CN114002247A - Three-dimensional electron diffraction data acquisition method and system for electron beam sensitive crystal - Google Patents

Three-dimensional electron diffraction data acquisition method and system for electron beam sensitive crystal Download PDF

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CN114002247A
CN114002247A CN202111389906.3A CN202111389906A CN114002247A CN 114002247 A CN114002247 A CN 114002247A CN 202111389906 A CN202111389906 A CN 202111389906A CN 114002247 A CN114002247 A CN 114002247A
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interference
time
space domain
event
domain mapping
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CN114002247B (en
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陈柏桦
刘磊峰
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Suzhou Qingyun Ruijing Biotechnology Co ltd
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    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20058Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method

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Abstract

According to the three-dimensional electron diffraction data acquisition method and system for the electron beam sensitive crystal, firstly, according to environment interference activity information which is obtained in the three-dimensional electron diffraction data acquisition process of the electron beam sensitive crystal and matches with acquired interference factors, a plurality of environment interference time-space domain distributions with time-space domain connection are extracted, then, time-space domain mapping characteristics corresponding to the environment interference time-space domain distributions are determined, supposing that the time-space domain mapping characteristics match with preset state conditions, test environment interference events corresponding to the environment interference time-space domain distributions with time-space domain connection are determined, and finally, interference denoising is carried out on the time-space domain mapping characteristics according to the test environment interference events and the environment interference activity information in the three-dimensional electron diffraction data acquisition process. Therefore, intelligent decision analysis can be carried out on the environmental interference activity, interference denoising processing is carried out accordingly, and the collection reliability and stability are improved.

Description

Three-dimensional electron diffraction data acquisition method and system for electron beam sensitive crystal
Technical Field
The invention relates to the technical field of data acquisition, in particular to a method and a system for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal.
Background
How to perform intelligent decision analysis on environmental interference activities and perform interference denoising processing accordingly is a technical problem to be solved urgently.
Disclosure of Invention
In light of the foregoing problems, an embodiment of the present invention provides a method for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal, including:
extracting a plurality of environment interference time-space domain distributions with time-space domain connection according to environment interference activity information which is obtained in the process of acquiring three-dimensional electron diffraction data of the electron beam sensitive crystal and matches with the acquired interference factors;
determining a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution according to the multiple environmental interference time-space domain distributions with the time-space domain connection, wherein the time-space domain mapping characteristic represents a connection vector between the acquisition interference factor and multiple preset interference reasons;
determining a test environment interference event corresponding to the time-space domain distribution of the plurality of environment interferences with the time-space domain connection on the assumption that the time-space domain mapping characteristics are matched with a preset state condition; and according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, executing an interference denoising rule cluster corresponding to the test environment interference event and the acquisition interference factor, and performing interference denoising on the time-space domain mapping characteristics through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
Determining a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution according to the plurality of environmental interference time-space domain distributions with time-space domain connections, wherein the determining comprises the following steps:
and inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
Assuming that the time-space domain mapping characteristics are matched with a preset state condition, determining a test environment interference event corresponding to the time-space domain distribution of the plurality of environment interferences with the time-space domain connection, including:
assuming that the time-space domain mapping characteristics are matched with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics;
and matching the test environment interference event corresponding to the time-space domain mapping characteristic component map from a preset interference event characteristic library according to the time-space domain mapping characteristic component map.
According to the time-space domain mapping characteristic component map, matching a test environment interference event corresponding to the time-space domain mapping characteristic component map from a preset interference event characteristic library, wherein the method comprises the following steps:
determining a plurality of interference event characteristic components corresponding to the time-space domain mapping characteristic component map from the preset interference event characteristic library according to the time-space domain mapping characteristic component map;
confirming the time-space domain mapping characteristics by the interference tracking service system through the plurality of interference event characteristic components;
and determining a target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the plurality of interference event characteristic components.
Wherein the method further comprises:
and generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
The invention also provides a three-dimensional electron diffraction data acquisition system for the electron beam sensitive crystal, which comprises:
the extraction module is used for extracting a plurality of environment interference time-space domain distributions with time-space domain connection according to environment interference activity information which is obtained in the process of acquiring three-dimensional electron diffraction data of the electron beam sensitive crystal and matches with the acquired interference factors;
the determining module is used for determining time-space domain mapping characteristics corresponding to the environmental interference time-space domain distribution according to the multiple environmental interference time-space domain distributions with time-space domain connections, wherein the time-space domain mapping characteristics represent connection vectors between the acquired interference factors and multiple preset interference reasons;
the interference denoising module is used for determining a test environmental interference event corresponding to the time-space domain distribution of the environmental interference with the time-space domain connection on the assumption that the time-space domain mapping characteristics are matched with a preset state condition; and according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, executing an interference denoising rule cluster corresponding to the test environment interference event and the acquisition interference factor, and performing interference denoising on the time-space domain mapping characteristics through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
Wherein the determining module is specifically configured to:
and inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
Wherein the interference denoising module is specifically configured to:
assuming that the time-space domain mapping characteristics are matched with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics; and matching the test environment interference event corresponding to the time-space domain mapping characteristic component map from a preset interference event characteristic library according to the time-space domain mapping characteristic component map.
Wherein the interference denoising module is further specifically configured to:
determining a plurality of interference event characteristic components corresponding to the time-space domain mapping characteristic component map from the preset interference event characteristic library according to the time-space domain mapping characteristic component map;
confirming the time-space domain mapping characteristics by the interference tracking service system through the plurality of interference event characteristic components;
and determining a target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the plurality of interference event characteristic components.
The system further comprises:
and the execution module is used for generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
To sum up, in the method and the system for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal according to the embodiments of the present invention, first, a plurality of environmental interference time-space domain distributions having time-space domain relations are extracted according to environmental interference activity information matching acquired interference factors obtained in the process of acquiring the three-dimensional electron diffraction data of the electron beam sensitive crystal, then, time-space domain mapping characteristics corresponding to the environmental interference time-space domain distributions are determined according to the plurality of environmental interference time-space domain distributions having time-space domain relations, the time-space domain mapping characteristics represent relation vectors between the acquired interference factors and a plurality of preset interference reasons, then, a test environmental interference event corresponding to the plurality of environmental interference time-space domain distributions having time-space domain relations is determined assuming that the time-space domain mapping characteristics match preset state conditions, and finally, the test environmental interference event and the environmental interference in the process of acquiring the three-dimensional electron diffraction data are determined according to the test environmental interference event and the environmental interference activity information matching the acquired in the process of acquiring the three-space domain sensitive crystal And the activity information executes an interference denoising rule cluster corresponding to the test environment interference event and the acquired interference factor, and performs interference denoising on the time-space domain mapping characteristic through an interference denoising rule corresponding to the three-dimensional electron diffraction data acquisition process. Therefore, the acquisition reliability and stability are improved by carrying out intelligent decision analysis on the acquisition interference factors and then carrying out interference denoising processing.
In order to make the aforementioned objects, features and advantages of the embodiments of the present invention comprehensible, embodiments accompanied with figures are described in detail below.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings are only some embodiments of the present invention, and therefore should not be considered as limiting the scope, and it is obvious for those skilled in the art that other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic flow chart of a method for collecting three-dimensional electron diffraction data of an electron beam sensitive crystal according to an embodiment of the present invention;
fig. 2 is a functional block diagram of a three-dimensional electron diffraction data acquisition system for an electron beam sensitive crystal according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood by the scholars in the technical field, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a schematic flow chart of a method for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal according to an embodiment of the present invention, where the method for denoising abnormal behavior interference may be performed by a target service platform for providing a three-dimensional electron diffraction data acquisition process service, and a background server for providing the three-dimensional electron diffraction data acquisition process service.
A server may include one or more processors, such as one or more Central Processing Units (CPUs), each of which may implement one or more hardware threads. A server may also include any storage medium for storing any kind of information, such as code, settings, data, etc. For example, and without limitation, the storage medium may include any one or more of the following in combination: any type of RAM, any type of ROM, flash memory devices, hard disks, optical disks, etc. More generally, any storage medium may use any technology to store information. Further, any storage medium may provide volatile or non-volatile retention of information. Further, any storage medium may represent a fixed or removable component of a server. In one case, the server may perform any of the operations of the associated instructions when the processor executes the corresponding instructions stored in any storage medium or combination of storage media. The server also comprises one or more drive units for interacting with any storage medium, such as a hard disk drive unit, an optical disk drive unit, etc.
The server also includes input/output (I/O) for receiving various inputs (via the input unit) and for providing various outputs (via the output unit)). One particular output mechanism may include a presentation device and a corresponding Graphical User Interface (GUI). The server may also include one or more network interfaces for exchanging data with other devices via one or more communication units. One or more communication buses couple the above-described components together.
The communication unit may be implemented in any manner, e.g., over a local area network, a wide area network (e.g., the internet), a point-to-point connection, etc., or any combination thereof. The communication units may comprise any combination of hardwired links, wireless links, routers, gateway functions, etc., governed by any protocol or combination of protocols.
The detailed steps of the method for acquiring the three-dimensional electron diffraction data of the electron beam sensitive crystal are described as follows.
Step 100, extracting a plurality of environment interference time-space domain distributions with time-space domain connection according to environment interference activity information which is obtained in the process of acquiring three-dimensional electron diffraction data of the electron beam sensitive crystal and matches with the acquired interference factors.
200, according to the plurality of environment interference time-space domain distributions with time-space domain connections, determining time-space domain mapping characteristics corresponding to the environment interference time-space domain distributions, wherein the time-space domain mapping characteristics represent connection vectors between the collected interference factors and a plurality of preset interference reasons.
Step 300, assuming that the time-space domain mapping characteristics are matched with a preset state condition, determining a test environment interference event corresponding to the time-space domain distribution of the plurality of environment interferences with the time-space domain connection; and according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, executing an interference denoising rule cluster corresponding to the test environment interference event and the acquisition interference factor, and performing interference denoising on the time-space domain mapping characteristics through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
In one possible implementation manner, for step 200, the determining, according to the plurality of environmental interference space-time domain distributions having the space-time domain relationship, a space-time domain mapping feature corresponding to the environmental interference space-time domain distribution includes:
and inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
In one possible implementation, for step 300, assuming that the space-time domain mapping characteristics match preset state conditions, determining a test environmental interference event corresponding to the plurality of environmental interference space-time domain distributions having the space-time domain relationship includes:
assuming that the time-space domain mapping characteristics are matched with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics; and matching the test environment interference event corresponding to the time-space domain mapping characteristic component map from a preset interference event characteristic library according to the time-space domain mapping characteristic component map.
In one possible implementation manner, for step 300, matching, according to the time-space domain mapping feature component map, a test environment interference event corresponding to the time-space domain mapping feature component map from a preset interference event feature library, includes:
determining a plurality of interference event characteristic components corresponding to the time-space domain mapping characteristic component map from the preset interference event characteristic library according to the time-space domain mapping characteristic component map;
confirming the time-space domain mapping characteristics by the interference tracking service system through the plurality of interference event characteristic components;
and determining a target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the plurality of interference event characteristic components.
In a possible implementation manner, the method according to this embodiment further includes:
and generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
Fig. 2 is a functional block diagram of an abnormal behavior interference denoising system according to an embodiment of the present invention, where the functions implemented by the abnormal behavior interference denoising system may correspond to the steps executed by the foregoing method. The abnormal behavior interference denoising system may be understood as the server or the processor of the server, or may be understood as a component which is independent of the server or the processor and implements the functions of the present invention under the control of the server, as shown in fig. 2, and the functions of each functional module of the abnormal behavior interference denoising system are described in detail below.
The extraction module 210 is configured to extract a plurality of environmental interference time-space domain distributions with time-space domain connections according to environmental interference activity information matching the acquired interference factors obtained in the process of acquiring three-dimensional electron diffraction data of the electron beam sensitive crystal;
a determining module 220, configured to determine, according to the multiple environmental interference time-space domain distributions with time-space domain connections, a time-space domain mapping feature corresponding to the environmental interference time-space domain distributions, where the time-space domain mapping feature represents a connection vector between the collected interference factor and multiple preset interference reasons;
an interference denoising module 230, configured to assume that the time-space domain mapping characteristics match a preset state condition, and determine a test environmental interference event corresponding to the time-space domain distribution of multiple environmental interferences having a time-space domain relationship; and according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, executing an interference denoising rule cluster corresponding to the test environment interference event and the acquisition interference factor, and performing interference denoising on the time-space domain mapping characteristics through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
In a possible implementation manner, the determining module is specifically configured to:
and inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
In a possible implementation, the interference denoising module is specifically configured to:
assuming that the time-space domain mapping characteristics are matched with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics; and matching the test environment interference event corresponding to the time-space domain mapping characteristic component map from a preset interference event characteristic library according to the time-space domain mapping characteristic component map.
In a possible implementation, the interference denoising module is further specifically configured to:
determining a plurality of interference event characteristic components corresponding to the time-space domain mapping characteristic component map from the preset interference event characteristic library according to the time-space domain mapping characteristic component map;
confirming the time-space domain mapping characteristics by the interference tracking service system through the plurality of interference event characteristic components;
and determining a target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the plurality of interference event characteristic components.
In one possible embodiment, the system further comprises:
and the execution module 240 is configured to generate an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activate and execute the interference denoising instance event and the interference denoising rule cluster.
To sum up, in the method and the system for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal according to the embodiments of the present invention, first, a plurality of environmental interference time-space domain distributions having time-space domain relations are extracted according to environmental interference activity information matching acquired interference factors obtained in the process of acquiring the three-dimensional electron diffraction data of the electron beam sensitive crystal, then, time-space domain mapping characteristics corresponding to the environmental interference time-space domain distributions are determined according to the plurality of environmental interference time-space domain distributions having time-space domain relations, the time-space domain mapping characteristics represent relation vectors between the acquired interference factors and a plurality of preset interference reasons, then, a test environmental interference event corresponding to the plurality of environmental interference time-space domain distributions having time-space domain relations is determined assuming that the time-space domain mapping characteristics match preset state conditions, and finally, the test environmental interference event and the environmental interference in the process of acquiring the three-dimensional electron diffraction data are determined according to the test environmental interference event and the environmental interference activity information matching the acquired in the process of acquiring the three-space domain sensitive crystal And the activity information executes an interference denoising rule cluster corresponding to the test environment interference event and the acquired interference factor, and performs interference denoising on the time-space domain mapping characteristic through an interference denoising rule corresponding to the three-dimensional electron diffraction data acquisition process. Therefore, the acquisition reliability and stability are improved by carrying out intelligent decision analysis on the acquisition interference factors and then carrying out interference denoising processing. It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
The functional modules in the embodiments of the present invention may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.
Alternatively, all or part of the implementation may be in software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, cause the processes or functions described in accordance with the embodiments of the invention to occur, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a network of computers, or other programmable device. The computer instructions may be stored in a computer readable storage medium or transmitted from one computer readable storage medium to another, for example, the computer instructions may be transmitted from one website site, computer, or data center to another website site, computer, or data center by wire (e.g., coaxial cable, fiber optic, Digital Subscriber Line (DSL)) or wirelessly (e.g., infrared, wireless, microwave, etc.). The computer-readable storage medium may be any available medium that can be accessed by a computer or a data storage device such as a server, a data center, etc. integrated with one or more available media. The usable medium may be a magnetic medium (e.g., floppy Disk, hard Disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., Solid State Disk (SSD)), among others.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive match, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any drawing credit or debit acknowledgement in the claims should not be construed as limiting the claim concerned.

Claims (10)

1. A method for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal, comprising:
extracting a plurality of environment interference time-space domain distributions with time-space domain connection according to environment interference activity information which is obtained in the process of acquiring three-dimensional electron diffraction data of the electron beam sensitive crystal and matches with the acquired interference factors;
determining a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution according to the multiple environmental interference time-space domain distributions with the time-space domain connection, wherein the time-space domain mapping characteristic represents a connection vector between the acquisition interference factor and multiple preset interference reasons;
assuming that the time-space domain mapping characteristics are matched with a preset state condition, determining a test environment interference event corresponding to the time-space domain distribution of the multiple environment interferences with the time-space domain connection, executing an interference denoising rule cluster corresponding to the test environment interference event and the acquired interference factors according to the test environment interference event and the environment interference activity information of the three-dimensional electron diffraction data acquisition process, and performing interference denoising on the time-space domain mapping characteristics through an interference denoising rule corresponding to the three-dimensional electron diffraction data acquisition process.
2. The method according to claim 1, wherein the determining a time-space domain mapping feature corresponding to the environmental interference time-space domain distribution according to the plurality of environmental interference time-space domain distributions having time-space domain relations comprises:
and inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
3. The method of claim 1, wherein determining a test environmental interference event corresponding to the plurality of environmental interference spatio-temporal distributions having spatio-temporal correlations assuming the spatio-temporal mapping features match a preset state condition comprises:
assuming that the time-space domain mapping characteristics are matched with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics;
and matching the test environment interference event corresponding to the time-space domain mapping characteristic component map from a preset interference event characteristic library according to the time-space domain mapping characteristic component map.
4. The method according to claim 3, wherein matching the test environment interference event corresponding to the time-space domain mapping feature component map from a preset interference event feature library according to the time-space domain mapping feature component map comprises:
determining a plurality of interference event characteristic components corresponding to the time-space domain mapping characteristic component map from the preset interference event characteristic library according to the time-space domain mapping characteristic component map;
confirming the time-space domain mapping characteristics by the interference tracking service system through the plurality of interference event characteristic components;
and determining a target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the plurality of interference event characteristic components.
5. The method of claim 1, further comprising:
and generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
6. A system for three-dimensional electron diffraction data acquisition of an electron beam sensitive crystal, comprising:
the extraction module is used for extracting a plurality of environment interference time-space domain distributions with time-space domain connection according to environment interference activity information which is obtained in the process of acquiring three-dimensional electron diffraction data of the electron beam sensitive crystal and matches with the acquired interference factors;
the determining module is used for determining time-space domain mapping characteristics corresponding to the environmental interference time-space domain distribution according to the multiple environmental interference time-space domain distributions with time-space domain connections, wherein the time-space domain mapping characteristics represent connection vectors between the acquired interference factors and multiple preset interference reasons;
and the interference denoising module is used for assuming that the time-space domain mapping characteristics are matched with a preset state condition, determining a test environment interference event corresponding to the time-space domain distribution of the multiple environment interferences with the time-space domain connection, executing an interference denoising rule cluster corresponding to the test environment interference event and the acquired interference factors according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, and performing interference denoising on the time-space domain mapping characteristics through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
7. The system of claim 6, wherein the determination module is specifically configured to:
and inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
8. The system of claim 6, wherein the interference denoising module is specifically configured to:
assuming that the time-space domain mapping characteristics are matched with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics; and matching the test environment interference event corresponding to the time-space domain mapping characteristic component map from a preset interference event characteristic library according to the time-space domain mapping characteristic component map.
9. The system of claim 8, wherein the interference denoising module is further configured to:
determining a plurality of interference event characteristic components corresponding to the time-space domain mapping characteristic component map from the preset interference event characteristic library according to the time-space domain mapping characteristic component map;
confirming the time-space domain mapping characteristics by the interference tracking service system through the plurality of interference event characteristic components;
and determining a target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the plurality of interference event characteristic components.
10. The system of claim 6, further comprising:
and the execution module is used for generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
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Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6970560B1 (en) * 1999-11-11 2005-11-29 Tokyo Electron Limited Method and apparatus for impairment diagnosis in communication systems
WO2010052289A1 (en) * 2008-11-06 2010-05-14 Nanomegas Sprl Methods and devices for high throughput crystal structure analysis by electron diffraction
US20130163378A1 (en) * 2011-12-27 2013-06-27 Cggveritas Services Sa Device and method for denoising ocean bottom data
US20140306108A1 (en) * 2011-07-21 2014-10-16 The Trustees Of Columbia University In The City Of New York Method of collecting and processing electron diffraction data
CN111344830A (en) * 2017-09-29 2020-06-26 牛津仪器纳米技术工具有限公司 Improved system for electron diffraction analysis
CN111351811A (en) * 2018-12-24 2020-06-30 清华大学 Crystal electron diffraction data acquisition method and device
CN111948967A (en) * 2020-08-18 2020-11-17 太仓韬信信息科技有限公司 Power data acquisition method and system based on big data
WO2021042503A1 (en) * 2019-09-06 2021-03-11 平安科技(深圳)有限公司 Information classification extraction method, apparatus, computer device and storage medium
CN112666191A (en) * 2021-01-31 2021-04-16 苏州青云瑞晶生物科技有限公司 Quantitative analysis system and method for crystalline phase content
CN112801155A (en) * 2021-01-20 2021-05-14 廖彩红 Business big data analysis method based on artificial intelligence and server
US20210302333A1 (en) * 2020-03-30 2021-09-30 Fei Company Electron diffraction holography
CN113674856A (en) * 2021-04-15 2021-11-19 腾讯科技(深圳)有限公司 Medical data processing method, device, equipment and medium based on artificial intelligence

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6970560B1 (en) * 1999-11-11 2005-11-29 Tokyo Electron Limited Method and apparatus for impairment diagnosis in communication systems
WO2010052289A1 (en) * 2008-11-06 2010-05-14 Nanomegas Sprl Methods and devices for high throughput crystal structure analysis by electron diffraction
US20140306108A1 (en) * 2011-07-21 2014-10-16 The Trustees Of Columbia University In The City Of New York Method of collecting and processing electron diffraction data
US20130163378A1 (en) * 2011-12-27 2013-06-27 Cggveritas Services Sa Device and method for denoising ocean bottom data
CN111344830A (en) * 2017-09-29 2020-06-26 牛津仪器纳米技术工具有限公司 Improved system for electron diffraction analysis
CN111351811A (en) * 2018-12-24 2020-06-30 清华大学 Crystal electron diffraction data acquisition method and device
WO2021042503A1 (en) * 2019-09-06 2021-03-11 平安科技(深圳)有限公司 Information classification extraction method, apparatus, computer device and storage medium
US20210302333A1 (en) * 2020-03-30 2021-09-30 Fei Company Electron diffraction holography
CN111948967A (en) * 2020-08-18 2020-11-17 太仓韬信信息科技有限公司 Power data acquisition method and system based on big data
CN112801155A (en) * 2021-01-20 2021-05-14 廖彩红 Business big data analysis method based on artificial intelligence and server
CN112666191A (en) * 2021-01-31 2021-04-16 苏州青云瑞晶生物科技有限公司 Quantitative analysis system and method for crystalline phase content
CN113674856A (en) * 2021-04-15 2021-11-19 腾讯科技(深圳)有限公司 Medical data processing method, device, equipment and medium based on artificial intelligence

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BONDARENKO, V. I.等: "Method of Contrast Enhancement and Background Correction in Electron Diffraction Patterns of Polycrystalline Materials", CRYSTALLOGRAPHY REPORTS, vol. 66, no. 4, 31 July 2021 (2021-07-31), pages 594 - 600, XP037516582, DOI: 10.1134/S1063774521040052 *
翟玉兰: "无透镜相干衍射成像系统的降噪技术研究", 中国优秀硕士学位论文全文数据库基础科学辑, no. 1, 15 January 2021 (2021-01-15), pages 005 - 207 *

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