CN114207427A - 气相色谱质量分析仪以及质量分析方法 - Google Patents

气相色谱质量分析仪以及质量分析方法 Download PDF

Info

Publication number
CN114207427A
CN114207427A CN201980099014.4A CN201980099014A CN114207427A CN 114207427 A CN114207427 A CN 114207427A CN 201980099014 A CN201980099014 A CN 201980099014A CN 114207427 A CN114207427 A CN 114207427A
Authority
CN
China
Prior art keywords
filament
opening
sample
ionization
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201980099014.4A
Other languages
English (en)
Chinese (zh)
Inventor
高仓诚人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN114207427A publication Critical patent/CN114207427A/zh
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN201980099014.4A 2019-08-22 2019-08-22 气相色谱质量分析仪以及质量分析方法 Withdrawn CN114207427A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/032873 WO2021033318A1 (ja) 2019-08-22 2019-08-22 ガスクロマトグラフ質量分析計および質量分析方法

Publications (1)

Publication Number Publication Date
CN114207427A true CN114207427A (zh) 2022-03-18

Family

ID=74660477

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980099014.4A Withdrawn CN114207427A (zh) 2019-08-22 2019-08-22 气相色谱质量分析仪以及质量分析方法

Country Status (4)

Country Link
US (1) US20220317089A1 (https=)
JP (1) JPWO2021033318A1 (https=)
CN (1) CN114207427A (https=)
WO (1) WO2021033318A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117782455A (zh) * 2024-02-28 2024-03-29 宁波众心电子科技有限公司 一种动力电池泄漏检测装置及方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58204462A (ja) * 1982-05-22 1983-11-29 Shimadzu Corp 質量分析計におけるイオン源装置
FR2874743A1 (fr) * 2004-09-01 2006-03-03 Abionix Sarl Chambre d'ionisation mixte mab-ei pour spectrometre de masse
WO2007102225A1 (ja) * 2006-03-09 2007-09-13 Shimadzu Corporation 質量分析装置
WO2007102224A1 (ja) * 2006-03-09 2007-09-13 Shimadzu Corporation 質量分析装置
US9048080B2 (en) * 2010-08-19 2015-06-02 Leco Corporation Time-of-flight mass spectrometer with accumulating electron impact ion source
JP2018032481A (ja) * 2016-08-23 2018-03-01 株式会社島津製作所 質量分析装置及び質量分析装置用ソフトウエア

Also Published As

Publication number Publication date
US20220317089A1 (en) 2022-10-06
JPWO2021033318A1 (https=) 2021-02-25
WO2021033318A1 (ja) 2021-02-25

Similar Documents

Publication Publication Date Title
EP1875486B1 (en) Method for controlling space charge-driven ion instabilities in electron impact ion sources
JP4806214B2 (ja) 電子捕獲解離反応装置
EP2819148B1 (en) Electron ionization (EI) utilizing different EI energies
EP2006882B1 (en) Ionizing device
US9117617B2 (en) Axial magnetic ion source and related ionization methods
JP6739931B2 (ja) ソフト電子イオン化のためのイオン源ならびに関連するシステムおよび方法
US20120126112A1 (en) Molecular ion accelerator
US9035244B2 (en) Automatic gain control with defocusing lens
EP1995764B1 (en) Mass spectrometer
JP5210418B2 (ja) 質量分析装置
CN114207427A (zh) 气相色谱质量分析仪以及质量分析方法
US11670496B2 (en) Ionization sources and methods and systems using them
CN116206943B (zh) 质谱仪及其气相离子源装置
US20090294652A1 (en) Electron Generation Apparatuses, Mass Spectrometry Instruments, Methods of Generating Electrons, and Mass Spectrometry Methods

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WW01 Invention patent application withdrawn after publication
WW01 Invention patent application withdrawn after publication

Application publication date: 20220318