CN113992554B - Full-automatic PoE switch aging system and aging method - Google Patents
Full-automatic PoE switch aging system and aging method Download PDFInfo
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- CN113992554B CN113992554B CN202111243572.9A CN202111243572A CN113992554B CN 113992554 B CN113992554 B CN 113992554B CN 202111243572 A CN202111243572 A CN 202111243572A CN 113992554 B CN113992554 B CN 113992554B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L12/00—Data switching networks
- H04L12/02—Details
- H04L12/10—Current supply arrangements
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L49/00—Packet switching elements
- H04L49/10—Packet switching elements characterised by the switching fabric construction
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04Q—SELECTING
- H04Q1/00—Details of selecting apparatus or arrangements
- H04Q1/02—Constructional details
- H04Q1/035—Cooling of active equipments, e.g. air ducts
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Abstract
The invention relates to the technical field of PoE switches, in particular to a full-automatic PoE switch aging system and an aging method, wherein an automatic transfer device moves the PoE switch to a test position of an aging test device, an automatic plugging device automatically plugs a power line and a network line, a data power supply separation device separates a power supply signal and a network data signal of the PoE switch, the power supply signal is input to the aging test device for current test, and the network data signal is subjected to network data test by the data test device, so that the PoE switch aging test can be quickly and automatically performed, manual participation is not needed, the labor cost is effectively reduced, and the test efficiency of the PoE switch is improved.
Description
Technical Field
The invention relates to the technical field of PoE switches, in particular to a full-automatic PoE switch aging system and an aging method.
Background
POE (Power Over Ethernet) is a technology for transmitting data signals to IP-based terminals (such as IP phones, wireless lan access points AP, webcams, etc.) while providing dc power to such devices without any modification to the existing ethernet cat.5 wiring infrastructure. POE is also known as a local area network based Power Over LAN (POL) or Active Ethernet (Active Ethernet), sometimes simply referred to as Power over Ethernet, which is the latest standard specification for transmitting data and electric Power while using existing standard Ethernet transmission cables, and maintains compatibility with existing Ethernet systems and users.
Traditional PoE switch ageing is simple, and under high temperature alleviating, connect some PD (Power Device) equipment after the circular telegram, carry out simple current aging test, occupy a large amount of manpower and materials, need the connecting wire of manual work plug test in-process.
Disclosure of Invention
The invention provides a full-automatic PoE switch aging system aiming at the problems in the prior art, which can fully automatically perform loading, transferring, aging test and data test work of the PoE switch, and can also perform the plugging of power lines and network lines in the test process through an automatic plugging device, thereby reducing a large amount of manpower and material resources and effectively improving the aging test efficiency of the PoE switch.
In order to solve the technical problems, the invention adopts the following technical scheme: the full-automatic PoE switch aging system comprises a control center, a rack, a data power supply separation device, an aging test device, a data test device, an automatic transfer device and an automatic plugging device, wherein the data power supply separation device, the aging test device, the data test device, the automatic transfer device and the automatic plugging device are all arranged on the rack, the aging test device and the data test device are connected with the control center through signals, and the control center is used for controlling the aging test device and the data test device to work; the data power supply separation device is provided with a power supply output end and a data output end, and is used for installing a PoE switch and separating the power supply of the PoE switch from data, and the automatic transfer device is used for transferring the data power supply separation device with the PoE switch to the aging test device; the power output end of the data power supply separation device is connected with the input end of the aging test device, and the aging test device is used for performing power aging test on the separated power supply of the PoE switch; the data output end of the data power supply separation device is connected with the input end of the data testing device, and the data testing device is used for carrying out network data testing on the data separated by the PoE switch; the automatic plugging device is used for automatically plugging the power line between the data power supply separation device and the aging test device and plugging the network line between the data power supply separation device and the data test device.
Preferably, the data power supply separation device comprises a separator and a separation load electrically connected with the separator, an output port of the PoE switch is connected with an input end of the separator, the separator is used for separating a signal of the PoE switch into a power signal and a network data signal, the power signal output by the separator is output to the aging test device through the separation load, and the network data signal output by the separator is output to the data test device.
Preferably, the automatic plugging device comprises a first manipulator installed on the rack, and the plugging of the power line between the data power supply separation device and the aging test device and the plugging of the network line between the data power supply separation device and the data test device are completed through the first manipulator.
Preferably, the automatic transfer device comprises a second manipulator arranged on the rack, and the PoE switch is transferred to the burn-in test device by the second manipulator for burn-in test.
Preferably, the aging test device comprises a housing and a plurality of test areas arranged in the housing, the test areas are respectively and electrically connected with the control center, each test area comprises a plurality of test bits, each test bit comprises an aging jig and an aging load, and the data power supply separation device is assembled behind the aging jig, and the power supply output end of the data power supply separation device is electrically connected with the aging load; the data power supply separation device is arranged on the aging jig.
Preferably, the burn-in apparatus is provided with a thermostat module for stabilizing the temperature within the housing of the burn-in apparatus.
Preferably, the constant temperature module comprises an exhaust assembly, a heating assembly and a temperature detection assembly, wherein the temperature detection assembly is arranged in the shell and is used for detecting the temperature in the shell, the temperature detection assembly is in signal connection with the control center, and the exhaust assembly and the heating assembly are both arranged in the shell and are in signal connection with the control center.
Preferably, the full-automatic PoE switch aging system further comprises a material detecting device, wherein the material detecting device is used for sorting out good products and defective products from the PoE switch after the test is completed.
The invention also provides an aging method of the full-automatic PoE switch aging system, which comprises the following steps:
A. the automatic transfer device transfers the PoE switch to an aging jig of the aging test device;
B. the automatic plugging device is used for automatically plugging a power line and a network line into the ageing jig and the PoE switch;
the PoE exchanger separates power signals and network data signals through a data power separation device arranged on the aging jig;
D. the power supply signal is converted into direct-current voltage after passing through the PD equipment and is input into an aging load of the aging test device, and then the control center regulates and controls the current of the port of the PoE switch to change the output power of the PoE switch so as to perform aging test; the network data signal is subjected to network data test through a data test device;
E. and (3) completing the test, automatically pulling out the power line and the network line by the automatic plugging device, and discharging the PoE switch.
Preferably, in the step E, after the PoE switch finishes the aging test and before the blanking, the control center needs to sort the products of the PoE switch, sort out the PoE switch with good test, the PoE switch with bad power supply aging, and the PoE switch with bad network test, and then respectively blanking.
The invention has the beneficial effects that:
according to the full-automatic PoE switch aging system and the aging method, the automatic transfer device moves the PoE switch to the test position of the aging test device, the automatic plugging device automatically plugs the power line and the network line, the data power separation device separates the power signal and the network data signal of the PoE switch, the power signal is input to the aging test device for current test, and the network data signal is subjected to network data test by the data test device, so that the PoE switch aging test can be quickly and automatically performed, manual participation is not needed, labor cost is effectively reduced, and the test efficiency of the PoE switch is improved.
Drawings
FIG. 1 is a signal control block diagram of the present invention;
FIG. 2 is a schematic diagram of a data power separation device according to the present invention;
FIG. 3 is a schematic structural diagram of the burn-in apparatus according to the present invention;
fig. 4 is a constant temperature module of the present invention.
The reference numerals in fig. 1 to 4 include:
the device comprises a 1-control center, a 2-data power supply separation device, a 3-aging test device, a 4-data test device, a 7-separator, an 8-separation load, a 9-shell, a 10-test area, an 11-test position, a 14-constant temperature module, a 15-exhaust assembly, a 16-heating assembly, a 17-temperature detection assembly and an 18-material detection device.
Detailed Description
The invention will be further described with reference to examples and drawings, to which reference is made, but which are not intended to limit the scope of the invention. The present invention will be described in detail below with reference to the accompanying drawings.
The embodiment provides a fully automatic PoE switch aging system, as shown in fig. 1, which comprises a control center 1, a rack (not shown in the drawing), and a data power supply separation device 2, an aging test device 3, a data test device 4, an automatic transfer device and an automatic plugging device which are all arranged on the rack, wherein the aging test device 3 and the data test device 4 are both in signal connection with the control center 1, and the control center 1 is used for controlling the aging test device 3 and the data test device 4 to work; the data power supply separation device 2 is provided with a power supply output end and a data output end, the data power supply separation device 2 is used for installing a PoE switch and separating the power supply of the PoE switch from data, and the automatic transfer device is used for transferring the data power supply separation device 2 provided with the PoE switch to the aging test device 3; the power output end of the data power supply separation device 2 is connected with the input end of the aging test device 3, and the aging test device 3 is used for performing power aging test on the separated power supply of the PoE switch; the data output end of the data power supply separation device 2 is connected with the input end of the data testing device 4, and the data testing device 4 is used for carrying out network data testing on the data separated by the PoE switch; the automatic plugging device is used for automatically plugging the power line between the data power supply separation device 2 and the aging test device 3 and plugging the network line between the data power supply separation device 2 and the data test device 4. The data testing device 4 is a prior art, such as a network tester.
The control center 1 of the present embodiment is a control hub of the whole PoE switch aging system, and preferably includes an MES control system, i.e., an intelligent manufacturing management system (this is the prior art), a control terminal (e.g., a computer), and an RS232 control system, where the MES control system, i.e., the intelligent manufacturing management system, is used to control the control terminal and the RS232 control system, and the control terminal and the RS232 control system are used to control other devices. The control of each function of the embodiment is completed by the control center 1, for example, the control center 1 controls the aging testing device 3 to perform power aging test, and controls the automatic plugging device to automatically plug the connecting wire.
Specifically, as shown in fig. 1 and fig. 2, in this embodiment, a fully automatic burn-in test mode is adopted, the feeding structure is in the prior art, after the PoE switch is fed, the automatic transfer device moves the PoE switch to the test site 11 of the burn-in test device 3, and the data power separation device 2 in this embodiment is preferably installed on the test site 11 of the burn-in test device 3, so that after the PoE switch is transferred and fixed to the data power separation device 2, the burn-in test can be directly performed after the power and data are separated; after the PoE switch is fixed on the data power supply separation device 2, the automatic plugging device automatically plugs the power supply wire and the network wire, and meanwhile, the data power supply separation device 2 separates the power supply signal and the network data signal of the PoE switch, the power supply signal is input to the aging test device 3 from the power supply output end for current test, and the network data signal is input to the data test device 4 from the data output end for network data test, so that the aging test of the PoE switch can be rapidly and automatically performed, manual participation is not needed, the labor cost is effectively reduced, and the test efficiency of the PoE switch is improved.
In the fully automatic PoE switch aging system provided in this embodiment, as shown in fig. 2, the data power supply separation device 2 includes a separator 7 and a separation load 8 electrically connected to the separator 7, an output port of the PoE switch is connected to an input end of the separator 7, the separator 7 is configured to separate a signal of the PoE switch into a power supply signal and a network data signal, the power supply signal output by the separator 7 is output to the aging test device 3 through the separation load 8, and the network data signal output by the separator 7 is output to the data test device 4.
Specifically, as shown in fig. 2, the splitter 7 of the present embodiment preferably employs a network transformer or the like for separating network data and power signals in the prior art, the splitter 7 is provided with an ethernet power receiving function (PD), and electrical energy and data are split by the network transformer, wherein the electrical energy flows to the splitting load 8 and the data flows to the data testing device 4; the separation load 8 can be a self-contained cement resistance load and an electronic load, or can be externally connected with an electronic load instrument. The use principle is as follows: firstly, connecting a PoE switch port to an input port of a separator 7 through a network cable, connecting an output port of the separator 7 to a data testing device 4 through the network cable, and separating electric signals and communication data by the separator 7; secondly, the separator 7 is regulated by the control center 1, so that the output power value of a single or a plurality of POE ports is fully loaded, or the total power value of the output power is close to the power budget value of the PoE switch, and the PoE switch is subjected to aging test of the electrical performance; and thirdly, setting relevant parameters of test software of the data test device 4 to enable the PoE switch to run under full system load, so as to test network communication data. The data power supply separation device 2 of this embodiment not only can improve the test efficiency of PoE switch, but also can test PoE system and switch system of PoE switch simultaneously, i.e. power and data are tested simultaneously, and in the test process of earlier stage, possible defect of finding dual system during operation is helped.
The automatic plugging device (not shown in the drawing) includes a first manipulator (not shown in the drawing) installed on the rack, and the plugging of the power line between the data power supply separation device 2 and the burn-in test device 3 and the plugging of the network line between the data power supply separation device 2 and the data test device 4 are completed by the first manipulator. Wherein the automatic transfer device (not shown in the drawing) comprises a second manipulator (not shown in the drawing) mounted on the rack, and the PoE switch is transferred into the burn-in test device 3 by the second manipulator for burn-in test.
Specifically, the first manipulator and the second manipulator are adopted, and intelligent control is realized through the control center 1, so that the purposes of automatic plugging and automatic transferring of connecting wires of the PoE switch are realized, and the testing efficiency of the PoE switch is further effectively improved. As another implementation manner of this embodiment, the automatic transfer device and the automatic plug device may be configured as corresponding clamps and structures in the prior art such as a slide rail and a slide block for driving the clamps to move, and the slide block is driven to move on the slide rail by a driving cylinder, so as to control the clamp to clamp the PoE switch to move, clamp the connecting line to move and plug, and the clamp may be a conventional finger cylinder or the like.
Referring to fig. 3 and 4, the aging test device 3 includes a housing 9 and a plurality of test areas 10 installed in the housing 9, the plurality of test areas 10 are respectively electrically connected with the control center 1, each test area 10 includes a plurality of test sites 11, the test sites 11 include an aging fixture (not shown in the drawing) and an aging load (not shown in the drawing), and after the data power separation device 2 is assembled in the aging fixture, a power output end of the data power separation device 2 is electrically connected with the aging load; the data power supply separation device 2 is arranged on the aging jig.
Specifically, in the actual test, the present embodiment may simultaneously set a plurality of burn-in devices 3, so that more PoE switches may be tested simultaneously. The burn-in test device 3 of the present embodiment is provided with a plurality of test areas 10, and each test area 10 is electrically independent, that is, each test area 10 is controlled by the control center 1, so that different test areas 10 can be set to different test parameters, and different PoE switches and different functions can be tested simultaneously. As shown in fig. 3, two test areas 10 are set, each test area 10 is provided with a plurality of test bits 11, after the PoE switch is fixed to the data power supply separation device 2 on the aging jig, the data power supply separation device 2 works to separate a power supply signal and a network data signal, after the power supply signal is separated, the separated power supply signal is connected to the separation load 8 with the PD function to be converted into standard direct current, and then is connected to the direct current power supply aging system of the aging test device 3, the direct current power supply aging system can respectively control the power of the port of each PoE switch through the control terminal of the control center 1 into a computer and the RS232 control system, and adjusts the power of the port (0-30W) according to the PoE standard ieee802.3af/AT, adjusts the output power according to the power p=u×i, when the voltage is constant, adjusts the current, and the maximum power of the port is 40W/port, thereby the port of the PoE switch works under the condition of full load, and is favorable for aging test. After the data is separated, the network test system in the prior art can be used for independently testing a plurality of PoE switches in the test area 10, the aging process needs 2-4 hours, the whole machine test only needs 1-2 minutes, and the time can be greatly saved.
Further, as shown in fig. 4, the aging test device 3 of this embodiment is further provided with a constant temperature module 14, the constant temperature module 14 includes an exhaust component 15, a heating component 16, and a temperature detection component 17, the temperature detection component 17 is installed in the housing 9 and is used for the temperature in the housing 9, the temperature detection component 17 is in signal connection with the control center 1, and the exhaust component 15 and the heating component 16 are both installed in the housing 9 and are in signal connection with the control center 1.
Specifically, in order to keep the temperature of the PoE switch stable in the testing process, the temperature detecting component 17, such as a temperature sensor, is installed in the aging testing device 3, and then the temperature detecting data is transmitted to the control center 1, if the temperature is increased, the air exhausting component 15 is used for exhausting air in the aging testing device 3, and hot air is exhausted to help cool, if the temperature is reduced, the control center 1 controls the heating component 16 to heat the aging testing device 3, so that the working temperature of the aging testing device 3 is kept constant, the aging testing work can be normally performed, and the testing environment is consistent, thereby being beneficial to improving the accurate effect of the test. The structure of the exhaust assembly 15 and the structure of the heating assembly 16 are both the prior art.
The embodiment provides a full-automatic PoE switch aging system, as shown in fig. 1, the full-automatic PoE switch aging system further includes a material checking device 18, and the material checking device 18 is used for sorting out good products and defective products from the PoE switch after the test is completed.
Specifically, after the test is completed, there may be good products and defective products, so by setting the material detecting device 18, the good products, the defective products of the aging test of the power signal and the defective products of the test of the network data are respectively sorted, so that the worker is convenient to recover and overhaul, wherein the structure of the material detecting device 18 is the prior art.
The ageing method of the full-automatic PoE switch ageing system provided by the embodiment comprises the following steps:
A. the automatic transfer device transfers the PoE switch to an aging jig of the aging test device 3;
B. the automatic plugging device is used for automatically plugging a power line and a network line into the ageing jig and the PoE switch;
the PoE exchanger separates power signals and network data signals through a data power separation device 2 arranged on the aging jig;
D. the power supply signal is converted into direct-current voltage after passing through PD equipment and is input into an aging load of the aging test device 3, and then the control center 1 regulates and controls the current of the port of the PoE switch to change the output power of the PoE switch so as to perform aging test; the network data signal is subjected to network data test by the data test device 4;
E. completing the test, automatically pulling out the power line and the network line by the automatic plug-pull device, and discharging the PoE switch;
in step E, after the PoE switch finishes the aging test and before the blanking, the control center 1 needs to sort the PoE switch, sort out the PoE switch with good test, the PoE switch with bad power supply aging, and the PoE switch with bad network test, and then blanking.
In particular, poE switch burn-in implementation is as follows:
1. the terminal (PoE exchanger) is put on a production line such as an automatic connection table (the automatic connection table is in the prior art), then is transported to the ageing test position 11 of the ageing test device 3 in a belt transportation mode in the prior art, and then the PoE exchanger is automatically put into an ageing carrier through a second mechanical arm;
2. a terminal (PoE switch) placed in the aging carrier automatically inserts and withdraws an AC power line and an RJ45 network line through a mechanical arm and the carrier;
3. a terminal (PoE switch) in the aging jig is connected with a separated load 8 with a PD function through a data power supply separation device 2 of the PoE switch, then the separated PoE is converted into a rectification voltage, then the rectification voltage is connected with an aging load of an aging test device 3, then the aging load of the aging test device 3 is controlled through a control terminal such as a computer and an RS232 control system, the current of a port of the PoE switch is regulated, the voltage is constant according to P=U.I, the output power can be regulated by regulating the current, and the maximum power of the port is 40W/port;
4. the network data signals separated through the data and power separation module of the PoE switch are subjected to network data related test on the PoE switch network port through a network test system, 1 PoE switch can be tested each time, and after the ageing jig is fixed, different PoE switches are continuously switched through a second manipulator in the ageing process for 4 hours to carry out corresponding network data test;
5. in an aging system, the temperature of the PoE switch can be controlled by a computer, and the input voltage can be automatically adjusted to 220V/110VAC through a peripheral power control module, wherein the power control module is in the prior art;
6. and finally, sorting and judging good products, ageing defective products and network testing defective products after the testing is finished.
The present POE switch is applied to all aspects of our life, POE switch manufacturers are also very many, most manufacturers simply age the power supply for POE switch, but do not perform substantial aging test on POE, and the aging method of the full-automatic POE switch of this embodiment has the following main advantages:
1. the power supply function of the PoE switch can be aged independently, and the power supply is not aged simply;
2. in the ageing process of the PoE switch, the AC power line and the network line do not need to be manually plugged and unplugged; the labor cost is greatly saved;
3. in the aging process of the PoE switch for 4 hours, synchronously performing a packetization test of the data stream;
4. the PoE switch separates the data flow and the PoE power supply through the aging system, and can age the data and the PoE power supply independently.
The present invention is not limited to the preferred embodiments, but is intended to be limited to the following description, and any modifications, equivalent changes and variations in light of the above-described embodiments will be apparent to those skilled in the art without departing from the scope of the present invention.
Claims (6)
1. A full-automatic PoE switch ageing system which characterized in that: the device comprises a control center, a rack, a data power supply separation device, an aging test device, a data test device, an automatic transfer device and an automatic plugging device, wherein the data power supply separation device, the aging test device, the data test device, the automatic transfer device and the automatic plugging device are all arranged on the rack, the aging test device and the data test device are connected with the control center through signals, and the control center is used for controlling the aging test device and the data test device to work;
the data power supply separation device is provided with a power supply output end and a data output end, and is used for installing a PoE switch and separating the power supply of the PoE switch from data, and the automatic transfer device is used for transferring the data power supply separation device with the PoE switch to the aging test device;
the power output end of the data power supply separation device is connected with the input end of the aging test device, and the aging test device is used for performing power aging test on the separated power supply of the PoE switch; the data output end of the data power supply separation device is connected with the input end of the data testing device, and the data testing device is used for carrying out network data testing on the data separated by the PoE switch; the automatic plugging device is used for automatically plugging a power line between the data power supply separation device and the aging test device and plugging a network line between the data power supply separation device and the data test device;
the data power supply separation device comprises a separator and a separation load electrically connected with the separator, an output port of the PoE switch is connected with an input end of the separator, the separator is used for separating a signal of the PoE switch into a power supply signal and a network data signal, the power supply signal output by the separator is output to the aging test device through the separation load, and the network data signal output by the separator is output to the data test device;
the aging test device comprises a shell and a plurality of test areas arranged in the shell, wherein the test areas are respectively and electrically connected with the control center, each test area is electrically independent, different test areas can be set as different test parameters, and different PoE switches and different functions are tested simultaneously; each test area comprises a plurality of test bits, each test bit comprises an aging jig and an aging load, and after the data power supply separation device is assembled on the aging jig, the power supply output end of the data power supply separation device is electrically connected with the aging load; the data power supply separation device is arranged on the aging jig;
the automatic plugging device comprises a first manipulator arranged on the frame, and the plugging of the power line between the data power supply separation device and the aging test device and the plugging of the network line between the data power supply separation device and the data test device are completed through the first manipulator;
the automatic transfer device comprises a second manipulator arranged on the rack, and the PoE switch is transferred into the aging test device through the second manipulator for aging test;
the detection modes of the separator and the separation load are as follows: firstly, connecting a PoE switch port to an input port of a separator through a network cable, connecting an output port of the separator to a data testing device through the network cable, and separating electric signals and communication data by the separator; secondly, the separator is regulated by the control center, so that the output power value of a single or a plurality of POE ports is fully loaded, or the total power value of the output power is close to the power budget value of the PoE switch, and the PoE switch is subjected to aging test of the electrical performance; thirdly, setting relevant parameters of test software of the data test device to enable the PoE switch to run under full system load, so as to test network communication data.
2. A fully automated PoE switch burn-in system as recited in claim 1 wherein: the aging test device is provided with a constant temperature module, and the constant temperature module is used for enabling the aging test device to keep the temperature in the shell stable.
3. A fully automated PoE switch burn-in system as recited in claim 2 wherein: the constant temperature module comprises an exhaust assembly, a heating assembly and a temperature detection assembly, wherein the temperature detection assembly is arranged in the shell and is used for detecting the temperature in the shell, the temperature detection assembly is in signal connection with the control center, and the exhaust assembly and the heating assembly are both arranged in the shell and are in signal connection with the control center.
4. A fully automated PoE switch burn-in system as recited in claim 1 wherein: the automatic PoE switch aging system further comprises a material detecting device, wherein the material detecting device is used for sorting out good products and defective products from the PoE switch after the test is completed.
5. A method of aging based on the fully automatic PoE switch aging system of any one of claims 1 to 4, comprising the steps of:
A. the automatic transfer device transfers the PoE switch to an aging jig of the aging test device;
B. the automatic plugging device is used for automatically plugging a power line and a network line into the ageing jig and the PoE switch;
the PoE exchanger separates power signals and network data signals through a data power separation device arranged on the aging jig;
D. the power supply signal is converted into direct-current voltage after passing through the PD equipment and is input into an aging load of the aging test device, and then the control center regulates and controls the current of the port of the PoE switch to change the output power of the PoE switch so as to perform aging test; the network data signal is subjected to network data test through a data test device;
E. and (3) completing the test, automatically pulling out the power line and the network line by the automatic plugging device, and discharging the PoE switch.
6. A method of aging a fully automatic PoE switch aging system as recited in claim 5 wherein: in the step E, after the PoE switch finishes the aging test and before the blanking, the control center needs to sort out the products of the PoE switch, and sort out the PoE switch with good test, the PoE switch with bad power supply aging and the PoE switch with bad network test, and then blanking the products respectively.
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|---|---|---|---|---|
| JP2000009792A (en) * | 1998-06-23 | 2000-01-14 | Ando Electric Co Ltd | Test burn-in system and test burn-in system calibrating method therefor |
| CN101232384A (en) * | 2008-02-25 | 2008-07-30 | 福建星网锐捷网络有限公司 | Method and device for testing switch with Ethernet power supply function |
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| CN201319606Y (en) * | 2008-09-19 | 2009-09-30 | 鸿富锦精密工业（深圳）有限公司 | Testing treatment tool |
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| JP2000009792A (en) * | 1998-06-23 | 2000-01-14 | Ando Electric Co Ltd | Test burn-in system and test burn-in system calibrating method therefor |
| CN101232384A (en) * | 2008-02-25 | 2008-07-30 | 福建星网锐捷网络有限公司 | Method and device for testing switch with Ethernet power supply function |
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