CN114355150A

CN114355150A - Circuit board detection equipment

Info

Publication number: CN114355150A
Application number: CN202111156641.2A
Authority: CN
Inventors: 罗雅鸿; 林文伟; 林文忠; 王友泽; 杨煌煌; 蔡守仁; 汤富俊
Original assignee: MJC Probe Inc
Current assignee: MJC Probe Inc
Priority date: 2020-10-14
Filing date: 2021-09-30
Publication date: 2022-04-15

Abstract

The invention relates to a circuit board detection device, which comprises a material placing carrier platform which bears a circuit board and can rotate, two probe devices which can respectively move along the three axial directions, and an image capturing device which can move along the three axial directions to align the electric contact points of the circuit board. Each probe device comprises a mounting seat, a probe unit, a transfer seat and at least one transmission line. The probe unit comprises a probe seat which can be rotatably arranged on the mounting seat and is relatively fixed with the adapter seat, and at least one probe arranged on the probe seat. The transmission line is provided with a first joint which is electrically connected with the probe unit in a conduction way and a second joint which is fixed on the adapter. The transmission line is used for connecting another transmission line to the second joint, the connection mode of the transmission line can ensure that the measurement stability is good, and the rotation of the material placing carrying platform is convenient for detection.

Description

Circuit board detection equipment

Technical Field

The present invention relates to a circuit board inspection apparatus, and more particularly, to a circuit board inspection apparatus having two probe devices for inspecting the same circuit board simultaneously.

Background

Conventional inspection equipment for circuit boards (especially Printed Circuit Boards (PCBs)) is usually an impedance test equipment for time domain inspection, and the equipment only needs to use a probe device to measure the impedance of each circuit of the circuit board, so as to meet the test requirement. When considering the frequency domain test, the loss of the circuit board must be measured, which is difficult to test, and usually two probe devices are used to detect two points of the circuit board simultaneously.

However, there are many variations of the measurement points in the circuit board, and the two-probe apparatus may interfere at some specific relative positions due to the limitation of the mechanism size. That is, the two probe devices may encounter some measurement points that cannot be directly detected during the process of detecting the circuit board. At this moment, the user needs to detach the circuit board from the material placing carrier and fix the circuit board on the material placing carrier again, so that the measurement point position which cannot be detected is transferred to the position where detection can be performed, and detection can be continued.

In addition, the probe provided in the probe apparatus is connected to a detecting instrument through a transmission line (usually a coaxial cable) having a considerable length. However, when the probe apparatus rotates, the transmission line connected to the probe may cause the probe to vibrate, which results in unstable measurement.

Disclosure of Invention

In view of the above problems, it is an object of the present invention to provide a circuit board inspection apparatus, which includes two probe devices for inspecting the same circuit board simultaneously and can solve at least one of the above problems.

To achieve the above object, the present invention provides a circuit board inspection apparatus capable of defining a first axial direction, a second axial direction and a third axial direction perpendicular to each other, the apparatus comprising: a base; the material placing carrier is arranged on the base in a manner of rotating around the first axial direction and is provided with a bearing surface for a circuit board to be arranged on the bearing surface, and the circuit board comprises a plurality of electrical contacts; the probe unit comprises a probe seat which can be rotationally arranged on the mounting seat around the first axial direction and at least one probe which is arranged on the probe seat and is used for contacting an electrical contact of the circuit board by the probe; and the image capturing equipment can move along the first axial direction, the second axial direction and the third axial direction, can be arranged on the base in a shooting way towards the bearing surface of the material placing carrier and is used for aligning the electric contact of the circuit board.

In the technical solution of the present invention, each of the probe devices includes an adapter fixed to the probe base, and at least one transmission line, where the transmission line includes a first connector and a second connector respectively located at two ends of the transmission line, the first connector is electrically connected to the probe unit in a conductive manner with the probe, and the second connector is fixed to the adapter so that another transmission line is connected to the second connector.

By adopting the technical scheme, according to the result of the image capturing equipment for aligning the electrical contacts of the circuit board, the two probe devices can respectively move to the required point measurement positions and the probe units can rotate to the required point measurement angles, so that the probes are used for point measuring the electrical contacts of the circuit board, when the positions of the electrical contacts of the two probe devices which need point measurement cause mechanism interference and cannot be directly detected, the circuit board can be rotated by rotating the material placing carrier platform, the relative positions of the electrical contacts which cannot be simultaneously subjected to point measurement by the two probe devices are changed, the detection can be continuously carried out, and the detection efficiency can be conveniently and quickly prevented from being reduced.

To achieve the above object, the present invention provides another circuit board inspection apparatus, which can define a first axial direction, a second axial direction and a third axial direction perpendicular to each other, the apparatus comprising: a base; the material placing carrier is arranged on the base and provided with a bearing surface for a circuit board to be arranged on the bearing surface, and the circuit board comprises a plurality of electrical contacts; two probe devices, each of which includes an installation base capable of moving along the first axial direction, the second axial direction and the third axial direction and disposed on the base, a probe unit, a transfer base, and at least one transmission line, wherein the probe unit includes a probe base rotatably disposed on the installation base around the first axial direction, and at least one probe disposed on the probe base for contacting an electrical contact of the circuit board with the probe, the transfer base is fixed relative to the probe base, the transmission line includes a first joint and a second joint respectively disposed at two ends of the transmission line, the first joint is electrically connected to the probe unit with the probe, and the second joint is fixed on the transfer base for connecting another transmission line to the second joint; and the image capturing equipment can move along the first axial direction, the second axial direction and the third axial direction, can be arranged on the base in a shooting way towards the bearing surface of the material placing carrier and is used for aligning the electric contact of the circuit board.

In the above technical solution of the present invention, each of the probe devices includes a rotating shaft rotatably disposed on the mounting base around the first axial direction, the probe base and the adapter base are relatively fixed to the rotating shaft, and the probe base is closer to the material placing stage than the adapter base.

Each probe device comprises a base, the adapter and the base are respectively fixed at two ends of the rotating shaft, and the probe seat is fixed on the base.

The adapter comprises a base plate fixed on the rotating shaft, an adapter plate fixedly arranged on the second joint and a fixing piece detachably fixing the adapter plate on the base plate.

Each probe device comprises two transmission lines, and second joints of the two transmission lines are respectively positioned at two opposite sides of the fixing piece.

The adapter further comprises an extension plate fixed on the substrate and extending from the substrate towards the direction far away from the rotating shaft, and a fixing unit arranged on the extension plate and used for locally fixing the other transmission line on the fixing unit.

The laser range finder is fixed on a mounting seat of one of the two probe devices.

The image capture device is a mounting base fixed to the other of the two probe devices.

The invention also comprises another image capturing device which is fixed on the base and is positioned at the periphery of the material placing carrier, and the shooting directions of the two image capturing devices are opposite.

The invention also comprises a jig disc, wherein the jig disc is arranged on the bearing surface of the material placing carrying platform and is used for arranging the circuit boards on the jig disc.

The invention also comprises a limit bearing assembly arranged on the bearing surface of the material placing carrier, wherein one of the circuit board and a jig disc which is arranged on the bearing surface of the material placing carrier and used for bearing the circuit board is supported on the limit bearing assembly.

By adopting the technical scheme, according to the result of the image capturing equipment aligning the electrical contact points of the circuit board, the two probe devices can respectively move to the required point measurement positions and the probe units can respectively rotate to the required point measurement angles, so that the probe points are used for measuring each electrical contact point of the circuit board, each probe is electrically connected with the long transmission line through the short transmission line, the long transmission line is connected to a detection instrument, the probe and the detection instrument are mutually electrically connected and can be used for the detection instrument to detect the electrical contact points of the circuit board, and the transmission line connection mode can avoid the rotation of the probe units from influencing the stability of the transmission line, so that better measurement stability can be generated.

Drawings

Fig. 1 is a perspective assembly view of a circuit board inspection apparatus according to a preferred embodiment of the present invention;

FIG. 2 is a top view of the circuit board inspection apparatus;

FIG. 3 is an enlarged view of a portion of FIG. 1, showing primarily a probe assembly and associated components of the circuit board inspection apparatus;

FIG. 4 is a perspective assembly view of the probe device and associated components shown in FIG. 3 from another angle;

FIG. 5 is an enlarged view of a portion of the circuit board inspection apparatus from another perspective, showing primarily another probe device and associated components thereof;

FIG. 6 is a perspective assembly view of the probe device and associated components shown in FIG. 5 from another angle;

fig. 7A and 7B are schematic top views of a circuit board.

Detailed Description

The details of the construction, features, assembly, or use of the invention are set forth in the accompanying drawings and the description below.

Applicant hereby gives notice that the same reference numerals will be used throughout the several views of the drawings to identify the same or similar elements or features thereof. It is noted that the components and arrangements of the drawings are not necessarily to scale and/or quantity, emphasis instead being placed upon illustrating the various embodiments, and that the features of the various embodiments may be practiced otherwise than as specifically described. Further, when an element is referred to as being disposed on another element, it means that the element is directly disposed on the another element or is indirectly disposed on the another element, i.e., one or more other elements are also disposed between the elements. When an element is referred to as being "directly on" another element, it is not intended that any other element be present between the elements.

Referring to fig. 1 and fig. 2, a circuit board inspection apparatus 10 according to a preferred embodiment of the present invention mainly includes a base 11, a material loading stage 12, a displacement mechanism 20, and two

probe devices

30A and 30B.

The material placing stage 12 can be arranged on the base 11 to rotate +/-180 degrees around a first axial direction (Z axis). More specifically, a rotation driving device (not shown) connected to the bottom surface of the loading platform 12 is disposed inside the base 11, and is used for driving the loading platform 12 to rotate relative to the base 11. As shown in fig. 7A, the circuit board 40 includes a plurality of circuits 42, and two ends of each circuit 42 respectively have two electrical contacts 422. As shown in fig. 1 and fig. 2, the carrying surface 122 of the loading platform 12 of the present embodiment is provided with a jig plate 13, for disposing the plurality of circuit boards 40 on the jig plate 13. In other words, the circuit board 40 is indirectly disposed on the carrying surface 122 through the jig tray 13. More specifically, the circuit boards 40 are fixed on the jig tray 13, and then the jig tray 13 carrying the circuit boards 40 is placed on the carrying surface 122 of the material loading stage 12. Therefore, the circuit board detection device 10 can continuously detect a plurality of circuit boards, so as to save the time for replacing the circuit boards. However, the circuit board inspection apparatus 10 of the present invention is not limited to include the jig tray 13, and for example, when the circuit board 40 is large in size and the loading platform 12 cannot simultaneously carry a plurality of circuit boards 40, the jig tray 13 is not needed. That is, the circuit board 40 can be directly disposed on the carrying surface 122 of the material loading stage 12. In addition, the carrying surface 122 of the material loading platform 12 of the present embodiment is further provided with a limit bearing assembly 14. The position-limiting bearing assembly 14 includes two L-shaped first bearing members 141 and four generally rectangular second bearing members 142, so that the jig tray 13 is supported by the four edges of the jig tray to limit the position of the first and second bearing

members

141, 142. Alternatively, in the case that the circuit board 40 is directly disposed on the carrying surface 122, the circuit board 40 may be limited by the four edges thereof abutting against the first and second abutting

members

141 and 142.

The displacement mechanism 20 is provided on the base 11, and the displacement mechanism 20 can drive the two

probe devices

30A and 30B provided on the displacement mechanism 20 to linearly displace in the three-axis direction above the material placing stage 12. In the directions shown in fig. 1 and fig. 2, the displacement mechanism 20 includes two first linear displacement assemblies 21 respectively located at the front side and the rear side of the material loading platform 12, two second linear displacement assemblies 22 commonly straddling the two first linear displacement assemblies 21, and two third linear displacement assemblies 23 respectively disposed on the two second linear displacement assemblies 22. Each

linear displacement assembly

21, 22, 23 may be a conventional linear displacement assembly including a motor, a lead screw, a slide, etc., and the structure thereof is not described in detail herein. The two second linear displacement elements 22 are driven by the two first linear displacement elements 21 to linearly displace along a second axial direction (Y axis). The two third linear displacement assemblies 23 are driven by the two second linear displacement assemblies 22 respectively and can be displaced linearly along a third axial direction (X axis). The two

probe devices

30A and 30B are respectively disposed on the two third linear displacement assemblies 23, and are respectively driven by the two third linear displacement assemblies 23 to respectively linearly displace along the first axial direction (Z axis). In other words, the two

probe devices

30A and 30B are indirectly disposed on the base 11 through the displacement mechanism 20, and can be driven by the displacement mechanism 20 to move along the first axial direction (Z axis), the second axial direction (Y axis), and the third axial direction (X axis).

Referring to fig. 3 to 6, each of the two

probe devices

30A and 30B includes a mounting base 31 disposed on the corresponding third linear displacement assembly 23 and capable of being driven by the displacement mechanism 20 to move along the X, Y, Z axis, a rotation driving device 32 passing through a bottom plate 311 of the mounting base 31 and fixed on the bottom plate 311, a rotating shaft 33 passing through the bottom plate 311 and connected to the rotation driving device 32 and capable of being driven by the rotation driving device 32 to rotate around the Z axis by ± 90 degrees, a base 34 fixed at the bottom end of the rotating shaft 33, and a probe unit 35 fixed at an edge of the base 34. The probe unit 35 includes a probe base 352 fixed on the base 34, and two probes (the number is not limited) disposed on the probe base 352. In other words, the probe unit 35 not only moves along the axis X, Y, Z with the mounting base 31, but also rotates around the axis Z with respect to the mounting base 31 with the rotation shaft 33, so that the probe can contact the electrical contacts 422 of the circuit board 40. Since the probes are very tiny and difficult to clearly show in the drawings, each probe is only illustrated by a dot (representing the tip of the probe) in fig. 7A and 7B, wherein the

probes

354A and 354B are the probes of the

probe devices

30A and 30B, respectively. It should be noted that the probe unit 35 adopted in the present embodiment is similar to the probe unit provided in taiwan patent No. I39694, and the structure thereof is not described in detail herein. The probe unit of the present invention is not limited to this type of probe unit, and may be a probe unit including a circuit board and an elastic probe disposed on the circuit board. The rotary drive device may be a conventional rotary drive device including a motor, a bearing, and the like, and the structure thereof is not described in detail herein.

As shown in fig. 3 to 6, each of the

probe devices

30A and 30B further includes an adapter 36 fixed to the top end of the rotating shaft 33 and two transmission lines 37 disposed on the adapter 36, in addition to the aforementioned components. It should be noted that each transmission line 37 is used to connect to another transmission line 50 for connecting to a testing instrument (not shown) through the transmission line 50, so that the transmission line 50 will have a considerable length, also referred to as a long transmission line in the present invention. Transmission line 37, in contrast, is much shorter than transmission line 50, also referred to herein as a short transmission line. In addition, the number of the transmission lines 37 of each

probe apparatus

30A, 30B is not limited, each

probe apparatus

30A, 30B may only have one transmission line 37, and the structure of the adapter 36 may have different designs according to the number of the transmission lines 37, and is not limited to the one provided in this embodiment.

The adapter 36 of the present embodiment includes a substrate 361 fixed to the top end of the shaft 33, an adapter plate 362 disposed along an edge of the substrate 361 and directly above the probe seat 352, and a fixing member 363 passing through a central area of the adapter plate 362 and detachably fixing the adapter plate 362 to the substrate 361. Each transmission line 37 includes a first terminal 371 and a second terminal 372 at two ends thereof. The first terminals 371 of the two transmission lines 37 are respectively connected to the two terminals 353 of the probe seat 352, and electrically connected to the corresponding probes through the conductive structure inside the probe seat 352. The second connectors 372 of the two transmission lines 37 are fixed to the adapter plate 362 and located on two opposite sides of the fixing element 363, respectively, so that the connector 51 at one end of the transmission line 50 is connected to the second connectors 372, and each of the

probes

354A and 354B is electrically connected to the inspection instrument through the probe seat 352, the transmission line 37 and the transmission line 50 in sequence. It should be noted that fig. 3 and 5 show the state that the first and

second connectors

371, 372 of the two transmission lines 37 are not connected to the probe seat 352 and the transmission line 50, and the

transmission lines

37, 50 are drawn shorter to clearly show the structures of the

transmission lines

37, 50 and the probe seat 352. In practice, the

transmission lines

37 and 50 are long enough to be connected in the state shown in fig. 4 and 6. In addition, the adapter 36 of the present embodiment further includes an extending plate 364 fixed on the substrate 361 and extending from the substrate 361 in a direction away from the rotating shaft 33, and a fixing unit 365 disposed at a distal end portion of the extending plate 364, so that the transmission line 50 is partially fixed to the fixing unit 365.

The circuit board inspection apparatus 10 of the present embodiment further includes a laser range finder 15, a first image capturing device 16, and a second image capturing device 17 in addition to the aforementioned components. As shown in fig. 3 and 4, laser rangefinder 15 is fixed to a vertical plate 312 of mounting base 31 of probe device 30A, so laser rangefinder 15 is displaced along axis X, Y, Z with probe device 30A. The relative position of the laser range finder 15 and the probe device 30A is fixed, so that the Z-axis distance between the probe device 30A and the material loading platform 12 can be detected. As shown in fig. 5 and 6, the first image capturing device 16 is fixed to a vertical plate 312 of the mounting seat 31 of the probe apparatus 30B, so that the first image capturing device 16 moves along the axis X, Y, Z with the probe apparatus 30B. The first image capturing device 16 is shot toward the carrying surface 122 of the loading platform 12 (i.e. shot downward) for aligning the electrical contacts 422 of the circuit board 40. As shown in fig. 1 and 2, the second image capturing device 17 is fixed on the base 11 and located at the periphery of the material loading stage 12. The second image capturing device 17 is shot in the opposite direction (i.e., upward) from the first image capturing device 16 for aligning the tips of the

probes

354A, 354B of the

probe apparatuses

30A, 30B. The alignment result is compared with the Z-axis distance between the probe device 30A and the material loading stage 12 measured by the laser range finder 15, so as to calculate the Z-axis distance between the probe device 30B and the material loading stage 12, and obtain the distance that the

probe device

30A, 30B needs to move along the Z-axis when detecting the electrical contact 422 of the circuit board 40. In addition, the position offset of the electrical contact 422 of the circuit board 40 and the tip positions of the

probes

354A and 354B measured by the first and second

image capturing devices

16 and 17 can be obtained, so as to obtain the distance that the

probe apparatus

30A and 30B needs to move along the axis X, Y when detecting the electrical contact 422 of the circuit board 40.

According to the alignment and distance measurement results, the two

probe devices

30A and 30B can move to the required detection positions respectively and the probe units 35 can rotate to the required detection angles, so as to simultaneously point-measure the electrical contacts 422 of the circuit board 40 by the

probes

354A and 354B, thereby performing a frequency domain test on the circuit board 40, for example, the

probes

354A and 354B of the two

probe devices

30A and 30B are simultaneously used to point-measure the electrical contacts 422 at two ends of the same circuit 42, so as to measure the electrical loss of the circuit 42. As shown in fig. 7A, the traces 42 of the circuit board 40 are not regularly arranged but have different extending directions, so the relative positions of the electrical contacts 422 of different traces 42 are different. When the two

probe devices

30A and 30B need to spot the electrical contacts 422 at the two ends of the circuit indicated by reference numeral 42 in fig. 7A, due to the limitation of the mechanism size, the Y-axis positions of the two

probe devices

30A and 30B are too close to cause mechanism interference, so that direct detection cannot be performed. At this time, as long as the material loading platform 12 rotates to adjust the circuit board 40 to the direction as shown in fig. 7B, the relative position of the electrical contact 422 that cannot be detected originally can be changed, so that the detection can be continued. It should be noted that the circuit board inspection apparatus 10 of the present invention is not limited to be applied to frequency domain testing, and can also be used to perform time domain inspection only by using a single probe device.

In addition, as can be seen from the foregoing, the adaptor 36 of each

probe apparatus

30A, 30B is fixed relative to the rotating shaft 33 and the probe unit 35, so that the adaptor 36 rotates together when the probe unit 35 rotates to the required detection angle. Because the signal transmission path between the probe and the testing instrument adopts a two-section transmission line design, that is, the short transmission line 37 is connected between the probe seat 352 and the adapter seat 36, and the long transmission line 50 extends from the top end of the short transmission line 37 to the distant testing instrument. Therefore, the rotation of the probe unit 35 can be prevented from affecting the stability of the signal transmission path, and thus, better measurement stability can be obtained. Moreover, the fixing element 363 of the adapter 36 allows a user to detach the adapter 362 from the transmission line 37, so that the transmission line 37 can be connected to a calibration element (not shown) for line calibration, thereby overcoming the line loss caused by the two-section transmission line design.

It should be noted that, if the two-section transmission line design of the present invention is not formed by using the switching manner, that is, if the transmission line 50 and the transmission line 37 of the same signal transmission path are the same transmission line, and only one section of the same transmission line is fixed on the switching seat 36, the fixed portion of the transmission line will be frequently twisted due to the rotation of the rotating shaft 33, resulting in the shortened service life of the transmission line. Therefore, the two-section transmission line design adopted by the invention has the advantages of good measurement stability and long service life of the transmission line.

Finally, it should be understood that the components of the present invention disclosed in the above embodiments are exemplary only, and those skilled in the art will understand that the detailed description and specific examples given for carrying out the invention are intended to illustrate the invention and not to limit the scope of the invention, and that various alternatives and modifications of the equivalent components are also intended to be included within the scope of the invention.

Claims

1. A circuit board inspection apparatus capable of defining a first axis, a second axis and a third axis perpendicular to each other, the apparatus comprising:

a base;

the material placing carrier is arranged on the base in a manner of rotating around the first axial direction and is provided with a bearing surface for a circuit board to be arranged on the bearing surface, and the circuit board comprises a plurality of electrical contacts;

the probe unit comprises a probe seat which can be rotationally arranged on the mounting seat around the first axial direction and at least one probe which is arranged on the probe seat and is used for contacting an electrical contact of the circuit board by the probe;

and the image capturing equipment can move along the first axial direction, the second axial direction and the third axial direction, can be arranged on the base in a shooting way towards the bearing surface of the material placing carrier and is used for aligning the electric contact of the circuit board.

2. The circuit board inspection apparatus of claim 1, wherein: each probe device comprises an adapter seat fixed opposite to the probe seat and at least one transmission line, wherein the transmission line comprises a first joint and a second joint which are respectively positioned at two ends of the transmission line, the first joint is electrically conducted with the probe and connected to the probe unit, and the second joint is fixed on the adapter seat so that the other transmission line can be connected to the second joint.

3. A circuit board inspection apparatus capable of defining a first axis, a second axis and a third axis perpendicular to each other, the apparatus comprising:

a base;

the material placing carrier is arranged on the base and provided with a bearing surface for a circuit board to be arranged on the bearing surface, and the circuit board comprises a plurality of electrical contacts;

two probe devices, each of which includes an installation base capable of moving along the first axial direction, the second axial direction and the third axial direction and disposed on the base, a probe unit, a transfer base, and at least one transmission line, wherein the probe unit includes a probe base rotatably disposed on the installation base around the first axial direction, and at least one probe disposed on the probe base for contacting an electrical contact of the circuit board with the probe, the transfer base is fixed relative to the probe base, the transmission line includes a first joint and a second joint respectively disposed at two ends of the transmission line, the first joint is electrically connected to the probe unit with the probe, and the second joint is fixed on the transfer base for connecting another transmission line to the second joint;

4. The circuit board inspection apparatus according to any one of claims 1 to 3, wherein: each probe device comprises a rotating shaft which can be rotatably arranged on the mounting base around the first axial direction, the probe base and the adapter base are relatively fixed with the rotating shaft, and the probe base is closer to the material placing carrier than the adapter base.

5. The circuit board inspection apparatus of claim 4, wherein: each probe device comprises a base, the adapter and the base are respectively fixed at two ends of the rotating shaft, and the probe seat is fixed on the base.

6. The circuit board inspection apparatus of claim 5, wherein: the adapter comprises a base plate fixed on the rotating shaft, an adapter plate fixedly arranged on the second joint and a fixing piece detachably fixing the adapter plate on the base plate.

7. The circuit board inspection apparatus of claim 6, wherein: each probe device comprises two transmission lines, and second joints of the two transmission lines are respectively positioned at two opposite sides of the fixing piece.

8. The circuit board inspection apparatus of claim 6, wherein: the adapter further comprises an extension plate fixed on the substrate and extending from the substrate towards the direction far away from the rotating shaft, and a fixing unit arranged on the extension plate and used for locally fixing the other transmission line on the fixing unit.

9. The circuit board inspection apparatus according to any one of claims 1 to 3, wherein: the laser range finder is fixed on a mounting seat of one of the two probe devices.

10. The circuit board inspection apparatus of claim 9, wherein: the image capture device is a mounting base fixed to the other of the two probe devices.

11. The circuit board inspection apparatus according to any one of claims 1 to 3, wherein: the material loading platform is characterized by further comprising another image capturing device which is fixed on the base and located on the periphery of the material loading platform, and the shooting directions of the two image capturing devices are opposite.

12. The circuit board inspection apparatus according to any one of claims 1 to 3, wherein: the jig plate is arranged on the bearing surface of the material placing carrying platform and is used for arranging the circuit boards on the jig plate.

13. The circuit board inspection apparatus according to any one of claims 1 to 3, wherein: the material loading device comprises a loading platform, a circuit board and a jig plate, and is characterized by further comprising a limiting bearing assembly arranged on the loading surface of the loading platform, wherein one of the circuit board and the jig plate which is arranged on the loading surface of the loading platform and used for bearing the circuit board bears against the limiting bearing assembly.