CN114363205B - High-speed link impedance mutation analysis method, system, terminal and storage medium - Google Patents
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Abstract
Description
技术领域technical field
本发明属于高速链路技术领域,具体涉及一种高速链路阻抗突变分析方法、系统、终端及存储介质。The invention belongs to the technical field of high-speed links, and in particular relates to a high-speed link impedance mutation analysis method, system, terminal and storage medium.
背景技术Background technique
随着服务器技术的发展,对通信速度的需求越来越高,高速链路的应用愈加广泛。现有对高速链路的性能检测方法大多是采用阻抗突变分析方法,不存在阻抗突变的高速链路的稳定性更高。此外在对高速链路进行故障定位时也许观察高速链路的阻抗突变情况。With the development of server technology, the demand for communication speed is getting higher and higher, and the application of high-speed links is becoming more and more extensive. Most existing performance testing methods for high-speed links use impedance mutation analysis methods, and high-speed links without impedance mutations have higher stability. In addition, the impedance mutation of the high-speed link may be observed when fault location is performed on the high-speed link.
现有对高速链路的阻抗分析方法大多是通过软件仿真得到链路的频域S参数,再通过傅里叶变换得到时域阻抗曲线。但是受到传输线电阻和板材损耗的影响,现有技术通过S参数变换得到的阻抗曲线会随着时间线性变大,这显然不是通常理解的均匀传输线的阻抗特性,而是由于误差造成的,不利于真实反映过孔等阻抗突变出的阻抗真实值。Most of the existing impedance analysis methods for high-speed links are to obtain the frequency-domain S-parameters of the link through software simulation, and then obtain the time-domain impedance curve through Fourier transform. However, due to the influence of transmission line resistance and plate loss, the impedance curve obtained by S-parameter transformation in the prior art will increase linearly with time. This is obviously not the impedance characteristic of a uniform transmission line as commonly understood, but caused by errors, which is not conducive to It truly reflects the real value of the impedance of vias and other impedance mutations.
发明内容Contents of the invention
针对现有技术的上述不足,本发明提供一种高速链路阻抗突变分析方法、系统、终端及存储介质,以解决上述技术问题。In view of the above-mentioned shortcomings of the prior art, the present invention provides a high-speed link impedance mutation analysis method, system, terminal and storage medium to solve the above-mentioned technical problems.
第一方面,本发明提供一种高速链路阻抗突变分析方法,包括:In the first aspect, the present invention provides a high-speed link impedance mutation analysis method, including:
利用监测工具获取高速链路的频域S参数,并通过对所述频域S参数进行傅里叶变换得到阻抗曲线方程;Obtain the frequency-domain S-parameters of the high-speed link by using monitoring tools, and obtain the impedance curve equation by performing Fourier transform on the frequency-domain S-parameters;
基于所述阻抗曲线方程生成误差函数;generating an error function based on the impedance curve equation;
根据所述高速链路的导线特性生成导线损耗函数,并根据所述导线损耗函数和设定的介质损耗系数生成损耗曲线函数;generating a wire loss function according to the wire characteristics of the high-speed link, and generating a loss curve function according to the wire loss function and a set dielectric loss factor;
利用最小二乘法对误差函数和损耗曲线函数进行拟合,得到导线损耗系数值和介质损耗系数值;The error function and the loss curve function are fitted by the least square method to obtain the wire loss coefficient value and the dielectric loss coefficient value;
将导线损耗系数值和介质损耗系数值代入所述损耗曲线函数得到损耗值,并利用所述损耗值对高速链路的实时时域阻抗曲线进行修正,并根据修正后的结果进行阻抗突变分析。Substituting the wire loss coefficient value and the dielectric loss coefficient value into the loss curve function to obtain a loss value, and using the loss value to correct the real-time time-domain impedance curve of the high-speed link, and performing impedance mutation analysis according to the corrected result.
进一步的,利用监测工具获取高速链路的频域S参数,并通过对所述频域S参数进行傅里叶变换得到阻抗曲线方程,包括:Further, the monitoring tool is used to obtain the frequency-domain S-parameters of the high-speed link, and the impedance curve equation is obtained by Fourier transforming the frequency-domain S-parameters, including:
利用网络分析仪检测高速链路的频域S参数。Use a network analyzer to detect frequency-domain S-parameters of high-speed links.
进一步的,基于所述阻抗曲线方程生成误差函数,包括:Further, an error function is generated based on the impedance curve equation, including:
设定最小时间范围,并将时间变量在所述最小时间范围内的阻抗曲线方程作为忽略误差的理论传输线阻抗方程;Setting a minimum time range, and using the impedance curve equation of the time variable within the minimum time range as a theoretical transmission line impedance equation ignoring errors;
对理论传输线阻抗方程与阻抗曲线方程做差,得到误差函数。The error function is obtained by taking the difference between the theoretical transmission line impedance equation and the impedance curve equation.
进一步的,根据所述高速链路的导线特性生成导线损耗函数,并根据所述导线损耗函数和设定的介质损耗系数生成损耗曲线函数,包括:Further, a wire loss function is generated according to the wire characteristics of the high-speed link, and a loss curve function is generated according to the wire loss function and a set dielectric loss coefficient, including:
根据高速链路的信号传播速度、电阻率和横截面积计算理论导线损耗函数其中ρ是导线的体电阻率,V是信号传播速度,可以通过相对介电常数和光速得到,A是导线横截面积;Calculation of theoretical wire loss functions based on signal propagation velocity, resistivity, and cross-sectional area for high-speed links Where ρ is the volume resistivity of the wire, V is the signal propagation velocity, which can be obtained from the relative permittivity and the speed of light, and A is the cross-sectional area of the wire;
基于趋肤效应对串联电阻的影响设定导线损耗系数a1,则导线损耗函数r'(t)=a1×r(t);Set the wire loss coefficient a 1 based on the influence of the skin effect on the series resistance, then the wire loss function r'(t)=a 1 ×r(t);
设定介质损耗系数为a2;Set the dielectric loss coefficient as a 2 ;
生成损耗曲线函数 Generate Loss Curve Function
进一步的,将导线损耗系数值和介质损耗系数值代入所述损耗曲线函数得到损耗值,并利用所述损耗值对高速链路的实时时域阻抗曲线进行修正,并根据修正后的结果进行阻抗突变分析,包括:Further, the loss coefficient value of the wire and the dielectric loss coefficient value are substituted into the loss curve function to obtain the loss value, and the real-time time-domain impedance curve of the high-speed link is corrected by using the loss value, and the impedance is calculated according to the corrected result. Mutation analysis, including:
根据对所述高速链路的持续监控更新频域S参数,并将更新的频域S参数通过傅里叶转换得到的阻抗曲线方程作为实时时域阻抗曲线。The frequency-domain S-parameters are updated according to the continuous monitoring of the high-speed link, and the impedance curve equation obtained by Fourier transforming the updated frequency-domain S-parameters is used as a real-time time-domain impedance curve.
第二方面,本发明提供一种高速链路阻抗突变分析系统,包括:In a second aspect, the present invention provides a high-speed link impedance mutation analysis system, including:
链路监测单元,用于利用监测工具获取高速链路的频域S参数,并通过对所述频域S参数进行傅里叶变换得到阻抗曲线方程;The link monitoring unit is used to obtain the frequency-domain S-parameter of the high-speed link by using the monitoring tool, and obtain the impedance curve equation by performing Fourier transform on the frequency-domain S-parameter;
误差计算单元,用于基于所述阻抗曲线方程生成误差函数;an error calculation unit, configured to generate an error function based on the impedance curve equation;
损耗计算单元,用于根据所述高速链路的导线特性生成导线损耗函数,并根据所述导线损耗函数和设定的介质损耗系数生成损耗曲线函数;A loss calculation unit, configured to generate a wire loss function according to the wire characteristics of the high-speed link, and generate a loss curve function according to the wire loss function and a set dielectric loss coefficient;
函数拟合单元,用于利用最小二乘法对误差函数和损耗曲线函数进行拟合,得到导线损耗系数值和介质损耗系数值;The function fitting unit is used to use the least square method to fit the error function and the loss curve function to obtain the wire loss coefficient value and the dielectric loss coefficient value;
阻抗分析单元,用于将导线损耗系数值和介质损耗系数值代入所述损耗曲线函数得到损耗值,并利用所述损耗值对高速链路的实时时域阻抗曲线进行修正,并根据修正后的结果进行阻抗突变分析。The impedance analysis unit is used for substituting the wire loss coefficient value and the dielectric loss coefficient value into the loss curve function to obtain a loss value, and using the loss value to correct the real-time time-domain impedance curve of the high-speed link, and according to the corrected The results were subjected to impedance mutation analysis.
进一步的,所述链路监测单元用于:Further, the link monitoring unit is used for:
利用网络分析仪检测高速链路的频域S参数。Use a network analyzer to detect frequency-domain S-parameters of high-speed links.
进一步的,所述误差计算单元用于:Further, the error calculation unit is used for:
设定最小时间范围,并将时间变量在所述最小时间范围内的阻抗曲线方程作为忽略误差的理论传输线阻抗方程;Setting a minimum time range, and using the impedance curve equation of the time variable within the minimum time range as a theoretical transmission line impedance equation ignoring errors;
对理论传输线阻抗方程与阻抗曲线方程做差,得到误差函数。The error function is obtained by taking the difference between the theoretical transmission line impedance equation and the impedance curve equation.
进一步的,所述损耗计算单元用于:Further, the loss calculation unit is used for:
根据高速链路的信号传播速度、电阻率和横截面积计算理论导线损耗函数其中ρ是导线的体电阻率,V是信号传播速度,可以通过相对介电常数和光速得到,A是导线横截面积;Calculation of theoretical wire loss functions based on signal propagation velocity, resistivity, and cross-sectional area for high-speed links Where ρ is the volume resistivity of the wire, V is the signal propagation velocity, which can be obtained from the relative permittivity and the speed of light, and A is the cross-sectional area of the wire;
基于趋肤效应对串联电阻的影响设定导线损耗系数a1,则导线损耗函数r'(t)=a1×r(t);Set the wire loss coefficient a 1 based on the influence of the skin effect on the series resistance, then the wire loss function r'(t)=a 1 ×r(t);
设定介质损耗系数为a2;Set the dielectric loss coefficient as a 2 ;
生成损耗曲线函数 Generate Loss Curve Function
进一步的,所述阻抗分析单元用于:Further, the impedance analysis unit is used for:
根据对所述高速链路的持续监控更新频域S参数,并将更新的频域S参数通过傅里叶转换得到的阻抗曲线方程作为实时时域阻抗曲线。The frequency-domain S-parameters are updated according to the continuous monitoring of the high-speed link, and the impedance curve equation obtained by Fourier transforming the updated frequency-domain S-parameters is used as a real-time time-domain impedance curve.
第三方面,提供一种终端,包括:In a third aspect, a terminal is provided, including:
处理器、存储器,其中,processor, memory, where,
该存储器用于存储计算机程序,The memory is used to store computer programs,
该处理器用于从存储器中调用并运行该计算机程序,使得终端执行上述的终端的方法。The processor is used to call and run the computer program from the memory, so that the terminal executes the above-mentioned terminal method.
第四方面,提供了一种计算机存储介质,所述计算机可读存储介质中存储有指令,当其在计算机上运行时,使得计算机执行上述各方面所述的方法。In a fourth aspect, a computer storage medium is provided, and instructions are stored in the computer-readable storage medium, and when run on a computer, the computer is made to execute the methods described in the above aspects.
本发明的有益效果在于,本发明提供的高速链路阻抗突变分析方法、系统、终端及存储介质,可以消除S参数傅里叶反变换后的时域阻抗曲线随时间增加而逐渐累积的误差,得到正确反映传输线阻抗和阻抗突变点变化情况的曲线,使高速链路分析和故障检查更加精确。The beneficial effect of the present invention is that the high-speed link impedance mutation analysis method, system, terminal and storage medium provided by the present invention can eliminate the error gradually accumulated in the time-domain impedance curve after the S-parameter inverse Fourier transform increases with time, Obtain curves that correctly reflect the changes in transmission line impedance and impedance mutation points, making high-speed link analysis and fault inspection more accurate.
此外,本发明设计原理可靠,结构简单,具有非常广泛的应用前景。In addition, the design principle of the present invention is reliable, the structure is simple, and has very wide application prospects.
附图说明Description of drawings
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,对于本领域普通技术人员而言,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, In other words, other drawings can also be obtained from these drawings on the premise of not paying creative work.
图1是本发明一个实施例的方法的示意性流程图。Fig. 1 is a schematic flowchart of a method according to an embodiment of the present invention.
图2是本发明一个实施例的方法的另一示意性流程图。Fig. 2 is another schematic flowchart of the method of an embodiment of the present invention.
图3是本发明一个实施例的系统的示意性框图。Fig. 3 is a schematic block diagram of a system according to one embodiment of the present invention.
图4为本发明实施例提供的一种终端的结构示意图。FIG. 4 is a schematic structural diagram of a terminal provided by an embodiment of the present invention.
具体实施方式Detailed ways
为了使本技术领域的人员更好地理解本发明中的技术方案,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都应当属于本发明保护的范围。In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
图1是本发明一个实施例的方法的示意性流程图。其中,图1执行主体可以为一种高速链路阻抗突变分析系统。Fig. 1 is a schematic flowchart of a method according to an embodiment of the present invention. Wherein, the execution subject in FIG. 1 may be a high-speed link impedance mutation analysis system.
如图1所示,该方法包括:As shown in Figure 1, the method includes:
步骤110,利用监测工具获取高速链路的频域S参数,并通过对所述频域S参数进行傅里叶变换得到阻抗曲线方程;Step 110, using a monitoring tool to obtain frequency-domain S-parameters of the high-speed link, and performing Fourier transform on the frequency-domain S-parameters to obtain an impedance curve equation;
步骤120,基于所述阻抗曲线方程生成误差函数;Step 120, generating an error function based on the impedance curve equation;
步骤130,根据所述高速链路的导线特性生成导线损耗函数,并根据所述导线损耗函数和设定的介质损耗系数生成损耗曲线函数;Step 130, generating a wire loss function according to the wire characteristics of the high-speed link, and generating a loss curve function according to the wire loss function and a set dielectric loss coefficient;
步骤140,利用最小二乘法对误差函数和损耗曲线函数进行拟合,得到导线损耗系数值和介质损耗系数值;Step 140, using the least squares method to fit the error function and the loss curve function to obtain the wire loss coefficient value and the dielectric loss coefficient value;
步骤150,将导线损耗系数值和介质损耗系数值代入所述损耗曲线函数得到损耗值,并利用所述损耗值对高速链路的实时时域阻抗曲线进行修正,并根据修正后的结果进行阻抗突变分析。Step 150, Substituting the wire loss coefficient value and the dielectric loss coefficient value into the loss curve function to obtain a loss value, and using the loss value to correct the real-time time-domain impedance curve of the high-speed link, and performing impedance calculation according to the corrected result Mutation analysis.
为了便于对本发明的理解,下面以本发明高速链路阻抗突变分析方法的原理,结合实施例中对高速链路进行阻抗突变分析的过程,对本发明提供的高速链路阻抗突变分析方法做进一步的描述。In order to facilitate the understanding of the present invention, the following uses the principle of the high-speed link impedance mutation analysis method of the present invention, combined with the process of performing impedance mutation analysis on the high-speed link in the embodiment, to further explain the high-speed link impedance mutation analysis method provided by the present invention. describe.
具体的,请参考图2,所述高速链路阻抗突变分析方法包括:Specifically, please refer to Figure 2, the high-speed link impedance mutation analysis method includes:
S1、利用监测工具获取高速链路的频域S参数,并通过对所述频域S参数进行傅里叶变换得到阻抗曲线方程。S1. Using a monitoring tool to acquire frequency-domain S-parameters of the high-speed link, and performing Fourier transform on the frequency-domain S-parameters to obtain an impedance curve equation.
制作一个实际的均匀传输线测试链路,或者建立传输线仿真模型,得到准确的S参数。通过傅里叶反变换得到阻抗曲线方程Z1(t)。Make an actual uniform transmission line test link, or establish a transmission line simulation model to obtain accurate S parameters. The impedance curve equation Z1(t) is obtained by inverse Fourier transform.
S2、基于所述阻抗曲线方程生成误差函数。S2. Generate an error function based on the impedance curve equation.
当时间t很小时,导线损耗和介质损耗小到可以忽略不计,因此可以读取到忽略误差的传输线阻抗值Z0,以此值为基础建立理想的阻抗曲线方程Z0(t)=Z0。两个方程做减法运算可以得到随时间变化的误差函数E(t)。When the time t is very small, the wire loss and dielectric loss are negligible, so the transmission line impedance value Z0 with negligible error can be read, and the ideal impedance curve equation Z0(t)=Z0 can be established based on this value. The time-varying error function E(t) can be obtained by subtracting the two equations.
S3、根据所述高速链路的导线特性生成导线损耗函数,并根据所述导线损耗函数和设定的介质损耗系数生成损耗曲线函数。S3. Generate a wire loss function according to the wire characteristics of the high-speed link, and generate a loss curve function according to the wire loss function and a set dielectric loss coefficient.
导线损耗的源头是导线串联电阻和趋肤效应,串联电阻是由导线横截面参数,导线长度(时间t的函数),导线电阻率决定的。导线横截面和电阻率是已知量,因此可以得到导线串联电阻关于时间t的函数其中ρ是导线的体电阻率,V是信号传播速度,可以通过相对介电常数和光速得到,A是导线横截面积。考虑趋肤效应对串联电阻的影响,添加系数a1来修正r(t),得到完整的导线损耗表达式r'(t)=a1×r(t)。The source of wire loss is wire series resistance and skin effect. Series resistance is determined by wire cross-section parameters, wire length (function of time t), and wire resistivity. The wire cross-section and resistivity are known quantities, so the series resistance of the wire as a function of time t can be obtained Where ρ is the volume resistivity of the wire, V is the signal propagation velocity, which can be obtained from the relative permittivity and the speed of light, and A is the cross-sectional area of the wire. Considering the influence of the skin effect on the series resistance, add the coefficient a 1 to correct r(t), and obtain the complete wire loss expression r'(t)=a 1 ×r(t).
介质损耗的主要参数是损耗因子df值,板材的df值不随时间变化,因此对误差函数的影响是常量,设为系数a2。The main parameter of dielectric loss is the loss factor df value. The df value of the plate does not change with time, so the influence on the error function is constant, which is set as the coefficient a 2 .
建立导线损耗和介质损耗因素构成的拟合曲线方程 Establish the fitting curve equation composed of wire loss and dielectric loss factors
S4、利用最小二乘法对误差函数和损耗曲线函数进行拟合,得到导线损耗系数值和介质损耗系数值。S4. Fitting the error function and the loss curve function by using the least squares method to obtain the wire loss coefficient value and the dielectric loss coefficient value.
使用最小二乘法,拟合F(t)曲线与已知的E(t)曲线,求解a1和a2。最小二乘法从几何意义上讲,就是寻求与给定点集{(xi,yi)}(i=0,1,2,...,m)的距离平方和为最小的曲线y=p(x)。函数p(x)成为拟合函数或最小二乘解,求拟合函数p(x)的方法为曲线拟合的最小二乘法,这种方法是一种基本的数学求解方法。最小二乘拟合公式如下:Use the least square method to fit the F(t) curve and the known E(t) curve to solve a 1 and a 2 . In a geometric sense, the least squares method is to seek the curve y=p with the smallest sum of squares of distances from a given point set {( xi ,y i )}(i=0,1,2,...,m) (x). The function p(x) becomes a fitting function or a least squares solution, and the method for finding the fitting function p(x) is the least squares method of curve fitting, which is a basic mathematical solution method. The least squares fitting formula is as follows:
其中,xi为时间序列,yi是F(t)的序列,a1和a2是拟合函数的系数。通过上述公式可求得a1和a2的值。Among them, x i is the time series, y i is the sequence of F(t), a 1 and a 2 are the coefficients of the fitting function. The values of a 1 and a 2 can be obtained by the above formula.
S5、将导线损耗系数值和介质损耗系数值代入所述损耗曲线函数得到损耗值,并利用所述损耗值对高速链路的实时时域阻抗曲线进行修正,并根据修正后的结果进行阻抗突变分析。S5. Substituting the wire loss coefficient value and the dielectric loss coefficient value into the loss curve function to obtain a loss value, and using the loss value to correct the real-time time-domain impedance curve of the high-speed link, and perform impedance mutation according to the corrected result analyze.
根据对所述高速链路的持续监控更新频域S参数,并将更新的频域S参数通过傅里叶转换得到的阻抗曲线方程作为实时时域阻抗曲线。将步骤S4求得的a1和a2的值代入得到F(t)以后加入到S参数转换为的结果中作为修正部分。在其它的传输线设计进行验证,方程可以适用于绝大多数设计说明得到了最优方法。如果偏差较大则重新修正方程,重新求解。The frequency-domain S-parameters are updated according to the continuous monitoring of the high-speed link, and the impedance curve equation obtained by Fourier transforming the updated frequency-domain S-parameters is used as a real-time time-domain impedance curve. Substitute the values of a 1 and a 2 obtained in step S4 into the obtained F(t) and add it to the result converted from the S parameter as a correction part. As verified in other transmission line designs, the equations can be applied to most designs stating that the optimal method was obtained. If the deviation is large, re-correct the equation and solve it again.
如图3所示,该系统300包括:As shown in Figure 3, the system 300 includes:
链路监测单元310,用于利用监测工具获取高速链路的频域S参数,并通过对所述频域S参数进行傅里叶变换得到阻抗曲线方程;The link monitoring unit 310 is configured to use a monitoring tool to obtain frequency-domain S parameters of the high-speed link, and obtain an impedance curve equation by performing Fourier transform on the frequency-domain S parameters;
误差计算单元320,用于基于所述阻抗曲线方程生成误差函数;An error calculation unit 320, configured to generate an error function based on the impedance curve equation;
损耗计算单元330,用于根据所述高速链路的导线特性生成导线损耗函数,并根据所述导线损耗函数和设定的介质损耗系数生成损耗曲线函数;A loss calculation unit 330, configured to generate a wire loss function according to the wire characteristics of the high-speed link, and generate a loss curve function according to the wire loss function and a set dielectric loss coefficient;
函数拟合单元340,用于利用最小二乘法对误差函数和损耗曲线函数进行拟合,得到导线损耗系数值和介质损耗系数值;The function fitting unit 340 is used to use the least square method to fit the error function and the loss curve function to obtain the wire loss coefficient value and the dielectric loss coefficient value;
阻抗分析单元350,用于将导线损耗系数值和介质损耗系数值代入所述损耗曲线函数得到损耗值,并利用所述损耗值对高速链路的实时时域阻抗曲线进行修正,并根据修正后的结果进行阻抗突变分析。The impedance analysis unit 350 is used to substitute the wire loss coefficient value and the dielectric loss coefficient value into the loss curve function to obtain a loss value, and use the loss value to correct the real-time time-domain impedance curve of the high-speed link, and according to the corrected The results were subjected to impedance mutation analysis.
可选地,作为本发明一个实施例,所述链路监测单元用于:Optionally, as an embodiment of the present invention, the link monitoring unit is used for:
利用网络分析仪检测高速链路的频域S参数。Use a network analyzer to detect frequency-domain S-parameters of high-speed links.
可选地,作为本发明一个实施例,所述误差计算单元用于:Optionally, as an embodiment of the present invention, the error calculation unit is used for:
设定最小时间范围,并将时间变量在所述最小时间范围内的阻抗曲线方程作为忽略误差的理论传输线阻抗方程;Setting a minimum time range, and using the impedance curve equation of the time variable within the minimum time range as a theoretical transmission line impedance equation ignoring errors;
对理论传输线阻抗方程与阻抗曲线方程做差,得到误差函数。The error function is obtained by taking the difference between the theoretical transmission line impedance equation and the impedance curve equation.
可选地,作为本发明一个实施例,所述损耗计算单元用于:Optionally, as an embodiment of the present invention, the loss calculation unit is used for:
根据高速链路的信号传播速度、电阻率和横截面积计算理论导线损耗函数其中ρ是导线的体电阻率,V是信号传播速度,可以通过相对介电常数和光速得到,A是导线横截面积;Calculation of theoretical wire loss functions based on signal propagation velocity, resistivity, and cross-sectional area for high-speed links Where ρ is the volume resistivity of the wire, V is the signal propagation velocity, which can be obtained from the relative permittivity and the speed of light, and A is the cross-sectional area of the wire;
基于趋肤效应对串联电阻的影响设定导线损耗系数a1,则导线损耗函数r'(t)=a1×r(t);Set the wire loss coefficient a 1 based on the influence of the skin effect on the series resistance, then the wire loss function r'(t)=a 1 ×r(t);
设定介质损耗系数为a2;Set the dielectric loss coefficient as a 2 ;
生成损耗曲线函数 Generate Loss Curve Function
可选地,作为本发明一个实施例,所述阻抗分析单元用于:Optionally, as an embodiment of the present invention, the impedance analysis unit is used for:
根据对所述高速链路的持续监控更新频域S参数,并将更新的频域S参数通过傅里叶转换得到的阻抗曲线方程作为实时时域阻抗曲线。The frequency-domain S-parameters are updated according to the continuous monitoring of the high-speed link, and the impedance curve equation obtained by Fourier transforming the updated frequency-domain S-parameters is used as a real-time time-domain impedance curve.
图4为本发明实施例提供的一种终端400的结构示意图,该终端400可以用于执行本发明实施例提供的高速链路阻抗突变分析方法。FIG. 4 is a schematic structural diagram of a terminal 400 provided by an embodiment of the present invention, and the terminal 400 may be used to implement the method for analyzing a sudden change in impedance of a high-speed link provided by an embodiment of the present invention.
其中,该终端400可以包括:处理器410、存储器420及通信单元430。这些组件通过一条或多条总线进行通信,本领域技术人员可以理解,图中示出的服务器的结构并不构成对本发明的限定,它既可以是总线形结构,也可以是星型结构,还可以包括比图示更多或更少的部件,或者组合某些部件,或者不同的部件布置。Wherein, the terminal 400 may include: a processor 410 , a memory 420 and a communication unit 430 . These components communicate through one or more buses. Those skilled in the art can understand that the structure of the server shown in the figure does not constitute a limitation to the present invention. It can be a bus structure, a star structure, or a More or fewer components than shown, or combinations of certain components, or different arrangements of components may be included.
其中,该存储器420可以用于存储处理器410的执行指令,存储器420可以由任何类型的易失性或非易失性存储终端或者它们的组合实现,如静态随机存取存储器(SRAM),电可擦除可编程只读存储器(EEPROM),可擦除可编程只读存储器(EPROM),可编程只读存储器(PROM),只读存储器(ROM),磁存储器,快闪存储器,磁盘或光盘。当存储器420中的执行指令由处理器410执行时,使得终端400能够执行以下上述方法实施例中的部分或全部步骤。Wherein, the memory 420 can be used to store the execution instructions of the processor 410, and the memory 420 can be realized by any type of volatile or non-volatile storage terminal or their combination, such as static random access memory (SRAM), electronic Erasable Programmable Read Only Memory (EEPROM), Erasable Programmable Read Only Memory (EPROM), Programmable Read Only Memory (PROM), Read Only Memory (ROM), Magnetic Memory, Flash Memory, Magnetic Disk or Optical Disk . When the execution instructions in the memory 420 are executed by the processor 410, the terminal 400 is enabled to perform some or all of the steps in the following above-mentioned method embodiments.
处理器410为存储终端的控制中心,利用各种接口和线路连接整个电子终端的各个部分,通过运行或执行存储在存储器420内的软件程序和/或模块,以及调用存储在存储器内的数据,以执行电子终端的各种功能和/或处理数据。所述处理器可以由集成电路(Integrated Circuit,简称IC)组成,例如可以由单颗封装的IC所组成,也可以由连接多颗相同功能或不同功能的封装IC而组成。举例来说,处理器410可以仅包括中央处理器(Central Processing Unit,简称CPU)。在本发明实施方式中,CPU可以是单运算核心,也可以包括多运算核心。The processor 410 is the control center of the storage terminal, using various interfaces and lines to connect various parts of the entire electronic terminal, by running or executing software programs and/or modules stored in the memory 420, and calling data stored in the memory, To perform various functions of the electronic terminal and/or process data. The processor may be composed of an integrated circuit (Integrated Circuit, IC for short), for example, may be composed of a single packaged IC, or may be composed of multiple packaged ICs connected with the same function or different functions. For example, the processor 410 may only include a central processing unit (Central Processing Unit, CPU for short). In the embodiments of the present invention, the CPU may be a single computing core, or may include multiple computing cores.
通信单元430,用于建立通信信道,从而使所述存储终端可以与其它终端进行通信。接收其他终端发送的用户数据或者向其他终端发送用户数据。The communication unit 430 is configured to establish a communication channel, so that the storage terminal can communicate with other terminals. Receive user data sent by other terminals or send user data to other terminals.
本发明还提供一种计算机存储介质,其中,该计算机存储介质可存储有程序,该程序执行时可包括本发明提供的各实施例中的部分或全部步骤。所述的存储介质可为磁碟、光盘、只读存储记忆体(英文:read-only memory,简称:ROM)或随机存储记忆体(英文:random access memory,简称:RAM)等。The present invention also provides a computer storage medium, wherein the computer storage medium may store a program, and the program may include part or all of the steps in the various embodiments provided by the present invention when executed. The storage medium may be a magnetic disk, an optical disk, a read-only memory (English: read-only memory, ROM for short), or a random access memory (English: random access memory, RAM for short), and the like.
因此,本发明可以消除S参数傅里叶反变换后的时域阻抗曲线随时间增加而逐渐累积的误差,得到正确反映传输线阻抗和阻抗突变点变化情况的曲线,使高速链路分析和故障检查更加精确,本实施例所能达到的技术效果可以参见上文中的描述,此处不再赘述。Therefore, the present invention can eliminate the error that the time-domain impedance curve after the S-parameter inverse Fourier transform gradually accumulates as time increases, and obtain a curve that correctly reflects the change of the transmission line impedance and the impedance mutation point, enabling high-speed link analysis and fault inspection More precisely, the technical effects that can be achieved by this embodiment can refer to the above description, and will not be repeated here.
本领域的技术人员可以清楚地了解到本发明实施例中的技术可借助软件加必需的通用硬件平台的方式来实现。基于这样的理解,本发明实施例中的技术方案本质上或者说对现有技术做出贡献的部分可以以软件产品的形式体现出来,该计算机软件产品存储在一个存储介质中如U盘、移动硬盘、只读存储器(ROM,Read-Only Memory)、随机存取存储器(RAM,Random Access Memory)、磁碟或者光盘等各种可以存储程序代码的介质,包括若干指令用以使得一台计算机终端(可以是个人计算机,服务器,或者第二终端、网络终端等)执行本发明各个实施例所述方法的全部或部分步骤。Those skilled in the art can clearly understand that the technologies in the embodiments of the present invention can be implemented by means of software plus a necessary general-purpose hardware platform. Based on such an understanding, the technical solutions in the embodiments of the present invention essentially or the part that contributes to the prior art can be embodied in the form of software products, and the computer software products are stored in a storage medium such as a USB flash drive, mobile Hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), magnetic disk or optical disk and other media that can store program codes, including several instructions to make a computer terminal (It may be a personal computer, a server, or a second terminal, a network terminal, etc.) Execute all or part of the steps of the methods described in the various embodiments of the present invention.
本说明书中各个实施例之间相同相似的部分互相参见即可。尤其,对于终端实施例而言,由于其基本相似于方法实施例,所以描述的比较简单,相关之处参见方法实施例中的说明即可。For the same and similar parts among the various embodiments in this specification, refer to each other. In particular, for the terminal embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and for relevant details, refer to the description in the method embodiment.
在本发明所提供的几个实施例中,应该理解到,所揭露的系统和方法,可以通过其它的方式实现。例如,以上所描述的系统实施例仅仅是示意性的,例如,所述单元的划分,仅仅为一种逻辑功能划分,实际实现时可以有另外的划分方式,例如多个单元或组件可以结合或者可以集成到另一个系统,或一些特征可以忽略,或不执行。另一点,所显示或讨论的相互之间的耦合或直接耦合或通信连接可以是通过一些接口,系统或单元的间接耦合或通信连接,可以是电性,机械或其它的形式。In the several embodiments provided by the present invention, it should be understood that the disclosed system and method can be implemented in other ways. For example, the system embodiments described above are only illustrative. For example, the division of the units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or May be integrated into another system, or some features may be ignored, or not implemented. In another point, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, and the indirect coupling or communication connection of systems or units may be in electrical, mechanical or other forms.
所述作为分离部件说明的单元可以是或者也可以不是物理上分开的,作为单元显示的部件可以是或者也可以不是物理单元,即可以位于一个地方,或者也可以分布到多个网络单元上。可以根据实际的需要选择其中的部分或者全部单元来实现本实施例方案的目的。The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place, or may be distributed to multiple network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.
另外,在本发明各个实施例中的各功能单元可以集成在一个处理单元中,也可以是各个单元单独物理存在,也可以两个或两个以上单元集成在一个单元中。In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, each unit may exist separately physically, or two or more units may be integrated into one unit.
尽管通过参考附图并结合优选实施例的方式对本发明进行了详细描述,但本发明并不限于此。在不脱离本发明的精神和实质的前提下,本领域普通技术人员可以对本发明的实施例进行各种等效的修改或替换,而这些修改或替换都应在本发明的涵盖范围内/任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,可轻易想到变化或替换,都应涵盖在本发明的保护范围之内。因此,本发明的保护范围应所述以权利要求的保护范围为准。Although the present invention has been described in detail in conjunction with preferred embodiments with reference to the accompanying drawings, the present invention is not limited thereto. Without departing from the spirit and essence of the present invention, those skilled in the art can make various equivalent modifications or replacements to the embodiments of the present invention, and these modifications or replacements should be within the scope of the present invention/any Those skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present invention, and all should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201336411Y (en) * | 2008-12-24 | 2009-10-28 | 杭州华三通信技术有限公司 | Bonding pad group for SFP connector and communication device |
CN107943641A (en) * | 2017-11-16 | 2018-04-20 | 郑州云海信息技术有限公司 | A kind of method and device for generating multiport S parameter document |
CN109815585A (en) * | 2019-01-22 | 2019-05-28 | 郑州云海信息技术有限公司 | A method and apparatus for viewing differential loss of an S-parameter model |
CN112134623A (en) * | 2020-09-23 | 2020-12-25 | 北京安石科技有限公司 | Link design capable of realizing high-speed signal transmission and low loss |
-
2021
- 2021-12-17 CN CN202111550562.XA patent/CN114363205B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201336411Y (en) * | 2008-12-24 | 2009-10-28 | 杭州华三通信技术有限公司 | Bonding pad group for SFP connector and communication device |
CN107943641A (en) * | 2017-11-16 | 2018-04-20 | 郑州云海信息技术有限公司 | A kind of method and device for generating multiport S parameter document |
CN109815585A (en) * | 2019-01-22 | 2019-05-28 | 郑州云海信息技术有限公司 | A method and apparatus for viewing differential loss of an S-parameter model |
CN112134623A (en) * | 2020-09-23 | 2020-12-25 | 北京安石科技有限公司 | Link design capable of realizing high-speed signal transmission and low loss |
Non-Patent Citations (1)
Title |
---|
高速SerDes系统的时钟恢复电路设计研究;郭俊;《中国优秀硕士学位论文全文数据库(电子期刊) 信息科技辑》;全文 * |
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