CN114252702A - Quality factor detection circuit, method and device and electronic equipment - Google Patents
Quality factor detection circuit, method and device and electronic equipment Download PDFInfo
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
Abstract
The embodiment of the application discloses a quality factor detection circuit, a quality factor detection method, a quality factor detection device and electronic equipment, which are used for improving the accuracy of quality factor Q detection. The embodiment of the application comprises the following steps: the device comprises a waveform filtering circuit, a resonance circuit, a detection circuit, a power supply and a main control circuit; the power supply is respectively connected with the resonance circuit and the main control circuit; the main control circuit comprises a digital-to-analog converter (ADC) and a control chip; the waveform filtering circuit comprises a first diode D2, a second diode D3, a voltage-stabilizing diode D1 and a resistor R1; the resonant circuit is connected with the main control circuit; a first end of the resistor R1 is connected with the resonant circuit; a second end of the resistor R1 is connected to the cathode of the first diode D3, the anode of the second diode D2 and the detection circuit respectively; the anode of the first diode D3 is connected to the cathode of the second diode D2 and the cathode of the zener diode D1 respectively; the anode of the voltage stabilizing diode is grounded; the cathode of the second diode is grounded; the detection circuit is connected with the main control circuit.
Description
Technical Field
The embodiment of the application relates to the field of information processing, in particular to a quality factor detection circuit, a quality factor detection method, a quality factor detection device and electronic equipment.
Background
Quality factor Q, also called Q factor, is generally used in optical communication systems, where the osnr is an important index for measuring the performance of an optical path, and the nonlinear effect of the current high-speed transmission system is very strong, which has a significant influence on the system. Under the same circumstances, the magnitude of the nonlinear effect can cause significant changes in the system. That is, high speed systems at rates of 10G and above do not more accurately scale the performance of the system, so the quality factor Q is derived as a measure of the system performance.
The quality factor Q can be applied to a charging circuit, in particular to a wireless charging coil circuit, besides the optical communication system. Since the wireless charging coil is equivalent to an inductor, in the process of wireless charging, the magnetic field on the coil is changed by applying alternating current to the coil, the change of the magnetic field can affect the magnetic change of another receiving coil, and simultaneously, the same alternating current is generated in the receiving coil, and then the receiving coil end circuit processes the generated alternating current to charge. In the wireless charging coil circuit, the quality factor Q refers to the quality factor of the inductor.
In the wireless charging process, if a metal foreign body exists in the two coils, the metal foreign body can generate an eddy current effect due to an alternating magnetic field, and the metal foreign body can be heated due to the eddy current effect, so that the insecurity of the charging process is increased. The approach of the foreign metal absorbs a part of the magnetic energy, so that the inductance is reduced. Since the magnetic energy is absorbed by the metallic foreign matter, the inductance of the coil is decreased, and thus the quality factor Q in both coils is decreased.
That is, whether a metallic foreign object exists in the magnetic field region of the wireless charging coil can be judged by calculating the quality factor Q. The quality factor Q is also calculated in relation to frequency, voltage, etc. Self-oscillation can be generated by a resonant network in the wireless charging coil circuit, and in the process of self-oscillation, a quality factor Q is calculated: the voltage at the highest point at the beginning of oscillation, a predetermined voltage value and the time of the node reaching the predetermined voltage value are calculated. In the self-oscillation process, the initial voltage can be easily detected through the built-in digital-to-analog converter ADC, and at the moment, only one voltage value needs to be specified, so that the voltage value has sufficient time to reach the preset voltage value through the self-oscillation attenuation. However, there is more measurement interference on the measurement of the node time, and the larger interference directly causes the increase of the measurement error of the node time, which results in the decrease of the accuracy of the detection quality factor Q. Another method for calculating the quality factor Q at present is to multiply the node time in the formula by a fixed frequency, that is, to calculate the number of cycles, i.e., the quality factor Q can be directly calculated by calculating the number of cycles, but the calculation of the number of cycles requires accurate detection, otherwise, the measurement error of the number of cycles becomes large, which results in reducing the accuracy of detecting the quality factor Q.
Disclosure of Invention
A first aspect of an embodiment of the present application provides a quality factor detection circuit, including:
the device comprises a waveform filtering circuit, a resonance circuit, a detection circuit, a power supply and a main control circuit;
the power supply is respectively connected with the resonance circuit and the main control circuit;
the main control circuit comprises a digital-to-analog converter (ADC) and a control chip, wherein the ADC is used for analyzing a oscillogram transmitted by the detection circuit and transmitting an analysis result to the control chip, and the control chip is used for calculating a quality factor;
the waveform filtering circuit comprises a first diode D2, a second diode D3, a voltage-stabilizing diode D1 and a resistor R1;
the resonant circuit is connected with the main control circuit and is used for forming a circuit self-oscillation signal;
a first end of the resistor R1 is connected with the resonant circuit;
a second end of the resistor R1 is respectively connected with a cathode of the first diode D3, an anode of the second diode D2 and a detection circuit, and the detection circuit is used for receiving signals output after being processed by the waveform filtering circuit and transmitting the signals to a digital-to-analog converter (ADC) of the main control circuit;
the anode of the first diode D3 is connected to the cathode of the second diode D2 and the cathode of the zener diode D1 respectively;
the anode of the voltage stabilizing diode is grounded;
the cathode of the second diode is grounded;
the detection circuit is connected with the main control circuit, the main control circuit is used for controlling the resonance circuit to form a self-oscillation signal, and the main control circuit is also used for calculating the quality factor by using the control chip.
Optionally, the resonant circuit includes a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q4, an inductor Lp, a capacitor Cp, a diode D1, a first diode, a second diode, a third diode, and a fourth diode;
the MOS tube Q1 is connected with the first diode through a source electrode and a drain electrode;
the MOS tube Q2 is connected with the second diode through a source electrode and a drain electrode;
the MOS tube Q3 is connected with a third diode through a source electrode and a drain electrode;
the MOS tube Q4 is connected with a fourth diode through a source electrode and a drain electrode;
the first end of the inductor Lp is respectively connected with the control circuit and the grid electrode of the MOS tube Q1;
a first end of the capacitor Cp is respectively connected with the source electrode of the MOS transistor Q2 and the drain electrode of the MOS transistor Q3;
the drain electrode of the MOS tube Q1 is connected with the drain electrode of the MOS tube Q2, and then is connected with the control circuit;
the source electrode of the MOS transistor Q3 and the source electrode of the MOS transistor Q4 are respectively grounded;
after the second end of the inductor Lp is connected with the second end of the capacitor Cp, the connection point of the second end of the inductor Lp and the second end of the capacitor Cp is connected with the diode D1;
the diode D1 is connected with a first resistor R1 of the filter circuit;
the control circuit is respectively connected with the grid of the MOS transistor Q1, the grid of the MOS transistor Q2, the grid of the MOS transistor Q3 and the grid of the MOS transistor Q4, and the control circuit is used for controlling the on and off of the MOS transistor Q1, the MOS transistor Q2, the MOS transistor Q3 and the MOS transistor Q4.
A second aspect of the embodiments of the present application provides a quality factor detection method, including:
generating a self-oscillation signal by using a resonance circuit;
wave trough elimination processing is carried out on a self-oscillation signal of a resonance circuit through a filter circuit, the wave form filter circuit comprises a first diode D2, a second diode D3, a voltage stabilizing diode D1 and a resistor R1, the resonance circuit is connected with a main control circuit, the resonance circuit is used for forming a circuit self-oscillation signal, a first end of the resistor R1 is connected with the resonance circuit, a second end of the resistor R1 is respectively connected with a negative electrode of a first diode D3, a positive electrode of a second diode D2 and a detection circuit, the detection circuit is used for receiving a signal output after being processed by the wave form filter circuit and transmitting the signal to a digital-to-analog converter (ADC) of the main control circuit, a positive electrode of the first diode D3 is respectively connected with a negative electrode of a second diode D2 and a negative electrode of the voltage stabilizing diode D1, a positive electrode of the voltage stabilizing diode is grounded, a negative electrode of the second diode is grounded, and the detection circuit is connected with the main control circuit;
the self-oscillation signal is subjected to signal conversion through the detection circuit and is transmitted to a digital-to-analog converter (ADC) in the main control circuit;
performing oscillogram analysis on the converted self-oscillation signal through a digital-to-analog converter (ADC) in the control circuit, and calculating the number of wave crests of the oscillogram corresponding to the self-oscillation signal;
and calculating the quality factor through a control chip in the control circuit according to the number of the wave crests.
A third aspect of the embodiments of the present application provides a quality factor detection apparatus, including:
a generation unit configured to generate a self-oscillation signal using a resonance circuit;
the elimination unit is used for eliminating wave troughs of self-oscillation signals of the resonant circuit through the filter circuit, the wave form filter circuit comprises a first diode D2, a second diode D3, a voltage stabilizing diode D1 and a resistor R1, the resonant circuit is connected with the main control circuit and is used for forming circuit self-oscillation signals, a first end of the resistor R1 is connected with the resonant circuit, a second end of the resistor R1 is respectively connected with a negative electrode of the first diode D3, a positive electrode of the second diode D2 and a detection circuit, the detection circuit is used for receiving signals output after being processed by the wave form filter circuit, the voltage is transmitted to a digital-to-analog converter ADC of the main control circuit, the anode of a first diode D3 is respectively connected with the cathode of a second diode D2 and the cathode of a voltage stabilizing diode D1, the anode of the voltage stabilizing diode is grounded, the cathode of the second diode is grounded, and the detection circuit is connected with the main control circuit;
the conversion unit is used for performing signal conversion on the self-oscillation signal through the detection circuit and transmitting the signal to a digital-to-analog converter (ADC) in the main control circuit;
the analysis unit is used for carrying out oscillogram analysis on the converted self-oscillation signal through a digital-to-analog converter (ADC) in the control circuit and calculating the number of wave crests of the oscillogram corresponding to the self-oscillation signal;
and the detection unit is used for calculating the quality factor through a control chip in the control circuit according to the number of the wave crests.
A third aspect of the present application provides an electronic device, comprising:
the device comprises a processor, a memory, an input and output unit and a bus;
the processor is connected with the memory, the input and output unit and the bus;
the memory stores a program that the processor calls to perform the method of detecting the figure of merit as described in the second aspect and any optional one of the second aspects.
A fourth aspect of the present application provides a computer-readable storage medium having a program stored thereon, the program, when executed on a computer, performs the method of detecting for calculating a figure of merit according to the second aspect and any of the alternatives of the second aspect.
According to the technical scheme, the embodiment of the application has the following advantages:
in this embodiment, the quality factor detection circuit includes a waveform filter circuit, a resonant circuit, a detection circuit, a power supply, and a main control circuit. The power supply is respectively connected with the resonance circuit and the main control circuit. The main control circuit comprises a digital-to-analog converter (ADC) and a control chip. The waveform filtering circuit includes a first diode D2, a second diode D3, a zener diode D1, and a resistor R1. The resonant circuit and the main control circuit. A first terminal of resistor R1 is connected to the resonant circuit. A second end of the resistor R1 is connected to the cathode of the first diode D3, the anode of the second diode D2, and the detection circuit, respectively. The anode of the first diode D3 is connected to the cathode of the second diode D2 and the cathode of the zener diode D1 respectively; the anode of the voltage stabilizing diode is grounded; the cathode of the second diode is grounded. The detection circuit is connected with the main control circuit. Wherein, make resonance circuit carry out filtering process at the wave form that self-oscillation's in-process produced through wave form filter circuit, eliminate the negative value in the oscillogram through a plurality of components and parts, only remain the positive value, at this moment detection circuitry carries out conversion treatment to the signal after filtering process to transmit to the analysis in main control circuit's digital analog converter ADC, control chip can analyze out the crest number, the crest number is the cycle number of oscillation promptly, indirect accurate calculation cycle number, the accuracy that has improved the detection figure of merit is counted in the cycle number, the accuracy that has improved the detection figure of merit
Drawings
FIG. 1 is a schematic diagram of one embodiment of a quality factor detection circuit according to the present application;
FIG. 2 is a schematic diagram of one embodiment of a resonant circuit of the present application;
FIG. 3 is a schematic diagram of an embodiment of a quality factor detection method according to the present application;
FIG. 4 is a schematic diagram of an embodiment of a quality factor detection apparatus according to the present application;
fig. 5 is a schematic diagram of an embodiment of an electronic device of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
As used in this specification and the appended claims, the term "if" may be interpreted contextually as "when", "upon" or "in response to" determining "or" in response to detecting ". Similarly, the phrase "if it is determined" or "if a [ described condition or event ] is detected" may be interpreted contextually to mean "upon determining" or "in response to determining" or "upon detecting [ described condition or event ]" or "in response to detecting [ described condition or event ]".
Furthermore, in the description of the present application and the appended claims, the terms "first," "second," "third," and the like are used for distinguishing between descriptions and not necessarily for describing or implying relative importance.
Reference throughout this specification to "one embodiment" or "some embodiments," or the like, means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the present application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," or the like, in various places throughout this specification are not necessarily all referring to the same embodiment, but rather "one or more but not all embodiments" unless specifically stated otherwise. The terms "comprising," "including," "having," and variations thereof mean "including, but not limited to," unless expressly specified otherwise.
In the prior art, in the wireless charging process, if a metal foreign body exists in two coils, the metal foreign body can generate an eddy current effect due to an alternating magnetic field, and the metal foreign body can be heated due to the eddy current effect, so that the insecurity of the charging process is increased. The approach of the foreign metal absorbs a part of the magnetic energy, so that the inductance is reduced. Since the magnetic energy is absorbed by the metallic foreign matter, the inductance of the coil is decreased, and thus the quality factor in both coils is decreased.
That is, whether a metallic foreign object exists in the magnetic field region of the wireless charging coil can be judged by calculating the quality factor. The figure of merit is also calculated in relation to frequency, voltage, etc. Self-oscillation can be generated by a resonant network in the wireless charging coil circuit, and in the process of self-oscillation, a quality factor is calculated: the voltage at the highest point at the beginning of oscillation, a predetermined voltage value and the time of the node reaching the predetermined voltage value are calculated. In the self-oscillation process, the initial voltage can be easily detected by the built-in ADC, and at the moment, only one voltage value needs to be specified, so that the voltage value has sufficient time to reach the preset voltage value through the self-oscillation attenuation. However, there is more measurement interference on the measurement of the node time, and the larger interference directly causes the measurement error of the node time to increase, resulting in the accuracy of the quality factor to be reduced. Another method for calculating the quality factor at present is to multiply the node time in the formula by a fixed frequency, that is, the node time is the cycle number, that is, the cycle number is calculated, and the quality factor can be directly calculated, but the calculation of the cycle number requires accurate detection, otherwise, the measurement error of the cycle number becomes large, and the accuracy of the quality factor is reduced.
Based on this, the embodiment of the application discloses a quality factor detection circuit, a method, a device and an electronic device, which are used for improving the accuracy of quality factor detection.
The technical solutions in the present application will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present application, and it is obvious that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The method of the present application may be applied to a server, a device, a terminal, or other devices with logic processing capability, and the present application is not limited thereto. For convenience of description, the following description will be given taking the execution body as an example.
Referring to fig. 1 to 2, the present application provides an embodiment of a quality factor detection circuit, including:
the device comprises a waveform filtering circuit 1, a resonance circuit 2, a detection circuit 3, a power supply 4 and a main control circuit 5;
the power supply 4 is respectively connected with the resonance circuit 2 and the main control circuit 5;
the main control circuit 5 comprises a digital-to-analog converter ADC and a control chip, wherein the digital-to-analog converter ADC is used for analyzing a oscillogram transmitted by the detection circuit and transmitting an analysis result to the control chip, and the control chip is used for calculating a quality factor;
the waveform filtering circuit 1 includes a first diode D2, a second diode D3, a zener diode D1, and a resistor R1;
the resonant circuit 2 and the main control circuit 5, the resonant circuit 2 is used for forming a circuit self-oscillation signal;
a first end of the resistor R1 is connected to the resonant circuit 2;
a second end of the resistor R1 is connected to a cathode of the first diode D3, an anode of the second diode D2, and the detection circuit 3, respectively, and the detection circuit 3 is configured to receive the signal output after being processed by the waveform filtering circuit 1, and transmit the signal to the digital-to-analog converter ADC of the main control circuit 5;
the anode of the first diode D3 is connected to the cathode of the second diode D2 and the cathode of the zener diode D1 respectively;
the anode of the voltage stabilizing diode is grounded;
the cathode of the second diode is grounded;
the detection circuit 3 is connected with a main control circuit 5, the main control circuit 5 is used for controlling the resonance circuit 2 to form a self-oscillation signal, and the main control circuit 5 is also used for calculating a quality factor by using a control chip.
The main control circuit 5 is a collection of circuits including a control chip and a digital-to-analog converter ADC. One of the main functions of the main control circuit 5 is to control the resonant circuit 2 to generate resonance, and when the main control circuit 5 disconnects the control of the resonant circuit 2, the resonant circuit 2 starts self-oscillation, and the oscillation frequency is the self-oscillation frequency. The energy in the resonant circuit 2 is totally consumed in the circuit and converted into heat energy. The waveform filtering circuit 1 is used for filtering the resonant signal of the resonant circuit 2, transmitting the filtered signal to the detection circuit 3 for signal conversion, and transmitting the signal to the digital-to-analog converter ADC and the control chip in the control circuit 5 by the detection circuit 3 for voltage analysis and quality factor detection.
The waveform filtering circuit 1 includes a first diode D2, a second diode D3, a zener diode D1 and a resistor R1, and the connection mode is: the first end of the resistor R1 is connected to the resonant circuit 2, the second end of the resistor R1 is connected to the cathode of the first diode D3, the anode of the second diode D2, and the detection circuit 3 is configured to receive the signal output after being processed by the waveform filtering circuit 1, and transmit the signal to the digital-to-analog converter ADC of the main control circuit 5.
The waveform filter circuit 1 performs waveform filtering processing on a signal generated by self-oscillation of the resonant circuit 2 under the action of the circuit including the first diode D2, the second diode D3, the zener diode D1 and the resistor R1, so that negative parameters (valleys) in a waveform diagram are eliminated, and only positive parameters (peaks) which are easy to detect remain. The waveform filtering circuit 1 outputs the signal after waveform filtering to the detection circuit 3 for conversion, that is, the signal is transmitted to a digital-to-analog converter ADC and a control chip in the main control circuit 5 by the detection circuit 3 for voltage analysis and quality factor detection.
The following principle for detecting the quality factor using the number N of peaks is as follows:
assuming that a resistor, a capacitor and an inductor are connected in series in a circuit, if there is alternating current in the circuit, uCIs the capacitor voltage uRIs a resistance voltage uLIs the inductance voltage, C is the capacitance, L is the inductance, and R is the resistance. At this time, a constant is assumed
The self-oscillation frequency f and the angular velocity associated with the self-oscillation frequency f are assumed to be w0Then there is
Capacitor voltage uCThe general solution of (A) can be defined as uC＝AeptWhere A is a constant, p is an unknown, and t is time, then:
since the resonant circuit 2 is only resonant in the case of underdamping, it can be ascertained that p1And p2A pair of conjugate complex roots, the resonance U in the resonant circuit 20(t) can be expressed as:
wherein k is an unknown number, and needs to be solved and then assumed
For the unknown, a solution is required. Then the initial conditions are obtained
Then U is0Which is the value of the capacitor voltage at the beginning of the self-oscillation of the resonant network 2, can be measured by means of a digital-to-analog converter ADC in the main control circuit 5,
the capacitance voltage integral value at the self-oscillation starting time of the resonant network 2 is the resonance U in the circuit0(t) can be expressed as:
due to the fact that
And the figure of merit may be expressed as
Then there are:
wherein the content of the first and second substances,
because only the wave crest needs to be counted, the amplitude coefficient, namely the envelope expression can be taken, and the voltage u can be controlledCComprises the following steps:
due to w 02 pi fT, f isSelf-oscillation frequency, T is total duration, T is node time, then have:
since N ═ f × T, the quality Factor Q-Factor can also be expressed as:
due to the U in the above formulac、U0Can be calculated or measured according to a circuit, pi is constant, so that:
Q＝KN
at this moment, the quality factor can be calculated only by accurately calculating the number N of the wave crests through the main control circuit 5, and the embodiment of the application increases the accuracy of calculating the number of the periods, thereby improving the accuracy of detecting the quality factor.
Optionally, referring to fig. 2, the resonant network 2 includes a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q4, an inductor Lp, a capacitor Cp, a diode D1, a first diode, a second diode, a third diode, and a fourth diode;
the MOS tube Q1 is connected with the first diode through a source electrode and a drain electrode;
the MOS tube Q2 is connected with the second diode through a source electrode and a drain electrode;
the MOS tube Q3 is connected with a third diode through a source electrode and a drain electrode;
the MOS tube Q4 is connected with a fourth diode through a source electrode and a drain electrode;
the first end of the inductor Lp is respectively connected with the control circuit and the grid electrode of the MOS tube Q1;
a first end of the capacitor Cp is respectively connected with the source electrode of the MOS transistor Q2 and the drain electrode of the MOS transistor Q3;
the drain electrode of the MOS tube Q1 is connected with the drain electrode of the MOS tube Q2, and then is connected with the control circuit;
the source electrode of the MOS transistor Q3 and the source electrode of the MOS transistor Q4 are respectively grounded;
after the second end of the inductor Lp is connected with the second end of the capacitor Cp, the connection point of the second end of the inductor Lp and the second end of the capacitor Cp is connected with the diode D1;
the diode D1 is connected with a first resistor R1 of the filter circuit;
the control circuit is respectively connected with the grid of the MOS transistor Q1, the grid of the MOS transistor Q2, the grid of the MOS transistor Q3 and the grid of the MOS transistor Q4, and the control circuit is used for controlling the on and off of the MOS transistor Q1, the MOS transistor Q2, the MOS transistor Q3 and the MOS transistor Q4.
One of the functions of the main control circuit 4 is to control the on and off of the 4 MOS transistors, namely, the MOS transistor Q1, the MOS transistor Q2, the MOS transistor Q3 and the MOS transistor Q4.
When the gate of the MOS transistor Q4, Q1 in fig. 2 is turned on and the gate of the MOS transistor Q3, Q2 is turned off, a forward current is generated in the inductor Lp and the capacitor Cp in the resonant circuit 2; when the gate of the MOS transistor Q1, Q4 is turned off, and the gate of the MOS transistor Q2, Q3 is turned on, a reverse current is generated in Lp and Cp in the resonant circuit 2, and the AC signal generated by this alternating on process causes the resonant circuit 2 to start resonance. When the generation of the ac signal is stopped, the resonant circuit 2 starts the self-oscillation process, and the self-oscillation frequency is f, and the resonant energy in the resonant circuit 2 is completely consumed in the circuit thereof and converted into heat energy.
Referring to fig. 3, the present application provides an embodiment of a quality factor detection method, including:
301. generating a self-oscillation signal by using a resonance circuit;
302. wave trough elimination processing is carried out on a self-oscillation signal of a resonance circuit through a filter circuit, the wave form filter circuit comprises a first diode D2, a second diode D3, a voltage stabilizing diode D1 and a resistor R1, the resonance circuit is connected with a main control circuit, the resonance circuit is used for forming a circuit self-oscillation signal, a first end of the resistor R1 is connected with the resonance circuit, a second end of the resistor R1 is respectively connected with a negative electrode of a first diode D3, a positive electrode of a second diode D2 and a detection circuit, the detection circuit is used for receiving a signal output after being processed by the wave form filter circuit and transmitting the signal to a digital-to-analog converter (ADC) of the main control circuit, a positive electrode of the first diode D3 is respectively connected with a negative electrode of a second diode D2 and a negative electrode of the voltage stabilizing diode D1, a positive electrode of the voltage stabilizing diode is grounded, a negative electrode of the second diode is grounded, and the detection circuit is connected with the main control circuit;
303. the self-oscillation signal is subjected to signal conversion through the detection circuit and is transmitted to a digital-to-analog converter (ADC) in the main control circuit;
304. performing oscillogram analysis on the converted self-oscillation signal through a digital-to-analog converter (ADC) in the control circuit, and calculating the number of wave crests of the oscillogram corresponding to the self-oscillation signal;
305. and calculating the quality factor through a control chip in the control circuit according to the number of the wave crests.
Referring to fig. 4, the present application provides an embodiment of a quality factor detection apparatus, including:
a generation unit 401 for generating a self-oscillation signal using a resonance circuit;
the elimination unit 402 is used for performing wave trough elimination processing on a self-oscillation signal of the resonant circuit through the filter circuit, the wave form filter circuit comprises a first diode D2, a second diode D3, a voltage stabilizing diode D1 and a resistor R1, the resonant circuit is connected with the main control circuit and is used for forming a circuit self-oscillation signal, a first end of the resistor R1 is connected with the resonant circuit, a second end of the resistor R1 is respectively connected with a negative electrode of the first diode D3, a positive electrode of the second diode D2 and a detection circuit, the detection circuit is used for receiving a signal output after the wave form filter circuit processing, the voltage is transmitted to a digital-to-analog converter ADC of the main control circuit, the anode of a first diode D3 is respectively connected with the cathode of a second diode D2 and the cathode of a voltage stabilizing diode D1, the anode of the voltage stabilizing diode is grounded, the cathode of the second diode is grounded, and the detection circuit is connected with the main control circuit;
a conversion unit 403, configured to perform signal conversion on the self-oscillation signal through the detection circuit, and transmit the signal to a digital-to-analog converter ADC in the main control circuit;
an analyzing unit 404, configured to perform a waveform analysis on the converted self-oscillation signal through a digital-to-analog converter ADC in the control circuit, and calculate the number of peaks of a waveform corresponding to the self-oscillation signal;
and the detection unit 405 is used for calculating the quality factor according to the number of the wave crests by a control chip in the control circuit.
Referring to fig. 5, the present application provides an electronic device, including:
a processor 501, a memory 502, an input-output unit 503, and a bus 504.
The processor 501 is connected to a memory 502, an input-output unit 503, and a bus 504.
The memory 502 holds a program that the processor 501 calls to perform a figure of merit detection method as in fig. 3.
The present application provides a computer-readable storage medium having a program stored thereon, the program, when executed on a computer, performs a method of figure 3 for figure 3 quality factor detection.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application may be substantially implemented or contributed to by the prior art, or all or part of the technical solution may be embodied in a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a read-only memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and the like.
Claims (5)
1. A quality factor detection circuit, comprising:
the device comprises a waveform filtering circuit, a resonance circuit, a detection circuit, a power supply and a main control circuit;
the power supply is respectively connected with the resonance circuit and the main control circuit;
the main control circuit comprises a digital-to-analog converter (ADC) and a control chip, wherein the ADC is used for analyzing a oscillogram transmitted by the detection circuit and transmitting an analysis result to the control chip, and the control chip is used for calculating a quality factor;
the waveform filtering circuit comprises a first diode D2, a second diode D3, a zener diode D1 and a resistor R1;
the resonant circuit is connected with the main control circuit and is used for forming a circuit self-oscillation signal;
a first end of the resistor R1 is connected with the resonant circuit;
a second end of the resistor R1 is connected to a cathode of the first diode D3, an anode of the second diode D2, and the detection circuit, respectively, and the detection circuit is configured to receive the signal output by the waveform filtering circuit and transmit the signal to the digital-to-analog converter ADC of the main control circuit;
the anode of the first diode D3 is connected to the cathode of the second diode D2 and the cathode of the zener diode D1 respectively;
the anode of the voltage stabilizing diode is grounded;
the cathode of the second diode is grounded;
the detection circuit is connected with the main control circuit, the main control circuit is used for controlling the resonance circuit to form a self-oscillation signal, and the main control circuit is also used for calculating the quality factor by using the control chip.
2. The detection circuit according to claim 1, wherein the resonant circuit comprises a MOS transistor Q1, a MOS transistor Q2, a MOS transistor Q3, a MOS transistor Q4, an inductor Lp, a capacitor Cp, a diode D1, a first diode, a second diode, a third diode and a fourth diode;
the MOS tube Q1 is connected with the first diode through a source electrode and a drain electrode;
the MOS tube Q2 is connected with the second diode through a source electrode and a drain electrode;
the MOS tube Q3 is connected with the third diode through a source electrode and a drain electrode;
the MOS tube Q4 is connected with the fourth diode through a source electrode and a drain electrode;
the first end of the inductor Lp is respectively connected with the control circuit and the gate of the MOS transistor Q1;
a first end of the capacitor Cp is respectively connected with a source electrode of the MOS transistor Q2 and a drain electrode of the MOS transistor Q3;
the drain electrode of the MOS tube Q1 is connected with the drain electrode of the MOS tube Q2, and then is connected with the control circuit;
the source electrode of the MOS transistor Q3 and the source electrode of the MOS transistor Q4 are respectively grounded;
after the second end of the inductor Lp is connected with the second end of the capacitor Cp, a connection point between the second end of the inductor Lp and the second end of the capacitor Cp is connected with the diode D1;
the diode D1 is connected with the first resistor R1 of the filter circuit;
the control circuit is respectively connected with the gate of the MOS transistor Q1, the gate of the MOS transistor Q2, the gate of the MOS transistor Q3 and the gate of the MOS transistor Q4, and the control circuit is used for controlling the on and off of the MOS transistor Q1, the MOS transistor Q2, the MOS transistor Q3 and the MOS transistor Q4.
3. A method for quality factor detection, comprising:
generating a self-oscillation signal by using a resonance circuit;
the wave trough elimination processing is carried out on the self-oscillation signal of the resonant circuit through a filter circuit, the wave form filter circuit comprises a first diode D2, a second diode D3, a voltage stabilizing diode D1 and a resistor R1, the resonant circuit is connected with the main control circuit, the resonant circuit is used for forming a circuit self-oscillation signal, a first end of the resistor R1 is connected with the resonant circuit, a second end of the resistor R1 is respectively connected with a negative electrode of the first diode D3, a positive electrode of the second diode D2 and the detection circuit, the detection circuit is used for receiving the signal output after being processed by the wave form filter circuit and transmitting the signal to the digital-to-analog converter ADC of the main control circuit, a positive electrode of the first diode D3 is respectively connected with a negative electrode of the second diode D2 and a negative electrode of the voltage stabilizing diode D1, and a positive electrode of the voltage stabilizing diode is grounded, the cathode of the second diode is grounded, and the detection circuit is connected with the main control circuit;
the self-oscillation signal is subjected to signal conversion through the detection circuit and is transmitted to a digital-to-analog converter (ADC) in the main control circuit;
performing oscillogram analysis on the converted self-oscillation signal through a digital-to-analog converter (ADC) in the control circuit, and calculating the number of wave crests of the oscillogram corresponding to the self-oscillation signal;
and calculating the quality factor through a control chip in the control circuit according to the number of the wave crests.
4. An apparatus for detecting quality factor, comprising:
a generation unit configured to generate a self-oscillation signal using a resonance circuit;
the elimination unit is used for eliminating wave troughs of self-oscillation signals of the resonant circuit through a filter circuit, the wave form filter circuit comprises a first diode D2, a second diode D3, a voltage stabilizing diode D1 and a resistor R1, the resonant circuit is connected with the main control circuit, the resonant circuit is used for forming circuit self-oscillation signals, a first end of the resistor R1 is connected with the resonant circuit, a second end of the resistor R1 is respectively connected with a negative electrode of the first diode D3, a positive electrode of the second diode D2 and the detection circuit, the detection circuit is used for receiving signals output after being processed by the wave form filter circuit and transmitting the signals to the digital-to-analog converter ADC of the main control circuit, a positive electrode of the first diode D3 is respectively connected with a negative electrode of the second diode D2 and a negative electrode of the voltage stabilizing diode D1, the anode of the voltage stabilizing diode is grounded, the cathode of the second diode is grounded, and the detection circuit is connected with the main control circuit;
the conversion unit is used for performing signal conversion on the self-oscillation signal through the detection circuit and transmitting the signal to a digital-to-analog converter (ADC) in the main control circuit;
the analysis unit is used for analyzing the waveform diagram of the converted self-oscillation signal through a digital-to-analog converter (ADC) in the control circuit and calculating the number of wave crests of the waveform diagram corresponding to the self-oscillation signal;
and the detection unit is used for calculating the quality factor through a control chip in the control circuit according to the number of the wave crests.
5. An electronic device, comprising:
the device comprises a processor, a memory, an input and output unit and a bus;
the processor is connected with the memory, the input and output unit and the bus;
the memory holds a program that the processor calls to execute a method of quality factor detection according to any one of claim 4.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111391546.0A CN114252702A (en) | 2021-11-23 | 2021-11-23 | Quality factor detection circuit, method and device and electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111391546.0A CN114252702A (en) | 2021-11-23 | 2021-11-23 | Quality factor detection circuit, method and device and electronic equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114252702A true CN114252702A (en) | 2022-03-29 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111391546.0A Pending CN114252702A (en) | 2021-11-23 | 2021-11-23 | Quality factor detection circuit, method and device and electronic equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114252702A (en) |
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2021
- 2021-11-23 CN CN202111391546.0A patent/CN114252702A/en active Pending
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