CN114281060A - Mechanical life test device based on singlechip - Google Patents

Mechanical life test device based on singlechip Download PDF

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Publication number
CN114281060A
CN114281060A CN202111535588.7A CN202111535588A CN114281060A CN 114281060 A CN114281060 A CN 114281060A CN 202111535588 A CN202111535588 A CN 202111535588A CN 114281060 A CN114281060 A CN 114281060A
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CN
China
Prior art keywords
chip microcomputer
single chip
port
switch
module
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CN202111535588.7A
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Chinese (zh)
Inventor
陈翰林
张佳飞
邵伟清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Pinggao Tianling Switch Co ltd
Pinggao Group Co Ltd
Original Assignee
Shanghai Pinggao Tianling Switch Co ltd
Pinggao Group Co Ltd
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Priority to CN202111535588.7A priority Critical patent/CN114281060A/en
Publication of CN114281060A publication Critical patent/CN114281060A/en
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Abstract

The invention discloses a mechanical life test device based on a single chip microcomputer, which comprises the single chip microcomputer, a relay control module, a display module and a storage module, wherein the single chip microcomputer outputs high and low level control signals to the relay control module to realize on-off control of the relay control module; the relay control module is provided with a normally open switch connected with a closing control terminal in the switch cabinet and a normally closed switch connected with a breaking control terminal in the switch cabinet, and when the relay control module is powered on and powered off, the normally open switch and the normally closed switch are used for circularly switching the switch state; one end of a switch-on indicating terminal in the switch cabinet is connected with a P3.6 port of the singlechip, and the other end of the switch-on indicating terminal is connected with the ground of the singlechip; when the switch cabinet is switched on, the P3.6 port of the single chip microcomputer is changed from high level to low level, and the switching-on and switching-off times are accumulated every time the P3.6 port of the single chip microcomputer completes one-time high-low level conversion through the programming of the single chip microcomputer, so that the counting of the switching-on and switching-off times is completed.

Description

Mechanical life test device based on singlechip
Technical Field
The invention relates to the technical field of mechanical life test devices of medium-voltage switch cabinets, in particular to a mechanical life test device based on a single chip microcomputer.
Background
In the mechanical life test of a switch cabinet, particularly a medium-voltage switch cabinet, a mechanical life test device can be used for replacing manpower for testing, and manpower is greatly saved. At present, two time relay circulation control intermediate relays are mostly used in the existing mechanical life tests, the counter is used for counting the times of the total times, so that the test requirements are met, the time relays and the counter are simple and practical, the cost is reduced according to the space, the time relays also have certain service lives, and the space for improvement is also provided.
The single chip microcomputer is internally provided with a timer, the time delay can be realized by programming a program, the output signal is continuously inverted to form a square wave signal, and the square wave signal is utilized to control the power-on time of the relay so as to control the switching-on and switching-off of the switch cabinet. The working principle of the counter is to judge whether the switch cabinet is conducted or not, namely whether the switch cabinet is closed or not to accumulate counting, the single chip microcomputer can also realize the accumulation counting by the same principle, one conducting wire outputs high level, the other conducting wire is grounded, and the two conducting wires are connected into the switch cabinet to judge whether the switch cabinet is conducted or not to accumulate counting, so that the single chip microcomputer is completely feasible in principle to replace two time relays and one counter.
Disclosure of Invention
The mechanical life test device based on the single chip microcomputer is provided for solving the technical problems that two time relays are mostly used for circularly controlling intermediate relays in the existing mechanical life test.
In order to achieve the purpose, the mechanical life test device based on the single chip microcomputer comprises the single chip microcomputer, a relay control module, a display module and a storage module, wherein a display signal output port of the single chip microcomputer is connected with the display module; the single chip microcomputer is in communication connection with the storage module, a P3.5 port of the single chip microcomputer is in control connection with the relay control module, and the single chip microcomputer outputs high and low level control signals to the relay control module to achieve on-off control of the relay control module; the relay control module is provided with a normally open switch and a normally closed switch, and the normally open switch and the normally closed switch are circularly switched to the switch state when the relay control module is switched on or off; the normally open switch is connected with a closing control terminal in the switch cabinet, the normally closed switch is connected with a breaking control terminal in the switch cabinet, one end of a closing indication terminal in the switch cabinet is connected with a port P3.6 of the single chip microcomputer, and the other end of the closing indication terminal is connected with the ground of the single chip microcomputer; when the switch cabinet is switched on, the P3.6 port of the single chip microcomputer is connected with the ground of the single chip microcomputer, the P3.6 port of the single chip microcomputer is changed from high level to low level, and the switching-on and switching-off times are accumulated when the P3.6 port of the single chip microcomputer completes one-time high-low level conversion through the programming of the single chip microcomputer, so that the counting of the switching-on and switching-off times is completed.
In a preferred embodiment of the invention, the model of the single chip microcomputer is STC89C51, and the voltage of the single chip microcomputer is 5V.
In a preferred embodiment of the invention, the single chip microcomputer communicates with the storage module through a P3.3/INT1 port and a P3.4/T0 port of the single chip microcomputer by adopting an I2C communication principle to finish the storage and reading of data.
In a preferred embodiment of the present invention, the memory module is a 24C02 memory module.
In a preferred embodiment of the present invention, the display module is a four-digit nixie tube display module.
In a preferred embodiment of the invention, the model of the four-digit nixie tube display module is 3461BS-1, and the four-digit nixie tube display module consists of 4-bit 8-segment red common-sun nixie tubes and is provided with an onboard driving module.
In a preferred embodiment of the invention, the relay model number in the relay control module is JQC-3FF-S-Z, and the voltage is 5V.
The mechanical life testing device based on the single chip microcomputer is lower in manufacturing cost, smaller in size and lighter in weight compared with the existing mechanical life testing device. When a mechanical life test is carried out, compared with the carrying of a switch cabinet, the mechanical life test device is more suitable for carrying and convenient to use.
Drawings
Fig. 1 is a schematic block diagram of a mechanical life testing device based on a single chip microcomputer.
Fig. 2 is an electrical schematic diagram among the single chip microcomputer, the relay control module, the display module and the storage module of the present invention.
Detailed Description
The invention is further described below in conjunction with the appended drawings and detailed description.
Referring to fig. 1 and 2, the mechanical life testing device based on the single chip microcomputer shown in the figures comprises a single chip microcomputer U1, a relay control module 10, a display module 20 and a storage module U2.
The single chip microcomputer U1 is STC89C51, and the voltage is 5V. The storage module U2 is a 24C02 storage module, and the display module 20 is a four-digit nixie tube display module 21. The model of the four-digit nixie tube display module 21 is 3461BS-1, the four-digit nixie tube display module 21 is composed of 4-digit 8-segment red common-anode nixie tubes, and an onboard driving module is arranged.
The display signal output port of the singlechip U1 is connected with the display module 20, and specifically comprises: a P0.0/AD0 pin, namely a 39 pin, of the singlechip U1 is connected with a nixie tube bit code 1 in the four-digit nixie tube display module 21 and is connected with a power supply through a resistor R3, a P0.1/AD1 pin, namely a 38 pin, of the singlechip U1 is connected with a nixie tube bit code 2 in the four-digit tube display module 21 and is connected with the power supply through a resistor R4, a P0.2/AD2 pin, namely a 37 pin, of the singlechip U1 is connected with a nixie tube bit code 3 in the four-digit tube display module 21 and is connected with the power supply through a resistor R5, a P0.3/AD3 pin, namely a 36 pin, of the singlechip U1 is connected with a nixie tube bit code 4 in the four-digit tube display module 21 and is connected with the power supply through a resistor R6, a P2.0/A8 pin, namely a 21 pin, of the singlechip U1 is connected with a nixie tube segment code DP in the four-digit tube display module 21, a P2.1/A22 pin, and a P2 pin, namely a 23 pin, of the nixie tube display module 21, and a nixie tube segment G2 tube display module in the four-digit tube display module 21, the P2.3/A11 pin, namely 24 pin, of the single chip microcomputer U1 is connected with a nixie tube segment code E in the four-digit nixie tube display module 21, the P2.4/A12 pin, namely 25 pin, of the single chip microcomputer U1 is connected with a nixie tube segment code D in the four-digit nixie tube display module 21, the P2.5/A13 pin, namely 26 pin, of the single chip microcomputer U1 is connected with a nixie tube segment code C in the four-digit nixie tube display module 21, the P2.6/A14 pin, namely 27 pin, of the single chip microcomputer U1 is connected with a nixie tube segment code B in the four-digit tube display module 21, and the P2.7/A15 pin, namely 28 pin is connected with a nixie tube segment code A in the four-digit tube display module 21.
The P0.4/AD4 and 35 feet of the single chip microcomputer U1 are connected with a power supply through a resistor R7, the P0.5/AD5 and 34 feet of the single chip microcomputer U1 are connected with the power supply through a resistor R8, the P0.6/AD6 and 33 feet of the single chip microcomputer U1 are connected with the power supply through a resistor R9, and the P0.7/AD7 and 32 feet of the single chip microcomputer U1 are connected with the power supply through a resistor R10.
The single-chip microcomputer U1 is in communication connection with the storage module U2, a P3.3/INT1 port, namely a13 pin, of the single-chip microcomputer U1 is an I2C time line, a P3.4/T0 port, namely a14 pin, of the single-chip microcomputer U1 is an I2C data line, the single-chip microcomputer U1 adopts an I2C communication principle to communicate with the storage module U2 through the P3.3/INT1 port, namely the 13 pin, and the P3.4/T0 port, namely the 14 pin of the single-chip microcomputer U1, and data storage and reading are completed. The P3.3/INT1 port, namely 13 feet, of the single chip microcomputer U1 is connected with the SCL port, namely 6 feet, of the storage module U2, the P3.4/T0 port, namely 14 feet, of the single chip microcomputer U1 is connected with the SDA port, namely 5 feet, of the storage module U2, and the VCC port, namely 8 feet, of the storage module U2 is used as a VCC power supply input port. One end of the resistor R13 is connected to the SDA port of the memory module U2, i.e., the 5-pin, and the other end of the resistor R13 is connected to the VCC power supply. One end of the resistor R14 is connected to the SCL port of the memory module U2, i.e., pin 6, and the other end of the resistor R14 is connected to the VCC power supply. The WP port of the storage module U2, namely a pin 7, the A0 port, namely a pin 1, the A1 port, namely a pin 2, the A2 port, namely a pin 3, and the GND port, namely a pin 4 are connected with the ground of the single chip microcomputer U1.
The P3.5 port of singlechip U1 is 15 foot output signals, and it is connected with relay control module 10 control, specifically: the relay control module 10 includes resistors R2, R11, R12, a green light emitting diode D1, a red light emitting diode D2, a triode Q1, a diode D2, and a relay RL 1. The model of the relay RL1 is JQC-3FF-S-Z, and the voltage is 5V.
The P3.5/T1 port, namely a pin 15 of the singlechip U1 is connected with one end of a resistor R11, the other end of the resistor R11 is connected with a base electrode of a triode Q1, an emitter of the triode Q1 is connected with a power supply and one end of a resistor R2, the other end of the resistor R2 is connected with an anode of a green light-emitting diode D1, and a cathode of the green light-emitting diode D1 is connected with the ground of the singlechip U1.
The collector of the triode Q1 is connected to one end of the coil of the relay RL1, the negative electrode of the diode D2, and one end of the resistor R12, the other end of the resistor R12 is connected to the positive electrode of the red light emitting diode D2, and the negative electrode of the red light emitting diode D2 is connected to the positive electrode of the diode D2 and the other end of the coil of the relay RL 1.
Relay RL1 has a normally open switch connected to the terminal of the closing control in switch cabinet 30 and a normally closed switch connected to the terminal of the opening control in switch cabinet 30.
A P3.5/T1 port, namely a pin 15 of the single chip microcomputer U1 outputs a high-low level control signal to the relay control module 10 to realize the on-off control of the relay control module 10; when the relay control module 10 is powered on or off, the normally open switch and the normally closed switch are circularly switched to the switch state, which is as follows:
when a P3.5 port/T1 pin, namely a15 pin of the single chip microcomputer U1 outputs a high-level control signal, the triode Q1 is conducted, the red light-emitting diode D2 is lightened, a coil of the relay RL1 is electrified, a normally open switch of the relay RL1 is driven to be closed, a normally closed switch is driven to be opened, a closing control loop of the switch cabinet 30 is closed, a switching-off control loop is opened, and a closing motor in the switch cabinet 30 is driven to complete closing action; when a P3.5/T1 port of the single chip microcomputer U1, namely a pin 15, outputs a low level control signal, the triode Q1 is cut off, the red light emitting diode D2 is extinguished, a coil of the relay RL1 loses electricity, a normally open switch of the relay RL1 is driven to be disconnected, a normally closed switch is driven to be closed, a switching-off control loop of the switch cabinet 30 is closed, a switching-on control loop is disconnected, and a switching-on motor in the switch cabinet 30 is driven to complete switching-on action.
One end of a terminal indicated by closing in the switch cabinet 30 is connected with a pin 16 which is a P3.6/WR port of the single chip microcomputer U1, the other end of the terminal indicated by closing in the switch cabinet 30 is connected with a ground of the single chip microcomputer U1, when the switch cabinet 30 is closed, the pin 16 which is the P3.6/WR port of the single chip microcomputer is connected with the ground of the single chip microcomputer U1, the P3.6/WR port of the single chip microcomputer changes from a high level to a low level, and by programming of the single chip microcomputer, the switching-on and switching-off times are accumulated when the P3.6/WR port of the single chip microcomputer U1 completes one switching of the high and low levels, and the counting of the switching-on and switching-off times is completed.
The P3.7/RD port of the singlechip U1, namely a pin 17, is connected with one end of a button 32, the other end of the button 32 is connected with the ground of the singlechip U1, and when the button 32 is pressed, the counting of the singlechip U1 is reset to zero.
An XTAL1 port (pin 19) of the singlechip U1 is connected with a common connecting end of the crystal oscillator X1 and the capacitor C2, an XTAL2 port (pin 18) of the singlechip U1 is connected with a common connecting end of the crystal oscillator X1 and the capacitor C1, and a common connecting end of the capacitor C1 and the capacitor C2 is connected with the ground of the singlechip U1 (the common knowledge in the field).
The RST port, namely a pin 9, of the singlechip U1 is connected with a common connection end of the resistors R10 and R1 and the capacitor C3, the other end of the resistor R10 is connected with one end of a RESET button RESET1 of the singlechip U1, the other end of the RESET button RESET1 of the singlechip U1 and the other end of the capacitor C3 are connected with a power supply, and the other end of the resistor R1 is connected with the ground of the singlechip U1 (the RST port is also common knowledge in the field).
The EA port of the singlechip U1 is a 31 pin connected with a power supply, the PSEN port of the singlechip U1 is a 29 pin, the ALE port is a 30 pin, the P1.0 port is a1 pin, the P1.1 port is a2 pin, the P1.2 port is a 3 pin, the P1.3 port is a 4 pin, the P1.4 port is a 5 pin, the P1.5 port is a 6 pin, the P1.6 port is a 7 pin, the P1.7 port is an 8 pin, the P3.0/RXD port is a10 pin, the P3.1/TXD port is a11 pin, and the P3.2/INT0 port is a12 pin which is a blank pin.

Claims (7)

1. A mechanical life test device based on a single chip microcomputer is characterized by comprising the single chip microcomputer, a relay control module, a display module and a storage module, wherein a display signal output port of the single chip microcomputer is connected with the display module; the single chip microcomputer is in communication connection with the storage module, a P3.5 port of the single chip microcomputer is in control connection with the relay control module, and the single chip microcomputer outputs high and low level control signals to the relay control module to achieve on-off control of the relay control module; the relay control module is provided with a normally open switch and a normally closed switch, and the normally open switch and the normally closed switch are circularly switched to the switch state when the relay control module is switched on or off; the normally open switch is connected with a closing control terminal in the switch cabinet, the normally closed switch is connected with a breaking control terminal in the switch cabinet, one end of a closing indication terminal in the switch cabinet is connected with a port P3.6 of the single chip microcomputer, and the other end of the closing indication terminal is connected with the ground of the single chip microcomputer; when the switch cabinet is switched on, the P3.6 port of the single chip microcomputer is connected with the ground of the single chip microcomputer, the P3.6 port of the single chip microcomputer is changed from high level to low level, and the switching-on and switching-off times are accumulated when the P3.6 port of the single chip microcomputer completes one-time high-low level conversion through the programming of the single chip microcomputer, so that the counting of the switching-on and switching-off times is completed.
2. The mechanical life test device based on the single chip microcomputer of claim 1, wherein the model of the single chip microcomputer is STC89C51, and the voltage of the single chip microcomputer is 5V.
3. The mechanical life test device based on the single chip microcomputer as claimed in claim 2, wherein the single chip microcomputer is communicated with the storage module through a P3.3/INT1 port and a P3.4/T0 port of the single chip microcomputer by adopting an I2C communication principle to finish storage and reading of data.
4. The mechanical life test device based on the single chip microcomputer as claimed in claim 3, wherein the storage module is a 24C02 storage module.
5. The device for testing mechanical life based on the single chip microcomputer according to any one of claims 1 to 4, wherein the display module is a four-digit nixie tube display module.
6. The mechanical life test device based on the single chip microcomputer as claimed in claim 5, wherein the model of the four-digit nixie tube display module is 3461BS-1, the four-digit nixie tube display module consists of 4-bit 8-segment red common-anode nixie tubes and an onboard driving module.
7. The single-chip microcomputer-based mechanical life test device as claimed in claim 6, wherein the relay type in the relay control module is JQC-3FF-S-Z, and the voltage is 5V.
CN202111535588.7A 2021-12-15 2021-12-15 Mechanical life test device based on singlechip Pending CN114281060A (en)

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CN202111535588.7A CN114281060A (en) 2021-12-15 2021-12-15 Mechanical life test device based on singlechip

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Application Number Priority Date Filing Date Title
CN202111535588.7A CN114281060A (en) 2021-12-15 2021-12-15 Mechanical life test device based on singlechip

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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101144848A (en) * 2007-06-28 2008-03-19 天津市百利电气有限公司 Multifunctional integrative life experimental platform and its control method
JP3156817U (en) * 2009-11-02 2010-01-21 松栄電子工業株式会社 Contact life test equipment
CN202126710U (en) * 2011-05-05 2012-01-25 黄初指 Intelligent high voltage circuit breaker counter
CN103500356A (en) * 2013-10-12 2014-01-08 南京欧格节能科技有限公司 Electronic counter for circuit breakers
CN105277880A (en) * 2015-11-19 2016-01-27 泉州七星电气有限公司 A switch device life test control system
CN110261767A (en) * 2019-07-05 2019-09-20 瑞纳智能设备股份有限公司 A kind of detection device and detection method in on-off switch service life
CN110658447A (en) * 2017-11-16 2020-01-07 湖南工业大学 Relay service life detection method
CN214409213U (en) * 2020-12-07 2021-10-15 希捷爱斯(上海)电气有限公司 Automatic service life testing operation device with counting function

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101144848A (en) * 2007-06-28 2008-03-19 天津市百利电气有限公司 Multifunctional integrative life experimental platform and its control method
JP3156817U (en) * 2009-11-02 2010-01-21 松栄電子工業株式会社 Contact life test equipment
CN202126710U (en) * 2011-05-05 2012-01-25 黄初指 Intelligent high voltage circuit breaker counter
CN103500356A (en) * 2013-10-12 2014-01-08 南京欧格节能科技有限公司 Electronic counter for circuit breakers
CN105277880A (en) * 2015-11-19 2016-01-27 泉州七星电气有限公司 A switch device life test control system
CN110658447A (en) * 2017-11-16 2020-01-07 湖南工业大学 Relay service life detection method
CN110261767A (en) * 2019-07-05 2019-09-20 瑞纳智能设备股份有限公司 A kind of detection device and detection method in on-off switch service life
CN214409213U (en) * 2020-12-07 2021-10-15 希捷爱斯(上海)电气有限公司 Automatic service life testing operation device with counting function

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