CN114325458B - Test method, system, device, equipment and storage medium of switching power supply - Google Patents
Test method, system, device, equipment and storage medium of switching power supply Download PDFInfo
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Abstract
The application discloses a test method, a system, a device, equipment and a storage medium of a switch power supply, which utilize a test host connected with a plurality of power supply devices, a plurality of electronic load devices and a plurality of test instruments respectively, determine power configuration parameters, load configuration parameters and test instrument configuration parameters corresponding to the switch power supply to be tested according to test requirements of the switch power supply to be tested, call the power supply devices and the electronic load devices to build a test environment according to the power configuration parameters and the load configuration parameters, call and configure the test instruments according to the test instrument configuration parameters so as to read the test parameters of the switch power supply to be tested through the test instruments, and finally evaluate the test parameters to obtain test results of the switch power supply to be tested, thereby realizing flexible configuration of the test environment and the test instruments, realizing simultaneous test of the switch power supply to be tested of a plurality of boards, being compatible with test of the switch power supply of a high-power high-load board card, and having high test efficiency and universality.
Description
Technical Field
The present disclosure relates to the field of power testing technologies, and in particular, to a method, a system, a device, equipment, and a storage medium for testing a switching power supply.
Background
With the development of novel internet technologies such as cloud computing, AI intelligence and big data, the demand of the market for servers is increasing, and the research and development period of the servers is continuously shortened, so that higher requirements are provided for the test efficiency of the server board card. A switch mode power supply (Switch Mode Power Supply, SMPS for short), also called a switching power supply, a switching converter, a switching power supply, is a high frequency power conversion device, and is a power supply. The function is to convert a voltage of one level into a voltage or current required by the user terminal through different types of structures. The input of the switching power supply is mostly an ac power supply (e.g. mains supply) or a dc power supply, while the output is mostly a device requiring a dc power supply, such as a personal computer, and the switching power supply performs voltage and current conversion between the two. On the motherboard of the server, the switching power supply is an important device for converting the power supplied by the power supply unit (Power Supply Unit, PSU) of the server into the power (3V, 5V, etc.) required for the power consumption components on the board.
When testing the board card switching power supply, after the direct current power supply and the direct current electronic load are respectively connected with the switching power supply of the board card to be tested, testing items of the switching power supply can be tested after related setting is carried out on testing instruments such as a universal meter, an oscilloscope and the like according to different testing pulling conditions. Because the related test items are more, the manual test of the test engineer obviously has the problems of lower efficiency and non-uniform test standard, so that the automatic power supply test system is developed by a person skilled in the art, namely, the automatic control of test instruments such as oscilloscopes is realized through a General interface bus (GPIB, general-Purpose Interface Bus), and after the test instruments, a power supply and an electronic load are respectively connected with a switch power supply of a tested board, an automatic test program is operated in an upper computer, so that the automatic test of the switch power supply can be completed.
However, compared with manual testing, the existing automatic power supply testing system can solve the problems of lower manual testing efficiency and non-uniform testing standard to a certain extent, but the existing automatic power supply testing system is a testing system of a single-host computer control oscilloscope and other testing instruments, and can only essentially meet single-board power supply testing, and cannot test a plurality of boards at the same time, so that the testing efficiency is limited. And with market demands for high-power high-performance boards (e.g., GPUs), multi-Phase power controllers (Multi-Phase controllers) have been used in an increasing number of applications. For example, one type of GPU master TDC current 236A employs an XDPE132G5D controller, which requires a 12-phase current equalization waveform to be grasped during testing, and a 4-channel oscilloscope of at least 3 is required, at which time the existing automated power test system has failed to meet the test requirements.
The improvement of the test efficiency and the universality of the existing automatic power supply test system is a technical problem which needs to be solved by the technicians in the field.
Disclosure of Invention
The purpose of the application is to provide a testing method, a system, a device, equipment and a storage medium of a switching power supply, which have higher testing efficiency and universality compared with the existing automatic power supply testing system.
In order to solve the above technical problems, the present application provides a testing method of a switching power supply, based on a testing host, including:
according to the test requirement of the tested switching power supply, determining a power supply configuration parameter, a load configuration parameter and a test instrument configuration parameter corresponding to the tested switching power supply;
according to the power supply configuration parameters and the load configuration parameters, a power supply device and an electronic load device are called to build a test environment for the tested switching power supply;
calling and configuring a test instrument according to the test instrument configuration parameters so as to read the test parameters of the tested switching power supply through the test instrument;
evaluating the test parameters to obtain a test result of the tested switching power supply;
the test host is respectively connected with the power supply devices, the electronic load devices and the test instruments.
Optionally, the power supply configuration parameters specifically include a power supply type and a power supply voltage;
the load configuration parameters specifically comprise load type and load current;
the test instrument configuration parameters specifically comprise test parameter types and test channel numbers.
Optionally, the power supply calling device and the electronic load device build a test environment for the tested switching power supply, specifically:
sending a power supply calling command to a first upper computer corresponding to the power supply device and the electronic load device so as to call the power supply device and the electronic load device to build a test environment for the tested switching power supply;
correspondingly, the calling and configuring the testing instrument is used for reading the testing parameters of the tested switching power supply through the testing instrument, and specifically comprises the following steps:
and sending an instrument calling command to a second upper computer corresponding to the test instrument so as to call and configure the test instrument, and receiving the test parameters which are sent by the second upper computer and read by the test instrument.
Optionally, the first upper computer and the second upper computer are both located under the same local area network with the test host.
Optionally, the first upper computer and the second upper computer are both upper computers in a switching power supply testing subsystem;
the switching power supply testing subsystem also comprises a power supply device, an electronic load device and a testing instrument which are connected with the upper computer and used for calling.
Optionally, according to the test requirement of the tested switching power supply, determining the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter corresponding to the tested switching power supply specifically includes:
and determining the power supply configuration parameters, the load configuration parameters and the test instrument configuration parameters according to the test requirements of the tested switching power supply input by the automatic power supply test client.
In order to solve the above technical problem, the present application further provides a test system of a switching power supply, including: the testing system comprises a testing host, a plurality of power supply devices, a plurality of electronic load devices and a plurality of testing instruments, wherein the power supply devices, the electronic load devices and the testing instruments are respectively connected with the testing host;
the test host is used for determining power supply configuration parameters, load configuration parameters and test instrument configuration parameters corresponding to the tested switching power supply according to the test requirements of the tested switching power supply; according to the power supply configuration parameters and the load configuration parameters, a power supply device and an electronic load device are called to build a test environment for the tested switching power supply; calling and configuring a test instrument according to the test instrument configuration parameters so as to read the test parameters of the tested switching power supply through the test instrument; and evaluating the test parameters to obtain a test result of the tested switching power supply.
For solving above-mentioned technical problem, this application still provides a switching power supply's testing arrangement, based on test host computer, includes:
the analysis unit is used for determining power supply configuration parameters, load configuration parameters and test instrument configuration parameters corresponding to the tested switching power supply according to the test requirements of the tested switching power supply;
the environment setting up unit is used for calling a power supply device and an electronic load device to set up a test environment for the tested switching power supply according to the power supply configuration parameters and the load configuration parameters;
the test unit is used for calling and configuring a test instrument according to the test instrument configuration parameters so as to read the test parameters of the tested switching power supply through the test instrument;
the evaluation unit is used for evaluating the test parameters to obtain a test result of the tested switching power supply;
the test host is respectively connected with the power supply devices, the electronic load devices and the test instruments.
In order to solve the technical problem, the application also provides a test device of a switching power supply, comprising:
the memory is used for storing instructions, and the instructions comprise the steps of the testing method of the switching power supply;
and the processor is used for executing the instructions.
To solve the above technical problem, the present application further provides a storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the steps of the method for testing a switching power supply according to any one of the above.
According to the test method of the switch power supply, the test hosts which are respectively connected with the power supply devices, the electronic load devices and the test instruments are utilized, the power supply configuration parameters, the load configuration parameters and the test instrument configuration parameters which correspond to the switch power supply to be tested are determined according to the test requirements of the switch power supply to be tested, the power supply devices and the electronic load devices are called for building a test environment for the switch power supply to be tested according to the power supply configuration parameters and the load configuration parameters, then the test instruments are called and configured according to the test instrument configuration parameters, the test parameters are read through the test instruments, and finally the test parameters are evaluated to obtain the test results of the switch power supply to be tested, so that the flexible configuration of the test environment and the test instruments is realized, the test of the switch power supply to be tested for multiple boards can be realized, the test of the switch power supply to be tested for high-power high-load boards can be compatible, and the test efficiency and the universality are achieved.
The application also provides a testing system, a testing device, testing equipment and a storage medium of the switching power supply, which have the beneficial effects and are not repeated here.
Drawings
For a clearer description of embodiments of the present application or of the prior art, the drawings that are used in the description of the embodiments or of the prior art will be briefly described, it being apparent that the drawings in the description that follow are only some embodiments of the present application, and that other drawings may be obtained from these drawings by a person of ordinary skill in the art without inventive effort.
Fig. 1 is a flowchart of a testing method of a switching power supply according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of a test system of a switching power supply according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a testing device of a switching power supply according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of a test device for a switching power supply according to an embodiment of the present application.
Detailed Description
The core of the application is to provide a testing method, a system, a device, equipment and a storage medium of a switching power supply, which have higher testing efficiency and universality compared with the existing automatic power supply testing system.
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
Example 1
Fig. 1 is a flowchart of a testing method of a switching power supply according to an embodiment of the present application.
As shown in fig. 1, based on a test host, the test method for a switching power supply provided in the embodiment of the present application includes:
s101: and determining the power supply configuration parameters, the load configuration parameters and the test instrument configuration parameters corresponding to the tested switching power supply according to the test requirements of the tested switching power supply.
S102: and according to the power supply configuration parameters and the load configuration parameters, the power supply device and the electronic load device are called to build a test environment for the tested switching power supply.
S103: and calling and configuring the test instrument according to the configuration parameters of the test instrument so as to read the test parameters of the tested switching power supply through the test instrument.
S104: and evaluating the test parameters to obtain a test result of the tested switching power supply.
The test host is respectively connected with the plurality of power supply devices, the plurality of electronic load devices and the plurality of test instruments.
The automatic power supply test system in the prior art can only test the low-power single-phase power supply of a single board, but the larger pulling load current and the larger number of oscilloscope channels of some high-power multi-phase power supplies cannot be met, and the input power supply VIN and the enabling power supply EN are needed to be provided when the same group of power supplies are tested, so that the test requirements of different voltages are required to be independently met. Therefore, the test method of the switching power supply provided by the embodiment of the application firstly establishes the switching power supply test system in which the test host is respectively connected with the plurality of power supply devices, the plurality of electronic load devices and the plurality of test instruments, and the test host runs the configuration script and the automatic test script by the instrument to realize unified allocation of test resources and meet the test requirements of the switching power supply.
In a specific implementation, for step S101, the test host receives a test requirement of the tested switching power supply input by a tester, specifically, a man-machine interaction interface can be provided to the outside, an alternative power supply device, an electronic load device and a test instrument are displayed, and the corresponding identifier of each instrument and the parameters of each instrument are described so as to allow the tester to select a required instrument; or receiving the type of the tested switching power supply input by a tester, calling a pre-established switching power supply test table, and obtaining the test requirement of the tested switching power supply from the test table, so as to determine which power supply devices, electronic load devices and test instruments are selected to be put into the test of the tested switching power supply.
The instrument calling configuration script is operated on the test host, and different instrument management modules, such as a universal meter management module, an oscilloscope management module, a power supply management module and an electronic load management module, can be established in advance according to instrument types, and each management module can complete automatic calling and configuration of corresponding devices and instruments according to configuration parameters obtained from test requirements.
In step S102, the tested switching power supply is connected to the power supply device through the power line and connected to the electronic load device through the load line. According to the power supply configuration parameters and the load configuration parameters of the tested switching power supply, the test host calls the power supply devices and the electronic load devices which meet the number and the types of test requirements to perform configuration, and one or more power supply devices and electronic load devices which meet the types of requirements are respectively connected into the test, so that the construction of the test environment of the tested switching power supply is completed. The power supply configuration parameters may specifically include a power supply type and a power supply voltage. The load configuration parameters may include in particular the load type and the load current.
For step S103, after the test environment of the switch power supply to be tested is built, the test host invokes the test instrument meeting the test requirement, which may include a multimeter connected with the switch to be tested through a stylus and an oscilloscope connected with the switch power supply to be tested through a probe, selecting one or more test instruments according to the test requirement, and configuring the test instruments according to the configuration parameters of the test instruments, where the configuration parameters of the test instruments include the test parameter types, the number of test channels, and the like. If each phase current waveform of a group of 8-phase power supplies needs to be grasped and 8 channels are needed, two four-channel oscilloscopes in two switching power supply subsystems are needed to be simultaneously allocated for collaborative test.
The test host reads the test parameters measured by the test instrument, such as static, dynamic ripple, transient response transient response, overshoot, undershoot, jitter, sequence sampling sequence, current over-high protection ocp, short-circuit protection scp and other relevant parameters of the test items, and the automatic test script of each test item can refer to the prior art and is not repeated here.
For step S104, whether each test parameter is qualified is detected according to a standard threshold range corresponding to the type of the switch power supply to be tested, and if the test parameter is unqualified, the switch power supply to be tested fails the test or other evaluation criteria to obtain the test result of the switch power supply to be tested.
According to the test method for the switch power supply, the test hosts which are respectively connected with the power supply devices, the electronic load devices and the test instruments are utilized, the power supply configuration parameters, the load configuration parameters and the test instrument configuration parameters which correspond to the switch power supply to be tested are determined according to the test requirements of the switch power supply to be tested, the power supply devices and the electronic load devices are called for building a test environment for the switch power supply to be tested according to the power supply configuration parameters and the load configuration parameters, then the test instruments are called and configured according to the test instrument configuration parameters, the test parameters of the switch power supply to be tested are read through the test instruments, finally the test parameters are evaluated, the test results of the switch power supply to be tested are obtained, flexible configuration of the test environment and the test instruments is achieved, the test of the switch power supply to be tested for multiple boards can be achieved simultaneously, the test of the switch power supply for high-power high-load boards can be compatible, and the test efficiency and the universality are achieved.
Example two
On the basis of the embodiment, in order to further improve the testing efficiency, the universality and the testing reliability of the switching power supply testing system, the testing host can be respectively connected with a plurality of upper computers, and the testing host can further control a plurality of power supply devices, a plurality of electronic load devices and a plurality of testing instruments through the upper computers.
Based on the foregoing embodiments, in the method for testing a switching power supply provided in the embodiments of the present application, invoking the power supply device and the electronic load device to build a test environment for the switching power supply to be tested in step S102 may specifically be:
and sending a power supply calling command to a first upper computer corresponding to the power supply device and the electronic load device so as to call the power supply device and the electronic load device to build a test environment for the tested switching power supply.
Correspondingly, in step S103, the test instrument is called and configured to read the test parameters of the tested switching power supply through the test instrument, which may specifically be:
and sending an instrument calling command to a second upper computer corresponding to the testing instrument so as to call and configure the testing instrument, and receiving the testing parameters which are sent by the second upper computer and read by the testing instrument.
In the implementation, the upper computer among the test host, the power supply device, the electronic load device and the test instrument can be used for completing the operation of calling and configuring the test device and reading the test parameters of the test instrument, and further, the initial analysis of the test parameters can be performed on the upper computer, and then all analysis results are integrated by the test host, so that the test result of the tested switching power supply is obtained through comprehensive evaluation. Therefore, the test host and the upper computer form a distributed test system, an automatic power supply test client can be further developed, so that a tester can access the test system through the automatic power supply test client running on the terminal equipment to input the test requirement of the tested switching power supply, know the power supply configuration parameters, the load configuration parameters, the test instrument configuration parameters and the test parameters related in the test process, and learn the final test result. In step S101, according to the test requirement of the tested switching power supply, the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter corresponding to the tested switching power supply are determined, specifically: and determining the power supply configuration parameters, the load configuration parameters and the test instrument configuration parameters according to the test requirements of the tested switching power supply input by the automatic power supply test client.
In order to facilitate unified allocation, the test host and the upper computers can be deployed under the same local area network, namely, the first upper computer and the second upper computer are both in the same local area network with the test host, the upper computers are connected with the test host through a switching system consisting of a switch router, and the test host controls the upper computers under the same local area network through different IP addresses, so as to further control a power supply device, an electronic load device and a test instrument which are connected with the upper computers through General interface buses (GPIB, general-Purpose Interface Bus).
The first upper computer and the second upper computer may be the same upper computer, may be different upper computers, or may be a plurality of upper computers having the same function. The first upper computer can be specifically arranged for allocating the power supply device and the electronic load device, and the second upper computer can be arranged for allocating test instruments such as a universal meter, an oscilloscope and the like. The first upper computer is used for controlling one group of power supply device, electronic load device and test instrument, and the second upper computer is used for controlling the other group of power supply device, electronic load device and test instrument, so that the first upper computer and the second upper computer are both upper computers in the switching power supply test subsystem; the switching power supply testing subsystem also comprises a power supply device, an electronic load device and a testing instrument which are connected with the upper computer and used for calling. As described in the background art, the existing automatic power supply testing system is formed by an upper computer control testing instrument, so that the existing automatic power supply testing system can be used as the switching power supply testing subsystem in the embodiment of the application, and the original developed automatic power supply testing script based on the python language is carried, so that the switching power supply testing subsystem can complete the automatic test of the low-power single-board switching power supply. The multiple switching power supply test subsystems are connected with the test host through the local area network, receive unified allocation of the test host, realize multi-board simultaneous test, or meet the larger pulling load current and the larger number of oscilloscope channels of the high-power multiphase power supply, and test requirements of input power supply VIN and enable power supply EN when testing the same group of power supplies. The switching power supply subsystem adopted at this time can be specifically an Intel provided pulling and loading jig.
Based on the test architecture provided by the embodiment of the application, the test host receives the test requirement of the tested switching power supply, judges whether a plurality of switching power supply subsystems are required to be allocated for testing, and if not, calls the current spare switching power supply subsystems to complete the testing; if yes, a plurality of spare switching power supply subsystems are allocated for multi-machine parallel connection, the equipment quantity of a testing instrument, a power supply device and an electronic load device is automatically selected, equipment resources of the switching power supply subsystems are automatically combined, and testing requirements of pulling load conditions, a plurality of oscilloscopes grabbing waveforms and the like are met; aiming at the test requirement of the comparison test of the same board card, the test host can select two switching power supply subsystems to be tested in parallel and synchronously, and the same setting is carried out on the switching power supply subsystems by using the tested switching power supplies of the same tested board card in different switching power supply subsystems, so that the comparison condition of waveforms is displayed efficiently and synchronously. And then the test host reads the test parameters from each switching power supply subsystem, gathers the test results of the tested switching power supplies, and generates an automatic test report of the tested switching power supplies according to a preset template.
Various embodiments corresponding to the testing method of the switching power supply are described in detail above, and on the basis of the embodiments, the application also discloses a testing system, a testing device, testing equipment and a storage medium of the switching power supply corresponding to the method.
Example III
Fig. 2 is a schematic structural diagram of a test system of a switching power supply according to an embodiment of the present application.
As shown in fig. 2, a test system for a switching power supply provided in an embodiment of the present application includes: a test host 201, a plurality of power supply devices 202, a plurality of electronic load devices 203, and a plurality of test instruments 204 respectively connected to the test host 201;
the test host 201 is configured to determine a power configuration parameter, a load configuration parameter and a test instrument 204 configuration parameter corresponding to the tested switching power supply according to a test requirement of the tested switching power supply; according to the power supply configuration parameters and the load configuration parameters, the power supply device 202 and the electronic load device 203 are called to build a test environment for the switch power supply to be tested; calling and configuring the test instrument 204 according to the configuration parameters of the test instrument 204 to read the test parameters of the switch power supply to be tested through the test instrument 204; and evaluating the test parameters to obtain a test result of the tested switching power supply.
In a specific implementation, the test system of the switching power supply provided in the embodiment of the present application may further include an upper computer 205 disposed between the test host 201 and the power supply device 202, the electronic load device 203, and the test instrument 204.
Since the embodiments of the system portion and the embodiments of the method portion correspond to each other, the embodiments of the system portion refer to the description of the embodiments of the method portion, which is not repeated herein.
Example IV
Fig. 3 is a schematic structural diagram of a testing device for a switching power supply according to an embodiment of the present application.
As shown in fig. 3, based on a test host, a test device for a switching power supply provided in an embodiment of the present application includes:
an analysis unit 301, configured to determine a power configuration parameter, a load configuration parameter, and a test instrument configuration parameter corresponding to the tested switching power supply according to a test requirement of the tested switching power supply;
the environment setting up unit 302 is configured to call the power supply device and the electronic load device to set up a test environment for the switch power supply to be tested according to the power supply configuration parameter and the load configuration parameter;
the test unit 303 is configured to call and configure the test instrument according to the configuration parameters of the test instrument, so as to read the test parameters of the switch power supply to be tested through the test instrument;
the evaluation unit 304 is configured to evaluate the test parameters to obtain a test result of the tested switching power supply;
the test host is respectively connected with the plurality of power supply devices, the plurality of electronic load devices and the plurality of test instruments.
Since the embodiments of the apparatus portion and the embodiments of the method portion correspond to each other, the embodiments of the apparatus portion are referred to the description of the embodiments of the method portion, and are not repeated herein.
Example five
Fig. 4 is a schematic structural diagram of a test device for a switching power supply according to an embodiment of the present application.
As shown in fig. 4, a test apparatus for a switching power supply provided in an embodiment of the present application includes:
a memory 410 for storing instructions including the steps of the method for testing a switching power supply according to any one of the embodiments described above;
and a processor 420 for executing the instructions.
Processor 420 may include one or more processing cores, such as a 3-core processor, an 8-core processor, etc., among others. The processor 420 may be implemented in at least one hardware form of digital signal processing DSP (Digital Signal Processing), field programmable gate array FPGA (Field-Programmable Gate Array), programmable logic array PLA (Programmable Logic Array). Processor 420 may also include a main processor, which is a processor for processing data in an awake state, also referred to as central processor CPU (Central Processing Unit), and a coprocessor; a coprocessor is a low-power processor for processing data in a standby state. In some embodiments, the processor 420 may be integrated with an image processor GPU (Graphics Processing Unit), a GPU for use in responsible for rendering and rendering of the content required to be displayed by the display screen. In some embodiments, the processor 420 may also include an artificial intelligence AI (Artificial Intelligence) processor for processing computing operations related to machine learning.
Memory 410 may include one or more storage media, which may be non-transitory. Memory 410 may also include high-speed random access memory, as well as non-volatile memory, such as one or more magnetic disk storage devices, flash memory storage devices. In this embodiment, the memory 410 is at least used for storing a computer program 411, where the computer program 411 can implement relevant steps in the testing method of the switching power supply disclosed in any one of the foregoing embodiments after being loaded and executed by the processor 420. In addition, the resources stored in the memory 410 may further include an operating system 412, data 413, and the like, where the storage manner may be transient storage or permanent storage. The operating system 412 may be Windows. The data 413 may include, but is not limited to, data related to the above-described method.
In some embodiments, the test equipment of the switching power supply can further comprise a display screen 430, a power supply 440, a communication interface 450, an input-output interface 460, a sensor 470 and a communication bus 480.
Those skilled in the art will appreciate that the configuration shown in fig. 4 does not constitute a limitation of the test equipment of the switching power supply and may include more or less components than those illustrated.
The test equipment for the switching power supply comprises the memory and the processor, and the processor can realize the test method for the switching power supply when executing the program stored in the memory.
Example six
It should be noted that the apparatus and device embodiments described above are merely exemplary, and for example, the division of modules is merely a logic function division, and there may be other division manners in actual implementation, for example, multiple modules or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or modules, which may be in electrical, mechanical, or other forms. The modules illustrated as separate components may or may not be physically separate, and components shown as modules may or may not be physical modules, i.e., may be located in one place, or may be distributed over a plurality of network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional module in each embodiment of the present application may be integrated into one processing module, or each module may exist alone physically, or two or more modules may be integrated into one module. The integrated modules may be implemented in hardware or in software functional modules.
The integrated modules may be stored in a storage medium if implemented in the form of software functional modules and sold or used as a stand-alone product. With such understanding, the technical solution of the present application, or a part contributing to the prior art or all or part of the technical solution, may be embodied in the form of a software product stored in a storage medium, performing all or part of the steps of the method described in the various embodiments of the present application.
To this end, the embodiments of the present application also provide a storage medium having a computer program stored thereon, which when executed by a processor implements the steps of a test method, such as a switching power supply.
The storage medium may include: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (ram) RAM (Random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The computer program included in the storage medium provided in this embodiment can implement the steps of the test method for the switching power supply described above when executed by the processor, and the same effects are achieved.
The above describes in detail a method, a system, a device, equipment and a storage medium for testing a switching power supply provided by the application. In the description, each embodiment is described in a progressive manner, and each embodiment is mainly described by the differences from other embodiments, so that the same similar parts among the embodiments are mutually referred. The system, the device, the equipment and the storage medium disclosed in the embodiments are relatively simple in description, and the relevant parts refer to the description of the method part because the system, the device, the equipment and the storage medium correspond to the methods disclosed in the embodiments. It should be noted that it would be obvious to those skilled in the art that various improvements and modifications can be made to the present application without departing from the principles of the present application, and such improvements and modifications fall within the scope of the claims of the present application.
It should also be noted that in this specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Claims (6)
1. A method for testing a switching power supply, based on a test host, comprising:
according to the test requirement of the tested switching power supply, determining a power supply configuration parameter, a load configuration parameter and a test instrument configuration parameter corresponding to the tested switching power supply;
according to the power supply configuration parameters and the load configuration parameters, a power supply device and an electronic load device are called to build a test environment for the tested switching power supply;
calling and configuring a test instrument according to the test instrument configuration parameters so as to read the test parameters of the tested switching power supply through the test instrument;
evaluating the test parameters to obtain a test result of the tested switching power supply;
the test host is respectively connected with the power supply devices, the electronic load devices and the test instruments; the power supply configuration parameters specifically comprise a power supply type and a power supply voltage; the load configuration parameters specifically comprise load type and load current; the configuration parameters of the test instrument specifically comprise test parameter types and test channel numbers;
the power supply calling device and the electronic load device build a test environment for the tested switching power supply, and specifically comprise the following steps: sending a power supply calling command to a first upper computer corresponding to the power supply device and the electronic load device so as to call the power supply device and the electronic load device to build a test environment for the tested switching power supply;
correspondingly, the calling and configuring the testing instrument is used for reading the testing parameters of the tested switching power supply through the testing instrument, and specifically comprises the following steps: sending an instrument calling command to a second upper computer corresponding to the test instrument so as to call and configure the test instrument, and receiving the test parameters which are sent by the second upper computer and read by the test instrument;
the first upper computer and the second upper computer are both upper computers in a switching power supply testing subsystem;
the switching power supply testing subsystem further comprises a power supply device, an electronic load device and a testing instrument which are connected with the upper computer and used for calling;
according to the test requirement of the tested switching power supply, determining the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter corresponding to the tested switching power supply, wherein the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter are specifically as follows: determining the power supply configuration parameters, the load configuration parameters and the test instrument configuration parameters according to the test requirements of the tested switching power supply input by an automatic power supply test client;
the determining the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter according to the test requirement of the tested switching power supply input by the automatic power supply test client comprises the following steps: receiving the test requirement of the tested switching power supply, judging whether a plurality of switching power supply subsystems are required to be allocated for testing, and if not, calling the current spare switching power supply subsystems to complete testing; if yes, a plurality of spare switching power supply subsystems are allocated for multi-machine parallel connection, the equipment numbers of the testing instrument, the power supply device and the electronic load device are selected, and equipment resources of the switching power supply subsystems are combined to meet the pulling load conditions and the testing requirements of a plurality of oscilloscopes for grabbing waveforms.
2. The method of claim 1, wherein the first host computer and the second host computer are both located under the same local area network as the test host computer.
3. A test system for a switching power supply, comprising: the testing system comprises a testing host, a plurality of power supply devices, a plurality of electronic load devices and a plurality of testing instruments, wherein the power supply devices, the electronic load devices and the testing instruments are respectively connected with the testing host;
the test host is used for determining power supply configuration parameters, load configuration parameters and test instrument configuration parameters corresponding to the tested switching power supply according to the test requirements of the tested switching power supply; according to the power supply configuration parameters and the load configuration parameters, a power supply device and an electronic load device are called to build a test environment for the tested switching power supply; calling and configuring a test instrument according to the test instrument configuration parameters so as to read the test parameters of the tested switching power supply through the test instrument; evaluating the test parameters to obtain a test result of the tested switching power supply;
the power supply configuration parameters specifically comprise a power supply type and a power supply voltage; the load configuration parameters specifically comprise load type and load current; the configuration parameters of the test instrument specifically comprise test parameter types and test channel numbers;
the power supply calling device and the electronic load device build a test environment for the tested switching power supply, and specifically comprise the following steps: sending a power supply calling command to a first upper computer corresponding to the power supply device and the electronic load device so as to call the power supply device and the electronic load device to build a test environment for the tested switching power supply;
correspondingly, the calling and configuring the testing instrument is used for reading the testing parameters of the tested switching power supply through the testing instrument, and specifically comprises the following steps: sending an instrument calling command to a second upper computer corresponding to the test instrument so as to call and configure the test instrument, and receiving the test parameters which are sent by the second upper computer and read by the test instrument;
the first upper computer and the second upper computer are both upper computers in a switching power supply testing subsystem;
the switching power supply testing subsystem further comprises a power supply device, an electronic load device and a testing instrument which are connected with the upper computer and used for calling;
according to the test requirement of the tested switching power supply, determining the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter corresponding to the tested switching power supply, wherein the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter are specifically as follows: determining the power supply configuration parameters, the load configuration parameters and the test instrument configuration parameters according to the test requirements of the tested switching power supply input by an automatic power supply test client;
the determining the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter according to the test requirement of the tested switching power supply input by the automatic power supply test client comprises the following steps: receiving the test requirement of the tested switching power supply, judging whether a plurality of switching power supply subsystems are required to be allocated for testing, and if not, calling the current spare switching power supply subsystems to complete testing; if yes, a plurality of spare switching power supply subsystems are allocated for multi-machine parallel connection, the equipment numbers of the testing instrument, the power supply device and the electronic load device are selected, and equipment resources of the switching power supply subsystems are combined to meet the pulling load conditions and the testing requirements of a plurality of oscilloscopes for grabbing waveforms.
4. A switching power supply testing device, characterized by comprising:
the analysis unit is used for determining power supply configuration parameters, load configuration parameters and test instrument configuration parameters corresponding to the tested switching power supply according to the test requirements of the tested switching power supply;
the environment setting up unit is used for calling a power supply device and an electronic load device to set up a test environment for the tested switching power supply according to the power supply configuration parameters and the load configuration parameters;
the test unit is used for calling and configuring a test instrument according to the test instrument configuration parameters so as to read the test parameters of the tested switching power supply through the test instrument;
the evaluation unit is used for evaluating the test parameters to obtain a test result of the tested switching power supply;
the test host is respectively connected with the power supply devices, the electronic load devices and the test instruments; the power supply configuration parameters specifically comprise a power supply type and a power supply voltage; the load configuration parameters specifically comprise load type and load current; the configuration parameters of the test instrument specifically comprise test parameter types and test channel numbers;
the power supply calling device and the electronic load device build a test environment for the tested switching power supply, and specifically comprise the following steps: sending a power supply calling command to a first upper computer corresponding to the power supply device and the electronic load device so as to call the power supply device and the electronic load device to build a test environment for the tested switching power supply;
correspondingly, the calling and configuring the testing instrument is used for reading the testing parameters of the tested switching power supply through the testing instrument, and specifically comprises the following steps: sending an instrument calling command to a second upper computer corresponding to the test instrument so as to call and configure the test instrument, and receiving the test parameters which are sent by the second upper computer and read by the test instrument;
the first upper computer and the second upper computer are both upper computers in a switching power supply testing subsystem;
the switching power supply testing subsystem further comprises a power supply device, an electronic load device and a testing instrument which are connected with the upper computer and used for calling;
according to the test requirement of the tested switching power supply, determining the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter corresponding to the tested switching power supply, wherein the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter are specifically as follows: determining the power supply configuration parameters, the load configuration parameters and the test instrument configuration parameters according to the test requirements of the tested switching power supply input by an automatic power supply test client;
the determining the power supply configuration parameter, the load configuration parameter and the test instrument configuration parameter according to the test requirement of the tested switching power supply input by the automatic power supply test client comprises the following steps: receiving the test requirement of the tested switching power supply, judging whether a plurality of switching power supply subsystems are required to be allocated for testing, and if not, calling the current spare switching power supply subsystems to complete testing; if yes, a plurality of spare switching power supply subsystems are allocated for multi-machine parallel connection, the equipment numbers of the testing instrument, the power supply device and the electronic load device are selected, and equipment resources of the switching power supply subsystems are combined to meet the pulling load conditions and the testing requirements of a plurality of oscilloscopes for grabbing waveforms.
5. A test apparatus for a switching power supply, comprising:
a memory for storing instructions comprising the steps of the method of testing a switching power supply of claim 1 or 2;
and the processor is used for executing the instructions.
6. A storage medium having stored thereon a computer program, which when executed by a processor performs the steps of the method for testing a switching power supply according to claim 1 or 2.
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