CN114240905A

CN114240905A - Detection method, detection system, and non-volatile computer-readable storage medium

Info

Publication number: CN114240905A
Application number: CN202111568203.7A
Authority: CN
Inventors: 田向阳; 刘楚枫
Original assignee: Shenzhen Ruyuan Fuyong Zhizao Technology Co ltd
Current assignee: Shenzhen Ruyuan Fuyong Zhizao Technology Co ltd
Priority date: 2021-12-21
Filing date: 2021-12-21
Publication date: 2022-03-25
Anticipated expiration: 2041-12-21
Also published as: CN114240905B

Abstract

The application discloses a detection method of drying equipment, a detection system of the drying equipment and a nonvolatile computer readable storage medium. The detection method comprises the following steps: obtaining a spot pattern, the spot pattern being an image of a spot formed by radiation emitted by the radiation structure; carrying out binarization processing on the speckle pattern to obtain a brightness distribution map; determining a radiation center and a plurality of radiation areas in a spot diagram according to a brightness distribution diagram and radiation source distribution conditions, wherein each radiation area corresponds to one radiation source, and the radiation source distribution conditions are the arrangement mode of the plurality of radiation sources in a radiation structure; and acquiring a radiation value of the radiation area, and determining whether the radiation structure is qualified according to the radiation value. The detection method, the detection system and the nonvolatile computer readable storage medium in the embodiment of the application can acquire the spot diagram corresponding to the radiation emitted by the drying equipment, and can determine a plurality of radiation areas corresponding to the radiation sources on the spot diagram. Thus, it can be determined whether the radiation structure of the drying apparatus is qualified or not according to the radiation value of the radiation area.

Description

Detection method, detection system, and non-volatile computer-readable storage medium

Technical Field

The present disclosure relates to the field of drying technologies, and in particular, to a method and a system for detecting a drying device and a non-volatile computer-readable storage medium.

Background

Conventional drying devices generally use resistance wires to heat the air flow sucked by the motor, and then blow out the air flow to heat the target and the surrounding air, thereby achieving the purpose of drying the target. The heat actually applied to the target object in this way is not large, and energy consumption is wasted. A plurality of drying equipment adopt the radiation source to replace traditional heater (such as resistance wire), utilize the thermal radiation principle to carry out heat-conduction, then can make most heat energy directly pass through on the mode of thermal radiation transmits target object and the moisture around, reduce unnecessary energy loss. The conventional optical detection equipment generally has high response precision to the visible light wave band, and the precision is reduced along with the entering of the wavelength into the infrared wave band, so that the detection of the radiation source is inaccurate. Therefore, a reliable detection method is needed to detect the light intensity of the radiation source, especially the intensity of infrared light, to determine whether the light intensity of the radiation source meets the drying requirement, so as to screen out qualified drying equipment.

Disclosure of Invention

The embodiment of the application provides a detection method of drying equipment, a detection system of the drying equipment and a nonvolatile computer readable storage medium.

The detection method of the embodiment of the application comprises the following steps: acquiring a spot pattern, wherein the spot pattern is an image of a spot formed in the visible light waveband; detecting the integrity of the light spots according to the light spot graph; under the condition that the light spot is complete, acquiring the visible light intensity of the visible light wave band according to the light spot pattern; acquiring the total light intensity of the preset spectrum according to the visible light intensity and the proportion of the visible light wave band in the preset spectrum; and acquiring the infrared light intensity according to the total light intensity and the visible light intensity.

The detection system of the embodiment of the application comprises a detection device and a processor. The processor is used for realizing a detection method of the drying equipment, and the detection method of the drying equipment comprises the following steps: acquiring a spot pattern, wherein the spot pattern is an image of a spot formed in the visible light waveband; detecting the integrity of the light spots according to the light spot graph; under the condition that the light spot is complete, acquiring the visible light intensity of the visible light wave band according to the light spot pattern; acquiring the total light intensity of the preset spectrum according to the visible light intensity and the proportion of the visible light wave band in the preset spectrum; and acquiring the infrared light intensity according to the total light intensity and the visible light intensity.

A non-transitory computer-readable storage medium containing a computer program of an embodiment of the present application, which, when executed by one or more processors, causes the processors to implement the detection method of a drying apparatus of an embodiment of the present application. The detection method comprises the following steps: acquiring a spot pattern, wherein the spot pattern is an image of a spot formed in the visible light waveband; detecting the integrity of the light spots according to the light spot graph; under the condition that the light spot is complete, acquiring the visible light intensity of the visible light wave band according to the light spot pattern; acquiring the total light intensity of the preset spectrum according to the visible light intensity and the proportion of the visible light wave band in the preset spectrum; and acquiring the infrared light intensity according to the total light intensity and the visible light intensity.

The detection method, the detection system and the nonvolatile computer readable storage medium in the embodiment of the application can acquire a spot pattern of a spot formed by radiation emitted by a radiation structure of drying equipment, and can determine a plurality of radiation areas corresponding to a radiation source in the spot pattern. Therefore, whether the corresponding radiation source is qualified or not can be detected according to the radiation value of the radiation area, and whether the whole radiation structure is qualified or not can be detected according to the total radiation value of each radiation area, so that whether the radiation structure of the drying equipment is qualified or not is comprehensively judged, and the qualified drying equipment is screened out.

Additional aspects and advantages of embodiments of the present application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the present application.

Drawings

The above and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:

FIG. 1 is a schematic block diagram of a drying apparatus according to certain embodiments of the present application;

FIG. 2 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 3 is a schematic diagram of a detection system of a drying apparatus according to certain embodiments of the present application;

FIG. 4 is a schematic illustration of a pattern of spots for certain embodiments of the present application;

FIG. 5 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 6 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 7 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 8 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 9 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 10 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 11 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 12 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 13 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 14 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 15 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 16 is a schematic flow diagram of a method of testing a drying apparatus according to certain embodiments of the present application;

FIG. 17 is a schematic diagram of a connection between a computer-readable storage medium and a processor according to some embodiments of the present application.

Detailed Description

Reference will now be made in detail to embodiments of the present application, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below by referring to the drawings are exemplary only for the purpose of explaining the embodiments of the present application, and are not to be construed as limiting the embodiments of the present application.

Referring to fig. 1, the present embodiment provides a drying apparatus 200. The drying apparatus 200 comprises a radiation structure 210, the radiation structure 210 comprising a plurality of radiation sources 211. The drying apparatus 200 serves to dry moisture, and in particular, the drying apparatus 200 dries moisture on an object by emitting heat radiation from the radiation source 211. In some application scenarios, the drying apparatus 200 may also be used for radiant exothermic heating. The drying device 200 may be a blower, a body dryer, a hand dryer, a bathroom warmer, etc., which are not listed here.

In certain embodiments, the radiation source 211 is an infrared radiation source that effects the transfer of thermal radiation by emitting infrared rays/beams having a predetermined energy. Wherein the energy of the radiation source 211 can be regulated by setting the operating power of the radiation source 211 to a predetermined energy. Further, in one embodiment, the radiation source 211 is a halogen lamp, and the radiation structure 210 is a halogen lamp group formed by combining a plurality of halogen lamps according to a predetermined arrangement. Under the conditions that the power of a single halogen lamp has an upper limit and the radiation capacity is limited, the radiation capacity of the whole halogen lamp group consisting of a plurality of halogen lamps can exceed the upper limit of the radiation capacity of the single halogen lamp, so that the halogen lamp group has stronger radiation capacity and can accelerate the drying speed. And, the irradiation range of the halogen lamp group can be controlled by adjusting the angle of each halogen lamp in the halogen lamp group to transmit the heat radiation into a predetermined irradiation range.

The drying apparatus 200 mainly performs drying by the heat radiation generated by the radiation structure 210, and if the heat radiation generated by the radiation structure 210 does not meet a preset standard, it is difficult to achieve a desired drying effect, i.e., the radiation structure 210 is not qualified, and accordingly, the drying apparatus 200 equipped with the radiation structure 210 is not qualified.

Referring to fig. 2, the present application provides a method for detecting a drying apparatus 200, which is used to determine whether a radiation structure 210 is qualified, so as to remove unqualified and defective products and screen out qualified and defective products. The detection method of the embodiment of the application comprises the following steps:

01: acquiring a light spot pattern, wherein the light spot pattern is an image of a light spot formed in a visible light wave band;

02: detecting the integrity of the light spots according to the light spot image;

03: under the condition that the light spots are complete, acquiring the visible light intensity of a visible light wave band according to a light spot graph;

04: acquiring the total light intensity of the preset spectrum according to the visible light intensity and the proportion of the visible light wave band in the preset spectrum; and

05: and acquiring the infrared light intensity according to the total light intensity and the visible light intensity.

Referring to fig. 3, the present embodiment further provides a detection system 1000 of the drying apparatus 200, and the detection method of the present embodiment can be applied to the detection system 1000 of the drying apparatus 200. The detection system 1000 of the drying apparatus 200 includes the detection device 100 and the processor 501. In one embodiment, the processor 501 is disposed within the detection device 100; in another embodiment, the inspection system 1000 includes an industrial control device 500, the processor 501 is disposed in the industrial control device 500, and the industrial control device 500 is connected to the inspection apparatus 100 for controlling the inspection apparatus 100 to perform inspection. Processor 501 may implement the methods in

steps

01, 02, 03, 04, and 05. That is, processor 501 may be configured to: obtaining a pattern of spots formed by radiation emitted by the radiation structure 210; detecting the integrity of the light spots according to the light spot image; under the condition that the light spots are complete, acquiring the visible light intensity of a visible light wave band according to a light spot graph; acquiring the total light intensity of the preset spectrum according to the visible light intensity and the proportion of the visible light wave band in the preset spectrum; and acquiring the infrared light intensity according to the total light intensity and the visible light intensity.

Referring to fig. 3, in some embodiments, the detection apparatus 100 includes a power supply module 10, a fixing module 20, a light equalizing module 30, a filtering module 40, a photosensitive element 60, and an image sensor 70, which are sequentially disposed. Wherein the power supply module 10 is used for supplying power to the radiation structure 210. The fixing module 20 is used to fix the radiation structure 210. The light homogenizing module 30 is used for receiving the radiation emitted by the radiation structure 210 to form a light spot. The filtering module 40 is used for filtering light so that the radiation light with a predetermined wavelength band is incident to the light-equalizing module 30. The photosensitive element 60 is used to photograph a light spot. The image processor 501 is configured to acquire a spot pattern from the light spots captured by the light sensing element 60.

Referring to fig. 3, in some embodiments, the drying detection system 1000 further includes a loading device 80, and the loading device 80 is used for mounting the radiation structure 210 on the fixing module 20. In one embodiment, the feeding device includes a pneumatic structure, and the power supply module 10 and the fixing module 20 in the detection device 100 are driven by the pneumatic structure to automatically complete the fixing and power supply operations, thereby avoiding misoperation caused by manual feeding.

In some embodiments, the light homogenizing module 30 is a light homogenizing plate, and the light emitted from the radiation source 211 of the drying apparatus 200 is irradiated on the light homogenizing plate to form a diffuse reflection, so as to generate a stable light spot. The shape of the formed light spot can be adjusted by changing the shape of the light homogenizing plate.

In some embodiments, the filter module 40, the photosensitive element 60 and the image sensor 70 are independent devices, and can be detached individually for maintenance and replacement, and for selecting the corresponding type of the filter module 40, the photosensitive element 60 or the image sensor 70 according to the type of the radiation structure 210 of the drying apparatus 200.

The model of the radiation source 211 is a known model, and then the radiation wavelength band corresponding to the model is also known, and the filtering module 40 corresponding to the model of the radiation source 211 can be selected to filter, so that the radiation light in the measurement wavelength band passes through the filtering module 40, and the light in the non-measurement wavelength band is filtered.

It should be noted that, in some embodiments, the drying apparatus 200 may include only a single radiation source 211, and the detection method of the embodiments of the present application may be applied to the drying apparatus 200 including only a single radiation source 211.

Referring to fig. 3, the radiation emitted from the radiation structure 210 forms a light spot on the light-equalizing module 30. The photosensitive element 60 captures a light spot and the image sensor 70 generates a light spot pattern, and the processor 501 acquires the light spot pattern generated by the image sensor 70 and determines the radiation condition of the radiation structure 210 according to the light spot pattern. The radiation emitted by the radiation source 211 is essentially radiation light, and the higher the energy of the radiation light, the higher the brightness of the light spot formed by the light-equalizing module 30, so that the radiation intensity of the radiation source 211 can be indirectly determined by detecting the brightness of the light spot to judge whether the radiation source 211 is qualified.

Specifically, the preset spectrum of the radiation source 211 includes a visible light band and an infrared light band, that is, the radiation emitted by the radiation source 211 according to the preset spectrum includes radiation in the visible light band and radiation in the infrared light band. The drying apparatus 200 mainly relies on the object to evaporate moisture by increasing the temperature after absorbing radiation in the infrared band emitted from the radiation source 211 to perform a drying function. Therefore, if the radiation intensity of the infrared band emitted by the radiation source 211 can be obtained, it can be determined whether the radiation intensity emitted by the radiation source 211 can meet the drying requirement of the drying device 200, so as to determine whether the drying device 200 is qualified.

Referring to fig. 1 to 3, in the embodiment of the present application, the photosensitive element 60 captures radiation emitted by the radiation source 211 to form a light spot on the light equalizing module 30 to obtain a light spot pattern. Since the light spot is formed by visible light, the visible light intensity in the visible light band of the preset spectrum of the radiation source 211 can be determined according to the light spot pattern. Because the preset spectrum is known, that is, the ratio of the visible light band and the infrared light band in the preset spectrum is known, the total light intensity of the preset spectrum can be calculated according to the visible light intensity and the proportion of the visible light band in the preset spectrum, and the total light intensity is the sum of the visible light intensity corresponding to the radiation of the visible light band and the infrared light intensity corresponding to the radiation of the infrared light band. Further, the visible light intensity is subtracted from the total light intensity to obtain the infrared light intensity.

Referring to fig. 4, fig. 4 illustrates a spot pattern obtained in an embodiment. After acquiring the spot pattern, the integrity of the spot in the spot pattern is first detected. Referring to fig. 1, the radiation structure 210 includes a plurality of radiation sources 211, and if each radiation source 211 is qualified, a complete spot corresponding to each radiation source 211 can be detected in the spot diagram. That is, if there is an incomplete light spot in the light spot pattern, it indicates that there may be a defect in the radiation source 211 corresponding to the incomplete light spot, and it is determined that the drying apparatus is not qualified without performing subsequent detection. And under the condition that the light spots in the light spot pattern are complete, executing the

methods

03, 04 and 05 to obtain the infrared light intensity so as to judge whether the drying equipment is qualified or not according to the infrared light intensity.

As will be further explained below in conjunction with the drawings,

referring to fig. 5, in some embodiments, 04: according to the visible light intensity and the proportion of the visible light wave band in the preset spectrum, the method comprises the following steps:

041: acquiring a response waveband of the photosensitive element 60;

042: acquiring the proportion of the response wave band in a preset spectrum; and

043: and taking the proportion of the response waveband in the preset spectrum as the proportion of the visible waveband in the preset spectrum.

Referring to fig. 3, in some embodiments, processor 501 may implement the methods in

steps

041, 042 and 043. That is, processor 501 may be configured to: acquiring a response waveband of the photosensitive element; acquiring the proportion of the response wave band in a preset spectrum; and taking the proportion of the response waveband in the preset spectrum as the proportion of the visible waveband in the preset spectrum.

Since "visible" of the "visible light band" is visible with respect to the human eye, and the device actually taking a spot is the light sensing element 60, the cut-off band of the light sensing element 60 is not necessarily the same as the visible light range visible to the human eye. In one embodiment, the cut-off wavelength band of the photosensitive element 60 covers the visible wavelength band of the human eye, i.e., the visible light range visible to the human eye is within the wavelength band that the photosensitive element can capture. The predetermined spectrum actually includes a portion of the visible light band that is not visible to human eyes, in addition to the "visible light band" visible to human eyes, and this portion of the visible light band can be measured by the photosensitive element 60 to obtain a more accurate total light intensity when calculating the total light intensity.

Referring to fig. 6, in some embodiments, 01: obtaining a speckle pattern comprising:

011: acquiring a high conversion rate interval, wherein the high conversion rate interval is a corresponding waveband interval under the condition that the photosensitive element has high photoelectric conversion efficiency; and

012: and filtering light rays by adopting a filtering module according to the high conversion rate interval, so that the photosensitive element generates a light spot pattern according to the light rays with the wave band in the high conversion rate interval.

Referring to fig. 3, in some embodiments, the processor 501 may implement the methods of

steps

011 and 012. That is, processor 501 may be configured to: and obtaining a high conversion rate interval, and filtering light rays by adopting a filtering module according to the high conversion rate interval, so that the photosensitive element generates a light spot pattern according to the light rays of the wave band in the high conversion rate interval.

Therefore, errors generated by the participation of the light intensity obtained from the low conversion rate interval in the calculation can be eliminated, and the calculation of the total light intensity is more accurate.

Specifically, the photoelectric conversion rate (or Quantum Efficiency) is the sensitivity of the photosensitive element 60 to light, and the photoelectric conversion rates of the photosensitive element 60 to the respective bands in the response band are not completely the same, and generally, the closer to the edge of the response band, the lower the photoelectric conversion rate, and only these bands can be theoretically detected, but the accuracy is lower, so that there are a high conversion rate interval with a higher photoelectric conversion rate and a low conversion rate interval with a lower photoelectric conversion rate, the more accurate the light intensity detected in the high conversion rate interval, and the greater the deviation between the light intensity detected in the low conversion rate interval and the actual light intensity, and the lower the reliability. Moreover, because most of the light intensity can be detected in the high conversion rate interval, the light intensity detected in the low conversion rate interval can be discarded, so that the accuracy of calculating the total light intensity is prevented from being influenced by errors.

For example, the visible light band occupies 1/4 of the total band of the predetermined spectrum, the ratio of the high conversion interval to the low conversion interval is 7:3, and the error ratio of the low conversion interval is 30%, that is, the error ratio of the visible light band is 0.3 × 30% =9%, but in this embodiment, the total band needs to be calculated according to the ratio of the visible light band, so if the total light intensity is calculated by using the high conversion interval and the low conversion interval, the error ratio of the total light intensity will reach 4 × 9% =36%, and the deviation from the true value is large. Therefore, the embodiment of the application generates the spot pattern only according to the light in the high conversion rate interval, and although the collected wave band is reduced, the embodiment is equivalent to reducing the sampling interval, and avoids mixing data with larger errors so as to reduce the errors.

Referring to fig. 3, specifically, the cut-off band of the filtering module 40 is set according to the high conversion rate interval, so that the filtering module 40 can filter the light in the low conversion rate interval, and only the light emitting line in the high conversion rate interval enters the photosensitive element, so as to reduce the error.

Referring to fig. 7, in some embodiments, 03: obtaining the visible light intensity of the visible light wave band according to the facula pattern, and further comprising:

031: carrying out binarization processing on the spot diagram to obtain a brightness distribution diagram;

032: determining a radiation center and a plurality of radiation areas in a spot diagram according to a brightness distribution diagram and radiation source distribution conditions, wherein each radiation area corresponds to one radiation source, and the radiation source distribution conditions are the arrangement mode of the plurality of radiation sources in a radiation structure; and

033: and acquiring the radiation value of the radiation area as the visible light intensity.

Referring to fig. 3, in some embodiments, the processor 501 may implement the methods in

steps

031, 032 and 033. That is, processor 501 may be configured to: carrying out binarization processing on the spot diagram to obtain a brightness distribution diagram; determining a radiation center and a plurality of radiation areas in a spot diagram according to a brightness distribution diagram and radiation source distribution conditions, wherein each radiation area corresponds to one radiation source, and the radiation source distribution conditions are the arrangement mode of the plurality of radiation sources in a radiation structure; and acquiring the radiation value of the radiation area as the visible light intensity.

Specifically, in an embodiment, after the binarization processing is performed on the speckle pattern, a gray scale map of the speckle pattern is obtained, and if black in the gray scale map is defined as a "0" value and white is defined as a "255" value, in the gray scale map of the speckle pattern, a region with a larger gray scale value represents a region with a larger brightness, and the brightness is positively correlated with the radiation intensity, so that a region with a larger gray scale value in the brightness distribution map represents a region with a larger radiation intensity. The visible light intensity corresponding to the radiation source 211 corresponding to the light spot can be determined by determining the gray value of the area where the light spot is located.

Further, if the speckle pattern is an image of a light spot formed by radiation emitted by one radiation source 211 in the radiation structure 210, the intensity of the visible light corresponding to the radiation source 211 can be detected according to the brightness distribution map corresponding to the speckle pattern. If the speckle pattern is an image of a speckle formed by the radiation emitted by the two radiation sources 211 in the radiation structure 210, the intensity of the visible light corresponding to the two radiation sources 211 can be detected according to the brightness distribution map corresponding to the speckle pattern. Further, if the speckle pattern is an image of a speckle formed by the radiation emitted by all the radiation sources 211 in the radiation structure 210, the intensity of the visible light corresponding to the whole radiation structure 210 can be detected according to the brightness distribution map corresponding to the speckle pattern.

In order to improve the detection efficiency, the spots corresponding to all the radiation sources 211 of one radiation structure 210 may be presented on the same spot pattern. In one embodiment, all the radiation sources 211 of the radiation structure 210 emit light simultaneously, and the photosensitive element 60 captures all the light spots on the light-equalizing module 30 to obtain a light spot pattern, which includes the light spots corresponding to all the radiation sources 211. In another embodiment, the radiation sources 211 of the radiation structure 210 emit light sequentially, and the photosensitive element 60 collects light spots formed on the light-equalizing module 30 by the radiation emitted by each radiation source 211 sequentially, and the image processor 501 synthesizes the sequentially-collected light spots to be displayed on the same light spot pattern.

The visible light intensity of the whole radiation structure 210 can be determined according to the brightness distribution diagram corresponding to the spot diagram. In addition, in combination with the distribution of the radiation sources 211 in the radiation structure 210, the corresponding relationship between each spot on the spot diagram and each radiation source 211 can be correspondingly determined, so that the visible light intensity corresponding to each radiation source 211 can be accurately obtained according to the radiation value of the spot corresponding to each radiation source 211.

Referring to fig. 4, specifically, a radiation center and a plurality of radiation areas can be determined in the optical spot pattern according to the brightness distribution map and the distribution of the radiation sources 211, so as to further distinguish the areas corresponding to the radiation sources 211 on the optical spot pattern, that is, the radiation areas corresponding to each radiation source 211. The radiation center is a point where the light (radiation) emitted by the radiation structure 210 is concentrated, and the radiation area is an area corresponding to a light spot formed on the light-equalizing module 30 by the radiation emitted by the corresponding radiation source 211.

As shown in fig. 4, as an example, the radiation center a1 and 6 radiation areas are determined on the spot map P1: s1, S2, S3, S4, S5, and S6. The radiation zones are sectors separated by dashed lines in fig. 4. The brightness distribution diagram is a gray scale diagram obtained by performing binarization processing on the spot diagram P1, and the gray scale distribution condition in the brightness distribution diagram is the brightness distribution condition of the corresponding position on the spot diagram P1.

In some embodiments, since the brightness of the light spot is in positive correlation with the visible light intensity, the gray value of the corresponding region of the irradiation region on the brightness distribution map can be used as the irradiation value of the irradiation region. Furthermore, statistics of gray values such as an average gray value, a median gray value, and a gray value variance of a region corresponding to the radiation region on the luminance distribution map may be used as the radiation value of the radiation region, which is not listed here. Thus, the visible light intensity corresponding to the radiation area, that is, the visible light intensity of the radiation source 211 corresponding to the radiation area, can be obtained according to the radiation value of the radiation area or the gray value of the corresponding area of the radiation area on the brightness distribution map.

Referring to fig. 8, in some embodiments, 04: obtain the total light intensity of predetermineeing the spectrum according to the proportion of visible light intensity and visible light wave band in predetermineeing the spectrum, still include:

044: acquiring a preset relation, wherein the preset relation is a distribution relation of a visible light wave band in a preset spectrum;

045: acquiring a light intensity coefficient according to a preset relation, wherein the light intensity coefficient represents the proportion of a visible light wave band in a preset spectrum; and

046: and acquiring the total light intensity according to the visible light intensity and the light intensity coefficient.

Referring to fig. 3, in some embodiments, the processor 501 may further implement the methods in

steps

044, 045, and 046. That is, processor 501 may be configured to: acquiring a preset relation, wherein the preset relation is a distribution relation of a visible light wave band in a preset spectrum; acquiring a light intensity coefficient according to a preset relation, wherein the light intensity coefficient represents the proportion of a visible light wave band in a preset spectrum; and acquiring the total light intensity according to the visible light intensity and the light intensity coefficient.

The preset relationship is the distribution relationship of the visible light wave band in the preset spectrum, the light intensity coefficient represents the proportion of the visible light wave band in the preset spectrum, for example, the light intensity coefficient is 0.2, and the representation visible light wave band represents 20% of the total wave band of the preset spectrum.

With reference to fig. 4 to 7, after the visible light intensity is obtained according to the radiation value of the radiation area, the total light intensity corresponding to the radiation area can be obtained according to the visible light intensity and the light intensity coefficient. That is, the radiation value of the radiation area in the speckle pattern can only reflect the light intensity of the corresponding radiation source 211 in the visible light band, and the total light intensity calculated according to the visible light intensity can reflect the total radiation value of the radiation emitted by the radiation source 211 according to the preset spectrum.

Further, the infrared light intensity corresponding to the radiation area can be calculated according to the total light intensity corresponding to the radiation area, so that whether the radiation structure is qualified or not can be determined according to the infrared light intensity.

Referring to FIG. 9, in some embodiments, the step 05 of obtaining the infrared intensity according to the total intensity and the visible intensity comprises:

051: the difference between the total intensity and the visible intensity was taken as the infrared intensity.

The detection method further comprises the following steps:

06: and determining whether the radiation structure is qualified or not according to the infrared light intensity.

Referring to fig. 3, in some embodiments, the processor 501 may also implement the methods in

steps

051 and 06. That is, processor 501 may be configured to: taking the difference value of the total light intensity and the visible light intensity as the infrared light intensity; and determining whether the radiation structure is qualified or not according to the infrared light intensity.

That is, the total light intensity is the sum of the visible light intensity and the infrared light intensity, and the infrared light intensity corresponding to the radiation region can be obtained by subtracting the visible light intensity from the total light intensity.

Further, referring to fig. 10, in some embodiments, 06: determining whether the radiation structure is acceptable according to the intensity of the infrared light, comprising:

061: acquiring a preset first radiation threshold, and determining whether a radiation source corresponding to each radiation area is qualified or not according to the infrared intensity of each radiation area and the first radiation threshold;

062: acquiring the infrared light intensity of a total radiation area according to the total light intensity of each radiation area, wherein the total radiation area is an area formed by each radiation area; and

063: and acquiring a preset second radiation threshold, and determining whether the radiation structure is qualified or not according to the infrared intensity of the total radiation area and the second radiation threshold.

steps

061, 062, and 063. That is, processor 501 may be configured to: acquiring a preset first radiation threshold, and determining whether a radiation source corresponding to each radiation area is qualified or not according to the infrared intensity of each radiation area and the first radiation threshold; acquiring the infrared light intensity of a total radiation area according to the total light intensity of each radiation area, wherein the total radiation area is an area formed by each radiation area; and acquiring a preset second radiation threshold value, and determining whether the radiation structure is qualified according to the infrared intensity of the total radiation area and the second radiation threshold value.

Referring to fig. 4, the total radiation area is an area formed by each radiation area of the spot pattern. For example, fig. 4 illustrates a spot diagram including 6 radiation zones: s1, S2, S3, S4, S5, and S6, 6 radiation regions collectively constitute a radiation total region. Each radiation area corresponds to one radiation unit 211, the infrared intensity of the radiation area corresponds to the radiation unit 211, and the infrared intensity of the total radiation area corresponds to the radiation structure 210 as a whole.

In one embodiment, the radiating structure 210 is determined to be disqualified when the infrared intensity of the total area of radiation is less than the second radiation threshold. That is, when the infrared intensity of the total radiation area is less than the second radiation threshold, the radiation structure 210 may be determined to be unqualified directly without comparing the infrared intensity of the radiation area with the first radiation threshold.

In yet another embodiment, the radiating structure 210 is determined to be disqualified when the infrared intensity of any of the radiating areas is less than the first radiation threshold. That is, when the infrared intensity of any radiation area is smaller than the first radiation threshold, the radiation structure 210 can be directly determined to be unqualified without comparing the infrared intensity of the total radiation area with the second radiation threshold.

In yet another embodiment, the radiating structure 210 is qualified when the total radiant area has an infrared intensity greater than or equal to the second radiant threshold and each radiant area has an infrared intensity greater than or equal to the first radiant threshold. Otherwise, that is, when the infrared intensity of the total radiation area is smaller than the second radiation threshold, or when the infrared intensity of any radiation area is smaller than the first radiation threshold, the radiation structure 210 is determined to be unqualified. By adopting the mode to carry out qualification detection, any unqualified condition can be eliminated.

Referring to fig. 11, in some embodiments, to improve the detection efficiency, a light spot formed by the radiation emitted by the plurality of radiation structures 210 may be displayed on the same light spot pattern to simultaneously detect whether the plurality of radiation structures 210 are qualified, and whether different radiation structures 210 are qualified may be detected according to the same total radiation threshold and sub-radiation threshold, without setting different qualification thresholds for each radiation structure 210, where the qualification thresholds are the total radiation threshold and the sub-radiation threshold.

In some embodiments, the plurality of radiating structures 210 have different focal lengths. 01: obtaining a speckle pattern comprising:

013: respectively collecting light spot subgraphs formed by the radiation of each radiation structure 210;

014: carrying out scaling processing on the light spot subgraph; and

015: and splicing the light spot sub-graphs to obtain a light spot graph, wherein each light spot in the light spot graph is on a preset distance of the corresponding radiation structure 210.

steps

013, 014, and 015. That is, processor 501 may be configured to: respectively collecting light spot subgraphs formed by the radiation of each radiation structure 210; carrying out scaling processing on the light spot subgraph; and splicing the spot sub-patterns to obtain a spot pattern, wherein each spot in the spot pattern is at a preset distance from the corresponding radiation structure 210.

Different models of the radiation structures 210 of the drying apparatus 200 may have different operating powers or operating distances and thus different focal lengths. Accordingly, the detection of the radiation structures 210 with different focal lengths requires setting corresponding detection distances according to the focal lengths of the radiation structures 210, and the detection distances are distances between the radiation structures 210 and the light-equalizing module 30. Otherwise, if the radiation structures 210 with different focal lengths are detected at the same detection distance, the detection distance may not be suitable for the radiation structures 210 with partial focal lengths, for example, the distance between the certain types of radiation structures 210 and the light-equalizing module 30 is too close under the uniform detection distance, which results in a higher radiation value of a spot formed by the light-equalizing module 30 according to the radiation emitted by the radiation structures 210, and may cause the originally unqualified radiation structures 210 to pass the qualification threshold; for another example, the distance between the light-equalizing module 30 and some types of radiation structures 210 is too far under the uniform detection distance, which results in a low radiation value of a light spot formed on the light-equalizing module 30 according to the radiation emitted by the radiation structure 210, and may result in that the originally qualified radiation structure 210 cannot pass the qualified threshold.

Referring to fig. 3, in some embodiments, the detection apparatus 100 further includes a moving module 90. The moving module 90 is connected to the light equalizing module 30, the moving module 90 is configured to adjust a distance between the light equalizing module 30 and the drying device 200 to be detected, specifically, the moving module 90 is configured to adjust a distance between the light equalizing module 30 and the currently detected radiation structure 210, and the moving module 90 can be automatically driven by a pneumatic structure.

In some embodiments, the detection apparatus 100 may further include a rail 91, and the fixing module 20 and the light-equalizing module 30 are disposed on the rail 91. In one embodiment, the light-equalizing module 30 can move relative to the rail 91, and the moving module 90 is connected to the light-equalizing module 30 and is configured to drive the light-equalizing module 30 to move on the rail 91. In yet another embodiment, the stationary module 20 can be moved relative to the rail 91 to change the distance of the radiating structure 210 mounted on the stationary module 20 relative to the light equalizing module 30. The moving module 90 is connected to the fixed module 20 and is used to move the fixed module 20 on the rail 91. In another embodiment, the fixed module 20 and the movable module 90 can move relative to the rail 91, and the two movable modules 90 are respectively connected to the fixed module 20 and the light-equalizing module 30 and are respectively configured to drive the fixed module 20 and the light-equalizing module 30 to move on the rail 91.

In some embodiments, the photosensitive element 60 can be a zoom photosensitive element, so as to change the focal length of the photosensitive element 60 corresponding to different light spots on the light-equalizing module 30.

In the method 021, specifically, by adjusting the distance between the light equalizing module 30 and the radiation structures 210, each radiation structure 210 emits radiation toward the light equalizing sheet at a corresponding preset distance, and the photosensitive element 60 captures a light spot correspondingly formed by the light equalizing sheet at each preset distance to generate a light spot sub-pattern, so that the radiation emitted by each radiation structure 210 at the optimal preset distance forms a light spot in the light equalizing module 30. Due to the fact that the sizes of the light spots shot by the photosensitive element 60 at different preset distances are different, the sub-light spot patterns need to be subjected to appropriate scaling processing and then spliced into the light spot patterns, so that the light spots from different radiation structures 210 can be presented on the same light spot pattern.

Further, in order to ensure that the same qualification threshold, i.e. the same total radiation threshold and sub-radiation threshold, can be applied to different types of radiation structures 210, it is necessary to ensure that the intensities of the sub-spot patterns corresponding to different radiation structures 210 are close. In some embodiments, obtaining gray values of the sub-spot patterns and the spot patterns respectively, and detecting whether a difference between the gray value of each sub-spot pattern and the gray value of the spot pattern is within a preset gray difference range, and if the difference between the gray value of each sub-spot pattern and the gray value of the spot pattern is within the preset gray difference range, determining that the luminance between each sub-spot pattern is close; otherwise, if the difference between the gray value of a sub-spot pattern and the gray value of the spot pattern is outside the preset gray difference range, readjusting the preset distance between the radiation structure 210 corresponding to the sub-spot pattern and the light-equalizing module 30, emitting radiation at the adjusted preset distance again to generate a spot and shoot a new sub-spot pattern until the difference between the gray value of the new sub-spot pattern and the gray value of the spot pattern is within the preset gray difference range, and recording the preset distance corresponding to the sub-spot pattern meeting the requirement as the preset distance corresponding to the radiation structure 210 of the same model.

Similarly, in some embodiments, the plurality of radiating structures 210 have the same focal length. Because the focal length of each radiation structure 210 is the same, the corresponding preset distance of each radiation structure 210 is also the same, and the size of the light spot formed on the light-equalizing module 30 is also close, so that the sub-light spot patterns do not need to be scaled, and only the sub-light spot patterns need to be spliced into the light spot pattern.

Referring to fig. 12, in some embodiments, 032: determining a radiation center and a plurality of radiation areas in the spot diagram according to the brightness distribution diagram and the distribution condition of the radiation sources 211, including:

0321: acquiring a preset first brightness threshold;

0322: determining a plurality of radiation areas in the facula pattern according to the brightness distribution diagram, the first brightness threshold value and the distribution condition of the radiation sources 211; and

0323: the radiation center is determined from the geometric centers of the plurality of radiation zones.

Referring to fig. 3, in some embodiments, processor 501 may also implement the methods in

steps

0321, 0322 and 0323. That is, processor 501 may be configured to: acquiring a preset first brightness threshold; determining a plurality of radiation areas in the facula pattern according to the brightness distribution diagram, the first brightness threshold value and the distribution condition of the radiation sources 211; and determining a radiation center according to the geometric centers of the plurality of radiation areas.

In order to distinguish the spots in the spot pattern corresponding to the respective radiation sources 211 of the radiation structure 210, a radiation center and a plurality of radiation areas need to be determined in the spot pattern. Referring to fig. 4, in the captured speckle pattern, not all areas are speckle (radiation) areas, but the radiation intensity is positively correlated with the brightness of the speckle, so that the radiation area can be determined according to the brightness. Specifically, a preset first brightness threshold is obtained, an area where the light spot is located can be determined by finding out an area where the brightness is higher than the first brightness threshold in the brightness distribution diagram, and then, in combination with the distribution condition of the radiation sources 211 in the radiation structure 210, each radiation area can be in one-to-one correspondence with each radiation source 211, so that whether the corresponding radiation source 211 is qualified or not can be detected according to the radiation value of the radiation area. The preset first brightness threshold is mainly used for distinguishing the areas with light spots and the areas without light spots, and due to the fact that the brightness of the areas without light spots is low, the first brightness threshold which is too high does not need to be set, and the fact that the range of the light spots which is finally determined is too small is avoided.

Specifically, in one embodiment, the radiation source 211 is a halogen lamp and the radiation structure 210 includes a plurality of respective halogen lamps in the shape of a ring. The distribution of the plurality of halogen lamps in the radiating structure 210 is known, and the angular relationship of the plurality of halogen lamps in the radiating structure 210 is also known. For example, the radiation structure 210 includes 6 halogen lamps, which are uniformly distributed in a ring shape, and each halogen lamp is spaced by 60 °. After the range of the light spot is determined according to the brightness distribution map and the first brightness threshold, the light spot is divided into 6 areas according to the position distribution condition of the halogen lamp, each area corresponds to one halogen lamp, and each area is a radiation area. For the radiation structure 210, since the radiation sources 211 are uniformly distributed in the radiation structure 210 in a ring shape, the center of radiation convergence of the radiation structure 210 in the working state is also the center of radiation with the highest radiation intensity, and is at the geometric center of the radiation structure 210. The center of the radiating structure 210 may be determined by the position of the geometric center of each radiating area. In this embodiment, the 6 radiation sources 211 are uniformly distributed in a ring shape, so that the connecting line of the geometric centers of the 6 radiation regions corresponding to the 6 radiation sources 211 is a hexagon, and the radiation center of the radiation structure 210 is at the center of the hexagon. Similarly, in other embodiments, the radiation sources 211 may be disposed on the radiation structure 210 in other distribution manners, and still be determined according to the geometric center of the radiation area corresponding to each radiation source 211, for example, according to the center of the graph formed by the connecting lines of the geometric centers of each radiation area.

Referring to fig. 13, in some embodiments, 032: determining a radiation center and a plurality of radiation areas in the spot diagram according to the brightness distribution diagram and the distribution condition of the radiation sources 211, including:

0324: acquiring a preset second brightness threshold;

0325: determining a radiation center in the facula pattern according to the brightness distribution diagram and a second brightness threshold value; and

0326: a plurality of radiation areas are determined in the spot diagram according to the radiation center and the distribution of the radiation sources 211.

steps

0324, 0325 and 0326. That is, processor 501 may be configured to: acquiring a preset second brightness threshold; determining a radiation center in the spot diagram according to the brightness distribution diagram and the second brightness threshold value; and determining a plurality of radiation areas in the spot diagram according to the radiation center and the distribution of the radiation sources 211.

Wherein the second brightness threshold is used to determine the area with the highest radiation in the speckle pattern, and can be set according to the working power of the radiation structure 210. And combining the brightness distribution map and the second brightness threshold value, wherein the position with the brightness higher than the second brightness threshold value in the brightness distribution map has a larger position which is possibly the position with the highest radiation intensity, namely the position of the radiation center. In one embodiment, the position near the center of the spot of the plurality of positions having an intensity above the second intensity threshold is determined as the center of radiation. And if the positions higher than the second brightness threshold value do not have positions close to the center of the light spot, determining the geometric center of a graph formed by connecting lines of the positions as the radiation center. If only one position is above the second intensity threshold but not near the center of the spot, then lowering the second intensity threshold again achieves multiple positions. If only one position is above the second intensity threshold and close to the spot center, that position is determined as the radiation center.

Referring to fig. 14, after the radiation center is determined, a plurality of radiation areas can be determined according to the distribution of the radiation sources 211 in the radiation structure 210. Specifically, 0326: determining a plurality of radiation areas in the spot diagram according to the radiation center and the distribution of the radiation sources 211, including:

03261: acquiring a preset radius;

03262: determining a radiation range in the facula image according to the radiation center and a preset radius; and

03263: and dividing the radiation range according to the radiation center and the distribution position to obtain a plurality of radiation areas.

steps

03261, 03262 and 03263. That is, processor 501 may be configured to: acquiring a preset radius; determining a radiation range in the facula image according to the radiation center and a preset radius; and dividing the radiation range according to the radiation center and the distribution position to obtain a plurality of radiation areas.

Wherein the preset radius is the radius of the light spot in the light spot pattern. The preset radius may be determined by the size of the radiation structure 210 and the preset distance between the radiation structure 210 and the light equalizing module 30. When the size of the radiation structure 210 is known, the size of the spot formed by the radiation structure 210 at a predetermined distance towards the light equalizing module 30 is also determined, so that a predetermined radius can be determined. The radiation range, i.e. the area where the spot is located, can be determined in the spot map according to the radiation center and the preset radius. The radiation range in the spot diagram is divided with reference to the distribution position of the radiation source 211 in combination with the radiation center, the radiation range, and the distribution position of the radiation source 211, and the radiation range is divided into a plurality of radiation areas, each radiation area corresponding to one radiation source 211. Thus, the correspondence between each radiation region on the spot pattern and the radiation source 211 can be determined.

Referring to fig. 15, in some embodiments, 01: obtaining a speckle pattern comprising:

016: the spot pattern is collected by aligning the center of the photosensitive element 60 with the center of the spot. Referring to fig. 3, in some embodiments, the photosensitive element 60 can further implement the method of step 011. That is, the photosensitive element 60 can be used to: and (4) aiming the center of the shot to the center of the light spot to acquire the light spot image.

Referring to fig. 16, in some embodiments, 032: determining a radiation center and a plurality of radiation areas in the spot diagram according to the brightness distribution diagram and the distribution condition of the radiation sources 211, including:

0327: acquiring a preset radius;

0328: determining the center of the light spot pattern as a radiation center; and

0329: and determining a plurality of radiation areas in the spot diagram according to the radiation center, the preset radius and the distribution condition of the radiation sources 211.

steps

0327, 0328 and 0329. That is, processor 501 may be configured to: acquiring a preset radius according to the brightness distribution diagram; determining the center of the light spot pattern as a radiation center; and determining a plurality of radiation areas in the spot diagram according to the radiation center, the preset radius and the distribution condition of the radiation sources 211.

Specifically, when the light spot on the light equalizing module 30 is photographed, the photographing center of the light sensing element 60 is directly aligned with the center of the light spot for photographing. Thus, the center of the collected light spot pattern is the center of the light spot. If the radiation sources 211 are evenly distributed in the radiation structure 210 and the power of each radiation source 211 is uniform or approximately comparable, the center of the spot can be determined as the radiation center of the radiation structure 210.

In one embodiment, the preset radius of the method 037 is the same as the preset radius of the method 0361, and is the preset radius determined according to the size of the radiation structure 210, and the radiation range in the spot diagram can be determined by combining the preset radius and the radiation center, so that a plurality of radiation areas are determined in the spot diagram according to the radiation range and the distribution of the radiation sources 211. When the brightness distribution map is obtained, the radiation value corresponding to each radiation area can be determined only by obtaining the brightness distribution in the radiation range.

In yet another embodiment, the preset radius of method 037 may be determined in conjunction with the second brightness threshold and the brightness profile of method 034. Specifically, the boundary of the area with the brightness higher than the second brightness threshold value is determined in the brightness distribution map, and the distance from the center of the brightness distribution map to the boundary is taken as a preset radius, so that the area where the light spot is located can be obtained on the light spot map according to the radiation center and the preset radius. Further, the area where the light spot is located is divided into a plurality of radiation areas according to the distribution of the radiation sources 211.

In summary, the embodiment of the present application can acquire the spot pattern of the spot formed by the radiation emitted by the radiation structure 210 of the drying apparatus 200, and can determine a plurality of radiation areas corresponding to the radiation sources 211 on the spot pattern. Therefore, whether the corresponding radiation source 211 is qualified or not can be detected according to the radiation value of the radiation area, and whether the whole radiation structure 210 is qualified or not can be detected according to the total radiation value of each radiation area, so that whether the radiation structure 210 of the drying equipment 200 is qualified or not is comprehensively judged, and the qualified drying equipment 200 is screened out.

Referring to fig. 17, one or more non-transitory computer-readable storage media 300 containing a computer program 301 according to an embodiment of the present disclosure, when the computer program 301 is executed by one or more processors 501, the processor 501 is enabled to perform the detection method according to any of the above embodiments, for example, one or more of

steps

01, 02, 03, 04, 05, 06, 011, 012, 013, 014, 015, 016, 031, 032, 033, 0321, 0322, 0323, 0324, 0325, 0326, 0327, 0328, 0329, 03261, 03262, 03263, 041, 042, and 043 are implemented.

For example, the computer program 301, when executed by the one or more processors 501, causes the processors 501 to perform the steps of:

In the description herein, reference to the description of the terms "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example" or "some examples" or the like means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Moreover, various embodiments or examples and features of various embodiments or examples described in this specification can be combined and brought together by those skilled in the art without contradiction.

Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and the scope of the preferred embodiments of the present application includes other implementations in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present application.

Although embodiments of the present application have been shown and described above, it is to be understood that the above embodiments are exemplary and not to be construed as limiting the present application, and that variations, modifications, substitutions and alterations may be made to the above embodiments by those of ordinary skill in the art within the scope of the present application.

Claims

1. A detection method for detecting an infrared intensity of a drying apparatus, wherein the drying apparatus includes a radiation structure including a plurality of radiation sources, a predetermined spectrum of the radiation sources includes a visible light band and an infrared light band, the detection method comprising:

acquiring a spot pattern, wherein the spot pattern is an image of a spot formed in the visible light waveband;

detecting the integrity of the light spots according to the light spot graph;

under the condition that the light spot is complete, acquiring the visible light intensity of the visible light wave band according to the light spot pattern;

acquiring the total light intensity of the preset spectrum according to the visible light intensity and the proportion of the visible light wave band in the preset spectrum; and

and acquiring the infrared light intensity according to the total light intensity and the visible light intensity.

2. The detection method according to claim 1, wherein the speckle pattern is acquired by a photosensitive element;

the proportion of the visible light band in the preset spectrum according to the visible light intensity comprises the following steps:

acquiring a response waveband of the photosensitive element;

acquiring the proportion of the response waveband in the preset spectrum; and

and taking the proportion of the response waveband in the preset spectrum as the proportion of the visible light waveband in the preset spectrum.

3. The detection method according to claim 2, wherein the obtaining of the speckle pattern comprises:

obtaining a high conversion rate interval, wherein the high conversion rate interval is a waveband interval of the photosensitive element with high photoelectric conversion efficiency; and

and filtering light rays by adopting a filtering module according to the high conversion rate interval, so that the photosensitive element generates the light spot pattern according to the light rays with the wave bands in the high conversion rate interval.

4. The detection method according to claim 1, wherein the obtaining the visible light intensity of the visible light band according to the speckle pattern comprises:

performing binarization processing on the light spot diagram to obtain a brightness distribution diagram;

determining a radiation center and a plurality of radiation areas in the spot diagram according to the brightness distribution diagram and the radiation source distribution condition, wherein each radiation area corresponds to one radiation source, and the radiation source distribution condition is the arrangement mode of the plurality of radiation sources in the radiation structure; and

and acquiring the radiation value of the radiation area as the visible light intensity.

5. The detecting method according to claim 4, wherein obtaining the total light intensity of the preset spectrum according to the visible light intensity and the proportion of the visible light band in the preset spectrum comprises:

acquiring a preset relation, wherein the preset relation is the distribution relation of the visible light wave band in the preset spectrum;

acquiring a light intensity coefficient according to the preset relation, wherein the light intensity coefficient represents the proportion of the visible light wave band in the preset spectrum; and

and acquiring the total light intensity according to the visible light intensity and the light intensity coefficient.

6. The detection method according to claim 5, wherein said obtaining the infrared light intensity from the total light intensity and the visible light intensity comprises:

taking the difference between the total light intensity and the visible light intensity as the infrared light intensity,

the detection method further comprises the following steps:

and determining whether the radiation structure is qualified or not according to the infrared light intensity.

7. The method of claim 6, wherein said determining whether said radiating structure is acceptable based on said infrared intensity comprises:

acquiring a preset first radiation threshold, and determining whether the radiation source corresponding to each radiation area is qualified or not according to the infrared intensity of each radiation area and the first radiation threshold;

acquiring the infrared light intensity of a total radiation area according to the total light intensity of each radiation area, wherein the total radiation area is an area formed by each radiation area; and

and acquiring a preset second radiation threshold, and determining whether the radiation structure is qualified or not according to the infrared intensity of the total radiation area and the second radiation threshold.

8. The detection method according to claim 4, wherein the radiation structure includes a plurality of radiation structures, a plurality of the radiation structures having different focal lengths, and the obtaining the speckle pattern includes:

respectively collecting light spot subgraphs formed by radiation of each radiation structure;

scaling the light spot subgraph; and

and splicing the light spot sub-graphs to obtain the light spot graph, wherein each light spot in the light spot graph is on the corresponding preset distance of the radiation structure.

9. The detection method according to claim 4, wherein the determining a radiation center and a plurality of radiation areas in the spot map according to the brightness distribution map and the radiation source distribution condition comprises:

acquiring a preset first brightness threshold;

determining a plurality of radiation areas in the light spot pattern according to the brightness distribution map, the first brightness threshold and the radiation source distribution condition; and

determining the radiation center according to the geometric centers of a plurality of the radiation areas.

10. The detection method according to claim 4, wherein the determining a radiation center and a plurality of radiation areas in the spot map according to the brightness distribution map and the radiation source distribution condition comprises:

acquiring a preset second brightness threshold;

determining the radiation center in the spot map according to the brightness distribution map and the second brightness threshold;

and determining a plurality of radiation areas in the optical spot diagram according to the radiation center and the radiation source distribution condition.

11. The method of claim 10, wherein the determining a plurality of the radiation zones in the speckle pattern according to the radiation center and the radiation source distribution comprises:

acquiring a preset radius;

determining a radiation range in the spot diagram according to the radiation center and the preset radius; and

and dividing the radiation range according to the radiation center and the distribution position to obtain a plurality of radiation areas.

12. A detection system for detecting the infrared intensity of a drying device, wherein the detection system comprises a detection device and a processor, and the processor is used for implementing the detection method of any one of claims 1 to 11.

13. The detection system according to claim 12, characterized in that said detection means comprise, in succession:

a power supply module for supplying power to the radiating structure;

a fixing module for fixing the radiating structure;

the light-equalizing module is used for receiving the radiation emitted by the radiation structure to form light spots;

the light filtering module is used for filtering light rays so as to enable radiation light with a preset waveband to enter the light homogenizing module;

the photosensitive element is used for shooting the light spot; and

and the image processor is used for acquiring a spot pattern according to the light spots shot by the photosensitive element.

14. The detection system according to claim 13, further comprising a loading device for mounting the radiating structure to the stationary module.

15. A non-transitory computer-readable storage medium containing a computer program which, when executed by one or more processors, causes the processors to implement the detection method of any one of claims 1 to 11.