CN113986036B - Touch panel motherboard and detection method thereof - Google Patents
Touch panel motherboard and detection method thereof Download PDFInfo
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- CN113986036B CN113986036B CN202111187655.0A CN202111187655A CN113986036B CN 113986036 B CN113986036 B CN 113986036B CN 202111187655 A CN202111187655 A CN 202111187655A CN 113986036 B CN113986036 B CN 113986036B
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- 238000001514 detection method Methods 0.000 title claims abstract description 40
- 238000012360 testing method Methods 0.000 claims abstract description 85
- 238000000034 method Methods 0.000 claims description 16
- 230000002159 abnormal effect Effects 0.000 claims description 13
- 239000010409 thin film Substances 0.000 claims description 11
- 230000008569 process Effects 0.000 description 5
- 239000000523 sample Substances 0.000 description 5
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- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
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- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The application discloses a touch panel motherboard and a detection method thereof. The touch panel motherboard comprises a plurality of touch areas and non-touch areas surrounding the touch areas; the touch control channels are arranged in each touch control area; the testing circuit is positioned in the non-touch area and comprises a switching element group, a control signal end and a testing signal end, the switching element groups correspond to the touch areas one by one, each switching element group comprises a plurality of switching elements, the control end of each switching element is connected with the control signal end, a first pole of each switching element is connected with the touch channel, and a second pole of each switching element is connected with the testing signal end. According to the embodiment of the application, the detection efficiency can be improved.
Description
Technical Field
The application relates to the technical field of electronic products, in particular to a touch panel motherboard and a detection method thereof.
Background
Along with the continuous development of display technology, the application range of the display panel is wider and wider, and the touch display panel with the touch function is also widely applied. According to the touch principle, the touch display panel is generally divided into a resistive touch display panel, a capacitive touch display panel, an infrared touch display panel, and the like, and the capacitive touch display panel is further divided into a self-capacitive touch display panel and a mutual-capacitive touch display panel.
Since the touch panel is prone to the problem of poor overlap or other circuit abnormality, in order to ensure that the touch panel can meet design requirements, it is generally necessary to detect the touch panel. In the related art, after a touch panel motherboard is cut into individual touch panels (also referred to as cells), each cell is then tested, which affects the testing efficiency.
Disclosure of Invention
The application provides a touch panel motherboard and a detection method thereof, which can improve detection efficiency.
In a first aspect, embodiments of the present application provide a touch panel motherboard, which includes a plurality of touch areas and a non-touch area surrounding each touch area;
the touch control channels are arranged in each touch control area;
the testing circuit is positioned in the non-touch area and comprises a switching element group, a control signal end and a testing signal end, the switching element groups correspond to the touch areas one by one, each switching element group comprises a plurality of switching elements, the control end of each switching element is connected with the control signal end, a first pole of each switching element is connected with the touch channel, and a second pole of each switching element is connected with the testing signal end.
In a possible implementation manner of the first aspect, the control terminals of the plurality of switching elements in the same switching element group are connected to the same control signal terminal, and the second poles of different switching elements in the same switching element group are connected to different test signal terminals.
In a possible implementation manner of the first aspect, the second pole of each of the at least two different switching element groups is connected to the same test signal terminal.
In one possible implementation manner of the first aspect, the plurality of touch areas are distributed in an array, each touch area is provided with n touch channels, the number of switching elements in each switching element group is n, the plurality of touch areas in the same row or the same column are correspondingly provided with n test signal ends, the i-th touch channel of the plurality of touch areas in the same row or the same column is connected with the first pole of the i-th switching element, the second poles of the plurality of i-th switching elements corresponding to the plurality of touch areas in the same row or the same column are connected with the i-th test signal end, n is a positive integer greater than or equal to 2, and i is equal to or greater than 1 and less than or equal to n.
In a possible implementation manner of the first aspect, the touch panel motherboard further includes a touch lead and a pad, the touch lead is connected between the touch channel and the pad, and the first electrode of the switching element is connected with the pad.
In a possible implementation manner of the first aspect, the non-touch area includes a first sub-area and a second sub-area, the first sub-area is located between the touch area and the second sub-area, the test circuit is disposed in the second sub-area, and the pad is disposed in the first sub-area.
In a possible implementation manner of the first aspect, the switching element is a thin film transistor;
preferably, each thin film transistor in the test circuit is a P-type transistor or an N-type transistor.
In a possible implementation manner of the first aspect, the plurality of touch areas are distributed in an array, and the plurality of switch element groups corresponding to the same row or column of touch areas are located on the same side of the same row or column of touch areas.
In a second aspect, based on the same inventive concept, an embodiment of the present application provides a method for detecting a touch panel motherboard, where the touch panel motherboard includes the touch panel motherboard according to any one of the embodiments of the first aspect, the method includes:
for any one switching element group, a conducting signal is sent through a control signal end to conduct a plurality of switching elements;
sending a detection signal to the touch control channel through the test signal end and receiving a feedback signal;
and determining that the touch channel is abnormal under the condition that the difference value between the feedback signal and the reference signal exceeds a preset range.
In a possible implementation manner of the second aspect, the detection method further includes:
removing a test circuit on the motherboard of the touch panel;
the touch panel motherboard is cut into a plurality of touch panels, and each touch panel comprises at least one touch area.
According to the touch panel motherboard and the detection method thereof, the test circuit is arranged on the touch panel motherboard, so that the touch panel motherboard can be detected before the touch panel motherboard is cut, detection is performed after the touch panel motherboard is cut, detection efficiency can be improved, and whether the touch channel on the touch panel motherboard is abnormal or not can be found in advance.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading the following detailed description of non-limiting embodiments, taken in conjunction with the accompanying drawings, in which like or similar reference characters designate the same or similar features, and which are not to scale.
Fig. 1 shows a schematic structural diagram of a motherboard of a touch panel according to an embodiment of the present application;
FIG. 2 shows an enlarged schematic view of the region Q of FIG. 1;
FIG. 3 shows another enlarged schematic view of the region Q of FIG. 1;
fig. 4 is a schematic structural diagram of another touch panel motherboard according to an embodiment of the present disclosure;
fig. 5 shows a schematic structural diagram of a touch panel motherboard according to another embodiment of the present application;
fig. 6 shows a schematic structural diagram of a touch panel motherboard according to another embodiment of the present application;
fig. 7 is a schematic flow chart of a method for detecting a motherboard of a touch panel according to an embodiment of the present application;
fig. 8 is a schematic flow chart of another method for detecting a motherboard of a touch panel according to an embodiment of the present application.
Detailed Description
Features and exemplary embodiments of various aspects of the present application are described in detail below to make the objects, technical solutions and advantages of the present application more apparent, and to further describe the present application in conjunction with the accompanying drawings and the detailed embodiments. It should be understood that the specific embodiments described herein are merely configured to explain the present application and are not configured to limit the present application. It will be apparent to one skilled in the art that the present application may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present application by showing examples of the present application.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions.
It will be understood that when a layer, an area, or a structure is described as being "on" or "over" another layer, another area, it can be referred to as being directly on the other layer, another area, or another layer or area can be included between the layer and the other layer, another area. And if the component is turned over, that layer, one region, will be "under" or "beneath" the other layer, another region.
It should be understood that the term "and/or" as used herein is merely one relationship describing the association of the associated objects, meaning that there may be three relationships, e.g., a and/or B, may represent: a exists alone, A and B exist together, and B exists alone. In addition, the character "/" herein generally indicates that the front and rear associated objects are an "or" relationship.
The embodiments provided in the examples of the present application may be combined with each other without contradiction.
In order to better understand the application, the touch panel motherboard and the detection method thereof provided by the embodiments of the application will be described below with reference to the accompanying drawings.
Alternatively, the touch panel motherboard may be a touch display panel motherboard, that is, the touch panel motherboard may have not only a touch function but also a display function.
The touch display panel motherboard can be an externally hung touch display panel motherboard or an embedded touch display panel motherboard. The embedded touch display panel motherboard may include an In-cell touch display panel motherboard with a touch panel function embedded into the pixel, and has the advantage of thinner thickness compared with an external touch display panel (i.e., the touch panel and the display panel are independently disposed and the touch panel is attached to the encapsulation layer of the display panel). The specific structure of the touch display panel motherboard is not limited.
Alternatively, the touch panel motherboard may be a self-capacitance touch panel motherboard or a mutual capacitance touch panel motherboard. The present application is not limited in this regard.
As shown in fig. 1, the touch panel motherboard 100 may include a plurality of touch areas TA and a non-touch area NA surrounding each touch area TA. Each touch area TA may be provided with a plurality of touch channels 10, and the non-touch area NA may be provided with a test circuit 20. For example, a touch panel motherboard may be referred to as a block, one block may be cut into a plurality of touch panels, and the cut touch panel may be referred to as a cell.
It is understood that the touch channel 10 is a touch signal channel. If the touch channel is abnormal, such as open circuit or short circuit, the touch signal received through the touch channel 10 is abnormal, and the touch position cannot be identified, so it is important to detect whether the touch channel 10 is abnormal. It should be noted that, for clearly showing the test circuit 20, fig. 1 and fig. 4 to 6 show the specific structure of the touch channel 10 in a hidden manner, and only one end of the touch channel 10 connected to the switching element is shown.
The touch channel 10 includes touch electrodes. Taking a mutual capacitive touch panel motherboard as an example, as shown in fig. 2, each touch channel 10 may include a first touch channel 11 extending along a first direction X and a second touch channel 12 extending along a second direction Y, where the first direction X and the second direction Y intersect, and the first touch channel 11 and the second touch channel 12 are insulated from each other. For example, the first direction X and the second direction Y may be perpendicular, the first direction X may be a row direction, and the second direction Y may be a column direction. Each first touch channel 11 includes a plurality of first touch electrodes 11a connected to each other, and each second touch channel 12 includes a plurality of second touch electrodes 12a connected to each other. The touch panel motherboard 100 may further include touch leads 10b. The touch lead 10b may include a first touch lead 11b and a second touch lead 12b, the first touch lead 11b being connected to the first touch electrode 11a, the second touch lead 12b being connected to the second touch electrode 12a. The other ends of the first and second touch leads 11b and 12b may be connected to the pad 30.
Alternatively, taking a self-capacitive touch panel motherboard as an example, as shown in fig. 3, each touch channel 10 may include a touch electrode 10a, where each touch electrode 10a is independent and insulated from each other. Each touch electrode 10a is connected to a touch lead 10b, and the other end of the touch lead 10b may be connected to a pad 30.
The test circuit 20 may include a switching element group 21, a control signal terminal SW and a test signal terminal SC. The plurality of switching element groups 21 are in one-to-one correspondence with the plurality of touch areas TA. Fig. 1 shows that the touch panel motherboard 100 includes three touch areas TA arranged along the first direction X, and correspondingly, the test circuit 20 may include three switching element groups 21. Each switching element group 21 includes a plurality of switching elements T, a control terminal of the switching element T is connected to the control signal terminal SW, a first pole of the switching element T is connected to the touch channel 10, and a second pole of the switching element T is connected to the test signal terminal SC.
The control signal for turning on or off the switching element T may be sent to the control terminal of the switching element T through the control signal terminal SW, and the detection signal may be sent to the touch channel 10 through the test signal terminal SC, and the feedback signal may be received. For example, during the detection phase, the control signal terminal SW and the test signal terminal SC may be connected to the detection module through probes. The detection module can be a test driving chip. The detection module may also be referred to as a jig control board.
Taking the switching element T being turned on at a low level as an example, the switching element may be turned on by transmitting a low level (VGL) to the control terminal of the switching element T through the control signal terminal SW, then transmitting a detection signal to the touch channel 10 through the test signal terminal SC, receiving a feedback signal through the test signal terminal SC, comparing the received feedback signal with a reference signal, and determining that there is an abnormality in the touch channel if a difference between the feedback signal and the reference signal exceeds a preset range, it may be understood that there is no abnormality in the touch channel if a difference between the feedback signal and the reference signal is within the preset range.
According to the embodiment of the application, the test circuit is arranged on the touch panel motherboard, so that the touch panel motherboard can be detected before the touch panel motherboard is cut, the detection efficiency can be improved relative to the detection after the touch panel motherboard is cut, and whether the touch channel on the touch panel motherboard is abnormal or not can be found in advance.
For example, the number of touch channels 10 disposed in each touch area TA may be the same as the number of switching elements T in the corresponding switching element group 21. That is, one switching element T is connected to one touch channel 10, thereby realizing detection of each touch channel 10.
In some alternative embodiments, as shown in fig. 4, the control terminals of the plurality of switching elements T in the same switching element group 21 are connected to the same control signal terminal SW. For example, the number of the switching element groups 21 is three, and the control of the switching elements T in the three switching element groups 21 can be realized only by setting three control signal ends SW, so that on one hand, the number of the control signal ends SW can be greatly saved, and the process cost is reduced; on the other hand, a control signal terminal SW of a larger size may be provided in a limited space so that the probe is more easily contacted with the control signal terminal SW during the detection stage.
In the case where the control terminals of the plurality of switching elements T in the same switching element group 21 are connected to the same control signal terminal SW, in order to implement detection of each touch channel 10, the second poles of the different switching elements in the same switching element group 10 are connected to different test signal terminals SC, so that a detection signal can be sent to their corresponding touch channels 10 through each test signal terminal SC or a signal fed back by their corresponding touch channels can be received through each test signal terminal SC, thereby enabling to implement determination of whether or not there is an abnormality in each touch channel 10.
In some alternative embodiments, as shown in fig. 5, the same test signal end SC may be shared by touch channels in different touch areas TA. For example, the second pole of each switching element T of at least two different switching element groups 21 is connected to the same test signal terminal SC. The number of touch areas TA and the number of switching element groups 21 are three, and the number of touch channels 10 in each touch area TA and the number of switching elements T in each switching element group 21 are four. For more convenient explanation of the connection relationship, the four switching elements T in the switching element group 21 are respectively marked as T1, T2, T3 and T4, the four test signal ends SC are marked as SC1, SC2, SC3 and SC4, and the four touch channels 10 are respectively marked as 10-1, 10-2, 10-3 and 10-4. The first poles of the four switching elements T1 are respectively connected with the four touch control channels 10-1, and the second poles of the four switching elements T1 are respectively connected with the test signal end SC 1; the first poles of the four switching elements T2 are respectively connected with the four touch control channels 10-2, and the second poles of the four switching elements T2 are respectively connected with the test signal end SC 2; the first poles of the four switching elements T3 are respectively connected with the four touch control channels 10-3, and the second poles of the four switching elements T3 are respectively connected with the test signal end SC 3; the first poles of the four switching elements T4 are respectively connected with the four touch control channels 10-4, and the second poles of the four switching elements T4 are respectively connected with the test signal end SC4.
It can be understood that the four touch channels 10-1 share one test signal end SC1, the four touch channels 10-2 share one test signal end SC2, the four touch channels 10-3 share one test signal end SC3, and the four touch channels 10-4 share one test signal end SC4.
Similarly, the touch channels in different touch areas TA share the test signal ends, so that on one hand, the number of the test signal ends can be greatly saved, and the process cost is reduced; on the other hand, a larger size of the test signal terminals can be provided in a limited space, so that the probes are more easily contacted with the test signal terminals in the detection stage.
In some alternative embodiments, both the control signal terminal and the test signal terminal may be shared. As shown in fig. 6, the plurality of touch areas TA may be distributed in an array. Fig. 6 shows three touch areas TA in total in three rows and three columns, and fig. 6 is only an example, and a plurality of touch areas TA may be distributed in a plurality of rows and columns.
Each touch area TA is provided with n touch channels, the number of the switch elements T in each switch element group 21 is n, a plurality of touch areas TA in the same row or the same column are correspondingly provided with n test signal ends, the ith touch channel of the plurality of touch areas TA in the same row or the same column is connected with a first pole of the ith switch element T, second poles of the plurality of ith switch elements corresponding to the plurality of touch areas in the same row or the same column are connected with the ith test signal end, n is a positive integer greater than or equal to 2, and i is more than or equal to 1 and less than or equal to n.
The points of the same points of fig. 6 and fig. 5 are not repeated, but the difference is that the control terminals of the plurality of switching elements T in the same switching element group 21 are connected to the same control signal terminal SW. For more convenient explanation of the connection, three switching element groups 21 are respectively labeled 21-1, 21-2, 21-3, and three control signal terminals are respectively labeled SW1, SW2, SW3. The control ends of the switching elements T in the switching element group 21-1 are all connected with the control signal end SW1, the control ends of the switching elements T in the switching element group 21-2 are all connected with the control signal end SW2, and the control ends of the switching elements T in the switching element group 21-3 are all connected with the control signal end SW3.
According to the embodiment of the application, the touch channels in different touch areas TA share the test signal end, and the plurality of switch elements in the same switch element group share the control signal end, so that the number of the control signal ends and the number of the test signal ends can be saved to the greatest extent, and the process cost is reduced; on the other hand, the control signal end and the test signal end with larger sizes can be arranged in a limited space to the greatest extent, so that the probe is easier to contact with the control signal end and the test signal end in the detection stage.
It should be understood that the number of touch areas, the number of touch channels in the touch areas, the number of switching element groups, etc. in the drawings of the present application are only examples and are not intended to limit the present application.
In addition, in the case that the touch channels in different touch areas TA share the test signal terminal, during detection, different switching elements connected to the shared test signal terminal should be turned on at different times, so as to avoid signal interference of different touch channels sharing the test signal terminal.
As described above with reference to fig. 2 or 3, the touch panel motherboard 100 may further include the touch leads 10b and the pads 30. The touch lead 10b is connected between the touch channel 10 and the pad 30, and the first electrode of the switching element T is connected to the pad 30. It can be understood that the touch channel 10 is connected to the switching element T through the touch lead 10b and the pad 30. In the manufacturing process of the motherboard of the touch panel, the risk of breakage or short circuit exists in the touch lead 10b, and in the embodiment of the application, whether the touch lead is abnormal or not can also be detected.
In some alternative embodiments, referring to fig. 2 or fig. 3, the non-touch area NA may include a first sub-area NA1 and a second sub-area NA2, the first sub-area NA1 is located between the touch area TA and the second sub-area NA2, the test circuit 20 is disposed in the second sub-area NA2, and the pad 30 is disposed in the first sub-area NA1. After the test is completed, dicing may be performed along the dicing line L1, thereby removing the second sub-area NA2. Referring to fig. 1, cutting may be performed along a cutting line L2 to cut a touch panel mother board into a plurality of touch panels, each of which may include at least one touch area TA.
According to the embodiment of the application, the test circuit 20 can be conveniently removed by arranging the test circuit 20 in the second sub-area NA2 far away from the touch area TA.
In some alternative embodiments, the switching element T may be a thin film transistor. It can be understood that the control terminal of the switching element T is the gate of the thin film transistor.
By way of example, the types of thin film transistors in the test circuit 10 may be the same. For example, each thin film transistor in the test circuit 10 is a P-type transistor, or each thin film transistor in the test circuit 10 is an N-type transistor. By providing the thin film transistors in the test circuit 10 to be of the same type, the thin film transistors can be manufactured by the same process steps, which can reduce process difficulty.
For example, for a plurality of touch areas TA located in the same row or the same column, the plurality of switch element groups 21 corresponding to one touch area group may be located on the same side of the touch area group, so that after the detection is completed, the plurality of switch element groups 21 corresponding to the touch area group may be conveniently cut off from the touch panel motherboard. For example, three touch areas TA arranged along the first direction X in fig. 1 are one touch area group, and three switch element groups 21 corresponding to the touch area group are all located on one side of the touch area group in the second direction Y, so that the three switch element groups 21 can be removed from the touch panel motherboard only by cutting once.
The application also provides a detection method of the touch panel motherboard, which can be used for detecting the touch panel motherboard provided by any one of the embodiments. As shown in fig. 7, the method for detecting a motherboard of a touch panel according to the embodiment of the present application includes steps 110 to 130.
Step 110, for any one switching element group, a conducting signal is sent through a control signal end to conduct a plurality of switching elements;
step 120, sending a detection signal to the touch channel through the test signal end and receiving a feedback signal;
in step 130, in the case that the difference between the feedback signal and the reference signal exceeds the preset range, it is determined that the touch channel is abnormal.
Before step 110, the detection module may be connected to the control signal terminal and the test signal terminal by probes. The detection module may be a driver chip.
In some alternative embodiments, the touch channels of the touch areas may be sequentially detected, that is, each of the switch element groups may be sequentially turned on during the detection process.
The detection signal may be a voltage signal, the feedback signal may be a capacitance signal, and the reference signal may be a capacitance signal.
Under the condition that the touch panel motherboard is self-capacitance, a voltage signal can be sent to the touch channel through the test signal end, the feedback capacitance signal is compared with the reference capacitance signal through the capacitance signal fed back by the touch channel received by the same test signal end, and under the condition that the difference value between the feedback capacitance signal and the reference capacitance signal exceeds a preset range, the touch channel is determined to be abnormal. For example, if the feedback signal is not received, the feedback capacitance signal may be considered to be 0, which indicates that the touch channel is open. And under the condition that the feedback signal can be received and the difference value between the feedback capacitance signal and the reference capacitance signal exceeds a preset range, determining that the touch channel has short circuit.
Under the condition that the touch panel mother board is of a mutual capacitance type, a voltage signal can be sent to the first touch channel through one test signal end, and a capacitance signal fed back by the second touch channel is received through the other test signal end, it can be understood that the first touch channel and the second touch channel need to be intersected, the fed back capacitance signal is compared with a reference capacitance signal, and the touch channel is determined to be abnormal under the condition that the difference value between the fed back capacitance signal and the reference capacitance signal exceeds a preset range. For example, in the case that the feedback signal is not received, the feedback capacitance signal may be considered to be 0, which indicates that at least one of the first touch channel and the second touch channel is open. And under the condition that the feedback signal can be received and the difference value between the feedback capacitance signal and the reference capacitance signal exceeds a preset range, determining that at least one of the first touch channel and the second touch channel has short circuit.
The preset range may be selected according to actual situations, and specifically may be a certain voltage value range or a capacitance value range.
According to the embodiment of the application, the touch panel motherboard can be detected before being cut, and compared with the detection after being cut, the detection efficiency can be improved, and whether the touch channel on the touch panel motherboard is abnormal or not can be found in advance.
In some alternative embodiments, as shown in fig. 8, the method for detecting a motherboard of a touch panel according to the embodiments of the present application may further include step 140 and step 150.
Step 140, removing the test circuit on the motherboard of the touch panel;
in step 150, the touch panel motherboard is cut into a plurality of touch panels, each of which includes at least one touch area.
For example, after the test is completed, as shown in fig. 2 or 3, dicing may be performed along dicing line L1, thereby removing the test circuit. Referring to fig. 1, cutting may be performed along a cutting line L2 to cut a touch panel mother board into a plurality of touch panels, each of which may include at least one touch region.
For example, in the case that it is determined that the touch channel is abnormal, an alarm signal may be output to prompt a worker to perform further detection or repair.
It should be noted that the exemplary embodiments mentioned in this application describe some methods or systems based on a series of steps or devices. However, the present application is not limited to the order of the above-described steps, that is, the steps may be performed in the order mentioned in the embodiments, may be different from the order in the embodiments, or several steps may be performed simultaneously.
These embodiments are not all details described in detail in accordance with the embodiments described hereinabove, nor are they intended to limit the application to the specific embodiments described. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best utilize the invention and various modifications as are suited to the particular use contemplated. This application is to be limited only by the claims and the full scope and equivalents thereof.
Claims (10)
1. The touch panel motherboard is characterized by comprising a plurality of touch areas and non-touch areas surrounding each touch area;
the touch control channels are arranged in each touch control area, and a plurality of touch control channels are arranged in each touch control area;
the testing circuit is positioned in the non-touch area and comprises a switching element group, a control signal end and a testing signal end, the switching element groups are in one-to-one correspondence with the touch areas, each switching element group comprises a plurality of switching elements, the control end of each switching element is connected with the control signal end, a first pole of each switching element is connected with the touch channel, and a second pole of each switching element is connected with the testing signal end;
the control ends of a plurality of switching elements in the same switching element group are connected with the same control signal end, the second poles of different switching elements in the same switching element group are connected with different test signal ends, and different switching element groups are connected with different control signal ends;
the test signal end is used for sending a detection signal and receiving a feedback signal.
2. The touch panel motherboard of claim 1, wherein the second pole of each of the at least two different switching element groups is connected to the same test signal terminal.
3. The touch panel motherboard according to claim 2, wherein a plurality of touch areas are distributed in an array, each touch area is provided with n touch channels, the number of switching elements in each switching element group is n, a plurality of touch areas in a same row or a same column are correspondingly provided with n test signal ends, an i-th touch channel of a plurality of touch areas in a same row or a same column is connected with a first pole of an i-th switching element, a second pole of a plurality of i-th switching elements corresponding to a plurality of touch areas in a same row or a same column is connected with an i-th test signal end, n is a positive integer greater than or equal to 2, and i is 1-n.
4. The touch panel motherboard of claim 1, further comprising a touch lead and a pad, wherein the touch lead is connected between the touch channel and the pad, and wherein the first pole of the switching element is connected to the pad.
5. The touch panel motherboard of claim 4, wherein the non-touch area comprises a first sub-area and a second sub-area, the first sub-area being located between the touch area and the second sub-area, the test circuit being disposed in the second sub-area, the pad being disposed in the first sub-area.
6. The touch panel motherboard of claim 1, wherein the switching element is a thin film transistor.
7. The touch panel motherboard of claim 6, wherein each of the thin film transistors in the test circuit is a P-type transistor or an N-type transistor.
8. The touch panel motherboard according to claim 1, wherein a plurality of the touch areas are distributed in an array, and a plurality of the switching element groups corresponding to the same row or column of the touch areas are located on the same side of the same row or column of the touch areas.
9. A method for detecting a touch panel motherboard, wherein the touch panel motherboard comprises the touch panel motherboard according to any one of claims 1 to 8, the method comprising:
for any one of the switch element groups, a conducting signal is sent through the control signal end to conduct the switch elements;
sending a detection signal to the touch channel through the test signal end and receiving a feedback signal;
and determining that the touch channel is abnormal under the condition that the difference value between the feedback signal and the reference signal exceeds a preset range.
10. The method of detecting according to claim 9, further comprising:
removing the test circuit on the touch panel motherboard;
and cutting the touch panel motherboard into a plurality of touch panels, wherein each touch panel comprises at least one touch area.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107037928A (en) * | 2017-04-27 | 2017-08-11 | 厦门天马微电子有限公司 | A kind of contact panel and its method of testing |
| CN108565278A (en) * | 2018-02-28 | 2018-09-21 | 京东方科技集团股份有限公司 | Array substrate motherboard, array substrate, display device and preparation method thereof |
| CN211087195U (en) * | 2019-12-31 | 2020-07-24 | 昆山龙腾光电股份有限公司 | Touch mother board and touch display screen |
| CN111610889A (en) * | 2020-05-24 | 2020-09-01 | 南昌欧菲显示科技有限公司 | Touch mother board and touch panel manufacturing method |
| CN112485940A (en) * | 2020-12-07 | 2021-03-12 | 武汉天马微电子有限公司 | Touch display substrate and test method thereof, liquid crystal display panel and display device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5194382B2 (en) * | 2005-08-18 | 2013-05-08 | セイコーエプソン株式会社 | Electro-optical device and electronic apparatus |
| KR102105369B1 (en) * | 2013-09-25 | 2020-04-29 | 삼성디스플레이 주식회사 | Mother substrate for a display substrate, array testing method thereof and display substrate |
| KR20210086283A (en) * | 2019-12-31 | 2021-07-08 | 엘지디스플레이 주식회사 | In-cell Touch Organic Light Emitting Diode Display Device and Testing method thereof |
-
2021
- 2021-10-12 CN CN202111187655.0A patent/CN113986036B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107037928A (en) * | 2017-04-27 | 2017-08-11 | 厦门天马微电子有限公司 | A kind of contact panel and its method of testing |
| CN108565278A (en) * | 2018-02-28 | 2018-09-21 | 京东方科技集团股份有限公司 | Array substrate motherboard, array substrate, display device and preparation method thereof |
| CN211087195U (en) * | 2019-12-31 | 2020-07-24 | 昆山龙腾光电股份有限公司 | Touch mother board and touch display screen |
| CN111610889A (en) * | 2020-05-24 | 2020-09-01 | 南昌欧菲显示科技有限公司 | Touch mother board and touch panel manufacturing method |
| CN112485940A (en) * | 2020-12-07 | 2021-03-12 | 武汉天马微电子有限公司 | Touch display substrate and test method thereof, liquid crystal display panel and display device |
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