CN114354986B - Flying probe tester and test shaft polarity distribution method thereof - Google Patents
Flying probe tester and test shaft polarity distribution method thereof Download PDFInfo
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Abstract
The invention discloses a flying probe testing machine and a test shaft polarity distribution method thereof. The method comprises the following steps: establishing a conversion relation M between a first probe coordinate system and a second probe coordinate system 12 The moving path L from the first probe to the first point to be measured 11 The moving path L from the second probe to the second point to be measured 22 (ii) a Based on the conversion relation M 12 Determine the moving path L 11 And a moving path L 22 Whether there is interference between them; if the moving path L 11 And a moving path L 22 If there is interference, the second point to be tested is used as the test point of the first probe, and the first point to be tested is used as the test point of the second probe, and the next probe test is carried out. The flying probe testing machine and the test shaft polarity allocation method thereof provided by the invention can judge whether interference collision occurs in the test process of the test shaft corresponding to the probe according to the position and the corresponding relation between the test point on the PCB and the corresponding probe, and allocate the polarity of the test shaft according to the judgment result so as to avoid the interference collision of the test shaft during next probe test.
Description
Technical Field
The invention relates to the technical field of flying probe testing, in particular to a flying probe testing machine and a test shaft polarity distribution method thereof.
Background
The PCB flying probe tester replaces a needle bed with probes, and uses a plurality of electric probes which are driven by a motor and can move quickly to contact with pins of a device for automatic testing. The testing shaft is required to have the characteristics of high speed, high precision and wide testing range in the testing process. However, in the prior art, due to the spatial distribution problem of the test points of the PCB, the test shaft is very likely to collide during high-speed operation, and once collision occurs, huge property loss is generated.
Therefore, in view of the above technical problems, it is necessary to provide a flying probe testing machine and a test shaft polarity allocation method thereof.
Disclosure of Invention
The invention aims to provide a flying probe testing machine and a test shaft polarity allocation method thereof, which can judge whether a test shaft corresponding to a probe collides in the testing process according to the position and the corresponding relation between a test point on a PCB and the corresponding probe, and allocate the polarity of the test shaft according to the judgment result so as to avoid the test shaft from interfering and colliding in the next probe testing process.
In order to achieve the purpose, the technical scheme provided by the invention is as follows:
in a first aspect, the present invention provides a test shaft polarity allocation method for a flying probe test machine, which is used for PCB board testing, the flying probe test machine includes a first test shaft and a second test shaft, the first test shaft is provided with a first probe and a first camera, the second test shaft is provided with a second probe and a second camera, the test method includes the following steps:
establishing a conversion relation M between a first probe coordinate system and a second probe coordinate system 12 (ii) a Establishing a conversion relation MP from a PCB coordinate system to a first probe mechanical coordinate system 1 (ii) a Establishing a conversion relation MP from a PCB coordinate system to a second probe mechanical coordinate system 2 (ii) a Selecting a first point to be tested as a test point of a first probe on the PCB, and selecting a second point to be tested as a test point of a second probe; based on conversion relation MP 1 Obtaining a moving path L from the first probe to the first point to be measured 11 Based on the conversion relation MP 2 Obtaining a moving path L from the second probe to the second point to be measured 22 (ii) a Based on the transformation relation M 12 Determine the moving path L 11 And a moving path L 22 Whether there is interference between them; if the moving path L 11 And a moving path L 22 If there is interference, the second point to be tested is used as the test point of the first probe, and the first point to be tested is used as the test point of the second probe, and the next probe test is carried out.
In one or more embodiments, establishing a transformation relationship M between the first probe coordinate system and the second probe coordinate system 12 The method comprises the following steps:
fixing the calibration plate on a preset position of the flying probe testing machine; establishing a conversion relation BC from a calibration plate coordinate system to a first camera coordinate system 1 And the conversion relation BC from the coordinate system of the calibration board to the coordinate system of the second camera 2 (ii) a Establishing a conversion relation MC from a first camera coordinate system to a first probe coordinate system according to the position relation of a first camera and a first probe on a first test axis 1 Establishing a conversion relation MC from a second camera coordinate system to a second probe coordinate system according to the position relation of the second camera and the second probe on a second test axis 2 (ii) a According to a conversion relation BC 1 And conversionRelation MC 1 Establishing a conversion relation MB from a calibration plate coordinate system to a first probe coordinate system 1 According to a conversion relation BC 2 And a conversion relation MC 2 Establishing a conversion relation MB from a calibration plate coordinate system to a second probe coordinate system 2 (ii) a According to a conversion relation MB 1 And the conversion relation MB 2 Establishing a conversion relation M between the first probe coordinate system and the second probe coordinate system 12 。
In one or more embodiments, the establishing a conversion relation BC from the calibration plate coordinate system to the first camera coordinate system 1 And the conversion relation BC from the coordinate system of the calibration board to the coordinate system of the second camera 2 The method comprises the following steps:
acquiring a first image of a calibration plate through a first camera, identifying and positioning a center coordinate of the first image, and calculating to obtain a conversion relation BC from a calibration plate coordinate system to a first camera coordinate system according to a physical distance between each marking point on the calibration plate 1 (ii) a Acquiring a second image of the calibration plate through the second camera, identifying and positioning the center coordinates of the second image, and calculating to obtain a conversion relation BC from the coordinate system of the calibration plate to the coordinate system of the second camera according to the physical distance between each marking point on the calibration plate 2 。
In one or more embodiments, the establishing of the conversion relation MP from the PCB coordinate system to the first probe mechanical coordinate system 1 The method comprises the following steps:
searching a coordinate file of the PCB, selecting a plurality of marking points on the PCB, and establishing a PCB coordinate system according to mechanical coordinates of the marking points; respectively moving the first camera to photographing positions corresponding to the plurality of marking points, acquiring images of the plurality of marking points, calculating pixel coordinates of the plurality of marking points based on the first camera, and recording mechanical coordinates of the first camera at the photographing positions corresponding to the plurality of marking points; establishing a conversion relation MP from a PCB coordinate system to a first probe mechanical coordinate system according to the mechanical coordinates of the plurality of mark points, the pixel coordinates of the plurality of mark points based on the first camera, the mechanical coordinates of the first camera at the photographing positions corresponding to the plurality of mark points and the position relation of the first camera and the first probe on the first test axis 1 。
In one or more embodiments, the establishing of the conversion relation MP from the PCB coordinate system to the second probe mechanical coordinate system 2 The method comprises the following steps:
searching a coordinate file of the PCB, selecting a plurality of marking points on the PCB, and establishing a PCB coordinate system according to mechanical coordinates of the marking points; respectively moving a second camera to photographing positions corresponding to the plurality of mark points, acquiring images of the plurality of mark points, calculating pixel coordinates of the plurality of mark points based on the second camera, and recording mechanical coordinates of the second camera at the photographing positions corresponding to the plurality of mark points; establishing a conversion relation MP from a PCB coordinate system to a second probe mechanical coordinate system according to the mechanical coordinates of the plurality of mark points, the pixel coordinates of the plurality of mark points based on the second camera, the mechanical coordinates of the second camera at the photographing positions corresponding to the plurality of mark points and the position relation of the second camera and the second probe on the second test axis 2 。
In one or more embodiments, the conversion relationship-based MP 1 Obtaining a moving path L from the first probe to the first point to be measured 11 Based on conversion relation MP 2 Obtaining a moving path L from the second probe to the second point to be measured 22 The method comprises the following steps:
based on conversion relation MP 1 Obtaining the coordinate of the first point to be measured in the first probe coordinate system, and calculating to obtain the moving path L according to the coordinate of the first point to be measured in the first probe coordinate system 11 (ii) a Based on conversion relation MP 2 Obtaining the coordinates of the second point to be measured in the second probe coordinate system, and calculating to obtain the moving path L according to the coordinates of the second point to be measured in the second probe coordinate system 22 。
In one or more embodiments, the movement path L is a linear path 1 And a moving path L 2 If there is interference between the first probe and the second probe, taking the second point to be tested as the test point of the first probe, and taking the first point to be tested as the test point of the second probe, and performing a probe test, including:
if the moving path L 11 And a moving path L 22 There is interference between, based on the conversionRelation MP 1 Obtaining a moving path L from the first probe to the second point to be measured 12 Based on the conversion relation MP 2 Obtaining a moving path L from the second probe to the first point to be measured 21 (ii) a According to the moving path L 12 Moving the first probe to the second point to be measured according to the moving path L 21 And moving the second probe to the first point to be tested, and performing a probe descending test.
In one or more embodiments, the conversion relationship-based MP 1 Obtaining a moving path L from the first probe to the second point to be measured 12 Based on the conversion relation MP 2 Obtaining a moving path L from the second probe to the second point to be measured 21 The method comprises the following steps:
based on conversion relation MP 1 Obtaining the coordinates of the second point to be measured in the first probe coordinate system, and calculating to obtain a moving path L according to the coordinates of the second point to be measured in the first probe coordinate system 12 (ii) a Based on conversion relation MP 2 Obtaining the coordinate of the first point to be measured in the second probe coordinate system, and calculating to obtain the moving path L according to the coordinate of the first point to be measured in the second probe coordinate system 21 。
In one or more embodiments, the testing method further comprises:
if the moving path L 11 And a moving path L 22 If no interference exists between the first probe and the second probe, taking the first point to be tested as the test point of the first probe and taking the second point to be tested as the test point of the second probe to carry out the next probe test.
In a second aspect, the present invention provides a flying needle testing machine comprising a memory and a processor, the memory having stored therein a computer program that, when executed by the processor, causes the processor to perform the steps of the aforementioned test axis polarity assignment method for a flying needle testing machine.
Compared with the prior art, the flying probe testing machine and the testing axis polarity distribution method thereof can judge whether the interference collision occurs in the testing process of the testing axis corresponding to the probe according to the position and the corresponding relation between the testing point on the PCB and the corresponding probe; if the test shaft is interfered and collided, switching the corresponding relation between the test point and the probe, namely redistributing the polarity of the test shaft, and performing probe descending test after the polarity of the test shaft is exchanged so as to avoid the interference and collision of the test shaft; if the test shaft does not generate interference collision, maintaining the corresponding relation between the original test point and the probe, namely maintaining the polarity of the test shaft, and performing a needle-off test; the test method is flexible, reliable and easy to realize.
Drawings
FIG. 1 is a flow chart of a method of assigning test axis polarity for a flying probe testing machine in accordance with one embodiment of the present invention;
fig. 2 is a block diagram showing the structure of a flying probe tester according to an embodiment of the present invention.
Detailed Description
The following detailed description of the present invention is provided in conjunction with the accompanying drawings, but it should be understood that the scope of the present invention is not limited to the specific embodiments.
Throughout the specification and claims, unless explicitly stated otherwise, the word "comprise", or variations such as "comprises" or "comprising", will be understood to imply the inclusion of a stated element or component but not the exclusion of any other element or component.
Fig. 1 is a flowchart illustrating a polarity assignment method for a test axis of a flying probe tester according to an embodiment of the present invention. The flying probe testing machine comprises a first testing shaft and a second testing shaft, wherein the first testing shaft is provided with a first probe and a first camera, and the second testing shaft is provided with a second probe and a second camera. The flying probe testing machine comprises the following steps:
s1: establishing a transformation relation M between the first probe coordinate system and the second probe coordinate system 12 。
In particular, the transformation relationship M between the first probe coordinate system and the second probe coordinate system 12 It can be established by:
and fixing the calibration plate on a preset position of the flying probe testing machine. The predetermined position may be a PCB fixing platform to be tested of the flying probe testing machine, or other positions on other flying probe testing machines, as long as the first camera and the second camera can smoothly acquire images of the calibration board.
Establishing a conversion relation BC from a calibration plate coordinate system to a first camera coordinate system 1 And the conversion relation BC from the coordinate system of the calibration board to the coordinate system of the second camera 2 . The method comprises the following specific steps: acquiring a first image of a calibration plate through a first camera, identifying and positioning a center coordinate of the first image, and calculating to obtain a conversion relation BC from a calibration plate coordinate system to a first camera coordinate system according to a physical distance between each marking point on the calibration plate 1 (ii) a Acquiring a second image of the calibration plate through a second camera, identifying and positioning the center coordinates of the second image, and calculating to obtain a conversion relation BC from a calibration plate coordinate system to a second camera coordinate system according to the physical distance between each marking point on the calibration plate 2 。
Establishing a conversion relation MC from a first camera coordinate system to a first probe coordinate system according to the position relation of a first camera and a first probe on a first test axis 1 Establishing a conversion relation MC from the second camera coordinate system to the second probe coordinate system according to the position relation of the second camera and the second probe on the second test axis 2 . When the flying probe test is carried out, the camera and the probe on the same test axis move synchronously along with the test axis, so that the conversion relation between the camera coordinate system and the probe coordinate system can be determined according to the position relation of the camera and the probe on the test axis.
According to a conversion relation BC 1 And a conversion relation MC 1 Establishing a conversion relation MB from a calibration plate coordinate system to a first probe coordinate system 1 According to a conversion relation BC 2 And a conversion relation MC 2 Establishing a conversion relation MB from a calibration plate coordinate system to a second probe coordinate system 2 。
According to a conversion relation MB 1 And the conversion relation MB 2 Establishing a conversion relation M between the first probe coordinate system and the second probe coordinate system 12 . Determining the conversion relation MB from the coordinate system of the calibration plate to the coordinate system of the first probe 1 And the conversion relation from the coordinate system of the calibration plate to the coordinate system of the second probeMB 2 Then, the conversion relation M between the first probe coordinate system and the second probe coordinate system can be realized by taking the calibration plate coordinate system as an intermediate coordinate system 12 And (4) determining.
S2: establishing a conversion relation MP from a PCB coordinate system to a first probe mechanical coordinate system 1 。
Specifically, the conversion relation MP from the PCB coordinate system to the first probe mechanical coordinate system 1 It can be established by:
and searching the coordinate file of the PCB, selecting a plurality of marking points on the PCB, and establishing a PCB coordinate system according to the mechanical coordinates of the plurality of marking points. In the system of the flying probe testing machine, coordinate files of various types of PCBs are usually stored in advance, and according to the type of the PCB to be tested, the corresponding coordinate file can be retrieved in the system of the flying probe testing machine, and according to the coordinate file, the mechanical coordinates corresponding to each marking point on the PCB can be obtained.
And respectively moving the first camera to the photographing positions corresponding to the plurality of marking points, acquiring images of the plurality of marking points, calculating pixel coordinates of the plurality of marking points based on the first camera, and recording mechanical coordinates of the first camera at the photographing positions corresponding to the plurality of marking points.
According to the mechanical coordinates of the plurality of mark points, the pixel coordinates of the plurality of mark points based on the first camera and the mechanical coordinates of the first camera at the photographing positions corresponding to the plurality of mark points, a conversion relation between a PCB coordinate system and a first camera coordinate system can be established, and then the position relation of the first camera and the first probe on the first test axis (namely the conversion relation MC) is combined 1 ) The conversion relation MP from the PCB coordinate system to the first probe mechanical coordinate system can be established 1 。
In actual operation, three marking points are usually selected on the PCB, and a PCB coordinate system is constructed by a three-point method. And then moving the first camera to the photographing positions corresponding to the three mark points respectively, photographing the three mark points through the first camera, acquiring images of the three mark points, and recording mechanical coordinates of the first camera when the three mark points are photographed. Then the first camera shoots to obtainAnd calculating the pixel coordinates of the three marking points in the corresponding image. Based on the mechanical coordinates and the pixel coordinates of the three mark points and the mechanical coordinates of the photographing position of the first camera, the conversion relation between the coordinate system of the PCB and the coordinate system of the first camera can be obtained, and the MC is obtained according to the conversion relation from the coordinate system of the first camera to the coordinate system of the first probe 1 The conversion relation MP from the PCB coordinate system to the first probe mechanical coordinate system can be calculated 1 。
S3: establishing a conversion relation MP from a PCB coordinate system to a second probe mechanical coordinate system 2 。
Specifically, the conversion relation MP from the PCB board coordinate system to the second probe mechanical coordinate system 2 It can be established by:
and searching a coordinate file of the PCB, selecting a plurality of marking points on the PCB, and establishing a PCB coordinate system according to the mechanical coordinates of the marking points. In the system of the flying probe testing machine, coordinate files of various types of PCBs are usually stored in advance, and according to the type of the PCB to be tested, the corresponding coordinate file can be retrieved in the system of the flying probe testing machine, and according to the coordinate file, the mechanical coordinates corresponding to each marking point on the PCB can be obtained.
And moving the second camera to the photographing positions corresponding to the plurality of mark points respectively, acquiring images of the plurality of mark points, calculating pixel coordinates of the plurality of mark points based on the second camera, and recording mechanical coordinates of the second camera at the photographing positions corresponding to the plurality of mark points.
According to the mechanical coordinates of the plurality of mark points, the pixel coordinates of the plurality of mark points based on the second camera and the mechanical coordinates of the second camera at the photographing positions corresponding to the plurality of mark points, a conversion relation between a PCB coordinate system and a second camera coordinate system can be established, and then the position relation of the second camera and the second probe on the second test axis (namely the conversion relation MC) is combined 2 ) The conversion relation MP from the PCB coordinate system to the mechanical coordinate system of the second probe can be established 2 。
In practical operation, reference may be made to the PCB coordinate system to the first probe mechanical coordinates in step S2Conversion relation MP of system 1 To realize the conversion relation MP 2 The establishment of the method is not described herein.
S4: and selecting a first point to be tested as a test point of the first probe and selecting a second point to be tested as a test point of the second probe on the PCB.
Specifically, in step S4, the correspondence between the first point to be tested and the first probe and the correspondence between the second point to be tested and the second probe are only used as preliminary correspondences, and are not necessarily the correspondence in the final probe placement test, and the final correspondence between the point to be tested and the probe needs to be determined according to the determination result in step S6.
S5: MP based on conversion relation 1 Obtaining a moving path L from the first probe to the first point to be measured 11 Based on the conversion relation MP 2 Obtaining a moving path L from the second probe to the second point to be measured 22 。
Specifically, the moving path L 11 And a moving path L 22 Can be obtained by the following steps:
based on conversion relation MP 1 Obtaining the coordinate of the first point to be measured in the first probe coordinate system, and calculating to obtain a moving path L according to the coordinate of the first point to be measured in the first probe coordinate system 11 (ii) a MP based on conversion relation 2 Obtaining the coordinates of the second point to be measured in the second probe coordinate system, and calculating to obtain the moving path L according to the coordinates of the second point to be measured in the second probe coordinate system 22 。
S6: based on the conversion relation M 12 Determine the moving path L 11 And a moving path L 22 Whether there is interference between them.
Since the first probe moves synchronously with the first testing axis and the second probe moves synchronously with the second testing axis, it can move along the moving path L 11 And a moving path L 22 Can determine the interference relationship between the first probe and the second probe along the moving path L respectively 11 And a moving path L 22 When the test device moves, whether the first test shaft and the second test shaft interfere or collide with each other or not can be judged.
S7: if the moving path L 11 And moveMoving path L 22 If no interference exists between the first probe and the second probe, taking the first point to be tested as the test point of the first probe and taking the second point to be tested as the test point of the second probe to carry out the next probe test.
If the moving path L 11 And a moving path L 22 The first test shaft and the second test shaft do not interfere and collide with each other, namely, when the first point to be tested is taken as the test point of the first probe and the second point to be tested is taken as the test point of the second probe for the next probe test. At this time, without redistributing the polarity of the test axis, the first point to be tested may be determined as the test point when the first probe is finally inserted, and the second point to be tested may be determined as the test point when the second probe is finally inserted.
S8: if the moving path L 11 And a moving path L 22 If there is interference, the second point to be tested is used as the test point of the first probe, and the first point to be tested is used as the test point of the second probe, and the next probe test is carried out.
If the moving path L 11 And a moving path L 22 The first test shaft and the second test shaft interfere and collide with each other when the first point to be tested is used as the test point of the first probe and the second point to be tested is used as the test point of the second probe for the next probe test. At this time, the correspondence between the two test points and the first probe and the second probe may be switched, that is, the polarities of the test axes are redistributed, the polarities of the first test axis and the second test axis are interchanged, the second point to be tested is determined as the test point when the first probe is finally inserted, and the first point to be tested is determined as the test point when the second probe is finally inserted, so as to avoid the interference and collision between the first test axis and the second test axis when the probe is inserted.
Specifically, after the correspondence between the first test point and the second test point and the first probe and the second probe is switched, the moving path of the first probe and the second probe when being inserted needs to be determined again. Namely, the moving path L from the first probe to the second point to be measured is determined 12 The moving path L from the second probe to the first point to be measured 21 。
MovePath L 12 And a moving path L 21 Can be based on the conversion relation MP 1 And conversion relation MP 2 To be implemented. I.e. based on the conversion relation MP 1 Obtaining the coordinates of the second point to be measured in the first probe coordinate system, and calculating to obtain a moving path L according to the coordinates of the second point to be measured in the first probe coordinate system 12 (ii) a Based on conversion relation MP 2 Obtaining the coordinate of the first point to be measured in the second probe coordinate system, and calculating to obtain the moving path L according to the coordinate of the first point to be measured in the second probe coordinate system 21 。
Moving path L 12 And a moving path L 21 The determination may also be made by converting the relationship M 12 To be implemented. Namely, based on the coordinate of the second point to be measured in the second probe coordinate system and the transformation relation M 12 Acquiring the coordinates of the second point to be measured in the first probe coordinate system, and calculating to obtain a moving path L according to the coordinates of the second point to be measured in the first probe coordinate system 12 (ii) a Based on coordinate and conversion relation M of first point to be measured in first probe coordinate system 12 Acquiring the coordinate of the first point to be measured in the second probe coordinate system, and calculating to obtain the moving path L according to the coordinate of the first point to be measured in the second probe coordinate system 21 。
As shown in fig. 2, an embodiment of the present invention further provides a flying probe testing machine 2, where the flying probe testing machine 2 includes a processor 21, a storage 22 (e.g., a non-volatile storage), a memory 23, and a communication interface 24, and the processor 21, the storage 22, the memory 23, and the communication interface 24 are connected together via a bus 25. Processor 21 is operative to invoke at least one program instruction stored or encoded in memory 22 to cause processor 21 to perform various operational steps and functions of the test axis polarity assignment method of the flying probe testing machine described in the various embodiments of the present specification.
The memory 22 may be any available media or data storage device that is accessible by a computer, including but not limited to magnetic memory (e.g., floppy disks, hard disks, magnetic tape, magneto-optical disks (MOs), etc.), optical memory (e.g., CDs, DVDs, BDs, HVDs, etc.), and semiconductor memory (e.g., ROMs, EPROMs, EEPROMs, non-volatile memories (NAND FLASH), solid State Disks (SSDs), etc.).
In summary, the flying probe testing machine and the testing axis polarity allocation method thereof provided by the invention can determine whether the interference collision occurs in the testing process of the testing axis corresponding to the probe according to the position and the corresponding relation between the testing point on the PCB and the corresponding probe; if the test shaft is interfered and collided, switching the corresponding relation between the test point and the probe, namely redistributing the polarity of the test shaft, and performing probe descending test after the polarity of the test shaft is exchanged so as to avoid the interference and collision of the test shaft; if the test shaft does not generate interference collision, maintaining the corresponding relation between the original test point and the probe, namely maintaining the polarity of the test shaft, and performing a needle-off test; the test method is flexible, reliable and easy to realize.
The foregoing descriptions of specific exemplary embodiments of the present invention have been presented for purposes of illustration and description. It is not intended to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable one skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the claims and their equivalents.
Claims (10)
1. A test shaft polarity distribution method of a flying probe tester is used for PCB board testing, the flying probe tester comprises a first test shaft and a second test shaft, a first probe and a first camera are arranged on the first test shaft, a second probe and a second camera are arranged on the second test shaft, and the test method is characterized by comprising the following steps:
establishing a conversion relation M between a first probe coordinate system and a second probe coordinate system 12 ；
Establishing a conversion relation MP from a PCB coordinate system to a first probe mechanical coordinate system 1 ；
Establishing a PCB coordinate system to a second probe machineConversion relation MP of mechanical coordinate system 2 ；
Selecting a first point to be tested as a test point of a first probe on the PCB, and selecting a second point to be tested as a test point of a second probe;
based on conversion relation MP 1 Obtaining a moving path L from the first probe to the first point to be measured 11 Based on the conversion relation MP 2 Obtaining a moving path L from the second probe to the second point to be measured 22 ；
Based on the conversion relation M 12 Determine the moving path L 11 And a moving path L 22 Whether there is interference between them;
if the moving path L 11 And a moving path L 22 If there is interference, the second point to be tested is used as the test point of the first probe, and the first point to be tested is used as the test point of the second probe, and the next probe test is carried out.
2. The method of claim 1, wherein establishing a translation M between the first probe coordinate system and the second probe coordinate system 12 The method comprises the following steps:
fixing the calibration plate on a predetermined position of the flying probe testing machine;
establishing a conversion relation BC from a calibration plate coordinate system to a first camera coordinate system 1 And the conversion relation BC from the coordinate system of the calibration board to the coordinate system of the second camera 2 ；
Establishing a conversion relation MC from a first camera coordinate system to a first probe coordinate system according to the position relation of a first camera and a first probe on a first test axis 1 Establishing a conversion relation MC from a second camera coordinate system to a second probe coordinate system according to the position relation of the second camera and the second probe on a second test axis 2 ；
According to a conversion relation BC 1 And a conversion relation MC 1 Establishing a conversion relation MB from a calibration plate coordinate system to a first probe coordinate system 1 According to a conversion relation BC 2 And a conversion relation MC 2 Establishing a conversion relation MB from a calibration plate coordinate system to a second probe coordinate system 2 ；
According to a conversion relation MB 1 And the conversion relation MB 2 Establishing a conversion relation M between the first probe coordinate system and the second probe coordinate system 12 。
3. The method of claim 2, wherein the establishing a transformation BC of the calibration plate coordinate system to the first camera coordinate system 1 And the conversion relation BC from the coordinate system of the calibration board to the coordinate system of the second camera 2 The method comprises the following steps:
acquiring a first image of a calibration plate through a first camera, identifying and positioning a center coordinate of the first image, and calculating to obtain a conversion relation BC from a calibration plate coordinate system to a first camera coordinate system according to a physical distance between each marking point on the calibration plate 1 ；
Acquiring a second image of the calibration plate through a second camera, identifying and positioning the center coordinates of the second image, and calculating to obtain a conversion relation BC from a calibration plate coordinate system to a second camera coordinate system according to the physical distance between each marking point on the calibration plate 2 。
4. The method as claimed in claim 1, wherein the step of establishing a transformation MP from the PCB coordinate system to the first probe mechanical coordinate system is performed by using the test axis polarity assignment method 1 The method comprises the following steps:
searching a coordinate file of the PCB, selecting a plurality of marking points on the PCB, and establishing a PCB coordinate system according to mechanical coordinates of the marking points;
respectively moving the first camera to photographing positions corresponding to the plurality of marking points, acquiring images of the plurality of marking points, calculating pixel coordinates of the plurality of marking points based on the first camera, and recording mechanical coordinates of the first camera at the photographing positions corresponding to the plurality of marking points;
according to the mechanical coordinates of the plurality of marking points, the pixel coordinates of the plurality of marking points based on the first camera, the mechanical coordinates of the first camera at the photographing positions corresponding to the plurality of marking points, and the positions of the first camera and the first probe at the first positionA position relation on the test axis, and establishing a conversion relation MP from the PCB coordinate system to the first probe mechanical coordinate system 1 。
5. The method of claim 1, wherein the transformation relationship MP from the PCB coordinate system to the second probe mechanical coordinate system is established 2 The method comprises the following steps:
searching a coordinate file of the PCB, selecting a plurality of marking points on the PCB, and establishing a PCB coordinate system according to mechanical coordinates of the marking points;
respectively moving a second camera to photographing positions corresponding to the plurality of mark points, acquiring images of the plurality of mark points, calculating pixel coordinates of the plurality of mark points based on the second camera, and recording mechanical coordinates of the second camera at the photographing positions corresponding to the plurality of mark points;
establishing a conversion relation MP from a PCB coordinate system to a mechanical coordinate system of a second probe according to the mechanical coordinates of the plurality of mark points, the pixel coordinates of the plurality of mark points based on a second camera, the mechanical coordinates of the second camera at the photographing positions corresponding to the plurality of mark points and the position relation of the second camera and the second probe on a second test axis 2 。
6. The method for assigning test axis polarity for a flying probe testing machine as claimed in claim 1 wherein said conversion relationship based MP 1 Obtaining a moving path L from the first probe to the first point to be measured 11 Based on the conversion relation MP 2 Obtaining a moving path L from the second probe to the second point to be measured 22 The method comprises the following steps:
MP based on conversion relation 1 Obtaining the coordinate of the first point to be measured in the first probe coordinate system, and calculating to obtain a moving path L according to the coordinate of the first point to be measured in the first probe coordinate system 11 ；
Based on conversion relation MP 2 Obtaining the coordinates of the second point to be measured in the second probe coordinate system, and calculating to obtain a moving path L according to the coordinates of the second point to be measured in the second probe coordinate system 22 。
7. The method of claim 1, wherein the travel path L is a travel path of the test shaft polarity distribution 1 And a moving path L 2 If there is interference between the first probe and the second probe, taking the second point to be tested as the test point of the first probe, and taking the first point to be tested as the test point of the second probe, and performing a probe test, including:
if the moving path L 11 And a moving path L 22 There is interference between them, based on the conversion relation MP 1 Obtaining a moving path L from the first probe to the second point to be measured 12 Based on the conversion relation MP 2 Obtaining a moving path L from the second probe to the first point to be measured 21 ；
According to the moving path L 12 Moving the first probe to the second point to be measured according to the moving path L 21 And moving the second probe to the first point to be tested, and performing a probe placing test.
8. The method of claim 7, wherein the MP based conversion relationship 1 Obtaining a moving path L from the first probe to the second point to be measured 12 Based on the conversion relation MP 2 Obtaining a moving path L from the second probe to the second point to be measured 21 The method comprises the following steps:
MP based on conversion relation 1 Obtaining the coordinates of the second point to be measured in the first probe coordinate system, and calculating to obtain a moving path L according to the coordinates of the second point to be measured in the first probe coordinate system 12 ；
Based on conversion relation MP 2 Obtaining the coordinate of the first point to be measured in the second probe coordinate system, and calculating to obtain the moving path L according to the coordinate of the first point to be measured in the second probe coordinate system 21 。
9. The method of assigning a polarity to a test axis of a flying probe testing machine as claimed in claim 1, wherein the method of testing further comprises:
if the moving path L 11 And a moving path L 22 If no interference exists between the first probe and the second probe, the first point to be tested is taken as the test point of the first probe, and the second point to be tested is taken as the test point of the second probe, and the next probe test is carried out.
10. A flying probe testing machine comprising a memory and a processor, the memory having stored therein a computer program that, when executed by the processor, causes the processor to perform the steps of the method for assigning test axis polarity of a flying probe testing machine as claimed in any one of claims 1 to 9.
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