CN114062820A - Method for identifying weak components and parts in electronic whole machine storage test and evaluating influence - Google Patents
Method for identifying weak components and parts in electronic whole machine storage test and evaluating influence Download PDFInfo
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- CN114062820A CN114062820A CN202111370375.3A CN202111370375A CN114062820A CN 114062820 A CN114062820 A CN 114062820A CN 202111370375 A CN202111370375 A CN 202111370375A CN 114062820 A CN114062820 A CN 114062820A
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Abstract
A method for identifying and evaluating the influence of weak components in an electronic complete machine storage test comprises the following steps: performing initial measurement on the components for the whole machine before the machine is started; assembling a part of the whole machine by using the components for the whole machine after initial test and performing pre-test analysis; comparing the initial test data and the pre-test analysis result of each component to identify weak components of the whole machine storage test; assembling the rest complete machines, and performing bypass control on the identified weak components for the complete machine storage test; carrying out formal test on the whole machine, wherein each test node tests weak components and the whole machine in the storage test of the whole machine; analyzing the influence of the degradation of the weak components and the whole machine performance degradation in the whole machine storage test according to the weak components and the test results of the whole machine storage test; and (5) disassembling and analyzing the complete machine of the formal test, and evaluating the storage life of the complete machine. The invention can effectively realize the identification of weak components and the evaluation of the influence on the performance of the whole electronic machine in the accelerated storage test of the whole electronic machine.
Description
Technical Field
The invention belongs to the field of electronic complete machine reliability evaluation, and particularly relates to a method for identifying weak components and evaluating influences of a storage test of an electronic complete machine.
Background
The storage life of the electronic complete machine product is an important index for measuring the performance of the equipment. At present, the storage life evaluation method generally adopted at home and abroad is to perform accelerated storage test on products, apply environmental stress exceeding natural storage conditions on samples, collect and record failure or degradation data of relevant parameters, analyze and model test data under certain conditions, and extrapolate storage reliability indexes under normal stress.
At present, a test method and an evaluation method for an accelerated storage life test of an electronic complete machine product have a plurality of research achievements and applications. However, there are some problems in the whole test and evaluation process. For example, when the whole device is subjected to an accelerated test, the collection of basic data in the process, such as test data before component installation and after the test, is ignored. Therefore, when the components are not failed, whether the components are degraded or not can not be found through comparison of test data of the components before and after the test, and then which components are weak links in the storage of the whole product can be judged.
The method is also important for analyzing the influence of the degradation of the weak components on the performance degradation of the whole electronic machine by realizing on-board test and real-time monitoring of the weak components, but the on-board test of the components can be influenced by other components in a loop, so that the test result is inaccurate.
In addition, the accelerated test of the electronic product comprises a complete machine level, a component level and the like, but the test results of the complete machine level and the component level are relatively independent. The degradation of the whole machine caused by the degradation of which component can not be accurately judged through a test of the whole machine level, and the influence of the degradation degree of the component on the performance of the whole machine can not be quantitatively analyzed.
Disclosure of Invention
The invention aims to provide a method for identifying and evaluating the influence of weak components in an electronic whole machine storage test, aiming at solving the problems in the prior art, and effectively realizing the identification of the weak components, the on-board test of the weak components and the evaluation of the influence of the degeneration of the weak components on the whole machine performance in the accelerated storage test of the electronic whole machine.
In order to achieve the purpose, the invention has the following technical scheme:
a method for identifying and evaluating the influence of weak components in an electronic complete machine storage test comprises the following steps:
performing initial measurement on the components for the whole machine before the machine is started;
assembling a part of the whole machine by using the components for the whole machine after initial test and performing pre-test analysis;
comparing the initial test data and the pre-test analysis result of each component to identify weak components of the whole machine storage test;
assembling the rest complete machines, and performing bypass control on the identified weak components for the complete machine storage test;
carrying out formal test on the whole machine, wherein each test node tests weak components and the whole machine in the storage test of the whole machine;
analyzing the influence of the degradation of the weak components and the whole machine performance degradation in the whole machine storage test according to the weak components and the test results of the whole machine storage test;
and (5) disassembling and analyzing the complete machine of the formal test, and evaluating the storage life of the complete machine.
As a preferable aspect of the present invention, the step of initially testing the components for the whole machine before the component for the whole machine is loaded includes: and performing initial test on all components for the whole machine before the machine is started, and recording initial test data of the components corresponding to each bit number.
As a preferred aspect of the present invention, the step of assembling a part of the electronic complete machine with the initially tested complete machine components and performing a pre-test analysis includes: and (3) assembling a part of the whole machine by using the components for the whole machine after initial test, then performing a pre-test, and performing disassembly analysis on the part of the whole machine after the pre-test is completed to test the disassembled components.
As a preferred scheme of the present invention, the step of comparing the initial test data and the pre-test analysis result of each component to identify the weak component in the whole storage test comprises: and comparing the initial test data of each component with the test data of the disassembled component after the pre-test and the test data before and after the pre-test of the whole machine, and identifying the weak components in the whole machine storage test.
As a preferred aspect of the present invention, the step of performing bypass control on the identified weak component in the whole machine storage test specifically includes: and leading out the pin flying line of the identified weak component for the whole machine storage test, and arranging a switch capable of disconnecting the loop of the component in the whole machine.
As a preferred scheme of the present invention, the step of testing the weak components and devices of the entire machine storage test and the entire machine at each test node specifically includes: the weak component of the whole machine storage test is subjected to on-board test, the component is disconnected from the loop through the switch, and the component is not influenced by other components of the loop during the test of the component of the board; when the whole machine is tested, the switch is closed, so that the performance test of the whole machine is not influenced; and finally, obtaining weak components and test data of the whole machine storage test at different test time nodes.
According to the optimal scheme, the degradation trends of the weak components and the whole machine in the whole machine storage test are obtained through the test data of the weak components and the whole machine in the whole machine storage test at different test time nodes, and the influence of the degradation of the weak components on the performance degradation of the whole machine is researched through analyzing the degradation trends of the weak components and the whole machine in the whole machine storage test.
As a preferred aspect of the present invention, the step of evaluating the storage life of the whole machine specifically includes: and testing the disassembled components, recording the test data of the disassembled components corresponding to each bit number, comparing the initial test data of the components with the test data after the test, and evaluating the storage life of the electronic complete machine by integrating the degradation information of all the components.
Compared with the prior art, the invention has the following beneficial effects:
by the method for identifying and evaluating the influence of the weak components in the storage test of the electronic complete machine, the weak components in the accelerated storage test of the electronic complete machine can be effectively identified; the degradation data of the weak component in the accelerated storage test process can be accurately obtained, and then the degradation trend of the weak component and the degradation trend of the whole machine are compared and analyzed; the obtained accurate data can be substituted into circuit analysis software to research the influence of the degradation of weak components on the performance degradation of the whole machine; the test data before and after the test of all the components can be obtained, and the storage life of the electronic complete machine is evaluated by integrating the degradation information of all the components.
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FIG. 1 is a flow chart of a method for identifying weak components and evaluating influences of an electronic complete machine storage test according to an embodiment of the invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples.
Referring to fig. 1, the method for identifying weak components and evaluating the influence of the electronic complete machine storage test comprises the following steps:
1) performing initial test on all the complete machines by using components before the machines are operated, and recording the initial test data of the components corresponding to each bit number;
2) pre-testing is carried out after a part of the electronic complete machine is assembled, and after the pre-testing is finished, the part of the electronic complete machine is disassembled and analyzed, and the disassembled components are tested;
3) comparing the initial test data of each component with the disassembly test data after the pre-test, and the test data before and after the pre-test of the whole machine, and identifying the weak components in the whole machine storage test;
4) assembling the rest of the whole machine, leading out the identified pin flying line of the weak component in the assembling process, and designing a switch capable of disconnecting the loop of the component in the whole machine;
5) and carrying out formal test on the whole machine, wherein each test node tests the weak component and the whole machine in the test process. The weak component is subjected to on-board test, the component can be disconnected from the loop through the switch, and the component is not influenced by other components in the loop when the component is tested. And when the whole machine is tested, the switch is closed, and the performance test of the whole machine is not influenced. The test data of the weak components and the whole machine at different test time nodes can be obtained, and the degradation trend of the components and the whole machine can be obtained.
6) By analyzing the degradation trends of the components and the whole machine, the influence of the degradation of the weak components on the performance degradation of the whole machine is researched;
7) and (3) disassembling and analyzing the formal test complete machine, testing the disassembled components, recording the test data of the disassembled components corresponding to each bit number, comparing the initial test data of the components with the test data after the test, and evaluating the storage life of the electronic complete machine by integrating the degradation information of all the components.
The weak component identification and influence evaluation method for the electronic whole machine storage test is utilized to identify the weak component of the amplifier circuit storage test and analyze the influence of the degeneration of the weak component on the whole machine performance.
By comparing the test data of the components before and after the pre-test, the degradation of the metal film resistance in the circuit can be found in the storage process, and the components are weak components. In a formal test, the flyer is designed to independently test the metal film resistor. And substituting the obtained accurate data into circuit analysis software, and comparing and analyzing the influence of the degradation of the weak component on the performance degradation of the whole machine. And after the test, the components of the whole electronic machine are disassembled and tested, and the degradation information of all the components is integrated to evaluate the storage life of the electronic machine.
The invention realizes the identification of weak components, the on-board test of the weak components and the evaluation of the influence of the degeneration of the weak components on the performance of the whole electronic machine in the accelerated storage test of the whole electronic machine. The problem that the degradation degree of the components cannot be quantitatively analyzed to influence the performance of the whole machine is solved.
The above-mentioned embodiments are only preferred embodiments of the present invention, and are not intended to limit the technical solution of the present invention, and it should be understood by those skilled in the art that the technical solution can be modified and replaced by a plurality of simple modifications and replacements without departing from the spirit and principle of the present invention, and the modifications and replacements also fall into the protection scope covered by the claims.
Claims (8)
1. A method for identifying and evaluating the influence of weak components in an electronic whole machine storage test is characterized by comprising the following steps:
performing initial measurement on the components for the whole machine before the machine is started;
assembling a part of the whole machine by using the components for the whole machine after initial test and performing pre-test analysis;
comparing the initial test data and the pre-test analysis result of each component to identify weak components of the whole machine storage test;
assembling the rest complete machines, and performing bypass control on the identified weak components for the complete machine storage test;
carrying out formal test on the whole machine, wherein each test node tests weak components and the whole machine in the storage test of the whole machine;
analyzing the influence of the degradation of the weak components and the whole machine performance degradation in the whole machine storage test according to the weak components and the test results of the whole machine storage test;
and (5) disassembling and analyzing the complete machine of the formal test, and evaluating the storage life of the complete machine.
2. The method for identifying and evaluating the weak components and parts in the electronic whole machine storage test as claimed in claim 1, wherein the step of initially testing the components for the whole machine before the components for the whole machine are loaded comprises the following steps:
and performing initial test on all components for the whole machine before the machine is started, and recording initial test data of the components corresponding to each bit number.
3. The method for identifying and evaluating the weak components and the influences of the electronic complete machine storage test as claimed in claim 1, wherein the step of assembling a part of the electronic complete machine by using the components for the complete machine after the initial test and performing the pre-test analysis comprises the following steps:
and (3) assembling a part of the whole machine by using the components for the whole machine after initial test, then performing a pre-test, and performing disassembly analysis on the part of the whole machine after the pre-test is completed to test the disassembled components.
4. The method for identifying and evaluating the influence of the weak components in the electronic whole machine storage test as claimed in claim 3, wherein the step of comparing the initial test data and the pre-test analysis result of each component to identify the weak components in the whole machine storage test comprises the following steps: and comparing the initial test data of each component with the test data of the disassembled component after the pre-test and the test data before and after the pre-test of the whole machine, and identifying the weak components in the whole machine storage test.
5. The method for identifying and evaluating the influence of the weak components in the electronic whole machine storage test as claimed in claim 1, wherein the step of performing bypass control on the identified weak components in the whole machine storage test specifically comprises the following steps: and leading out the pin flying line of the identified weak component for the whole machine storage test, and arranging a switch capable of disconnecting the loop of the component in the whole machine.
6. The method for identifying and evaluating the weak components and parts in the electronic whole machine storage test as claimed in claim 5, wherein the step of testing the weak components and the whole machine in the whole machine storage test by each testing node specifically comprises the following steps: the weak component of the whole machine storage test is subjected to on-board test, the component is disconnected from the loop through the switch, and the component is not influenced by other components of the loop during the test of the component of the board; when the whole machine is tested, the switch is closed, so that the performance test of the whole machine is not influenced; and finally, obtaining weak components and test data of the whole machine storage test at different test time nodes.
7. The method for identifying and evaluating the weak components and the whole electronic machine storage test as claimed in claim 6, wherein the degradation trends of the weak components and the whole electronic machine storage test are obtained according to the test data of the weak components and the whole electronic machine storage test at different test time nodes, and the influence of the degradation of the weak components on the performance degradation of the whole electronic machine storage test is researched by analyzing the degradation trends of the weak components and the whole electronic machine storage test.
8. The method for identifying and evaluating the weak components and parts in the storage test of the whole electronic machine according to claim 1, wherein the step of evaluating the storage life of the whole electronic machine specifically comprises the following steps: and testing the disassembled components, recording the test data of the disassembled components corresponding to each bit number, comparing the initial test data of the components with the test data after the test, and evaluating the storage life of the electronic complete machine by integrating the degradation information of all the components.
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2021
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Patent Citations (6)
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| CN102928229A (en) * | 2012-10-24 | 2013-02-13 | 哈尔滨东安发动机（集团）有限公司 | Method for prolonging life of stored missile engine |
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