CN114137308B - Method for obtaining equipment loop resistance based on highest temperature value of electrical equipment - Google Patents
Method for obtaining equipment loop resistance based on highest temperature value of electrical equipment Download PDFInfo
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- 238000001514 detection method Methods 0.000 abstract description 2
- 239000004020 conductor Substances 0.000 description 4
- 230000032683 aging Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Abstract
A method for obtaining equipment loop resistance based on highest temperature value of electrical equipment relates to the technical field of electrical equipment detection. The method solves the problem that the prior method cannot obtain the accurate loop resistance of the electrical equipment due to the influence of the actual working condition, and establishes a relation between the loop resistance of the equipment and the environmental temperature and the load current of the equipment before the electrical equipment is put into use; and after the equipment is put into use, acquiring the current loop resistance value of the electrical equipment according to the current environment temperature of the electrical equipment, the equipment loop resistance and the load current by utilizing the relational expression. The invention is suitable for obtaining the loop resistance of the electrical equipment.
Description
Technical Field
The invention relates to the technical field of electrical equipment detection.
Background
The loop resistance of the electrical equipment can directly influence the heating value of the equipment when the equipment is electrified, and the size of the loop resistance can directly represent the working state of the equipment. By measuring the resistance value of the loop, whether the equipment is in a normal state or in a bad state such as virtual connection, aging, corrosion and the like can be known.
However, in the energized state, it is difficult to directly measure the loop resistance of the electrical device, and heat is generated when current passes through the conductor, which is called the thermal effect of the current. According to Joule's law, the heat generated by a current passing through a conductor is proportional to the resistance of the conductor, to the square of the current passing through the conductor, and to the time of energization, and these heats are not directly equivalent to the temperature of the device, and the specific heat of the wire needs to be known to calculate the temperature rise under adiabatic conditions. In a laboratory environment, the relationship between the maximum temperature value and the load current of the same device is observed, also approximately similar to Joule's law, but if factors such as ambient temperature and air flow are introduced, the temperature rise of the wire becomes complex and unworkable. If a simple set of equations similar to Joule's law can be used to describe the relationship between device temperature and loop temperature, load current, and its loop resistance. The loop resistance of the device can be calculated in turn using this formula.
However, due to the influence of the actual working condition, it is difficult to directly deduce the loop resistance of the device. Thus, an accurate electrical device loop resistance cannot be obtained at present.
Disclosure of Invention
The invention aims to solve the problem that the existing method cannot acquire accurate loop resistance of electrical equipment due to the influence of actual working conditions, and provides a method for acquiring the loop resistance of the equipment based on the highest temperature value of the electrical equipment.
The invention discloses a method for obtaining equipment loop resistance based on the highest temperature value of electrical equipment, which comprises the following steps:
before the electrical equipment is put into use, establishing a relation between equipment loop resistance, equipment environment temperature and load current;
after the equipment is put into use, the current loop resistance of the electrical equipment is obtained according to the current environmental temperature and the load current of the electrical equipment by utilizing the relational expression;
establishing a relation between the loop resistance of the equipment, the ambient temperature of the equipment and the load current; the method specifically comprises the following steps:
step S1, placing the electrical equipment in a high-low temperature box, adjusting the temperature of the high-low temperature box and the load current of the equipment, and collecting the highest temperature of the loop resistance of the electrical equipment in real time;
step S2, drawing a highest temperature value curve of the loop resistor at different environment temperatures and different load currents by using the data acquired in the step S1;
s3, obtaining a curve formula of the change of the highest temperature of the loop resistance along with the environmental temperature by utilizing the curves of the highest temperature values of the loop resistance at different environmental temperatures;
s4, obtaining deviation of the highest temperature value of the loop resistor along with the change of the load current by utilizing curves of the highest temperature value of the loop resistor at different load currents, and adding the deviation into a curve formula of the highest temperature of the loop resistor along with the change of the environment temperature;
and S5, deducing and obtaining a relation between the loop resistance of the equipment, the ambient temperature of the equipment and the load current by using the formula obtained in the step S4.
Further, in the present invention, in step S3, the specific method for obtaining the curve formula of the change of the highest temperature of the loop resistance with the ambient temperature is as follows:
and obtaining a curve relation between the highest temperature of the equipment and the ambient temperature according to the curve of the highest temperature changing along with the ambient temperature, wherein the load current is below 100A:
T apparatus and method for controlling the operation of a device ＝kT Environment (environment) +b
Then fitting and averaging the curve of the highest temperature along with the change of the environmental temperature to obtain a k value and a b value; the K is a weight coefficient of the temperature rise effect of the ambient temperature on the resistance of the equipment loop, b is a constant, T Apparatus and method for controlling the operation of a device For the device loop resistance temperature, T Environment (environment) Is the ambient temperature and takes as a baseline the curve between the device's highest temperature and the ambient temperature below the load current 100A.
Further, in the present invention, k is 0.59 and b is 7.5.
Further, in step S4, the deviation generated by the highest temperature value of the loop resistor along with the change of the load current is obtained as follows:
by curve fitting: delta T I ＝1.39×(I-I 0 ) 2 R+T c
Wherein R is the loop resistance of the device, I is the load current, I 0 When the loop resistance value is larger, the base point current is smaller, the value range is between 0.1KA and 0.25KA, and the average value of 0.175KA can be taken as an empirical value; t (T) c For correcting the temperature, the value range is-1.6-1.5 ℃.
Further, in the invention, in step S4, the deviation is added to a curve formula of the highest temperature of the loop resistance along with the ambient temperature;
T apparatus and method for controlling the operation of a device ＝0.59×T Environment (environment) +1.39×(I-0.175) 2 R Loop circuit +7.5
I is the loop current of the device, R Loop circuit Is the loop resistance of the device.
Further, in step S5, the relationship between the loop resistance of the device, the ambient temperature of the device and the load current is derived as follows:
according to the invention, a curve relation of the loop resistance of the electrical equipment along with the change of load current and the change of ambient temperature is obtained in a curve fitting mode, and when the equipment is used, the ambient temperature and the temperature of the highest temperature point of the equipment are directly substituted into the relation, so that the loop resistance of the equipment under the current temperature and the load current environment can be directly obtained, the loop resistance can be rapidly obtained, and meanwhile, the loop resistance of the electrical equipment can be accurately and rapidly obtained according to different working conditions of the equipment.
Drawings
FIG. 1 is a graph of the maximum temperature values of a 100KV disconnecting switch at different ring temperatures and different load currents;
FIG. 2 is a graph of the maximum temperature values of clamp A at different ring temperatures and different load currents;
FIG. 3 is a graph of the maximum temperature values of clamp B at different ring temperatures and different load currents;
fig. 4 is a graph of the offset temperature of clamp a relative to baseline at different loop temperatures and different load currents.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that, without conflict, the embodiments of the present invention and features of the embodiments may be combined with each other.
The first embodiment is as follows: next, a method for obtaining a loop resistance of an electrical device based on a maximum temperature value of the electrical device according to the present embodiment will be described with reference to fig. 1, where the method includes:
before the electrical equipment is put into use, establishing a relation between equipment loop resistance, equipment environment temperature and load current;
after the equipment is put into use, the current loop resistance of the electrical equipment is obtained according to the current ambient temperature and the load current of the electrical equipment;
establishing a relation between the loop resistance of the equipment, the ambient temperature of the equipment and the load current; the method specifically comprises the following steps:
step S1, placing the electrical equipment in a high-low temperature box, adjusting the temperature of the high-low temperature box and the load current of the equipment, and collecting the highest temperature of the loop resistance of the electrical equipment in real time;
step S2, drawing a highest temperature value curve of the loop resistor at different environment temperatures and different load currents by using the data acquired in the step S1;
s3, obtaining a curve formula of the change of the highest temperature of the loop resistance along with the environmental temperature by utilizing the curves of the highest temperature values of the loop resistance at different environmental temperatures;
s4, obtaining deviation of the highest temperature value of the loop resistor along with the change of the load current by utilizing curves of the highest temperature value of the loop resistor at different load currents, and adding the deviation into a curve formula of the highest temperature of the loop resistor along with the change of the environment temperature;
and S5, deducing and obtaining a relation between the loop resistance of the equipment, the ambient temperature of the equipment and the load current by using the formula obtained in the step S4.
Further, in the present invention, in step S3, the specific method for obtaining the curve formula of the change of the highest temperature of the loop resistance with the ambient temperature is as follows:
and obtaining a curve relation between the highest temperature of the equipment and the ambient temperature according to the curve of the highest temperature changing along with the ambient temperature, wherein the load current is below 100A:
T apparatus and method for controlling the operation of a device ＝kT Environment (environment) +b
And then the maximum temperature is curved along with the change of the environmental temperatureCarrying out fitting and averaging on the lines to obtain a k value and a b value; the K is a weight coefficient of the temperature rise effect of the ambient temperature on the resistance of the equipment loop, b is a constant, T Apparatus and method for controlling the operation of a device For the device loop resistance temperature, T Environment (environment) Is the ambient temperature and takes as a baseline the curve between the device's highest temperature and the ambient temperature below the load current 100A.
Further, in the present invention, K is 0.59 and b is 7.5.
Further, in step S4, the deviation generated by the highest temperature value of the loop resistor along with the change of the load current is obtained as follows:
by curve fitting: delta T I ＝1.39×(I-I 0 ) 2 R+T c
Wherein R is the loop resistance of the device, I is the load current, I 0 When the loop resistance value is larger, the base point current is smaller, the value range is between 0.1KA and 0.25KA, and the average value of 0.175KA can be taken as an empirical value; t (T) c For correcting the temperature, the value range is-1.6-1.5 ℃.
Further, in the invention, in step S4, the deviation is added to a curve formula of the highest temperature of the loop resistance along with the ambient temperature;
T apparatus and method for controlling the operation of a device ＝0.59×T Environment (environment) +1.39×(I-0.175) 2 R Loop circuit +7.5
I is the loop current of the device, R Loop circuit Is the loop resistance of the device.
Further, in step S5, the relationship between the loop resistance of the device, the ambient temperature of the device and the load current is derived as follows:
specific examples:
three electrical devices are selected in the experiment, and the loop resistances are 16.2 mu omega, 40.7 mu omega and 69.9 mu omega respectively according to the following proportion
The method is used for respectively carrying out sampling record on the maximum temperature value of the equipment, and the method comprises the following steps of:
TABLE 1
TABLE 2
TABLE 3 Table 3
For ease of observation and analysis, the above data were formulated in the form of a transformation graph, as shown in FIGS. 1-3.
Analyzing fig. 1 to 3, the following points can be obtained:
for the same device, as the ambient temperature increases, the temperature value of the highest heat generation point also increases, and the rate of increase is accelerated.
This characteristic is relatively consistent across different devices. Moreover, the temperature rise profile can be roughly divided into two sections: a stage below 0 ℃ and a stage above 0 ℃. The slopes of the two curves are different, and the focus is to analyze the situation below 0 ℃.
The increase in temperature rise is different at different load currents. It can be seen that below the load current 100A, the relationship between the device maximum temperature and the ambient temperature can be simplified approximately to a fixed linear increase relationship, namely:
T apparatus and method for controlling the operation of a device ＝kT Environment (environment) +b
After fitting and averaging the relevant experimental data, the k value and the b value can be obtained, and the formula is as follows:
T apparatus and method for controlling the operation of a device ＝0.59×T Environment (environment) +7.5
The temperature profile below the load current 100A may be unified into the above-described profile, which may be referred to as a baseline. The temperature profile above the load current 100A can be considered to be superimposed on this baseline by an offset.
Looking at the curve sets of clamps a and B, it can be seen that at ambient temperatures below 0 ℃, the increase in the maximum temperature value of the device due to the increase in load current exhibits a fixed bias value and can be described by the following equation:
T apparatus and method for controlling the operation of a device ＝kT Environment (environment) +b+ΔT I ＝T Base line +ΔT I
Wherein DeltaT I Is an offset relative to the load current I, i.e. has a delta T I ＝T Apparatus and method for controlling the operation of a device -T Base line Therefore, the temperature value of the equipment is subtracted from the baseline temperature value to obtain DeltaT I Taking the wire clip a as an example, the following fig. 4 can be obtained:
fitting these offset temperature data yields the following equation, where load current I is in Kiloamperes (KA):
ΔT I ＝56.5×I 2 -27.8×I+4.8＝56.5×(I-0.25) 2 +1.5
similarly, a similar equation for wire clamp B can be obtained:
ΔT I ＝95.2×I 2 -19.5×I-0.7＝95.2×(I-0.1) 2 -1.6
the coefficients of the two formulas are different, which is easily thought to be due to the different loop resistances of clip a and clip B. The loop resistance values of both 40.7 μΩ and 69.9 μΩ are introduced, and the two equations above can be combined into the following equation:
ΔT I ＝1.39×(I-I 0 ) 2 R+T c
wherein R is the loop resistance of the device, I 0 The base current is a base current, and the base current is smaller as the loop resistance value is larger, the base current is in the range of 0.1KA to 0.25KA, and the average value of 0.175KA can be taken as an empirical value. T (T) c For temperature correction, the value range is-1.6-1.5 ℃, and the average value can be 0 ℃.
Finally, a simplified empirical formula for the maximum temperature value of the device is obtained as follows:
T apparatus and method for controlling the operation of a device ＝0.59×T Environment (environment) +1.39×(I Load(s) -0.175) 2 R Loop circuit +7.5
In this way, a relation is established between the highest temperature value that the electrical device can reach and the load current, loop resistance and ambient temperature of the device.
According to the above formula, the calculation formula for obtaining the loop resistance is as follows:
the experimental data in the foregoing table can be used to verify that, for example, when the wire clamp a is at an ambient temperature of-15 ℃ and a load current of 0.4KA, the highest temperature is 2.5 ℃, and r=54.7 μΩ (actual value is 40.7 μΩ) is obtained by substituting a known amount into the above formula.
When the ambient temperature of the wire clamp B is 0 ℃ and the load current is 0.6KA, the highest temperature value is 35.8 ℃, and r=113 μΩ (the actual value is 69.9 μΩ) can be obtained by substituting the above formula.
The difference from the actual value is still a certain, and this is mainly related to the fixed basic current value adopted in the formula, as described above, the basic current value should be related to the loop resistance, and since only two kinds of data of the loop resistance values are adopted in the present invention, the obtained basic current value is rough, and more groups of experimental data are collected later, so that a more accurate basic current value can be obtained, and a more accurate loop resistance can be calculated.
Although the invention herein has been described with reference to particular embodiments, it is to be understood that these embodiments are merely illustrative of the principles and applications of the present invention. It is therefore to be understood that numerous modifications may be made to the illustrative embodiments and that other arrangements may be devised without departing from the spirit and scope of the present invention as defined by the appended claims. It should be understood that the different dependent claims and the features described herein may be combined in ways other than as described in the original claims. It is also to be understood that features described in connection with separate embodiments may be used in other described embodiments.
Claims (5)
1. A method for obtaining a loop resistance of an electrical device based on a maximum temperature value of the electrical device, the method comprising:
before the electrical equipment is put into use, establishing a relation between equipment loop resistance, equipment environment temperature and load current;
after the equipment is put into use, the current loop resistance of the electrical equipment is obtained according to the current environmental temperature and the load current of the electrical equipment by utilizing the relational expression;
establishing a relation between the loop resistance of the equipment, the ambient temperature of the equipment and the load current; the method specifically comprises the following steps:
step S1, placing the electrical equipment in a high-low temperature box, adjusting the temperature of the high-low temperature box and the load current of the equipment, and collecting the highest temperature of the loop resistance of the electrical equipment in real time;
step S2, drawing a highest temperature value curve of the loop resistor at different environment temperatures and different load currents by using the data acquired in the step S1;
s3, obtaining a curve formula of the change of the highest temperature of the loop resistance along with the environmental temperature by utilizing the curves of the highest temperature values of the loop resistance at different environmental temperatures;
s4, obtaining deviation of the highest temperature value of the loop resistor along with the change of the load current by utilizing curves of the highest temperature value of the loop resistor at different load currents, and adding the deviation into a curve formula of the highest temperature of the loop resistor along with the change of the environment temperature;
s5, deducing and obtaining a relation between the loop resistance of the equipment, the ambient temperature of the equipment and the load current by using the formula obtained in the step S4;
in step S3, the specific method for obtaining the curve formula of the change of the highest temperature of the loop resistance with the ambient temperature is as follows:
and obtaining a curve relation between the highest temperature of the equipment and the ambient temperature according to the curve of the highest temperature changing along with the ambient temperature, wherein the load current is below 100A:
T apparatus and method for controlling the operation of a device ＝kT Environment (environment) +b
Then fitting and averaging the curve of the highest temperature along with the change of the environmental temperature to obtain a k value and a b value; the K is a weight coefficient of the temperature rise effect of the ambient temperature on the resistance of the equipment loop, b is a constant, T Apparatus and method for controlling the operation of a device For the device loop resistance temperature, T Environment (environment) Is the ambient temperature and takes as a baseline the curve between the device's highest temperature and the ambient temperature below the load current 100A.
2. A method of deriving a device loop resistance based on a maximum temperature of an electrical device according to claim 1, wherein k is 0.59 and b is 7.5.
3. The method for obtaining the loop resistance of the equipment based on the highest temperature value of the electrical equipment according to claim 1 or 2, wherein in the step S4, the deviation of the highest temperature value of the loop resistance generated by the change of the load current is obtained as follows:
by curve fitting: delta T I ＝1.39×(I-I 0 ) 2 R+T c
Wherein R is the loop resistance of the device, I is the load current, I 0 When the loop resistance value is larger, the base point current is smaller, the value range is between 0.1KA and 0.25KA, and the average value of 0.175KA can be taken as an empirical value; t (T) c For correcting the temperature, the value range is-1.6-1.5 ℃.
4. A method for obtaining a loop resistance of an electrical device based on a maximum temperature value of the electrical device according to claim 3, wherein in step S4, the deviation is added to a loop resistance maximum temperature versus ambient temperature curve formula;
T apparatus and method for controlling the operation of a device ＝0.59×T Environment (environment) +1.39×(I-0.175) 2 R Loop circuit +7.5
I is the loop current of the device, R Loop circuit Is the loop resistance of the device.
5. The method for obtaining the loop resistance of the equipment based on the highest temperature value of the electrical equipment according to claim 4, wherein in the step S5, the relationship between the loop resistance of the equipment, the environmental temperature of the equipment and the load current is derived as follows:
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104698283A (en) * | 2013-12-04 | 2015-06-10 | 大连东浦机电有限公司 | Resistor test method |
| CN104807561A (en) * | 2015-04-29 | 2015-07-29 | 清华大学深圳研究生院 | Calibrating circuit and calibrating method for resistance-type temperature sensing chip |
| JP2017215303A (en) * | 2016-06-02 | 2017-12-07 | 三菱電機エンジニアリング株式会社 | Resistance value measurement circuit |
| CN111239493A (en) * | 2020-02-06 | 2020-06-05 | 张军 | Method for measuring resistance of power transmission cable |
| CN112816789A (en) * | 2021-01-29 | 2021-05-18 | 深圳博创汇能科技有限公司 | Conductor internal resistance abnormity identification method, device, equipment and computer storage medium |
-
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104698283A (en) * | 2013-12-04 | 2015-06-10 | 大连东浦机电有限公司 | Resistor test method |
| CN104807561A (en) * | 2015-04-29 | 2015-07-29 | 清华大学深圳研究生院 | Calibrating circuit and calibrating method for resistance-type temperature sensing chip |
| JP2017215303A (en) * | 2016-06-02 | 2017-12-07 | 三菱電機エンジニアリング株式会社 | Resistance value measurement circuit |
| CN111239493A (en) * | 2020-02-06 | 2020-06-05 | 张军 | Method for measuring resistance of power transmission cable |
| CN112816789A (en) * | 2021-01-29 | 2021-05-18 | 深圳博创汇能科技有限公司 | Conductor internal resistance abnormity identification method, device, equipment and computer storage medium |
Non-Patent Citations (1)
| Title |
|---|
| 基于有限元法的跳线线夹温度场计算及影响因素分析;王菲菲 等;《新技术新工艺》;第1卷(第1期);42-46 * |
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Inventor after: Zhang Dewen Inventor after: Xu Minhu Inventor after: Qiu Shuaihui Inventor after: Yang Wenshuai Inventor after: Wang Zhenpeng Inventor after: Jiang Shijin Inventor after: Zhang Jian Inventor after: Liu Heqian Inventor after: Shang Shulei Inventor after: Zhang Zhen Inventor after: Zhang Peng Inventor after: Zhao Xiangyu Inventor after: Chen Shiyu Inventor before: Zhang Dewen Inventor before: Qiu Shuaihui Inventor before: Yang Wenshuai Inventor before: Wang Zhenpeng Inventor before: Zhang Jian Inventor before: Liu Heqian Inventor before: Shang Shulei Inventor before: Zhang Zhen Inventor before: Zhang Peng Inventor before: Zhao Xiangyu Inventor before: Chen Shiyu Inventor before: Xu Minhu |