CN114034883A - Acceleration determination method, acceleration determination device, acceleration determination apparatus, storage medium, and program - Google Patents
Acceleration determination method, acceleration determination device, acceleration determination apparatus, storage medium, and program Download PDFInfo
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- CN114034883A CN114034883A CN202210011900.0A CN202210011900A CN114034883A CN 114034883 A CN114034883 A CN 114034883A CN 202210011900 A CN202210011900 A CN 202210011900A CN 114034883 A CN114034883 A CN 114034883A
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- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
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- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
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Abstract
The application provides an acceleration determination method, an acceleration determination device, acceleration determination equipment, a storage medium and a program, wherein the method comprises the following steps: acquiring the current temperature of an accelerometer, the starting temperature of the accelerometer and a first sampling value acquired by the accelerometer; determining a first temperature change value according to the current temperature and the starting temperature; determining a target scale factor and a target offset value of the accelerometer according to the current temperature and the first temperature change value; and determining the acceleration corresponding to the first sampling value according to the first sampling value, the target scale factor and the target offset value. In the process, when the target scale factor and the target offset value of the accelerometer are determined, the influence of the current temperature on the accelerometer is considered, and the influence of the first temperature change value of the current temperature relative to the starting temperature on the accelerometer is also considered, so that the determined target scale factor and the target offset value are more accurate, and the measurement accuracy of the accelerometer is improved.
Description
Technical Field
The present application relates to the field of inertial meter technologies, and in particular, to a method, an apparatus, a device, a storage medium, and a program for determining an acceleration.
Background
An accelerometer is a meter that measures acceleration. The accelerometer is widely applied to the inertial navigation system, and the precision of the accelerometer can directly influence the precision of the inertial navigation system.
The accuracy of an accelerometer is dependent on the environmental conditions in addition to the manufacturing process, internal structure, materials, etc. Among them, the influence of temperature is most significant. Generally, when the accelerometer is in different temperature environments, the scale factor of the accelerometer changes, so that the measurement accuracy of the accelerometer is affected. In a related implementation, the scale factor of the accelerometer may be compensated based on a current temperature of the accelerometer, and the compensated scale factor may be used to determine the acceleration.
However, based on the above implementation, the measurement accuracy of the accelerometer is still low.
Disclosure of Invention
The application provides an acceleration determination method, an acceleration determination device, acceleration determination equipment, a storage medium and a program, which are used for improving the measurement precision of an accelerometer.
In a first aspect, the present application provides an acceleration determining method, including:
acquiring the current temperature of an accelerometer, the starting temperature of the accelerometer and a first sampling value acquired by the accelerometer;
determining a first temperature change value according to the current temperature and the starting temperature;
determining a target scaling factor and a target offset value for the accelerometer based on the current temperature and the first temperature change value;
and determining the acceleration corresponding to the first sampling value according to the first sampling value, the target scale factor and a target offset value.
In one possible implementation, determining a target scaling factor and a target offset value for the accelerometer based on the current temperature and the first temperature change value includes:
determining the target scale factor according to the current temperature and the first temperature change value;
and determining the target offset value according to the current temperature.
In one possible implementation, determining the target scaling factor according to the current temperature and the first temperature variation value includes:
acquiring a first relation model between the scale factor and the temperature and acquiring a third relation model between the change value of the scale factor and the change value of the temperature;
determining a first scaling factor based on the current temperature and the first relationship model;
determining a first scale factor change value according to the first temperature change value and the third relation model;
determining the target scale factor based on the first scale factor and the first scale factor variation value.
In one possible implementation, obtaining a third correlation model between the scale factor variation value and the temperature variation value includes:
the method comprises the steps of obtaining a plurality of starting process models corresponding to preset temperatures, wherein the starting process models are used for indicating the relation between a change value of a scale factor and a temperature change value when the accelerometer is started at the preset temperatures;
determining a target preset temperature among the plurality of preset temperatures, wherein the absolute value of the difference between the target preset temperature and the starting temperature is minimum;
and determining a starting process model corresponding to the target preset temperature as the third relation model.
In one possible implementation, determining the target offset value according to the current temperature includes:
obtaining a second relation model between the deviation value and the temperature;
and determining the target offset value according to the current temperature and the second relation model.
In one possible implementation, obtaining a first relationship model between the scaling factor and the temperature includes:
if the first relation model exists in a preset storage space, acquiring the first relation model in the preset storage space;
if the first relation model does not exist in the preset storage space, acquiring first sample data, and generating the first relation model according to the first sample data;
wherein the first sample data includes: the accelerometer comprises a plurality of sample temperatures, a first sample value obtained by sampling a first sample acceleration at each sample temperature by the accelerometer, and a second sample value obtained by sampling a second sample acceleration at each sample temperature by the accelerometer; the values of the first sample acceleration and the second sample acceleration are opposite numbers, and the first sample data is acquired after the accelerometer runs for a preset time.
In one possible implementation, generating the first relationship model according to the first sample data includes:
for any sample temperature, determining a sample scaling factor corresponding to the sample temperature according to the first sample value and the second sample value at the sample temperature;
generating the first relational model from the plurality of sample temperatures and the plurality of sample scaling factors.
In one possible implementation, obtaining a second relationship model between the offset value and the temperature includes:
if the second relation model exists in a preset storage space, acquiring the second relation model in the preset storage space;
if the second relation model does not exist in the preset storage space, acquiring second sample data, and generating the second relation model according to the second sample data;
wherein the second sample data comprises: the accelerometer is used for measuring the acceleration of the sample at each sample temperature, and the accelerometer is used for measuring the acceleration of the sample at each sample temperature; the values of the third sample acceleration and the fourth sample acceleration are respectively 0, the directions of the third sample acceleration and the fourth sample acceleration are opposite, and the second sample data is obtained by sampling after the accelerometer runs for a preset time length.
In one possible implementation, the generating the second relationship model according to the second sample data includes:
for any sample temperature, determining a sample offset value corresponding to the sample temperature according to the third sample sampling value and the fourth sample sampling value at the sample temperature;
generating the second relational model from the plurality of sample temperatures and the plurality of sample offset values.
In a possible implementation manner, for each preset temperature, obtaining a starting process model corresponding to the preset temperature includes:
if the starting process model corresponding to the preset temperature exists in the preset storage space, acquiring the starting process model corresponding to the preset temperature in the preset storage space;
if the starting process model corresponding to the preset temperature does not exist in the preset storage space, acquiring third sample data corresponding to the preset temperature, and generating the starting process model corresponding to the preset temperature according to the third sample data;
wherein the third sample data comprises: a plurality of sample temperatures, a fifth sample value obtained by sampling a fifth sample acceleration by the accelerometer at each of the sample temperatures; and the third sample data is obtained by sampling within a preset time length after the accelerometer is started.
In a possible implementation manner, generating a starting process model corresponding to the preset temperature according to the third sample data includes:
obtaining a plurality of scale factors to be selected according to the plurality of sample temperatures and the first relation model;
obtaining a plurality of offset values to be selected according to the plurality of sample temperatures and a second relation model;
determining a plurality of scale factor variation values to be selected according to the plurality of fifth sample sampling values, the plurality of scale factors to be selected and the plurality of offset values to be selected;
determining a plurality of temperature change values to be selected according to the plurality of sample temperatures and the preset temperature;
and determining a starting process model corresponding to the preset temperature according to the multiple scale factor change values to be selected and the multiple temperature change values to be selected.
In a second aspect, the present application provides an acceleration determination apparatus comprising:
the system comprises an acquisition module, a control module and a processing module, wherein the acquisition module is used for acquiring the current temperature of an accelerometer, the starting temperature of the accelerometer and a first sampling value acquired by the accelerometer;
the first determining module is used for determining a first temperature change value according to the current temperature and the starting temperature;
a second determination module for determining a target scaling factor and a target offset value for the accelerometer based on the current temperature and the first temperature change value;
and the third determining module is used for determining the acceleration corresponding to the first sampling value according to the first sampling value, the target scale factor and a target offset value.
In a third aspect, the present application provides an electronic device, comprising:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores a computer program that is executed by the at least one processor to implement the method of any of the first aspects.
In a fourth aspect, the present application provides a computer-readable storage medium comprising: the computer-readable storage medium has stored thereon a computer program which, when executed by a processor, implements the method according to any of the first aspects.
In a fifth aspect, the present application provides a computer program product comprising a computer program which, when executed by a processor, implements the method according to any one of the first aspect.
The present application provides an acceleration determination method, apparatus, device, storage medium, and program, the method including: acquiring the current temperature of an accelerometer, the starting temperature of the accelerometer and a first sampling value acquired by the accelerometer; determining a first temperature change value according to the current temperature and the starting temperature; determining a target scale factor and a target offset value of the accelerometer according to the current temperature and the first temperature change value; and determining the acceleration corresponding to the first sampling value according to the first sampling value, the target scale factor and the target offset value. In the process, when the target scale factor and the target offset value of the accelerometer are determined, the influence of the current temperature on the accelerometer is considered, and the influence of the first temperature change value of the current temperature relative to the starting temperature on the accelerometer is also considered, so that the determined target scale factor and the target offset value are more accurate, and the measurement accuracy of the accelerometer is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
FIG. 1 is a schematic diagram illustrating the operating principle of an accelerometer according to an embodiment of the present disclosure;
FIG. 2 is a graph illustrating a scale factor of an accelerometer according to an embodiment of the present disclosure;
fig. 3 is a schematic flowchart of an acceleration determining method according to an embodiment of the present application;
FIG. 4 is a schematic diagram illustrating temperature variation during start-up of an accelerometer according to an embodiment of the present disclosure;
FIG. 5 is a schematic diagram illustrating an accelerometer calibration process according to an embodiment of the present disclosure;
fig. 6 is a schematic structural diagram of an acceleration determining apparatus according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The terms "first," "second," "third," "fourth," and the like in the description and in the claims of the present application and in the above-described drawings (if any) are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In order to facilitate understanding of the technical solution of the present application, an operation principle of the accelerometer is first described with reference to fig. 1.
Fig. 1 is a schematic diagram of an operating principle of an accelerometer according to an embodiment of the present application. As shown in fig. 1, an acceleration f is applied to the accelerometer, which is sensitive to the acceleration f, and a sampled value N is output. The sampling value N may be a current signal, a voltage signal, or a frequency signal. The sensing model of the accelerometer can be expressed as the following equation (1):
Where f is the applied acceleration and N is the sampled value output by the accelerometer. K is the scaling factor of the accelerometer and D is the offset value of the accelerometer.
The scale factor K may also be referred to as a scale factor, simply scale. The scaling factor K and the offset value D may be determined by a calibration process of the accelerometer.
In practical application, the acceleration f can be calculated by using the following formula (2) according to the sampling value N output by the accelerometer, the scale factor K and the offset value D, so that the measurement of the acceleration is realized.
The acceleration determination method provided by the present embodiment may be applied to any type of accelerometer, for example, a quartz flexure accelerometer, or other type of accelerometer.
In the above process, the acceleration calculated by the formula (2) is the total acceleration applied by the accelerometer, and the total acceleration includes the acceleration caused by the gravity acceleration and other external forces (i.e., external forces other than the earth's gravity). Therefore, in practical applications, after the acceleration f is calculated by the formula (2), the acceleration f may be subtracted by the gravity acceleration to obtain the acceleration caused by other external forces. The acceleration due to the other external force is generally referred to as "specific force". In practical applications, the accelerometer measures a "specific force".
In practical applications, the accuracy of the accelerometer may be affected by the ambient temperature. The inventor of the application finds that when the accelerometer works, a torque coil of an inner meter core of the accelerometer can generate self-heating to cause temperature change of the meter core when passing through feedback current, a temperature field is formed inside the accelerometer, the temperature field is difficult to reach balance in a short time, and components such as magnetic steel of the inner meter core of the accelerometer and the like can generate parameter change in the temperature field, so that a scale factor K and an offset value D of the accelerometer can change along with the change of temperature.
The influence of the temperature on the accelerometer is mainly reflected in the following two aspects:
(1) the scaling factor K and the offset value D of the accelerometer will all be different at different temperatures. For example, in the case of a quartz flexible accelerometer, when the operating temperature is changed from-40 ℃ to +50 ℃, the scale factor K of the accelerometer can be changedAnd even larger. That is, even when the accelerometer has reached thermal equilibrium, the scaling factor K and offset value D of the accelerometer will vary when the accelerometer is operating at different temperatures.
(2) During the start-up of the accelerometer, the temperature of the accelerometer changes with time, and the rate of change of the temperature of the accelerometer also has an effect on the scaling factor K. That is, the scaling factor K of the accelerometer has a significant start-up process. For example, fig. 2 is a graph illustrating a variation of an accelerometer scale factor with time according to an embodiment of the present application. As shown in FIG. 2, the acceleration changes nearly within 300s after starting。
Based on the above analysis, in the technical solution provided by the present application, the target scale factor and the target offset value of the accelerometer may be determined according to the current temperature of the accelerometer and the first temperature change value of the current temperature relative to the start temperature. Further, an acceleration corresponding to the first sample value is determined based on the first sample value of the accelerometer, the target scaling factor, and the target offset value. In the process, when the target scale factor and the target offset value of the accelerometer are determined, the influence of the current temperature on the accelerometer is considered, and the influence of the change condition of the current temperature relative to the starting temperature on the accelerometer is also considered, so that the determined target scale factor and the target offset value are more accurate, and the measurement accuracy of the accelerometer is improved.
The technical solution of the present application will be described in detail below with specific examples. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments.
Fig. 3 is a schematic flowchart of an acceleration determining method according to an embodiment of the present application. As shown in fig. 3, the method of the present embodiment includes:
s301: the method comprises the steps of obtaining the current temperature of an accelerometer, the starting temperature of the accelerometer and a first sampling value collected by the accelerometer.
The method of the embodiment can be executed in real time after the accelerometer is started. Wherein, the current temperature refers to the real-time temperature of the accelerometer. In some examples, the real-time temperature of the accelerometer may be acquired by a temperature sensor disposed within or around the acceleration.
The starting temperature of the accelerometer refers to the environment temperature of the accelerometer when the accelerometer is started at the time. It should be understood that, during the starting process of the accelerometer, the moment coil of the watch core inside the accelerometer can self-heat when passing through the feedback current to cause the temperature change of the watch core, and a temperature field is formed inside the accelerometer, so that the current temperature of the accelerometer is different from the starting temperature.
Fig. 4 is a schematic diagram of a temperature variation amount in a start-up process of an accelerometer according to an embodiment of the present application. As shown in fig. 4, the temperature of the accelerometer may change by about 7 degrees within 1000s after the accelerometer is powered on. For example, assuming that the start temperature of the accelerometer is 20 degrees, at the start time (e.g., 0 s), the current temperature of the accelerometer is the same as the ambient temperature, i.e., the temperature change amount is 0. However, as the temperature of the accelerometer internal core increases, the current temperature of the accelerometer will gradually increase, which may reach around 27 degrees after 1000s of start-up.
The first sampling value acquired by the accelerometer is a sampling value output by the accelerometer sensing the acceleration by using the sensing model shown in formula (1). The sampling value may be an electrical signal (for example, a current signal or a voltage signal), or may also be a frequency signal obtained by converting the electrical signal, which is not limited in this embodiment.
S302: and determining a first temperature change value according to the current temperature and the starting temperature.
For example, the difference between the current temperature and the start temperature is determined as the first temperature change value.
S303: determining a target scaling factor and a target offset value for the accelerometer based on the current temperature and the first temperature change value.
In the embodiment of the application, the scale factor and the offset value of the accelerometer can be compensated according to the current temperature and the first temperature change value, so that a target scale factor and a target offset value are obtained.
In a possible implementation manner, the influence of the temperature variation on the scale factor is considered to be large, and the influence on the offset value is negligible, and for implementation convenience, only the current temperature can be considered when compensating the offset value, and the temperature variation is not considered.
In particular, a target scaling factor for the accelerometer may be determined based on the current temperature and the first temperature change value. That is, the scale factor of the acceleration is compensated using the current temperature and the first temperature change value, resulting in a target scale factor. Based on the current temperature, a target offset value for the accelerometer is determined. That is, the offset value of the accelerometer is compensated by the current temperature, resulting in a target offset value.
In the embodiment of the present application, based on the analysis of the influence of the temperature on the accelerometer, the following three relationship models may be established in advance:
the first relation model is used for indicating the relation between the scale factor and the temperature and can also be called as the relation model between the scale factor and the temperature.
The second relation model is used for indicating the relation between the offset value and the temperature, and can also be called as the relation model between the offset value and the temperature.
The third relation model is used for indicating the relation between the scale factor change value and the temperature change value, and can also be called a relation model between the scale factor change value and the temperature change value, or a starting process model.
Wherein the first relational model can be used for compensating the influence of the temperature on the scale factor. The second relationship model described above may be used to compensate for the effect of temperature on the offset value. The third relationship model described above may be used to compensate for the effect of temperature variation on the scaling factor.
It should be noted that, in this embodiment, specific forms of the first relationship model, the second relationship model, and the third relationship model are not limited, and for example, the first relationship model, the second relationship model, and the third relationship model may be a polynomial function model, an exponential function model, or a function model in another form.
In one possible implementation, the target scale factor and the target offset value of the accelerometer may be determined as follows:
(1) a first model of a relationship between the scale factor and the temperature is obtained, a second model of a relationship between the offset value and the temperature is obtained, and a third model of a relationship between a change in the scale factor and a change in the temperature is obtained.
(2) A first scaling factor is determined based on the current temperature and the first relationship model.
For example, assuming that the current temperature is T1 and the starting temperature is T0, the current temperature T1 may be substituted into the first relationship model to obtain the first scaling factor K1.
(3) And determining a first scale factor change value according to the first temperature change value and the third relation model.
For example, assume that the first temperature change value isThe first temperature can be changed by a valueSubstituting into the third relation model to obtain the first scale factor variation value。
(4) Determining the target scale factor based on the first scale factor and the first scale factor variation value.
Illustratively, the first scaling factor K1 may be varied from the first scaling factorThe sum, determined as the target scale factor K, i.e., K = K1+。
(5) And determining the target offset value according to the current temperature and the second relation model.
For example, the current temperature T1 may be substituted into the second relational model to obtain the target offset value D.
In this embodiment, it is considered that the temperature change conditions of the accelerometer are usually different when the accelerometer is started at different environmental temperatures, and therefore, a plurality of preset temperatures can be determined in advance, and the starting process of the accelerometer in the environment with each preset temperature is measured to obtain the starting process models corresponding to different preset temperatures. Thus, the third relation model may be obtained in the following manner in the step (1):
the method comprises the steps of obtaining a plurality of starting process models corresponding to preset temperatures, wherein the starting process models are used for indicating the relation between a change value of a scale factor and a temperature change value when the accelerometer is started at the preset temperatures; determining a target preset temperature among a plurality of preset temperatures, wherein the absolute value of the difference between the target preset temperature and the starting temperature is minimum; and determining the starting process model corresponding to the target preset temperature as a third relation model.
For example, assume that the plurality of preset temperatures are: -40 ℃, -30 ℃, -20 ℃, -10 ℃, 0 ℃, +10 ℃, +20 ℃, +30 ℃, +40 ℃, +50 ℃. And respectively measuring and modeling according to each preset temperature to obtain a starting process model corresponding to each preset temperature. Assuming that the starting temperature T0=22 ℃, since 22 ℃ is closest to 20 ℃ among the plurality of preset temperatures, the above-mentioned 20 ℃ is taken as the target preset temperature, and the starting process model corresponding to 20 ℃ is determined as the third relation model.
S304: and determining the acceleration corresponding to the first sampling value according to the first sampling value, the target scale factor and a target offset value.
In this embodiment, the target scale factor K and the target offset value D of the accelerometer are already determined in S303. Therefore, the acceleration f can be calculated based on the first sample value N, the target scale factor K and the target offset value D. The specific calculation process can be seen in formula (2).
The acceleration determining method provided by the embodiment comprises the following steps: acquiring the current temperature of an accelerometer, the starting temperature of the accelerometer and a first sampling value acquired by the accelerometer; determining a first temperature change value according to the current temperature and the starting temperature; determining a target scale factor and a target offset value of the accelerometer according to the current temperature and the first temperature change value; and determining the acceleration corresponding to the first sampling value according to the first sampling value, the target scale factor and the target offset value. In the process, when the target scale factor and the target offset value of the accelerometer are determined, the influence of the current temperature on the accelerometer is considered, and the influence of the first temperature change value of the current temperature relative to the starting temperature on the accelerometer is also considered, so that the determined target scale factor and the target offset value are more accurate, and the measurement accuracy of the accelerometer is improved.
In the above embodiment, when determining the acceleration, the first relationship model, the second relationship model, and the starting process model corresponding to each preset temperature need to be used. The process of constructing each model is described in detail below with reference to a specific embodiment.
Fig. 5 is a schematic diagram of an accelerometer calibration process according to an embodiment of the present application. As shown in fig. 5, the accelerometer calibration process provided by this embodiment includes:
s501: and (5) calibration preparation.
Illustratively, the accelerometer is mounted on a calibration support and is fixed on the temperature-controlled rotary table together with the calibration support. The temperature control rotary table can rotate with the accelerometer, so that certain acceleration is applied to the acceleration. And the temperature control rotary table can also adjust the ambient temperature of the accelerometer.
S502: a plurality of preset temperatures are determined.
For example, assuming that the operating temperature range of an accelerometer of a certain type is-40 ℃ to +50 ℃, the following 10 preset temperature points can be determined: -40 ℃, -30 ℃, -20 ℃, -10 ℃, 0 ℃, +10 ℃, +20 ℃, +30 ℃, +40 ℃, +50 ℃.
S503: and collecting sample data corresponding to each preset temperature.
The method comprises the following two stages of collecting sample data aiming at each preset temperature point.
The first stage is within a preset time (for example, 1000 s) after the accelerometer is turned on, and in the first stage, the current temperature of the accelerometer does not reach the equilibrium and is continuously increased.
And in the second stage, after the preset time length after the start-up, the current temperature of the accelerometer reaches the balance and does not rise any more in the stage.
The process of sampling the sample data will be described below with an example of-40 ℃.
The temperature of the temperature-controlled turntable is adjusted to-40 ℃, and the temperature is kept at the temperature for a period of time (for example, 2 hours), so that the current temperature of the accelerometer is balanced with the ambient temperature. The temperature-controlled turntable is controlled to apply a certain acceleration (for example, the acceleration may be 1 g) to the acceleration. Starting the accelerometer after starting up, and recording a sampling value acquired by the accelerometer in each unit time (for example, 1 s) after starting upAnd current temperature of accelerometer. Typically, the current temperature of the accelerometerWill rise continuously.
Exemplary, the sample data recorded in the first stage is shown in table 1.
TABLE 1
Further, after the preset time (1000 s), namely the second stage, the temperature control rotary table is controlled to perform a plurality of position tests on the accelerometer as follows. Wherein, in the plurality of position tests, at least two positions have corresponding accelerations of 0g, and at least two positions have corresponding accelerations with the same absolute value but opposite directions.
Hereinafter, for the sake of understanding, the 4-position test is exemplified. Wherein, the position 1 is that the sensitive axis of the acceleration is horizontally leftward, the position 2 is that the sensitive axis of the acceleration is vertically upward, the position 3 is that the sensitive axis of the acceleration is horizontally rightward, and the position 4 is that the sensitive axis of the acceleration is vertically downward.
(a) The sensitive axis of the accelerometer is horizontally towards the left, namely, 0g of acceleration is applied to the accelerometer, and the sampling value acquired by the accelerometer is recordedAnd current temperature of accelerometer. Optionally, the accelerometer may be held in this position for a second preset length of time (e.g., 30 s). And respectively recording the sampling value acquired by the accelerometer in each unit time (for example, 1 s) and the current temperature of the accelerometer. Taking the average value of sampling values acquired in a second preset time period as the average valueTaking the average value of the current temperatures acquired in the second preset time period as the average value。
(b) The sensitive axis of the accelerometer is vertical, namely, 1g of acceleration is applied to the accelerometer, and the sampling value acquired by the accelerometer is recordedAnd current temperature of accelerometer. Optionally, the accelerometer may be held in this position for a second preset length of time (e.g., 30 s). And respectively recording the sampling value acquired by the accelerometer in each unit time (for example, 1 s) and the current temperature of the accelerometer. Taking the average value of sampling values acquired in a second preset time period as the average valueTaking the average value of the current temperatures acquired in the second preset time period as the average value。
(c) The sensitive axis of the accelerometer is horizontal to the right, namely, 0g of acceleration is applied to the accelerometer, and the sampling value acquired by the accelerometer is recordedAnd current temperature of accelerometer. Optionally, the accelerometer may be held in this position for a second preset length of time (e.g., 30 s). And respectively recording the sampling value acquired by the accelerometer in each unit time (for example, 1 s) and the current temperature of the accelerometer. Taking the average value of sampling values acquired in a second preset time period as the average valueTaking the average value of the current temperatures acquired in the second preset time period as the average value。
(d) The sensitive axis of the accelerometer is vertically downward, namely, the accelerometer is applied with an acceleration of-1 g, and the sampling value acquired by the accelerometer is recordedAnd current temperature of accelerometer. Optionally, the accelerometer may be held in this position for a second preset length of time (e.g., 30 s). And respectively recording the sampling value acquired by the accelerometer in each unit time (for example, 1 s) and the current temperature of the accelerometer. Taking the average value of sampling values acquired in a second preset time period as the average valueTaking the average value of the current temperatures acquired in the second preset time period as the average value。
Exemplary sample data recorded in the second stage is shown in table 2.
TABLE 2
It should be understood that the above is exemplified by the sample data acquisition process corresponding to-40 ℃. According to the same operation mode, other sample data corresponding to preset temperatures (-30 ℃, -20 ℃, -10 ℃, 0 ℃, +10 ℃, +20 ℃, +30 ℃, +40 ℃, and, +50 ℃) are completed in sequence. The sample data collected at each preset temperature is similar to those in tables 1 and 2, which are not illustrated herein.
S504: and constructing a first relation model and a second relation model according to the sample data.
For each preset temperature i, sinceAndare collected under the condition that the acceleration of 0g is applied, so that the offset value corresponding to the preset temperature i is determined according to the following formula (3). Due to the fact thatAndacquired under the condition of applying 1g acceleration and-1 g acceleration respectively, so that the following formula (4) can be adopted to determine the scaling factor corresponding to the preset temperature i。
In this embodiment, it is assumed that the first relational model and the second relational model are both a univariate polynomial function model. For ease of understanding, the following is exemplified by a one-dimensional quadratic polynomial function model. Illustratively, the first relational model is shown in the following equation (5), and the second relational model is shown in the following equation (6).
Where, representing a scale factor, T is the temperature,、、the coefficients are to be found.Is an offset value, T is a temperature,、、the coefficients are to be found.
The above equation (5) can be converted into a matrix form as shown in equation (7):
Let equation (7) be expressed in vector form, as shown in equation (8) below:
From the least squares method, P can be found as shown in equation (9):
After obtaining P, in formula (5)、、It can be determined and thus a first relational model is obtained.
In the formula (6), the、、The determination method is similar to formula (5), and is not described herein again. When in use、、After the determination, a second relational model shown in formula (6) is obtained。
S505: and determining a starting process model corresponding to each of the plurality of preset temperatures according to the sample data.
In this embodiment, it is considered that, in the first stage test, the influence of the temperature on the accuracy of the accelerometer is reflected in two aspects, on one hand, the influence of the current temperature on the accelerometer is, and the part of the influence is consistent with the first relation model and the second relation model. Another aspect is the effect of the change in current temperature relative to the start-up temperature on the accelerometer. The influence of the second aspect is modeled below.
For each preset temperature i, the collected sample data is shown in table 1. For each current temperatureThe current temperature may be determined according to the following equation (10)Relative to the starting temperatureChange value of:
For each current temperatureAlso can be used forSubstituting into the first relational model shown in equation (5) can obtain the scale factorWill beSubstituting into the second relational model shown in equation (6) can obtain the offset value. Further, the variation value of the scale factor can be calculated from the following equation (11):
The startup model is assumed to adopt the functional relationship shown in the following equation (12):
Wherein the content of the first and second substances,、、、、parameters are to be solved for the model.
Thus, for each preset temperature i, a plurality of sets of data (for example) are acquired at the preset temperature i1000 sets of data as shown in table 1), solving using equation (10), equation (11), and equation (12) can obtain model parameters、、、、. Thus, the start-up model is constructed.
Optionally, considering that noise may exist in multiple sets of data (e.g., 1000 sets of data shown in table 1) collected at each preset temperature i, before modeling using equations (10) to (12), the multiple sets of data may be subjected to smoothing preprocessing to reduce noise influence. The smoothing preprocessing mode may adopt a mean filtering mode. For example, equation (13) may be used to sample values in multiple sets of dataFiltering is performed to obtain the current temperature in the data sets by using the formula (14)And performing median filtering.
It should be understood that the filtering manners shown in the above equations (13) and (14) are only examples, and in practical applications, other filtering manners may also be adopted, which is not limited in this embodiment.
By the embodiment, the starting process models corresponding to the first relation model, the second relation model and the plurality of preset temperatures can be constructed and obtained. Wherein the first relationship model is used for indicating the relationship between the scale factor and the temperature. The second relationship model is used to indicate a relationship between the offset value and the temperature. Each preset temperature corresponds to a starting process model, and the starting process model is used for indicating the relation between the scale factor change value and the temperature change value when the accelerometer is started in the environment with the preset temperature. After the modeling is completed, the first relation model, the second relation model and the starting process model corresponding to each preset temperature can be stored in a preset storage space.
Thus, in the embodiment shown in fig. 3, when the first relationship model needs to be obtained, the following manner may be adopted: if the first relation model exists in the preset storage space, acquiring the first relation model in the preset storage space; and if the first relation model does not exist in the preset storage space, acquiring first sample data, and generating the first relation model according to the first sample data. Wherein, the first sample data comprises: the accelerometer comprises a plurality of sample temperatures, a first sample value obtained by sampling a first sample acceleration at each sample temperature by the accelerometer, and a second sample value obtained by sampling a second sample acceleration at each sample temperature by the accelerometer; the values of the first sample acceleration and the second sample acceleration are opposite numbers, and the first sample data is acquired after the accelerometer runs for a preset time.
Illustratively, the sensitive axis of the accelerometer is vertically upward, so that the accelerometer samples a first sample acceleration (1 g) to obtain a first sample sampling value; the sensitive axis of the accelerometer is oriented vertically downwards so that the acceleration samples a second sample acceleration (-1 g) resulting in a second sample value. Alternatively, the first sample acceleration may be 2g, and the second sample acceleration may be-2 g. As long as the first sample acceleration and the second sample acceleration are opposite numbers to each other.
For example, the first sample data may be data corresponding to position 1g and position-1 g in table 2 in the embodiment shown in fig. 5. For example,andis the temperature of the sample and is,for accelerometers at sample temperatureNext, a first sample value obtained by sampling the first sample acceleration 1g,for accelerometers at sample temperatureAnd sampling a second sample value obtained by sampling the acceleration of the second sample to be 1 g.
Optionally, the first relationship model may be generated from the first sample data in the following manner: for any sample temperature, determining a sample scaling factor corresponding to the sample temperature according to the first sample value and the second sample value at the sample temperature (see formula (4) in the embodiment shown in fig. 5); the first relationship model is generated based on the plurality of sample temperatures and the plurality of sample scaling factors (see equation (5) in the embodiment shown in fig. 5).
Similarly, in the embodiment shown in fig. 3, when the second relationship model needs to be obtained, the following manner may be adopted: if the second relation model exists in a preset storage space, acquiring the second relation model in the preset storage space; and if the second relation model does not exist in the preset storage space, acquiring second sample data, and generating the second relation model according to the second sample data. The accelerometer is used for measuring the acceleration of the sample at each sample temperature, wherein the sample temperatures, the third sample sampling value obtained by sampling the acceleration of the third sample at each sample temperature by the accelerometer, and the fourth sample sampling value obtained by sampling the acceleration of the fourth sample at each sample temperature by the accelerometer; the values of the third sample acceleration and the fourth sample acceleration are respectively 0, the directions of the third sample acceleration and the fourth sample acceleration are opposite, and the second sample data is obtained by sampling after the accelerometer runs for a preset time length.
Illustratively, the sensitive axis of the accelerometer is horizontally to the left, such that the accelerometer samples a third sample acceleration (0 g) resulting in a third sample value; the sensitivity axis of the accelerometer is leveled to the right so that acceleration samples a fourth sample acceleration (0 g) resulting in a fourth sample value.
For example, the second sample data may be data corresponding to the position 0g and the position 0g in table 2 in the embodiment shown in fig. 5. For example,andis the temperature of the sample and is,for accelerometers at sample temperatureA third sample value obtained by sampling the third sample acceleration of 0g,for accelerometers at sample temperatureAnd a fourth sample sampling value obtained by sampling the fourth sample acceleration of 0g is obtained.
Optionally, the second relationship model may be generated according to the second sample data in the following manner: for any sample temperature, determining a sample offset value corresponding to the sample temperature according to the third sample value and the fourth sample value at the sample temperature (see formula (3) in the embodiment shown in fig. 5); the second relational model is generated based on the plurality of sample temperatures and the plurality of sample offset values (see equation (6) in the embodiment shown in fig. 5).
Similarly, in the embodiment shown in fig. 3, when the starting process model corresponding to a certain preset temperature needs to be obtained, the following method may be adopted: if the starting process model corresponding to the preset temperature exists in the preset storage space, acquiring the starting process model corresponding to the preset temperature in the preset storage space; if the starting process model corresponding to the preset temperature does not exist in the preset storage space, acquiring multiple groups of third sample data corresponding to the preset temperature, and generating the starting process model corresponding to the preset temperature according to the multiple groups of third sample data. Wherein the third sample data comprises: a plurality of sample temperatures, a fifth sample value obtained by sampling a fifth sample acceleration by the accelerometer at each of the sample temperatures; and the third sample data is acquired within the preset running time of the accelerometer.
For example, the fifth sample acceleration may be 1 g. For example, the third sample data may be the data shown in table 1 in the embodiment shown in fig. 5. For example,is the temperature of the sample and is,a fifth sample value is obtained for the accelerometer sampling a fifth sample acceleration of 1g at the sample temperature.
Optionally, a starting process model corresponding to the preset temperature may be generated according to the third sample data in the following manner: obtaining a plurality of scale factors to be selected according to the plurality of sample temperatures and the first relation model (for example, the sample temperatures are substituted into the first relation model to obtain the scale factors to be selected); obtaining a plurality of deviation values to be selected according to the plurality of sample temperatures and the second relation model (for example, the sample temperatures are substituted into the second relation model to obtain the deviation values to be selected); determining a plurality of candidate scale factor variation values according to the plurality of fifth sample sampling values, the plurality of candidate scale factors and the plurality of candidate offset values (see formula (11) in the embodiment shown in fig. 5); determining a plurality of temperature variation values to be selected according to the plurality of sample temperatures and the preset temperature (see formula (10) in the embodiment shown in fig. 5); and determining a starting process model corresponding to the preset temperature according to the plurality of candidate scale factor change values and the plurality of candidate temperature change values (see formula (12) in the embodiment shown in fig. 5).
In inertial navigation systems, accelerometers are often used in conjunction with IF (current frequency) conversion circuitry. The current sampling value output by the accelerometer is output to an IF conversion circuit, and the IF conversion circuit converts the current sampling value into a frequency signal. IF conversion circuit heats up faster when working, and the temperature change of IF conversion circuit will also cause the temperature change of accelerometer. In the embodiment of the application, when the target scale factor and the target offset value are determined, not only the influence of the current temperature on the accelerometer is considered, but also the influence of the temperature change value of the current temperature relative to the starting temperature on the accelerometer is considered, and the influence of the temperature change of the IF conversion circuit on the accelerometer is implied in the temperature change value, so that the influence of the temperature change of the accelerometer on the accuracy of the accelerometer can be compensated, the influence of the temperature change of the IF conversion circuit on the accuracy of the accelerometer can be compensated, and the accuracy of the inertial navigation system is improved.
Fig. 6 is a schematic structural diagram of an acceleration determining apparatus according to an embodiment of the present application. The acceleration determining means of the present embodiment may be in the form of software and/or hardware. As shown in fig. 6, the acceleration determining apparatus 600 provided in the present embodiment may include: an acquisition module 601, a first determination module 602, a second determination module 603, and a third determination module 604.
The acquiring module 601 is configured to acquire a current temperature of an accelerometer, a starting temperature of the accelerometer, and a first sampling value acquired by the accelerometer;
a first determining module 602, configured to determine a first temperature change value according to the current temperature and the starting temperature;
a second determining module 603, configured to determine a target scaling factor and a target offset value of the accelerometer according to the current temperature and the first temperature change value;
a third determining module 604, configured to determine an acceleration corresponding to the first sample value according to the first sample value, the target scaling factor and a target offset value.
In a possible implementation manner, the second determining module 603 is specifically configured to:
determining the target scale factor according to the current temperature and the first temperature change value;
and determining the target offset value according to the current temperature.
In a possible implementation manner, the second determining module 603 is specifically configured to:
acquiring a first relation model between the scale factor and the temperature and acquiring a third relation model between the change value of the scale factor and the change value of the temperature;
determining a first scaling factor based on the current temperature and the first relationship model;
determining a first scale factor change value according to the first temperature change value and the third relation model;
determining the target scale factor based on the first scale factor and the first scale factor variation value.
In a possible implementation manner, the second determining module 603 is specifically configured to:
the method comprises the steps of obtaining a plurality of starting process models corresponding to preset temperatures, wherein the starting process models are used for indicating the relation between a change value of a scale factor and a temperature change value when the accelerometer is started at the preset temperatures;
determining a target preset temperature among the plurality of preset temperatures, wherein the absolute value of the difference between the target preset temperature and the starting temperature is minimum;
and determining a starting process model corresponding to the target preset temperature as the third relation model.
In a possible implementation manner, the second determining module 603 is specifically configured to:
obtaining a second relation model between the deviation value and the temperature;
and determining the target offset value according to the current temperature and the second relation model.
In a possible implementation manner, the second determining module 603 is specifically configured to:
if the first relation model exists in a preset storage space, acquiring the first relation model in the preset storage space;
if the first relation model does not exist in the preset storage space, acquiring first sample data, and generating the first relation model according to the first sample data;
wherein the first sample data includes: the accelerometer comprises a plurality of sample temperatures, a first sample value obtained by sampling a first sample acceleration at each sample temperature by the accelerometer, and a second sample value obtained by sampling a second sample acceleration at each sample temperature by the accelerometer; the values of the first sample acceleration and the second sample acceleration are opposite numbers, and the first sample data is acquired after the accelerometer runs for a preset time.
In a possible implementation manner, the second determining module 603 is specifically configured to:
for any sample temperature, determining a sample scaling factor corresponding to the sample temperature according to the first sample value and the second sample value at the sample temperature;
generating the first relational model from the plurality of sample temperatures and the plurality of sample scaling factors.
In a possible implementation manner, the second determining module 603 is specifically configured to:
if the second relation model exists in a preset storage space, acquiring the second relation model in the preset storage space;
if the second relation model does not exist in the preset storage space, acquiring second sample data, and generating the second relation model according to the second sample data;
wherein the second sample data comprises: the accelerometer is used for measuring the acceleration of the sample at each sample temperature, and the accelerometer is used for measuring the acceleration of the sample at each sample temperature; the values of the third sample acceleration and the fourth sample acceleration are respectively 0, the directions of the third sample acceleration and the fourth sample acceleration are opposite, and the second sample data is obtained by sampling after the accelerometer runs for a preset time length.
In a possible implementation manner, the second determining module 603 is specifically configured to:
for any sample temperature, determining a sample offset value corresponding to the sample temperature according to the third sample sampling value and the fourth sample sampling value at the sample temperature;
generating the second relational model from the plurality of sample temperatures and the plurality of sample offset values.
In a possible implementation manner, the second determining module 603 is specifically configured to:
if the starting process model corresponding to the preset temperature exists in the preset storage space, acquiring the starting process model corresponding to the preset temperature in the preset storage space;
if the starting process model corresponding to the preset temperature does not exist in the preset storage space, acquiring third sample data corresponding to the preset temperature, and generating the starting process model corresponding to the preset temperature according to the third sample data;
wherein the third sample data comprises: a plurality of sample temperatures, a fifth sample value obtained by sampling a fifth sample acceleration by the accelerometer at each of the sample temperatures; and the third sample data is obtained by sampling within a preset time length after the accelerometer is started.
In a possible implementation manner, the second determining module 603 is specifically configured to:
obtaining a plurality of scale factors to be selected according to the plurality of sample temperatures and the first relation model;
obtaining a plurality of offset values to be selected according to the plurality of sample temperatures and a second relation model;
determining a plurality of scale factor variation values to be selected according to the plurality of fifth sample sampling values, the plurality of scale factors to be selected and the plurality of offset values to be selected;
determining a plurality of temperature change values to be selected according to the plurality of sample temperatures and the preset temperature;
and determining a starting process model corresponding to the preset temperature according to the multiple scale factor change values to be selected and the multiple temperature change values to be selected.
The acceleration determining apparatus provided in this embodiment may be configured to execute the technical solutions provided in any of the above method embodiments, and the implementation principles and technical effects thereof are similar and will not be described herein again.
Fig. 7 is a schematic structural diagram of an electronic device according to an embodiment of the present application. Illustratively, the electronic device may be an accelerometer, or other device connected to an accelerometer. As shown in fig. 7, the electronic device 700 provided in this embodiment includes: at least one processor 701 and a memory 702. The processor 701 and the memory 702 may be connected by a bus 703, for example.
The memory 702 is used to store computer programs;
the at least one processor 701 is configured to execute the computer program stored in the memory, so that the electronic device 700 executes the acceleration determining method provided in any of the above embodiments, which achieves similar principles and technical effects, and is not described herein again.
An embodiment of the present application further provides a computer-readable storage medium, where a computer program is stored, and when the computer program is executed by a processor, the method for determining an acceleration provided in any of the above method embodiments is implemented, and the implementation principle and the technical effect of the method are similar, and are not described herein again.
An embodiment of the present application further provides a chip, including: the acceleration determining method provided by any one of the above method embodiments is implemented by a memory and a processor, where the memory stores a computer program, and the processor runs the computer program to implement the acceleration determining method provided by any one of the above method embodiments, and the implementation principle and the technical effect are similar, and are not described herein again.
The embodiment of the present application further provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, the acceleration determining method provided in any of the above method embodiments is implemented, and the implementation principle and the technical effect are similar, which are not described herein again.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described device embodiments are merely illustrative, and for example, the division of the modules is only one logical division, and other divisions may be realized in practice, for example, a plurality of modules may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or modules, and may be in an electrical, mechanical or other form.
The modules described as separate parts may or may not be physically separate, and parts displayed as modules may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment.
In addition, functional modules in the embodiments of the present application may be integrated into one processing unit, or each module may exist alone physically, or two or more modules are integrated into one unit. The unit formed by the modules can be realized in a hardware form, and can also be realized in a form of hardware and a software functional unit.
The integrated module implemented in the form of a software functional module may be stored in a computer-readable storage medium. The software functional module is stored in a storage medium and includes several instructions to enable a computer device (which may be a personal computer, a server, or a network device) or a processor (processor) to execute some steps of the methods according to the embodiments of the present application.
It should be understood that the Processor may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of a method disclosed in the incorporated application may be directly implemented by a hardware processor, or may be implemented by a combination of hardware and software modules in the processor.
The memory may comprise a high-speed RAM memory, and may further comprise a non-volatile storage NVM, such as at least one disk memory, and may also be a usb disk, a removable hard disk, a read-only memory, a magnetic or optical disk, etc.
The bus may be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, an Extended ISA (EISA) bus, or the like. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, the buses in the figures of the present application are not limited to only one bus or one type of bus.
The storage medium may be implemented by any type or combination of volatile or non-volatile memory devices, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic or optical disks. A storage media may be any available media that can be accessed by a general purpose or special purpose computer.
An exemplary storage medium is coupled to the processor such the processor can read information from, and write information to, the storage medium. Of course, the storage medium may also be integral to the processor. The processor and the storage medium may reside in an Application Specific Integrated Circuits (ASIC). Of course, the processor and the storage medium may reside as discrete components in an electronic device or host device.
Those of ordinary skill in the art will understand that: all or a portion of the steps of implementing the above-described method embodiments may be performed by hardware associated with program instructions. The program may be stored in a computer-readable storage medium. When executed, the program performs steps comprising the method embodiments described above; and the aforementioned storage medium includes: various media that can store program codes, such as ROM, RAM, magnetic or optical disks.
Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.
Claims (15)
1. An acceleration determination method, comprising:
acquiring the current temperature of an accelerometer, the starting temperature of the accelerometer and a first sampling value acquired by the accelerometer;
determining a first temperature change value according to the current temperature and the starting temperature;
determining a target scaling factor and a target offset value for the accelerometer based on the current temperature and the first temperature change value;
and determining the acceleration corresponding to the first sampling value according to the first sampling value, the target scale factor and a target offset value.
2. The method of claim 1, wherein determining a target scaling factor and a target offset value for the accelerometer based on the current temperature and the first temperature change value comprises:
determining the target scale factor according to the current temperature and the first temperature change value;
and determining the target offset value according to the current temperature.
3. The method of claim 2, wherein determining the target scaling factor based on the current temperature and the first temperature change value comprises:
acquiring a first relation model between the scale factor and the temperature and acquiring a third relation model between the change value of the scale factor and the change value of the temperature;
determining a first scaling factor based on the current temperature and the first relationship model;
determining a first scale factor change value according to the first temperature change value and the third relation model;
determining the target scale factor based on the first scale factor and the first scale factor variation value.
4. The method of claim 3, wherein obtaining a third model of a relationship between the scale factor change value and the temperature change value comprises:
the method comprises the steps of obtaining a plurality of starting process models corresponding to preset temperatures, wherein the starting process models are used for indicating the relation between a change value of a scale factor and a temperature change value when the accelerometer is started at the preset temperatures;
determining a target preset temperature among the plurality of preset temperatures, wherein the absolute value of the difference between the target preset temperature and the starting temperature is minimum;
and determining a starting process model corresponding to the target preset temperature as the third relation model.
5. The method of any of claims 2 to 4, wherein determining the target offset value based on the current temperature comprises:
obtaining a second relation model between the deviation value and the temperature;
and determining the target offset value according to the current temperature and the second relation model.
6. The method of claim 3, wherein obtaining a first model of a relationship between scale factor and temperature comprises:
if the first relation model exists in a preset storage space, acquiring the first relation model in the preset storage space;
if the first relation model does not exist in the preset storage space, acquiring first sample data, and generating the first relation model according to the first sample data;
wherein the first sample data includes: the accelerometer comprises a plurality of sample temperatures, a first sample value obtained by sampling a first sample acceleration at each sample temperature by the accelerometer, and a second sample value obtained by sampling a second sample acceleration at each sample temperature by the accelerometer; the values of the first sample acceleration and the second sample acceleration are opposite numbers, and the first sample data is acquired after the accelerometer runs for a preset time.
7. The method of claim 6, wherein generating the first relational model from the first sample data comprises:
for any sample temperature, determining a sample scaling factor corresponding to the sample temperature according to the first sample value and the second sample value at the sample temperature;
generating the first relational model from the plurality of sample temperatures and the plurality of sample scaling factors.
8. The method of claim 5, wherein obtaining a second model of a relationship between offset value and temperature comprises:
if the second relation model exists in a preset storage space, acquiring the second relation model in the preset storage space;
if the second relation model does not exist in the preset storage space, acquiring second sample data, and generating the second relation model according to the second sample data;
wherein the second sample data comprises: the accelerometer is used for measuring the acceleration of the sample at each sample temperature, and the accelerometer is used for measuring the acceleration of the sample at each sample temperature; the values of the third sample acceleration and the fourth sample acceleration are respectively 0, the directions of the third sample acceleration and the fourth sample acceleration are opposite, and the second sample data is obtained by sampling after the accelerometer runs for a preset time length.
9. The method of claim 8, wherein generating the second relational model from the second sample data comprises:
for any sample temperature, determining a sample offset value corresponding to the sample temperature according to the third sample sampling value and the fourth sample sampling value at the sample temperature;
generating the second relational model from the plurality of sample temperatures and the plurality of sample offset values.
10. The method according to claim 4, wherein for each preset temperature, obtaining a starting process model corresponding to the preset temperature comprises:
if the starting process model corresponding to the preset temperature exists in the preset storage space, acquiring the starting process model corresponding to the preset temperature in the preset storage space;
if the starting process model corresponding to the preset temperature does not exist in the preset storage space, acquiring third sample data corresponding to the preset temperature, and generating the starting process model corresponding to the preset temperature according to the third sample data;
wherein the third sample data comprises: a plurality of sample temperatures, a fifth sample value obtained by sampling a fifth sample acceleration by the accelerometer at each of the sample temperatures; and the third sample data is obtained by sampling within a preset time length after the accelerometer is started.
11. The method of claim 10, wherein generating a startup process model corresponding to the preset temperature according to the third sample data comprises:
obtaining a plurality of scale factors to be selected according to the plurality of sample temperatures and the first relation model;
obtaining a plurality of offset values to be selected according to the plurality of sample temperatures and a second relation model;
determining a plurality of scale factor variation values to be selected according to the plurality of fifth sample sampling values, the plurality of scale factors to be selected and the plurality of offset values to be selected;
determining a plurality of temperature change values to be selected according to the plurality of sample temperatures and the preset temperature;
and determining a starting process model corresponding to the preset temperature according to the multiple scale factor change values to be selected and the multiple temperature change values to be selected.
12. An acceleration determining apparatus, characterized by comprising:
the system comprises an acquisition module, a control module and a processing module, wherein the acquisition module is used for acquiring the current temperature of an accelerometer, the starting temperature of the accelerometer and a first sampling value acquired by the accelerometer;
the first determining module is used for determining a first temperature change value according to the current temperature and the starting temperature;
a second determination module for determining a target scaling factor and a target offset value for the accelerometer based on the current temperature and the first temperature change value;
and the third determining module is used for determining the acceleration corresponding to the first sampling value according to the first sampling value, the target scale factor and a target offset value.
13. An electronic device, comprising:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores a computer program that is executed by the at least one processor to implement the method of any one of claims 1 to 11.
14. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1 to 11.
15. A computer program product, comprising a computer program which, when executed by a processor, implements the method of any one of claims 1 to 11.
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