TWI837548B - Component inspection jig - Google Patents

Abstract

The invention discloses a component inspection jig, which comprises a carrier, a signal feed-in portion, and a metal conductive member. The carrier is defined with a supporting surface. The signal feed-in portion is fixed on the carrier and comprises a first transmission member and a second transmission member. The metal conductive member is disposed on the supporting surface and comprises a first conductive member and a second conductive member that are electrically insulated. The first conductive member is electrically connected to the first transmission member, and the second conductive member is electrically connected to the second transmission member. The support surface is defined with a sensing area, and the metal conductive member inside the periphery of the sensing area and the metal conductive member outside the periphery of the sensing area are not coplanar.

Description

Component testing fixture

The present invention relates to a component detection fixture, and in particular to a component detection fixture capable of reducing measurement errors.

With the advancement of technology, not only smartphones and computers, but also tools, vehicles, or various detectors that we come into contact with in daily life have gradually begun to support networking functions. Although people's lives have become more convenient, it also means that the components in the equipment also have higher specifications. For example, as 5G networking becomes more and more popular, the passive components in the equipment also need to support higher frequency bands, and in order to detect the latest passive components, various passive component detection equipment also needs to be able to operate at higher frequency bands. For traditional impedance analyzers, calibration is required before measuring the passive component to be tested, such as using open circuit standards for calibration. However, the circuit architecture of traditional impedance analyzers ignores the errors of the test fixtures. For example, the test fixtures have extremely small parasitic capacitance, which causes the impedance measured by the open-circuit standard to be much smaller than infinity when operating in the high-frequency band. In addition, the traditional test fixtures may also change the length of the electronic path of signal transmission due to frequent plugging and unplugging, causing the impedance analyzer to have calibration inaccuracies in the high-frequency band.

Therefore, the industry needs a new test fixture that can reduce the calibration error of the impedance analyzer in the high-frequency band, so as to correctly calibrate and measure the device under test.

The present invention provides a component testing fixture, which improves the path of signal feeding and the location of the component to be tested in structure, can reduce parasitic capacitance and avoid causing length error of the electronic path.

The present invention proposes a component detection fixture, comprising a supporting plate, a signal feeding part, a first conductive part and a second conductive part. The supporting plate comprises a supporting surface, a first through hole and a second through hole. The signal feeding part comprises a first transmission part and a second transmission part. The first conductive part comprises a first main body and a first cantilever, which is arranged on the supporting surface and electrically connected to the first transmission part, the first cantilever and the supporting surface are at a first angle, and the first end of the first cantilever is at a first height away from the first main body. The second conductive part comprises a second main body and a second cantilever, the second main body is arranged on the supporting surface and electrically connected to the second transmission part, the second cantilever and the supporting surface are at a first angle, and the second end of the second cantilever is at a first height away from the second main body. The first through hole and the second through hole respectively accommodate the first transmission component and the second transmission component.

In some embodiments, the first transmission member may be inserted into the first through hole and exposed on the supporting surface, the second transmission member may be inserted into the second through hole and exposed on the supporting surface, the first body portion contacts the first transmission member, and the second body portion contacts the second transmission member. When the first end and the second end respectively abut against the first electrode and the second electrode of the device under test, the first end is at a second height from the first body portion, the second end is at a second height from the second body portion, and the second height may be less than the first height. In addition, the supporting plate may further have a plurality of second through holes, and the signal feed portion may further have a plurality of second transmission members, each of which is inserted into one of the plurality of second through holes, and the distance between each second through hole and the first through hole may be the same. In addition, the component inspection fixture may further include a lifting unit and a signal adapter, the signal feed part is electrically connected to the signal adapter, the carrier plate and the signal adapter are fixed to the lifting unit, and the lifting unit can move the carrier plate and the signal adapter simultaneously in a vertical direction.

The present invention also proposes a component detection fixture, including a carrier plate, a signal feed part and a metal conductive part. The carrier plate defines a support surface. The signal feed part is fixed to the carrier plate, and includes a first transmission part and a second transmission part. The metal conductive part is arranged on the support surface, and includes an electrically insulated first conductive part and a second conductive part, the first conductive part is electrically connected to the first transmission part, and the second conductive part is electrically connected to the second transmission part. The support surface defines a sensing area, and the metal conductive part within the periphery of the sensing area is not coplanar with the metal conductive part outside the periphery of the sensing area.

In some embodiments, the signal feed portion and the sensing area may not overlap in the vertical direction. In addition, the component detection fixture may further include a cover, which shields the metal conductive parts outside the periphery of the sensing area.

In summary, the component detection fixture of the present invention includes a signal feed portion fixed on a carrier plate, and the signal feed portion can be electrically connected to a metal conductive part. In addition, the metal conductive part of the component detection fixture of the present invention that contacts the component to be tested is elastic, which allows the component to be tested to be pressed against the metal conductive part, thereby fixing the length of the electronic path of signal transmission and reducing the effect of parasitic capacitance.

The following will further disclose the features, purpose and function of the present invention. However, what is described below is only an embodiment of the present invention and should not be used to limit the scope of the present invention. That is, any equivalent changes and modifications made within the scope of the patent application of the present invention will still be the gist of the present invention and will not deviate from the spirit and scope of the present invention, so they should be regarded as further embodiments of the present invention.

Please refer to FIG. 1 and FIG. 2. FIG. 1 is a three-dimensional schematic diagram of a component detection fixture according to an embodiment of the present invention, and FIG. 2 is a three-dimensional schematic diagram of a portion of a component detection fixture according to an embodiment of the present invention. As shown in the figure, the component detection fixture 1 includes a carrier plate 10, a signal feed portion 12, and a metal conductive member 14, wherein FIG. 2 is a three-dimensional diagram of the component detection fixture 1 after removing the upper cover 100 based on FIG. 1. In terms of the position of the component, the carrier plate 10 can be defined with a supporting surface 10a, and the supporting surface 10a faces the upper side of the figure. The signal feeding portion 12 is disposed through the carrier plate 10, a portion of the signal feeding portion 12 is below the carrier plate 10, and a portion of the signal feeding portion 12 is exposed on the supporting surface 10a, but the signal feeding portion 12 exposed on the supporting surface 10a should not pass through the upper cover 100. In addition, the metal conductive member 14 is disposed on the supporting surface 10a of the carrier plate 10, and the metal conductive member 14 is substantially located between the carrier plate 10 and the upper cover 100. In practice, the component testing fixture 1 can be used together with an impedance analyzer (not shown) to measure the device under test DUT, especially to measure various electrical parameters of the device under test DUT under high-frequency signals. In one example, when the DUT is a passive component, the component testing fixture 1 can carry the DUT, and then the impedance analyzer can measure the electrical parameters of the DUT, such as impedance size, impedance angle, equivalent series resistance (ESR), and quality factor Q.

In FIG. 1 , the upper cover 100 has an opening 100a, and the device under test DUT can contact the metal conductive part 14 from the bottom of the figure through the opening 100a. In practice, the side of the device under test DUT facing the device detection fixture 1 can expose more than two electrodes. The present embodiment does not limit the form of the electrodes of the device under test DUT, which can be pads or pins, for example. A person with ordinary knowledge in the relevant technical field should understand that when the device under test DUT contacts the metal conductive part 14 downward through the opening 100a, the metal conductive part 14 and the device under test DUT can be electrically connected, and the aforementioned impedance analyzer can perform measurements. In one example, the size of the opening 100a can be similar to the size of the device under test DUT. Only when the device under test DUT is aligned and passes through the opening 100a can it correctly contact the corresponding position of the metal conductive component 14 to avoid the device under test DUT from being placed incorrectly. The electrical connection method between the device under test DUT and the metal conductive component 14 will be described in detail below. In addition, the upper cover 100 also has the function of protecting the metal conductive component 14. For example, when the device under test DUT moves toward the device detection fixture 1, the upper cover 100 can resist the board or film layer carrying the device under test DUT, and only allow the device under test DUT with a known thickness to pass through the opening 100a, thereby avoiding the board or film layer carrying the device under test DUT from excessively squeezing the metal conductive component 14. The combination relationship between the carrier plate 10, the signal feeding portion 12 and the metal conductive member 14 is described below.

Please refer to FIG. 2, FIG. 3 and FIG. 4 together. FIG. 3 is a three-dimensional schematic diagram of a carrier plate according to an embodiment of the present invention, and FIG. 4 is a three-dimensional schematic diagram of a signal feed portion according to an embodiment of the present invention. As shown in the figure, it can be seen that there are many through holes on the supporting surface 10a of the carrier plate 10. Some of the through holes can be used for heat dissipation or fixing other peripheral components, which will not be elaborated in this embodiment. In addition, the carrier plate 10 also includes a through hole 102 (first through hole), a plurality of through holes 104 (second through holes) and a slot 106, wherein the through hole 102 and the plurality of through holes 104 are used to accommodate the signal feed portion 12. For example, the through hole 102 can accommodate the first transmission element 120 of the signal feeding part 12, and the through hole 104 can accommodate the second transmission element 122. In practice, since the first transmission element 120 and the second transmission element 122 transmit signals of different polarities, the carrier plate 10 should be made of insulating material to avoid signal interference. In addition, the connector 124 of the signal feeding part 12 can be used to connect a signal adapter to transfer the measurement signal to the back-end equipment (such as an impedance analyzer). In terms of the position of the components, the connector 124 will be under the carrier plate 10, so that the ends of the first transmission element 120 and the second transmission element 122 and the connector 124 can be seen as being located on opposite sides of the carrier plate 10 respectively.

As can be seen from the figure, the first transmission member 120 and the second transmission member 122 will penetrate the carrier plate 10 and be exposed on the support surface 10a, in order to contact and electrically connect the metal conductive member 14 on the support surface 10a. This embodiment does not limit whether the slot 106 penetrates the carrier plate 10, and the function of the slot 106 will be described in the following embodiments. In an example, the through hole 102 of the present case can be arranged at the center of multiple through holes 104, that is, the distance between each through hole 104 and the through hole 102 is the same. In other words, the first transmission element 120 can be located at the center of the plurality of second transmission elements 122. One advantage is that when the first transmission element 120 is used to transmit a sensing signal and the plurality of second transmission elements 122 are used for grounding, the plurality of second transmission elements 122 can shield noise to reduce interference with the sensing signal transmitted by the first transmission element 120.

It is worth mentioning that, although the present embodiment shows one first transmission element 120 and four second transmission elements 122, and the shape of the second transmission element 122 (rectangular column) is slightly different from the shape of the first transmission element 120 (cylindrical), the present embodiment does not limit the number, shape and arrangement of the first transmission element 120 and the second transmission element 122. A person with ordinary knowledge in the relevant technical field should understand that the function of the first transmission element 120 and the second transmission element 122 is to transmit signals of different polarities, and the number of the first transmission element 120 and the second transmission element 122 has no effect. For example, the number of the second transmission elements 122 can be greater than four, or there is only one second transmission element 122 and one corresponding through hole 104, which should be able to achieve the basic function of transmitting signals of different polarities. On the other hand, the signal feed part 12 is not necessarily locked to the carrier plate 10. The present embodiment may also prevent the signal feed part 12 from being loosened from the carrier plate 10 by means of engagement or tight fit between components. For example, a tight fit relationship may be achieved by means of the shape of the second transmission component 122 (rectangular column) and the shape of the through hole 104 (round hole). Of course, the present embodiment may also assemble the signal feed part 12 and the carrier plate 10 by means of external auxiliary components, so that the second transmission component 122 only passes through the through hole 104 without contacting each other. Other auxiliary components of the component detection fixture 1 will be described later.

Please refer to Figures 2 to 6 together. Figure 5 is a three-dimensional schematic diagram of a metal conductive member according to an embodiment of the present invention, and Figure 6 is a side view of a metal conductive member according to an embodiment of the present invention. As shown in the figure, the metal conductive member 14 can be divided into two mutually insulated parts, such as a first conductive member 140 and a second conductive member 142. Different electrodes of the aforementioned device under test DUT can contact the first conductive member 140 and the second conductive member 142 respectively, so that the device under test DUT can receive the feed signal of the impedance analyzer through the first conductive member 140 and the second conductive member 142. The first conductive member 140 can include a first body 1400 and a first cantilever 1402, and the second conductive member 142 can include a second body 1420 and a second cantilever 1422. In one example, the area of the first body portion 1400 is smaller than the area of the second body portion 1420, and the second body portion 1420 surrounds the first body portion 1400, but the present embodiment is not limited thereto. In addition, the second body portion 1420 can be electrically connected to the second transmission element 122 and serve as the ground terminal of the system, and the first body portion 1400 can serve as a sensing terminal to receive the sensing signal from the first transmission element 120. The present embodiment does not limit the thickness of the first conductive element 140 and the second conductive element 142, but the thickness of the first conductive element 140 and the second conductive element 142 can be the same. For example, the first body portion 1400 and the first cantilever 1402 can be stamped from the same metal plate, and the second body portion 1420 and the second cantilever 1422 can be stamped from the same metal plate. Alternatively, the first conductive member 140 and the second conductive member 142 may be stamped from the same metal plate, so that the first conductive member 140 and the second conductive member 142 have the same thickness.

As can be seen from the figure, the first body portion 1400 and the second body portion 1420 are fixed on the supporting surface 10a of the supporting plate 10, and the first cantilever 1402 and the second cantilever 1422 are bent upward and slightly away from the supporting surface 10a. Here, this embodiment refers to the first cantilever 1402 and the second cantilever 1422 as being in the sensing area A of the supporting surface 10a. This embodiment does not limit the scope of the sensing area A, but it should at least include the area of the first cantilever 1402 and the second cantilever 1422 projected on the supporting surface 10a in the vertical direction. In one example, the first cantilever 1402 and the second cantilever 1422 can have the same length, and can be lifted up from the first body portion 1400 and the second body portion 1420 respectively by the same angle θ (first angle). In this embodiment, the end position of the first cantilever 1402 and the end position of the second cantilever 1422 are defined as the first end 1402a and the second end 1422a, respectively. In other words, the first end 1402a and the second end 1422a should be farthest from the first body portion 1400 and the second body portion 1420, or the first end 1402a and the second end 1422a should be farthest from the supporting surface 10a. In terms of position, when the upper cover 100 covers the metal conductive member 14, the first end 1402a and the second end 1422a should be exposed from the opening 100a of the upper cover 100. In other words, from a top view, at least the first end 1402a and the second end 1422a will not be shielded by the upper cover 100.

In addition, when the first cantilever 1402 and the second cantilever 1422 have the same length and are raised at the same angle θ, the first end 1402a and the second end 1422a of the present embodiment can be defined to have the same height H. In detail, the present embodiment can first define that the first body 1400 and the second body 1420 are in the same plane, or the first body 1400 and the second body 1420 form a coplanar surface. Then, based on the plane where the first body 1400 and the second body 1420 are located, the first end 1402a and the second end 1422a are defined to be at a first height. At this time, the first height refers to the vertical distance between the first end 1402a and the first body 1400, and the vertical distance between the second end 1422a and the second body 1420 in a preset state. In one example, the aforementioned default state refers to a state when the device under test DUT has not yet contacted the first conductive member 140 and the second conductive member 142, that is, a state when the first cantilever 1402 and the second cantilever 1422 have not yet been squeezed by the device under test DUT. It is worth mentioning that the present embodiment does not limit the first cantilever 1402 and the second cantilever 1422 to have the same length, and the first cantilever 1402 and the second cantilever 1422 may also have different upward lifting angles. It can be understood by a person having ordinary knowledge in the relevant technical field that even if the first cantilever 1402 and the second cantilever 1422 have different lengths, the angles at which the first cantilever 1402 and the second cantilever 1422 should be lifted upward can be selected so that the first end 1402a and the second end 1422a have the same height H. In other words, as long as the first end 1402a and the second end 1422a have the same height H, and the first cantilever 1402 and the second cantilever 1422 are elastic, they should fall within the scope of the present embodiment.

Since the first cantilever 1402 and the second cantilever 1422 are elastic, a person skilled in the art will know that when the first cantilever 1402 and the second cantilever 1422 are squeezed by the device under test DUT, the angle θ and the height H will begin to change, for example, the angle θ and the height H will be less than the values in the preset state. In other words, the device under test DUT contacts the first end 1402a and the second end 1422a, which not only means that the electrodes of the device under test DUT are electrically connected to the first end 1402a and the second end 1422a, but also presses the first end 1402a and the second end 1422a toward the plane where the first body portion 1400 and the second body portion 1420 are located. As mentioned above, since the upper cover 100 of this embodiment can resist the board or film layer carrying the device under test DUT, and only allow the device under test DUT with a known thickness to pass through the opening 100a, the height H of the first end 1402a and the second end 1422a should be fixed (second height), and the second height will be smaller than the first height. Of course, the angle θ between the first end 1402a and the second end 1422a should also be fixed (second angle), and the second angle will also be smaller than the first angle. This embodiment does not limit the values of the angle θ and the height H in the default state. However, although the first end 1402a and the second end 1422a will be exposed in the opening 100a, in order to better protect the first end 1402a and the second end 1422a, the first end 1402a and the second end 1422a will not protrude from the top surface of the upper cover 100, that is, the first height does not exceed the thickness of the upper cover 100.

It is worth mentioning that in the example where the supporting surface 10a of the carrier plate 10 has a groove 106, the groove 106 should be within the sensing area A, that is, it should be located below the projection of the first cantilever 1402 and the second cantilever 1422 in the vertical direction. At this time, if the device under test DUT is greater than the first height, the first cantilever 1402 and the second cantilever 1422 of this embodiment may be squeezed by the device under test DUT and be lower than the plane where the first body part 1400 and the second body part 1420 are located. From the above, it can be seen that this embodiment does not limit the bending angle of the first cantilever 1402 and the second cantilever 1422. As long as the first cantilever 1402 and the second cantilever 1422 can be restored to the preset angle θ and height H in the preset state (without external force), they should all fall within the scope of this embodiment. In one example, the slot 106 may be filled with an elastic body, such as a colloid or other materials that help the first cantilever 1402 and the second cantilever 1422 return to the preset angle θ and height H. Of course, the carrier plate 10 may not have the slot 106, but only have an elastic body disposed at the position of the slot 106 shown in the present embodiment, and should also have similar functions as long as the device under test DUT is not greater than the first height.

As can be seen from FIG. 5 , the first body 1400 may have a through hole 1404, and the second body 1420 may have a plurality of through holes 1424. In terms of position, the through hole 1404 and the plurality of through holes 1424 may correspond to the through hole 102 and the plurality of through holes 104, respectively. Thus, the first transmission element 120 not only passes through the through hole 102, but may also be exposed from the through hole 1404, so that the first transmission element 120 contacts and is electrically connected to the first body 1400. Similarly, each second transmission element 122 not only passes through the corresponding through hole 104, but may also be exposed from the corresponding through hole 1424, so that the plurality of second transmission elements 122 may contact and be electrically connected to the second body 1420 at the same time. One advantage is that, since the plurality of second transmission elements 122 are used for grounding, the second body portion 1420 surrounding the first body portion 1400 can be stably at the ground potential. A person skilled in the art should understand that multi-point grounding can reduce the generation of parasitic capacitance and help the stability of measurement. The combined carrier board 10, signal feeder portion 12 and metal conductive element 14 are shown in FIG2 , and will not be described in detail here.

Please refer to FIG. 1 and FIG. 7 together. FIG. 7 is a three-dimensional schematic diagram of a component detection fixture according to another embodiment of the present invention. As shown in the figure, the carrier plate 10 can also be locked together with the box body 18 via other connectors 16. The box body 18 is used to accommodate the aforementioned signal adapter, and the signal adapter can be connected to the impedance analyzer at the rear end. In practice, the signal adapter in the box body 18 can fix the connector 124 of the signal feed part 12. Since the relative position of the signal adapter and the signal feed part 12 is fixed, and the placement position of the device under test DUT on the first cantilever 1402 and the second cantilever 1422 is also fixed. Therefore, the component testing fixture 1 provided in this embodiment can fix the length of the electronic path from the device under test DUT to the signal adapter, and can reduce the error of the electronic path length when calibrating and measuring different devices under test DUT.

Although the present embodiment demonstrates a measurement method in which the device testing fixture 1 is stationary and the device under test DUT passes through the opening 100a to contact the first cantilever 1402 and the second cantilever 1422, the present embodiment is not limited thereto. In actual operation, the device under test DUT may also be stationary, and the device testing fixture 1 may move toward the device under test DUT, and the device under test DUT may also pass through the opening 100a to contact the first cantilever 1402 and the second cantilever 1422. As in the aforementioned example, since the relative positions of the signal adapter and the signal feed portion 12 are fixed, and the placement positions of the DUT on the first cantilever 1402 and the second cantilever 1422 are also fixed, the length of the electronic path from the DUT to the signal adapter can also be fixed, thereby reducing the error in the length of the electronic path when calibrating and measuring different DUTs.

Please refer to FIG. 2 and FIG. 8 together. FIG. 8 is a schematic diagram of an electronic path in a metal conductive component according to an embodiment of the present invention. As shown in the figure, since the aforementioned first transmission component 120 is electrically connected to the through hole 1404, it passes through the first main body 1400 and the first cantilever 1402 from the position of the through hole 1404, and then electrically connects to an electrode of the device under test DUT at the position of the first end 1402a. Accordingly, the length of an electronic path from the first transmission component 120 to the device under test DUT can be expressed as a distance D1. In order to meet the requirements of high-frequency testing, the range of the distance D1 can be between 8.5 mm and 9 mm, for example, it can be 8.75 mm. Those with ordinary knowledge in the relevant technical field can determine it according to the operating frequency band. In addition, when selecting the second transmission element 122 with the shortest electronic path length from multiple second transmission elements 122, the selected second transmission element 122 is electrically connected to the through hole 1424, and then reaches one end of the second cantilever 1422 through the second body 1420 from the position of the through hole 1424, and then electrically connects to another electrode of the device under test DUT through the position of the other end (second end 1422a) of the second cantilever 1422. Accordingly, the electronic path length from the second transmission element 122 with the shortest electronic path length to the device under test DUT can be expressed as the sum of the distance D2, the distance D3, and the distance D4. Among them, the range of distance D2 can be between 12 mm and 14 mm, for example, it can be 13 mm. The range of distance D3 can be between 0.5 mm and 1.5 mm, for example, it can be 1 mm. The range of distance D4 can be between 2.5 mm and 3.5 mm, for example, can be 3 mm. Similarly, a person skilled in the art can determine the values of distance D2, distance D3 and distance D4 according to the operating frequency band, and this embodiment does not limit this.

In summary, the component detection fixture of the present invention includes a signal feed portion fixed on a carrier plate, and the signal feed portion can be electrically connected to a metal conductive part, and the metal conductive part can stably contact the component to be tested. Thereby, the component detection fixture of the present invention can accurately align the component to be tested, and minimize the movement generated when replacing the component to be tested, so that the length of the electronic path is more fixed. In addition, the design of the signal feed portion of the component detection fixture of the present invention can also reduce parasitic capacitance and avoid causing errors in the length of the electronic path.

1: Component testing fixture 10: Carrier plate 10a: Support surface 100: Upper cover 100a: Opening 102: Through hole (first through hole) 104: Through hole (second through hole) 106: Slot 12: Signal feeder 120: First transmission element 122: Second transmission element 124: Connector 14: Metal conductor 140: First conductor 1400: First body 1402: First cantilever 1402a: First end 1404: Through hole 142: Second conductor 1420: Second body 1422: Second cantilever 1422a: Second end 1424: Through hole 16: Connector 18: Box A: Sensing area D1~D4: Distance DUT: Component under test H: Height θ: Angle

FIG. 1 is a three-dimensional schematic diagram of a component testing fixture according to an embodiment of the present invention.

FIG. 2 is a three-dimensional schematic diagram showing a portion of a component testing fixture according to an embodiment of the present invention.

FIG. 3 is a three-dimensional schematic diagram of a carrier plate according to an embodiment of the present invention.

FIG. 4 is a three-dimensional schematic diagram of a signal feeding unit according to an embodiment of the present invention.

FIG. 5 is a three-dimensional schematic diagram of a metal conductive component according to an embodiment of the present invention.

FIG. 6 is a side view showing a metal conductive member according to an embodiment of the present invention.

FIG. 7 is a three-dimensional schematic diagram of a device testing fixture according to another embodiment of the present invention.

FIG. 8 is a schematic diagram showing an electronic path in a metal conductive element according to an embodiment of the present invention.

without

1: Component testing fixture

10: Carrier plate

10a: Support surface

12: Signal Feedback Unit

120: First transmission component

122: Second transmission component

14:Metallic conductive parts

140: First conductive member

142: Second conductive member

A: Sensing area

DUT: Component under test

Claims (7)

A component detection fixture comprises: a support plate, comprising a support surface, a first through hole and a second through hole; a signal feeding portion, comprising a first transmission member and a second transmission member; a first conductive member, comprising a first body and a first cantilever, disposed on the support surface and electrically connected to the first transmission member, the first cantilever and the support surface having a first angle, and a first end of the first cantilever being at a first height from the first body; and a second conductive member, comprising a second body and a second cantilever, the second body The first transmission member is disposed on the supporting surface and electrically connected to the second transmission member, the second cantilever and the supporting surface have the first angle, and a second end of the second cantilever is at the first height away from the second body; wherein the first through hole and the second through hole respectively accommodate the first transmission member and the second transmission member; wherein the first transmission member is penetrated through the first through hole and exposed to the supporting surface, the second transmission member is penetrated through the second through hole and exposed to the supporting surface, the first body contacts the first transmission member, and the second body contacts the second transmission member. The component inspection fixture as described in claim 1, wherein when the first end and the second end respectively abut against a first electrode and a second electrode of a component to be tested, the first end is at a second height from the first body portion, the second end is at the second height from the second body portion, and the second height is less than the first height. As described in claim 1, the component inspection fixture, wherein the carrier plate has a plurality of second through holes, the signal feed portion has a plurality of second transmission components, each of the second transmission components is inserted into one of the second through holes, and the distance between each of the second through holes and the first through hole is the same. The component inspection fixture as described in claim 1 further includes a box body, the box body is connected to the carrier plate, and the box body is used to accommodate a signal adapter, and the signal feed part is electrically connected to the signal adapter. A component detection fixture includes: a carrier plate, which defines a support surface, having a first through hole and a second through hole; a signal feed portion, which is fixed to the carrier plate, and includes a first transmission member and a second transmission member; and a metal conductive member, which is disposed on the support surface, and includes a first conductive member and a second conductive member which are electrically insulated, wherein the first conductive member is electrically connected to the first transmission member, and the second conductive member is electrically connected to the The second transmission member; wherein the support surface defines a sensing area, and the metal conductive member within the periphery of the sensing area is not coplanar with the metal conductive member outside the periphery of the sensing area; wherein the first transmission member is disposed through the first through hole and exposed to the support surface, the second transmission member is disposed through the second through hole and exposed to the support surface, the first body portion contacts the first transmission member, and the second body portion contacts the second transmission member. A component inspection fixture as described in claim 5, wherein the signal feed portion and the sensing area do not overlap in a vertical direction. The component detection fixture as described in claim 5 further includes a top cover, which shields the metal conductive part outside the periphery of the sensing area.