CN114371346A - Capacitance value detection circuit and detection method of capacitor - Google Patents
Capacitance value detection circuit and detection method of capacitor Download PDFInfo
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- CN114371346A CN114371346A CN202210281714.9A CN202210281714A CN114371346A CN 114371346 A CN114371346 A CN 114371346A CN 202210281714 A CN202210281714 A CN 202210281714A CN 114371346 A CN114371346 A CN 114371346A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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Abstract
The invention discloses a capacitance value detection circuit and a capacitance value detection method. The capacitance value of the capacitor to be measured can be calculated according to a formula when the sine wave amplitude is detected to be-3 dB of the initial value by changing the resistor in the RC filter. The capacitance value measuring device is simple in structure and easy to realize, can obtain the capacitance value of the capacitor to be measured in a short time, and can be widely applied to the field of rapid measurement of the capacitor.
Description
Technical Field
The invention relates to a capacitance value detection circuit and a capacitance value detection method.
Background
As an indispensable device in an electronic circuit, a capacitor is widely used in each module of the circuit, and is very commonly used as a resistor. Common uses of capacitors include dc blocking, bypassing, coupling, filtering, temperature compensation, timing, tuning, rectifying, and energy storage.
In the research and manufacture of the fields of semiconductors, new materials, biology and micro electricity, the selection of the capacitor with a reasonable capacitance value is very critical, so that the measurement problem of the capacitor can be related, and the research and development of the capacitance measurement technology and device have great significance. Capacitance measurement is mainly classified into three methods, i.e., a charge injection method (also called a charge-discharge method), an alternating current excitation method, and an alternating current excitation method with a balance capacitance. However, the above conventional method requires the use of an additional clock and a plurality of frequency sources, has problems of complicated circuit structure, long detection time, and the like, and is suitable for precision measurement in a specific situation. In the scenes of batch detection of the capacitance and the like, the capacitance value of the capacitance needs to be determined quickly, and the detection method is not suitable.
Disclosure of Invention
The purpose of the invention is as follows: aiming at the prior art, a capacitance value detection circuit and a capacitance value detection method are provided, the problem that a signal source is complex when a frequency method is used for measuring the capacitance value in the prior art is solved, and the capacitance value is rapidly detected.
The technical scheme is as follows: a capacitance value detection circuit comprises a signal source, a resistor array, a resistor switch group, a capacitor to be detected, a capacitor switch to be detected, a rectifier, a filter, an analog-to-digital converter and a controller;
the signal source is used for outputting sine wave signals to the input end of the resistor array;
the resistor array comprises a plurality of resistors connected in series;
the resistance switch group comprises a plurality of switches, and the resistors in the resistor array are all connected with one switch in parallel;
the capacitor to be tested and the capacitor switch to be tested form a series branch, and the series branch is connected between the output end of the resistor array and the ground in parallel;
the output end of the resistor array is also connected with the input end of a rectifier, the output end of the rectifier is connected with the input end of a filter, and the output end of the filter is connected with the input end of an analog-to-digital converter;
the controller is used for controlling the resistance switch group and the capacitance switch to be tested, and the resistance array is changedResistance of column accessR XWhen the sine wave amplitude output by the analog-to-digital converter is-3 dB of the initial value, the sine wave amplitude is calculated according to a formula
Outputting the capacitance value of the capacitor to be testedC X，f 0Is the frequency of the sine wave signal; and when the signal source is directly connected with the rectifier, the amplitude of the output value of the analog-to-digital converter is obtained.
Furthermore, n resistors are connected in series in the resistor array, the first resistor at the input end is R, the second resistor to the nth resistor meet the equal proportion relation, and the resistance value of the ith resistor is 2i-2R，2≤i≤n。
Further, the rectifier is a full wave rectifier.
Furthermore, the signal source is provided with a functional module for adjusting the frequency and amplitude of the output sine wave signal.
The capacitance value detection method of the circuit comprises the following steps:
step 1: the controller controls the switch of the capacitor to be tested to be switched off and controls all the switches in the resistance switch group to be switched on, namely the capacitor to be tested is switched off, and the signal source is directly connected with the rectifier;
step 2: the controller controls the output frequency of the signal source to bef 0A sine wave signal with amplitude A;
and step 3: the rectifier inputs the sine wave signal after full wave rectification into the filter, the filter converts the rectified signal into average value direct current quantity, and the direct current quantity is
The analog-to-digital converter converts the DC quantity A0Converted into corresponding digital quantity D0And storing;
and 4, step 4: the controller controls a switch connected with a first resistor in parallel in the resistor array to be disconnected, the first resistor is connected into a circuit, then the capacitor to be tested is controlled to be closed, and the capacitor to be tested is connected into the circuit;
and 5: the analog-to-digital converter outputs the direct current quantity A of the filter at the moment1Converted into corresponding digital quantity D1And storing;
step 6: the controller compares the digital quantity D1And a digital quantity D0Size, if
I.e., D1 is the-3 dB value of D0, go to step 8, otherwise go to step 7;
and 7: the controller controls the resistance switch group to increase the resistance accessed by the resistance array in a stepping mode, and then step 5 is executed;
and 8: the controller is based on the amount of resistance in the access circuit at that timeR XAccording to the formula
Outputting the capacitance value of the capacitor to be testedC X。
Furthermore, the frequency and the amplitude of the sine wave signal output by the signal source are adjusted to adjust the measurement range and the precision of the capacitance value.
Has the advantages that: the capacitance value detection circuit and the detection method of the invention change the resistance value accessed by the resistor array by constructing the RC circuitR XSo that the amplitude of the sine wave can be measured to be changed to-3 dB of the initial value according to the known frequency of the sine wavef 0And quickly obtaining the capacitance value of the capacitor to be measured. The invention solves the problem of complex signal source when the capacitance value of the capacitor is measured by using a frequency method in the prior art, realizes the rapid detection of the capacitance value, and also solves the problems of higher cost and long measuring time of other measuring methods.
Drawings
FIG. 1 is a schematic diagram of a capacitance detection circuit according to the present invention;
FIG. 2 is a flow chart of the method of the present invention.
Detailed Description
The invention is further explained below with reference to the drawings.
As shown in fig. 1, a capacitance-capacitance value detection circuit includes a signal source 101, a resistor array, a resistor switch group, a capacitor to be detected 105, a capacitor to be detected 104, a rectifier 106, a filter 107, an analog-to-digital converter 108, a memory 109, and a controller 110.
The signal source 101 is used for outputting a sine wave signal to the input terminal of the resistor array. The signal source 101 has a function module for adjusting the frequency and amplitude of the output sine wave signal.
The resistor array is formed by connecting n resistors 102-1-102-n in series, the resistance value of the first resistor 102-1 at the input end is R, the second resistor to the nth resistor meet the equal proportion relation, and the resistance value of the ith resistor is 2i-2R，2≤i≤n。
The resistance switch group comprises n switches from 103-1 to 103-n, the number of the switches is consistent with that of the resistors in the resistor array, the resistors in the resistor array are all connected with one switch in parallel, and the corresponding resistors are short-circuited after the switches are closed.
The capacitor to be tested 105 and the capacitor switch to be tested 104 form a series branch, and the series branch is connected between the output end of the resistor array and the ground in parallel.
The output end of the resistor array is also connected with the input end of a rectifier 106, the output end of the rectifier 106 is connected with the input end of a filter 107, and the output end of the filter 107 is connected with the input end of an analog-to-digital converter ADC 108. The rectifier 106 is a full-wave rectifier, and can perform full-wave rectification on the sinusoidal signal, and the filter 107 can obtain an average value of the rectified signal; the analog-to-digital converter 108 can convert the dc signal output from the filter 107 into a digital signal.
The controller 110 is used for controlling the resistor switch set and the capacitor switch 104 to be tested by changing the resistance value connected to the resistor arrayR XWhen the sine wave amplitude output by the analog-to-digital converter 108 is-3 dB of the initial value, the formula is used
Outputting a capacitance 105 to be measuredVolume valueC X，f 0The frequency of the sine wave signal. The initial value is the amplitude of the output value of the analog-to-digital converter 108 when the series branch is disconnected and the signal source 101 is directly connected to the rectifier 106.
According to the capacitance value detection method of the circuit, as shown in fig. 2, the method comprises the following steps:
step 1: the controller 110 controls the capacitor switch 104 to be tested to be opened and controls all switches in the resistor switch group to be closed, that is, the capacitor 105 to be tested is opened, and the signal source 101 is directly connected with the rectifier 106.
Step 2: the controller 110 controls the output frequency of the signal source 101 to bef 0And a sine wave signal of amplitude a.
And step 3: the rectifier 106 full-wave rectifies the sine wave signal and inputs the rectified signal to the filter 107, and the filter 107 converts the rectified signal into an average value DC value of the rectified signal
The analog-to-digital converter 108 converts the DC component A0Converted into corresponding digital quantity D0And stored to the memory 109.
And 4, step 4: the controller 110 controls the switch connected in parallel with the first resistor in the resistor array to be switched off, the first resistor is switched into the circuit, then the capacitor switch 104 to be tested is controlled to be switched on, and the capacitor 105 to be tested is switched into the circuit.
And 5: the sine wave signal output by the signal source 101 passes through a new RC filter network, and generates a new dc quantity a through the rectifier 106 and the filter 1071The analog-to-digital converter 108 will then output the DC component A from the filter 1071Converted into corresponding digital quantity D1And stored.
Step 6: the controller 110 compares the digital quantity D1And a digital quantity D0Size, if
I.e., D1 is the-3 dB value of D0, step 8 is performed, otherwise step 7 is performed.
And 7: the controller 110 controls the resistor switch group to switch the next resistor connected to the resistor in the circuit into the circuit, so that the connected resistor amount is increased by step R, and then step 5 is executed.
And 8: the controller 110 controls the amount of resistance in the circuit according to the currentR XAccording to the formula
Output the capacitance value of the capacitor 105 to be measuredC X。
The signal source 101 outputs a sine wave signal with a fixed frequency and amplitude in a single detection. In different detection processes, the frequency and amplitude of the sine wave signal output by the signal source 101 are adjusted to adjust the capacitance measurement range and accuracy.
The invention can realize the purpose of rapid capacitance detection by using the RC filter principle. The characteristic of the capacitor is closely related to the frequency, so the capacitor is used in a filter, which is a frequency-selective device that can pass a specific frequency component in a signal and greatly attenuate other frequency components. Therefore, the capacitance values of different capacitors can be distinguished by utilizing different responses of the capacitors with different sizes to small signals. In a basic RC filter circuit, a capacitor C is used as an output end and is a low-pass filter, the output amplitude can change along with the change of a resistor R, and when the output amplitude is-3 dB of an input signal, the capacitor meets the requirement of the input signal
When the signal frequencyfAnd when the resistance R is determined, the value of the capacitor C can be uniquely determined, so that the purpose of detecting the capacitance value of the capacitor is achieved.
In addition, the invention considers that extra algorithm is needed for detecting sine wave amplitude, and the complexity of the system is increased, so that the amplitude judgment is carried out by extracting the direct current quantity in a sine wave full wave rectification mode, and the detection of the direct current quantity change is equivalent to the detection of sine wave amplitude change because the direct current quantity is 2/pi times of the amplitude before sine wave rectification.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (6)
1. A capacitance value detection circuit is characterized by comprising a signal source (101), a resistor array, a resistor switch group, a capacitor to be detected (105), a capacitor switch to be detected (104), a rectifier (106), a filter (107), an analog-to-digital converter (108) and a controller (110);
the signal source (101) is used for outputting sine wave signals to the input end of the resistor array;
the resistor array comprises a plurality of resistors connected in series;
the resistance switch group comprises a plurality of switches, and the resistors in the resistor array are all connected with one switch in parallel;
a capacitor to be tested (105) and a capacitor switch to be tested (104) form a series branch, and the series branch is connected between the output end of the resistor array and the ground in parallel;
the output end of the resistor array is also connected with the input end of a rectifier (106), the output end of the rectifier (106) is connected with the input end of a filter (107), and the output end of the filter (107) is connected with the input end of an analog-to-digital converter (108);
the controller (110) is used for controlling the resistance switch group and the capacitance switch (104) to be tested, and the resistance value accessed by the resistance array is changedR XWhen the sine wave amplitude output by the analog-to-digital converter (108) is-3 dB of the initial value, the sine wave amplitude is calculated according to a formula
Outputting the capacitance value of the capacitor (105) to be measuredC X，f 0Is the frequency of the sine wave signal; wherein the initial value is the amplitude of the output value of the analog-to-digital converter (108) when the series branch is disconnected and the signal source (101) is directly connected with the rectifier (106).
2. The capacitance value detection circuit according to claim 1, wherein n resistors are connected in series in the resistor array, a first resistor at the input end has a resistance value of R, the second to nth resistors satisfy an equal proportional relation, and an ith resistor has a resistance value of 2i-2R，2≤i≤n。
3. The capacitance value detection circuit of claim 2, wherein the rectifier (106) is a full-wave rectifier.
4. The capacitance-capacitance value detection circuit according to claim 3, characterized in that the signal source (101) has a functional module for adjusting the frequency and amplitude of the output sine wave signal.
5. The capacitance value detection method of the circuit according to any one of claims 1 to 4, comprising the steps of:
step 1: the controller (110) controls the capacitor switch (104) to be tested to be disconnected and controls all switches in the resistance switch group to be closed, namely the capacitor (105) to be tested is disconnected, and the signal source (101) is directly connected with the rectifier (106);
step 2: the controller (110) controls the output frequency of the signal source (101) to bef 0A sine wave signal with amplitude A;
and step 3: the rectifier (106) performs full-wave rectification on the sine wave signal and then inputs the sine wave signal into the filter (107), the filter (107) converts the rectified signal into average value direct current quantity, and the direct current quantity is
The analog-to-digital converter (108) converts the DC component A0Converted into corresponding digital quantity D0And storing;
and 4, step 4: the controller (110) controls a switch connected with a first resistor in parallel in the resistor array to be switched off, the first resistor is switched into a circuit, then the capacitor switch (104) to be tested is controlled to be switched on, and the capacitor (105) to be tested is switched into the circuit;
and 5: the analog-to-digital converter (108) converts the direct current quantity A output by the filter (107) at the moment1Converted into corresponding digital quantity D1And storing;
step 6: the controller (110) compares the digital quantity D1And a digital quantity D0Size, if
I.e., D1 is the-3 dB value of D0, go to step 8, otherwise go to step 7;
and 7: the controller (110) controls the resistance switch group to increase the resistance accessed by the resistance array in a stepping mode, and then step 5 is executed;
and 8: the controller (110) switches on the amount of resistance in the circuit according to the timeR XAccording to the formula
Outputting the capacitance value of the capacitor (105) to be measuredC X。
6. The capacitance value detection method according to claim 5, wherein the capacitance value measurement range and accuracy are adjusted by adjusting the frequency and amplitude of the sine wave signal output by the signal source (101).
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Effective date of registration: 20220608 Address after: No. 88, Wenchang East Road, Yangzhou, Jiangsu 225000 Patentee after: Jiangsu Daoyuan Technology Group Co.,Ltd. Address before: 211135 enlightenment star Nanjing maker space G41, second floor, No. 188, Qidi street, Qilin science and Technology Innovation Park, Qixia District, Nanjing, Jiangsu Province Patentee before: Jiangsu Peregrine Microelectronics Co.,Ltd. |