CN113985247A - Chip testing device with multiple testing units - Google Patents
Chip testing device with multiple testing units Download PDFInfo
- Publication number
- CN113985247A CN113985247A CN202111231117.7A CN202111231117A CN113985247A CN 113985247 A CN113985247 A CN 113985247A CN 202111231117 A CN202111231117 A CN 202111231117A CN 113985247 A CN113985247 A CN 113985247A
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- Prior art keywords
- circuit board
- probe
- tray
- test
- chip
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- 238000012360 testing method Methods 0.000 title claims abstract description 129
- 239000000523 sample Substances 0.000 claims abstract description 61
- 230000000670 limiting effect Effects 0.000 claims description 15
- 238000000034 method Methods 0.000 abstract description 7
- 230000001174 ascending effect Effects 0.000 description 2
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009423 ventilation Methods 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 230000003044 adaptive effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
Abstract
The chip testing device with the plurality of testing units can be used for longitudinally and serially connecting the plurality of chip testing units on the operating platform, the structure is compact, the space is reasonably utilized, the serial connection method is simple and reliable, and the serial connection quantity can be randomly set, so that the testing efficiency is improved. The circuit board placing frame is suspended on the operating table, the opening of the containing cavity of the circuit board placing frame faces downwards, when a chip is tested, the chip is inserted into the chip socket, and then one side of the probe head of the circuit board tray faces upwards and is pressed into the containing cavity. The spring support block at the downward opening of the accommodating cavity can rotate upwards due to the pressing of the circuit board tray, so that the circuit board tray enters the accommodating cavity. The probe head enters the pressure plate probe groove, so that the test circuit board is communicated with the computer circuit. Then, the circuit board trays are pressed into the accommodating cavities, the circuit board trays are mutually overlapped in the accommodating cavities, and probe heads and probe grooves of the adjacent circuit board trays are connected, so that the respective test circuit boards are connected in series.
Description
Technical Field
The invention relates to the technical field of chip testing devices, in particular to a chip testing device comprising a plurality of testing units.
Background
The chip FT test refers to the test function verification and the electrical parameter test of the chip after the chip is packaged and the reliability verification of the finished chip is finished. The main test criteria are the integrated circuit specification, chip specification, and user manual. When testing, a chip socket needs to be arranged on the test circuit board, and after the chip to be tested is inserted into the socket, a computer connected with the test circuit board is started to run a corresponding test program, so that various tests are completed. In an actual test, a test circuit board provided with a chip socket is a test unit, and the test efficiency is insufficient for multi-batch chip tests. If a plurality of test units are connected in series, the test circuit board needs to occupy a certain space for placement, so that the working site is limited, the operation is complex and tedious, and the test efficiency is low.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides the chip testing device comprising a plurality of testing units, the space is reasonably utilized, the series connection method is simple and reliable, and the testing efficiency can be improved.
In order to achieve the purpose, the invention is realized by the following technical scheme: a chip testing apparatus including a plurality of test cells, comprising: the computer is arranged on the operating platform, a circuit board placing frame is suspended on the operating platform and provided with an accommodating cavity, the accommodating cavity is opened towards one side of the operating platform, a pressing plate is arranged in the accommodating cavity, at least one pressing plate probe groove is arranged on one side of the pressing plate close to the operating platform and electrically connected with the computer, and a group of spring support blocks are rotatably arranged at the opening of the accommodating cavity of the circuit board placing frame; the probe card comprises a circuit board tray, and is characterized in that the circuit board tray is adaptive to the containing cavity in shape, a test circuit board is arranged on the circuit board tray, a chip socket is arranged on the test circuit board, at least one probe head is arranged on the top surface of the circuit board tray, the shape and the position of the probe head correspond to those of a pressing plate probe groove, the test circuit board is correspondingly provided with probe grooves on the opposite side surfaces of the probe head, the probe head is electrically conducted with the probe grooves, and the test circuit board is electrically connected with the probe head and/or the probe grooves.
In the device, the circuit board placing frame is suspended on the operating table, the opening of the containing cavity of the circuit board placing frame faces downwards, when a chip is tested, the chip is inserted into the chip socket, and then one side of the probe head of the circuit board tray faces upwards and is pressed into the containing cavity. The spring support block at the downward opening of the accommodating cavity can rotate upwards due to the pressing of the circuit board tray, so that the circuit board tray enters the accommodating cavity. When the circuit board tray enters the accommodating cavity, the spring support block resets so as to support the pressing plate and the circuit board tray in the accommodating cavity. Meanwhile, the probe head enters the probe groove of the pressing plate, so that the test circuit board is communicated with the computer circuit. Then, the circuit board trays are pressed into the accommodating cavities, the circuit board trays are mutually overlapped in the accommodating cavities, and probe heads and probe grooves of the adjacent circuit board trays are connected, so that the respective test circuit boards are connected in series. And when the circuit board tray is pressed in, the circuit board tray which is arranged in the accommodating cavity can be always conducted with the computer. The chip testing device with the plurality of testing units can be used for longitudinally and serially connecting the plurality of chip testing units on the operating platform, the structure is compact, the space is reasonably utilized, the serial connection method is simple and reliable, and the serial connection quantity can be randomly set, so that the testing efficiency is improved.
Further, the chip testing device with the plurality of testing units comprises a circuit board placing frame, wherein the circuit board placing frame comprises a pair of side plates, a top plate and a supporting column, the supporting column is fixed on an operating table, the top plate is fixed at one end, far away from the operating table, of the supporting column, the pair of side plates are arranged on one side, close to the operating table, of the top plate, and the containing cavity is an n-shaped containing cavity formed by the top plate and the pair of side plates. Overall structure is simple, and the holding chamber is n type appearance chamber on the whole, helps the holistic ventilation cooling of each test unit in circuit board rack.
Furthermore, the chip testing device comprising a plurality of testing units is characterized in that a supporting block cavity is formed in one end, close to the operating platform, of the opposite surfaces of the pair of side plates, the spring supporting block is rotatably arranged in the supporting block cavity and comprises a supporting block and a torsion spring, a spring shaft is arranged on the supporting block, the torsion spring is sleeved on the spring shaft and is provided with a pair of pressing feet, the pair of pressing feet are respectively arranged on the supporting block and the side plates in a pressing mode, and a limiting plane is arranged in the supporting block cavity. When no circuit board tray is pressed in, the spring supporting block is integrally fixed in the horizontal direction under the action of the torsion spring and the limiting plane and is used for supporting the pressing plate in the accommodating cavity and the circuit board tray. When the circuit board tray is pressed in, the spring support block is lifted upwards and enters the support block cavity to make room for the circuit board tray. When the circuit board tray passes through the top end of the spring supporting block, the spring supporting block is reset under the action of the torsion spring and the limiting plane. The automatic reset of the spring is utilized, the problem that the circuit board tray is prevented from falling and falling out after upwards entering the containing cavity is solved, and the structure is simple and the operation is convenient.
Furthermore, the chip testing device with the plurality of testing units is characterized in that a cylinder is fixed on one side, away from the circuit board placing frame, of the operating platform, the position of the cylinder corresponds to the accommodating cavity, the telescopic rod of the cylinder penetrates through the operating platform, and a tray pushing seat is arranged at the end part of the telescopic rod of the cylinder. Through setting up the cylinder, only need place the circuit board tray and push up the operation that can accomplish the circuit board tray holding chamber of impressing on the tray pushes away the seat control cylinder, consequently, has promoted degree of automation and operating efficiency.
Furthermore, the chip testing device with the plurality of testing units is characterized in that a limit switch is arranged in the supporting block cavity and electrically connected with the cylinder controller. The limiting switch is arranged, when the air cylinder pushes the circuit board tray to be pressed into the accommodating cavity, the spring supporting block upwards rotates, when the circuit board tray passes through the top end of the spring supporting block, the angular position of the spring supporting block just triggers the limiting switch, the limiting switch inputs a signal to the air cylinder controller, the telescopic rod of the feedback air cylinder returns, and the spring supporting block also returns simultaneously. Therefore, can accomplish the very first time and reset, prevent that the cylinder return stroke from starting too early circuit board tray and not pushing into the holding intracavity completely, perhaps the cylinder return stroke starts too late, the wasted time. And the automation degree and the working efficiency are further improved.
Furthermore, the chip testing device comprising the plurality of testing units is characterized in that a pushing seat cavity is arranged on the bottom surface of the circuit board tray, and the pushing seat cavity is matched with the tray pushing seat in shape. The push seat cavity enables the circuit board tray to be more stable on the tray push seat, and the circuit board tray is prevented from deviating in the ascending process of the tray push seat. Simultaneously, the push seat cavity also plays a positioning role, and can quickly place the circuit board tray on the designated position of the tray push seat. Therefore, the stability of the chip testing device comprising a plurality of testing units can be improved, and the operating efficiency can be improved.
Furthermore, the chip testing device with the plurality of testing units is characterized in that a pressure spring is arranged between the pressure plate and the top plate. The probe head on the circuit board tray is ensured to be fully pressed with the probe groove of the pressing plate or the probe groove on the adjacent circuit board tray, and the serial stability of the test circuit board is ensured, so that the overall stability of the chip test device comprising a plurality of test units is improved.
Furthermore, the chip testing device with the plurality of testing units is characterized in that one end, away from the operating platform, of the pressing plate is provided with a pressing plate spring shaft, the pressing plate spring shaft is sleeved on the pressing plate spring shaft, and the pressing plate spring shaft penetrates through the top plate. The pressure spring is sleeved on the pressure plate spring shaft, so that the stability of compression and elastic extension movement of the pressure spring is ensured, and the pressure spring is prevented from deviating.
Furthermore, the chip testing device with the plurality of testing units is characterized in that a guide hole seat is arranged on the top of the circuit board placing frame corresponding to the pressing plate spring shaft. The pressure plate spring shaft rises and falls along the guide hole of the guide hole seat, so that the pressure plate spring shaft is prevented from inclining, and the stability of the chip testing device comprising a plurality of testing units is improved.
Furthermore, the chip testing device with the plurality of testing units is characterized in that a gear screw hole is formed in the side plate in a penetrating mode, and a gear screw is arranged in the gear screw hole. The gear screw hole is formed in the side plate close to the top plate side, the gear screw extends into the accommodating cavity, and therefore limiting effect is achieved, the circuit board tray in the accommodating cavity is prevented from being excessive, and the pressing plate is prevented from being lifted and over-positioned. On the other hand, when the circuit board tray in the accommodating cavity is to be taken out, the gear screw is screwed out until the end part of the gear screw is screwed out of the accommodating cavity, namely the plane of the inner wall of the side plate, the pressing plate is lifted upwards to enable the position of the pressing plate to be higher than the gear screw hole, and then the gear screw is screwed in until the end part of the gear screw enters the accommodating cavity. At the moment, the pressing plate is separated from the circuit board tray, is limited by the gear screws and cannot be pressed back downwards, so that the circuit board tray in the accommodating cavity can be taken out from the side opening.
The technical scheme shows that the invention has the following beneficial effects:
1. the invention provides a chip testing device with a plurality of testing units, which can be used for longitudinally and serially connecting a plurality of chip testing units on an operating platform, has compact structure and reasonable utilization of space, is simple and reliable in serial connection method, and can be used for randomly setting the serial connection quantity, thereby improving the testing efficiency.
2. The invention provides a chip testing device comprising a plurality of testing units, wherein when no circuit board tray is pressed in, the spring supporting block is integrally fixed in the horizontal direction under the action of a torsion spring and a limiting plane and is used for supporting a pressing plate in an accommodating cavity and the circuit board tray. The automatic reset of the spring is utilized, the problem that the circuit board tray is prevented from falling and falling out after upwards entering the containing cavity is solved, and the structure is simple and the operation is convenient.
3. The invention provides a chip testing device comprising a plurality of testing units, which is provided with a limit switch, wherein a cylinder can complete reset at the first time, and the phenomenon that a circuit board tray is not completely pressed into an accommodating cavity before the cylinder is started in a return stroke manner or the time is wasted due to the fact that the cylinder is started in the return stroke manner too late is prevented. And the automation degree and the working efficiency are further improved.
4. The invention provides a chip testing device comprising a plurality of testing units, wherein a pressure spring is arranged between a pressing plate and a top plate, so that a probe head on a circuit board tray is fully pressed with a probe groove of the pressing plate or a probe groove on an upper adjacent circuit board tray, the serial stability of a testing circuit board is ensured, and the integral stability is improved.
Drawings
FIG. 1 is a schematic structural diagram of a chip testing apparatus including a plurality of testing units according to the present invention;
FIG. 2 is an enlarged view of a portion of the circled area A of FIG. 1;
FIG. 3 is a schematic diagram of a three-dimensional structure of the spring support block of the chip testing device with a plurality of testing units according to the present invention.
In the figure: 1-a computer; 2-an operation table; 3-placing a circuit board; 31-an accommodating cavity; 32-a pallet cavity; 321-a limit plane; 33-a via seat; 34-gear screw holes; 35-gear screw; 36-side plate; 37-a top plate; 38-support column; 4, pressing a plate; 41-platen probe slot; 42-platen spring shaft; 5-a spring supporting block; 51-a support block; 511-a spring shaft; 52-a torsion spring; 521-presser foot; 6-circuit board tray; 61-test circuit board; 62-a chip socket; 63-a probe head; 64-a probe slot; 65-a push seat cavity; 7-a cylinder; 71-a tray pushing seat; 8-a limit switch; 9-pressure spring.
Detailed Description
Reference will now be made in detail to embodiments of the invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.
In the description of the invention, it is to be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "clockwise," "counterclockwise," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and for simplicity in description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be operated in a particular manner, and are not to be construed as limiting the invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the invention, unless otherwise indicated, "a plurality" means two or more unless explicitly defined otherwise.
In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to specific situations.
In the present invention, unless otherwise expressly specified or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
Examples
A chip testing apparatus including a plurality of test units shown in fig. 1 and 2 includes: including computer 1 and operation panel 2, computer 1 sets up on operation panel 2, hang circuit board rack 3 on the operation panel 2, circuit board rack 3 is equipped with holding chamber 31, holding chamber 31 is towards 2 one side direction openings of operation panel. The circuit board placing frame 3 includes a pair of side plates 36, a top plate 37 and a supporting column 38, the supporting column 38 is fixed on the operating platform 2, the top plate 37 is fixed at one end of the supporting column 38 far from the operating platform 2, the pair of side plates 36 are arranged at one side of the top plate 37 close to the operating platform 2, and the accommodating cavity 31 is an n-shaped accommodating cavity formed by the top plate 37 and the pair of side plates 36.
The accommodating cavity 31 is internally provided with a pressing plate 4, one side of the pressing plate 4 close to the operating platform 2 is provided with a pair of pressing plate probe grooves 41, and the pressing plate probe grooves 41 are electrically connected with the computer 1. A pressure spring 9 is provided between the pressure plate 4 and the top plate 37. And, the end of the pressing plate 4 far away from the operation table 2 is provided with a pressing plate spring shaft 42, the pressing plate spring shaft 42 is sleeved with the pressing spring 9, and the pressing plate spring shaft 42 penetrates through the top plate 37. And, the top of the circuit board placing frame 3 is provided with a guide hole seat 33 corresponding to the pressing plate spring shaft 42. In addition, a gear screw hole 34 is formed in the side plate 36, and a gear screw 35 is arranged in the gear screw hole 34.
As shown in fig. 3, the spring support block 5 includes a support block 51 and a torsion spring 52, the support block 51 is provided with a spring shaft 511, the torsion spring 52 is sleeved on the spring shaft 511, the torsion spring 52 is provided with a pair of press feet 521, the pair of press feet 521 are respectively pressed on the support block 51 and the side plate 36, and a limit plane 321 is arranged in the support block cavity 32.
Still include circuit board tray 6, circuit board tray 6 shape and holding chamber 31 suit, be equipped with test circuit board 61 on the circuit board tray 6, be equipped with chip socket 62 on the test circuit board 61, be equipped with a pair of probe 63 on the circuit board tray 6 top surface, probe 63 shape and position are corresponding with clamp plate probe groove 41, test circuit board 61 corresponds on probe 63 opposite side face and is equipped with probe groove 64, probe 63 switches on with probe groove 64 electrical property, test circuit board 61 and probe 63 and probe groove 64 electrical connection.
Further, an air cylinder 7 is fixed on one side, away from the circuit board placing frame 3, of the operating platform 2, the position of the air cylinder 7 corresponds to the accommodating cavity 31, an expansion rod of the air cylinder 7 penetrates through the operating platform 2, and a tray pushing seat 71 is arranged at the end portion of the expansion rod of the air cylinder 7. And, be equipped with limit switch 8 in the tray chamber 32, limit switch 8 and cylinder 7 controller electric connection. And a push seat cavity 65 is arranged on the bottom surface of the circuit board tray 6, and the shape of the push seat cavity 65 is adapted to that of the tray push seat 71.
Based on the structure, the circuit board placing frame 3 is suspended on the operating platform 2, the opening of the containing cavity 31 faces downwards, when a chip is tested, the chip is inserted into the chip socket 62, and then one side of the probe head 63 of the circuit board tray 6 faces upwards and is pressed into the containing cavity 31. The spring support block 5 at the downward opening of the accommodating cavity 31 rotates upward due to the press-in of the circuit board tray 6, so that the circuit board tray 6 enters the accommodating cavity 31. After the circuit board tray 6 enters the accommodating cavity 31, the spring support block 5 is reset, so that the pressing plate 4 and the circuit board tray 6 in the accommodating cavity 31 are supported. At the same time, the probe tip 63 enters the press plate probe groove 41, so that the test circuit board 61 is electrically connected to the computer 1. Thereafter, the circuit board trays 6 are pressed into the accommodating cavities 31, the circuit board trays 6 are overlapped with each other in the accommodating cavities 31, and the probe heads 63 and the probe slots 64 of the adjacent circuit board trays 6 are connected, thereby connecting the respective test circuit boards 61 in series. And when the circuit board tray 6 is pressed in, the circuit board tray 6 which is already arranged in the accommodating cavity 31 can be always kept conductive with the computer 1. In addition, the containing cavity 31 is an n-shaped containing cavity on the whole, and the structure is simple, so that the whole ventilation and heat dissipation of each test unit in the circuit board placing frame 3 are facilitated.
When no circuit board tray 6 is pressed in, the spring support block 5 is integrally fixed in the horizontal direction under the action of the torsion spring 52 and the limiting plane 321, and is used for supporting the pressing plate 4 and the circuit board tray 6 in the accommodating cavity 31. When the circuit board tray 6 is pressed in, the spring support block 5 is lifted upwards and enters the support block cavity 32 to make room for the circuit board tray 6 to enter. When the circuit board tray 6 passes the top end of the spring bracket 5, the spring bracket 5 is reset by the action of the torsion spring 52 and the limiting plane 321. By means of the automatic reset of the spring, the problem that the circuit board tray 6 is prevented from falling off after upwards entering the accommodating cavity 31 is solved.
Further, through setting up cylinder 7, only need place circuit board tray 6 and control cylinder 7 and push up on tray pushes away seat 71 and can accomplish the operation that circuit board tray 6 impresses holding chamber 31, has promoted degree of automation and operating efficiency. And, set up limit switch 8, when cylinder 7 promoted circuit board tray 6 and impresses into holding chamber 31, spring tray 5 upwards rotated, when circuit board tray 6 crossed 5 tops of spring tray, 5 angular position of spring tray just in time triggered limit switch 8 this moment, and limit switch 8 inputs the signal for cylinder 7 controller, and feedback cylinder 7 telescopic link return stroke resets, and spring tray 5 also resets simultaneously. Consequently, can the very first time accomplish reset, prevent that cylinder 7 return stroke from starting too early circuit board tray 6 and not pressing into in the holding chamber 31 completely, perhaps cylinder 7 return stroke starts too late, the waste time, consequently, has further promoted degree of automation and work efficiency. In addition, the socket pushing cavity 65 makes the circuit board tray 6 more stable on the tray pushing seat 71, and prevents the circuit board tray 6 from shifting during the ascending process of the tray pushing seat 71. Meanwhile, the push seat cavity 65 also plays a positioning role, so that the circuit board tray 6 can be quickly placed at a designated position of the tray push seat 71.
Further, a pressure spring 9 is arranged between the pressure plate 4 and the top plate 37. The probe heads 63 on the circuit board tray 6 can be fully pressed with the probe grooves 41 of the pressing plate or the probe grooves 64 on the adjacent circuit board tray 6, and the serial stability of the test circuit board 61 is ensured. The pressure spring 9 is sleeved on the pressure plate spring shaft 42, so that the stability of the compression and extension movement of the pressure spring 9 is ensured, and the pressure spring 9 is prevented from deviating. In addition, a guide hole seat 33 is provided, the pressing plate spring shaft 42 ascends and descends along the guide hole of the guide hole seat 33, and the pressing plate spring shaft 42 is prevented from inclining, so that the stability of the chip testing device comprising a plurality of testing units is improved.
Furthermore, the gear screw hole 34 is arranged on the side plate 36 near the top plate 37, and the gear screw 35 extends into the accommodating cavity 31, so that on one hand, a limiting effect is achieved, the circuit board tray 6 in the accommodating cavity 31 is prevented from being excessive, and the pressing plate 4 is prevented from being lifted and over-positioned. On the other hand, when the circuit board tray 6 in the accommodating cavity 31 is to be taken out, the gear screw 35 is screwed out until the end of the gear screw 35 is screwed out of the accommodating cavity 31, i.e. the inner wall plane of the side plate 36, the pressing plate 4 is lifted upwards to make the position of the pressing plate 4 higher than the gear screw hole 34, and then the gear screw 35 is screwed in until the end of the gear screw 35 enters the accommodating cavity 31. At this time, the pressing plate 4 is separated from the circuit board tray 6 and is limited by the shift screw 35, and the circuit board tray 6 in the accommodating cavity 31 can be taken out from the side opening because the circuit board tray is not pressed back downwards.
The method for testing the chip by using the chip testing device comprising a plurality of testing units comprises the following steps:
(1) inserting a chip to be tested into the chip socket 62 of the circuit board tray 6;
(2) sleeving a pushing seat cavity 65 of the circuit board tray 6 on a tray pushing seat 71, and starting a switch of the air cylinder 7;
(3) after the tray pushing seat 71 is automatically reset, repeating the step (1) or (2) again until the circuit board tray 6 with the tested chip is completely pressed into the accommodating cavity;
(4) switching on a power supply of the computer 1, starting a test program and testing;
(5) after the test is finished, the power supply of the computer 1 or the circuit of the pressure plate probe slot 41 and the computer 1 is disconnected;
(6, lifting the pressure plate 4 to a position higher than the gear screw holes 34, and screwing the gear screws 35 into the accommodating cavities 31, so that the pressure plate 4 is limited by the gear screws to descend;
(7) the circuit board tray 6 in the accommodating chamber 31 is taken out from the side opening of the circuit board placing frame 3, and the tested chip is taken down from the chip socket 62.
The technical principles of the invention have been described above in connection with specific embodiments, which are intended to illustrate the principles of the invention and should not be construed as limiting the scope of the invention in any way. Based on the explanations herein, those skilled in the art will be able to conceive other embodiments of the invention without inventive step, which shall fall within the scope of the invention.
Claims (10)
1. A chip testing device with a plurality of testing units, comprising a computer (1) and an operating platform (2), wherein the computer (1) is arranged on the operating platform (2), and is characterized in that: a circuit board placing frame (3) is suspended on the operating platform (2), the circuit board placing frame (3) is provided with an accommodating cavity (31), the accommodating cavity (31) is opened towards one side of the operating platform (2), a pressing plate (4) is arranged in the accommodating cavity (31), at least one pressing plate probe groove (41) is arranged on one side of the pressing plate (4) close to the operating platform (2), the pressing plate probe groove (41) is electrically connected with the computer (1), and a group of spring supporting blocks (5) are rotatably arranged on the opening of the accommodating cavity (31) of the circuit board placing frame (3); still include circuit board tray (6), circuit board tray (6) shape suits with holding chamber (31), be equipped with test circuit board (61) on circuit board tray (6), be equipped with chip socket (62) on test circuit board (61), be equipped with at least one probe (63) on circuit board tray (6) top surface, probe (63) shape and position are corresponding with clamp plate probe groove (41), test circuit board (61) correspond on probe (63) counterpoint face and are equipped with probe groove (64), probe (63) and probe groove (64) electrical conductivity, test circuit board (61) and probe (63) and/or probe groove (64) electrical connection.
2. The apparatus of claim 1, wherein the test unit comprises a plurality of test units, and wherein: circuit board rack (3) include a pair of curb plate (36), roof (37) and support column (38), support column (38) are fixed on operation panel (2), roof (37) are fixed and are kept away from operation panel (2) one end in support column (38), a pair of curb plate (36) set up in roof (37) near operation panel (2) one side, holding chamber (31) are the n type that roof (37) and a pair of curb plate (36) formed holds the chamber.
3. The apparatus of claim 2, wherein the test unit comprises a plurality of test units, and wherein: one end, close to the operating platform (2), of each of the opposite faces of the side plates (36) is provided with a supporting block cavity (32), the spring supporting block (5) is rotatably arranged in the supporting block cavity (32), the spring supporting block (5) comprises a supporting block (51) and a torsion spring (52), a spring shaft (511) is arranged on the supporting block (51), the torsion spring (52) is sleeved on the spring shaft (511), the torsion spring (52) is provided with a pair of press feet (521), the pair of press feet (521) are respectively pressed on the supporting block (51) and the side plates (36), and a limiting plane (321) is arranged in the supporting block cavity (32).
4. A chip testing device comprising a plurality of test units according to any one of claims 1 to 3, wherein: one side of the operating platform (2) far away from the circuit board placing frame (3) is fixed with an air cylinder (7), the position of the air cylinder (7) corresponds to the accommodating cavity (31), the telescopic rod of the air cylinder (7) penetrates through the operating platform (2), and the end part of the telescopic rod of the air cylinder (7) is provided with a tray pushing seat (71).
5. The apparatus of claim 4, wherein the testing unit comprises a plurality of testing units, and the testing unit comprises: a limit switch (8) is arranged in the supporting block cavity (32), and the limit switch (8) is electrically connected with a cylinder (7) controller.
6. The apparatus of claim 4, wherein the testing unit comprises a plurality of testing units, and the testing unit comprises: the circuit board tray is characterized in that a push seat cavity (65) is formed in the bottom surface of the circuit board tray (6), and the push seat cavity (65) is matched with the tray push seat (71) in shape.
7. A chip testing device comprising a plurality of test units according to any one of claims 1 to 3, wherein: and a pressure spring (9) is arranged between the pressure plate (4) and the top plate (37).
8. The apparatus of claim 7, wherein the test unit comprises a plurality of test units, and wherein: one end, far away from the operating platform (2), of the pressing plate (4) is provided with a pressing plate spring shaft (42), the pressing plate spring shaft (42) is sleeved with the pressure spring (9), and the pressing plate spring shaft (42) penetrates through the top plate (37).
9. The apparatus of claim 8, wherein the test unit comprises a plurality of test units, and wherein: the top of the circuit board placing frame (3) is provided with a guide hole seat (33) corresponding to the pressing plate spring shaft (42).
10. The apparatus of claim 7, wherein the test unit comprises a plurality of test units, and wherein: a gear screw hole (34) penetrates through the side plate (36), and a gear screw (35) is arranged in the gear screw hole (34).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111231117.7A CN113985247A (en) | 2021-10-22 | 2021-10-22 | Chip testing device with multiple testing units |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111231117.7A CN113985247A (en) | 2021-10-22 | 2021-10-22 | Chip testing device with multiple testing units |
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| Publication Number | Publication Date |
|---|---|
| CN113985247A true CN113985247A (en) | 2022-01-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111231117.7A Withdrawn CN113985247A (en) | 2021-10-22 | 2021-10-22 | Chip testing device with multiple testing units |
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| Country | Link |
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| CN (1) | CN113985247A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115683862A (en) * | 2022-11-09 | 2023-02-03 | 徐州市沂芯微电子有限公司 | Chip packaging detection machine capable of detecting press-fitting quality and implementation method thereof |
| CN115831797A (en) * | 2022-12-26 | 2023-03-21 | 徐州市沂芯微电子有限公司 | Chip detection machine with self-material-taking and installing functions |
| CN117310451A (en) * | 2023-11-27 | 2023-12-29 | 深圳市晶导电子有限公司 | Detection device applied to short-sized direct-insert plastic package chip |
-
2021
- 2021-10-22 CN CN202111231117.7A patent/CN113985247A/en not_active Withdrawn
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115683862A (en) * | 2022-11-09 | 2023-02-03 | 徐州市沂芯微电子有限公司 | Chip packaging detection machine capable of detecting press-fitting quality and implementation method thereof |
| CN115683862B (en) * | 2022-11-09 | 2023-12-26 | 徐州市沂芯微电子有限公司 | Chip packaging detector capable of detecting packaging quality and implementation method thereof |
| CN115831797A (en) * | 2022-12-26 | 2023-03-21 | 徐州市沂芯微电子有限公司 | Chip detection machine with self-material-taking and installing functions |
| CN115831797B (en) * | 2022-12-26 | 2023-10-13 | 徐州市沂芯微电子有限公司 | Chip detector with self-feeding installation function |
| CN117310451A (en) * | 2023-11-27 | 2023-12-29 | 深圳市晶导电子有限公司 | Detection device applied to short-sized direct-insert plastic package chip |
| CN117310451B (en) * | 2023-11-27 | 2024-02-23 | 深圳市晶导电子有限公司 | Detection device applied to short-sized direct-insert plastic package chip |
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Application publication date: 20220128 |