CN114047414B - Be used for defect test simulation in GIS air chamber to use convenient change structure - Google Patents
Be used for defect test simulation in GIS air chamber to use convenient change structure Download PDFInfo
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- CN114047414B CN114047414B CN202111333837.4A CN202111333837A CN114047414B CN 114047414 B CN114047414 B CN 114047414B CN 202111333837 A CN202111333837 A CN 202111333837A CN 114047414 B CN114047414 B CN 114047414B
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- insulating tape
- metal
- elastic insulating
- gis
- hole
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- 230000007547 defect Effects 0.000 title claims abstract description 77
- 238000012360 testing method Methods 0.000 title claims abstract description 26
- 238000004088 simulation Methods 0.000 title claims abstract description 21
- 230000008859 change Effects 0.000 title claims description 5
- 229910052751 metal Inorganic materials 0.000 claims abstract description 72
- 239000002184 metal Substances 0.000 claims abstract description 72
- 239000002923 metal particle Substances 0.000 claims abstract description 61
- 239000000725 suspension Substances 0.000 claims abstract description 37
- 239000004020 conductor Substances 0.000 claims abstract description 32
- 239000011810 insulating material Substances 0.000 claims abstract description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 10
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 9
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 9
- 229910052802 copper Inorganic materials 0.000 claims description 9
- 239000010949 copper Substances 0.000 claims description 9
- 229910052782 aluminium Inorganic materials 0.000 claims description 7
- 235000012239 silicon dioxide Nutrition 0.000 claims description 5
- 239000000377 silicon dioxide Substances 0.000 claims description 5
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 230000001105 regulatory effect Effects 0.000 claims description 2
- 239000003570 air Substances 0.000 description 10
- 239000000463 material Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000009413 insulation Methods 0.000 description 3
- 229910018503 SF6 Inorganic materials 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000005489 elastic deformation Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- SFZCNBIFKDRMGX-UHFFFAOYSA-N sulfur hexafluoride Chemical compound FS(F)(F)(F)(F)F SFZCNBIFKDRMGX-UHFFFAOYSA-N 0.000 description 2
- 229960000909 sulfur hexafluoride Drugs 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004643 material aging Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
Abstract
The invention relates to a convenient replacement structure for GIS air chamber defect test simulation, which comprises an elastic insulating tape, a viscous insulating material layer arranged on the lower surface of the insulating tape and used for being adhered to a conductor or an insulating piece, metal particles respectively matched with the elastic insulating tape and used for simulating the surface adhesion metal particle defects of a GIS inner conductor and the insulating piece, a metal tip used for simulating the surface burr point discharge defects of the GIS inner conductor and the insulating piece, and a metal suspension sheet used for suspending the defects.
Description
Technical Field
The invention relates to the technical field of GIS defect simulation detection, in particular to a convenient replacement structure for metal particle, tip and suspension defect test simulation in a GIS air chamber.
Background
In recent years, with the rapid development of economy, the demand of electric power is continuously increased, the requirements of electric power users on the operation reliability and the power supply quality of a power grid are higher and higher, GIS is a key device for power transmission and transformation of a power system, and has an important role in the power grid, and the operation reliability of the GIS is directly related to the safety and the stability of the system.
Years of operation and maintenance experience shows that GIS equipment inevitably generates defects due to manufacturing process, assembly quality, material aging, mechanical vibration and other reasons in the production, transportation, installation, operation and other processes. Common defects mainly include tip discharge defects such as metal particle defects, burrs and the like attached to the surfaces of GIS inner conductors and insulators, suspension defects and the like, and the defects are important reasons for causing insulation degradation and insulation damage in GIS equipment. When the GIS internal defect discharge theory research is carried out, the defects are required to be arranged in the simulation GIS device, but the problems that the defects are difficult to arrange because the size is too small or larger errors are generated to the test when the defects are fixed by other materials and the like often occur.
Disclosure of Invention
The invention aims to overcome the defects in the prior art and provides a convenient replacement structure for simulating the defect test in a GIS air chamber.
The aim of the invention can be achieved by the following technical scheme:
a convenient replacement structure for GIS air chamber defect test simulation comprises an elastic insulating tape, a viscous insulating material layer arranged on the lower surface of the insulating tape and used for being adhered to a conductor or an insulating piece, metal particles which are respectively matched with the elastic insulating tape and used for simulating the surface adhesion metal particle defects of a GIS inner conductor and the insulating piece, a metal tip used for simulating the surface burr point discharge defects of the GIS inner conductor and the insulating piece and a metal suspension sheet used for suspending the defects.
The elastic insulating tape is made of silicon dioxide film.
The elastic insulating tape is deformed to generate pressure when being pressed or pulled, so that contact pressures of different degrees are generated among metal particles, metal tips, metal suspension sheets and insulating pieces in the elastic insulating tape, and the discharge condition of real defects in a GIS is simulated.
When the defect of the metal particles is simulated, the elastic insulating tape is a hole-type elastic insulating tape, holes for embedding the metal particles are formed in the elastic insulating tape, the metal particles are embedded from the lower surface of the hole-type elastic insulating tape and are elastically fixed in the hole-type elastic insulating tape, and the contact pressure between the metal particles and the surface of a conductor or an insulating piece is regulated by changing the height of the metal particles protruding out of the hole-type elastic insulating tape.
The number of the holes is 1-9, when the number of the holes is 1, the elastic insulating tape is a single-hole elastic insulating tape, and when the number of the holes is 2-9, the elastic insulating tape is a multi-hole elastic insulating tape, and the positions, the sizes and the arrangement modes of the holes are all adjustable.
The metal particles are of a sphere structure, the material of the metal particles is copper or aluminum, and the diameter of the metal particles is 0.8-1mm.
When the surface burr point discharge defect is simulated, the elastic insulating tape is a hole type elastic insulating tape, and a hole which is used for penetrating through the metal point and has an adjustable aperture is formed in the elastic insulating tape.
The metal tip is a copper or aluminum metal needle, the head part of the metal tip is hemispherical, the middle part of the metal tip is cylindrical, the tail part of the metal tip is cylindrical, the length and the diameter of the cylindrical middle part of the metal tip are adjustable, the metal tip part is clamped by the cylindrical tail part after passing through a hole of the elastic insulating tape, and the contact pressure between the metal needle and the surface of a conductor or an insulating part is changed through the elasticity of the elastic insulating tape.
When the defect of the suspension body is simulated, the elastic insulating tape is a groove-type elastic insulating tape, and the upper surface of the groove-type elastic insulating tape is transversely provided with a groove for horizontally inserting the metal suspension sheet.
The metal suspension sheet is made of copper or aluminum, is rectangular with adjustable length and fixed width or round with adjustable diameter, and is used for simulating different discharge amounts of suspension defects, and the groove-type elastic insulating tape is adhered with insulating tapes with the same width and different thicknesses as the groove-type elastic insulating tape, so that the gap distance between the metal suspension sheet and a conductor or an insulating part is changed.
Compared with the prior art, the invention has the following advantages:
1. the hole-type insulating tape is used for arranging two defects of metal particles and metal burr tips, single metal particles or a plurality of metal particles can be arranged when the metal particles are arranged, multi-metal particle defects with different sizes and different positions can be arranged, and the metal particles and the metal tips can be replaced conveniently.
2. The groove-type elastic insulating tape can be used for simulating suspended potential defects by arranging the metal suspension sheets in multiple sizes and multiple shapes, so that the defect replaceable arrangement function is realized, the replacement is convenient, and the simulation test is convenient to carry out.
3. The adhesive structure on the lower surface of the insulating tape is used for adhering the insulating tape to a conductor or an insulating piece, so that defects are arranged more simply and conveniently.
4. The dielectric constant of the silicon dioxide film material is relatively close to that of air, nitrogen and sulfur hexafluoride, and the influence on the electric field in the test process is small.
5. The metal tip structure is arranged to be a smooth curved surface, so that electric field distortion is mainly generated at the upper end part of the metal tip, discharge concentration is ensured, and the influence of structural factors on a test is reduced.
Drawings
Fig. 1 is a schematic structure of a single hole elastic insulation tape.
Fig. 2 is a schematic structural view of a metal tip.
Fig. 3 is a view showing a structure of a metal burr tip defect arrangement by taking a diameter of 0.8mm and a length of 6mm as an example.
Fig. 4 is an uncompacted cross-sectional view of a metal burr tip defect, for example, having a diameter of 0.8mm and a length of 6mm, wherein fig. 4a is a top view and fig. 4b is a cross-sectional view A-A of fig. 4 a.
Fig. 5 is a cross-sectional view showing a metal burr tip defect compacting by taking a diameter of 0.8mm and a length of 6mm as an example, wherein fig. 5a is a top view and fig. 5B is a cross-sectional view B-B in fig. 5 a.
Fig. 6 is a structural view of a porous elastic insulating tape.
Fig. 7 is a diagram showing a configuration of a multi-metal particle defect arrangement by taking a diameter of 1mm as an example.
Fig. 8 is a schematic structural view of a groove-type insulating tape.
Fig. 9 is a structural cross-sectional view of the groove-type insulating tape, wherein fig. 9a is a plan view, and fig. 9b is a C-C cross-sectional view in fig. 9 a.
Fig. 10 is a diagram showing a configuration of a floating potential defect arrangement by taking a metal floating sheet having a length of 2cm as an example.
Fig. 11 is a cross-sectional view of a suspended potential defect arrangement, for example, a metal suspended sheet having a length of 2cm, wherein fig. 11a is a top view and fig. 11b is a D-D cross-sectional view in fig. 11 a.
The figure indicates:
101. elastic insulating tape, 102, holes, 103, adhesive insulating material layer, 201, metal pins, 701, metal particles, 1001, grooves, 1101, metal suspension sheet.
Detailed Description
In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "rear", etc. are used for indicating orientations or positional relationships based on the orientation or positional relationships shown in the drawings, and are merely for convenience of describing the present invention and simplifying the description, rather than indicating or implying that the indicated component or structure must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present invention.
The invention provides a convenient replacement structure for metal particle, tip and suspension defect test simulation in a GIS air chamber, which comprises an elastic insulating tape 101, metal particles 701, a metal tip and a metal suspension sheet 1101, wherein the elastic insulating tape 101 is designed into two structures, namely a hole-type elastic insulating tape and a groove-type elastic insulating tape; the metal particles 701 are embedded from the lower end of the hole-type elastic insulating tape, and are fixed in the hole-type elastic insulating tape by utilizing the elasticity of the insulating tape, so as to simulate the defects of the metal particles attached to the surfaces of the GIS inner conductor and the insulating piece; the metal tip is vertically inserted from the hole-type elastic insulating tape, and is fixed in the hole-type elastic insulating tape by utilizing the elasticity of the insulating tape, so as to simulate the tip discharge defects such as burrs on the surfaces of the GIS inner conductor and the insulating part; a metal suspension sheet 1101 is inserted horizontally into the upper surface of the grooved elastic insulating tape for simulating suspension defects.
The elastic insulating tape 101 is made of a silicon dioxide film, and the relative dielectric constant of the silicon dioxide film is close to that of air, nitrogen and sulfur hexafluoride, so that the influence on various defect discharge is small, the defect discharge condition in a real GIS air chamber can be simulated, the lower surface of the elastic insulating tape 101 is provided with a viscous insulating material layer 103 with viscosity, the elastic insulating tape 101 can be adhered to a conductor or an insulating piece, the elastic insulating tape 101 can be conveniently peeled off after a test, the elastic insulating tape 101 can be pressed or pulled to deform to generate pressure, and contact pressure of different degrees is generated between metal particles 701 and metal tips fixed in the insulating tape and the conductor or the insulating piece, so that the real defect discharge in the GIS can be simulated.
The hole type elastic insulating tape is divided into a single hole type elastic insulating tape and a multi-hole type elastic insulating tape according to its structure:
the single-hole elastic insulating tape is used for arranging metal particle 701 defects, burrs and other point discharge defects attached to the surfaces of a GIS inner conductor and an insulating piece, 1 hole 102 is formed in the middle of the single-hole elastic insulating tape, and the diameter of the hole 102 can be set to be 0.6-1mm according to test requirements;
the porous elastic insulating tape is used for arranging defects of metal particles 701 attached to the surfaces of the GIS inner conductor and the insulating piece, and a plurality of holes 102 are formed in the center of the porous elastic insulating tape 101, so that different hole numbers, hole position arrangements and different hole sizes can be set according to test requirements.
The groove-type elastic insulating tape is used for a suspension defect simulation test, a groove 1001 structure with the length of 10mm, the width of 10mm and the thickness of 1mm is arranged in the middle of the upper surface of the groove-type elastic insulating tape and is used for installing a metal suspension sheet 1101, and the groove-type elastic insulating tape can change the gap distance between the metal suspension sheet 1101 and a conductor or an insulating piece by pasting insulating tapes with the same length and width as the groove 1001-type insulating tape and different thicknesses.
The metal particles 701 are made of copper or aluminum materials; the metal particles 701 have a spherical structure, and the diameter of the metal particles is 0.8-1mm; when the metal particles 701 are arranged to fix the defects of the metal particles 701, 1-9 metal particles 701 with different numbers and different sizes can be arranged, and the arrangement positions can be adjusted according to the test requirements; when the metal particles 701 are arranged to fix the defects of the metal particles 701, a variable height H is arranged between the metal particles 701 and the porous elastic insulating tape, and the contact pressure between the metal particles 701 and the surface of the conductor or the insulator is changed by adjusting the variable height H and utilizing the elastic deformation of the insulating tape.
The metal tip is made of copper or aluminum, the upper end of the metal tip is of a hemispherical structure, the size of the hemispherical structure is changed according to the diameter of the metal tip, the middle of the metal tip is of a cylindrical structure with variable length L and diameter D, the lower end of the metal tip is of a truncated cone structure with the height of 1mm, the upper circle diameter of the truncated cone structure is changed according to the straight diameter of the metal tip, and the lower circle diameter is 1.6mm; the lower end of the round table with the metal tip is of a cylindrical structure with the height of 1mm and the diameter of 1.6mm, and the contact pressure between the metal tip and the surface of a conductor or an insulating piece can be changed by using the elasticity of the insulating tape.
The metal suspension sheet 1101 is made of copper or aluminum materials, the length L of the metal suspension sheet 1101 is variable, a rectangular structure with the width of 10mm and a circular structure with the diameter of 8-10mm are arranged according to test requirements, the thickness is 1mm, and simulation of different discharge amounts of suspension defects is realized.
Example 1
As shown in fig. 1 to 5, the present example provides a convenient replacement structure for the simulation of metal particle, tip and suspension defect test in a GIS gas chamber, which comprises a single hole type elastic insulating tape and a metal tip.
In this embodiment, a metal tip with a diameter of 0.8mm and a length of 6mm is taken as an example, and the implementation principle is as follows:
the metal tip is vertically inserted from and passed through the single hole type elastic insulating tape, and the metal tip is fixed in the single hole type elastic insulating tape by using the elasticity of the insulating tape. By pulling on both sides of the single hole type elastic insulating tape and adhering the tape to the conductor, the length of the hole type elastic insulating tape is 13mm, the width of the hole type elastic insulating tape is 7mm, and the thickness of the hole type elastic insulating tape is 0.5mm, and the contact pressure between the metal tip and the surface of the conductor or the surface of the insulating piece can be changed by using the elasticity of the insulating tape.
Example 2
As shown in fig. 6 and 7, the present example provides a convenient replacement structure for simulating defects of metal particles, tips and suspensions in a GIS gas chamber, which comprises a porous elastic insulating tape and metal particles.
In this embodiment, metal particles with a diameter of 1mm are taken as an example, and the implementation principle is as follows:
9 metal particles are respectively plugged into the porous elastic insulating tape from the lower end of the porous elastic insulating tape and are fixed in the insulating tape by utilizing the elastic action of the insulating tape, 3 rows of 3 columns of 9 holes with the center distance of 2mm are formed in the center of the porous elastic insulating tape according to experimental requirements, the diameters of the holes are set to be 0.6mm according to the sizes of the metal particles, and the two sides of the porous elastic insulating tape are pulled and adhered to a conductor or an insulating piece. When the metal particles are arranged and fixed to have metal particle defects, a variable height H is arranged between the metal particles and the porous hole type elastic insulating tape, and the contact pressure between the metal particles and the surface of the conductor or the insulating piece is changed by adjusting the variable height H and utilizing the elastic deformation of the insulating tape.
Example 3
As shown in fig. 8 to 11, the present example provides a convenient replacement structure for simulating defects of metal particles, tips and suspensions in a GIS air chamber, which comprises a groove-type elastic insulating tape and a metal suspension sheet.
In this embodiment, a metal suspension sheet with a length of 20mm, a width of 10mm, and a thickness of 1mm is taken as an example, and the implementation principle is as follows:
the metal suspension sheet is horizontally inserted into the groove of the insulating tape from the upper end of the groove-type elastic insulating tape. The length of the groove type elastic insulating tape is 30mm, the width is 10mm, and the thickness is 3mm. The groove-type elastic insulating tape can be adhered to the groove-type insulating tape with the same length and width, and the insulating tapes with different thicknesses can change the gap distance between the metal suspension sheet and the conductor or the insulating piece.
The present invention is not limited to the above-described embodiments, and various changes and modifications may be made by those skilled in the art, and these equivalents are intended to be included within the scope of the appended claims. While the preferred embodiments of the present invention have been illustrated and described in detail, it should be understood that the same is by way of example and not to be taken as limiting the invention, and that changes, modifications, substitutions and alterations can be made thereto by those of ordinary skill in the art without departing from the spirit and scope of the invention, which is defined solely by the appended claims.
In summary, the invention is used for simulating the tip discharge defects such as metal particle defects, surface burrs and the like attached to the surfaces of GIS inner conductors and insulating pieces and the defects such as suspension bodies and the like, solves the problems of large error, difficult arrangement and the like of the existing GIS air chamber internal defect partial discharge simulation test, and the like.
Claims (7)
1. The convenient replacement structure for GIS air chamber defect test simulation is characterized by comprising an elastic insulating tape (101), a viscous insulating material layer (103) arranged on the lower surface of the insulating tape (101) and used for being adhered to a conductor or an insulating piece, metal particles (701) respectively matched with the elastic insulating tape (101) and used for simulating metal particle defects attached to the surfaces of the GIS inner conductor and the insulating piece, metal tips used for simulating burr point discharge defects on the surfaces of the GIS inner conductor and the insulating piece and metal suspension sheets (1101) used for suspending defects;
when the defect of the metal particles is simulated, the elastic insulating tape (101) is a hole-type elastic insulating tape, holes (102) for embedding the metal particles (701) are formed in the elastic insulating tape, the metal particles (701) are embedded from the lower surface of the hole-type elastic insulating tape and are elastically fixed in the hole-type elastic insulating tape, and the contact pressure between the metal particles (701) and the surface of a conductor or an insulating piece is regulated by changing the height of the protruding hole-type elastic insulating tape of the metal particles (701);
when the surface burr point discharge defect is simulated, the elastic insulating tape (101) is a hole type elastic insulating tape, and a hole (102) which is used for penetrating through the metal point and has adjustable aperture is formed in the elastic insulating tape (101);
when simulating a defect of a suspension body, the elastic insulating tape (101) is a groove-type elastic insulating tape, and the upper surface of the groove-type elastic insulating tape is transversely provided with a groove (1001) for horizontally inserting a metal suspension sheet (1101).
2. The convenient replacement structure for the GIS air chamber defect test simulation according to claim 1, wherein the elastic insulating tape (101) is made of silicon dioxide film.
3. The convenient replacement structure for the GIS air chamber defect test simulation according to claim 2, wherein the elastic insulating tape (101) deforms to generate pressure when being pressed or pulled, so that contact pressures with different degrees are generated between metal particles, metal tips and metal suspension sheets (1101) arranged in the elastic insulating tape (101) and the insulating piece, and the actual defect discharge condition in the GIS is simulated.
4. The convenient replacement structure for the GIS air chamber defect test simulation is characterized in that the number of the holes (102) is 1-9, when the number of the holes (102) is 1, the elastic insulating tape (101) is a single-hole elastic insulating tape, when the number of the holes (102) is 2-9, the elastic insulating tape (101) is a multi-hole elastic insulating tape, and the positions, the sizes and the arrangement modes of the holes (102) are all adjustable.
5. The convenient replacement structure for the GIS air chamber defect test simulation of claim 4, wherein the metal particles are of a spherical structure, are made of copper or aluminum, and have diameters of 0.8-1mm.
6. The convenient replacement structure for the GIS air chamber defect test simulation is characterized in that the metal tip is a copper or aluminum metal needle (201), the head of the metal needle is hemispherical, the middle of the metal needle is cylindrical, the tail of the metal needle is cylindrical, the length and the diameter of the cylindrical middle of the metal needle are adjustable, the metal needle is clamped by the cylindrical tail after the head of the metal needle (201) passes through a hole (102) of an elastic insulating belt (101), and the contact pressure between the metal needle (201) and the surface of a conductor or an insulating piece is changed through the elasticity of the elastic insulating belt (101).
7. The convenient replacement structure for the defect test simulation in the GIS air chamber according to claim 1, wherein the metal suspension sheet (1101) is made of copper or aluminum, is rectangular with adjustable length and fixed width, or is round with adjustable diameter, and is used for realizing the simulation of different discharge amounts of the defects of the suspension body, and the groove-type elastic insulating tape is used for pasting insulating tapes with the same width and different thickness as the groove-type elastic insulating tape so as to change the gap distance between the metal suspension sheet (1101) and a conductor or an insulating piece.
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Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201188368Y (en) * | 2008-04-11 | 2009-01-28 | 张长安 | Integral-molding compound material insulation drive tube with insert |
CN202600103U (en) * | 2012-06-14 | 2012-12-12 | 江苏省电力试验研究院有限公司 | Independent metal tip defect model for partial discharge test of gas insulated switchgear (GIS) |
CN103592588A (en) * | 2013-11-26 | 2014-02-19 | 深圳供电局有限公司 | Simulation device of floating potential flaws inside GIS power equipment |
CN103605051A (en) * | 2013-11-19 | 2014-02-26 | 国家电网公司 | Gas insulated metal tip defect device for partial discharge test under impact voltage |
CN204575805U (en) * | 2015-05-19 | 2015-08-19 | 国家电网公司 | A kind of defect model of Simulated GlS inner suspension current potential electric discharge |
CN104937673A (en) * | 2013-01-23 | 2015-09-23 | 西门子公司 | Insulation arrangement for high-voltage machine |
CN204731371U (en) * | 2015-05-22 | 2015-10-28 | 广西电网有限责任公司电力科学研究院 | A kind of free metal particle defects analogue experiment installation of disc insulator |
CN106990335A (en) * | 2017-03-23 | 2017-07-28 | 国家电网公司 | The test model of the sophisticated shelf depreciations of GIS under simulation slightly non-uniform field background |
KR101847864B1 (en) * | 2017-07-18 | 2018-04-13 | 주식회사 에스에이치아이앤씨 | MEMS acceleration sensor based partial discharge / fault location detection method and detection system |
CN207780166U (en) * | 2017-12-26 | 2018-08-28 | 上海交通大学 | Sensor for the detection of gas-insulating and fully-enclosed combined electrical apparatus insulation defect |
CN108535609A (en) * | 2018-03-05 | 2018-09-14 | 上海交通大学 | A kind of PCB antenna and the external acoustic-electric compound sensor for the detection of GIS insulation defects |
CN111024233A (en) * | 2019-11-14 | 2020-04-17 | 国网上海市电力公司 | Simulation device for poor contact of GIS internal contact and infrared calibration method |
-
2021
- 2021-11-11 CN CN202111333837.4A patent/CN114047414B/en active Active
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201188368Y (en) * | 2008-04-11 | 2009-01-28 | 张长安 | Integral-molding compound material insulation drive tube with insert |
CN202600103U (en) * | 2012-06-14 | 2012-12-12 | 江苏省电力试验研究院有限公司 | Independent metal tip defect model for partial discharge test of gas insulated switchgear (GIS) |
CN104937673A (en) * | 2013-01-23 | 2015-09-23 | 西门子公司 | Insulation arrangement for high-voltage machine |
CN103605051A (en) * | 2013-11-19 | 2014-02-26 | 国家电网公司 | Gas insulated metal tip defect device for partial discharge test under impact voltage |
CN103592588A (en) * | 2013-11-26 | 2014-02-19 | 深圳供电局有限公司 | Simulation device of floating potential flaws inside GIS power equipment |
CN204575805U (en) * | 2015-05-19 | 2015-08-19 | 国家电网公司 | A kind of defect model of Simulated GlS inner suspension current potential electric discharge |
CN204731371U (en) * | 2015-05-22 | 2015-10-28 | 广西电网有限责任公司电力科学研究院 | A kind of free metal particle defects analogue experiment installation of disc insulator |
CN106990335A (en) * | 2017-03-23 | 2017-07-28 | 国家电网公司 | The test model of the sophisticated shelf depreciations of GIS under simulation slightly non-uniform field background |
KR101847864B1 (en) * | 2017-07-18 | 2018-04-13 | 주식회사 에스에이치아이앤씨 | MEMS acceleration sensor based partial discharge / fault location detection method and detection system |
CN207780166U (en) * | 2017-12-26 | 2018-08-28 | 上海交通大学 | Sensor for the detection of gas-insulating and fully-enclosed combined electrical apparatus insulation defect |
CN108535609A (en) * | 2018-03-05 | 2018-09-14 | 上海交通大学 | A kind of PCB antenna and the external acoustic-electric compound sensor for the detection of GIS insulation defects |
CN111024233A (en) * | 2019-11-14 | 2020-04-17 | 国网上海市电力公司 | Simulation device for poor contact of GIS internal contact and infrared calibration method |
Non-Patent Citations (2)
Title |
---|
GIS 局部放电常规检测和超声波检测方法的应用比较;李德军等;《高压电器》;全文 * |
基于时频分析与分形理论的GIS局部放电模式 识别特征提取方法;陈继明等;《高压电技术》;第287-295页 * |
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