CN114236803A - 显微系统和用于检验显微镜校准的方法 - Google Patents

显微系统和用于检验显微镜校准的方法 Download PDF

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Publication number
CN114236803A
CN114236803A CN202110790405.XA CN202110790405A CN114236803A CN 114236803 A CN114236803 A CN 114236803A CN 202110790405 A CN202110790405 A CN 202110790405A CN 114236803 A CN114236803 A CN 114236803A
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CN
China
Prior art keywords
microscope
panoramic image
panoramic
calibration
computing device
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Pending
Application number
CN202110790405.XA
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English (en)
Chinese (zh)
Inventor
克里斯蒂安·迪特里希
丹尼尔·哈泽
曼努埃尔·阿姆托尔
约翰内斯·克诺布利希
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Carl Zeiss Microscopy GmbH
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Carl Zeiss Microscopy GmbH
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Application filed by Carl Zeiss Microscopy GmbH filed Critical Carl Zeiss Microscopy GmbH
Publication of CN114236803A publication Critical patent/CN114236803A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Computing Systems (AREA)
  • Artificial Intelligence (AREA)
  • Mathematical Physics (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Biophysics (AREA)
  • Multimedia (AREA)
  • General Health & Medical Sciences (AREA)
  • Computational Linguistics (AREA)
  • Biomedical Technology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Medical Informatics (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Analysis (AREA)
CN202110790405.XA 2020-09-09 2021-07-13 显微系统和用于检验显微镜校准的方法 Pending CN114236803A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102020123562.3A DE102020123562A1 (de) 2020-09-09 2020-09-09 Mikroskopiesystem und verfahren zum überprüfen einer mikroskopkalibrierung
DE102020123562.3 2020-09-09

Publications (1)

Publication Number Publication Date
CN114236803A true CN114236803A (zh) 2022-03-25

Family

ID=80266706

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202110790405.XA Pending CN114236803A (zh) 2020-09-09 2021-07-13 显微系统和用于检验显微镜校准的方法

Country Status (2)

Country Link
CN (1) CN114236803A (de)
DE (1) DE102020123562A1 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022106435A1 (de) 2022-03-18 2023-09-21 Carl Zeiss Microscopy Gmbh Mikroskopiesystem und Verfahren zum Bestimmen einer Orientierung eines Probenträgers

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013006994A1 (de) 2013-04-19 2014-10-23 Carl Zeiss Microscopy Gmbh Digitalmikroskop und Verfahren zur Optimierung des Arbeitsablaufes in einem Digitalmikroskop
DE102013012987A1 (de) 2013-08-03 2015-02-05 Carl Zeiss Microscopy Gmbh Verfahren zur Kalibrierung eines digitalen optischen Gerätes und optisches Gerät
DE102013222295A1 (de) 2013-11-04 2015-05-07 Carl Zeiss Microscopy Gmbh Digitalmikroskop, Verfahren zur Kalibrierung und Verfahren zur automatischen Fokus- und Bildmittennachführung für ein solches Digitalmikroskop
DE102017109698A1 (de) 2017-05-05 2018-11-08 Carl Zeiss Microscopy Gmbh Bestimmen von Kontextinformation für Wechselkomponenten eines optischen Systems
DE102018133196A1 (de) 2018-12-20 2020-06-25 Carl Zeiss Microscopy Gmbh Bildbasierte wartungsvorhersage und detektion von fehlbedienungen
DE102019114117B3 (de) 2019-05-27 2020-08-20 Carl Zeiss Microscopy Gmbh Automatische Workflows basierend auf einer Erkennung von Kalibrierproben
DE102020101191A1 (de) 2020-01-20 2021-07-22 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren zum Ermitteln eines Messortes eines Mikroskops
DE102020118801A1 (de) 2020-07-16 2022-01-20 Carl Zeiss Microscopy Gmbh Mikroskop und verfahren zur abstandsbestimmung einer probenreferenzebene

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Publication number Publication date
DE102020123562A1 (de) 2022-03-10

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