CN114113136A - Device for detecting surface defects of high-brightness surface - Google Patents
Device for detecting surface defects of high-brightness surface Download PDFInfo
- Publication number
- CN114113136A CN114113136A CN202111321027.7A CN202111321027A CN114113136A CN 114113136 A CN114113136 A CN 114113136A CN 202111321027 A CN202111321027 A CN 202111321027A CN 114113136 A CN114113136 A CN 114113136A
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- China
- Prior art keywords
- light
- light source
- lighting cavity
- hole
- ellipsoidal
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- 230000007547 defect Effects 0.000 title claims abstract description 17
- 238000000576 coating method Methods 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 claims description 4
- 238000001514 detection method Methods 0.000 abstract description 15
- 238000005286 illumination Methods 0.000 abstract description 8
- 238000000034 method Methods 0.000 description 4
- 238000007689 inspection Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 150000002739 metals Chemical group 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000004033 plastic Chemical group 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
Abstract
The invention relates to a device for detecting surface defects of a high-brightness surface, and relates to the field of defect detection and optics. The detection device includes: a camera, a light source, an ellipsoidal crown lighting cavity; the lens of the camera is positioned on one focal point of the ellipsoidal crown illumination cavity, and the detected sample is positioned on the other focal point of the ellipsoidal crown illumination cavity; a light through hole is formed above the ellipsoidal crown lighting cavity; the light source is positioned above the light through hole, and the irradiation direction is downward or obliquely downward. The irradiation light of the detection device for the surface defects of the high-brightness surface has the advantages of high energy utilization rate and high detection efficiency.
Description
Technical Field
The invention relates to the field of defect detection and optics, in particular to a device for detecting surface defects of a high-brightness surface.
Background
In modern industry, machine vision inspection is used in a large number in the fields of working condition monitoring, product inspection and quality control. The machine vision inspection is to acquire the surface image of an object to be inspected by using an illumination light source and a camera. Parts with highly reflective surfaces, such as finished metals, metal and plastic parts with coatings and coatings, have great difficulty in surface defect detection using machine vision due to their strong specular reflection.
The prior visual detection device and method mostly adopt a supplementary lighting light source to solve the problem of illumination uniformity of a planar high-reflection object or provide illumination in multiple directions to a certain extent by using a diffuse reflection principle, but the methods can cause waste of energy utilization rate of the light source and illumination nonuniformity.
Disclosure of Invention
In order to solve the above-mentioned disadvantages of the prior art, an object of the present invention is to provide an apparatus for detecting a surface defect of a highlight surface, which has advantages of high energy utilization efficiency and high detection efficiency of the irradiation light of the detection apparatus for detecting a surface defect of a highlight surface.
In order to achieve the purpose, the invention provides the following scheme:
a device for detecting surface defects of a highlight surface is characterized in that a lens of a camera is positioned at one focus of an ellipsoidal crown lighting cavity, and a sample to be detected is positioned at the other focus of the ellipsoidal crown lighting cavity; a light through hole is formed above the ellipsoidal crown lighting cavity; the light source is positioned above the light through hole, and the irradiation direction is downward or obliquely downward;
preferably, the inner surface of the ellipsoidal crown lighting cavity is uniformly coated with a high-reflection coating so as to form the ellipsoidal crown lighting cavity;
preferably, the shell of the ellipsoidal crown lighting cavity is provided with a light through hole, and the size of the light through hole is larger than that of the sample to be detected, so as to ensure that the light source can completely cover and irradiate the surface of the sample;
preferably, the light source area of the light source is larger than the area of the light through hole on the ellipsoidal crown lighting cavity;
preferably, the camera lens is a wide-angle lens to ensure that more light source information enters the camera.
In addition, the highlight surface detection device has the advantages of simple structure, low cost, high identification efficiency and the like, and has a wide application prospect in highlight surface defect detection. Meanwhile, the method has important significance for improving the quality of the products and reducing the detection cost of companies.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
Fig. 1 is a schematic view of a detection apparatus according to an embodiment of the present invention.
Fig. 2 is a schematic top view according to an embodiment of the present invention.
In the figure, 1-an ellipsoidal crown lighting cavity, 2-a light source, 3-a light through hole, 4-a sample to be detected and 5-a camera.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention aims to provide a device for detecting high-brightness surface defects, which has the advantages of high energy utilization rate and high detection efficiency for the irradiation light of the detection device for the high-brightness surface defects.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
Referring to fig. 1 and fig. 2, the apparatus for detecting surface defects of a highlight surface provided in this embodiment includes an ellipsoidal crown lighting cavity 1, a light source 2, a light through hole 3 formed in the ellipsoidal crown lighting cavity 1, a sample to be detected 4, and a camera 5.
Wherein, the ellipsoidal crown lighting cavity 1 is internally coated with uniform high-reflection coating and is positioned above a sample to be detected 4 and a camera 5. The shell of the ellipsoidal crown lighting cavity 1 is provided with a light through hole 3 and is integrated with the ellipsoidal crown lighting cavity 1, and one, two or more light through holes 3 can be arranged according to specific implementation requirements. A light source 2 is arranged above the light through hole 3, the area of the light source 2 is larger than that of the light through hole 3 on the ellipsoidal crown lighting cavity 1, and meanwhile, the area of a light beam passing through the light through hole 3 is larger than the size of the surface size of a sample 4 to be detected. The light-transmitting hole 3 can be positioned above or obliquely above the sample 4 to be detected, so as to ensure that the surface of the sample 4 to be detected is completely covered by the light source. The lens of the sample 4 to be detected and the camera 5 are respectively positioned on two focal points of the ellipsoidal crown illumination cavity 1.
The light source 2 irradiates the sample 4 to be detected and reflects the sample to the inner surface of the ellipsoidal crown lighting cavity 1 for reflection, the reflected light is reflected by the high-reflectivity coating and then passes through the camera 1 located on one of the focal points of the ellipsoidal crown lighting cavity 1, the shooting of the sample 4 to be detected by the camera 5 is completed, and image information is obtained.
The principles and embodiments of the present invention have been described herein using specific examples, which are provided only to help understand the method and the core concept of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.
Claims (5)
1. A device for detecting surface defects of a highlight surface is characterized in that a lens of a camera is positioned at one focus of an ellipsoidal crown lighting cavity, and a sample to be detected is positioned at the other focus of the ellipsoidal crown lighting cavity; a light through hole is formed above the ellipsoidal crown lighting cavity; the light source is positioned above the light through hole, and the irradiation direction is downward or obliquely downward.
2. The apparatus of claim 1, wherein the inner surface of the ellipsoidal crown lighting cavity is uniformly coated with a highly reflective coating to form the ellipsoidal crown lighting cavity.
3. The device for detecting the surface defects of the high bright surface as claimed in claim 1, wherein the housing of the lighting cavity of the ellipsoid crown is provided with a light through hole, and the size of the light through hole is larger than that of the sample to be detected, so as to ensure that the light source can fully cover and irradiate the surface of the sample.
4. The apparatus of claim 1, wherein the area of the light source is larger than the area of the light-passing hole of the ellipsoidal crown lighting cavity.
5. The apparatus of claim 1, wherein the camera lens is a wide angle lens to ensure more light source information enters the camera.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111321027.7A CN114113136A (en) | 2021-11-09 | 2021-11-09 | Device for detecting surface defects of high-brightness surface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111321027.7A CN114113136A (en) | 2021-11-09 | 2021-11-09 | Device for detecting surface defects of high-brightness surface |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114113136A true CN114113136A (en) | 2022-03-01 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111321027.7A Pending CN114113136A (en) | 2021-11-09 | 2021-11-09 | Device for detecting surface defects of high-brightness surface |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114113136A (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104040287A (en) * | 2012-01-05 | 2014-09-10 | 合欧米成像公司 | Arrangement for optical measurements and related method |
| CN104819405A (en) * | 2014-02-03 | 2015-08-05 | 三星电机株式会社 | Luminous module and visual inspection system using the same |
| CN106323987A (en) * | 2016-09-30 | 2017-01-11 | 厦门威芯泰科技有限公司 | Lighting source for detecting high-reflectivity surface defects |
| CN108760627A (en) * | 2018-03-12 | 2018-11-06 | 北京林业大学 | A kind of light supply apparatus for defects detection |
-
2021
- 2021-11-09 CN CN202111321027.7A patent/CN114113136A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104040287A (en) * | 2012-01-05 | 2014-09-10 | 合欧米成像公司 | Arrangement for optical measurements and related method |
| CN104819405A (en) * | 2014-02-03 | 2015-08-05 | 三星电机株式会社 | Luminous module and visual inspection system using the same |
| CN106323987A (en) * | 2016-09-30 | 2017-01-11 | 厦门威芯泰科技有限公司 | Lighting source for detecting high-reflectivity surface defects |
| CN108760627A (en) * | 2018-03-12 | 2018-11-06 | 北京林业大学 | A kind of light supply apparatus for defects detection |
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