CN211788187U - Solid state hard drives high temperature aging testing equipment - Google Patents
Solid state hard drives high temperature aging testing equipment Download PDFInfo
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- CN211788187U CN211788187U CN202020508858.XU CN202020508858U CN211788187U CN 211788187 U CN211788187 U CN 211788187U CN 202020508858 U CN202020508858 U CN 202020508858U CN 211788187 U CN211788187 U CN 211788187U
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- 238000012360 testing method Methods 0.000 title claims abstract description 129
- 239000007787 solid Substances 0.000 title claims abstract description 46
- 238000010438 heat treatment Methods 0.000 claims description 19
- 239000000523 sample Substances 0.000 claims description 13
- 238000009423 ventilation Methods 0.000 claims description 11
- 238000003780 insertion Methods 0.000 claims description 7
- 230000037431 insertion Effects 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 abstract description 9
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- 230000005611 electricity Effects 0.000 description 9
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- 238000004891 communication Methods 0.000 description 1
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Abstract
The utility model is suitable for a high temperature equipment technical field that ages. The utility model provides a solid state hard drives high temperature aging testing equipment, includes: a housing; the inner container is arranged in the shell, an aging chamber is arranged in the inner container, and a first conductive piece electrically connected with an external power supply is arranged on the inner surface of the aging chamber; the aging test frame comprises a frame body and a test board arranged on the frame body, and a second conductive piece which is electrically connected with the test board and is matched with the first conductive piece is arranged on the frame body; when the aging test frame is pushed into the aging chamber, the second conductive piece is in fit contact with the first conductive piece to realize electric connection. The utility model provides a solid state hard drives high temperature aging testing equipment utilizes the second to lead electrically conductive piece and first electrically conductive cooperation contact to realize the power supply of surveying the board, and test procedure easy operation is convenient, and makes solid state hard drives high temperature aging testing equipment's simple structure, greatly reduced solid state hard drives high temperature aging testing equipment's manufacturing cost.
Description
Technical Field
The utility model belongs to the technical field of the high temperature ageing equipment, especially, relate to a solid state hard drives high temperature ageing testing equipment.
Background
The high-temperature aging test equipment is a high-temperature and severe environment test equipment which is simulated aiming at high-performance electronic products, is important experimental equipment for improving the stability and the reliability of products, is an important production process for improving the quality and the competitiveness of products of various production enterprises, and is widely applied to the fields of power electronics, computers, communication, biological pharmacy and the like.
In the prior art, the solid state disk high temperature aging test equipment mainly comprises an aging chamber and an aging test frame, wherein a test board with a slot is arranged on the aging test frame, the aging test frame is generally provided with an aviation plug connected with the test board through a cable, and an aviation socket is arranged on the solid state disk high temperature aging test equipment. When the aging test frame is placed in an aging chamber for high-temperature test, a user is required to plug an aviation plug and an aviation socket on the aging test frame to realize power supply of the test board, and the test process is complicated to operate; and because the aviation plug and the aviation socket are arranged, the whole production cost of the solid state disk high-temperature aging equipment is high.
SUMMERY OF THE UTILITY MODEL
The utility model provides a solid state hard drives high temperature aging testing equipment aims at solving the solid state hard drives high temperature aging testing equipment of prior art and passes through the power supply that aviation plug and aviation socket grafting realization survey test panel, and test process complex operation, and the high problem of manufacturing cost.
The utility model discloses a realize like this, provide a solid state hard drives high temperature aging testing equipment, include:
a housing;
the inner container is arranged in the shell, an aging chamber is arranged in the inner container, and a first conductive piece electrically connected with an external power supply is arranged on the inner surface of the aging chamber; and
the aging test frame can be pushed into the aging chamber and comprises a frame body and a test board arranged on the frame body, and a second conductive piece which is electrically connected with the test board and is matched with the first conductive piece is arranged on the frame body; when the aging test frame is pushed into the aging chamber, the second conductive piece is in contact with the first conductive piece in a matching mode to realize electric connection.
Preferably, the first conductive member and the second conductive member are inserted into each other.
Preferably, the first conductive piece includes two pairs of conductive elastic pieces arranged at intervals, the second conductive piece includes a base provided with two jacks, and conductive posts respectively arranged in one of the jacks, and each pair of conductive elastic pieces is inserted into one of the jacks and clamps the conductive posts.
Preferably, the rack body is provided with a plurality of layers of test boards, each layer of test board is correspondingly provided with a second conductive piece, the inner surface of the aging chamber is provided with first conductive pieces corresponding to the second conductive pieces in number, and each first conductive piece is connected with an external power supply through a control switch.
Preferably, the solid state disk high-temperature aging test equipment comprises an outer liner arranged inside the shell, the inner liner is arranged in the outer liner, an air channel communicated with the outside is formed between the outer liner and the inner liner at intervals, the air channel is communicated with the aging chamber, and a heating wire is arranged in the air channel.
Preferably, the inner bag includes the bottom plate, encloses to locate the relative both sides of bottom plate and be equipped with the wind channel board of through-hole array, connect two the curb plate of wind channel board and connect two the roof of wind channel board, bottom plate, two the wind channel board the curb plate with the roof encloses into ageing chamber, two the wind channel board with between the inner wall of outer courage and the roof with form between the inner wall of outer courage the wind channel, first electrically conductive piece is located on the curb plate.
Preferably, the solid state disk high-temperature aging test equipment further comprises a fan device, the fan device comprises a motor and fan blades, and the top plate is provided with an air suction opening communicated with the air duct; the motor is arranged on the shell and connected with fan blades through a driving rod, the fan blades are arranged between the top plate and the inner wall of the outer container and opposite to the air suction opening, the side of the fan device is provided with an air inlet pipe and an air exhaust pipe which penetrate through the shell and the outer container, and the air inlet pipe and the air exhaust pipe are respectively communicated with the aging chamber and the outside.
Preferably, the inner container further comprises a ventilation plate which is arranged on the bottom plate and is provided with a plurality of ventilation holes, and a cavity communicated with the outside is formed between the ventilation plate and the bottom plate.
Preferably, a plurality of heating wires are uniformly arranged in the air duct from bottom to top at intervals, and a temperature probe is arranged on the inner side of the aging chamber corresponding to each heating wire.
Preferably, the inner surface of the aging chamber is also provided with a positioning hole for positioning the aging test frame, and the frame body is provided with a positioning column matched with the positioning hole; when the aging test frame is pushed into the aging chamber, the positioning column is inserted into the positioning hole.
The utility model discloses a solid state hard drives high temperature aging testing equipment has following technological effect:
1. the first conductive piece electrically connected with an external power supply is arranged in the aging chamber, and the second conductive piece which is electrically connected with the test board and matched with the first conductive piece is arranged on the frame body of the aging test frame. When the aging test frame is pushed into the aging chamber, the second conductive piece is in fit contact with the first conductive piece to realize electric connection, so that power supply of the test board of the aging test frame can be realized, the test process is simple and convenient to operate, the solid state disk high-temperature aging test equipment is simple in structure, and the production cost of the solid state disk high-temperature aging test equipment is greatly reduced.
2. Through set up the ventilating board on the bottom plate at the inner bag, utilize ventilating board and external intercommunication for outside air can be followed the bottom upward movement of ageing room, has improved the indoor air circulation volume of ageing, makes the temperature distribution of ageing room more even.
3. The temperature probes are arranged on the inner side of the aging chamber corresponding to the positions of the heating wires, so that the temperature of each region in the aging chamber can be detected in real time, the temperature of each region in the aging chamber can be controlled conveniently, and the temperature of each region in the aging chamber can be maintained in a certain interval.
Drawings
Fig. 1 is a schematic perspective view of a solid state disk high temperature aging test apparatus provided in an embodiment of the present invention;
fig. 2 is a front view of the solid state disk high temperature aging test apparatus provided by the embodiment of the present invention when the aging test jig is not installed;
fig. 3 is a top view of a solid state disk high temperature aging testing apparatus provided in an embodiment of the present invention;
FIG. 4 is a schematic cross-sectional view taken along line B-B of FIG. 3;
FIG. 5 is a schematic cross-sectional view taken along line C-C of FIG. 3;
fig. 6 is a schematic perspective view of an inner container in the solid state disk high temperature aging test apparatus provided by the embodiment of the present invention;
FIG. 7 is an enlarged view of portion E of FIG. 6;
fig. 8 is a schematic perspective view of an aging testing jig in the solid state disk high-temperature aging testing apparatus according to the embodiment of the present invention;
FIG. 9 is an enlarged view of portion F of FIG. 8;
FIG. 10 is a schematic cross-sectional view taken along line A-A of FIG. 2;
fig. 11 is an enlarged view of a portion D in fig. 4.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The embodiment of the utility model provides a solid state hard drives high temperature aging testing equipment is through setting up the first electrically conductive piece of being connected with external power supply electricity in ageing chamber to support body setting and testing panel electricity at the aging testing frame and with the first electrically conductive piece complex second electrically conductive piece, utilize the second electrically conductive piece and the first electrically conductive piece cooperation contact to realize testing the power supply of panel, user operation is simple and convenient, and simple structure, greatly reduced manufacturing cost.
Referring to fig. 1 to 8, an embodiment of the present invention provides a solid state disk high temperature aging testing apparatus, including:
a housing 1;
the inner container 2 is arranged in the shell 1, an aging chamber 20 is arranged in the inner container 2, and a first conductive piece 21 electrically connected with an external power supply is arranged on the inner surface of the aging chamber 20; and
the aging test rack 4 can be pushed into the aging chamber 20, the aging test rack 4 comprises a rack body 41 and a test board 42 arranged on the rack body 41, and the rack body 41 is provided with a second conductive member 44 which is electrically connected with the test board 42 and is matched with the first conductive member 21; when the burn-in jig 4 is pushed into the burn-in chamber 20, the second conductive member 44 is brought into contact with the first conductive member 21 to electrically connect the members.
The embodiment of the utility model provides an in, be equipped with on the test panel 42 and be connected and be used for a plurality of slots 43 of grafting solid state hard drives with the electrically conductive 44 electricity of second, after the slot 43 on the test panel 42 is tested in the solid state hard drives insertion, test panel 42 gives the solid state hard drives power supply.
The embodiment of the utility model provides an in, be equipped with the first electrically conductive piece 21 of being connected with external power supply electricity through the internal surface at ageing room 20, and be connected with slot 43 electricity and electrically conductive 44 with first electrically conductive piece 21 complex second at the support body 41 setting of ageing test jig 4, when pushing ageing test jig 4 into ageing room 20, second electrically conductive piece 44 can realize the electricity with first electrically conductive piece 21 contact cooperation and be connected, thereby realize the power supply of ageing test jig 4's survey test panel 42, make user process easy operation, and make this solid state hard drives high temperature ageing testing equipment's simple structure, greatly reduced manufacturing cost.
In the embodiment of the present invention, the front side surface of the casing 1 is provided with the door body 5, the first conductive piece 21 is disposed opposite to the door body 5, and the second conductive piece 44 is disposed at an end of the frame body 41. The door body 5 is provided with an observation window 51 made of a transparent material, and the test condition inside the aging chamber 20 can be directly observed through the observation window 51.
As an embodiment of the present invention, the first conductive member 21 and the second conductive member 44 are inserted into each other, so that the first conductive member 21 and the second conductive member 44 are stably connected, and the first conductive member 21 and the second conductive member 44 are electrically connected with each other with good stability. In addition, the first conductive member 21 is in direct contact with the second conductive member 44 to achieve electrical connection.
Referring to fig. 6-9, as an embodiment of the present invention, the first conductive member 21 includes two pairs of conductive elastic pieces 211 arranged at intervals, the second conductive member 44 includes a base 441 having two insertion holes 440, and conductive posts 442 respectively arranged in one insertion hole 440, and each pair of conductive elastic pieces 211 is inserted into one insertion hole 440 and holds the conductive posts 442. One pair of conductive elastic pieces 211 is connected with the positive electrode of the power supply, the other pair of conductive elastic pieces 211 is connected with the negative electrode of the power supply, and the two pairs of conductive elastic pieces 211 are respectively contacted through the two conductive columns 442, so that the power supply of the test board 42 is realized. Each conductive post 442 clamps the pair of conductive elastic pieces 211, so that the conductive elastic pieces 211 and the conductive posts 442 are in good contact stability and stable and reliable conduction.
In this embodiment, after the solid-state disk is inserted into the slot 43 of the testing board 42 and the burn-in test rack 4 is completely pushed into the burn-in chamber 20, the second conductive member 44 of the burn-in test rack 4 is inserted into the first conductive member 21 to achieve electrical connection, so as to achieve power supply of the testing board 42 of the burn-in test rack 4.
As an embodiment of the present invention, a multi-layer testing board 42 is disposed on the frame body 41, each layer of testing board 42 is correspondingly disposed with a second conductive piece 44, the inner surface of the aging chamber 20 is disposed with the first conductive pieces 21 corresponding to the second conductive pieces 44, and each first conductive piece 21 is connected to the external power source through a control switch.
In this embodiment, the number of layers of the test board 42 is not limited, and can be set according to actual needs. Each layer of the test board 42 is provided with one second conductive member 44 and one first conductive member 21, respectively, so that each layer of the test board 42 can be independently powered.
In this embodiment, each first conductive member 21 is connected to an external power source through a control switch, so that each layer of test board 42 can be controlled to be connected to or disconnected from the external power source through one control switch, thereby facilitating the use of the user.
As an embodiment of the utility model, solid state hard drives high temperature aging testing equipment is including locating the inside outer courage 6 of casing 1, and in outer courage 6 was located to inner bag 2, the interval formed the wind channel 7 with external intercommunication between outer courage 6 and the inner bag 2, and wind channel 7 and ageing room 20 intercommunication are equipped with heater 8 in the wind channel 7.
In this embodiment, the heating wire 8 in the air duct 7 works to generate heat, and hot air in the air duct 7 enters the aging chamber 20, so that the aging chamber 20 is kept at a certain temperature range, and the solid state disk aging test is performed in the aging chamber 20.
Referring to fig. 6 again, as an embodiment of the present invention, the inner container 2 includes a bottom plate 22, air duct plates 23 surrounding the two opposite sides of the bottom plate 22 and having the through hole array 231, a side plate 24 connecting the two air duct plates 23, and a top plate 25 connecting the two air duct plates 23, the bottom plate 22, the two air duct plates 23, the side plate 24, and the top plate 25 define an aging chamber 20, air ducts 7 are formed between the two air duct plates 22 and the inner wall of the outer container 6 and between the top plate 25 and the inner wall of the outer container 6, and the first conductive member 21 is disposed on the side plate 24.
In this embodiment, the two air duct plates 23 of the inner container 2 are spaced apart from the inner wall of the outer container 6, and the top plate 25 of the inner container 2 is spaced apart from the inner wall of the outer container 6, so that the air duct 7 is formed between the inner container 2 and the outer container 6, and the hot air in the air duct 7 enters the aging chamber 20 from the through hole array 231 of the air duct plates 23, so that the heating inside the aging chamber 20 is balanced, and the temperature in the aging chamber 20 is stably maintained within a certain temperature range.
Referring to fig. 4 again, as an embodiment of the present invention, the solid state disk high temperature aging test apparatus further includes a blower device, the blower device includes a motor 81 and blower blades 82, and the top plate 25 is provided with an air suction opening 251 communicated with the air duct 7; the motor 81 is arranged on the shell 1 and connected with the fan blade 82 through a driving rod, the fan blade 82 is arranged between the top plate 25 and the inner wall of the outer container 6 and is opposite to the air suction opening 251, the air inlet pipe 9 and the air outlet pipe 10 penetrating through the shell 1 and the outer container 6 are arranged beside the fan device, and the air inlet pipe 9 and the air outlet pipe 10 are respectively communicated with the aging chamber 20 and the outside.
In this embodiment, the motor 81 drives the fan blade 82 to rotate through the driving rod, so that the outside air enters the air duct 7 from the air inlet pipe 9, the air in the air duct 7 is heated, and the hot air in the air duct 7 flows along the air duct 7 and enters the inside of the aging chamber 20 from the through hole array 231 of the air duct plate 23, and enters the air duct 7 from the air suction opening 251, thereby realizing the circulation of the hot air in the air duct 7. The fan blades 82 are used for accelerating the circulation of hot air in the air duct 7, so that the temperature of the aging chamber 20 is uniformly distributed, and the temperature in the aging chamber 20 is ensured to be stably kept in a certain temperature range.
In this embodiment, the number of the fan devices is two, and the air inlet pipe 9 and the air outlet pipe 10 are both two, so as to increase the air circulation amount of the aging chamber 20, and make the temperature distribution of the aging chamber 20 more uniform.
Referring to fig. 4 and 10, as an embodiment of the present invention, the inner container 2 further includes a ventilation plate 26 disposed on the bottom plate 22 and having a plurality of ventilation holes 261, and a cavity 27 communicating with the outside is formed between the ventilation plate 26 and the bottom plate 22. By providing the ventilation board 26 on the bottom board 22, the ventilation board 26 is used to communicate with the outside, so that the outside air can move upward from the bottom of the aging chamber 20, thereby increasing the air circulation amount of the aging chamber 20 and making the temperature distribution of the aging chamber 20 more uniform.
As an embodiment of the present invention, the solid state disk high temperature aging test device further includes the communicating pipe 11 connecting the cavity 27 and the outside. Wherein, the communicating pipe 11 passes through the top plate 25 of the inner container 2 and the outer container 6 and extends out from the top of the casing 1, and the outside air can enter the cavity 27 from the communicating pipe 11 and enter the aging chamber 20 from the vent hole 261 on the vent plate 26.
Referring to fig. 4 and 11, a plurality of heating wires 8 are uniformly arranged in the air duct 7 from bottom to top at intervals, and a temperature probe 13 is arranged at a position corresponding to each heating wire 8 inside the aging chamber 20. The temperature probe 13 is arranged at the position corresponding to each heating wire 8 on the inner side of each aging chamber 20, so that the temperature of each heating wire 8 in the aging chamber 20 can be detected in real time, the temperature of each region in the aging chamber 20 can be controlled conveniently, and the temperature of each region in the aging chamber 20 can be maintained in a certain interval.
As an embodiment of the utility model, solid state hard drives high temperature aging testing equipment is including locating the insulating layer 12 of 6 inner walls of outer courage, and heater 8 locates between insulating layer 12 and the air duct board 23, and the even interval from bottom to top between every air duct board 23 and the insulating layer 12 sets up a plurality of heaters 8. In the embodiment, three heating wires 8 are uniformly arranged between each air duct plate 23 and the heat insulation layer 12 from bottom to top at intervals, and three temperature probes 13 arranged corresponding to the three heating wires 8 one by one are respectively arranged on each side of the aging chamber 20.
In this embodiment, through set up insulating layer 12 at outer 6 inner walls of courage, play heat preservation and thermal-insulated effect, prevent the heat loss, improve thermal utilization ratio.
The solid state disk high-temperature aging test equipment is provided with a temperature control unit, the temperature control unit is connected with each temperature probe 13, and the temperature control unit controls the work of the heating wire 8 at the corresponding position of each temperature probe, so that the temperature in the aging chamber 20 is controlled within a certain interval. Such as: when the temperature control unit judges that the area temperature detected by the temperature probe 13 exceeds the preset temperature, the temperature control circuit controls the heating wire at the position corresponding to the temperature probe 13 to reduce the working power; when the temperature control unit determines that the area temperature detected by the temperature probe 13 is lower than the preset temperature, the temperature control unit controls the heating wire at the position corresponding to the temperature probe 13 to increase the working power, so that the temperature of each position in the aging chamber 20 is maintained within the preset temperature range.
Referring to fig. 6 and 8 again, as an embodiment of the present invention, the inner surface of the aging chamber 20 is further provided with a positioning hole 28 for positioning the aging test jig 4, the frame body 41 is provided with a positioning column 411 matched with the positioning hole 28, and when the aging test jig 4 is pushed into the aging chamber 20, the positioning column 411 is inserted into the positioning hole 28. Specifically, the positioning hole 28 is disposed on the side plate 24 of the inner container 2, and the positioning column 411 is disposed at one end of the frame body 41.
In this embodiment, when the aging testing jig 4 is pushed into the aging chamber 20, the positioning column 421 at one end of the frame body 41 is inserted into the corresponding positioning hole 28 in the aging chamber 20, so that the aging testing jig 4 is positioned by matching the positioning column 421 with the positioning hole 28, and the aging testing jig 4 is stably placed in the aging chamber 20, thereby making the testing safer and more reliable.
The number of the positioning columns 411 and the positioning holes 28 is four, so that the burn-in test rack 4 is more stably placed in the burn-in chamber 20.
Referring to fig. 8 and 10, as an embodiment of the present invention, a slide rail 14 is installed at the bottom of the aging chamber 20, and the aging test rack 4 is provided with a universal wheel 45 capable of cooperating with the slide rail 14. Specifically, there are two slide rails 14, and the two slide rails 14 are disposed on the bottom plate 22 of the liner 2. When the aging test jig 4 is pushed into the aging chamber 20, the universal wheels 45 are correspondingly clamped into the slide rails 14, and the aging test jig 4 is pushed into the aging chamber 20, so that the aging test jig 4 can be easily pushed into the aging chamber 20, the aging test jig 4 is conveniently pulled out of the aging chamber 20, the labor intensity of workers is greatly reduced, and the use is also very convenient. Wherein, the aging test frame 4 and the universal wheel 45 are made of high temperature resistant materials.
The embodiment of the utility model provides a solid state hard drives high temperature aging testing equipment is through the first electrically conductive piece of being connected with external power supply electricity that sets up in the ageing chamber to support body setting and survey test panel electricity at the ageing test jig and be connected and with first electrically conductive piece complex second electrically conductive piece, when pushing the ageing test jig, second electrically conductive piece can realize the electricity with first electrically conductive piece cooperation contact and be connected, realize the power supply of the survey test panel of ageing test jig, and easy operation is convenient, and greatly reduced manufacturing cost. Through set up the ventilating board on the bottom plate at the inner bag, utilize ventilating board and external intercommunication for outside air can follow the bottom upward movement of ageing room, with the air circulation volume that improves the ageing room, makes ageing room temperature distribution more even. The temperature probes are arranged on the inner side of the aging chamber corresponding to the positions of the heating wires, so that the temperature of each area in the aging chamber can be detected in real time, and the temperature of each area in the aging chamber can be controlled conveniently, so that the temperature of each area in the aging chamber can be maintained in a certain interval.
The above description is only exemplary of the present invention and should not be construed as limiting the present invention, and any modifications, equivalents and improvements made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. The utility model provides a solid state hard drives high temperature aging testing equipment which characterized in that includes:
a housing;
the inner container is arranged in the shell, an aging chamber is arranged in the inner container, and a first conductive piece electrically connected with an external power supply is arranged on the inner surface of the aging chamber; and
the aging test frame can be pushed into the aging chamber and comprises a frame body and a test board arranged on the frame body, and a second conductive piece which is electrically connected with the test board and is matched with the first conductive piece is arranged on the frame body; when the aging test frame is pushed into the aging chamber, the second conductive piece is in contact with the first conductive piece in a matching mode to realize electric connection.
2. The apparatus of claim 1, wherein the first conductive member and the second conductive member are inserted into each other.
3. The solid state disk high-temperature aging test device according to claim 1 or 2, wherein the first conductive member includes two pairs of conductive elastic pieces arranged at intervals, the second conductive member includes a base provided with two insertion holes, and conductive posts respectively arranged in one of the insertion holes, and each pair of conductive elastic pieces is inserted into one of the insertion holes and clamps the conductive posts.
4. The high-temperature aging test equipment for the solid state disk as claimed in claim 1, wherein a plurality of layers of test boards are arranged on the frame body, each layer of test board is correspondingly provided with a second conductive member, the inner surface of the aging chamber is provided with a number of first conductive members corresponding to the number of the second conductive members, and each first conductive member is connected with an external power supply through a control switch.
5. The solid state disk high-temperature aging test device of claim 1, wherein the solid state disk high-temperature aging test device comprises an outer liner arranged inside the shell, the inner liner is arranged in the outer liner, an air duct communicated with the outside is formed between the outer liner and the inner liner at intervals, the air duct is communicated with the aging chamber, and a heating wire is arranged in the air duct.
6. The solid state disk high-temperature aging test device of claim 5, wherein the inner container comprises a bottom plate, air duct plates arranged on two opposite sides of the bottom plate in a surrounding manner and provided with a through hole array, side plates connecting the two air duct plates, and a top plate connecting the two air duct plates, the bottom plate, the two air duct plates, the side plates, and the top plate enclose the aging chamber, the air ducts are formed between the two air duct plates and the inner wall of the outer container and between the top plate and the inner wall of the outer container, and the first conductive member is arranged on the side plates.
7. The solid state disk high-temperature aging test device of claim 6, further comprising a fan device, wherein the fan device comprises a motor and fan blades, and the top plate is provided with an air suction opening communicated with the air duct; the motor is arranged on the shell and connected with fan blades through a driving rod, the fan blades are arranged between the top plate and the inner wall of the outer container and opposite to the air suction opening, the side of the fan device is provided with an air inlet pipe and an air exhaust pipe which penetrate through the shell and the outer container, and the air inlet pipe and the air exhaust pipe are respectively communicated with the aging chamber and the outside.
8. The solid state disk high-temperature aging test device according to claim 6 or 7, wherein the inner container further comprises a ventilation plate which is arranged on the bottom plate and provided with a plurality of ventilation holes, and a cavity communicated with the outside is formed between the ventilation plate and the bottom plate.
9. The solid state disk high-temperature aging testing device according to claim 5, wherein a plurality of the heating wires are arranged in the air duct at intervals from bottom to top, and a temperature probe is arranged at a position corresponding to each heating wire on the inner side of the aging chamber.
10. The solid state disk high-temperature aging test device of claim 1, wherein the inner surface of the aging chamber is further provided with a positioning hole for positioning the aging test rack, and the rack body is provided with a positioning column matched with the positioning hole; when the aging test frame is pushed into the aging chamber, the positioning column is inserted into the positioning hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020508858.XU CN211788187U (en) | 2020-04-09 | 2020-04-09 | Solid state hard drives high temperature aging testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020508858.XU CN211788187U (en) | 2020-04-09 | 2020-04-09 | Solid state hard drives high temperature aging testing equipment |
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| Publication Number | Publication Date |
|---|---|
| CN211788187U true CN211788187U (en) | 2020-10-27 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202020508858.XU Active CN211788187U (en) | 2020-04-09 | 2020-04-09 | Solid state hard drives high temperature aging testing equipment |
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| CN (1) | CN211788187U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114171109A (en) * | 2021-12-22 | 2022-03-11 | 汇钜电科(东莞)实业有限公司 | Aging testing baking oven |
-
2020
- 2020-04-09 CN CN202020508858.XU patent/CN211788187U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114171109A (en) * | 2021-12-22 | 2022-03-11 | 汇钜电科(东莞)实业有限公司 | Aging testing baking oven |
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