CN114171109A - Aging testing baking oven - Google Patents

Aging testing baking oven Download PDF

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Publication number
CN114171109A
CN114171109A CN202111581330.0A CN202111581330A CN114171109A CN 114171109 A CN114171109 A CN 114171109A CN 202111581330 A CN202111581330 A CN 202111581330A CN 114171109 A CN114171109 A CN 114171109A
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CN
China
Prior art keywords
testing
cabinet body
inner box
electrically connected
components
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Pending
Application number
CN202111581330.0A
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Chinese (zh)
Inventor
詹焕
张剑勇
黄永明
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Huiju Electric Technology Dongguan Industrial Co Ltd
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Huiju Electric Technology Dongguan Industrial Co Ltd
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Publication date
Application filed by Huiju Electric Technology Dongguan Industrial Co Ltd filed Critical Huiju Electric Technology Dongguan Industrial Co Ltd
Priority to CN202111581330.0A priority Critical patent/CN114171109A/en
Publication of CN114171109A publication Critical patent/CN114171109A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses an aging test baking oven, which is used for carrying out aging test work on a solid state disk and comprises the following components: a cabinet body; the testing mechanism comprises a plurality of first testing components and a plurality of second testing components, the plurality of first testing components are arranged in the cabinet body and are respectively and electrically connected with the tested workpiece, the plurality of second testing components are arranged outside the cabinet body and are respectively and electrically connected with the plurality of first testing components; the thermal circulation mechanism is arranged in the cabinet body and is used for heating the interior of the cabinet body; the control box is arranged at the upper end of the cabinet body and is electrically connected with the testing mechanism and the thermal circulation mechanism respectively. The invention can effectively reduce the production cost of the solid state disk high-temperature aging test equipment, and improve the air circulation volume in the cabinet body, so that the temperature distribution in the equipment is more uniform.

Description

Aging testing baking oven
Technical Field
The invention relates to the technical field of aging tests, in particular to an aging test baking oven.
Background
The high-temperature aging test equipment is a high-temperature and severe environment test equipment which is simulated aiming at high-performance electronic products, is important experimental equipment for improving the stability and the reliability of products, is an important production process for improving the quality and the competitiveness of products of various production enterprises, and is widely applied to the fields of power electronics, computers, communication, biological pharmacy and the like.
In the prior art, the solid state disk high temperature aging test equipment mainly comprises an aging chamber and an aging test frame, wherein a test board with a slot is arranged on the aging test frame, the aging test frame is generally provided with an aviation plug connected with the test board through a cable, and an aviation socket is arranged on the solid state disk high temperature aging test equipment. When the aging test frame is placed in an aging chamber for high-temperature test, a user is required to plug an aviation plug and an aviation socket on the aging test frame to realize power supply of the test board, and the test process is complicated to operate; and because the aviation plug and the aviation socket are arranged, the whole production cost of the solid state disk high-temperature aging equipment is high. Therefore, it is necessary to improve the above problems.
Disclosure of Invention
The invention aims to provide an aging test baking oven, which solves the problems in the background technology.
In order to achieve the purpose, the invention provides the following technical scheme: the utility model provides an aging testing toasts case for carry out aging testing work to solid state hard drives, include:
a cabinet body;
the testing mechanism comprises a plurality of first testing components and a plurality of second testing components, the plurality of first testing components are arranged in the cabinet body and are respectively electrically connected with a workpiece to be tested, the plurality of second testing components are arranged outside the cabinet body and are respectively electrically connected with the plurality of first testing components;
the thermal circulation mechanism is arranged in the cabinet body and is used for heating the interior of the cabinet body;
the control box is arranged at the upper end of the cabinet body and is electrically connected with the testing mechanism and the thermal circulation mechanism respectively.
Preferably, the cabinet body is provided with an inner box, the first testing assemblies are all arranged in the inner box, a circulation channel is formed between the inner box and the cabinet body, and the thermal circulation mechanism is arranged in the circulation channel.
Preferably, both ends are equipped with air outlet and gas inlet respectively about the inner box, thermal cycle mechanism includes wind wheel, driving motor and a plurality of electrothermal tube, the wind wheel is located gas outlet, just the wind wheel is configured to by inner box extraction air to circulation channel, driving motor with the wind wheel transmission is connected, and a plurality of electrothermal tube is all located in the circulation channel.
Preferably, the inner box is provided with a plurality of placing plates, the placing plates are movably connected with the inner box, and the first testing assemblies are respectively arranged in the placing plates.
Preferably, the first testing component comprises a testing jig board, and the testing jig board is electrically connected with the second testing component and the tested workpiece respectively.
Preferably, the second testing component comprises an RDT power supply, and the RDT power supply is electrically connected with the second testing component.
Compared with the prior art, the invention has the following beneficial effects:
according to the invention, the test mechanism is arranged, the test mechanism comprises a plurality of first test assemblies and a plurality of second test assemblies, the plurality of first test assemblies are arranged in the cabinet body and are respectively electrically connected with the tested workpiece, the plurality of second test assemblies are arranged outside the cabinet body and are respectively electrically connected with the plurality of first test assemblies, so that power supply of the aging equipment can be realized, the test process is simple and convenient to operate, the structure of the solid state disk high-temperature aging test equipment is simple, and the production cost of the solid state disk high-temperature aging test equipment can be effectively reduced.
The heat circulation mechanism comprises a wind wheel, a driving motor and a plurality of electric heating tubes, wherein the wind wheel is arranged at the airflow outlet, the wind wheel is configured to draw air from the inner box to the circulation channel, the driving motor is in transmission connection with the wind wheel, and the plurality of electric heating tubes are all arranged in the circulation channel; during operation, driving motor drives the wind wheel and rotates, and the air of extraction inner box makes inside and outside formation pressure differential, and the air current after the electrothermal tube heating flows into the inner box from the air current entry in the circulation channel afterwards, can improve the internal air circulation volume of cabinet, makes the temperature distribution in the equipment more even.
Drawings
FIG. 1 is a schematic view of the present invention;
FIG. 2 is a second schematic structural diagram of the present invention;
fig. 3 is a schematic cross-sectional structure of the present invention.
The reference numerals and names in the figures are as follows:
1. a cabinet body; 11. an inner box; 111. an airflow outlet; 112. an airflow inlet; 113. placing the plate; 12. a circulation channel; 2. a testing mechanism; 21. a first test assembly; 211. testing the jig plate; 22. a second test assembly; 221. an RDT power supply; 3. a thermal cycling mechanism; 31. a wind wheel; 32. a drive motor; 33. an electric heating tube; 4. and a control box.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1 to 3, an embodiment of the present invention includes: the utility model provides an aging testing toasts case for carry out aging testing work to solid state hard drives, include:
a cabinet body;
the testing mechanism comprises a plurality of first testing components and a plurality of second testing components, the plurality of first testing components are arranged in the cabinet body and are respectively electrically connected with a tested workpiece, the plurality of second testing components are arranged outside the cabinet body and are respectively electrically connected with the plurality of first testing components, power supply of the aging equipment can be realized, the testing process is simple and convenient to operate, the structure of the solid state disk high-temperature aging testing equipment is simple, and the production cost of the solid state disk high-temperature aging testing equipment can be effectively reduced;
the thermal circulation mechanism is arranged in the cabinet body and is used for heating the interior of the cabinet body;
the control box is arranged at the upper end of the cabinet body and is electrically connected with the testing mechanism and the thermal circulation mechanism respectively.
More specifically, the cabinet body is equipped with the inner box, and a plurality of first test assembly all locates in the inner box, the inner box with form a circulation channel between the cabinet body, thermal cycle mechanism locates in the circulation channel.
More specifically, the upper end and the lower end of the inner box are respectively provided with an airflow outlet and an airflow inlet, the thermal circulation mechanism comprises a wind wheel, a driving motor and a plurality of electric heating tubes, the wind wheel is arranged at the airflow outlet, the wind wheel is configured to draw air from the inner box to a circulation channel, the driving motor is in transmission connection with the wind wheel, and the electric heating tubes are arranged in the circulation channel; during operation, driving motor drives the wind wheel and rotates, and the air of extraction inner box makes inside and outside formation pressure differential, and the air current after the electrothermal tube heating flows into the inner box from the air current entry in the circulation channel afterwards, can improve the internal air circulation volume of cabinet, makes the temperature distribution in the equipment more even.
More specifically, the inner box is provided with a plurality of placing trays, the placing trays are movably connected with the inner box, and the first testing assemblies are respectively arranged in the placing trays; when in use, the placing disc can be pulled out from the inner box, so that the tested workpiece can be conveniently placed and released.
More specifically, the first testing component comprises a testing jig board, and the testing jig board is electrically connected with the second testing component and the tested workpiece respectively.
More specifically, the second testing component comprises an RDT power supply, and the RDT power supply is electrically connected with the second testing component.
More specifically, the cabinet body is formed by numerical control bending and welding of an A3 steel plate, surface baking finish treatment is carried out, and heat preservation rock wool is filled in the cabinet body, so that heat can be effectively prevented from leaking.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims (6)

1. The utility model provides an aging testing toasts case for carry out aging testing work to solid state hard drives, its characterized in that includes:
a cabinet body (1);
the testing mechanism (2) comprises a plurality of first testing components (21) and a plurality of second testing components (22), the plurality of first testing components (21) are arranged in the cabinet body (1), the plurality of first testing components (21) are respectively and electrically connected with a workpiece to be tested, the plurality of second testing components (22) are arranged outside the cabinet body (1), and the plurality of second testing components (22) are respectively and electrically connected with the plurality of first testing components (21);
the thermal circulation mechanism (3) is arranged in the cabinet body (1), and the thermal circulation mechanism (3) is used for heating the interior of the cabinet body (1);
the control box (4), the control box (4) is located cabinet body (1) upper end, just control box (4) respectively with accredited testing organization (2) and thermal cycle mechanism (3) electric connection.
2. The burn-in test oven of claim 1, wherein: the cabinet body (1) is equipped with inner box (11), and is a plurality of first test subassembly (21) all locate in inner box (11), inner box (11) with form a circulation channel (12) between the cabinet body (1), thermal cycle mechanism (3) are located in circulation channel (12).
3. The burn-in test oven of claim 2, wherein: both ends are equipped with air outlet (111) and air inlet mouth (112) respectively about inner box (11), thermal cycle mechanism (3) include wind wheel (31), driving motor (32) and a plurality of electrothermal tube (33), wind wheel (31) are located air outlet (111) department, just wind wheel (31) are configured as by inner box (11) extraction air to circulation channel (12), driving motor (32) with wind wheel (31) transmission is connected, and is a plurality of electrothermal tube (33) are all located in circulation channel (12).
4. The burn-in test oven of claim 2, wherein: the inner box (11) is provided with a plurality of placing plates (113), the placing plates (113) are movably connected with the inner box (11), and the first testing assemblies (21) are arranged in the placing plates (113) respectively.
5. The burn-in test oven of claim 4, wherein: the first testing component (21) comprises a testing jig plate (211), and the testing jig plate (211) is respectively electrically connected with the second testing component (22) and the tested workpiece.
6. The burn-in test oven of claim 5, wherein: the second testing component (22) comprises an RDT power supply (221), and the RDT power supply (221) is electrically connected with the second testing component (22).
CN202111581330.0A 2021-12-22 2021-12-22 Aging testing baking oven Pending CN114171109A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202111581330.0A CN114171109A (en) 2021-12-22 2021-12-22 Aging testing baking oven

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202111581330.0A CN114171109A (en) 2021-12-22 2021-12-22 Aging testing baking oven

Publications (1)

Publication Number Publication Date
CN114171109A true CN114171109A (en) 2022-03-11

Family

ID=80487771

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202111581330.0A Pending CN114171109A (en) 2021-12-22 2021-12-22 Aging testing baking oven

Country Status (1)

Country Link
CN (1) CN114171109A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN208444602U (en) * 2018-07-27 2019-01-29 深圳市高盛试验设备有限公司 A kind of SSD solid state hard disk burn-in test cabinet
CN210487941U (en) * 2019-08-21 2020-05-08 任传建 Discrete energy-saving aging testing device
CN211788187U (en) * 2020-04-09 2020-10-27 深圳市时创意电子有限公司 Solid state hard drives high temperature aging testing equipment
CN113533871A (en) * 2020-04-14 2021-10-22 中山市江波龙电子有限公司 Aging test equipment and aging detection method thereof
CN217008655U (en) * 2021-12-22 2022-07-19 汇钜电科(东莞)实业有限公司 Aging testing baking oven

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN208444602U (en) * 2018-07-27 2019-01-29 深圳市高盛试验设备有限公司 A kind of SSD solid state hard disk burn-in test cabinet
CN210487941U (en) * 2019-08-21 2020-05-08 任传建 Discrete energy-saving aging testing device
CN211788187U (en) * 2020-04-09 2020-10-27 深圳市时创意电子有限公司 Solid state hard drives high temperature aging testing equipment
CN113533871A (en) * 2020-04-14 2021-10-22 中山市江波龙电子有限公司 Aging test equipment and aging detection method thereof
CN217008655U (en) * 2021-12-22 2022-07-19 汇钜电科(东莞)实业有限公司 Aging testing baking oven

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Country or region after: China

Address after: Room 501, Building 4, No. 3 Yongtai Road, Tangxia Town, Dongguan City, Guangdong Province, 523000

Applicant after: Huiju Storage Technology (Dongguan) Co.,Ltd.

Address before: 523000 Building 1, No. 7, Keyuan fifth road, Tangxia Town, Dongguan City, Guangdong Province

Applicant before: Huiju Electric Technology (Dongguan) Industrial Co.,Ltd.

Country or region before: China