CN114077228A - System and method for controlling quality of product - Google Patents
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- CN114077228A CN114077228A CN202010818097.2A CN202010818097A CN114077228A CN 114077228 A CN114077228 A CN 114077228A CN 202010818097 A CN202010818097 A CN 202010818097A CN 114077228 A CN114077228 A CN 114077228A
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- 238000004519 manufacturing process Methods 0.000 claims abstract description 101
- 238000012544 monitoring process Methods 0.000 claims abstract description 13
- 239000000047 product Substances 0.000 description 98
- 239000000463 material Substances 0.000 description 13
- 238000010586 diagram Methods 0.000 description 10
- 238000005259 measurement Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 230000000007 visual effect Effects 0.000 description 4
- 238000003070 Statistical process control Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
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- 230000004397 blinking Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
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Abstract
The present application provides a system and method for controlling the quality of a product, the system comprising: a display that displays a screen; and a controller that generates a process performance index map and a single-value control map of a quality element of a product based on data relating to the quality element, the controller further performing control such that the process performance index map and the single-value control map for the same quality element are displayed on the same display screen of the display, wherein the quality element includes: production parameters during the manufacture of the product; and/or characteristic parameters during and/or after the manufacture of said product, said data relating to quality elements of the product comprising: monitoring data of said production parameters during the manufacturing of said product; and/or data detected from said characteristic parameters during and/or after the manufacture of said product.
Description
Technical Field
The present application relates to the field of data processing technologies, and in particular, to a system and method for controlling product quality based on data processing.
Background
In the production of products, there is a need to control the quality of the products.
In the prior art, a Statistical Process Control (SPC) system can be used to monitor the quality of the final product, and the monitoring result can be fed back to the production link, so as to adjust the relevant elements of the production link of the product, thereby improving the quality of the product.
It should be noted that the above background description is only for the sake of clarity and complete description of the technical solutions of the present invention and for the understanding of those skilled in the art. Such solutions are not considered to be known to the person skilled in the art merely because they have been set forth in the background section of the invention.
Disclosure of Invention
The inventors of the present application found that: the existing method for controlling the product quality by using the SPC system monitors the production result and cannot monitor the production process, so that the product quality is difficult to improve by monitoring the production process and adjusting production elements in time.
To solve the above problems or other similar problems, embodiments of the present application provide a system and method for controlling the quality of a product. In the system, a Process Performance Index (PPK) graph and a single-value control graph are generated according to data related to quality elements of products, the PPK graph and the single-value control graph are displayed on the same display screen, and the quality elements of the products can be monitored in a visual mode, so that the production elements related to the production Process of the products can be adjusted in time, the quality of the products is controlled in the production Process, and the batch reject ratio of the products is reduced.
According to an aspect of an embodiment of the present application, there is provided a system for controlling quality of a product, including:
a display that displays a screen; and
a controller generating a Process Performance Index (PPK) map and a single value control map of a quality element of a product based on data related to the quality element,
the controller further controls the process performance index (PPK) map and the single-value control map for the same quality element to be displayed on the same display screen of the display,
wherein the quality factors include:
production parameters during the manufacture of the product; and/or
The characteristic parameters during and/or after the manufacture of said product,
the data relating to quality factors of the product includes:
monitoring data of said production parameters during the manufacturing of said product; and/or
And (c) detecting data of the characteristic parameters during and/or after the manufacture of the product.
According to another aspect of embodiments of the present application, there is provided a method of controlling quality of a product, including: generating a Process Performance Index (PPK) map and a single-value control map of a quality element of a product according to data related to the quality element; and displaying the process performance index (PPK) map and the single-value control map for the same quality element on the same display screen of a display, wherein the quality element includes:
production parameters during the manufacture of the product; and/or
The characteristic parameters during and/or after the manufacture of said product,
the data relating to quality factors of the product includes:
monitoring data of said production parameters during the manufacturing of said product; and/or
And (c) detecting data of the characteristic parameters during and/or after the manufacture of the product.
One of the beneficial effects of the embodiment of the application lies in: the PPK chart and the single-value control chart are generated according to data related to the quality elements of the product, the PPK chart and the single-value control chart are displayed on the same display screen, and the quality elements of the product can be monitored in a visual mode, so that the production elements related to the production process of the product can be adjusted conveniently in time, the control of the product quality is realized in the production process, and the batch reject ratio of the product is reduced.
Specific embodiments of the present invention are disclosed in detail with reference to the following description and drawings, indicating the manner in which the principles of the invention may be employed. It should be understood that the embodiments of the invention are not so limited in scope. The embodiments of the invention include many variations, modifications and equivalents within the spirit and scope of the appended claims.
Features that are described and/or illustrated with respect to one embodiment may be used in the same way or in a similar way in one or more other embodiments, in combination with or instead of the features of the other embodiments.
It should be emphasized that the term "comprises/comprising" when used herein, is taken to specify the presence of stated features, integers, steps or components but does not preclude the presence or addition of one or more other features, integers, steps or components.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort. In the drawings:
FIG. 1 is a schematic view of a system for controlling the quality of a product according to example 1 of the present application;
FIG. 2 is a schematic view of a display screen of the display 10;
fig. 3 is another schematic view of the display screen of the display 10;
fig. 4 is a schematic diagram of a method for controlling the quality of a product according to example 2 of the present application.
Detailed Description
The foregoing and other features of the present application will become apparent from the following description, taken in conjunction with the accompanying drawings. In the description and drawings, particular embodiments of the application are disclosed in detail as being indicative of some of the embodiments in which the principles of the application may be employed, it being understood that the application is not limited to the embodiments described, but, on the contrary, is intended to cover all modifications, variations, and equivalents falling within the scope of the appended claims. Various embodiments of the present application will be described below with reference to the drawings. These embodiments are merely exemplary and are not intended to limit the present application.
In the embodiments of the present application, the terms "first", "second", and the like are used for distinguishing different elements by reference, but do not denote a spatial arrangement, a temporal order, or the like of the elements, and the elements should not be limited by the terms. The term "and/or" includes any and all combinations of one or more of the associated listed terms. The terms "comprising," "having," and the like, refer to the presence of stated features, elements, components, and do not preclude the presence or addition of one or more other features, elements, components, and/or groups thereof.
In the embodiments of the present application, the singular forms "a", "an", and the like include the plural forms and are to be construed broadly as "a" or "an" and not limited to the meaning of "a" or "an"; furthermore, the term "the" should be understood to include both the singular and the plural, unless the context clearly dictates otherwise. Further, the term "according to" should be understood as "at least partially according to … …" unless the context clearly dictates otherwise.
Example 1
The embodiment 1 of the application provides a system for controlling the quality of a product.
Fig. 1 is a schematic view of a system for controlling the quality of a product according to embodiment 1 of the present application. As shown in fig. 1, a system 1 for controlling the quality of a product includes: a display 10 and a controller 20.
Among them, the display 10 can display a screen.
The controller 20 generates a Process Performance Index (PPK) map and a single-value control map of a quality element of a product based on data related to the quality element; the controller 20 is also capable of controlling such that a process performance index (PPK) map and a single-value control map for the same quality element are displayed on the same display screen of the display 10.
In embodiment 1 of the present application, a PPK map and an individual value control map are generated according to data related to quality elements of a product, and the PPK map and the individual value control map are displayed on the same display screen, so that the quality elements of the product can be monitored in a visual manner, thereby facilitating timely adjustment of production elements involved in a production process of the product, achieving control of product quality in the production process, and reducing the batch reject ratio of the product.
In this embodiment, the quality factor of the product refers to a factor that has a large influence on the quality of the product. The quality factor of the product can be obtained by analyzing the key quality characteristic of the product, for example, the relationship between the key characteristic of the product and the factor affecting the quality of the product can be determined by combining the process principle in the manufacturing process of the product, and the degree of influence of each factor is evaluated through experiments, so that the factor having a large influence on the quality of the product is determined as the quality factor of the product.
The quality factors of the product may include: production parameters in the manufacturing process of the product, wherein the production parameters comprise, for example: the operation state parameters of the production equipment, and/or the process parameters, and/or the material performance, the material consumption and other parameters. Quality factors of the product may also include: the characteristic parameters obtained by testing during and/or after the manufacture of the product are, for example, circuit boards, and the characteristic parameters of the product can be the thickness of metal wiring measured during the manufacture of the circuit boards, the strength of the circuit boards after the manufacture, and the like. In the present application, the quality factor of the product may be at least one of the above-described production parameter and the above-described characteristic parameter.
In the present application, the data related to the quality factor of the product may include: monitoring data obtained by monitoring the production parameters in the manufacturing process of the product. The data relating to the quality factor of the product may also include: and detecting the characteristic parameters to obtain detection data in the manufacturing process of the product and/or after the product is manufactured. In the present application, the data related to the quality factor of the product may include at least one of the above-mentioned monitoring data and the above-mentioned detection data.
In the present application, there may be a plurality of quality elements of a product, and the controller 20 may perform control, generate a PPK map and an individual value control map of each quality element for data related to the quality element, and display the PPK map and the individual value control map corresponding to the same quality element on the same display screen of the display 10. In the present application, the number of the displays 10 may be plural. The display screen of one display 10 may display the PPK map and the single-value control map corresponding to one quality element, or the display screen of one display 10 may alternately display the PPK map and the single-value control map corresponding to different quality elements.
In the present application, the specific process of the controller 20 generating the PPK map and the single-value control map may refer to the related art.
Fig. 2 is a schematic diagram of a display screen of the display 10, and as shown in fig. 2, the display screen 100 may display: the PPK chart A and the single-value control chart B correspond to the quality elements.
As shown in FIG. 2, there are multiple data points 111 in PPK map A. The vertical axis of the PPK graph a represents a Process performance index of a data point, for example, a value of a Complex Process Capability index (CPK). The horizontal axis of the PPK map a indicates the number of each data point, and the number of each data point may correspond to time. In the PPK graph a, one data point 111 may represent a batch of products, the number of the data point represented by the horizontal axis may be the number of the product batch, and the coordinate of the horizontal axis may be represented by mo (n), where n may be a natural number.
The controller 20 may control such that information of a first threshold value indicating a lower limit value of a preset process performance index is displayed in the PPK map a, and the first threshold value may be used to warn the process performance index of the data point. The information of the first threshold may be displayed, for example, as a line 112 perpendicular to the vertical axis.
As shown in fig. 2, the single-value control map B may be a metering-type single-value control map. There may be multiple data points 121 in the single-value control map B. The vertical axis of the single-value control map B represents the measurement value corresponding to the data point (for example, the measurement value may be a value of data related to a quality element of a product, such as a characteristic value), and the horizontal axis represents the accumulated amount of data, which gradually increases as time passes.
The controller 20 may also control so that the control center line 122 is displayed in a single-value control map B. The control centerline 122 may be a line perpendicular to the longitudinal axis. Further, the controller 20 may also perform control so that the upper limit control line 123 and/or the lower limit control line 124 are displayed in the single-value control map B. The upper limit control line 123 is above the control centerline 122 and the lower limit control line 124 is below the control centerline 122.
In the single-value control chart B, the data points 121 are discrete points. Data points 121 fluctuate near control centerline 122, indicating that the production process is stable and the data meets the requirements; data points 121 above the upper control line 123 or below the lower control line 124 indicate that the process is fluctuating significantly and that the data is unsatisfactory, for example, product quality is unsatisfactory; the data point 121 is located between the upper control line 123 and the lower control line 124, but is located further from the control centerline 122, i.e., the center of fluctuation of the data point 121 is offset from the control centerline 122, indicating that while the data is satisfactory, the production process fluctuations are large. The single-value control map B can show that the fluctuation center of the data point is shifted up or down with respect to the control center line 122.
In the present application, for a same batch of products, one data point 111 in the PPK map a may correspond to one data point set 121A in the single-value control map B, where the one data point set 121A includes a plurality of data points 121, and the plurality of data points 121 are used to represent data obtained by monitoring or detecting quality elements of the batch of products.
In the present application, the controller 20 may control to display one of the data points 111 and the corresponding data point set 121A on the display screen 100A (shown in fig. 3) of the display 10. For example, the controller 20 may receive an instruction from an operator (e.g., a producer of a product) to switch the display screen 100 to the display screen 100A, so as to display the data point 111 selected by the operator and the corresponding data point set 121A.
Fig. 3 is a schematic diagram of the display screen 100A of the display 10. As shown in fig. 3, the controller 20 may control to display one of the data points 111 (for example, a data point whose abscissa is MO (1)) and the corresponding data point set 121A on the display screen 100A. For example, as shown in fig. 3, a PPK map 3A may be displayed on the display screen 100A, where the PPK map 3A includes data points 111 of the product numbered MO (1) of the lot; a single-value control chart 3B can also be displayed in the display screen 100A; the single value control data point 121 in FIG. 3B is generated from data monitoring or detecting a lot of product numbered MO (1); the ordinate of the single-value control chart 3B may represent a measurement value (i.e., a characteristic value) monitored or detected for a product, such as a coil quality factor (Q value), and the measurement value represented by the ordinate of the single-value control chart 3B and the measurement value represented by the ordinate of the single-value control chart B of the display screen 100 have a predetermined correspondence relationship, and the units of the two may be different or the same.
In the application, different devices can be adopted to monitor or detect the same quality element of the same batch of products so as to obtain data, and the data deviation caused by the difference (namely, the machine difference) of the devices can be identified by comparing the data obtained by the different devices, so that the authenticity and the effectiveness of the data are improved. For example, when detecting that the mean value of the data acquired by different devices differs by more than a predetermined value (e.g., 5%), the controller 20 generates first warning information to prompt that the difference between different devices is large, so that a manufacturer can be prompted to check the devices to avoid obtaining unreal data.
As shown in fig. 3, in the display screen 100A, for the single-value control map 3B, the data point 121 located in the area 3B1 may correspond to a first device, the data point 121 located in the area 3B2 may correspond to a second device, the mean value of the ordinate of the data point 121 of the area 3B1 is P1, the mean value of the ordinate of the data point 121 of the area 3B2 is P2, and if the absolute value of the difference between P1 and P2 exceeds 5%, the controller 20 generates the first warning information. The first warning information may be displayed on the display screen 100A, may be displayed on the screen 100, or may be displayed on both the screen 100A and the screen 100, and may be, for example, text, picture information, or the like on the display screen.
The display screen 100A may also display information 31 related to production or detection, such as a machine type (model), a classification, a machine model (model), a product line (production line), a time period (time interval) for acquiring data, a characteristic value, and the like. The display screen 100A may also display a search button 32, whereby the producer can generate the PPK map 3A and the single-value control map 3B corresponding to the information filled in the display screen 100A by filling the information 31 relating to production or detection with the information and then clicking the search button 32.
As shown in fig. 2, the abscissa of the data point 121 of the single-value control map B and the abscissa of the data point 111 of the PPK map a have a corresponding relationship. For example, the abscissa of the data point 121 of the single-value control map B may be shifted to the right by a certain value with respect to the abscissa of the data point 111 of the PPK map a, corresponding to the same batch of products.
The ordinate of the data point 121 of the single-value control map B and the ordinate of the data point 111 of the PPK map a also have a corresponding relationship as shown in fig. 2. For example, as the ordinate of the data point 111 of the PPK map a becomes smaller, the fluctuation center of the data point 121 of the corresponding single-value control map B shifts upward or downward with respect to the control center line.
In the present application, the controller 20 may generate the second warning information when detecting that the process performance index PPK of the predetermined number of data points 111 in the process performance index map is lower than the first threshold. For example, the second warning information includes: the controller 20 generates second warning information when it detects that consecutive 3 data points are located below the line 112. The second warning information is, for example, a character second warning information displayed on the screen 100, or the like, in which the PPK chart a is caused to blink, or a data point of the PPK chart is caused to blink.
For example, in fig. 2, where a plurality of consecutive data points 111, shown by dashed line 11A, are located below line 112, controller 20 may generate second warning information; also, since there is a correspondence between the data point 111 of the PPK map a and the data point 121 of the single-value control map B, the data point 121 shown by the broken line 12B corresponding to the plurality of consecutive data points 111 shown by the broken line 11A fluctuates upward with respect to the control center line 122.
In the present application, as shown in fig. 2, the controller 20 may also perform control so that information of production elements affecting quality elements is also displayed on the screen 100 of the display 20. The production element may for example be involved in the production of the product: personnel involved in production (Man), materials used in the product (Material), equipment used in the production of the product (Machine), methods of operation (Method), and other factors, among others. The icons 13 of the above-described production elements may be displayed on the screen 100.
When the second warning information corresponding to the dashed line 11A in fig. 2 appears, the producer may adjust at least one of the production elements to deal with the appearance of the second warning information. The information of the adjusted production element may be displayed on the screen 100, for example, when the material is adjusted, an icon corresponding to the material may be displayed in a blinking manner or in a highlighted manner. Further, the adjustment content information of the adjusted production element may be displayed on the screen 100, and for example, when a material is adjusted, the type of the adjusted material may be displayed on the screen 100.
In the present application, displaying the information of the production elements and the information of the adjusted production elements on the screen can help the producer to respond to the second warning information timely and effectively. For example, when the second warning information corresponding to the dashed line 11A in fig. 2 appears, the producer first adjusts the personnel in the production element (as shown in 131 in fig. 2), and finds that the second warning information still exists, and the data point 111 in the PPK diagram a still lies below the line 112; subsequently, the manufacturer adjusts the material (indicated by 132 in fig. 2), and as a result, the data point 111 in the PPK map a returns to the maximum value (indicated by the dashed line 21A in fig. 2), which indicates that the adjustment material can effectively cope with the current data fluctuation, and at this time, the data point 121 in the single-value control map B is stable but shifted downward (indicated by the dashed line 22B in fig. 2) with respect to the control center line 122; next, the manufacturer continues to adjust the material (as indicated by 133 in fig. 2), the data point 111 in the PPK map a continues to remain at the maximum value (as indicated by the dashed line 31A in fig. 2), and the data point 121 in the single-value control map B not only stabilizes, but also is located near the control centerline 122 (as indicated by the dashed line 32B in fig. 2), so that the adjustment of the material can be stopped, the current material can be maintained, and the production of the product can continue.
As shown in fig. 2, in the present application, the PPK map a and the single-value control map B are displayed in the same screen 100 of the display 10, which facilitates timely and effective control of the production process of the product. For example, through the PPK map a, the second warning information can be generated in the display screen in time, and the producer can be prompted to change the production elements in time; through the single-value control chart B, whether the data fluctuates upwards or downwards relative to the control center line can be indicated, so that the change direction of the production elements can be prompted, and the effective change of the production elements can be realized as soon as possible. Further, by further displaying information of production elements affecting quality elements on the same screen 100 of the display 10, the producer can be helped to quickly recognize the influence of each production element on data fluctuation, and thus can efficiently adjust the production elements to restore the stability of data. In addition, the first early warning information is displayed on the display picture, so that a producer can be reminded that equipment is poor, and unreal data is avoided.
Example 2
The embodiment 2 of the application provides a method for controlling the quality of a product. The method corresponds to the system for controlling the quality of a product of example 1.
Fig. 4 is a schematic view of a method of controlling the quality of a product of embodiment 2, as shown in fig. 4, the method comprising:
In this embodiment, the quality factors include:
production parameters during the manufacture of the product; and/or characteristic parameters during and/or after manufacture of the product.
Data relating to quality factors of a product include: monitoring data of the production parameter during the manufacturing process of the product; and/or, data detected of the characteristic parameter during and/or after completion of manufacture of the product.
As shown in fig. 4, the method further includes:
in operation 403, when it is detected that the difference between the data related to the same quality element acquired by different devices exceeds a predetermined value, first warning information is generated.
As shown in fig. 4, the method further includes:
In this embodiment, the process performance index map displays information of the first threshold.
In the present embodiment, information of production elements that affect the quality element is also displayed on the screen of the display.
In this embodiment, the information of the adjusted production element is also displayed on the screen of the display.
In the present embodiment, a control center line is displayed in the single-value control map.
In the present embodiment, an upper limit control line and/or a lower limit control line are also displayed in the single-value control map.
In embodiment 2 of the present application, a PPK map and an individual value control map are generated according to data related to quality elements of a product, and the PPK map and the individual value control map are displayed on the same display screen, so that the quality elements of the product can be monitored in a visual manner, thereby facilitating timely adjustment of production elements involved in a production process of the product, achieving control of product quality in the production process, and reducing the batch reject ratio of the product. In addition, information of production elements affecting quality elements is further displayed on the same screen of the display, so that a producer can be helped to quickly identify the influence of each production element on data fluctuation, and the production elements can be effectively adjusted to restore the stability of data.
The controller described in connection with the embodiments of the invention may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. For example, one or more of the functional block diagrams and/or one or more combinations of the functional block diagrams illustrated in the figures may correspond to individual software modules, or may correspond to individual hardware modules of a computer program flow. These software modules may correspond to the steps shown in example 3, respectively. These hardware modules may be implemented, for example, by solidifying these software modules using a Field Programmable Gate Array (FPGA).
A software module may reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art. A storage medium may be coupled to the processor such that the processor can read information from, and write information to, the storage medium; or the storage medium may be integral to the processor. The processor and the storage medium may reside in an ASIC. The software module may be stored in the memory of the mobile terminal or in a memory card that is insertable into the mobile terminal. For example, if the electronic device employs a MEGA-SIM card with a larger capacity or a flash memory device with a larger capacity, the software module may be stored in the MEGA-SIM card or the flash memory device with a larger capacity.
One or more of the functional block diagrams and/or one or more combinations of the functional block diagrams described with respect to the figures may be implemented as a general purpose processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any suitable combination thereof designed to perform the functions described herein. One or more of the functional block diagrams and/or one or more combinations of the functional block diagrams described with respect to the figures may also be implemented as a combination of computing devices, e.g., a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in conjunction with a DSP communication, or any other such configuration.
The present application has been described in conjunction with specific embodiments, but it should be understood by those skilled in the art that these descriptions are intended to be illustrative, and not limiting. Various modifications and adaptations of the present application may occur to those skilled in the art based on the teachings herein and are within the scope of the present application.
Claims (16)
1. A system for controlling the quality of a product, the system comprising:
a display that displays a screen; and
a controller generating a process performance index map and a single-value control map of a quality element of a product based on data associated with the quality element,
the controller also controls the process performance index map and the single-value control map for the same quality element to be displayed on the same display screen of the display,
wherein,
the quality factors include:
production parameters during the manufacture of the product; and/or the presence of a gas in the gas,
the characteristic parameters during and/or after the manufacture of said product,
the data relating to quality factors of the product includes:
monitoring data of said production parameters during the manufacturing of said product; and/or the presence of a gas in the gas,
and (c) detecting data of the characteristic parameters during and/or after the manufacture of the product.
2. The system of claim 1, wherein,
the controller generates first early warning information when detecting that the difference of data related to the same quality element acquired by different devices exceeds a preset value.
3. The system of claim 1, wherein,
the controller generates second warning information upon detecting that a process performance index for a predetermined number of data points in the process performance index map is below a first threshold.
4. The system of claim 3, wherein,
the controller controls such that information of the first threshold is displayed in the process performance index map.
5. The system of claim 3, wherein,
the controller controls so that information of production elements that affect the quality elements is also displayed on the screen of the display.
6. The system of claim 5, wherein,
the controller controls so that information of the adjusted production element is also displayed on a screen of the display.
7. The system of claim 1, wherein,
the controller controls so that a control center line is displayed in the single-value control map.
8. The system of claim 7, wherein,
the controller controls so that an upper limit control line and/or a lower limit control line is also displayed in the single-value control map.
9. A method of controlling the quality of a product, the method comprising:
generating a process performance index map and a single-value control map of a quality element of a product according to data related to the quality element; and
causing the process performance index map and the single-value control map for the same quality element to be displayed on the same display screen of a display,
wherein,
the quality factors include:
production parameters during the manufacture of the product; and/or
The characteristic parameters during and/or after the manufacture of said product,
the data relating to quality factors of the product includes:
monitoring data of said production parameters during the manufacturing of said product; and/or
And (c) detecting data of the characteristic parameters during and/or after the manufacture of the product.
10. The method of claim 9, wherein,
the method further comprises the following steps:
and generating first early warning information when detecting that the difference of the data related to the same quality element acquired by different devices exceeds a preset value.
11. The method of claim 9, wherein,
the method further comprises the following steps:
generating second warning information upon detecting that a process performance index of a predetermined number of data points in the process performance index map is below a first threshold.
12. The method of claim 11, wherein,
and information of the first threshold is displayed in the process performance index map.
13. The method of claim 11, wherein,
information of production factors affecting the quality factors is also displayed on the screen of the display.
14. The method of claim 13, wherein,
and displaying the adjusted information of the production elements on the screen of the display.
15. The method of claim 9, wherein,
a control centerline is displayed in the single-value control map.
16. The method of claim 15, wherein,
also shown in the single-value control map are upper and/or lower limit control lines.
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