CN114142924A - Optical module test platform - Google Patents
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- CN114142924A CN114142924A CN202111285434.7A CN202111285434A CN114142924A CN 114142924 A CN114142924 A CN 114142924A CN 202111285434 A CN202111285434 A CN 202111285434A CN 114142924 A CN114142924 A CN 114142924A
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- 238000012360 testing method Methods 0.000 title claims abstract description 208
- 230000003287 optical effect Effects 0.000 title claims abstract description 169
- 238000004458 analytical method Methods 0.000 claims description 7
- 238000013522 software testing Methods 0.000 abstract description 2
- 238000004891 communication Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 9
- 238000011161 development Methods 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 238000011056 performance test Methods 0.000 description 3
- 238000003491 array Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
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Abstract
The application discloses optical module test platform can provide higher optical module efficiency of software testing. The application provides an optical module test platform includes: each optical module test unit is used for accessing an optical module and a light source, and testing a transmitting end and a receiving end of the accessed optical module and the light source; the control unit is connected to the optical module testing unit and used for controlling the optical module testing unit to test the connected optical module; the control unit is configured to be capable of controlling at least two of the optical module testing units to perform optical module testing simultaneously.
Description
Technical Field
The application relates to the field of optical communication, in particular to an optical module test platform.
Background
In the development process of 5G communication, operation, maintenance and management of a communication system are particularly prominent, and intelligent management and control on a communication unit in real time and remotely are required, which is a current major development bottleneck. Optical communication is the core of 5G key networking, optical modules used in optical communication have higher and higher speed, application environments are more and more complex, and performance tests of the optical modules become more important before optical communication is performed by using the optical modules.
An optical module in the prior art has low testing efficiency, and is not beneficial to the development of optical communication, so an optical module testing platform with high optical module testing efficiency is urgently needed to be provided.
Disclosure of Invention
In view of this, the present application provides an optical module testing platform, which can provide higher optical module testing efficiency.
The application provides an optical module test platform includes:
each optical module test unit is used for accessing an optical module and a light source, and testing a transmitting end and a receiving end of the accessed optical module and the light source;
the control unit is connected to the optical module testing unit and used for controlling the optical module testing unit to test the connected optical module;
the control unit is configured to be capable of controlling at least two of the optical module testing units to perform optical module testing simultaneously.
Optionally, the optical module receiving unit is configured to be able to test a transmitter and a receiver to which the optical module is connected at the same time.
Optionally, the optical module testing unit includes:
a power supply assembly for providing a drive signal;
the first test board is connected to the control unit and the power supply assembly and is also used for being connected to an optical module to be tested and testing the performance of a transmitter and a receiver of the optical module;
the second test board is connected to the power supply component to receive the driving signal, is also used for being connected to a light source to drive the light source, and emits light signals to the optical module assembled on the first test board by the light source;
and the error rate analyzer is connected to the control unit, the first test board and the second test board, and is used for performing error rate analysis on the optical signal transmitted by the transmitter of the optical module connected to the first test board and the optical signal received by the receiver, and performing error rate analysis on the optical signal transmitted by the transmitting end of the light source connected to the second test board.
Optionally, the bit error rate analyzer includes four input terminals, which are respectively a transmitting positive terminal, a transmitting negative terminal, a receiving positive terminal, and a receiving negative terminal;
the first test board is provided with a receiving terminal and a transmitting terminal which are respectively used for being connected to a receiver and a transmitter of an optical module to be tested, and the receiving terminal and the transmitting terminal are respectively connected to a transmitting negative terminal and a receiving positive terminal of the bit error rate analyzer;
the second test board is provided with a transmitting terminal for connecting to the light source, and the transmitting terminal is connected to a transmitting positive terminal of the bit error rate analyzer.
Optionally, the optical module testing unit further includes:
and the attenuator is connected to the first test board, the second test board and the control unit and is used for adjusting the power of the optical signal emitted by the emitter of the optical module connected with the first test board and adjusting the power of the optical signal emitted by the emitting end of the light source connected with the second test board according to the control of the control unit.
Optionally, the optical module testing unit further includes:
and the heat flow meter is connected to the first test board and the control unit and used for providing cold and hot air for the first test board according to the control of the control unit so as to adjust the temperature of the first test board.
Optionally, the power supply assembly includes a first power supply and a second power supply, which respectively supply power to the first test board and the second test board.
Optionally, the test device further comprises a display module, connected to the optical module test unit and the control unit, and configured to display test data output by the optical module test unit according to control of the control unit.
Optionally, the display module includes an oscilloscope, connected to the control unit and the first test board, and configured to display test data output by the optical module connected to the first test board according to control of the control unit.
The optical module test platform is provided with at least two optical module test units, and each optical module test unit can be connected to one optical module, so that the optical module test platform can at least simultaneously realize the evaluation of the two optical modules, thereby greatly accelerating the test speed of the optical modules and improving the test efficiency of the optical modules.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an optical module testing platform in an embodiment of the present application;
fig. 2 is a schematic structural diagram of an optical module testing platform in an embodiment of the present application;
fig. 3 is a schematic diagram illustrating that each optical module testing unit performs transceiving testing simultaneously in an embodiment of the present application;
fig. 4 is a schematic diagram illustrating that each optical module testing unit performs a transceiving test simultaneously in an embodiment of the present application.
Detailed Description
The optical module testing platform is further described with reference to the accompanying drawings and specific embodiments.
Fig. 1 is a schematic structural diagram of an optical module testing platform according to an embodiment of the present application.
In this embodiment, the optical module testing platform includes: each optical module test unit 101 is used for accessing an optical module and a light source, and testing a transmitting end and a receiving end of the accessed optical module and the light source; a control unit 102, connected to the optical module testing unit 101, for controlling the optical module testing unit 101 to test an optical module connected thereto; the control unit 102 is configured to control at least two of the optical module testing units 101 to perform optical module testing simultaneously.
Because the optical module test platform in the application is provided with at least two optical module test units 101, each optical module test unit 101 can be connected to one optical module, the optical module test platform can at least simultaneously realize the evaluation of two optical modules, thereby greatly accelerating the test speed of the optical modules and improving the test efficiency of the optical modules.
The optical module testing unit 101 includes: and the power supply assembly is used for providing a driving signal.
The optical module testing unit 101 includes: the first test board 7 is connected to the control unit 102 and the power supply assembly, and is further used for being connected to an optical module to be tested and testing the performance of a transmitter and a receiver of the optical module;
the first test board 7 needs to communicate with the optical module and complete related tests, and needs to be connected by an I2C wire and all connected to the control unit 102, and when a plurality of optical module test units 101 exist in the optical module test platform, no communication needs to exist between the first test boards 7 in each optical module test unit 101.
The optical module testing unit 101 includes: and the second test board 6 is connected to the power supply component to receive the driving signal, the second test board 6 is also used for being connected to a light source to drive the light source, and the light source emits light signals to the optical module assembled on the first test board 7. The second test board 6 is a light source test board capable of testing a light source emitting a light signal.
The optical module testing unit 101 includes: and an error rate analyzer 8, connected to the control unit 102, the first test board 7 and the second test board 6, configured to perform error rate analysis on an optical signal transmitted by a transmitter of an optical module to which the first test board 7 is connected and an optical signal received by a receiver, and perform error rate analysis on an optical signal transmitted by a transmitting end of a light source to which the second test board 6 is connected.
The ber analyzer 8 may be used to detect distortion during transmission of signals of different rates and different models. Under the condition of an error code rate analyzer 8, the eye diagram of the transmitter of the optical module can be seen in a Digital Communication Analyzer (DCA), and the error code rate transmitted in the optical signal received by the receiver of the optical module can be seen, so that the performance test of a transmitting end and a receiving end is completed.
Since the first test board 7 and the second test board 6 need to supply power to the light module and the light source, respectively, they have different operating voltages. The power supply assembly thus comprises a first power supply 2 and a second power supply 3, respectively supplying the first test board 7 and the second test board 6, so as to satisfy the requirements of the first test board 7 and the second test board 6 for different operating voltages.
The bit error rate analyzer 8 comprises four input ends, namely a transmitting positive terminal, a transmitting negative terminal, a receiving positive terminal and a receiving negative terminal; the first test board 7 is provided with a receiving terminal and a transmitting terminal which are respectively used for connecting to a receiver and a transmitter of an optical module to be tested, and the receiving terminal and the transmitting terminal are respectively connected to a transmitting negative terminal and a receiving positive terminal of the bit error rate analyzer 8; the second test board 6 is provided with a receiving terminal and a transmitting terminal, which are respectively used for connecting to a receiver and a transmitter of an optical module to be tested, and the transmitting terminal is connected to a transmitting positive terminal of the bit error rate analyzer 8.
Referring to fig. 2, the number of the optical module testing units 101 is four, and therefore in the embodiment shown in fig. 2, the number of the first testing board 7 and the number of the second testing board 6 are four respectively, and the ber analyzer 8 includes four sets of the four input terminals for providing ber analysis for the four first testing boards 7 and the four second testing boards 6 in fig. 2.
In fact, when the number of the optical module test units 101 is other, the number of sets of the four input ends of the ber analyzer 8 is changed to meet the requirement of the number of the optical module test units 101.
In the embodiment shown in fig. 2, the control unit 102 comprises an upper computer 9.
The optical module testing unit 101 further includes: and an attenuator 4, connected to the first test board 7, the second test board 6 and the control unit 102, for attenuating the power value of the light according to the control of the control unit 102, so as to adjust the power of the optical signal emitted by the emitter of the optical module on the first test board 7 and the second test board 6.
In the embodiment shown in fig. 2, the input end of the attenuator 4 is connected to the emitting end of the light source, and the output end is connected to the receiving end of the module. The light source can provide light with different power values through the attenuation of the attenuator 4, and then the attenuated light is transmitted to the receiver of the optical module, so that the performance test of the receiver of the optical module can be carried out.
In the embodiment shown in fig. 2, the first power supply, the second power supply, the attenuator 4, the oscilloscope, and the bit error rate analyzer all have 4 channels, which respectively correspond to 4 test boards, the four channels can be independently controlled, and can be simultaneously tested by cooperating with software, and the condition that the devices used for testing the receiving end and the testing end are not simultaneously used and interfere with each other does not exist, so that a hardware environment is created for the independent control of the software.
Thus, the light module receiving unit is configured to be able to simultaneously test the transmitter and the receiver to which the light module is connected.
Specifically, please refer to fig. 3 and 4, wherein fig. 3 is a schematic diagram illustrating that each optical module testing unit performs a transceiving test simultaneously in an embodiment of the present application; fig. 4 is a schematic diagram illustrating that each optical module testing unit performs a transceiving test simultaneously in an embodiment of the present application.
In this embodiment, the plurality of optical module test units 101 are independently controlled in a multithread manner, and the optical module test units 101 may perform tests on performance parameters of the transmitting end and the receiving end respectively without interfering with each other and simultaneously.
The fuzzy block 201 in fig. 3 and fig. 4 is a program block diagram of software in Labview, corresponding to code used in other software languages, for calling a child virtual instrument vi (virtual instrument) in Labview.
Each fuzzy block 201 in fig. 3 corresponds to the test of one channel, and four fuzzy blocks can realize the function of multi-channel parallel test.
In fig. 4, the first left one of the five first fuzzy blocks 301 is a total configuration sub-virtual instrument VI, the remaining four first fuzzy blocks 301 function as the transmitting side test of four channels, and the four second fuzzy blocks 302 function as the receiving side test of four channels.
The 5 parameters in FIG. 3 and FIG. 4 are artificially defined configuration names and control names of labview, without special attention, wherein Threapar3- [ 1-4 ] blocks, Threapar 2- [ 0-4 ] blocks, testblock, Threapar 2- [5-8] blocks are file names to which child VI is called, and executing, bidiationdata and testsulttable are control arrays, channel tables and total test result tables in labview, respectively.
In the embodiment shown in fig. 2, the optical module testing unit 101 further includes: the heat flow meter 1 is connected to the first test board 7 and the control unit 102, and is configured to provide cold and hot air to the first test board 7 according to the control of the control unit 102, so as to adjust the temperature of the first test board 7. Moreover, the heat flow meter 1 can also provide a temperature environment required by the test for the optical module test platform.
The power supply assembly comprises a first power supply 2 and a second power supply 3 for powering the first test board 7 and the second test board 6, respectively.
The optical module test platform further comprises a display module, wherein the display module is connected to the optical module test unit 101 and the control unit 102 and is used for displaying the test data output by the optical module test unit 101 so that a user can obtain the test data in time.
The display module comprises an oscilloscope 5, is connected to the first test board 7, and is used for displaying test data output by the optical module connected to the first test board 7.
Because the optical module test platform in this application has at least two optical module test unit 101, each optical module test unit 101 can both be connected to one the optical module, therefore, this optical module test platform can realize the evaluation of two optical modules simultaneously at least, consequently, has accelerated optical module's test speed greatly, has improved optical module's efficiency of software testing, has also improved optical module test platform's rate of utilization.
The above-mentioned embodiments are only examples of the present application, and not intended to limit the scope of the present application, and all equivalent structures or equivalent flow transformations made by the contents of the specification and the drawings, such as the combination of technical features between the embodiments and the direct or indirect application to other related technical fields, are also included in the scope of the present application.
Claims (9)
1. An optical module test platform, comprising:
each optical module test unit is used for accessing an optical module and a light source, and testing a transmitting end and a receiving end of the accessed optical module and the light source;
the control unit is connected to the optical module testing unit and used for controlling the optical module testing unit to test the connected optical module;
the control unit is configured to be capable of controlling at least two of the optical module testing units to perform optical module testing simultaneously.
2. The optical module test platform of claim 1, wherein the optical module receiving unit is configured to be able to simultaneously test a transmitter and a receiver to which the optical module is connected.
3. The optical module test platform of claim 1, wherein the optical module test unit comprises:
a power supply assembly for providing a drive signal;
the first test board is connected to the control unit and the power supply assembly and is also used for being connected to an optical module to be tested and testing the performance of a transmitter and a receiver of the optical module;
the second test board is connected to the power supply component to receive the driving signal, is also used for being connected to a light source to drive the light source, and emits light signals to the optical module assembled on the first test board by the light source;
and the error rate analyzer is connected to the control unit, the first test board and the second test board, and is used for performing error rate analysis on the optical signal transmitted by the transmitter of the optical module connected to the first test board and the optical signal received by the receiver, and performing error rate analysis on the optical signal transmitted by the transmitting end of the light source connected to the second test board.
4. The optical module test platform of claim 3, wherein the bit error rate analyzer comprises four input terminal interfaces, namely a transmitting positive terminal interface, a transmitting negative terminal interface, a receiving positive terminal interface and a receiving negative terminal interface;
the first test board is provided with a receiving positive terminal and a transmitting negative terminal which are respectively used for being connected to a receiver and a transmitter of an optical module to be tested, the receiving positive terminal is connected to a receiving positive terminal interface of the bit error rate analyzer, and the transmitting negative terminal is connected to a transmitting negative terminal interface of the bit error rate analyzer;
the second test board is provided with a transmitting positive terminal for being connected to the light source, and the transmitting positive terminal is connected to a transmitting positive terminal interface of the bit error rate analyzer.
5. The optical module test platform of claim 3, wherein the optical module test unit further comprises:
and the attenuator is connected to the first test board, the second test board and the control unit and is used for adjusting the power of the optical signal emitted by the emitter of the optical module connected with the first test board and adjusting the power of the optical signal emitted by the emitting end of the light source connected with the second test board according to the control of the control unit.
6. The optical module test platform of claim 3, wherein the optical module test unit further comprises:
and the heat flow meter is connected to the first test board and the control unit and used for providing cold and hot air for the first test board according to the control of the control unit so as to adjust the temperature of the first test board.
7. The optical module test platform of claim 3, wherein the power supply assembly comprises a first power supply and a second power supply for powering the first test board and the second test board, respectively.
8. The optical module testing platform according to claim 1, further comprising a display module, connected to the optical module testing unit and the control unit, for displaying the test data output by the optical module testing unit according to the control of the control unit.
9. The optical module testing platform of claim 8, wherein the display module comprises an oscilloscope connected to the control unit and the first testing board, and configured to display the test data output by the optical module connected to the first testing board according to the control of the control unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111285434.7A CN114142924A (en) | 2021-11-02 | 2021-11-02 | Optical module test platform |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111285434.7A CN114142924A (en) | 2021-11-02 | 2021-11-02 | Optical module test platform |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017118149A1 (en) * | 2016-01-07 | 2017-07-13 | 烽火通信科技股份有限公司 | Method and apparatus for rapidly collecting fibre interconnection information |
| CN108494482A (en) * | 2018-04-11 | 2018-09-04 | 武汉普赛斯电子技术有限公司 | A kind of four station optical modules test system |
| CN211656146U (en) * | 2020-04-19 | 2020-10-09 | 大连优迅科技有限公司 | ROSA performance test system |
| CN112422182A (en) * | 2020-11-20 | 2021-02-26 | 平湖科谱激光科技有限公司 | Multifunctional debugging and testing device and method for WDM (wavelength division multiplexing) optical module |
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2021
- 2021-11-02 CN CN202111285434.7A patent/CN114142924A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017118149A1 (en) * | 2016-01-07 | 2017-07-13 | 烽火通信科技股份有限公司 | Method and apparatus for rapidly collecting fibre interconnection information |
| CN108494482A (en) * | 2018-04-11 | 2018-09-04 | 武汉普赛斯电子技术有限公司 | A kind of four station optical modules test system |
| CN211656146U (en) * | 2020-04-19 | 2020-10-09 | 大连优迅科技有限公司 | ROSA performance test system |
| CN112422182A (en) * | 2020-11-20 | 2021-02-26 | 平湖科谱激光科技有限公司 | Multifunctional debugging and testing device and method for WDM (wavelength division multiplexing) optical module |
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