰克半导体有限公司 Fault memory bank positioning method and device and storage medium
CN210666750U (en) * 2019-11-22 2020-06-02 苏州浪潮智能科技有限公司 Memory fault alarm device
CN112650612A (en) * 2020-12-24 2021-04-13 新华三云计算技术有限公司 Memory fault positioning method and device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115292113A (en) * 2022-09-30 2022-11-04 新华三信息技术有限公司 Method and device for fault detection of internal memory of server and electronic equipment
CN117762716A (en) * 2024-01-05 2024-03-26 深圳市沃存电子有限公司 Method and system for rapidly positioning memory bank abnormality on main board
CN117762716B (en) * 2024-01-05 2024-07-16 深圳市沃存电子有限公司 Method and system for rapidly positioning memory bank abnormality on main board

Also Published As

Publication number Publication date
CN114461476B (en) 2023-09-26

Similar Documents

Publication Publication Date Title
CN114461476A (en) Memory bank fault detection method, device and system
CN112257963B (en) Defect prediction method and device based on spaceflight software defect data distribution outlier
CN101706749B (en) Comprehensive processing method based on software safety defect detection
US20090313505A1 (en) System and method for detecting combinations of perfomance indicators associated with a root cause
KR101211042B1 (en) Storage device and storing method for fault information of memory
CN113415165B (en) Fault diagnosis method and device, electronic equipment and storage medium
CN111309584B (en) Data processing method, device, electronic equipment and storage medium
CN111027721B (en) System fault positioning method
CN113532549A (en) Power battery test system for new energy automobile
US20120229155A1 (en) Semiconductor integrated circuit, failure diagnosis system and failure diagnosis method
CN113823349B (en) Method and terminal for determining chip failure mode
CN117572837B (en) Intelligent power plant AI active operation and maintenance method and system
CN113657747B (en) Intelligent assessment system for enterprise safety production standardization level
US20100211837A1 (en) Semiconductor test system with self-inspection of memory repair analysis
CN117763457B (en) Chip test data management system and method based on big data analysis
CN109299201A (en) Power plant's production subsystem method for monitoring abnormality and device based on two-phase analyzing method
CN111767546B (en) Deep learning-based input structure inference method and device
CN115879697A (en) Data processing method, system, equipment and storage medium for industrial internet
CN115981911A (en) Memory failure prediction method, electronic device and computer-readable storage medium
JP2000077495A (en) Inspection system and manufacture of electronic device using the same
JP4034489B2 (en) Defect relief determination method and apparatus for semiconductor memory device
Kirubarajan et al. Fault detection algorithms for real-time diagnosis in large-scale systems
CN112988792B (en) Searching method and device for wafer yield problem database
CN116381419B (en) Transmission line fault processing method, device, computer equipment and storage medium
CN117766014B (en) Method for testing irradiation detection memory chip

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant