CN114137308A - Method for acquiring loop resistance of electrical equipment based on highest temperature value of electrical equipment - Google Patents
Method for acquiring loop resistance of electrical equipment based on highest temperature value of electrical equipment Download PDFInfo
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- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Abstract
A method for obtaining loop resistance of an electrical device based on the highest temperature value of the electrical device relates to the technical field of electrical device detection. The problem that the accurate loop resistance of the electrical equipment cannot be obtained due to the influence of actual working conditions in the existing method is solved, and before the electrical equipment is put into use, a relation between the loop resistance of the equipment and the environmental temperature and load current of the equipment is established; and after the equipment is put into use, acquiring the current loop resistance value of the electrical equipment according to the current environment temperature of the electrical equipment, the loop resistance of the equipment and the load current by using the relational expression. The method is suitable for obtaining the loop resistance of the electrical equipment.
Description
Technical Field
The invention relates to the technical field of electrical equipment detection.
Background
The loop resistance of the electrical equipment directly influences the heat productivity of the equipment when the equipment is electrified, and the size of the loop resistance can directly represent the working state of the equipment. By measuring the resistance value of the loop, whether the equipment is in a normal state or in a bad state such as virtual connection, aging, corrosion and the like can be known.
However, in the energized state, it is difficult to directly measure the loop resistance of the electrical device, and heat is generated when current passes through the conductor, which is called thermal effect of the current. According to joule's law, the heat generated by the current passing through the conductor is proportional to the resistance of the conductor, to the square of the current passing through the conductor, and to the energization time, and this heat is not directly equivalent to the temperature of the equipment, and it is also necessary to know the specific heat of the wire in order to calculate the temperature rise under adiabatic conditions. In a laboratory environment, the relationship between the maximum temperature value and the load current of the same equipment is observed, which is also roughly similar to joule's law, but if these factors of ambient temperature and air flow are introduced, the temperature rise of the wire becomes complicated and unthinkable. If the relationship between the device temperature and the loop temperature, the load current, and its loop resistance can be described by a simple set of equations similar to joule's law. The loop resistance of the device can then be deduced in turn using this formula.
However, it is difficult to directly derive the loop resistance of the device due to the influence of the actual working conditions. Therefore, at present, accurate loop resistance of the electrical equipment cannot be obtained.
Disclosure of Invention
The invention aims to solve the problem that the accurate loop resistance of the electrical equipment cannot be obtained due to the influence of actual working conditions in the existing method, and provides a method for obtaining the loop resistance of the electrical equipment based on the highest temperature value of the electrical equipment.
The invention discloses a method for acquiring loop resistance of equipment based on the highest temperature value of electrical equipment, which comprises the following steps:
before the electrical equipment is put into use, establishing a relation between the loop resistance of the equipment and the environmental temperature and load current of the equipment;
after the equipment is put into use, acquiring the current loop resistance value of the electrical equipment according to the current environment temperature and the load current of the electrical equipment by using the relational expression;
establishing a relation between the loop resistance of the equipment and the environmental temperature and load current of the equipment; the method specifically comprises the following steps:
step S1, placing the electrical equipment in a high-low temperature box, adjusting the temperature of the high-low temperature box and the load current of the equipment, and collecting the highest temperature of the loop resistor of the electrical equipment in real time;
step S2, drawing a curve of the highest temperature value of the loop resistor at different environmental temperatures and different load currents by using the data collected in the step S1;
step S3, obtaining a curve formula of the change of the highest temperature of the loop resistance along with the environmental temperature by using the curve of the highest temperature value of the loop resistance at different environmental temperatures;
step S4, obtaining the deviation of the maximum temperature value of the loop resistance along with the change of the load current by using the curve of the maximum temperature value of the loop resistance in different load currents, and adding the deviation into a curve formula of the maximum temperature value of the loop resistance along with the change of the environment temperature;
and step S5, deriving and obtaining a relation between the loop resistance of the equipment and the environmental temperature and the load current of the equipment by using the formula obtained in the step S4.
Further, in the present invention, in step S3, the specific method for obtaining the formula of the curve of the maximum temperature of the loop resistance along with the change of the environmental temperature is as follows:
the curve relation between the highest temperature of the equipment and the ambient temperature is obtained according to the curve of the highest temperature along with the ambient temperature, and the curve relation is below the load current 100A:
Tdevice＝kTEnvironment(s)+b
Fitting a curve of the maximum temperature changing along with the ambient temperature to obtain an average value, and acquiring a k value and a b value; k is the weight coefficient of the temperature rise of the loop resistance of the equipment caused by the environment temperature, b is a constant, and T isDeviceIs the temperature of the loop resistance, T, of the deviceEnvironment(s)The ambient temperature is taken and the curve between the maximum temperature of the device at load current below 100A and the ambient temperature is taken as the baseline.
Further, in the present invention, k is 0.59 and b is 7.5.
Further, in the present invention, in step S4, the deviation of the maximum temperature value of the loop resistance caused by the change of the load current is obtained as follows:
by curve fitting: delta TI＝1.39×(I-I0)2R+Tc
Wherein R is the loop resistance of the device, I is the load current, I0For the basic current, when the loop resistance is larger, the base point current is smaller, the value range is 0.1 KA-0.25 KA, and the average value of 0.175KA can be taken as an empirical value; t iscTo correct the temperature, take the rangeThe temperature is-1.6-1.5 ℃.
Further, in the present invention, in step S4, the deviation is added to a curve formula of the maximum temperature of the loop resistance along with the change of the ambient temperature;
Tdevice＝0.59×TEnvironment(s)+1.39×(I-0.175)2RLoop circuit+7.5
I is the loop current of the device, RLoop circuitIs the loop resistance of the device.
Further, in step S5, the relationship between the device loop resistance and the ambient temperature and the load current of the device is derived as follows:
according to the invention, a curve relation formula of the loop resistance value of the electrical equipment along with the change of the load current and the change of the ambient temperature is obtained by adopting a curve fitting mode, and when the equipment is used, the ambient temperature and the temperature of the highest temperature point of the equipment are directly substituted into the relation formula, so that the loop resistance value of the equipment under the current temperature and the load current environment can be directly obtained, the loop resistance value can be rapidly obtained, and meanwhile, the loop resistance of the electrical equipment can be accurately and rapidly obtained according to different working conditions of the equipment.
Drawings
FIG. 1 is a graph of the maximum temperature values of a 100KV disconnector at different ring temperatures and different load currents;
FIG. 2 is a graph of the maximum temperature values of the clamp A at different ring temperatures and different load currents;
FIG. 3 is a graph of the maximum temperature values of the wire clamp B at different ring temperatures and different load currents;
fig. 4 is a graph of the offset temperature of clamp a from the baseline at different loop temperatures and different load currents.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
The first embodiment is as follows: the present embodiment is described below with reference to fig. 1, and the method for acquiring the device loop resistance based on the maximum temperature value of the electrical device according to the present embodiment includes:
before the electrical equipment is put into use, establishing a relation between the loop resistance of the equipment and the environmental temperature and load current of the equipment;
after the equipment is put into use, acquiring the current loop resistance value of the electrical equipment according to the current environment temperature and the load current of the electrical equipment;
establishing a relation between the loop resistance of the equipment and the environmental temperature and load current of the equipment; the method specifically comprises the following steps:
step S1, placing the electrical equipment in a high-low temperature box, adjusting the temperature of the high-low temperature box and the load current of the equipment, and collecting the highest temperature of the loop resistor of the electrical equipment in real time;
step S2, drawing a curve of the highest temperature value of the loop resistor at different environmental temperatures and different load currents by using the data collected in the step S1;
step S3, obtaining a curve formula of the change of the highest temperature of the loop resistance along with the environmental temperature by using the curve of the highest temperature value of the loop resistance at different environmental temperatures;
step S4, obtaining the deviation of the maximum temperature value of the loop resistance along with the change of the load current by using the curve of the maximum temperature value of the loop resistance in different load currents, and adding the deviation into a curve formula of the maximum temperature value of the loop resistance along with the change of the environment temperature;
and step S5, deriving and obtaining a relation between the loop resistance of the equipment and the environmental temperature and the load current of the equipment by using the formula obtained in the step S4.
Further, in the present invention, in step S3, the specific method for obtaining the formula of the curve of the maximum temperature of the loop resistance along with the change of the environmental temperature is as follows:
the curve relation between the highest temperature of the equipment and the ambient temperature is obtained according to the curve of the highest temperature along with the ambient temperature, and the curve relation is below the load current 100A:
Tdevice＝kTEnvironment(s)+b
Fitting a curve of the maximum temperature changing along with the ambient temperature to obtain an average value, and acquiring a k value and a b value; k is the weight coefficient of the temperature rise of the loop resistance of the equipment caused by the environment temperature, b is a constant, and T isDeviceIs the temperature of the loop resistance, T, of the deviceEnvironment(s)The ambient temperature is taken and the curve between the maximum temperature of the device at load current below 100A and the ambient temperature is taken as the baseline.
Further, in the present invention, K is 0.59 and b is 7.5.
Further, in the present invention, in step S4, the deviation of the maximum temperature value of the loop resistance caused by the change of the load current is obtained as follows:
by curve fitting: delta TI＝1.39×(I-I0)2R+Tc
Wherein R is the loop resistance of the device, I is the load current, I0For the basic current, when the loop resistance is larger, the base point current is smaller, the value range is 0.1 KA-0.25 KA, and the average value of 0.175KA can be taken as an empirical value; t iscThe value range is-1.6-1.5 ℃ for correcting the temperature.
Further, in the present invention, in step S4, the deviation is added to a curve formula of the maximum temperature of the loop resistance along with the change of the ambient temperature;
Tdevice＝0.59×TEnvironment(s)+1.39×(I-0.175)2RLoop circuit+7.5
I is the loop current of the device, RLoop circuitIs the loop resistance of the device.
Further, in step S5, the relationship between the device loop resistance and the ambient temperature and the load current of the device is derived as follows:
the specific embodiment is as follows:
three kinds of electrical equipment are selected in the experiment, and the loop resistances of the three kinds of electrical equipment are respectively 16.2 mu omega, 40.7 mu omega and 69.9 mu omega
The method respectively carries out sampling record on the maximum temperature value of the equipment, and comprises the following steps:
TABLE 1
TABLE 2
TABLE 3
For ease of observation and analysis, the above data are formulated in the form of a conversion curve, as shown in FIGS. 1-3.
Analyzing fig. 1 to 3, the following points can be obtained:
for the same equipment, as the ambient temperature rises, the temperature value of the highest heating point also rises, and the rising speed of the highest heating point is accelerated.
This characteristic behaves relatively uniformly across different devices. Moreover, the temperature rise curve can be roughly divided into two sections: a stage below 0 ℃ and a stage above 0 ℃. The slopes of the two curves are different, and the analysis is focused on the case below 0 ℃.
The increase in temperature rise is different at different load currents. It can be seen that below the load current 100A, the relationship between the maximum temperature of the device and the ambient temperature can be reduced to a substantially fixed linearly increasing relationship, namely:
Tdevice＝kTEnvironment(s)+b
And fitting and averaging the related experimental data to obtain a k value and a b value, wherein the formula is as follows:
Tdevice＝0.59×TEnvironment(s)+7.5
The temperature profile below the load current 100A may be unified into the above-described profile, which we may refer to as a baseline. The temperature profile above the load current 100A can be viewed as having an offset superimposed on the baseline.
Observing the curve group of the clamp a and the clamp B, it can be seen that when the ambient temperature is below 0 ℃, the increase of the highest temperature value of the device due to the increase of the load current shows a fixed deviation value, and therefore, the following formula can be used for describing:
Tdevice＝kTEnvironment(s)+b+ΔTI＝TBase line+ΔTI
Wherein, Delta TIIs an offset related to the load current I, i.e. has aI＝TDevice-TBase lineTherefore, the delta T can be obtained by subtracting the baseline temperature value from the device temperature valueITaking the wire clamp a as an example, the following results can be obtained as shown in fig. 4:
fitting these offset temperature data yields the following equation, where the load current I is in Kiloamperes (KA):
ΔTI＝56.5×I2-27.8×I+4.8＝56.5×(I-0.25)2+1.5
similarly, a similar formula for clip B can be obtained:
ΔTI＝95.2×I2-19.5×I-0.7＝95.2×(I-0.1)2-1.6
the coefficients of the two sets of equations are different, as can be readily appreciated, due to the different loop resistances of clip a and clip B. The loop resistance values of 40.7 mu omega and 69.9 mu omega are introduced, and the two formulas can be combined into the following formula:
ΔTI＝1.39×(I-I0)2R+Tc
wherein R is the loop resistance of the device, I0The base current is related to the loop resistance, the larger the loop resistance is, the smaller the base current is, the value range is between 0.1KA and 0.25KA, and the average value of 0.175KA can be taken as an empirical value. T iscFor correcting the temperature, the value range is-1.6-1.5 ℃, and the average value is 0 ℃.
Finally, a simplified empirical formula for obtaining the maximum temperature value of the equipment is as follows:
Tdevice＝0.59×TEnvironment(s)+1.39×(ILoad(s)-0.175)2RLoop circuit+7.5
In the above, a relation between the maximum temperature value that the electrical equipment can reach and the load current, the loop resistance and the ambient temperature of the equipment is established.
According to the formula, the calculation formula for obtaining the loop resistance is as follows:
it can be verified by the experimental data in the foregoing table that when the clamp a is at-15 ℃ and 0.4KA as the ambient temperature, the maximum temperature value is 2.5 ℃, and the known amount is substituted into the above formula, R ═ 54.7 μ Ω (actual value is 40.7 μ Ω).
When the ambient temperature of the clip B is 0 ℃ and the load current is 0.6KA, the maximum temperature value is 35.8 ℃, and the above formula is substituted, so that R ═ 113 μ Ω (actual value is 69.9 μ Ω).
The difference from the actual value is still a certain value, which is mainly related to the fixed basic current value adopted in the formula, as mentioned above, the basic current value should be related to the loop resistance, because only data of two loop resistance values are adopted, the obtained basic current value is still relatively coarse, and more groups of experimental data are collected later, so that a relatively accurate basic current value can be obtained, and a more accurate loop resistance can be calculated.
Although the invention herein has been described with reference to particular embodiments, it is to be understood that these embodiments are merely illustrative of the principles and applications of the present invention. It is therefore to be understood that numerous modifications may be made to the illustrative embodiments and that other arrangements may be devised without departing from the spirit and scope of the present invention as defined by the appended claims. It should be understood that features described in different dependent claims and herein may be combined in ways different from those described in the original claims. It is also to be understood that features described in connection with individual embodiments may be used in other described embodiments.
Claims (6)
1. A method for obtaining loop resistance of an electrical device based on a maximum temperature value of the electrical device is characterized by comprising the following steps:
before the electrical equipment is put into use, establishing a relation between the loop resistance of the equipment and the environmental temperature and load current of the equipment;
after the equipment is put into use, acquiring the current loop resistance value of the electrical equipment according to the current environment temperature and the load current of the electrical equipment by using the relational expression;
establishing a relation between the loop resistance of the equipment and the environmental temperature and load current of the equipment; the method specifically comprises the following steps:
step S1, placing the electrical equipment in a high-low temperature box, adjusting the temperature of the high-low temperature box and the load current of the equipment, and collecting the highest temperature of the loop resistor of the electrical equipment in real time;
step S2, drawing a curve of the highest temperature value of the loop resistor at different environmental temperatures and different load currents by using the data collected in the step S1;
step S3, obtaining a curve formula of the change of the highest temperature of the loop resistance along with the environmental temperature by using the curve of the highest temperature value of the loop resistance at different environmental temperatures;
step S4, obtaining the deviation of the maximum temperature value of the loop resistance along with the change of the load current by using the curve of the maximum temperature value of the loop resistance in different load currents, and adding the deviation into a curve formula of the maximum temperature value of the loop resistance along with the change of the environment temperature;
and step S5, deriving and obtaining a relation between the loop resistance of the equipment and the environmental temperature and the load current of the equipment by using the formula obtained in the step S4.
2. The method for obtaining the loop resistance of the equipment based on the maximum temperature value of the electrical equipment according to claim 1, wherein in the step S3, the specific method for obtaining the formula of the curve of the maximum temperature of the loop resistance along with the change of the environmental temperature is as follows:
the curve relation between the highest temperature of the equipment and the ambient temperature is obtained according to the curve of the highest temperature along with the ambient temperature, and the curve relation is below the load current 100A:
Tdevice＝kTEnvironment(s)+b
Fitting a curve of the maximum temperature changing along with the ambient temperature to obtain an average value, and acquiring a k value and a b value; k is the weight coefficient of the temperature rise of the loop resistance of the equipment caused by the environment temperature, b is a constant, and T isDeviceIs the temperature of the loop resistance, T, of the deviceEnvironment(s)The ambient temperature is taken and the curve between the maximum temperature of the device at load current below 100A and the ambient temperature is taken as the baseline.
3. The method for obtaining the loop resistance of the equipment based on the maximum temperature value of the electrical equipment as claimed in claim 2, wherein k is 0.59 and b is 7.5.
4. The method for obtaining the loop resistance of the electrical equipment according to claim 1, 2 or 3, wherein in step S4, the deviation of the maximum temperature value of the loop resistance with the change of the load current is obtained as follows:
by curve fitting: delta TI＝1.39×(I-I0)2R+Tc
Wherein R is the loop resistance of the device, I is the load current, I0For the basic current, when the loop resistance is larger, the base point current is smaller, the value range is 0.1 KA-0.25 KA, and the average value of 0.175KA can be taken as an empirical value; t iscTo correct forThe temperature is in the range of-1.6 ℃ to 1.5 ℃.
5. The method for obtaining the loop resistance of the equipment based on the maximum temperature value of the electrical equipment as claimed in claim 4, wherein in step S4, the deviation is added to a curve formula of the maximum temperature of the loop resistance along with the change of the ambient temperature;
Tdevice＝0.59×TEnvironment(s)+1.39×(I-0.175)2RLoop circuit+7.5
I is the loop current of the device, RLoop circuitIs the loop resistance of the device.
6. The method for obtaining the loop resistance of the electrical equipment according to claim 5, wherein in step S5, the relationship between the loop resistance of the electrical equipment and the ambient temperature and the load current of the electrical equipment is derived as follows:
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| CN104698283A (en) * | 2013-12-04 | 2015-06-10 | 大连东浦机电有限公司 | Resistor test method |
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Inventor after: Zhang Dewen Inventor after: Xu Minhu Inventor after: Qiu Shuaihui Inventor after: Yang Wenshuai Inventor after: Wang Zhenpeng Inventor after: Jiang Shijin Inventor after: Zhang Jian Inventor after: Liu Heqian Inventor after: Shang Shulei Inventor after: Zhang Zhen Inventor after: Zhang Peng Inventor after: Zhao Xiangyu Inventor after: Chen Shiyu Inventor before: Zhang Dewen Inventor before: Qiu Shuaihui Inventor before: Yang Wenshuai Inventor before: Wang Zhenpeng Inventor before: Zhang Jian Inventor before: Liu Heqian Inventor before: Shang Shulei Inventor before: Zhang Zhen Inventor before: Zhang Peng Inventor before: Zhao Xiangyu Inventor before: Chen Shiyu Inventor before: Xu Minhu |
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