CN114002247B - Three-dimensional electron diffraction data acquisition method and system for electron beam sensitive crystal - Google Patents
Three-dimensional electron diffraction data acquisition method and system for electron beam sensitive crystal Download PDFInfo
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- 238000010894 electron beam technology Methods 0.000 title claims abstract description 24
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- 230000007613 environmental effect Effects 0.000 claims abstract description 64
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- G01N23/20058—Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
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Abstract
According to the three-dimensional electron diffraction data acquisition method and system for the electron beam sensitive crystal, firstly, according to the environment interference activity information which is obtained in the three-dimensional electron diffraction data acquisition process of the electron beam sensitive crystal and matches with the acquisition interference factors, a plurality of environment interference time-space domain distributions with time-space domain relations are extracted, then time-space domain mapping characteristics corresponding to the environment interference time-space domain distributions are determined, the time-space domain mapping characteristics are assumed to match with preset state conditions, test environment interference events corresponding to the environment interference time-space domain distributions with the time-space relations are determined, and finally interference denoising is carried out on the time-space domain mapping characteristics according to the test environment interference events and the environment interference activity information of the three-dimensional electron diffraction data acquisition process. Therefore, intelligent decision analysis can be performed on the environmental interference activity, interference denoising processing is performed, and acquisition reliability and stability are improved.
Description
Technical Field
The invention relates to the technical field of data acquisition, in particular to a method and a system for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal.
Background
How to perform intelligent decision analysis on environmental interference activities and performing interference denoising processing according to the intelligent decision analysis is a technical problem to be solved urgently.
Disclosure of Invention
According to the above problems, the embodiment of the present invention provides a method for collecting three-dimensional electron diffraction data of an electron beam sensitive crystal, including:
extracting a plurality of environmental interference time-space domain distributions with time-space domain relations according to the environmental interference activity information which is obtained in the process of acquiring the three-dimensional electron diffraction data of the electron beam sensitive crystal and matches with the acquisition interference factors;
According to the plurality of environmental interference time-space domain distributions with time-space domain relations, determining time-space domain mapping characteristics corresponding to the environmental interference time-space domain distributions, wherein the time-space domain mapping characteristics represent relation vectors between the acquisition interference factors and a plurality of preset interference reasons;
Assuming that the time-space domain mapping characteristics match preset state conditions, determining test environment interference events corresponding to the plurality of environment interference time-space domain distributions with time-space domain relation; and executing an interference denoising rule cluster corresponding to the test environment interference event and the acquisition interference factor according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, and carrying out interference denoising on the time-space domain mapping characteristic through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
The determining, according to the multiple environmental interference time-space domain distributions with time-space domain relations, a time-space domain mapping feature corresponding to the environmental interference time-space domain distribution includes:
And inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
The determining a test environment interference event corresponding to the plurality of environment interference time-space domain distributions with time-space domain relation, provided that the time-space domain mapping feature matches a preset state condition, includes:
Assuming that the time-space domain mapping characteristics match with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics;
And matching the test environment interference event corresponding to the time-space domain mapping characteristic component spectrum from a preset interference event characteristic library according to the time-space domain mapping characteristic component spectrum.
Matching the test environment interference event corresponding to the time-space domain mapping characteristic component spectrum from a preset interference event characteristic library according to the time-space domain mapping characteristic component spectrum, wherein the method comprises the following steps:
determining a plurality of interference event feature components corresponding to the time-space domain mapping feature component spectrum from the preset interference event feature library according to the time-space domain mapping feature component spectrum;
confirming the time-space domain mapping features through the interference tracking service system by the multiple interference event feature components;
And determining the target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the feature components of the interference events.
Wherein the method further comprises:
Generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
The invention also provides a three-dimensional electron diffraction data acquisition system for the electron beam sensitive crystal, which comprises:
the extraction module is used for extracting a plurality of environmental interference time-space domain distributions with time-space domain relation according to the environmental interference activity information which is obtained in the process of acquiring the three-dimensional electron diffraction data of the electron beam sensitive crystal and is matched with the acquisition interference factors;
the determining module is used for determining time-space domain mapping characteristics corresponding to the environmental interference time-space domain distribution according to the environmental interference time-space domain distribution with the time-space domain relation, and the time-space domain mapping characteristics represent relation vectors between the acquisition interference factors and a plurality of preset interference reasons;
The interference denoising module is used for determining test environment interference events corresponding to the environment interference time-space domain distribution with the time-space domain relation on the assumption that the time-space domain mapping characteristics match preset state conditions; and executing an interference denoising rule cluster corresponding to the test environment interference event and the acquisition interference factor according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, and carrying out interference denoising on the time-space domain mapping characteristic through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
The determining module is specifically configured to:
And inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
The interference denoising module is specifically configured to:
Assuming that the time-space domain mapping characteristics match with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics; and matching the test environment interference event corresponding to the time-space domain mapping characteristic component spectrum from a preset interference event characteristic library according to the time-space domain mapping characteristic component spectrum.
Wherein, the interference denoising module is specifically further configured to:
determining a plurality of interference event feature components corresponding to the time-space domain mapping feature component spectrum from the preset interference event feature library according to the time-space domain mapping feature component spectrum;
confirming the time-space domain mapping features through the interference tracking service system by the multiple interference event feature components;
And determining the target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the feature components of the interference events.
The system further comprises:
and the execution module is used for generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
In summary, in the method and system for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal provided by the embodiments of the present invention, according to the environmental interference activity information of matching acquisition interference factors obtained in the process of acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal, a plurality of environmental interference time-space domain distributions with time-space relations are extracted, then according to the plurality of environmental interference time-space domain distributions with time-space relations, time-space mapping features corresponding to the environmental interference time-space domain distributions are determined, the time-space mapping features characterize the relation vector between the acquisition interference factors and a plurality of preset interference reasons, then assume that the time-space mapping features match preset state conditions, determine test environmental interference events corresponding to the plurality of environmental interference time-space distributions with time-space relations, and finally execute interference denoising rule clusters corresponding to the test environmental interference events and the acquisition interference factors according to the environmental interference activity information of the test environmental interference events and the three-dimensional electron diffraction data acquisition process, and perform interference denoising mapping on the time-space domain features through the interference denoising rule corresponding to the three-dimensional electron diffraction data acquisition process. Therefore, through intelligent decision analysis aiming at the acquisition interference factors, interference denoising processing is carried out, and acquisition reliability and stability are improved.
The foregoing objects, features and advantages of embodiments of the invention will be more readily apparent from the following detailed description of the embodiments taken in conjunction with the accompanying drawings.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, it being understood that the drawings below are only some embodiments of the present invention and therefore should not be considered as limiting the scope, and that other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for collecting three-dimensional electron diffraction data of an electron beam sensitive crystal according to an embodiment of the present invention;
FIG. 2 is a functional block diagram of a three-dimensional electron diffraction data acquisition system for electron beam sensitive crystals, according to an embodiment of the present invention.
Detailed Description
In order to enable those skilled in the art to better understand the present invention, a technical solution of the present embodiment of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiment of the present invention, and it is apparent that the described embodiment is only a part of the embodiment of the present invention, not all the embodiments. All other embodiments, which can be made by one of ordinary skill in the art without undue burden, are within the scope of the present invention in light of the embodiments of the present invention.
Fig. 1 is a schematic flow chart of a method for collecting three-dimensional electron diffraction data of an electron beam sensitive crystal according to an embodiment of the present invention, where the method for collecting three-dimensional electron diffraction data may be executed by a target service platform for providing a three-dimensional electron diffraction data collecting process service, and a background server for providing the three-dimensional electron diffraction data collecting process service.
The servers may include one or more processors, such as one or more Central Processing Units (CPUs), each of which can implement one or more hardware threads. The server may also include any storage medium for storing any kind of information such as code, settings, data, etc. For example, and without limitation, the storage medium may include any one or more of the following combinations: any type of RAM, any type of ROM, flash memory devices, hard disks, optical disks, etc. More generally, any storage medium may store information using any technique. Further, any storage medium may provide volatile or non-volatile retention of information. Further, any storage medium may represent fixed or removable components of a server. In one case, the server may perform any of the operations of the associated instructions when the processor executes the corresponding instructions stored in any storage medium or combination of storage media. The server also includes one or more drive units for interacting with any storage media, such as a hard disk drive unit, optical disk drive unit, and the like.
The server also includes input/output (I/O) for receiving various inputs (via the input unit) and for providing various outputs (via the output unit). One particular output mechanism may include a presentation device and a corresponding Graphical User Interface (GUI). The server may also include one or more network interfaces for exchanging data with other devices via one or more communication units. One or more communication buses couple the above-described components together.
The communication unit may be implemented in any manner, e.g., via a local area network, a wide area network (e.g., the internet), a point-to-point connection, etc., or any combination thereof. The communication units may include any combination of hardwired links, wireless links, routers, gateway functions, etc., governed by any protocol or combination of protocols.
The detailed steps of the three-dimensional electron diffraction data acquisition method for the electron beam sensitive crystal are described below.
And 100, extracting a plurality of environment interference time-space domain distributions with time-space domain relations according to the environment interference activity information which is obtained in the process of acquiring the three-dimensional electron diffraction data of the electron beam sensitive crystal and matches the acquired interference factors.
Step 200, determining time-space domain mapping features corresponding to the environmental interference time-space domain distribution according to the environmental interference time-space domain distribution with the time-space domain relation, wherein the time-space domain mapping features represent relation vectors between the acquisition interference factors and a plurality of preset interference reasons.
Step 300, assuming that the time-space domain mapping characteristics match with preset state conditions, determining test environment interference events corresponding to the plurality of environment interference time-space domain distributions with time-space domain relations; and executing an interference denoising rule cluster corresponding to the test environment interference event and the acquisition interference factor according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, and carrying out interference denoising on the time-space domain mapping characteristic through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
In a possible implementation manner, for step 200, the determining, according to the multiple environmental interference time-space domain distributions with time-space domain relations, a time-space domain mapping feature corresponding to the environmental interference time-space domain distribution includes:
And inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
In a possible implementation manner, for step 300, assuming that the time-space domain mapping feature matches a preset state condition, determining a test environmental interference event corresponding to the plurality of environmental interference time-space domain distributions with time-space domain association includes:
Assuming that the time-space domain mapping characteristics match with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics; and matching the test environment interference event corresponding to the time-space domain mapping characteristic component spectrum from a preset interference event characteristic library according to the time-space domain mapping characteristic component spectrum.
In a possible implementation manner, for step 300, according to the time-space domain mapping feature component spectrum, matching a test environment interference event corresponding to the time-space domain mapping feature component spectrum from a preset interference event feature library, including:
determining a plurality of interference event feature components corresponding to the time-space domain mapping feature component spectrum from the preset interference event feature library according to the time-space domain mapping feature component spectrum;
confirming the time-space domain mapping features through the interference tracking service system by the multiple interference event feature components;
And determining the target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the feature components of the interference events.
In one possible implementation manner, the method described in this embodiment further includes:
Generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
Fig. 2 is a functional block diagram of a three-dimensional electron diffraction data acquisition system for electron beam sensitive crystals, where functions implemented by the data acquisition system may correspond to steps performed by the above-described method according to an embodiment of the present invention. The data acquisition system may be understood as the above server, or a processor of the server, or may be understood as a component, which is independent from the above server or processor and is controlled by the server, to implement the functions of the present invention, as shown in fig. 2, and the functions of each functional module of the data acquisition system are described in detail below.
The extracting module 210 is configured to extract a plurality of environmental interference time-space domain distributions with time-space domain relations according to environmental interference activity information that matches an acquisition interference factor and is obtained in a three-dimensional electron diffraction data acquisition process of an electron beam sensitive crystal;
a determining module 220, configured to determine, according to the multiple environmental interference time-space domain distributions with time-space domain relations, a time-space domain mapping feature corresponding to the environmental interference time-space domain distributions, where the time-space domain mapping feature characterizes a relation vector between the acquisition interference factor and multiple preset interference reasons;
The interference denoising module 230 is configured to determine a test environmental interference event corresponding to the plurality of environmental interference time-space distributions with time-space relation, assuming that the time-space mapping features match a preset state condition; and executing an interference denoising rule cluster corresponding to the test environment interference event and the acquisition interference factor according to the test environment interference event and the environment interference activity information of the three-dimensional electronic diffraction data acquisition process, and carrying out interference denoising on the time-space domain mapping characteristic through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process.
In a possible implementation manner, the determining module is specifically configured to:
And inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
In one possible implementation manner, the interference denoising module is specifically configured to:
Assuming that the time-space domain mapping characteristics match with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics; and matching the test environment interference event corresponding to the time-space domain mapping characteristic component spectrum from a preset interference event characteristic library according to the time-space domain mapping characteristic component spectrum.
In a possible implementation manner, the interference denoising module is specifically further configured to:
determining a plurality of interference event feature components corresponding to the time-space domain mapping feature component spectrum from the preset interference event feature library according to the time-space domain mapping feature component spectrum;
confirming the time-space domain mapping features through the interference tracking service system by the multiple interference event feature components;
And determining the target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the feature components of the interference events.
In one possible embodiment, the system further comprises:
And the execution module 240 is configured to generate an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and perform activation execution on the interference denoising instance event and the interference denoising rule cluster.
In summary, in the method and system for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal provided by the embodiments of the present invention, according to the environmental interference activity information of matching acquisition interference factors obtained in the process of acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal, a plurality of environmental interference time-space domain distributions with time-space relations are extracted, then according to the plurality of environmental interference time-space domain distributions with time-space relations, time-space mapping features corresponding to the environmental interference time-space domain distributions are determined, the time-space mapping features characterize the relation vector between the acquisition interference factors and a plurality of preset interference reasons, then assume that the time-space mapping features match preset state conditions, determine test environmental interference events corresponding to the plurality of environmental interference time-space distributions with time-space relations, and finally execute interference denoising rule clusters corresponding to the test environmental interference events and the acquisition interference factors according to the environmental interference activity information of the test environmental interference events and the three-dimensional electron diffraction data acquisition process, and perform interference denoising mapping on the time-space domain features through the interference denoising rule corresponding to the three-dimensional electron diffraction data acquisition process. Therefore, through intelligent decision analysis aiming at the acquisition interference factors, interference denoising processing is carried out, and acquisition reliability and stability are improved. It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described systems, apparatuses and units may refer to corresponding procedures in the foregoing method embodiments, which are not repeated herein.
The functional modules in the embodiments of the present invention may be integrated together to form a single part, or the functional modules may exist alone, or two or more modules may be integrated to form a single part.
Alternatively, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, produces a flow or function in accordance with embodiments of the present invention, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable apparatus. The computer instructions may be stored in or transmitted from one computer-readable storage medium to another, for example, by wired (e.g., coaxial cable, optical fiber, digital Subscriber Line (DSL)), or wireless (e.g., infrared, wireless, microwave, etc.). The computer readable storage medium may be any available medium that can be accessed by a computer or a data storage device such as a server, data center, etc. that matches one or more of the available media. The usable medium may be a magnetic medium (e.g., floppy disk, hard disk, tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid state disk Solid STATE DISK (SSD)), etc.
It should be noted that, in this document, the terms "comprises," "comprising," "includes," "including," or any other variation thereof, are intended to cover a non-exclusive match, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any accompanying drawings in the claims should not be taken as limiting the claim concerned.
Claims (6)
1. A method for acquiring three-dimensional electron diffraction data of an electron beam sensitive crystal, comprising the steps of:
extracting a plurality of environmental interference time-space domain distributions with time-space domain relations according to the environmental interference activity information which is obtained in the process of acquiring the three-dimensional electron diffraction data of the electron beam sensitive crystal and matches with the acquisition interference factors;
According to the plurality of environmental interference time-space domain distributions with time-space domain relations, determining time-space domain mapping characteristics corresponding to the environmental interference time-space domain distributions, wherein the time-space domain mapping characteristics represent relation vectors between the acquisition interference factors and a plurality of preset interference reasons;
Assuming that the time-space domain mapping characteristics match with preset state conditions, determining test environment interference events corresponding to the plurality of environment interference time-space domain distributions with time-space domain connections, executing an interference denoising rule cluster corresponding to the test environment interference events and the acquisition interference factors according to the test environment interference events and environment interference activity information of the three-dimensional electronic diffraction data acquisition process, and performing interference denoising on the time-space domain mapping characteristics through the interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process;
The determining a test environment interference event corresponding to the plurality of environment interference time-space domain distributions with time-space domain relation, provided that the time-space domain mapping feature matches a preset state condition, includes:
Assuming that the time-space domain mapping characteristics match with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics;
matching a test environment interference event corresponding to the time-space domain mapping characteristic component spectrum from a preset interference event characteristic library according to the time-space domain mapping characteristic component spectrum;
Matching the test environment interference event corresponding to the time-space domain mapping characteristic component spectrum from a preset interference event characteristic library according to the time-space domain mapping characteristic component spectrum, wherein the method comprises the following steps:
determining a plurality of interference event feature components corresponding to the time-space domain mapping feature component spectrum from the preset interference event feature library according to the time-space domain mapping feature component spectrum;
confirming the time-space domain mapping features through the interference tracking service system by the multiple interference event feature components;
And determining the target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the feature components of the interference events.
2. The method of claim 1, wherein said determining a time-space domain mapping feature corresponding to said environmental interference time-space domain distribution according to said plurality of environmental interference time-space domain distributions with time-space domain connections comprises:
And inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
3. The method according to claim 1, wherein the method further comprises:
Generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
4. A three-dimensional electron diffraction data acquisition system for an electron beam sensitive crystal, comprising:
the extraction module is used for extracting a plurality of environmental interference time-space domain distributions with time-space domain relation according to the environmental interference activity information which is obtained in the process of acquiring the three-dimensional electron diffraction data of the electron beam sensitive crystal and is matched with the acquisition interference factors;
the determining module is used for determining time-space domain mapping characteristics corresponding to the environmental interference time-space domain distribution according to the environmental interference time-space domain distribution with the time-space domain relation, and the time-space domain mapping characteristics represent relation vectors between the acquisition interference factors and a plurality of preset interference reasons;
The interference denoising module is used for determining test environment interference events corresponding to the plurality of environment interference time-space domain distributions with time-space domain relation on the assumption that the time-space domain mapping characteristics match preset state conditions, executing an interference denoising rule cluster corresponding to the test environment interference events and the acquisition interference factors according to the test environment interference events and environment interference activity information of the three-dimensional electronic diffraction data acquisition process, and carrying out interference denoising on the time-space domain mapping characteristics through an interference denoising rule corresponding to the three-dimensional electronic diffraction data acquisition process;
The interference denoising module is specifically configured to:
Assuming that the time-space domain mapping characteristics match with preset state conditions, determining a time-space domain mapping characteristic component map corresponding to the time-space domain mapping characteristics; matching a test environment interference event corresponding to the time-space domain mapping characteristic component spectrum from a preset interference event characteristic library according to the time-space domain mapping characteristic component spectrum;
the interference denoising module is specifically further configured to:
determining a plurality of interference event feature components corresponding to the time-space domain mapping feature component spectrum from the preset interference event feature library according to the time-space domain mapping feature component spectrum;
confirming the time-space domain mapping features through the interference tracking service system by the multiple interference event feature components;
And determining the target test environment interference event according to the confirmation indication information of the interference tracking service system aiming at the feature components of the interference events.
5. The system according to claim 4, wherein the determining module is specifically configured to:
And inputting the environmental interference time-space domain distribution into a neural network unit, and deciding a time-space domain mapping characteristic corresponding to the environmental interference time-space domain distribution through the neural network unit.
6. The system of claim 4, wherein the system further comprises:
and the execution module is used for generating an interference denoising instance event corresponding to the interference denoising rule cluster according to the interference denoising rule cluster, and activating and executing the interference denoising instance event and the interference denoising rule cluster.
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