CN114019201A - Module testing device - Google Patents
Module testing device Download PDFInfo
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- CN114019201A CN114019201A CN202111151884.7A CN202111151884A CN114019201A CN 114019201 A CN114019201 A CN 114019201A CN 202111151884 A CN202111151884 A CN 202111151884A CN 114019201 A CN114019201 A CN 114019201A
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- module
- tested
- probe
- test
- sticking
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Abstract
The invention relates to a module testing device. This module testing arrangement includes: a base; the bearing frame is used for mounting a module to be tested; the pressing component is used for contacting or separating with the module to be tested so as to test the module to be tested; the test probe is used for contacting with the module to be tested and acquiring a signal generated when the module to be tested contacts with the pressing component; and the needle protection assembly is arranged on the base and used for separating the pressing assembly from the module to be tested after the testing of the testing piece on the module to be tested is completed. The device has higher test safety and better protectiveness.
Description
Technical Field
The invention relates to the field of test equipment, in particular to a module test device.
Background
For the fingerprint module, what mainly affects its quality is the quality of the TFT (Thin Film Transistor) module of the fingerprint module, and for controlling the overall yield of the fingerprint module in the production process, the specific quality data of the TFT module needs to be tested in the production process. One test method is to use a probe to connect a PAD of a TFT module, use a vacuum adsorption method to stabilize the TFT module, and then use a biometric-like recognition indenter (e.g., a dummy finger) to perform a simulation test. In this test method, when a TFT module of 20 × 30 large size is tested, the TFT module is easily stuck, and the TFT module moves relative to the probe card to damage the probe card.
Disclosure of Invention
In view of the above, the present invention provides a module testing apparatus to solve the problem that the conventional TFT module is easy to damage the probe card during testing.
The invention provides a module testing device, which comprises: a base; the bearing frame is used for mounting a module to be tested; the pressing component is used for contacting or separating with the module to be tested so as to test the module to be tested; the test probe is used for contacting with the module to be tested and acquiring a signal generated when the module to be tested contacts with the pressing piece; and the needle protection assembly is arranged on the base and used for separating the pressing assembly from the module to be tested after the pressing assembly completes the test of the module to be tested.
So set up, this module testing arrangement's base is used for the installation to bear frame, press subassembly and anti-sticking subassembly etc.. The bearing frame is used for placing the module to be tested and positioning the module to be tested. The pressing component is used for testing the module to be tested.
The test probe is used for contacting with the module to be tested and collecting signals generated by the module to be tested so as to determine whether the module to be tested can work normally according to the signals. Because at the in-process of the module that awaits measuring and the contact of pressing the subassembly and separating, the effort can be applyed to the module that awaits measuring to the pressing subassembly, if pressing the subassembly and probably gluing the module that awaits measuring and make its relative test probe motion when both separate, and then probably cause the damage to the test probe, consequently in order to prevent damaging the test probe, set up on the base and protect the needle subassembly, utilize and protect the needle subassembly to make and exert the effort that makes its and pressing the subassembly separation to the module that awaits measuring at the in-process that presses the subassembly and the module that awaits measuring to separate, thereby prevent that the module that awaits measuring receives the influence of pressing the subassembly and relative test probe removes, with this protection test probe, promote the life of test probe, thereby reduce test cost.
In other embodiments, the bearing frame can move relative to the base, the needle protection assembly comprises a probe protection assembly, the probe protection assembly is arranged on the base, and the probe protection assembly presses the module to be tested before the test probe in the process that the bearing frame drives the module to be tested to move towards the test probe so as to prevent the module to be tested from transmitting vibration to the test probe.
So set up, can protect test probe.
In other embodiments, the probe protection assembly includes a pressing member movably connected to the base and a third elastic member abutting against the pressing member and applying an acting force toward the module to be tested to the pressing member when the pressing member contacts the module to be tested.
By the arrangement, the module to be tested can be prevented from vibrating and buffering can be provided.
In other embodiments, the probe protection assembly further includes a probe protection mounting base, the probe protection mounting base is fixedly connected to the base, the first end of the third elastic member is matched with the probe protection mounting base, and the second end of the third elastic member is matched with the pressing member.
So set up, can reliably install and compress tightly the piece.
In other embodiments, the probe protection assembly further includes a limiting member, the limiting member is disposed on the probe protection mounting base, and the limiting member is used for stopping the pressing member.
So set up, can carry out hard spacing to compressing tightly the piece.
In other embodiments, the probe protection assembly further comprises a guide member, the guide member penetrates through the probe protection mounting seat and is connected with the pressing member, the guide member is sleeved with the linear bearing, and at least part of the linear bearing is located in the probe protection mounting seat.
So set up, can promote life.
In other embodiments, guides are provided on both sides of the test probe, each guide being sleeved with a linear bearing.
So set up, can promote the atress homogeneity.
In other embodiments, the pressing assembly includes a pressing piece and a testing installation base, the testing installation base is movably arranged on the base and drives the pressing piece to move relative to the module to be tested, the needle protection assembly includes an anti-sticking assembly, the anti-sticking assembly is arranged on the testing installation base, and when the pressing piece is separated from the module to be tested, the anti-sticking assembly applies an acting force for separating the module to be tested from the pressing piece to the module to be tested.
So set up, can further protect test probe.
In other embodiments, the anti-sticking assembly includes an anti-sticking stripping piece and a first elastic piece, the anti-sticking stripping piece is movably disposed on the test mounting base, the first elastic piece abuts between the anti-sticking stripping piece and the test mounting base, and the first elastic piece is used for applying an acting force towards the module to be tested to the anti-sticking stripping piece.
So set up, can reduce the vibration and avoid the pressing member to await measuring the module adhesion.
In other embodiments, the anti-sticking assembly further comprises a peeling stopper, a groove is formed in the peeling stopper, the anti-sticking peeling member is movably disposed in the groove, and a stopping protrusion configured with the peeling stopper is formed on the anti-sticking peeling member.
So set up, can carry on spacingly to anti-sticking stripping element.
Drawings
Fig. 1 is a schematic perspective view of a module testing apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic perspective view illustrating a pressing assembly and an anti-sticking assembly of a module testing device according to an embodiment of the invention;
FIG. 3 is an exploded view of a pressing member of the module testing apparatus according to an embodiment of the present invention;
FIG. 4 is an exploded view of a probe guard assembly of the modular testing apparatus according to an embodiment of the present invention;
fig. 5 is a schematic perspective view of a test probe according to an embodiment of the present invention.
Description of reference numerals:
10. a carrier; 20. a module to be tested; 31. a test mounting seat; 32. testing the cover plate; 33. a second elastic member; 34. an equal-height bolt; 40. an anti-sticking component; 41. an anti-sticking stripper; 42. a first elastic member; 43. stripping the stop block; 50. a probe guard assembly; 51. a compression member; 52. a third elastic member; 53. a probe protection mounting base; 54. a connecting member; 55. a guide member; 56. a linear bearing; 57. a bolt; 60. and (6) testing the probe.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
It will be understood that when an element is referred to as being "mounted on" another element, it can be directly mounted on the other element or intervening elements may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present. When an element is referred to as being "secured to" another element, it can be directly secured to the other element or intervening elements may also be present.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "or/and" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1 to 5, the present invention provides a module testing apparatus, which includes a base, a carrier 10, a pressing assembly, a test probe 60 and a pin guard assembly. Wherein, the bearing frame 10 is used for installing the module 20 to be tested; the pressing component is used for contacting or separating with the module to be tested 20 so as to test the module to be tested 20; the test probe 60 is used for contacting with the module to be tested 20 and collecting signals generated by the module to be tested 20 when contacting with the pressing component; and the pin protection component is arranged on the base and is used for separating the pressing component from the module to be tested 20 after the pressing component completes the test of the module to be tested 20.
The base of the module test apparatus is used to mount the carrier 10, the pressing assembly, the needle guard assembly, and the like. The carrier 10 is used for placing and positioning a module 20 to be tested (such as a TFT module). The pressing member is used for contacting or separating with the module to be tested 20 so as to test the module to be tested 20.
The test probe 60 is used to contact the module 20 to be tested and collect a signal generated by the module 20 to be tested when the pressing member contacts the module 20 to be tested, so as to determine whether the module 20 to be tested can work normally according to the signal. Since the pressing member applies an acting force to the module 20 to be tested in the process of contacting and separating the module 20 to be tested with the pressing member, if the pressing member may stick the module 20 to be tested and move relative to the testing probe 60 when the pressing member and the pressing member are separated, and further may damage the testing probe 60, in order to prevent the testing probe 60 from being damaged, a pin protection member is disposed on the base, and the pin protection member is used to apply an acting force to the module 20 to be tested in the process of separating the pressing member and the module 20 to be tested and separating the pressing member from the pressing member, so as to prevent the module 20 to be tested from being influenced by the pressing member and moving relative to the testing probe 60, so as to protect the testing probe 60, prolong the service life of the testing probe 60, and reduce the testing cost.
The structure and operation of the anti-sticking assembly 40 in one example will be described with reference to the accompanying drawings as follows:
in the present embodiment, the test probe 60 is used to contact the module 20 to be tested and collect the signal generated by the module 20 to be tested. The test probes 60 may be provided on a probe card, which may include a probe card holder for holding the test probes in addition to the test probes 60.
As shown in fig. 1-3, the module under test 20 may be a TFT module in a fingerprint module. When testing the TFT module, the test probe 60 is in contact with the TFT module to detect an electrical signal generated therefrom. The pressing assembly includes a test mounting base 31 and a pressing member (for example, a dummy finger), the test mounting base 31 is movably disposed on the base, and the pressing member is disposed on the test mounting base 31 and is driven by the test mounting base 31 to contact with or separate from the TFT module. During testing, a pressing piece (for example, a dummy finger) is mounted on the test mounting seat 31, and a real finger touch process is simulated by contacting or separating the dummy finger with the TFT module, so as to test the TFT module.
Optionally, the carrier 10 is movable relative to the base, the needle protection assembly includes a probe protection assembly 50, the probe protection assembly 50 is disposed on the base, and during the movement of the to-be-tested module 20 driven by the carrier 10 toward the test probe 60, the probe protection assembly 50 presses the to-be-tested module 20 in front of the test probe 60 to prevent the to-be-tested module 20 from transmitting vibration to the test probe 60. The probe guard assembly 50 may reduce vibration transmitted to the test probe 60 during contact between the module 20 to be tested and the test probe 60, thereby protecting the test probe 60. In addition, it can prevent the module to be tested 20 from moving when the pressing member is brought into contact with or separated from the module to be tested 20, thereby protecting the test probe 60.
As shown in fig. 4 and 5, the probe protection assembly 50 includes a pressing member 51 and a third elastic member 52, the pressing member 51 is movably connected to the base, the third elastic member 52 abuts against the pressing member 51, and applies a force to the pressing member 51 toward the module 20 to be tested when the pressing member 51 contacts the module 20 to be tested.
The hold-down member 51 is used to stabilize the test pattern assembly 20. The third elastic member 52 may be a spring or the like, which can absorb vibration on one hand and provide a resisting force on the other hand.
Optionally, in order to reliably mount the pressing member 51, the probe protection assembly 50 further includes a probe protection mounting seat 53, the probe protection mounting seat 53 is fixedly connected to the base, a first end of the third elastic member 52 is engaged with the probe protection mounting seat 53, and a second end of the third elastic member 52 is engaged with the pressing member 51.
Optionally, the probe protection assembly 50 further includes a connector 54, the connector 54 includes a threaded rod section and a polish rod section, a first end of the polish rod section is provided with a stop structure, the threaded rod section is connected to a second end of the polish rod section, the polish rod section passes through the probe protection mounting seat 53, the stop structure is stopped at one side of the probe protection mounting seat 53 far away from the pressing member 51, and the threaded rod section is in threaded connection with the pressing member 51. The pressing piece 51 can be reliably connected to the probe protection mounting seat 53 through the connecting piece 54, and the guide is realized through the matching of the optical rod section and the probe protection mounting seat 53.
The connector 54 is in threaded fit with the pressing member 51, and is not in fit with the probe protection mounting seat 53, so that the height of the pressing member 51 can be adjusted under the condition that the test position or the origin position of the bearing frame 10 is changed, and the adaptability is improved.
Optionally, the third elastic element 52 is sleeved outside the connecting element 54 for facilitating the matching and positioning of the third elastic element 52. The third elastic member 52 may provide a cushioning effect.
In this embodiment, the probe protection assembly 50 further includes a limiting member, the limiting member is disposed on the probe protection mounting base 53, and the limiting member is used for stopping the pressing member 51. The limiting member may be a bolt 57, which is screwed with the probe protection mounting seat 53, and the end of the bolt is located above the pressing member 51, so as to limit the pressing member 51 hard.
Optionally, the probe guard assembly 50 further includes a guide member 55, the guide member 55 passes through the probe guard mounting seat 53 and is connected to the pressing member 51, the guide member 55 is externally sleeved with a linear bearing 56, and at least a portion of the linear bearing 56 is located in the probe guard mounting seat 53. The linear bearing 56 may reduce friction, thereby improving durability and reducing noise.
In order to limit the linear bearing, a linear bearing pressure plate is arranged on the linear bearing.
Preferably, in order to improve the force uniformity of the TFT module, the guide members 55 are disposed on two sides of the test probe 60 (which may be two sides in the direction of probe arrangement in fig. 5), and each guide member 55 is sleeved with a linear bearing 56. Thus, the abrasion can be reduced, and simultaneously, a better guiding effect is realized.
In addition to protecting the test probe 60 by the probe protection assembly 50, in an optional manner of this embodiment, the probe protection assembly may further include an anti-sticking assembly 40, the anti-sticking assembly 40 is disposed on the test mounting base 31, and when the pressing member is separated from the module to be tested 20, the anti-sticking assembly applies an acting force to the module to be tested 20 to separate the module to be tested 20 from the pressing member. The anti-sticking member 40 can prevent the module 20 to be tested from being stuck when the module 20 to be tested is separated from the pressing member, thereby protecting the testing probe 60.
In addition, the anti-sticking assembly may press the module to be tested 20 before the press piece in the process that the press piece moves toward the module to be tested 20, and since the anti-sticking assembly 40 presses the module to be tested 20 in advance, when the press piece contacts the module to be tested 20, vibration caused to the module to be tested 20 by impact of the press piece may be reduced, thereby preventing damage to the test probe 60 contacting the module to be tested 20 due to vibration of the module to be tested 20. Similarly, when the pressing member is separated from the module to be tested 20, the anti-sticking assembly 40 applies a force to the module to be tested 20 to separate the pressing member from the test, so that the pressing member is prevented from sticking to the module to be tested 20 and the module to be tested 20 bumps the test probe 60 contacting the pressing member. The movement or vibration of the module 20 to be tested during the test is effectively reduced by providing the anti-sticking member 40 in the module testing apparatus, thereby preventing damage to the test probes 60 contacting the module 20 to be tested.
In the example shown in fig. 3, the pressing assembly may include a height bolt 34, a second elastic member 33, a test cover plate 32, and the like, in addition to the test mounting seat 31 and the pressing member. Wherein, the test cover plate 32 is connected to the base, the test installation seat 31 is movably connected to the test cover plate 32, and a second elastic member 33 is arranged between the test installation seat 31 and the test cover plate 32.
For example, a contour bolt 34 passes through the test cover plate 32 and connects with the test mount 31 for guiding. The test cover 32 may be coupled to the moving member and moved by the moving member. The second elastic member 33 is located between the test mounting seat 31 and the test cover 32, and is used for stabilizing the downward pressure of the dummy finger pressing down on the module 20 to be tested, so as to prevent the module 20 to be tested from being damaged by pressure. The second elastic member 33 may be a spring or the like.
The anti-sticking assembly 40 includes an anti-sticking stripping member 41 and a first elastic member 42, the anti-sticking stripping member 41 is movably disposed on the test mounting base 31, the first elastic member 42 abuts between the anti-sticking stripping member 41 and the test mounting base 31, and the first elastic member 42 is used for applying a force to the anti-sticking stripping member 41 toward the module 20 to be tested. The anti-sticking stripping member 41 is used for contacting with the module 20 to be tested, and the first elastic member 42 is used for applying a force to the anti-sticking stripping member 41 so that the module 20 to be tested moves away from the fake finger.
In a practical manner, the number of the anti-adhesion peeling members 41 is at least two, and the anti-adhesion peeling members are spaced apart from each other to increase the contact area with the module 20 to be tested, so as to reduce the contact pressure between the anti-adhesion peeling members 41 and the module 20 to be tested, and to protect the module 20 to be tested. At least one first elastic member 42 is disposed between each anti-sticking peeling member 41 and the test mounting seat 31. The first elastic member 42 may be a spring or other structure capable of accumulating and releasing mechanical energy, and the embodiment is not limited thereto.
Optionally, in order to further improve the stability of the movement of the anti-sticking stripping element, the anti-sticking assembly 40 further includes a stripping stop 43, a groove is disposed on the stripping stop 43, the anti-sticking stripping element 41 is movably disposed in the groove, and a stop protrusion configured with the stripping stop 43 is disposed on the anti-sticking stripping element 41.
As shown in fig. 3, the peeling stoppers 43 correspond to the anti-adhesion peeling members 41 one by one, and the peeling stoppers 43 are in a shape of "concave" to form a groove capable of accommodating at least a part of the anti-adhesion peeling members 41. In this embodiment, a fitting stopper is provided on the test mounting seat 31, and when the peeling stopper 43 is connected to the test mounting seat 31, the opening of the groove faces the fitting stopper, and the fitting stopper closes the opening of the groove to form a passage for accommodating the anti-sticking peeling member 41.
The anti-sticking stripper 41 may be in the shape of an "I" for better engagement with the stripper stop 43. The middle part is positioned in the groove, and the protruding parts on the two sides are used as stop protrusions to be matched with the stripping stop block 43 so as to limit the moving stroke of the anti-sticking stripping piece 41 relative to the stripping stop block 43.
Optionally, in order to make the movement of the anti-sticking peeling member 41 more stable and smooth, and the force applied to the module to be tested 20 is perpendicular to the surface of the module to be tested 20, a guide pin is provided between the anti-sticking peeling member 41 and the test mounting seat 31 to guide the movement of the anti-sticking peeling member 41.
The working process of the probe protection assembly is as follows: when the test is started, the carriage 10 is driven by the moving mechanism below the carriage to lift the TFT module (i.e. the module 20 to be tested) to contact the pressing member 51, and after the TFT module continues to be lifted, the third elastic member 52 is compressed to provide pressure to the pressing member 51 to stabilize the TFT module.
The carriage 10 is further lifted to the testing position, so that the TFT module contacts the testing probe 60, and since the pressing member 51 stabilizes the TFT module at this time, the influence of the vibration of the machine table on the testing probe during the contact between the TFT module and the testing probe is reduced.
In addition, the vibration generated in the process of pressing and lifting the dummy finger for testing can be blocked outside the test probe by the pressing piece 51, so that the service life of the test probe is greatly prolonged.
The other bolt 57 is in threaded fit with the probe protection mounting seat 53, the tail end of the other bolt is pressed above the pressing piece 51, and the other bolt has the main function of limiting the lifting height of the pressing piece 51 and playing a role in hard limiting of a test position.
In the use process, when the TFT module and the fake finger are not peeled off, the pressure of the pressing piece 51 is smaller than the lifting force of the TFT module, the bolt 57 can force the pressing piece 51 to be pressed on the test position, the TFT module can be forced to be pressed on the test position, and fatal damage to the test probe caused by extreme conditions is avoided.
The working process of the anti-sticking assembly is as follows: when the dummy finger is pressed down, the anti-sticking stripping element 41 presses the module 20 to be tested first, the first elastic element connected with the anti-sticking stripping element 41 is compressed to apply pressure to the anti-sticking stripping element 41 to stabilize the module 20 to be tested, and the situation that when the dummy finger is pressed down to be in contact with the module 20 to be tested, the contact vibration causes the module 20 to be tested to move or shake to cause the tip of the test probe 60 to be damaged by shaking is prevented. Moreover, when the dummy finger is lifted upwards after the test is completed, the first elastic member 42 rebounds to drive the anti-sticking stripping member 41 to strip the module 20 to be tested stuck on the dummy finger, so as to prevent sticking of the module 20 to be tested, thereby achieving the anti-sticking effect of the needle guard.
The device can be applied to the test of TFT module of 20x30, through setting up the anti-sticking subassembly 40, can make the artificial finger reduce its removal in the contact process with TFT module, and peel off the TFT module that glues on the artificial finger in the lift-off process. Prevent the generation of the phenomenon of sticking the sheet by the false finger, reduce the vibration and prolong the service life of the probe card.
In addition, the probe protection assembly can isolate the vibration generated when the bearing frame 10 runs and the TFT module is tested from the test probes so as to protect the test probes. Moreover, because the atmospheric pressure is too strong, when the anti-sticking component does not peel off the TFT module, the bolt 57 on the probe protection component can force the TFT module to be pressed at the test position, and extreme damage to the probe card caused by extreme conditions is avoided.
The device can adapt to the TFT module discernment sensitivity of 20x30 type and compare in small-size type TFT modules such as 8x8 very much, and the imitative biological identification pressure head (for example artificial finger) surface line that its test used is more slight, and the more smooth condition in surface has solved because the line is more slight, the surface is more smooth leads to its artificial finger to lift the process and easily leads to the TFT module to be glued by artificial finger after the test is accomplished, finally leads to probe damage condemned problem even.
In addition, the problem that the service life of the probe is reduced sharply due to the fact that vibration of the platform cannot be isolated during testing is solved, the problem that the pressure required by testing of a 20x30 type TFT module is 2.5 kg-3.5 kg and is far greater than 200 g-400 g of pushing force required by testing of an 8x8 type TFT module, the platform is prone to shaking during large-pressure testing is solved, and when the TFT module is sucked and stabilized through vacuum and is stuck on a fake finger, the fake finger can easily lift the whole platform upwards or shake upwards, so that the service life of the probe is shortened.
In conclusion, the anti-sticking component realizes the peeling of the TFT module adhered to the fake finger and simultaneously realizes the effect of reducing the vibration of the pressing of the fake finger. The TFT module adhered to the fake finger is stripped by arranging the probe protection component, and the vibration generated when the fake finger is pressed down and stripped is isolated; it can also have safe limit function, stops the fatal damage that extreme condition shines into to the probe.
The features of the above-described embodiments may be arbitrarily combined, and for the sake of brevity, all possible combinations of the features in the above-described embodiments are not described, but should be construed as being within the scope of the present disclosure as long as there is no contradiction between the combinations of the features.
It should be understood by those skilled in the art that the above embodiments are only for illustrating the present invention and are not to be used as a limitation of the present invention, and that suitable changes and modifications of the above embodiments are within the scope of the claimed invention as long as they are within the spirit and scope of the present invention.
Claims (10)
1. A module testing device, comprising:
a base;
a carrier (10), the carrier (10) being used for mounting a module to be tested (20);
the pressing component is used for contacting with or separating from the module to be tested (20) so as to test the module to be tested (20);
the test probe (60) is used for contacting with the module to be tested (20) and acquiring a signal generated by the module to be tested (20) when contacting with the test piece;
the needle protection component is arranged on the base and used for separating the pressing component from the module to be tested (20) after the pressing component completes the test of the module to be tested (20).
2. The module testing apparatus according to claim 1, wherein the carrier (10) is movable relative to the base, the needle guard assembly comprises a probe guard assembly (50), the probe guard assembly (50) is disposed on the base, and during the movement of the carrier (10) with the module to be tested (20) toward the test probe (60), the probe guard assembly (50) presses the module to be tested (20) before the test probe (60) to prevent the module to be tested (20) from transmitting vibration to the test probe (60).
3. The module testing device according to claim 2, wherein the probe guard assembly (50) comprises a pressing member (51) and a third elastic member (52), the pressing member (51) is movably connected to the base, the third elastic member (52) abuts against the pressing member (51) and applies a force to the pressing member (51) toward the module to be tested (20) when the pressing member (51) is in contact with the module to be tested (20).
4. The module testing device according to claim 3, wherein the probe guard assembly (50) further comprises a probe guard mounting seat (53), the probe guard mounting seat (53) is fixedly connected to the base, a first end of the third elastic member (52) is engaged with the probe guard mounting seat (53), and a second end of the third elastic member (52) is engaged with the pressing member (51).
5. The module testing device according to claim 4, wherein the probe guard assembly (50) further comprises a stopper disposed on the probe guard mounting seat (53), the stopper being used for stopping the pressing member (51).
6. The module testing device according to claim 4, wherein the probe guard assembly (50) further comprises a guide member (55), the guide member (55) passes through the probe guard mounting seat (53) and is connected with the pressing member (51), a linear bearing (56) is sleeved outside the guide member (55), and at least a part of the linear bearing (56) is positioned in the probe guard mounting seat (53).
7. The module testing device according to claim 6, wherein the guides (55) are provided on both sides of the test probe (60), each guide (55) being provided with the linear bearing (56) in a sleeved manner.
8. The module testing device according to claim 1 or 2, wherein the pressing assembly comprises a pressing piece and a testing mounting seat (31), the testing mounting seat (31) is movably arranged on the base and drives the pressing piece to move relative to the module to be tested (20), the needle protection assembly comprises an anti-sticking assembly (40), the anti-sticking assembly (40) is arranged on the testing mounting seat (31), and when the pressing piece is separated from the module to be tested (20), the anti-sticking assembly applies an acting force to the module to be tested (20) to separate the module to be tested (20) from the pressing piece.
9. The module testing device according to claim 8, wherein the anti-sticking assembly (40) comprises an anti-sticking stripper (41) and a first elastic member (42), the anti-sticking stripper (41) being movably arranged to the test mounting seat (31), the first elastic member (42) abutting between the anti-sticking stripper (41) and the test mounting seat (31), the first elastic member (42) being configured to apply a force to the anti-sticking stripper (41) towards the module to be tested (20).
10. The module testing device according to claim 9, wherein the anti-sticking assembly (40) further comprises a peeling stopper (43), the peeling stopper (43) is provided with a groove, the anti-sticking peeling member (41) is movably disposed in the groove, and the anti-sticking peeling member (41) is provided with a stopper projection configured with the peeling stopper (43).
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111151884.7A CN114019201A (en) | 2021-09-29 | 2021-09-29 | Module testing device |
| CN202210154197.9A CN114217102B (en) | 2021-09-29 | 2022-02-21 | Module testing device |
| CN202220447253.3U CN216248085U (en) | 2021-09-29 | 2022-03-03 | Module testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111151884.7A CN114019201A (en) | 2021-09-29 | 2021-09-29 | Module testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114019201A true CN114019201A (en) | 2022-02-08 |
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| KR0152260B1 (en) * | 1988-07-08 | 1998-12-15 | 고다까 토시오 | Probe apparatus |
| JP2929948B2 (en) * | 1994-09-20 | 1999-08-03 | 三菱電機株式会社 | Probe type test handler and IC testing method using the same |
| JP4126786B2 (en) * | 1998-11-24 | 2008-07-30 | 株式会社日立製作所 | Sample preparation apparatus and method |
| JP2005315615A (en) * | 2004-04-27 | 2005-11-10 | Star Technologies Inc | Test card |
| CN102054413B (en) * | 2009-11-06 | 2014-03-26 | 日本麦可罗尼克斯股份有限公司 | Detecting device of panel-shaped body to be checked |
| US9244099B2 (en) * | 2011-05-09 | 2016-01-26 | Cascade Microtech, Inc. | Probe head assemblies, components thereof, test systems including the same, and methods of operating the same |
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| CN114019201A (en) * | 2021-09-29 | 2022-02-08 | 杭州长川科技股份有限公司 | Module testing device |
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| CN114217102B (en) | 2022-08-09 |
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